Instrument channel uncertainty and cross comparison calculation method and device, storage medium and electronic equipment

Abstract

The invention relates to an instrument channel uncertainty and cross comparison calculation method and device, a storage medium and electronic equipment, and the method comprises the steps: carrying out the layering of each measurement channel of an instrument at a same measurement point, and obtaining a plurality of layers of each measurement channel; carrying out uncertainty calculation on the plurality of layers to obtain expansion uncertainty of each layer; calculating according to the expansion uncertainty of each layer to obtain the expansion uncertainty of each measurement channel; calculating according to the expansion uncertainty of each measurement channel to obtain the uncertainty of the measurement average value of all the measurement channels of the same measurement point; and performing calculation according to the expansion uncertainty of each measurement channel and the uncertainty of the measurement average value to obtain a criterion value of cross comparison of the instruments at the same measurement point. According to the method, the uncertainty and the cross comparison criterion of the instrument can be calculated, a reasonable and scientific calculation method is provided, and the accuracy and the reliability of instrument judgment are ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of instrument uncertainty calculation, and more particularly to an instrument channel uncertainty and cross-comparison calculation method, device, storage medium and electronic equipment. Background Art

[0002] EPR (Energy Processor) third-generation nuclear power plants are designed with a large number of redundant remote instruments (hereinafter referred to as instruments) to improve measurement reliability. During routine maintenance, redundant instrument measurements are compared to determine instrument accuracy and usability, reducing the frequency of instrument intervention. Therefore, the criteria for determining instrument accuracy and usability are crucial, and the key to calculating these criteria lies in calculating the uncertainty of the instrument measurement channels. However, existing solutions lack methods for calculating instrument uncertainty and cross-comparison. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide an instrument channel uncertainty and cross-comparison calculation method, device, storage medium and electronic equipment to address the problems existing in the prior art.

[0004] The technical solution adopted by the present invention to solve the technical problem is to construct an instrument channel uncertainty and cross-comparison calculation method, including the following steps:

[0005] Layering each measurement channel of an instrument at the same measurement point to obtain multiple layers for each measurement channel;

[0006] performing uncertainty calculation on multiple layers of each of the measurement channels to obtain expanded uncertainty of each layer of each of the measurement channels;

[0007] Calculating according to the expanded uncertainty of each layer of each measurement channel to obtain the expanded uncertainty of each measurement channel;

[0008] Calculating based on the expanded uncertainty of each measurement channel to obtain the uncertainty of the measurement average value of all measurement channels at the same measurement point;

[0009] Calculation is performed based on the expanded uncertainty of each measurement channel and the uncertainty of the measurement average value to obtain a criterion value for cross-comparison of instruments at the same measurement point.

[0010] In the instrument channel uncertainty and cross-comparison calculation method of the present invention, the multiple layers include: layer 0, layer 1, and layer 2;

[0011] Calculating the uncertainty of the multiple layers of each measurement channel to obtain the expanded uncertainty of each layer of each measurement channel includes:

[0012] Calculating the uncertainty of the 0th layer of each of the measurement channels to obtain the expanded uncertainty of the 0th layer;

[0013] Calculating the uncertainty of one layer of each measurement channel to obtain an expanded uncertainty of one layer;

[0014] The two-layer uncertainty of each of the measurement channels is calculated to obtain the two-layer expanded uncertainty.

[0015] In the instrument channel uncertainty and cross-comparison calculation method of the present invention, calculating the uncertainty of the 0th layer of each measurement channel to obtain the expanded uncertainty of the 0th layer includes:

[0016] Identify all influencing factors of the instrument;

[0017] Determine the distribution type and measurement uncertainty of all the influencing factors mentioned;

[0018] Calculate based on the measurement uncertainty and the distribution type to obtain the standard uncertainty of all the influencing factors;

[0019] Calculate the combined uncertainty of the 0 layer based on the standard uncertainties of all the influencing factors;

[0020] Calculation is performed based on the composite uncertainty of the 0 layer to obtain the expanded uncertainty of the 0 layer.

[0021] In the instrument channel uncertainty and cross-comparison calculation method of the present invention, calculating the uncertainty of one layer of each measurement channel to obtain the expanded uncertainty of one layer includes:

[0022] Determine all modules that the instrument passes through in the first layer;

[0023] Determine all influencing factors for each of said modules;

[0024] Determine the distribution type and measurement uncertainty of all influencing factors of each of the modules;

[0025] Calculate the measurement uncertainty of each module according to the distribution type to obtain the combined uncertainty;

[0026] Calculating according to the combined uncertainty of each module to obtain the expanded uncertainty of each module;

[0027] The expanded uncertainty of the first layer is obtained by performing calculations based on the expanded uncertainties of all modules that the instrument passes through.

