Method and system for establishing aging analysis and maintenance strategy of card of nuclear power station

Abstract

The invention relates to a nuclear power station card aging analysis and maintenance strategy establishment method and system. The method comprises the following steps: acquiring image information of a card; component identification is carried out based on the image information, and all components in the card and component information corresponding to all the components are obtained; determining aging information of the component according to the component information in combination with a maintenance manual of the component; determining the working environment of the card; analyzing and evaluating according to the aging information of the component and the working environment of the card to obtain the predicted life of the card; determining the grade of the card; and determining a maintenance strategy of the card according to the predicted service life of the card and the grade of the card. According to the invention, accurate aging grading and classification management of the card can be realized, key equipment influencing the availability of a unit is guaranteed to be preferentially and strictly managed, stable operation of the unit is realized, the cost of spare parts is saved, meanwhile, the service life of the aged component is analyzed, the service life of the card is evaluated, a maintenance strategy is given, and the reliability of the equipment is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of card management in nuclear power plants, and more particularly to a method and system for analyzing aging of card aging and establishing a maintenance strategy for nuclear power plants. Background Art

[0002] During operation, nuclear power plants often experience problems such as DCS card failures. These can lead to unit load shedding and communication failures that compromise redundant control. Therefore, a DCS card maintenance strategy is necessary. However, nuclear power plants currently lack clear requirements for card maintenance strategies and cycles, and lack methods for analyzing card aging and maintenance strategies. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a method and system for analyzing the aging of card parts and establishing a maintenance strategy for a nuclear power plant in response to the problems existing in the prior art.

[0004] The technical solution adopted by the present invention to solve the technical problem is to construct a method for analyzing the aging of card parts and establishing a maintenance strategy for a nuclear power plant, comprising the following steps:

[0005] Obtain image information of the card;

[0006] Perform component identification based on the image information to obtain all components in the card and device information corresponding to all components;

[0007] Determining aging information of all components based on the component information and in combination with maintenance manuals of all components;

[0008] Determining the working environment of the card;

[0009] Analyze and evaluate the aging information of all components, the working environment of the card and / or empirical data to obtain the predicted life of the card;

[0010] Determining the grade of the card;

[0011] A maintenance strategy for the card component is determined according to the predicted life of the card component and the grade of the card component.

[0012] In the method for analyzing aging of card components and establishing a maintenance strategy for a nuclear power plant according to the present invention, determining the working environment of the card components includes:

[0013] Obtaining an on-site temperature measurement method of the card;

[0014] The working environment of the card component is determined according to the on-site temperature measurement method of the card component.

[0015] In the method for analyzing aging of card components and establishing a maintenance strategy for a nuclear power plant according to the present invention, the grades of the card components include: grade A and grade B;

[0016] Determining the level of the card comprises:

[0017] Obtaining expiration information of the card;

[0018] Identifying the failure type of the card component and the failure impact of the card component according to the failure information;

[0019] If the failure type of the card component is a single fault failure, identifying the failure impact of the card component;

[0020] If the failure impact of the card component is significant, the card component is determined to be grade A;

[0021] If the failure impact of the card component is non-significant, the grade of the card component is determined to be Class B.

[0022] In the method for analyzing the aging of card components and establishing a maintenance strategy for a nuclear power plant described in the present invention, the important impacts include: a single fault causing shutdown or reactor shutdown or requiring shutdown for treatment; a single fault causing failure of the diesel engine, high-pressure injection, or auxiliary water supply function; a single fault causing failure of major equipment protection; a single fault causing hydrogen explosion risk; a DCS system or equipment containing tripping or reactor tripping or causing load transient or state degradation signals; a single fault causing tripping or reactor tripping or load rejection or state degradation signals;

[0023] The non-significant impacts include: a single fault causing a reduction in the availability of the power plant, a single fault causing a trip of the machine or reactor, and degradation of the protection redundancy, safety protection redundancy, and major equipment protection redundancy.

