Photoelectric detector sensitivity test method, device and equipment and storage medium

Abstract

The invention provides a photoelectric detector sensitivity test method and device, equipment and a storage medium. Obtaining the sensitivity compensation amount corresponding to the target batch of photoelectric detectors; the sensitivity compensation amount is determined according to long-time test first sensitivity and short-time test second sensitivity corresponding to a set number of first sample photoelectric detectors in the target batch of photoelectric detectors; performing sensitivity testing on each photoelectric detector in the target batch of photoelectric detectors according to the second duration, and determining the undetermined sensitivity corresponding to each photoelectric detector; the second duration is less than the first duration, and the total number of photoelectric detectors included in the target batch of photoelectric detectors is greater than a set number; and determining the target sensitivity corresponding to each photoelectric detector according to the undetermined sensitivity of each photoelectric detector and the sensitivity compensation amount. By adopting the technical scheme provided by the invention, the time for testing the sensitivity of batch products can be shortened.

Description

Technical Field

[0001] The present invention relates to the technical field of photoelectric detectors, and in particular to a method, device, equipment and storage medium for testing the sensitivity of a photoelectric detector. Background Art

[0002] The receiving sensitivity of a photodetector refers to the minimum received optical power at a certain rate and bit error rate. Accurately measuring the bit error rate is a prerequisite for determining the sensitivity of the photodetector. To test or measure the sensitivity of a photodetector, an optical signal is typically modulated at a specified rate and pattern. An adjustable optical attenuator is used to adjust the incident optical power of the photodetector. The incident optical power at this point is measured to determine the receiving sensitivity of the photodetector at the specified bit error rate.

[0003] At present, more and more photodetectors need to be tested for sensitivity at low bit error rates. For the sensitivity test of photodetectors at low bit error rates, the relevant technology generally adopts the running second monitoring method for sensitivity testing, which specifically includes: adjusting the incident light power of the photodetector, increasing the incident light power after a bit error occurs until no bit error occurs, and waiting for a certain period of time without bit error, and recording the received light power value at this time as the receiving sensitivity.

[0004] However, the above technology has the problem of long sensitivity testing time. Summary of the Invention

[0005] The present invention provides a photoelectric detector sensitivity testing method, device, equipment and storage medium to solve the defect of long sensitivity testing time in the prior art. The method achieves the goal of obtaining sensitivity compensation by performing long and short sensitivity tests on a small number of sample photoelectric detectors in batch products, and compensating the short-time sensitivity of each photoelectric detector by the sensitivity compensation to obtain the sensitivity under long-time sensitivity testing. In this way, there is no need to perform long-time sensitivity testing on all photoelectric detectors in batch products, thereby greatly shortening the time / duration of sensitivity testing on batch products and improving the efficiency of sensitivity testing on batch products.

[0006] The present invention provides a method for testing the sensitivity of a photoelectric detector, comprising: Obtaining a sensitivity compensation amount corresponding to a target batch of photodetectors; the sensitivity compensation amount is determined based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, where the first sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a first duration, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a second duration; performing a sensitivity test on each photodetector in the target batch of photodetectors according to a second duration to determine the pending sensitivity corresponding to each photodetector; the second duration is shorter than the first duration, and the total number of photodetectors included in the target batch of photodetectors is greater than a set number; The target sensitivity corresponding to each photodetector is determined according to the undetermined sensitivity of each photodetector and the sensitivity compensation amount.

[0007] According to a photoelectric detector sensitivity testing method provided by the present invention, obtaining the sensitivity compensation amount corresponding to the target batch of photoelectric detectors includes: Obtaining test parameters corresponding to the target batch of photodetectors; the test parameters include a transmission rate corresponding to the target batch of photodetectors, a bit error rate requirement required to be achieved by the target batch of photodetectors, a confidence requirement required to be achieved by the target batch of photodetectors, and a test duration allowed for the target batch of photodetectors, where the test duration is equal to the second duration; Obtaining a set number of first sample photoelectric detectors from a target batch of photoelectric detectors; wherein the total number of first photoelectric detection channels corresponding to the set number of first sample photoelectric detectors is greater than or equal to 3; Determine a first duration according to transmission rate, bit error rate requirements, and confidence requirements, and perform a sensitivity test on each first photoelectric detection channel using the first duration to determine a first sensitivity corresponding to each first photoelectric detection channel; and perform a sensitivity test on each first photoelectric detection channel according to a second duration to determine a second sensitivity corresponding to each first photoelectric detection channel; A sensitivity compensation amount is determined according to the first sensitivity and the second sensitivity of each first photodetection channel.

[0008] According to a photodetector sensitivity testing method provided by the present invention, determining the sensitivity compensation amount based on the first sensitivity and the second sensitivity of each first photodetection channel includes: performing difference processing on the first sensitivity and the second sensitivity of each first photoelectric detection channel to determine a first sensitivity difference corresponding to each first photoelectric detection channel; A sensitivity compensation amount is determined according to each first sensitivity difference.