[0028] In the instrument channel uncertainty and cross-comparison calculation method of the present invention, calculating the two-layer uncertainty of each measurement channel to obtain the two-layer expanded uncertainty includes:

[0029] Determine all influencing factors of the two layers;

[0030] determining a distribution type of each of the influencing factors;

[0031] Calculate the measurement uncertainty of each of the influencing factors;

[0032] Calculate based on the measurement uncertainty and the distribution type to obtain the standard uncertainty of all the influencing factors;

[0033] The expanded uncertainty of the two layers is obtained by calculating the standard uncertainty of all the influencing factors.

[0034] In the instrument channel uncertainty and cross-comparison calculation method of the present invention, the uncertainty of the uncertainty of the measurement average of all measurement channels at the same measurement point obtained by calculating the uncertainty based on the expanded uncertainty of each measurement channel includes:

[0035] Determining the number of measurement channels at the same measurement point;

[0036] The uncertainty of the measurement average value of all the measurement channels at the same measurement point is obtained by performing calculations based on the number of the measurement channels and the expanded uncertainty of each of the measurement channels.

[0037] The instrument channel uncertainty and cross-comparison calculation method of the present invention also includes:

[0038] Calculate the measurement average of all instruments at the same measuring point;

[0039] Calculating based on the measurement average and the measurement value of a single instrument to obtain a deviation percentage value;

[0040] Whether the single instrument is normal is determined according to the deviation percentage value and the cross-comparison criterion value.

[0041] The present invention also provides an instrument channel uncertainty and cross-comparison calculation device, comprising:

[0042] a stratification unit, configured to stratify the respective measurement channels of the instrument at the same measurement point to obtain a plurality of strata for each of the measurement channels;

[0043] a layered uncertainty calculation unit, configured to calculate the combined uncertainty of multiple layers of each of the measurement channels to obtain the combined uncertainty of each layer of each of the measurement channels;

[0044] a channel uncertainty calculation unit, configured to calculate, based on the combined uncertainty of each layer of each measurement channel, to obtain a combined uncertainty of each measurement channel;

[0045] an average uncertainty calculation unit, configured to calculate the uncertainty of the average value of all instruments at the same measurement point according to the combined uncertainty of each measurement channel;

[0046] The cross comparison calculation unit is used to calculate according to the combined uncertainty of each measurement channel and the uncertainty of the average value of all the instruments to obtain the criterion value for the cross comparison of the instruments at the same measurement point.

[0047] The present invention also provides a storage medium storing a computer program, wherein the computer program is suitable for being loaded by a processor to execute the steps of the above-mentioned instrument channel uncertainty and cross-comparison calculation method.

[0048] The present invention also provides an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor executes the steps of the above-mentioned instrument channel uncertainty and cross-comparison calculation method by calling the computer program stored in the memory.

[0049] The instrument channel uncertainty and cross-comparison calculation method, device, storage medium, and electronic device implemented in the present invention have the following beneficial effects: by stratifying the various measurement channels of the instrument at the same measurement point, multiple strata of each measurement channel are obtained; uncertainty calculation is performed on the multiple strata to obtain the expanded uncertainty of each stratum; the expanded uncertainty of each measurement channel is calculated based on the expanded uncertainty of each stratum; the uncertainty of the measurement average value of all measurement channels at the same measurement point is calculated based on the expanded uncertainty of each measurement channel; the criterion value for cross-comparison of instruments at the same measurement point is calculated based on the expanded uncertainty of each measurement channel and the uncertainty of the measurement average value. The present invention can realize the calculation of instrument uncertainty and cross-comparison criterion, provide a reasonable and scientific calculation method, and ensure the accuracy and reliability of instrument judgment. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0051] Figure 11 is a flow chart of a first embodiment of a method for calculating instrument channel uncertainty and cross-comparison provided by the present invention;

[0052] Figure 2 It is a hierarchical schematic diagram of the instrument measurement channel provided by the present invention;

[0053] Figure 3 This is a schematic diagram of signal processing for a layer 1 device provided by the present invention;

[0054] Figure 4 This is a schematic diagram of display value refresh provided by the present invention;

[0055] Figure 5 1 is a flow chart of a second embodiment of the method for calculating the uncertainty and cross-comparison of instrument channels provided by the present invention;

[0056] Figure 6 It is a logic block diagram of the instrument channel uncertainty and cross comparison calculation device provided by the present invention. DETAILED DESCRIPTION

[0057] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. In the description of this application, the meaning of "several" is one or more, the meaning of "more" is more than two, and "greater than", "less than", "exceed", etc. are understood to exclude the number itself, and "above", "below", "within", etc. are understood to include the number itself. If there is a description of the first, the second is only used for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0058] In the description of this specification, it should be understood that the descriptions of directions, such as up, down, left, right, front, and back, and the like, are based on the directions or positional relationships shown in the accompanying drawings and are intended only to facilitate the description of this application and simplify the description. They do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operate in a specific direction, and therefore should not be understood as limiting this application. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments of the present invention without creative effort are within the scope of protection of this invention.