[0024] In the method for analyzing aging of card components and establishing a maintenance strategy for a nuclear power plant according to the present invention, the Class A includes: Class A1 and Class A2;

[0025] The A1-level cards include: Class A cards that contain short-life components or require regular replacement, Class A cards with a high risk of aging failure, or Class A cards that produce transient irreversible failures;

[0026] The A2-level cards include: all A-level cards except A1-level cards;

[0027] The B level includes: B1 level and B2 level;

[0028] The B1-level cards include: B-level cards containing short-life components, or B-level cards with a high risk of aging failure;

[0029] The B2-level cards include: all B-level cards except B1-level cards.

[0030] In the method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to the present invention, the method further includes:

[0031] Establish an aging database;

[0032] Generate guidelines for disassembly and aging identification of card parts.

[0033] In the method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to the present invention, the method further includes:

[0034] Receive query instructions;

[0035] Search and match the aging database according to the query instruction to obtain corresponding query information;

[0036] The query information is output and displayed.

[0037] The present invention also provides a system for analyzing aging of components in a nuclear power plant and establishing a maintenance strategy, comprising:

[0038] An image acquisition unit, used to acquire image information of the card;

[0039] A device identification unit, configured to identify components based on the image information, and obtain all components in the card and device information corresponding to all components;

[0040] an aging information analysis unit, configured to determine aging information of all components based on the component information and in combination with maintenance manuals of all components;

[0041] An environment determination unit, configured to determine a working environment of the card;

[0042] A life prediction unit, configured to analyze and evaluate the aging information of all components, the working environment of the card and / or empirical data to obtain a predicted life of the card;

[0043] a grade determination unit, configured to determine the grade of the card;

[0044] A maintenance strategy generating unit is used to determine a maintenance strategy for the card component according to the predicted life of the card component and the grade of the card component.

[0045] The card aging analysis and maintenance strategy establishment system for a nuclear power plant according to the present invention further includes: a query unit,

[0046] The query unit is used to perform the following actions:

[0047] Receive query instructions;

[0048] Search and match the aging database according to the query instruction to obtain corresponding query information;

[0049] The query information is output and displayed.

[0050] In the nuclear power plant component aging analysis and maintenance strategy establishment system of the present invention, the query unit includes:

[0051] Basic data query module, used to perform classified query on basic equipment information;

[0052] Management plan query module, used to query the aging management plan of the card;

[0053] Maintenance plan formulation and maintenance history query module, used to query maintenance plan and overhaul historical processing information;

[0054] Task query module, used to query pending task information;

[0055] Aging identification query module, used to query aging analysis reports and results;

[0056] Experience feedback query module, used to query internal and external experience feedback information;

[0057] The aging document query module is used to query historical aging file information.

[0058] The method and system for establishing a card aging analysis and maintenance strategy for a nuclear power plant according to the present invention have the following beneficial effects: including: obtaining image information of the card; identifying components based on the image information to obtain all components in the card and the device information corresponding to all components; determining the aging information of the component based on the device information and in combination with the maintenance manual of the component; determining the working environment of the card; analyzing and evaluating the aging information of the component and the working environment of the card to obtain the predicted life of the card; determining the grade of the card; determining the maintenance strategy of the card based on the predicted life of the card and the grade of the card. The present invention can achieve accurate aging classification and management of the card, ensure that the key equipment that affects the availability of the unit is given priority and strict management, achieve stable operation of the unit and save spare parts costs, and at the same time perform life analysis on aging components, evaluate the life of the card, and provide maintenance strategies to improve the reliability of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0059] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0060] Figure 1 This is a flow chart of an embodiment of a method for analyzing aging of card components and establishing a maintenance strategy for a nuclear power plant provided by the present invention;

[0061] Figure 2This is a flow chart of another embodiment of the method for analyzing aging of card components and establishing a maintenance strategy for a nuclear power plant provided by the present invention;

[0062] Figure 3 This is a flow chart of another embodiment of the method for analyzing aging of card components and establishing a maintenance strategy for a nuclear power plant provided by the present invention;

[0063] Figure 4 This is a logic block diagram of a card aging analysis and maintenance strategy establishment system for a nuclear power plant provided by the present invention;

[0064] Figure 5 It is the display interface of the basic data list provided by the present invention. DETAILED DESCRIPTION

[0065] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0066] The present invention provides a method for analyzing the aging of card parts and establishing a maintenance strategy for a nuclear power plant. The method can perform aging analysis on card parts, perform hierarchical and classified management on the card parts in the nuclear power plant, establish an aging database for data query, and establish aging identification guidelines for card parts, thereby ensuring the stable operation of the unit and saving spare parts costs.