[0009] According to a photodetector sensitivity testing method provided by the present invention, before determining the sensitivity compensation amount according to each first sensitivity difference, the method further includes: Obtaining a maximum first sensitivity difference value and a minimum first sensitivity difference value among the first sensitivity difference values, and performing difference processing on the maximum first sensitivity difference value and the minimum first sensitivity difference value to obtain a range; According to the range and the preset threshold, it is determined whether to return to the step of determining the sensitivity compensation amount according to each first sensitivity difference.

[0010] According to a photodetector sensitivity testing method provided by the present invention, the step of determining whether to return to the step of determining the sensitivity compensation amount according to each first sensitivity difference according to the range and the preset threshold value includes: If the range is not less than the preset threshold, a retest operation is performed until the range is less than the preset threshold. The retest operation includes: reacquire two second sample photodetectors of a second photodetection channel from the target batch of photodetectors; Performing a sensitivity test on each second photoelectric detection channel according to the bit error rate requirement and the confidence requirement to determine the first sensitivity corresponding to each second photoelectric detection channel; and performing a sensitivity test on each second photoelectric detection channel according to the second time length to determine the second sensitivity corresponding to each second photoelectric detection channel; performing difference processing on the first sensitivity and the second sensitivity of each second photoelectric detection channel to determine a second sensitivity difference corresponding to each second photoelectric detection channel; Eliminate the maximum and minimum values ​​among the first sensitivity differences and the second sensitivity differences, determine the candidate sensitivity differences, use each candidate sensitivity difference as a new first sensitivity difference, and return to execute the above steps of obtaining the maximum first sensitivity difference and the minimum first sensitivity difference among the first sensitivity differences.

[0011] According to a photodetector sensitivity testing method provided by the present invention, the step of determining whether to return to the step of determining the sensitivity compensation amount according to each first sensitivity difference according to the range and the preset threshold value includes: If the range is less than the preset threshold, the process returns to the step of determining the sensitivity compensation amount according to each first sensitivity difference.

[0012] The present invention also provides an electrical detector sensitivity testing device, comprising the following modules: an acquisition module, configured to acquire a sensitivity compensation amount corresponding to a target batch of photodetectors; the sensitivity compensation amount being determined based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, wherein the first sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a first duration, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a second duration; a sensitivity testing module, configured to perform a sensitivity test on each photodetector in a target batch of photodetectors according to a second duration to determine a pending sensitivity corresponding to each photodetector; wherein the second duration is less than the first duration, and the total number of photodetectors included in the target batch of photodetectors is greater than a set number; The target sensitivity determination module is used to determine the target sensitivity corresponding to each photoelectric detector according to the undetermined sensitivity of each photoelectric detector and the sensitivity compensation amount.

[0013] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, any of the above-described photodetector sensitivity testing methods is implemented.

[0014] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for testing the sensitivity of a photoelectric detector as described above is implemented.

[0015] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the computer program implements any of the above-mentioned photodetector sensitivity testing methods.

[0016] The present invention provides a method, apparatus, device, and storage medium for testing photodetector sensitivity. The method determines the sensitivity compensation corresponding to the target batch of photodetectors based on the first and second sensitivities of a set number of sample photodetectors in the target batch, performs a sensitivity test on each photodetector in the target batch according to the duration of the short-time sensitivity test to determine the pending sensitivity corresponding to each photodetector, and then determines the target sensitivity of each photodetector based on the pending sensitivity and the sensitivity compensation. The method includes the following steps: wherein the first sensitivity is obtained by performing a sensitivity test on the sample photodetectors for a first duration, the second sensitivity is obtained by performing a sensitivity test on the sample photodetectors for a second duration, the second duration is less than the first duration, and the total number of photodetectors in the target batch is greater than the set number. In this method, since a small number of sample photodetectors in the target batch can be subjected to long-term and short-term sensitivity tests to obtain the sensitivity compensation, and the short-term sensitivity of each photodetector is compensated by the sensitivity compensation to obtain the sensitivity under the long-term sensitivity test, the method eliminates the need to perform a long-term sensitivity test on all photodetectors in the batch. This significantly shortens the time required for sensitivity testing of the batch, improving the efficiency of sensitivity testing of the batch. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction is given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0018] Figure 1 This is one of the flow charts of the photoelectric detector sensitivity testing method provided by the present invention.

[0019] Figure 2 This is the second flow chart of the photoelectric detector sensitivity testing method provided by the present invention.

[0020] Figure 3 This is the third flow chart of the photoelectric detector sensitivity testing method provided by the present invention.

[0021] Figure 4 It is a structural schematic diagram of the photoelectric detector sensitivity testing device provided by the present invention.