[0059] The present invention determines the channel uncertainty calculation and cross-comparison criterion calculation of the remote transmission instrument (hereinafter referred to as the instrument) of the third-generation EPR nuclear power unit, and provides an instrument channel uncertainty and cross-comparison calculation method. The method is a classified and layered uncertainty and cross-comparison calculation method. The calculation method is reasonable and scientific and can be widely applied to conventional power plants.

[0060] refer to Figure 1 , Figure 1 The present invention provides a flowchart of a preferred embodiment of the method for calculating the uncertainty and cross-comparison of instrument channels.

[0061] Specifically, such as Figure 1 As shown, the instrument channel uncertainty and cross-comparison calculation method includes the following steps:

[0062] Step S101: stratify each measurement channel of an instrument at the same measurement point to obtain multiple strata for each measurement channel.

[0063] Optionally, in step S101 of some embodiments, the multiple layers include: layer 0, layer 1, and layer 2. Specifically, according to the characteristics of the EPR unit instrument measurement channel, the equipment involved in the measurement channel can be divided into layer 0, layer 1, and layer 2 equipment. Among them, the layer 0 equipment is the measuring instrument (i.e., the aforementioned instrument), the layer 1 equipment is the acquisition card, the logic calculation processor, and the like, and the layer 2 equipment is the display component, the display terminal, and the like. Among them, the instrument measurement channel layer is as follows: Figure 2 shown.

[0064] Step S102: performing uncertainty calculation on multiple layers of each measurement channel to obtain the expanded uncertainty of each layer of each measurement channel.

[0065] Optionally, in step S102 of some embodiments, uncertainty calculation is performed on multiple layers of each measurement channel to obtain the expanded uncertainty of each layer of each measurement channel, including: calculating the uncertainty of layer 0 of each measurement channel to obtain the expanded uncertainty of layer 0; calculating the uncertainty of layer 1 of each measurement channel to obtain the expanded uncertainty of layer 1; calculating the uncertainty of layer 2 of each measurement channel to obtain the expanded uncertainty of layer 2.

[0066] Calculating the uncertainty of the 0th layer of each measurement channel to obtain the expanded uncertainty of the 0th layer includes the following steps:

[0067] Step 1: Identify all influencing factors of the instrument.

[0068] Step 2: Determine the distribution type and measurement uncertainty of all influencing factors.

[0069] Step 3: Calculate the standard uncertainty of all influencing factors based on the measurement uncertainty and distribution type.

[0070] Step 4: Calculate the combined uncertainty of level 0 based on the standard uncertainty of all influencing factors.

[0071] Step 5: Calculate based on the composite uncertainty of layer 0 to obtain the expanded uncertainty of layer 0.

[0072] Specifically, instruments on the 0th floor typically include various types of transmitters, sensors, and so on. Since 0th floor equipment is typically installed in process plants, measurements are subject to interference from various environmental factors, such as temperature, radiation, and static pressure. Furthermore, the instruments themselves exhibit annual drift. Based on these characteristics, all influencing factors of the instrument are determined. These factors include: instrument reference accuracy, annual drift, the effects of temperature changes, radiation effects, the effect of static pressure on the zero point, and the effect of static pressure on the instrument range. The instrument reference accuracy follows a normal distribution, while the other influencing factors follow a uniform distribution. The measurement uncertainty of each influencing factor is then determined. Based on the relationship between the confidence probability and confidence factor for each distribution type, the confidence factor for each distribution type is determined. The corresponding standard uncertainty is then calculated based on the confidence factor. The relationship between distribution type, confidence probability, and confidence factor is shown in Table 1.

[0073] Table 1. Relationship between confidence probability and confidence factor for normal and uniform distribution

[0074]

[0075] It should be noted that in the embodiments of the present invention, the uncertainty generated by each influencing factor at each layer is assessed using the Type B uncertainty assessment method (Type B uncertainty is obtained based on empirical measurement data, the accuracy of the instrument itself as stated in the equipment manual, or information such as a calibration certificate). The standard uncertainty of the Layer 0 equipment is shown in Table 2.