[0067] refer to Figure 1 The method for analyzing the aging of components in a nuclear power plant and establishing a maintenance strategy provided by the present invention comprises the following steps:

[0068] Step S101: Acquire the image information of the card.

[0069] Specifically, in some embodiments, the image information of the card component is a picture of the card component, wherein the image information of the card component can be obtained by photographing an image acquisition device such as a camera. It should be noted that the image information of the card component is an image of the disassembled card component, that is, the image of the card component is an image that can display all components on the card component. The card component can be a faulty card component or a detachable spare part (also a card component). By photographing the disassembled card component, images of all components on the card component can be obtained.

[0070] Step S102: Component identification is performed based on the image information to obtain all components in the card and the device information corresponding to all components.

[0071] Specifically, all components in the card include, but are not limited to, capacitors, resistors, optocouplers, fuses, and the like. Component information includes, but is not limited to, the device model, brand, model, manufacturer, quantity, and parameters. By performing image and information recognition on the card image, all components in the card and the corresponding device information for each component can be obtained. Conventional methods can be used to identify the images and information of components on the card, and this is not specifically limited in the present invention; as long as the components and device information on the card can be identified, the method is sufficient.

[0072] Step S103: Determine aging information of all components based on the component information and in combination with the maintenance manuals of all components.

[0073] Specifically, in some embodiments, after obtaining device information for all components on the card, the maintenance manual for each component is used to determine whether it requires aging, thereby determining aging information for all components on the card. Optionally, component aging information may include, but is not limited to, the component's lifespan at the manufacturer's rated temperature, the rated temperature, and whether aging is required.

[0074] Step S104: Determine the working environment of the card.

[0075] Optionally, in some embodiments, determining the card's operating environment includes: obtaining an on-site temperature measurement method of the card; and determining the card's operating environment based on the on-site temperature measurement method. Specifically, the on-site temperature measurement method includes factory temperature measurement, cabinet temperature measurement, etc. The card's operating environment can be determined based on the on-site temperature measurement method. For example, factory temperature measurement can determine that the card's operating environment is inside the factory, while cabinet temperature measurement can determine that the card's operating environment is inside the cabinet.

[0076] Step S105: Analyze and evaluate the aging information of all components, the working environment of the card and / or empirical data to obtain the predicted life of the card.

[0077] Optionally, in some embodiments, the evaluation of the predicted life of the card can be achieved through the following specific steps.

[0078] First, based on the aging information of all components, the aged components are determined. Specifically, the aged components are identified based on whether the components need aging. The aged components here generally refer to components that are prone to aging.

[0079] Secondly, analyze and calculate the expected life of aging components.

[0080] Among them, for capacitor components, after determining the working environment of the card, the temperature measurement method of the aging components is determined based on its working environment, and then the actual temperature test is performed according to the temperature measurement method to obtain the actual measured temperature of the aging components. Specifically, the expected life of the key components can be calculated based on the measured temperature of the aging components, the life of the key components at the manufacturer's rated temperature, and the rated temperature of the key components. Among them, the expected life of capacitor components can be calculated using the following formula:

[0081]

[0082] (1) Where L0 is the life at the manufacturer's rated temperature, T0 is the rated temperature, and T s is the measured surface temperature, and L is the expected life at the corresponding temperature.

[0083] Alternatively, the expected life of the capacitor can be evaluated based on the manufacturer's instructions; or, the expected life of the capacitor can be estimated based on the operating experience data of nuclear power plants.

[0084] For components such as fuses and optocouplers, their expected lifespan can be estimated based on the operating experience data of nuclear power plants.

[0085] Finally, a comprehensive evaluation is performed based on the expected lifespan of each aging component to obtain the predicted lifespan of the card. The predicted lifespan of the card is based on the shortest expected lifespan of all aging components.

[0086] Step S106: Determine the level of the card.