[0022] Figure 5 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0023] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0024] The receiving sensitivity of a photodetector refers to the minimum received optical power of the photodetector under certain speed and bit error rate requirements. Accurately measuring the bit error rate is the prerequisite for obtaining the sensitivity value. The bit error rate value obtained by testing within a limited time is an estimate of long-term work. The longer the test time, the smaller the deviation between the test value and the true value. The bit error rate (BER, Bit Error Rate, also known as bit error rate) is the ratio of the number of received erroneous bits to the total number of received bits. Only when the accumulated time is long enough and a sufficient number of bit errors are obtained can the bit error rate be calculated more accurately. Taking a 10Gbps optical receiver module as an example, when the bit error rate indicator we specify is BER=10 -9 , it is easy to calculate that an error will occur every 0.1s on average. At this time, a large number of errors can be generated by accumulating a few seconds or more than ten seconds, thus obtaining a stable and accurate error rate result. As the error rate index increases, when we require a bit error rate BER = 10-12 , then on average one bit error will occur every 100 seconds. In this case, it is difficult to read the bit error rate value in a short time.

[0025] Receiver sensitivity testing at low bit error rates mainly includes two types of technical solutions: Technical solution 1: fitting extrapolation method.

[0026] It's generally believed that the sensitivity of a photodetector is linearly related to the quadratic logarithm of the bit error rate. The fitting extrapolation method involves measuring sensitivity values ​​at multiple levels of higher bit error rates and performing a linear fit on these values ​​to extrapolate the sensitivity value at lower bit error rates.

[0027] However, the above fitting extrapolation method requires taking at least 3 points at higher BER values ​​(usually at 10 -4 ~10 -9 The sensitivity value at low bit error rates is estimated by recording the incident optical power value and taking the logarithm of the bit error rate twice, then performing a linear fit. The testing, calculation, and fitting process is relatively complex.

[0028] Technical solution 2: running second monitoring method.

[0029] When using the running-second monitoring method, the incident light power of the photodetector is adjusted. After a bit error occurs, the incident light power is increased until no bit errors occur. After waiting for a certain period of time without bit errors, the received light power value at this time is recorded as the receiving sensitivity.

[0030] The above-mentioned running second detection method is relatively simple and intuitive. It only needs to adjust the incident light power from low to high until no bit error occurs. It is easy to understand and operate, and thus is widely adopted. However, for low bit error rate systems, such as BER=10 -12 For systems with bit error rates of 95% or lower, a key issue when using the running-second monitoring method to determine the sensitivity value is the appropriate monitoring time. Taking a 10Gbps optical receiver module as an example, if a bit error rate test is to be performed at a higher confidence level, such as 95%, at least 3×10 -12 Monitoring a single bit takes over five minutes; if a bit error rate test is performed at a high confidence level of 99.9%, it takes 11.5 minutes. Testing a single channel for five or even more than ten minutes is unacceptable for high-volume, especially multi-channel, product testing. This means that this technology suffers from a long sensitivity test time in low bit error rate systems.

[0031] Based on this, embodiments of the present invention provide a method, device, equipment and storage medium for testing the sensitivity of a photodetector, which can solve the above technical problems.

[0032] It should be noted that the execution subject of the embodiment of the present invention can be a photoelectric detector sensitivity testing device, or it can be an electronic device including the photoelectric detector sensitivity testing device, or it can be a photoelectric detector sensitivity testing system, or it can be other devices or equipment or systems. No specific limitation is made here. The following embodiments will be explained by taking the electronic device as the execution subject as an example.

[0033] Figure 1 This is one of the flow charts of the photoelectric detector sensitivity testing method provided by the present invention, such as Figure 1 As shown, the method includes the following steps: Step 102: Obtain a sensitivity compensation amount corresponding to a target batch of photodetectors; the sensitivity compensation amount is determined based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, wherein the first sensitivity is obtained by performing a sensitivity test on the first sample photodetector at a first time length, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetector at a second time length.

[0034] The target batch photodetectors refer to photodetectors within the same target batch of products. The target batch of products includes multiple photodetectors, each of which has a photodetection channel for detecting / receiving light signals. Each photodetector may include one or more photodetection channels. When performing a sensitivity test / measurement on a photodetector, the sensitivity test / measurement is actually performed on each photodetection channel of the photodetector.

[0035] At present, when performing sensitivity testing / measurement on the photoelectric detection channel of a photodetector, it is generally necessary to perform sensitivity testing on the photoelectric detection channel of the photodetector under a low bit error rate requirement. The low bit error rate requirement requires the photoelectric detection channel of the photodetector to meet a low bit error rate. Here, the low bit error rate can be, for example, a bit error rate BER=10 -12 BER=10 -14 BER=10 -15 In this low bit error rate test scenario, it is usually necessary to test each photodetection channel for a long time to complete its sensitivity test at a higher confidence level. In this way, when performing sensitivity tests on a large number of photodetectors, if each photodetection channel is tested in this way, the test time / duration will be very long.

