Robustness evaluation system based on electronic equipment

Abstract

The invention relates to the technical field of data analysis, in particular to a robustness evaluation system based on electronic equipment, which comprises a design module used for designing a built-in program test task of the electronic equipment; the selection module is used for selecting a plurality of electronic equipment built-in program test tasks as application test tasks from the electronic equipment built-in program test tasks designed by the design module; the acquisition module is used for acquiring operation state parameters of the electronic equipment in the process of executing the test task by the electronic equipment; according to the method, diversified tests are provided for the electronic equipment by designing a built-in program test task mode of the electronic equipment, in the test process, the operation robustness of the electronic equipment is evaluated by collecting operation state parameters of the electronic equipment, and finally the message is generated based on the evaluation result and fed back to the user side, so that the user experience is improved. And synchronously controlling an electronic equipment production line to sort unqualified electronic equipment based on an evaluation result, thereby further realizing intelligent control of quality detection of the electronic equipment.

Description

Technical Field

[0001] The present invention relates to the technical field of data analysis, and in particular to a robustness evaluation system based on electronic equipment. Background Art

[0002] Finished electronic equipment testing is a critical step in ensuring product quality. At the end of the production process, specialized equipment and diverse methods are employed to comprehensively inspect the finished product's performance, functionality, and appearance. From electrical performance testing to practical inspections of functional modules and investigations for cosmetic defects, this process eliminates defective products and ensures that the electronic equipment entering the market meets quality standards and is reliable and durable.

[0003] The invention patent application with application number 202310460099.2 discloses an automatic equipment reliability testing system based on an API interface, including a CIjob execution module, an API interface processing module, a cloud platform data receiving module and a WIFI control module: the CIiob execution module is used to set the equipment-side reliability test parameters, and send the network configuration, binding, and equipment control test cases to the API interface through the CIiob execution parameters; the API interface processing module is used to receive the execution parameters from CIjob, communicate with the cloud platform, and accept the execution results returned by the cloud platform: the cloud platform data receiving module accepts the data transmitted from the API interface through the MQTT protocol, and parses it. After parsing, the reliability test control information is sent to the WIFI module, and the execution results returned by the WIFI module are accepted; the WIFI control module is used to accept the equipment reliability control parameters sent by the cloud, and send control commands to the equipment-side electronic control.

[0004] The application aims to solve the problem that "in the existing technology, during the testing process, the mobile phone model, mobile phone version, control size, etc. of the tested mobile phone may affect the accuracy of the reliability test results. In addition, when testing reliability such as network configuration and binding, it is necessary to manually reset the device before testing again, which will waste a lot of manpower and material resources, and is time-consuming and inefficient."

[0005] However, the current production testing of electronic products is still at the stage of qualified testing of built-in circuits. Even if the built-in circuits of electronic products are qualified, the programs loaded inside them may still have operational defects. To this end, we propose a robustness evaluation system based on electronic devices. Summary of the Invention

[0006] In view of the above shortcomings of the prior art, the present invention provides a robustness evaluation system based on electronic devices, which solves the technical problems raised in the above background technology.

[0007] To achieve the above objectives, the present invention is implemented through the following technical solutions: A robustness evaluation system based on electronic equipment, comprising: a design module for designing electronic device built-in program test tasks; a selection module for selecting several electronic device built-in program test tasks from the electronic device built-in program test tasks designed by the design module as test tasks for application; a collection module for collecting electronic device operating status parameters during the electronic device's execution of the test tasks; an evaluation module for receiving the electronic device operating status parameters collected by the collection module and applying the electronic device operating status parameters to evaluate the robustness of the electronic device; a determination module for receiving the electronic device robustness evaluation result from the evaluation module and determining whether the electronic device is qualified based on the evaluation result; a feedback module for receiving module operating information in the system, generating a message based on the module operating information in the system, and providing feedback to the system end user; The design module is interactively connected to a storage unit and a configuration unit at the lower level through a wireless network. The design module is interactively connected to a selection module, a collection module and an evaluation module through a wireless network. The selection module is interactively connected to the storage unit through a wireless network. The evaluation module is interactively connected to an identification unit at the lower level through a wireless network. The identification unit is interactively connected to the configuration unit through a wireless network. The evaluation module is interactively connected to a determination module and a feedback module through a wireless network.

