A superconducting wire critical current data processing method and a data automatic processing system

Abstract

The application discloses a superconducting wire critical current data processing method and a data automatic processing system, and relates to the technical field of superconducting wire critical current measurement. The method comprises the following steps: obtaining superconducting wire U-I measurement data, and generating an initial U-I curve; determining a background voltage linear data segment according to the initial U-I curve and performing fitting to generate a background function straight line; subtracting the background function straight line from the initial U-I curve to obtain a background-subtracted U-I curve; and obtaining an electric field criterion critical current, a resistivity criterion critical current and a superconducting normal transition index based on the background-subtracted U-I curve. The application generates a background function straight line, subtracts the background function straight line from the initial U-I curve, obtains an electric field criterion critical current, a resistivity criterion critical current and a superconducting normal transition index based on the background-subtracted U-I curve, and improves the accuracy and data processing efficiency of critical current data processing.

Description

Technical Field

[0001] This application relates to the field of critical current measurement technology for superconducting conductors, and in particular to a method for processing critical current data of superconducting conductors and an automatic data processing system. Background Technology

[0002] Superconducting wires have extremely wide applications in many fields such as nuclear magnetic resonance imaging (MRI), nuclear magnetic resonance spectrometer (NMR), large particle accelerators and superconducting energy storage systems (SMES), and magnetic confinement nuclear fusion devices (Tokamak). The critical current of superconducting wires is one of the most important performance indicators for superconducting wire applications. Therefore, it is necessary to study the data processing technology of critical current of superconducting wires.

[0003] During the critical current test, a significant induced voltage is present in the test curve. This is because the critical current test sample itself is a small inductor, making the presence of induced voltage unavoidable. Additionally, there may be contact voltage and transfer voltage. The superposition of these three background voltages can lead to inaccurate critical current data processing or make it impossible to determine the critical current and superconducting quench-out transition index. Critical current data processing is typically done manually, requiring approximately >60 sets of data per day. Each set of data takes about 10 minutes to process, necessitating technicians to dedicate >10 hours of work per day.

[0004] However, there is currently no existing technology that takes into account the impact of background voltage on critical current data, resulting in poor accuracy in critical current data processing; in addition, the current manual processing of critical current data is inefficient. Summary of the Invention

[0005] This application provides a method and automatic data processing system for processing critical current data of superconducting wires, which solves the problems of poor accuracy of critical current data processing and low efficiency of manual processing of critical current data in the prior art because the influence of background voltage on critical current data is not considered.

[0006] On the one hand, this application provides a method for processing critical current data of superconducting wires, including the following steps:

[0007] Step 1: Obtain UI measurement data of the superconducting wire, and generate an initial UI curve based on the UI measurement data of the superconducting wire.

[0008] Step 2: Determine the linear data segment of the back-bottom voltage based on the initial UI curve and fit it to generate a straight line of the back-bottom function.

[0009] Step 3: Subtract the background function line from the initial UI curve to obtain the UI curve with the background removed.

[0010] Step 4: Based on the UI curve after background subtraction, obtain the critical current for electric field criteria, the critical current for resistivity criteria, and the superconducting quench transition index.

[0011] In one possible implementation, step two includes:

[0012] Based on the initial UI curve, determine the linear data segment of the back-side voltage and fit it to obtain the first-order function of the back-side voltage.

[0013] A straight line of the back-bottom function is generated based on the first-order function of the back-bottom voltage.

[0014] In one possible implementation, the primary function of the back-side voltage is shown in the following equation:

[0015] V0 = A0 + B0 * I.

[0016] Where V0 represents the background voltage, I represents the current, A0 represents the background voltage when the current is 0, and B0 represents the slope of the straight line that the background voltage changes with the current.

[0017] In one possible implementation, in step four, the electric field criterion critical current is determined based on the subtracted background UI curve and according to E=0.1uV / cm or E=1uV / cm.

[0018] In one possible implementation, in step four, based on the subtracted background UI curve and according to ρ=10 -13 Ω*m or ρ=10 -14 The Ω*m value determines the critical current for the resistivity criterion.