[0036] Based on this, before conducting sensitivity tests on large batches of target products, this embodiment can first conduct sensitivity testing experiments on different sample photodetectors. These experiments revealed that, for low bit error rate systems, the sensitivity values ​​obtained using the running-second monitoring method at different confidence levels (corresponding to different monitoring / testing durations) exhibit a relatively stable relationship. For a specific 10Gbps photodetector, repeated testing of multiple samples revealed that, despite variations in receiving sensitivity test results, for a single sample, the sensitivity value obtained at a 40% confidence level (approximately 1 minute of monitoring) was consistently 0.5dB better than the value obtained at a 95% confidence level (approximately 5 minutes of monitoring) and 0.7dB better than the value obtained at a 99.9% confidence level (approximately 12 minutes of monitoring). This experiment suggests that, for each batch of photodetectors, the sensitivity compensation value corresponding to that batch can be determined, and then sensitivity testing can be rapidly performed on large batches of products based on this sensitivity compensation value.

[0037] When determining the sensitivity compensation amount for each batch, taking the target batch of photodetectors as an example, in a low bit error rate test scenario, a set number of photodetectors can be randomly selected from the large target batch of products, denoted as sample photodetectors. This set number will be much smaller than the total number of photodetectors included in the target batch, thereby shortening the duration of subsequent long-term testing of all photodetectors. Each photodetection channel of these selected sample photodetectors can then be subjected to a long-term sensitivity test (denoted as the first duration) and a short-term sensitivity test (denoted as the second duration) to obtain the sensitivity under the long-term sensitivity test (denoted as the first sensitivity) and the sensitivity under the short-term sensitivity test (denoted as the second sensitivity). The sensitivity compensation amount corresponding to the target batch of photodetectors can then be determined based on the difference between these two types of sensitivities of the sample photodetectors.

[0038] It will be appreciated that the sensitivity compensation values ​​corresponding to a large number of photodetectors from each batch can be obtained in the above manner. The sensitivity compensation values ​​corresponding to different batches of photodetectors can be different or the same. By first determining the sensitivity compensation values ​​corresponding to different batches of photodetectors, the accuracy of the sensitivity test for each batch of photodetectors can be improved.

[0039] Step 104 , performing a sensitivity test on each photodetector in the target batch of photodetectors according to a second time duration to determine the pending sensitivity corresponding to each photodetector; the second time duration is shorter than the first time duration, and the total number of photodetectors included in the target batch of photodetectors is greater than a set number.

[0040] In this step, when performing the short-time sensitivity test on the sample photodetectors, a duration corresponding to the short time can be obtained, which is recorded as the second duration. After determining the sensitivity compensation amount corresponding to the photodetectors in the target batch, a sensitivity test can be performed on each photodetection channel of each photodetector in the target batch according to the second duration, obtaining a sensitivity test result for each photodetector (or each photodetection channel) under the second duration. This sensitivity test result can include the sensitivity tested under the second duration, which is recorded as the undetermined sensitivity.

[0041] In addition, the set number of sample photodetectors selected for the experiment in the target batch of photodetectors is much smaller than the total number of photodetectors in the target batch, and the test time for each photodetector in the target batch is the second time, which is much smaller than the first time. Therefore, only a small number of samples need to be subjected to long-term sensitivity tests, and there is no need to conduct long-term sensitivity tests on all photodetectors. Therefore, the time for sensitivity testing of large batches of photodetectors can be greatly shortened.

[0042] Step 106 : determining the target sensitivity corresponding to each photodetector according to the undetermined sensitivity of each photodetector and the sensitivity compensation amount.

[0043] In this step, after obtaining the sensitivity compensation amount corresponding to the target batch of photodetectors and the undetermined sensitivity corresponding to each photodetector, the sensitivity compensation amount can be added to the undetermined sensitivity of each photodetector to obtain the final sensitivity of each photodetector, which is recorded as the target sensitivity. The sensitivity compensation amount can be expressed in dB (decibel), and the undetermined sensitivity and target sensitivity can both be expressed in dBm (decibel milliwatt).

[0044] In this embodiment, sensitivity compensation amounts corresponding to the target batch of photodetectors are determined based on the first and second sensitivities of a set number of sample photodetectors in the target batch, and sensitivity tests are performed on each photodetector in the target batch according to the short-time sensitivity test duration to determine the pending sensitivity corresponding to each photodetector. The target sensitivity of each photodetector is then determined based on the pending sensitivity and the sensitivity compensation amount. The first sensitivity is obtained by performing a sensitivity test on the sample photodetectors for a first duration, and the second sensitivity is obtained by performing a sensitivity test on the sample photodetectors for a second duration, the second duration being shorter than the first duration, and the total number of photodetectors in the target batch is greater than the set number. In this method, since a small number of sample photodetectors in the target batch can be subjected to long-time and short-time sensitivity tests to obtain the sensitivity compensation amount, and the short-time sensitivity of each photodetector is compensated using the sensitivity compensation amount to obtain the sensitivity under the long-time sensitivity test, there is no need to perform a long-time sensitivity test on all photodetectors in the batch. This significantly shortens the sensitivity testing time for the batch and improves the efficiency of sensitivity testing for the batch.