[0008] Furthermore, the electronic device built-in program test task designed in the design module is customized by the system end user, and the design module is provided with submodules at the lower level, including: A storage unit, configured to receive the electronic device built-in program test task designed by the design module and store the electronic device built-in program test task; a configuration unit, configured to traverse the electronic device built-in program test tasks stored in the storage unit and configure a test weight for each electronic device built-in program test task; Among them, the test weight configured for each electronic device built-in program test task in the configuration unit is customized by the system end user and is subject to the electronic device built-in program test task when an electronic device is executed. The higher the memory occupied, the greater the corresponding configured test weight value. The test weight value range of each electronic device built-in program test task configuration is (0, 1].

[0009] Furthermore, when the selection module selects the electronic device built-in program test task, the system end user customizes the corresponding test weight sum threshold of the electronic device built-in program test task so that the corresponding test weight of the selected electronic device built-in program test task is not less than the set threshold; Among them, the selection module selects the operation of the built-in program test task of the electronic device to be executed in the storage unit. When the built-in program test task of the electronic device is selected in the storage unit, a random selection operation is performed based on any one of the random sampling algorithms or the Fisher-Yates shuffling algorithm, so that the number of test tasks executed by each electronic device or the built-in program test tasks of the electronic device are different.

[0010] Furthermore, the electronic device operating status parameters collected by the acquisition module include: the success rate of each test task execution, the time consumed by each test task execution, and the temperature change range of the electronic device during the execution of each test task; When the electronic device executes the selected test task, all test tasks are executed synchronously.

[0011] Furthermore, the electronic device operating status parameters collected by the acquisition module include: the success rate of each test task execution, the time consumed by each test task execution, and the temperature change range of the electronic device during the execution of each test task; When the electronic device executes the selected test task, all test tasks are executed synchronously.

[0012] Furthermore, the evaluation logic of the electronic device robustness is expressed as: ; Where: is the robustness performance value of the electronic equipment; Perform a comprehensive success rate for all test tasks; is the total amount of test tasks; is the theoretical execution time of the i-th test task; The cumulative value of the time taken to execute all test tasks; The total number of test tasks successfully executed; The maximum and minimum values ​​of the temperature change range of the electronic device during the execution of each test task; Among them, the robustness performance value of electronic equipment The larger the value, the better the robustness of the electronic device. Conversely, the smaller the value, the worse the robustness of the electronic device.

[0013] Furthermore, during the initial operation phase of the determination module, a user of the system end customizes a qualified determination interval within the determination module, and the determination module determines whether the electronic device is qualified based on a comparison between the qualified determination interval and the robustness evaluation result of the electronic device; When the robustness evaluation result of the electronic device is within the qualified judgment interval, the electronic device is judged to be qualified; otherwise, the electronic device is judged to be unqualified.

[0014] Furthermore, the determination module is interactively connected to the production equipment of the electronic equipment through a wireless network, and the operation determination result of the determination module is transmitted to the production equipment in real time. After receiving the negative determination result, the production equipment sorts out unqualified electronic devices through the robotic arm or transmission module deployed on the production equipment.

[0015] Furthermore, the module operation information in the system received by the feedback module includes: operation status parameters of the electronic device during the execution of the test task, the robustness evaluation results of the electronic device, and the qualification determination results of the electronic device; The feedback module is connected to the mobile computer device held by the user through a wireless network. The feedback module feeds back the message generated by the operation to the mobile computer held by the user through the wireless network, and the user reads the message content on the mobile computer device.

[0016] Compared with the known public technology, the technical solution provided by the present invention has the following beneficial effects: The present invention provides a robustness evaluation system based on electronic devices. During operation, the system provides diversified tests for electronic devices by designing built-in program test tasks for electronic devices. During the test process, the system evaluates the robustness of electronic device operation by collecting operating status parameters of the electronic devices. Finally, based on the evaluation results, a message is generated and fed back to the user end. Simultaneously, based on the evaluation results, the electronic device production line is controlled to sort out unqualified electronic devices, thereby further realizing intelligent control of electronic device quality detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] To more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. Those skilled in the art can also derive other drawings based on these drawings without inventive effort.