[0087] Optionally, in some embodiments, the card component grades include: Grade A and Grade B. Determining the grade of the card component includes: obtaining the failure information of the card component; identifying the failure type of the card component and the failure impact of the card component based on the failure information; if the failure type of the card component is a single fault failure, identifying the failure impact of the card component; if the failure impact of the card component is an important impact, determining the grade of the card component to be Grade A; if the failure impact of the card component is a non-important impact, determining the grade of the card component to be Grade B. Furthermore, the grade of the card component also includes: Grade C. Grade C refers to other cards except Grade A and Grade B. Generally speaking, Grade C equipment may not be included in the scope of instrumentation and control reliability and aging management in principle.

[0088] In some embodiments, important impacts include: a single fault causing shutdown or reactor shutdown or requiring shutdown for processing; a single fault causing failure of diesel engine, high-pressure injection, and auxiliary water supply functions; a single fault causing failure of major equipment protection; a single fault causing hydrogen explosion risk; the DCS system and equipment contain trip and reactor trip signals or cause load transient or state degradation; a single fault causes trip and reactor trip signals or load rejection or state degradation; non-important impacts include: a single fault causing reduced power plant availability; a single fault causing degradation of trip and reactor protection redundancy, safety protection redundancy, and major equipment protection redundancy.

[0089] Optionally, Class A includes: Class A1 and Class A2; Class A1 cards include: Class A cards containing short-life components or requiring regular replacement, or Class A cards with a high risk of aging failure, or Class A cards that produce transient irreversible failures; Class A2 cards include: all Class A cards except Class A1.

[0090] Optionally, Class B includes: Class B1 and Class B2; Class B1 cards include: Class B cards containing short-life components, or Class B cards with a high risk of aging failure; Class B2 cards include: all Class B cards except Class B1.

[0091] Specifically, according to the impact caused by the card failure, the present invention can classify the card into different levels. The classification principles of different levels are as follows:

[0092] Class A cards: Cards whose single failure causes shutdown or requires shutdown for processing; cards whose single failure causes failure of diesel engine, high-pressure injection, or auxiliary water supply functions; cards whose single failure causes failure of major equipment protection; cards whose single failure causes hydrogen explosion risk. Cards in DCS systems and equipment that contain tripping or transient load or state-degrading signals; cards whose single failure causes loss of server / controller or communication A / B columns with tripping or transient load or state-degrading signals. Class A cards can be further divided into Class A1 and Class A2 cards based on aging identification:

[0093] Class A1 equipment: contains short-life components or Class A parts that need to be replaced regularly, or Class A parts with a high risk of aging failure, or parts that produce transient irreversible failures;

[0094] 2) A2-level equipment: all A-level components except A1-level components.

[0095] Class B components: components whose single failure leads to reduced power plant availability; components whose single failure leads to machine tripping, reactor tripping, and degradation of protection redundancy, safety protection redundancy, and major equipment protection redundancy.

[0096] Class B equipment can be further divided into Class B1 equipment and Class B2 equipment based on aging identification:

[0097] 1) Class B1 equipment: Class B equipment containing short-life components, or Class B equipment with a high risk of aging failure;

[0098] 2) Class B2 equipment: All Class B equipment except Class B1.

[0099] Step S107: Determine a maintenance strategy for the card component based on the predicted life of the card component and the grade of the card component.

[0100] The following explanation is made using the signal acquisition card FUM230 as an example.

[0101] After disassembling the signal acquisition card FUM230, a 360-degree camera was used to capture the disassembled FUM230H, capturing all components and their corresponding device information. The system then identified all components to identify those prone to aging, thereby determining the most vulnerable components. The aging components on the FUM230 included electrolytic capacitors PW, BC116, SMG, fuses 373, NA, and optocoupler AQW214.

[0102] The parameter information of each aged component is shown in Table 1 below.

[0103] Table 1. Parameter information of various aged components

[0104]

[0105] As can be seen from the table above, the FUM230 card uses three types of electrolytic capacitors for the internal power supply circuits of the card. The main indicators of these three electrolytic capacitors in the manufacturer's manual are compared in Table 2 below.

[0106] Table 2. Electrolytic capacitor indicators

[0107]

[0108]

[0109] According to field measurements, the surface temperature of the capacitor is generally between 35 and 40°C. Referring to formula (1), the 10-degree rule is used to convert the capacitor manufacturer's durability specifications to the operating temperature to obtain the following table (i.e., Table 3).