[0045] The following embodiment illustrates the process of determining the sensitivity compensation amount corresponding to the target batch of photoelectric detectors.

[0046] Figure 2 This is the second flow chart of the photoelectric detector sensitivity testing method provided by the present invention. Figure 2 As shown, obtaining the sensitivity compensation amount corresponding to the target batch of photoelectric detectors in the above step 102 may include the following steps: Step 202, obtain the test parameters corresponding to the target batch of photodetectors; the above test parameters include the transmission rate corresponding to the target batch of photodetectors, the bit error rate requirement that the target batch of photodetectors needs to achieve, the confidence requirement that the target batch of photodetectors needs to achieve, and the test time allowed by the target batch of photodetectors, where the test time is equal to the second time.

[0047] In this step, before conducting a sensitivity test on the target batch of photoelectric detectors, the test parameters such as the transmission rate of the target batch of photoelectric detectors during the sensitivity test, the bit error rate requirements that the target batch of photoelectric detectors need to achieve during the sensitivity test, the confidence requirements that the target batch of photoelectric detectors need to achieve during the sensitivity test, and the test time allowed for the target batch of photoelectric detectors during the sensitivity test can be determined based on indicator limitations and production needs.

[0048] The bit error rate requirement to be achieved includes the low bit error rate to be achieved. Here, the low bit error rate can be, for example, BER=10 -12 BER=10 -14 BER=10 -15 The required confidence level requirement includes the required confidence level, which is generally a higher confidence level, such as 95% or 99.9%. The allowed test duration refers to the test duration allowed for the sensitivity test of the target batch of photodetectors. This test duration is equal to the second duration of the short-time test described above, and can be, for example, 10 seconds, 30 seconds, 1 minute, 2 minutes, etc.

[0049] Step 204 : Acquire a set number of first sample photoelectric detectors from a target batch of photoelectric detectors; the total number of first photoelectric detection channels corresponding to the set number of first sample photoelectric detectors is greater than or equal to 3.

[0050] In this step, the number of photoelectric detection channels included in each photoelectric detector in the target batch of photoelectric detectors can be one or more, and at least three photoelectric detection channels can be randomly selected therefrom. Then, the photoelectric detectors corresponding to these three photoelectric detection channels are used as sample photoelectric detectors. The number of sample photoelectric detectors is a set number, which can be greater than or equal to 1. The specific number can be determined according to the number of photoelectric detection channels included in the photoelectric detector.

[0051] Alternatively, at least three photodetectors may be randomly selected from the target batch of photodetectors as sample photodetectors for subsequent sensitivity testing.

[0052] In addition, the sample photodetectors initially selected above can all be recorded as first sample photodetectors, and the photodetection channel included in each first sample photodetector can all be recorded as a first photodetection channel.

[0053] Step 206: Determine the first duration according to the transmission rate, bit error rate requirements, and confidence requirements, and use the first duration to perform a sensitivity test on each first photoelectric detection channel to determine the first sensitivity corresponding to each first photoelectric detection channel; and perform a sensitivity test on each first photoelectric detection channel according to the second duration to determine the second sensitivity corresponding to each first photoelectric detection channel.

[0054] In this step, after obtaining the bit error rate requirements and confidence requirements for the sensitivity test of the target batch of photodetectors, the transmission rate and the low bit error rate in the bit error rate requirements, combined with the confidence level in the confidence level requirement, are used to determine the maximum time required for the sensitivity test of the photodetectors. This time is recorded as the first duration. For example, this can be 5 minutes, 10 minutes, 12 minutes, etc.

[0055] Afterwards, the first photodetection channel of the first sample photodetector can be subjected to long-term sensitivity monitoring / testing for a first duration. The sensitivity test under the first duration is a sensitivity test under a higher confidence level, and the sensitivity corresponding to each first photodetection channel can be obtained, which is recorded as the first sensitivity S1 (dBm).

[0056] Then, a short-time (instantaneous) sensitivity monitoring / test of the second duration can be performed on each first photoelectric detection channel. The sensitivity test under the second duration is a sensitivity test under a lower confidence level, and the sensitivity corresponding to each first photoelectric detection channel can be obtained, which is recorded as the second sensitivity S2 (dBm).

[0057] Step 208 : determining a sensitivity compensation amount according to the first sensitivity and the second sensitivity of each first photoelectric detection channel.

[0058] In this step, after obtaining the first sensitivity and the second sensitivity of each first photodetection channel, the difference between the first sensitivity and the corresponding second sensitivity of each first photodetection channel can be compared to determine the sensitivity compensation amount.

[0059] Alternatively, see Figure 3 The third flow chart of the photodetector sensitivity test method shown in FIG. 1 includes determining the sensitivity compensation amount based on the first sensitivity and the second sensitivity of each first photodetection channel, and may include the following steps: Step 302 : performing difference processing on the first sensitivity and the second sensitivity of each first photoelectric detection channel to determine a first sensitivity difference corresponding to each first photoelectric detection channel.

[0060] Step 304: Determine a sensitivity compensation amount according to each first sensitivity difference.