[0018] Figure 1 It is a structural diagram of a robustness evaluation system based on electronic equipment; Figure 2 This is a logical flow diagram of the expanded technical solution in the present invention; Figure 3 This is an example diagram of the background display interface of the technical solution of this release. DETAILED DESCRIPTION

[0019] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0020] The present invention will be further described below with reference to the embodiments.

[0021] Example 1: This embodiment is based on a robustness evaluation system of an electronic device, such as Figure 1 Shown, including: Design module, used to design electronic equipment built-in program test tasks; The electronic device built-in program test tasks designed in the design module are customized by the system end user. The design module is set up with submodules, including: A storage unit, configured to receive the electronic device built-in program test task designed by the design module and store the electronic device built-in program test task; a configuration unit, configured to traverse the electronic device built-in program test tasks stored in the storage unit and configure a test weight for each electronic device built-in program test task; The test weight configured for each electronic device built-in program test task in the configuration unit is customized by the system end user and is subject to the electronic device built-in program test task when executed by an electronic device. The higher the memory occupied, the greater the corresponding configured test weight value. The test weight value range of each electronic device built-in program test task configuration is (0, 1]; A selection module is used to select a number of electronic device built-in program test tasks from the electronic device built-in program test tasks designed by the design module as the test tasks for application; When selecting the electronic device built-in program test task, the selection module sets the test weight sum threshold corresponding to the electronic device built-in program test task selected by the system end user so that the test weight corresponding to the selected electronic device built-in program test task is not less than the set threshold; The selection module selects the electronic device built-in program test task in the storage unit, and when selecting the electronic device built-in program test task in the storage unit, the random selection operation is performed based on any one of a random sampling algorithm and a Fisher-Yates shuffling algorithm, so that the number of test tasks or the electronic device built-in program test tasks executed by each electronic device are different; The acquisition module is used to collect the operating status parameters of the electronic device during the electronic device performs the test task; The electronic equipment operation status parameters collected by the acquisition module include: the success rate of each test task execution, the time consumed by each test task execution, and the temperature change range of the electronic equipment during the execution of each test task; Wherein, when the electronic device executes the selected test task, all test tasks are executed synchronously; An evaluation module, configured to receive the electronic device operating status parameters collected by the collection module, and use the electronic device operating status parameters to evaluate the robustness of the electronic device; The evaluation module is divided into submodules, including: an identification unit, configured to identify a corresponding test weight of each test task currently executed by the electronic device; Among them, the evaluation module has a built-in electronic device robustness evaluation logic. After the identification unit identifies the corresponding test weights of all test tasks currently executed by the electronic device, it performs an evaluation operation of the robustness of the electronic device based on the electronic device robustness evaluation logic; The evaluation logic of the robustness of electronic equipment is expressed as: ; Where: is the robustness performance value of the electronic equipment; Perform a comprehensive success rate for all test tasks; is the total amount of test tasks; is the theoretical execution time of the i-th test task; The cumulative value of the time taken to execute all test tasks; The total number of test tasks successfully executed; The maximum and minimum values ​​of the temperature change range of the electronic device during the execution of each test task; Among them, the robustness performance value of electronic equipment The larger the value, the better the robustness of the electronic device operation; conversely, the smaller the value, the worse the robustness of the electronic device operation; By calculating using the above logic formula, the operational robustness of the electronic device is represented in a digital form, which provides support for further operation of the determination module of the system in this embodiment.

[0022] A determination module, configured to receive the robustness evaluation result of the electronic device from the evaluation module and determine whether the electronic device is qualified based on the evaluation result; During the initial operation phase of the determination module, the system user customizes the qualified determination interval within the determination module. The determination module compares the qualified determination interval with the robustness evaluation results of the electronic equipment to determine whether the electronic equipment is qualified. When the robustness evaluation result of the electronic device is within the qualified judgment interval, the electronic device is judged to be qualified, otherwise the electronic device is judged to be unqualified; The determination module is interactively connected to the production equipment of the electronic devices via a wireless network. The operation determination result of the determination module is transmitted to the production equipment in real time. After receiving the negative determination result, the production equipment sorts the unqualified electronic devices through the robotic arm or transmission module deployed on the production equipment. The feedback module is used to receive the module operation information in the system, generate messages based on the module operation information in the system, and provide feedback to the system end user; The module operation information in the system received by the feedback module includes: the operation status parameters of the electronic equipment during the execution of the test task, the robustness evaluation results of the electronic equipment, and the qualification determination results of the electronic equipment; The feedback module is connected to the mobile computer device held by the user through a wireless network. The feedback module feeds back the message generated by the operation to the mobile computer held by the user through the wireless network, and the user reads the message content on the mobile computer device. The design module is interactively connected to the storage unit and the configuration unit through a wireless network. The design module is interactively connected to the selection module, the acquisition module and the evaluation module through a wireless network. The selection module is interactively connected to the storage unit through a wireless network. The evaluation module is interactively connected to the identification unit through a wireless network. The identification unit is interactively connected to the configuration unit through a wireless network. The evaluation module is interactively connected to the judgment module and the feedback module through a wireless network.