[0019] In one possible implementation, in step four, the superconducting quench transition index is calculated based on the following formula:

[0020] U c =I c *ρ c *L / S.

[0021] E c = U c / L.

[0022] n=lg(E s / E c ) / lg(I s / I c ).

[0023] Among them, I c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The current corresponding to Ω*m is expressed in amperes (A).

[0024] ρ cThe resistivity criterion ρ=10 -14 Ω*m.

[0025] L represents the sample voltage lead spacing, in cm.

[0026] S represents the sample area, in mm. 2 .

[0027] U c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The voltage corresponding to Ω*m, in μV.

[0028] E c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The electric field corresponding to Ω*m is expressed in μV / cm.

[0029] E s This indicates that the electric field is greater than the electric field criterion of 0.1 μV / cm to 1 μV / cm or the resistivity criterion of ρ=10. -14 Ω*m to ρ=10 -13 The electric field at any point Ω*m, with units of uV / cm.

[0030] I s This indicates that the electric field is greater than the electric field criterion of 0.1 μV / cm to 1 μV / cm or the resistivity criterion of ρ=10. -14 Ω*m to ρ=10 -13 The current at any point in Ω*m, expressed in amperes (A).

[0031] E s with I s Correspondingly.

[0032] n represents the superconducting quench transition index.

[0033] On the other hand, this application also provides an automatic data processing system for critical current of superconducting wires, including: a data import module and a data processing module.

[0034] The data import module is used to import UI measurement data of the superconducting wire and to input sample area, sample voltage, and lead spacing.

[0035] The data processing module is used to execute a superconducting wire critical current data processing method according to this application.

[0036] In one possible implementation, an automatic data processing system for critical current of a superconducting wire further includes a display module.

[0037] The display module is used to display the process and result data of the data import module and the data processing module.

[0038] The method and automatic data processing system for processing critical current data of superconducting wires disclosed in this application have the following advantages:

[0039] By generating a background function straight line and subtracting it from the initial UI curve, the critical current for the electric field criterion, the critical current for the resistivity criterion, and the superconducting quench transition index are obtained based on the subtracted background UI curve, thus improving the accuracy and efficiency of critical current data processing. When the critical current data processing method for superconducting conductors described in this application is executed through an automated data processing system, the overall processing efficiency is improved by over 96% in practical applications. Automated processing of a set of data takes only 3 seconds, saving the need for more than one dedicated data processing personnel. Attached Figure Description

[0040] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 A flowchart illustrating a method for processing critical current data of a superconducting wire, provided in an embodiment of this application;

[0042] Figure 2 A schematic diagram of the initial UI curve and the background function line provided in the embodiments of this application;

[0043] Figure 3 This is a schematic diagram of the UI curve subtraction for background removal provided in an embodiment of this application;

[0044] Figure 4 A schematic diagram of the processing curves of the critical current for the electric field criterion and the critical current for the resistivity criterion provided in the embodiments of this application;

[0045] Figure 5 This is a schematic diagram of a display module for an automatic processing system for critical current data of superconducting wires, provided in an embodiment of this application. Detailed Implementation

[0046] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0047] like Figure 1As shown in the figure, this application provides a method for processing critical current data of superconducting wires, including the following steps:

[0048] Step 1: Obtain UI measurement data of the superconducting wire, and generate an initial UI curve based on the UI measurement data of the superconducting wire.

[0049] Step 2: Determine the linear data segment of the back-bottom voltage based on the initial UI curve and fit it to generate a straight line of the back-bottom function.

[0050] Step 3: Subtract the background function line from the initial UI curve to obtain the UI curve with the background removed.

[0051] Step 4: Based on the UI curve after background subtraction, obtain the critical current for electric field criteria, the critical current for resistivity criteria, and the superconducting quench transition index.

[0052] For example, step two includes:

[0053] Based on the initial UI curve, determine the linear data segment of the back-side voltage and fit it to obtain the first-order function of the back-side voltage.