[0061] The difference between the first sensitivity and the corresponding second sensitivity of each first photodetection channel can be calculated to obtain the difference corresponding to each first photodetector, which is recorded as the first sensitivity difference and can be expressed as follows: =S1-S2, unit is dB.

[0062] The sensitivity compensation can then be obtained using any of the following methods: Method 1: Perform average processing on each first sensitivity difference to obtain an average value, and use the average value as the sensitivity compensation amount.

[0063] Method 2: Obtain the maximum value among the first sensitivity differences and use the maximum value as the sensitivity compensation amount.

[0064] In this embodiment, parameters such as the long-term sensitivity test duration, short-term test duration, and confidence level are determined based on the test parameters of a target batch of photodetectors. A small number of samples from the target batch of photodetectors are subjected to long-term sensitivity tests and short-term sensitivity tests, respectively, to obtain long-term sensitivity test results and short-term sensitivity test results. The sensitivity compensation amount is then determined based on the sensitivity test results at the two different durations. This allows the corresponding sensitivity compensation amount to be determined based on the test parameters of the photodetectors, improving the accuracy of the determined sensitivity compensation amount and, in turn, improving the accuracy of sensitivity testing of a large batch of photodetectors. This also facilitates subsequent inference of the long-term sensitivity test results of the large batch of photodetectors based on the sensitivity compensation amount, thereby shortening the test time / duration of the large batch of photodetectors. Furthermore, determining the sensitivity compensation amount by performing differential processing on the long-term sensitivity test results and the short-term sensitivity test results of the sample photodetectors is simple and intuitive, allowing the sensitivity compensation amount to be obtained more quickly, thereby improving the efficiency of long-term sensitivity testing of a large batch of photodetectors.

[0065] When calculating the sensitivity compensation amount using selected samples, there may be abnormalities in the sample testing process or sample abnormalities, which may affect the results of subsequent long-term sensitivity tests on large quantities of photoelectric detectors. Based on this, this embodiment proposes a solution for verifying the accuracy of each first sensitivity difference value before determining the sensitivity compensation amount based on the first sensitivity difference values ​​of the sample. The following embodiment illustrates this process.

[0066] In one embodiment, before the above step 304 determines the sensitivity compensation amount according to each first sensitivity difference, the above method may further include the following steps: Step A1: Obtain the maximum first sensitivity difference and the minimum first sensitivity difference among the first sensitivity differences, and perform difference processing on the maximum first sensitivity difference and the minimum first sensitivity difference to obtain a range.

[0067] In this step, after obtaining the first sensitivity differences corresponding to each first photodetection channel of the first sample photodetector, the maximum first sensitivity difference and the minimum first sensitivity difference can be found among the first sensitivity differences, and then the difference between the two can be calculated. The obtained difference is recorded as the range.

[0068] Step A2: Determine whether to return to the step of determining the sensitivity compensation amount according to each first sensitivity difference value based on the range and the preset threshold.

[0069] In this step, after obtaining the range, the range can be compared with a preset threshold to determine whether the range is less than the preset threshold, thereby obtaining a determination result. The preset threshold can be set based on actual conditions, for example, 0.1 dB. Generally, the difference between the first sensitivity differences will not be too large. If the difference is too large, it may indicate an abnormality in the sample testing process or the sample itself.

[0070] After obtaining the above judgment result, optionally, if the range is less than the preset threshold, return to execute the step of determining the sensitivity compensation amount according to each first sensitivity difference in the above step 304, that is, if the range is less than the preset threshold, it means that the difference between the first sensitivity differences obtained this time is not too large, and the first sensitivity differences are normal. At this time, the sensitivity compensation amount can be calculated normally according to the sensitivity differences, and the calculated sensitivity compensation amount is also relatively accurate, and the error is small.

[0071] Alternatively, if the range is not less than a preset threshold, that is, the range is greater than or equal to the preset threshold, it indicates that the differences between the first sensitivity differences obtained this time are too large, and it is necessary to reselect samples for sensitivity testing. Specifically, if the range is not less than the preset threshold, a retest operation is performed until the range is less than the preset threshold. The retest operation includes the following steps B1-B4: Step B1: reacquire two second sample photoelectric detectors of the second photoelectric detection channel from the target batch of photoelectric detectors.

[0072] Step B2: Perform sensitivity tests on each second photoelectric detection channel according to the bit error rate requirements and the confidence requirements to determine the first sensitivity corresponding to each second photoelectric detection channel; and perform sensitivity tests on each second photoelectric detection channel according to the second time length to determine the second sensitivity corresponding to each second photoelectric detection channel.

[0073] Step B3: performing difference processing on the first sensitivity and the second sensitivity of each second photoelectric detection channel to determine the second sensitivity difference corresponding to each second photoelectric detection channel.