[0076] Table 2.0 Standard Uncertainties of Equipment

[0077]

[0078] In Table 2, the measurement uncertainty of each influencing factor is a known quantity. After calculating the standard uncertainty of each influencing factor according to Table 2, the combined uncertainty of the 0 layer can be calculated. The specific calculation formula is as follows:

[0079]

[0080] (1) In the formula, μ c is the composite uncertainty of layer 0.

[0081] The confidence factor K is taken as 1.96, so the expanded uncertainty of level 0 is calculated as follows:

[0082]

[0083] (2) In the formula, U 0层 is the expanded uncertainty of level 0.

[0084] It should be noted that influencing factors will vary depending on the actual instrument measurement situation. For example, regarding the influence of radiation, most instruments in EPR units are installed in the green zone. Under normal operating conditions, the radiation measurement is very small, so the radiation effect can be ignored. In addition, the influence of static pressure applies to differential pressure instruments. For example, a primary flow transmitter has a pressure of 155 bar on both sides. In this case, the influence of static pressure needs to be considered. However, for instruments with low static pressure, the influence can be ignored. For example, if the instruments of an EPR unit that are greatly affected by static pressure have already been static pressure corrected, the influence of static pressure can be ignored when calculating uncertainty.

[0085] Step S103: Calculate the expanded uncertainty of each layer of each measurement channel to obtain the expanded uncertainty of each measurement channel.

[0086] Optionally, in step S103 of some embodiments, the uncertainty of one layer of each measurement channel is calculated to obtain the expanded uncertainty of one layer, including: determining all modules passed by the instrument in one layer; determining all influencing factors of each module; determining the distribution type and measurement uncertainty of all influencing factors of each module; calculating according to the measurement uncertainty of the distribution type to obtain the combined uncertainty of each module; calculating according to the combined uncertainty of each module to obtain the expanded uncertainty of each module; calculating according to the expanded uncertainty of all modules passed by the instrument to obtain the expanded uncertainty of one layer.

[0087] The uncertainty calculation for each channel 1 layer includes the following steps:

[0088] Step 1: Identify all modules involved in layer 1.

[0089] Step 2: Identify all influencing factors for each module.

[0090] Step 3: Determine the distribution type and measurement uncertainty of each influencing factor for each module.

[0091] Step 4: Calculate the standard uncertainty of each influencing factor for each module.

[0092] Step 5: Calculate the combined uncertainty of each module.

[0093] Step 6: Calculate the expanded uncertainty for each module.

[0094] Step 7: Calculate the expanded uncertainty of layer 1 based on the expanded uncertainty of all modules the instrument passes through.

[0095] Specifically, the first layer of equipment mainly realizes functions such as data acquisition, preprocessing, logical calculation, and data output. Taking analog data acquisition as an example, it mainly includes: analog acquisition and processing modules FUM230, SAA1, SNV1, SAI1, temperature sensor and resistance acquisition modules FUM232, STT1 card, logical calculation process processing units AP, APU, etc. The uncertainty of general processing units is negligible. The schematic diagram of the signal processing process of the first layer of equipment is as follows: Figure 3 As shown in the figure, the standard uncertainty of a single module on the first floor is typically installed in the electronics room. The factors affecting the uncertainty of a single module include reference accuracy, temperature variation, and load variation. The effects of reference accuracy and temperature variation apply to all devices, while the effects of load variation generally apply to the STT1 and SNV1 modules. Table 3 shows the standard uncertainty of a single module.

[0096] Table 3.1 Standard uncertainty of a single module

[0097]

[0098] According to Table 3, the combined uncertainty of a single module can be obtained. The specific calculation formula is as follows:

[0099]

[0100] Taking the confidence factor K as 1.96, the expanded uncertainty calculation formula for a single module is as follows:

[0101]

[0102] According to formula (3) and formula (4), the expanded uncertainty of all modules in layer 1 can be calculated. Therefore, when calculating the expanded uncertainty of layer 1, it is synthesized according to the modules that it actually passes through. For example, if a signal passes through SAA1, SNV1, and FUM230 cards, the expanded uncertainty calculation formula for layer 1 is as follows:

[0103]

[0104] U in formula (5) SAA1 、U SNV1 、U FUM230 is the expanded uncertainty of a single module calculated according to formula (4).