[0023] In this embodiment, through the operation of the above system, a further intelligent management and control effect is achieved for the operation robustness evaluation of electronic equipment, providing effective guarantee for the production quality of electronic equipment.

[0024] As an expansion solution based on the system in this embodiment: The reliability test automation system designed in this solution is divided into access layer, logic layer and application layer.

[0025] The access layer connects the products under test (DUTs) and test instruments to the system described in this solution. It integrates and encapsulates protocols for communication methods such as ETH, Wi-Fi, RS485, RS232, Bluetooth, LoRa, and ZigBee. Through simple configuration, the DUTs and test instruments are connected to the automated test system. The DUTs support both IoT devices and web system software. Test instruments include communication equipment, oscilloscopes, and other instruments.

[0026] The logic layer implements automated test logic processing, test instrument operation, and test process monitoring, and is divided into three parts: Establish multi-dimensional reliability test models by reliability test type (including fault tolerance, recoverability, extreme pressure, long-term stability, etc.), and implement the logic of these models in the automated test system; Reliability testing rarely monitors the testing process, and a monitoring model is established based on the resource classification to be monitored; To achieve automated testing, it is necessary to control the test instrument and encapsulate the operating logic of the test instrument into a model through functional interface control, UI recognition, AI and other technologies.

[0027] The application layer is the operating interface for testers and is divided into four modules: The use case management module generates test cases by calling the logic layer, configuring the test model, setting the operation and resource monitoring methods; The device management module manages the addition and removal of devices to be tested and manages the effectiveness of the devices; The task management module schedules the test cases to be executed in the form of tasks and implements automated test execution according to the strategy; The test report module displays the test case execution results, showing detailed information on success and failure; The specific implementation plan is as follows: 1. Connect the product to be tested to the test device through the communication interface; 2. Select the scenarios to be tested from the stability test model; 3. Set the parameters of the test model and generate stability test cases; 4. Create test tasks and associate the product to be tested, test cases, and test execution equipment; 5. Start the test task execution; 6. Check the test report.

[0028] In summary, during the operation of the system in the above embodiment, a variety of tests are provided for electronic devices by designing built-in program test tasks for electronic devices. During the test, the robustness of the electronic device operation is evaluated by collecting the operating status parameters of the electronic device. Finally, a message is generated based on the evaluation results to feedback to the user end, and the electronic device production line is controlled based on the evaluation results to sort out unqualified electronic devices, thereby further realizing intelligent control of electronic device quality detection.

[0029] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements will not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A robustness evaluation system based on electronic equipment, characterized in that: include: Design module, used to design electronic equipment built-in program test tasks; A selection module is used to select a number of electronic device built-in program test tasks from the electronic device built-in program test tasks designed by the design module as the test tasks for application; The acquisition module is used to collect the operating status parameters of the electronic device during the electronic device performs the test task; An evaluation module, configured to receive the electronic device operating status parameters collected by the collection module, and use the electronic device operating status parameters to evaluate the robustness of the electronic device; A determination module, configured to receive the robustness evaluation result of the electronic device from the evaluation module and determine whether the electronic device is qualified based on the evaluation result; The feedback module is used to receive module operation information in the system, generate messages based on the module operation information in the system, and provide feedback to the system end user.