[0074] Step B4: Eliminate the maximum and minimum values ​​among the first sensitivity differences and the second sensitivity differences, determine the candidate sensitivity differences, use each candidate sensitivity difference as a new first sensitivity difference, and return to execute the above-mentioned step of obtaining the maximum first sensitivity difference and the minimum first sensitivity difference among the first sensitivity differences.

[0075] Among them, other photodetectors can be reselected from the target batch of photodetectors. These photodetectors can be recorded as second sample photodetectors, and the photodetection channels included in these second sample photodetectors are recorded as second photodetection channels. The number of reselected second photodetection channels is two, that is, two second photodetection channels are reselected.

[0076] After obtaining the two newly selected second photodetection channels, the test process in step 206 can be followed to perform a long-term sensitivity test of the first duration on each of the two second photodetection channels to obtain the first sensitivity corresponding to each second photodetection channel. A short-term sensitivity test of the second duration can also be performed on each of the two second photodetection channels to obtain the second sensitivity corresponding to each second photodetection channel. The difference between the first sensitivity and the corresponding second sensitivity of each second photodetection channel is then calculated to obtain a sensitivity difference corresponding to each second photodetection channel, which is recorded as the second sensitivity difference.

[0077] Afterwards, the second sensitivity differences can be combined with the first sensitivity differences and sorted to find the largest sensitivity difference (recorded as the maximum value) and the smallest sensitivity difference (recorded as the minimum value). The maximum and minimum values ​​are then eliminated, and the remaining sensitivity differences can be recorded as candidate sensitivity differences. The total number of candidate sensitivity differences is the same as the total number of first sensitivity differences. These candidate sensitivity differences can then be used as new first sensitivity differences, and the process returns to steps A1 and A2. This means that the range can be calculated for each new first sensitivity difference, and a determination is made as to whether the range is less than a preset threshold. If so, a sensitivity compensation amount is calculated based on the new first sensitivity differences. If not, steps B1-B4 are returned to reselect two new second photoelectric detection channels from the target batch of photoelectric detectors for sensitivity testing. This results in new first sensitivity differences for this round, and the process returns to steps A1 and A2 for a new determination. Until the extreme difference corresponding to each new first sensitivity difference is less than the preset threshold, the loop is terminated and the sensitivity compensation amount is calculated based on each new first sensitivity difference in the current round.

[0078] In this embodiment, by comparing the range between the maximum and minimum values ​​in each first sensitivity difference with a preset threshold value, and determining whether to determine the sensitivity compensation amount through each first sensitivity difference value based on the comparison result, the accuracy of the sensitivity compensation amount finally determined can be improved, thereby improving the accuracy of the test results of the subsequent sensitivity test on a large number of samples. In addition, when the range corresponding to each first sensitivity difference value is less than the preset threshold value, the sensitivity compensation amount is determined through each first sensitivity difference value, which can further improve the accuracy of the sensitivity compensation amount finally determined. Furthermore, when the range corresponding to each first sensitivity difference value is not less than the preset threshold value, by reselecting samples from a large number of products to participate in the sensitivity test, and based on the sensitivity test results of the reselected samples combined with the test results of the previous round of samples, the final first sensitivity differences are determined, which can ensure the accuracy of the selected first sensitivity differences and further ensure the accuracy of the sensitivity compensation amount finally determined.

[0079] From the description of the above embodiments, it can be seen that in the embodiments of the present invention, the difference between the sensitivity obtained by short-time / instantaneous bit error rate monitoring and the sensitivity obtained by long-time bit error rate monitoring of a small number of samples of the same type or the same batch is tested, and the long-time bit error rate test results are inferred from the instantaneous bit error rate test results, so as to achieve the effect of greatly shortening the test time in large-scale testing, and realize the rapid and accurate testing of the sensitivity of large quantities of photoelectric detectors in low bit error rate systems.

[0080] The photoelectric detector sensitivity testing device provided by the present invention is described below. The photoelectric detector sensitivity testing device described below and the photoelectric detector sensitivity testing method described above can be referenced to each other.

[0081] Figure 4 FIG4 is a schematic diagram of the structure of the photoelectric detector sensitivity testing device provided by the present invention. Referring to FIG4 , the device may include: An acquisition module 410 is configured to acquire a sensitivity compensation amount corresponding to a target batch of photodetectors; the sensitivity compensation amount is determined based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, where the first sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a first duration, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a second duration; a sensitivity testing module 420 configured to perform a sensitivity test on each photodetector in the target batch of photodetectors according to a second duration to determine a pending sensitivity corresponding to each photodetector; wherein the second duration is less than the first duration, and the total number of photodetectors in the target batch of photodetectors is greater than a set number; The target sensitivity determination module 430 is configured to determine the target sensitivity corresponding to each photodetector according to the undetermined sensitivity of each photodetector and the sensitivity compensation amount.