[0105] Optionally, in step S103 of some embodiments, the uncertainty of the two layers of each measurement channel is calculated to obtain the expanded uncertainty of the two layers, including: determining all influencing factors of the two layers; determining the distribution type of each influencing factor; calculating the measurement uncertainty of each influencing factor; calculating according to the measurement uncertainty and distribution type to obtain the standard uncertainty of all influencing factors; calculating according to the standard uncertainty of all influencing factors to obtain the expanded uncertainty of the two layers.

[0106] The uncertainty calculation for each channel 2 layer specifically includes the following steps:

[0107] Step 1: Identify all influencing factors of layer 2.

[0108] Step 2: Determine the distribution type of each influencing factor.

[0109] Step 3: Calculate the measurement uncertainty of each influencing factor.

[0110] Step 4: Calculate the standard uncertainty of each influencing factor.

[0111] Step 5: Calculate the expanded uncertainty of the second layer based on the standard uncertainty of each influencing factor.

[0112] Specifically, the display components on the second level of the EPR unit's measurement channel primarily include PICS, SICS, and QDS display systems. Since readings are typically taken on the PICS, the uncertainty calculation for the PICS system is used as an example. The factors influencing the uncertainty of the PICS display include two aspects: the uncertainty introduced by the refresh deadband and refresh time of the displayed value, and the uncertainty introduced by rounding. The factors influencing the uncertainty of the PICS display value are shown in Table 4.

[0113] Table 4. Factors affecting uncertainty of the 2-layer PICS system

[0114]

[0115] The measurement uncertainty of the display value refresh dead zone and time is calculated as follows:

[0116] Each analog signal fed into the second-level display is assigned a corresponding refresh time (Y_ST) and refresh deadband (Y_DELT). Each time Y_ST elapses, the current value is compared with the last refreshed value. If the deviation is greater than Y_DELT, the displayed value is refreshed to the current value. If the deviation is less than Y_DELT, the displayed value is not refreshed. However, the deviation from each comparison accumulates until the cumulative deviation exceeds 16 times Y_DELT, at which point the displayed value is updated to the current value. Figure 4The figure below is a schematic diagram of the display value refresh. Therefore, the calculation formula for the display value refresh dead zone and measurement uncertainty of time is:

[0117]

[0118] Since Y_DELT is generally set to 1% of the range by default, ε 2―1 =1%.

[0119] The measurement uncertainty for rounding of the displayed value is calculated as follows:

[0120] Since the PICS system has a limited number of display digits, the values of analog signals are rounded off. The size of the rounded value is related to the number of decimal places. The calculation formula for its uncertainty is as follows:

[0121]

[0122] Here, n is a multiple of the decimal point.

[0123] Then, the expanded uncertainty of the 2-layer display value can be calculated. Specifically, the display value refresh dead zone, time, and rounding all meet the uniform distribution, and the confidence factor K is taken as 1.96. Therefore, the expanded uncertainty calculation formula of the 2-layer display value is as follows:

[0124]

[0125] Step S104: Calculate the uncertainty of the uncertainty of the measurement average value of all measurement channels at the same measurement point according to the expanded uncertainty of each measurement channel.

[0126] Optionally, in step S104 of some embodiments, the uncertainty of the measurement average value of all measurement channels of the same measurement point is obtained by calculating based on the expanded uncertainty of each measurement channel, including: determining the number of measurement channels of the same measurement point; and obtaining the uncertainty of the measurement average value of all measurement channels of the same measurement point by calculating based on the number of measurement channels and the expanded uncertainty of each measurement channel.

[0127] Specifically, uncertainty calculation is widely used in the calculation of commissioning test criteria, operation test criteria, and maintenance criteria. Assume that there are N measurement channels at the same measurement point, and each measurement channel is equipped with an instrument. The measurement values of each instrument are x1, x2, x3, ..., x N , the calculation formula of its measured average value is as follows:

[0128]

[0129] in, is the measured average value.

[0130] Since the measurement values of N instruments are independent of each other and have equal uncertainties, the calculation formula for the uncertainty of the measurement average value of all measurement channels at the same measurement point is as follows:

[0131]

[0132] in, is the uncertainty of the measurement mean value of all measurement channels at the same measurement point, N is the number of measurement channels, U 总 The expanded uncertainty of an instrument measurement channel.

[0133] Step S105: Calculate the expanded uncertainty of each measurement channel and the uncertainty of the measurement average value to obtain a criterion value for cross-comparison of instruments at the same measurement point.

[0134] Specifically, in step S105 of some embodiments, the maximum allowable deviation between the measured value of an instrument and the average value is Δx max , then the standard for judging the accuracy of the instrument's measurement value is:

[0135]

[0136] Δx max =U 交叉比较 ×Range (12).