[0054] A straight line of the back-bottom function is generated based on the first-order function of the back-bottom voltage.

[0055] For example, the first-order function of the back-side voltage is shown in the following equation:

[0056] V0 = A0 + B0 * I.

[0057] Where V0 represents the background voltage, I represents the current, A0 represents the background voltage when the current is 0, and B0 represents the slope of the straight line that the background voltage changes with the current.

[0058] Specifically, in this embodiment, A0 in the linear function of the back-side voltage obtained in step two is equal to -3.73149, and B0 is equal to 0.00715. The initial UI curve and the straight line of the back-side function are as follows: Figure 2 As shown, Figure 2 The original curve in the curve is the initial UI curve, and the back bottom line is the back bottom function line.

[0059] Specifically, in this embodiment, the UI curve obtained in step three after background subtraction is as follows: Figure 3 As shown, Figure 3 The UI curve after removing the background is the UI curve after removing the background.

[0060] For example, in step four, the electric field criterion critical current is determined based on the subtracted background UI curve and according to E=0.1uV / cm or E=1uV / cm.

[0061] For example, in step four, based on the subtracted background UI curve and according to ρ=10 -13 Ω*m or ρ=10 -14 The Ω*m value determines the critical current for the resistivity criterion.

[0062] For example, in step four, the superconducting quench transition index is calculated based on the following formula:

[0063] U c =I c *ρ c *L / S.

[0064] E c = U c / L.

[0065] n=lg(E s / E c ) / lg(I s / I c ).

[0066] Among them, I c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The current corresponding to Ω*m is expressed in amperes (A).

[0067] ρ c The resistivity criterion ρ=10 -14 Ω*m.

[0068] L represents the sample voltage lead spacing, in cm.

[0069] S represents the sample area, in mm. 2 .

[0070] U c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The voltage corresponding to Ω*m, in μV.

[0071] E c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The electric field corresponding to Ω*m is expressed in μV / cm.

[0072] E s This indicates that the electric field is greater than the electric field criterion of 0.1 μV / cm to 1 μV / cm or the resistivity criterion of ρ=10. -14 Ω*m to ρ=10 -13 The electric field at any point Ω*m, with units of uV / cm.

[0073] I sThis indicates that the electric field is greater than the electric field criterion of 0.1 μV / cm to 1 μV / cm or the resistivity criterion of ρ=10. -14 Ω*m to ρ=10 -13 The current at any point in Ω*m, expressed in amperes (A).

[0074] E s with I s Correspondingly.

[0075] n represents the superconducting quench transition index.

[0076] Specifically, such as Figure 4 The diagram shown is a schematic representation of the processing curves for the critical current of the electric field criterion and the critical current of the resistivity criterion provided in the embodiments of this application. Figure 4 The critical currents for the electric field criterion and the resistivity criterion can be obtained. Figure 4 The superconducting superconducting transition exponent is calculated by taking the upper point. In this embodiment, the correspondence between each criterion and the electric field, critical current, and superconducting superconducting transition exponent is shown in Table 1:

[0077] Table 1. Correspondence between various criteria and electric field, critical current, and superconducting quench transition index.

[0078]

[0079] This application also provides an automatic data processing system for critical current of superconducting wires, including a data import module and a data processing module.

[0080] The data import module is used to import UI measurement data of the superconducting wire and to input sample area, sample voltage, and lead spacing.

[0081] The data processing module is used to execute a superconducting wire critical current data processing method according to this application.

[0082] Specifically, in this embodiment, the sample area S is 2.227 mm². 2 The sample voltage lead spacing is 50cm.

[0083] For example, an automatic data processing system for critical current of superconducting wires further includes a display module.

[0084] The display module is used to display the process and result data of the data import module and the data processing module.

[0085] Specifically, such as Figure 5 As shown, the process and results data of the data import module and the data processing module are displayed through the display module.

[0086] Specifically, in this embodiment, the data import module, data processing module, and display module are all set on the computer through software programming to realize automatic processing of critical current data.