[0110] Table 3. Expected lifespan

[0111] model Expected lifespan at 35℃ (years) Expected lifespan at 40℃ (years) UPW 73 51 116RLL 21 15 SMG 7.3 5.2

[0112] fuse:

[0113] FUM230 uses one Littelfuse 373 series fast-acting fuse, 15A, 250V;

[0114] FUM230 uses one Littelfuse fast-acting fuse installed on the front panel with a parameter of 25A, 250V.

[0115] Optocoupler:

[0116] FUM230 uses 18 AQW214 and 4 2601 optocouplers, respectively. The main parameter characteristics are shown in Table 4.

[0117] Table 4. Parameter characteristics of optocouplers

[0118] Model / Parameters AQW214 2601 Input voltage (V) 5 4.5-5.5 Input current (mA) 50 60 Allowable load voltage (V) 400 7 Allowable load current (mA) 100 50 On-time (ms) 0.31 48 Turn-off time (ms) 0.5 50 Operating temperature range (℃) -40-85 0-70

[0119] At the same time, the precautions for the card are given as follows:

[0120] Spare parts must be stored in a dust-free warehouse with constant temperature and humidity, avoiding severe vibration, impact and strong magnetic fields;

[0121] Storage temperature and humidity: 20℃~25℃, 40%~70%, no condensation;

[0122] The storage environment must have good anti-static measures;

[0123] Wear anti-static gloves and an anti-static wrist strap when removing spare parts or folding components in half;

[0124] When the card is running, the on-site ambient temperature should be controlled at 20-22°C to avoid abnormal temperature inside the machine caused by the external environment where the card is located.

[0125] After obtaining the estimated lifespan of aging components, the predicted lifespan of the card is comprehensively evaluated based on the estimated lifespan of each aging component, and a corresponding maintenance strategy is provided. The details are shown in Tables 5 and 6.

[0126] Table 5. Maintenance strategies for various aging components

[0127]

[0128] Table 6. Predicted lifespan and maintenance strategies for card components

[0129]

[0130] refer to Figure 2 In another embodiment, the method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant further includes the above steps:

[0131] Step S201: Establishing an aging database.

[0132] Step S202: Generate card disassembly and aging identification guidelines.

[0133] Specifically, after performing an aging analysis on a card and generating a corresponding maintenance strategy based on the method of Example 1, an aging database can be generated based on the relevant data obtained above. The aging database may include, but is not limited to, the card's grade, all components within the card and their corresponding device information, and aged components and related parameter information (such as model, manufacturer, quantity, brand, and parameters). Generating the aging database facilitates subsequent data queries. Relevant aging history documents can also be uploaded for review.

[0134] Furthermore, the present invention can also generate a card disassembly and aging identification guide based on the method of Example 1. The relevant contents of the disassembly and aging identification guide may include but are not limited to the contents of Tables 1 to 6, as well as relevant precautions for the card (as described above).

[0135] Furthermore, if Figure 3 As shown, in another embodiment, the method for analyzing the aging of components and establishing a maintenance strategy for a nuclear power plant further includes the following steps:

[0136] Step S301: Receive a query instruction.

[0137] Optionally, in some embodiments, the query instructions may include but are not limited to: basic data query instructions, management plan query instructions, maintenance plan formulation and maintenance history query instructions, task query instructions, aging identification query instructions, experience feedback query instructions, aging document query instructions, etc.

[0138] Step S302: performing a search and match in the aging database according to the query instruction to obtain corresponding query information.

[0139] Specifically, in this step, according to the received query instruction, a corresponding query function is executed in a corresponding functional module of the system to obtain matching query information.

[0140] Step S303: Output and display the query information.

[0141] This invention enables precise categorization and management of components, ensuring that critical components that impact unit availability receive priority and strict management, ensuring stable unit operation and saving spare parts costs. Furthermore, the invention uses on-site temperature measurement and aging component life analysis methods to predict and assess component lifespans and provide corresponding maintenance strategies, significantly improving equipment reliability.

[0142] refer to Figure 4 The present invention also provides a card aging analysis and maintenance strategy establishment system for a nuclear power plant.

[0143] Specifically, such as Figure 4 As shown, the nuclear power plant's card aging analysis and maintenance strategy establishment system includes:

[0144] The image acquisition unit 401 is used to acquire image information of the card.