[0137] Among them, U 交叉比较 is the uncertainty of cross comparison, that is, the criterion of cross comparison. Through the calculation and transformation of uncertainty, the calculation formula of uncertainty of cross comparison is as follows:

[0138]

[0139] Among them, U 总 is the expanded uncertainty of an instrument measurement channel, is the uncertainty of the measurement mean.

[0140] refer to Figure 5 In another embodiment, the instrument channel uncertainty and cross comparison calculation method further includes:

[0141] Step S501: Calculate the average measurement value of all instruments at the same measurement point.

[0142] Step S502: Calculate the deviation percentage value based on the measurement average value and the measurement value of a single instrument.

[0143] Step S503: Determine whether a single instrument is normal based on the deviation percentage value and the cross-comparison criterion value.

[0144] In the embodiment of the present invention, the combined uncertainty is the root mean square of the standard uncertainty components of each independent random distribution. The expanded uncertainty is expressed as a multiple of the combined standard uncertainty based on the confidence probability and confidence interval, and is calculated as follows:

[0145] U=K×μ c (14).

[0146] Where U is the expanded uncertainty; K is the confidence factor; μ c is the combined standard uncertainty.

[0147] Based on the characteristics of the EPR unit's instrument measurement channels, this paper proposes a hierarchical uncertainty calculation method. This method divides the equipment involved in the channel into 0-layer, 1-layer, and 2-layer devices. Factors that may affect the uncertainty calculation at each layer are considered, and these factors are classified to derive the expanded uncertainty for each layer, ultimately calculating the expanded uncertainty for the entire instrument measurement channel. This method makes the entire calculation process more rational, scientific, and clear. Uncertainty calculation is widely used in the calculation of commissioning test criteria, operating test criteria, and maintenance criteria, and is crucial for determining whether an instrument is accurate and usable.

[0148] The following is an explanation using a specific application example.

[0149] The Safety Injection System (RIS) of a nuclear power plant is designed with four redundant pressure transmitters for measuring the SAB4 plant. The equipment used is the 3154KA3R2F1J2CAQ8Q9W1V5G model produced by Rosemount. The zero point of the equipment pressure test is: -0.2 bar (corresponding to the display range: 0.8 bar), and the full scale of the pressure test is 0.1 bar (corresponding to the display range: 1.1 bar). These four devices are 0-level devices. Assume that the codes of the four instruments are ①, ②, ③, and ④. According to the equipment manual, the calculated value of the impact of temperature changes on its measurement is: 1.97%; the annual drift is: 0.56%; the equipment accuracy is 0.20%. Since the above four 0-level devices are arranged in the safety plant, the influence of radiation and static pressure is not considered. The expanded uncertainty of the above single-channel 0-level device is:

[0150]

[0151] The analog card used to collect data from these four devices is FUM230 (Siemens), which is a layer 1 device.

[0152] According to the analog card's manual, the card's reference accuracy is 0.25% (calibrated for a range of 0-20mA at 25°C), and the temperature effect is 0.09% / 10°C. During normal operation, the room temperature where the equipment is located ranges from 20-28°C, so in subsequent calculations, we assume an ambient temperature of 23°C. Furthermore, considering the maximum temperature variation in the cabinet where the card is located, ΔT = 12°C, the FUM 230 module's acquisition signal range is 4-20mA.

[0153] The expanded uncertainty of the single instrument channel 1 layer device is:

[0154]

[0155] The display range is (0.8~1.1)bar, and it is displayed as #.###, retaining 3 decimal places. The refresh dead zone is 1%. This is a 2-layer device.

[0156] The expanded uncertainty of the above single instrument channel 2-layer device is:

[0157]

[0158] The expanded uncertainty of a single instrument channel is:

[0159]

[0160] The calculated uncertainty of the mean value of the four measuring instruments is as follows:

[0161]

[0162] Through the calculation and conversion of uncertainty, the standard values for cross-comparison of the above four transmitters are as follows:

[0163]

[0164] Assume that the second-level display values of the four instruments are as shown in Table 5:

[0165] Table 5

[0166] Instrument Code Second layer display value ① 0.883 ② 0.885 ③ 0.903 ④ 0.900

[0167] From the data in Table 5, it can be calculated that the average value of the four instruments is: (0.883+0.885+0.903+0.900)÷4=0.89275.