[0087] This application's embodiments improve the accuracy and efficiency of critical current data processing by generating a background function straight line, subtracting the background function straight line from the initial UI curve, and obtaining the electric field criterion critical current, resistivity criterion critical current, and superconducting quench transition index based on the subtracted background UI curve. When the superconducting critical current data processing method of this application is executed by an automatic data processing system, the overall processing efficiency is improved by more than 96% in practical applications. Automatically processing a set of data takes only 3 seconds, saving the need for more than one dedicated data processing personnel.

[0088] Although preferred embodiments of this application have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of this application.

[0089] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of this application. Therefore, if such modifications and variations fall within the scope of the claims of this application and their equivalents, this application also intends to include such modifications and variations.

Claims

1. A method for processing critical current data of superconducting wires, characterized in that, Includes the following steps: Step 1: Obtain UI measurement data of the superconducting wire, and generate an initial UI curve based on the UI measurement data of the superconducting wire; Step 2: Determine the linear data segment of the back-bottom voltage based on the initial UI curve and fit it to generate a straight line of the back-bottom function; Step 3: Subtract the background function line from the initial UI curve to obtain the UI curve with the background removed; Step 4: Based on the UI curve after background subtraction, obtain the critical current for electric field criteria, the critical current for resistivity criteria, and the superconducting quench transition index. In step four, the superconducting quench transition index is calculated based on the following formula: U c =I c *r c *L / S, And c = U c / L, n=lg(E s / E c ) / lg(I s / I c ), Among them, I c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The current corresponding to Ω*m, in amperes (A); ρ c The resistivity criterion ρ=10 -14 Ω*m; L represents the sample voltage lead spacing, in cm; S represents the sample area, in mm. 2 ; U c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The voltage corresponding to Ω*m, in μV; E c This indicates that the electric field criterion is 0.1 μV / cm or the resistivity criterion is ρ=10. -14 The electric field corresponding to Ω*m, with units of uV / cm; E s This indicates that the electric field is greater than the electric field criterion of 0.1 μV / cm to 1 μV / cm or the resistivity criterion of ρ=10. -14 Ω*m to ρ=10 -13 The electric field at any point Ω*m, in μV / cm; I s This indicates that the electric field is greater than the electric field criterion of 0.1 μV / cm to 1 μV / cm or the resistivity criterion of ρ=10. -14 Ω*m to ρ=10 -13 The current at any point in Ω*m, expressed in amperes (A). E s with I s Correspondingly; n represents the superconducting quench transition index.

2. The method for processing critical current data of a superconducting wire according to claim 1, characterized in that, Step two includes: Based on the initial UI curve, determine the linear data segment of the back-bottom voltage and fit it to obtain a linear function of the back-bottom voltage. A straight line of the back-bottom function is generated based on the first-order function of the back-bottom voltage.

3. The method for processing critical current data of a superconducting wire according to claim 2, characterized in that, The first-order function of the back-side voltage is shown in the following equation: V0 = A0 + B0 * I, Where V0 represents the background voltage, I represents the current, A0 represents the background voltage when the current is 0, and B0 represents the slope of the straight line that the background voltage changes with the current.

4. The method for processing critical current data of a superconducting wire according to claim 1, characterized in that, In step four, the critical current of the electric field criterion is determined based on the UI curve after background subtraction and according to E=0.1uV / cm or E=1uV / cm.

5. The method for processing critical current data of a superconducting wire according to claim 1, characterized in that, In step four, based on the UI curve with background subtraction and according to ρ=10 -13 Ω*m or ρ=10 -14 The critical current for the resistivity criterion is determined by Ω*m.

6. An automatic data processing system for critical current of superconducting wires, characterized in that, include: Data import module and data processing module; The data import module is used to import UI measurement data of the superconducting wire and to input sample area, sample voltage, and lead spacing. The data processing module is used to execute a critical current data processing method for superconducting wires as described in any one of claims 1 to 5.

7. The automatic data processing system for critical current of a superconducting wire according to claim 6, characterized in that, Also includes: Display module; The display module is used to display the process and result data of the data import module and the data processing module.

Images