[0145] The device identification unit 402 is used to identify components based on the image information, and obtain all components in the card and the device information corresponding to all components.

[0146] The aging information analysis unit 403 is configured to determine the aging information of all components based on the component information and in combination with the maintenance manuals of all components.

[0147] The environment determination unit 404 is used to determine the working environment of the card.

[0148] The life prediction unit 405 is used to analyze and evaluate the aging information of all components, the working environment of the card and / or empirical data to obtain the predicted life of the card.

[0149] The level determination unit 406 is used to determine the level of the card.

[0150] The maintenance strategy generating unit 407 is configured to determine a maintenance strategy for a card according to the predicted life of the card and the grade of the card.

[0151] Furthermore, the nuclear power plant component aging analysis and maintenance strategy establishment system also includes a query unit, which is configured to: receive a query instruction; perform a search and match in the aging database based on the query instruction to obtain corresponding query information; and output and display the query information.

[0152] Optionally, in some embodiments, the query unit includes: a basic data query module for classified query of basic equipment information; a management plan query module for querying the aging management plan of the card; a maintenance plan formulation and maintenance history query module for querying the historical processing information of maintenance plans and overhauls; a task query module for querying the information of pending tasks; an aging identification query module for querying aging analysis reports and results; an experience feedback query module for querying internal and external experience feedback information; and an aging document query module for querying historical aging file information.

[0153] Specifically, such as Figure 5As shown, the basic data query module queries basic information by categorizing and querying component / device basic information in the basic database (i.e., the aging database), such as device model and online time. The corresponding management solution can be found by querying the management solution module. The management solution is achieved by matching the component aging classification with the maintenance strategy recommended by the aging guidelines according to the aforementioned method and then saving it to the aging database. The maintenance plan development and repair history query module enables queries of maintenance plans and repair history records. Optionally, the maintenance plan development and repair history query module may include a maintenance plan module, an on-site execution module, and a project browsing module. These modules can be used to query the maintenance plan for a specific overhaul or historical processing information for a particular overhaul. For example, the export button in the maintenance plan module allows for querying a summary of more maintenance plans and historical processing information. Equipment replacement information outside of the A / B category can also be queried in the on-site execution module.

[0154] The Task Query module allows you to query information about tasks currently handled by the current handler. Furthermore, in the Application Tracking module, you can query the status or change history of items within a process by functional location, applicant, and process status. The Aging Identification Query module allows you to query aging analysis reports and results based on various input criteria. In the Aging Document Query module, you can query aging history documents and related information stored in the database by entering various document query criteria.

[0155] Specifically, the specific coordination operation process between the various units in the card aging analysis and maintenance strategy establishment system of the nuclear power plant can refer to the above-mentioned card aging analysis and maintenance strategy establishment method of the nuclear power plant, which will not be repeated here.

[0156] By applying the present invention to nuclear power plants, the compilation of aging identification guidelines for card components in nuclear power plants and the establishment of an aging database are realized. The hierarchical management data import and synchronization enable the DCS card component management of EPR units to achieve "from 0 to 1" progress, filling the gap in the reliability and aging management system of nuclear power plants. Through the systematic management of card components, focusing on the management of card components that affect the availability of the unit (Class A and Class B cards), while ensuring the safe and stable operation of the unit, costs are effectively saved. For example, the reliability of the DCS card components of a certain nuclear power plant was improved, and a total of 74 DCS card components were disassembled and aging identification guidelines were compiled. The basic database of 470 Class A devices, 3270 Class B devices, and 6350 Class C devices was completed. 1501 management plans were sorted out. Taking the CM903 equipment alone as an example, costs can be saved by 41.72 million per unit every 9 years.

[0157] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. Reference can be made to the common and similar parts between the various embodiments. For the devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple, and the relevant parts can be referred to the method description.

[0158] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present invention.

[0159] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0160] The above embodiments are intended only to illustrate the technical concepts and features of the present invention. Their purpose is to enable those skilled in the art to understand the present invention and implement it accordingly. They are not intended to limit the scope of protection of the present invention. All equivalent variations and modifications within the scope of the claims of the present invention are intended to be covered by the claims of the present invention.