[0168] To determine whether instrument No. 1 is normal, you need to subtract the average value from the measured value of instrument No. 1, take the absolute value, and then divide it by the range of instrument No. 1. Compare the calculated deviation percentage value with the cross-comparison criterion value. If it is less than the criterion value, it is determined that instrument No. 1 is normal. If it exceeds the criterion value, it is determined that there is a problem with instrument No. 1 and it needs to be intervened.

[0169] The specific calculation of the deviation percentage value is as follows:

[0170] |0.89275-0.883|÷0.3*100%=3.25%;

[0171] From the above formula, we can get the deviation percentage value: 3.25%. It can be seen that 3.25%>2.93%. Therefore, it can be determined that there is a problem with instrument No. 1 and it needs to be intervened.

[0172] refer to Figure 6 , the present invention also provides an instrument channel uncertainty and cross comparison calculation device.

[0173] like Figure 6 As shown, the instrument channel uncertainty and cross comparison calculation device includes:

[0174] A stratification unit 601 is used to stratify the measurement channels of the instrument at the same measurement point to obtain multiple strata for each measurement channel;

[0175] The layer uncertainty calculation unit 602 is used to calculate the combined uncertainty of multiple layers of each measurement channel to obtain the combined uncertainty of each layer of each measurement channel;

[0176] The channel uncertainty calculation unit 603 is used to calculate the combined uncertainty of each layer of each measurement channel to obtain the combined uncertainty of each measurement channel;

[0177] An average uncertainty calculation unit 604 is used to calculate the uncertainty of the average value of all instruments at the same measurement point based on the combined uncertainty of each measurement channel;

[0178] The cross comparison calculation unit 605 is used to calculate the cross comparison criterion value of the instruments at the same measurement point based on the combined uncertainty of each measurement channel and the uncertainty of the average value of all instruments.

[0179] Specifically, the specific coordination operation process between the various units in the instrument channel uncertainty and cross comparison calculation device here can refer to the above-mentioned instrument channel uncertainty and cross comparison calculation method, which will not be repeated here.

[0180] In addition, an electronic device of the present invention includes a memory and a processor; the memory is used to store a computer program; the processor is used to execute the computer program to implement the instrument channel uncertainty and cross-comparison calculation method as any one of the above. Specifically, according to an embodiment of the present invention, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present invention includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program contains program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed by an electronic device and, when executed, performs the above functions defined in the method of the embodiment of the present invention. The electronic device in the present invention can be a terminal such as a notebook, desktop, tablet computer, smart phone, or a server.

[0181] In addition, the present invention provides a storage medium having a computer program stored thereon. When executed by a processor, the computer program implements any of the above-mentioned instrument channel uncertainty and cross-comparison calculation methods. Specifically, it should be noted that the storage medium of the present invention may be a computer-readable signal medium or a computer-readable storage medium, or any combination thereof. Computer-readable storage media may be, for example, but not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or components, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to, an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, a computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, device, or component. In the present invention, a computer-readable signal medium may include a data signal transmitted in baseband or as part of a carrier wave, which carries computer-readable program code. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium that can transmit, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device. Program code embodied on a computer-readable medium may be transmitted using any suitable medium, including but not limited to wires, optical cables, RF (radio frequency), or any suitable combination thereof.

[0182] The computer-readable medium may be included in the electronic device, or may exist independently without being incorporated into the electronic device.

[0183] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. Reference can be made to the common and similar parts between the various embodiments. For the devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple, and the relevant parts can be referred to the method description.

[0184] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present invention.

[0185] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0186] The above embodiments are intended only to illustrate the technical concepts and features of the present invention. Their purpose is to enable those skilled in the art to understand the present invention and implement it accordingly. They are not intended to limit the scope of protection of the present invention. All equivalent variations and modifications within the scope of the claims of the present invention are intended to be covered by the claims of the present invention.

Claims

1. A method for calculating instrument channel uncertainty and cross-comparison, characterized in that: The following steps are involved: Layering each measurement channel of an instrument at the same measurement point to obtain multiple layers for each measurement channel; performing uncertainty calculation on multiple layers of each of the measurement channels to obtain expanded uncertainty of each layer of each of the measurement channels; Calculating according to the expanded uncertainty of each layer of each measurement channel to obtain the expanded uncertainty of each measurement channel; Calculating based on the expanded uncertainty of each measurement channel to obtain the uncertainty of the measurement average value of all measurement channels at the same measurement point; Calculation is performed based on the expanded uncertainty of each measurement channel and the uncertainty of the measurement average value to obtain a criterion value for cross-comparison of instruments at the same measurement point.