2. The robustness evaluation system based on electronic equipment according to claim 1, characterized in that: The electronic device built-in program test task designed in the design module is customized by the system end user. The design module is provided with submodules at the lower level, including: A storage unit, configured to receive the electronic device built-in program test task designed by the design module and store the electronic device built-in program test task; a configuration unit, configured to traverse the electronic device built-in program test tasks stored in the storage unit and configure a test weight for each electronic device built-in program test task; Among them, the test weight configured for each electronic device built-in program test task in the configuration unit is customized by the system end user and is subject to the electronic device built-in program test task when an electronic device is executed. The higher the memory occupied, the greater the corresponding configured test weight value. The test weight value range of each electronic device built-in program test task configuration is (0, 1].

3. The robustness evaluation system based on electronic equipment according to claim 1, characterized in that: When the selection module selects the electronic device built-in program test task, the system end user customizes the corresponding test weight sum threshold of the electronic device built-in program test task so that the corresponding test weight of the selected electronic device built-in program test task is not less than the set threshold; Among them, the selection module selects the operation of the built-in program test task of the electronic device to be executed in the storage unit. When the built-in program test task of the electronic device is selected in the storage unit, a random selection operation is performed based on any one of the random sampling algorithms or the Fisher-Yates shuffling algorithm, so that the number of test tasks executed by each electronic device or the built-in program test tasks of the electronic device are different.

4. The robustness evaluation system based on electronic equipment according to claim 1, characterized in that: The electronic device operating status parameters collected by the acquisition module include: the success rate of each test task execution, the time consumed by each test task execution, and the temperature change range of the electronic device during the execution of each test task; When the electronic device executes the selected test task, all test tasks are executed synchronously.

5. The robustness evaluation system based on electronic equipment according to claim 1, characterized in that: The evaluation module is provided with submodules at the lower level, including: an identification unit, configured to identify a corresponding test weight of each test task currently executed by the electronic device; Among them, the evaluation module has built-in electronic device robustness evaluation logic. After the identification unit identifies the corresponding test weights of all test tasks currently executed by the electronic device, it performs an evaluation operation on the robustness of the electronic device based on the electronic device robustness evaluation logic.

6. The robustness evaluation system based on electronic equipment according to claim 5, characterized in that: The evaluation logic of the electronic device robustness is expressed as: ； Where: is the robustness performance value of the electronic equipment; Perform a comprehensive success rate for all test tasks; is the total amount of test tasks; is the theoretical execution time of the i-th test task; The cumulative value of the time taken to execute all test tasks; The total number of test tasks successfully executed; The maximum and minimum values ​​of the temperature change range of the electronic device during the execution of each test task; Among them, the robustness performance value of electronic equipment The larger the value, the better the robustness of the electronic device. Conversely, the smaller the value, the worse the robustness of the electronic device.

7. The robustness evaluation system based on electronic equipment according to claim 1, characterized in that: During the initial operation phase of the determination module, a user of the system defines a qualified determination interval within the determination module, and the determination module compares the qualified determination interval with the robustness evaluation result of the electronic device to determine whether the electronic device is qualified. When the robustness evaluation result of the electronic device is within the qualified judgment interval, the electronic device is judged to be qualified; otherwise, the electronic device is judged to be unqualified.

8. The robustness evaluation system based on electronic equipment according to claim 7, characterized in that: The determination module is interactively connected to the production equipment of the electronic equipment through a wireless network, and the operation determination result of the determination module is transmitted to the production equipment in real time. After receiving the negative determination result, the production equipment sorts the unqualified electronic equipment through the robotic arm or transmission module deployed on the production equipment.

9. The robustness evaluation system based on electronic equipment according to claim 1, characterized in that: The module operation information in the system received by the feedback module includes: operation status parameters of the electronic device during the execution of the test task, the robustness evaluation results of the electronic device, and the qualification determination results of the electronic device; The feedback module is connected to the mobile computer device held by the user through a wireless network. The feedback module feeds back the message generated by the operation to the mobile computer held by the user through the wireless network, and the user reads the message content on the mobile computer device.

10. The robustness evaluation system based on electronic equipment according to claim 1, characterized in that: The design module is interactively connected to a storage unit and a configuration unit at the lower level through a wireless network. The design module is interactively connected to a selection module, a collection module and an evaluation module through a wireless network. The selection module is interactively connected to the storage unit through a wireless network. The evaluation module is interactively connected to an identification unit at the lower level through a wireless network. The identification unit is interactively connected to the configuration unit through a wireless network. The evaluation module is interactively connected to a determination module and a feedback module through a wireless network.

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