Claims

1. A method for analyzing the aging of components in a nuclear power plant and establishing a maintenance strategy, characterized in that: The following steps are involved: Obtain image information of the card; Perform component identification based on the image information to obtain all components in the card and device information corresponding to all components; Determining aging information of all components based on the component information and in combination with maintenance manuals of all components; Determining the working environment of the card; Analyze and evaluate the aging information of all components, the working environment of the card and / or empirical data to obtain the predicted life of the card; Determining the grade of the card; A maintenance strategy for the card component is determined according to the predicted life of the card component and the grade of the card component.

2. The method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to claim 1, characterized in that: Determining the working environment of the card component includes: Obtaining an on-site temperature measurement method of the card; The working environment of the card component is determined according to the on-site temperature measurement method of the card component.

3. The method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to claim 1, characterized in that: The grades of the cards include: Grade A and Grade B; Determining the level of the card comprises: Obtaining expiration information of the card; Identifying the failure type of the card component and the failure impact of the card component according to the failure information; If the failure type of the card component is a single fault failure, identifying the failure impact of the card component; If the failure impact of the card component is significant, the card component is determined to be grade A; If the failure impact of the card component is non-significant, the grade of the card component is determined to be Class B.

4. The method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to claim 3, characterized in that: The significant impacts include: a single fault causing shutdown or reactor shutdown or requiring shutdown for treatment; a single fault causing failure of the diesel engine, high-pressure injection, or auxiliary water supply functions; a single fault causing failure of major equipment protection; a single fault causing hydrogen explosion risk; the DCS system and equipment contain tripping or reactor tripping signals or cause transient load or state degradation; a single fault causing tripping or reactor tripping, load rejection, or state degradation signals; The non-significant impacts include: a single fault causing a reduction in the availability of the power plant, a single fault causing a trip of the machine or reactor, and degradation of the protection redundancy, safety protection redundancy, and major equipment protection redundancy.

5. The method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to claim 3, characterized in that: The A level includes: A1 level and A2 level; The A1-level cards include: Class A cards that contain short-life components or require regular replacement, Class A cards with a high risk of aging failure, or Class A cards that produce transient irreversible failures; The A2-level cards include: all A-level cards except A1-level cards; The B level includes: B1 level and B2 level; The B1-level cards include: B-level cards containing short-life components, or B-level cards with a high risk of aging failure; The B2-level cards include: all B-level cards except B1-level cards.

6. The method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to any one of claims 1 to 5, characterized in that: The method further comprises: Establish an aging database; Generate guidelines for disassembly and aging identification of card parts.

7. The method for analyzing aging of components and establishing a maintenance strategy for a nuclear power plant according to claim 6, characterized in that: The method further comprises: Receive query instructions; Search and match the aging database according to the query instruction to obtain corresponding query information; The query information is output and displayed.

8. A system for analyzing aging of components and establishing maintenance strategies for nuclear power plants, characterized in that: include: An image acquisition unit, used to acquire image information of the card; A device identification unit, configured to identify components based on the image information, and obtain all components in the card and device information corresponding to all components; an aging information analysis unit, configured to determine aging information of all components based on the component information and in combination with maintenance manuals of all components; An environment determination unit, configured to determine a working environment of the card; A life prediction unit, configured to analyze and evaluate the aging information of all components, the working environment of the card and / or empirical data to obtain a predicted life of the card; a grade determination unit, configured to determine the grade of the card; A maintenance strategy generating unit is used to determine a maintenance strategy for the card component according to the predicted life of the card component and the grade of the card component.

9. The system for analyzing aging of components and establishing maintenance strategies for nuclear power plants according to claim 8, characterized in that: Also includes: Query unit, The query unit is used to perform the following actions: Receive query instructions; Search and match the aging database according to the query instruction to obtain corresponding query information; The query information is output and displayed.

10. The system for analyzing aging of components and establishing maintenance strategies for nuclear power plants according to claim 9, characterized in that: The query unit includes: Basic data query module, used to perform classified query on basic equipment information; Management plan query module, used to query the aging management plan of the card; Maintenance plan formulation and maintenance history query module, used to query maintenance plan and overhaul historical processing information; Task query module, used to query pending task information; Aging identification query module, used to query aging analysis reports and results; Experience feedback query module, used to query internal and external experience feedback information; The aging document query module is used to query historical aging file information.

Images