2. The instrument channel uncertainty and cross comparison calculation method according to claim 1 is characterized in that: The multiple layers include: layer 0, layer 1 and layer 2; Calculating the uncertainty of the multiple layers of each measurement channel to obtain the expanded uncertainty of each layer of each measurement channel includes: Calculating the uncertainty of the 0th layer of each of the measurement channels to obtain the expanded uncertainty of the 0th layer; Calculating the uncertainty of one layer of each measurement channel to obtain an expanded uncertainty of one layer; The two-layer uncertainty of each of the measurement channels is calculated to obtain the two-layer expanded uncertainty.

3. The instrument channel uncertainty and cross comparison calculation method according to claim 2 is characterized in that: Calculating the uncertainty of the 0th layer of each of the measurement channels to obtain the expanded uncertainty of the 0th layer includes: Identify all influencing factors of the instrument; Determine the distribution type and measurement uncertainty of all the influencing factors mentioned; Calculate based on the measurement uncertainty and the distribution type to obtain the standard uncertainty of all the influencing factors; Calculate the combined uncertainty of the 0 layer based on the standard uncertainties of all the influencing factors; Calculation is performed based on the composite uncertainty of the 0 layer to obtain the expanded uncertainty of the 0 layer.

4. The instrument channel uncertainty and cross comparison calculation method according to claim 2 is characterized in that: Calculating the uncertainty of one layer of each measurement channel to obtain the expanded uncertainty of one layer includes: Determine all modules that the instrument passes through in the first layer; Determine all influencing factors for each of said modules; Determine the distribution type and measurement uncertainty of all influencing factors of each of the modules; Calculate the measurement uncertainty of each module according to the distribution type to obtain the combined uncertainty; Calculating according to the combined uncertainty of each module to obtain the expanded uncertainty of each module; The expanded uncertainty of the first layer is obtained by performing calculations based on the expanded uncertainties of all modules that the instrument passes through.

5. The instrument channel uncertainty and cross comparison calculation method according to claim 2 is characterized in that: Calculating the two-layer uncertainty of each of the measurement channels to obtain the two-layer expanded uncertainty includes: Determine all influencing factors of the two layers; determining a distribution type of each of the influencing factors; Calculate the measurement uncertainty of each of the influencing factors; Calculate based on the measurement uncertainty and the distribution type to obtain the standard uncertainty of all the influencing factors; The expanded uncertainty of the two layers is obtained by calculating the standard uncertainty of all the influencing factors.

6. The instrument channel uncertainty and cross comparison calculation method according to claim 1 is characterized in that: The uncertainty of the uncertainty of the measurement average value of all measurement channels at the same measurement point obtained by calculating the uncertainty of each measurement channel according to the expanded uncertainty of each measurement channel includes: Determining the number of measurement channels at the same measurement point; The uncertainty of the measurement average value of all the measurement channels at the same measurement point is obtained by performing calculations based on the number of the measurement channels and the expanded uncertainty of each of the measurement channels.

7. The instrument channel uncertainty and cross comparison calculation method according to any one of claims 1 to 6, characterized in that: Also includes: Calculate the measurement average of all instruments at the same measuring point; Calculating based on the measurement average and the measurement value of a single instrument to obtain a deviation percentage value; Whether the single instrument is normal is determined according to the deviation percentage value and the cross-comparison criterion value.

8. An instrument channel uncertainty and cross comparison calculation device, characterized in that: include: a stratification unit, configured to stratify the respective measurement channels of the instrument at the same measurement point to obtain a plurality of strata for each of the measurement channels; a layered uncertainty calculation unit, configured to calculate the combined uncertainty of multiple layers of each of the measurement channels to obtain the combined uncertainty of each layer of each of the measurement channels; a channel uncertainty calculation unit, configured to calculate, based on the combined uncertainty of each layer of each measurement channel, to obtain a combined uncertainty of each measurement channel; an average uncertainty calculation unit, configured to calculate the uncertainty of the average value of all instruments at the same measurement point according to the combined uncertainty of each measurement channel; The cross comparison calculation unit is used to calculate according to the combined uncertainty of each measurement channel and the uncertainty of the average value of all the instruments to obtain the criterion value for the cross comparison of the instruments at the same measurement point.

9. A storage medium, characterized in that: The storage medium stores a computer program, which is suitable for being loaded by a processor to execute the steps of the instrument channel uncertainty and cross-comparison calculation method according to any one of claims 1 to 7.

10. An electronic device, characterized in that: The method comprises a memory and a processor, wherein a computer program is stored in the memory, and the processor executes the steps of the instrument channel uncertainty and cross-comparison calculation method according to any one of claims 1 to 7 by calling the computer program stored in the memory.

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