[0082] In one embodiment, the acquisition module 410 is specifically configured to acquire test parameters corresponding to the target batch of photodetectors; the test parameters include a transmission rate corresponding to the target batch of photodetectors, a bit error rate requirement required to be achieved by the target batch of photodetectors, a confidence requirement required to be achieved by the target batch of photodetectors, and a test duration allowed for the target batch of photodetectors, where the test duration is equal to the second duration. Obtaining a set number of first sample photoelectric detectors from a target batch of photoelectric detectors; wherein the total number of first photoelectric detection channels corresponding to the set number of first sample photoelectric detectors is greater than or equal to 3; Determine a first duration according to transmission rate, bit error rate requirements, and confidence requirements, and perform a sensitivity test on each first photoelectric detection channel using the first duration to determine a first sensitivity corresponding to each first photoelectric detection channel; and perform a sensitivity test on each first photoelectric detection channel according to a second duration to determine a second sensitivity corresponding to each first photoelectric detection channel; A sensitivity compensation amount is determined according to the first sensitivity and the second sensitivity of each first photodetection channel.

[0083] Optionally, the acquisition module 410 is specifically configured to perform difference processing on the first sensitivity and the second sensitivity of each first photoelectric detection channel to determine a first sensitivity difference corresponding to each first photoelectric detection channel; and determine a sensitivity compensation amount according to each first sensitivity difference.

[0084] In one embodiment, before the acquisition module 410 determines the sensitivity compensation amount according to each first sensitivity difference, the apparatus further includes: a range determination module, configured to obtain a maximum first sensitivity difference value and a minimum first sensitivity difference value among the first sensitivity differences, and perform difference processing on the maximum first sensitivity difference value and the minimum first sensitivity difference value to obtain a range; The return execution module is used to determine whether to return to the step of determining the sensitivity compensation amount according to each first sensitivity difference value based on the range and the preset threshold.

[0085] Optionally, the return execution module is specifically configured to execute a retest operation if the range is not less than a preset threshold value, until the range is less than the preset threshold value, and the retest operation includes: reacquire two second sample photodetectors of a second photodetection channel from the target batch of photodetectors; Performing a sensitivity test on each second photoelectric detection channel according to the bit error rate requirement and the confidence requirement to determine the first sensitivity corresponding to each second photoelectric detection channel; and performing a sensitivity test on each second photoelectric detection channel according to the second time length to determine the second sensitivity corresponding to each second photoelectric detection channel; performing difference processing on the first sensitivity and the second sensitivity of each second photoelectric detection channel to determine a second sensitivity difference corresponding to each second photoelectric detection channel; Eliminate the maximum and minimum values ​​among the first sensitivity differences and the second sensitivity differences, determine the candidate sensitivity differences, use each candidate sensitivity difference as a new first sensitivity difference, and return to execute the above steps of obtaining the maximum first sensitivity difference and the minimum first sensitivity difference among the first sensitivity differences.

[0086] Optionally, the return execution module is specifically configured to return to the step of determining the sensitivity compensation amount according to each first sensitivity difference if the range is less than a preset threshold.

[0087] It should be noted here that the above-mentioned device provided by the embodiment of the present invention can implement all the method steps implemented by the above-mentioned method embodiment and can achieve the same technical effect. The parts and beneficial effects of this embodiment that are the same as those of the method embodiment will not be described in detail here.

[0088] Figure 5 An example of a physical structure diagram of an electronic device is shown below. Figure 5As shown, the electronic device may include: a processor 510, a communications interface 520, a memory 530, and a communications bus 540. The processor 510, the communications interface 520, and the memory 530 communicate with each other via the communications bus 540. The processor 510 may invoke logic instructions in the memory 530 to execute a photodetector sensitivity testing method, which includes: obtaining a sensitivity compensation amount corresponding to a target batch of photodetectors; determining the sensitivity compensation amount based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, wherein the first sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a first duration, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a second duration; performing a sensitivity test on each photodetector in the target batch of photodetectors at the second duration to determine a pending sensitivity corresponding to each photodetector; the second duration being less than the first duration, and the total number of photodetectors in the target batch of photodetectors being greater than a set number; and determining a target sensitivity corresponding to each photodetector based on the pending sensitivity and the sensitivity compensation amount of each photodetector.

[0089] Furthermore, the logic instructions in the aforementioned memory 530 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the portion that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, a mobile hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0090] On the other hand, the present invention also provides a computer program product, which includes a computer program, which can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the photodetector sensitivity testing method provided by the above methods, the method including: obtaining the sensitivity compensation amount corresponding to the target batch of photodetectors; the above sensitivity compensation amount is determined based on the first sensitivity and second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, the above first sensitivity is obtained by performing a sensitivity test on the first sample photodetector under a first time length, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetector under a second time length; performing a sensitivity test on each photodetector in the target batch of photodetectors according to the second time length to determine the pending sensitivity corresponding to each photodetector; the above second time length is less than the first time length, and the total number of photodetectors included in the above target batch of photodetectors is greater than the set number; determining the target sensitivity corresponding to each photodetector based on the pending sensitivity and sensitivity compensation amount of each photodetector.

[0091] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the photodetector sensitivity testing method provided by the above-mentioned methods, the method comprising: obtaining a sensitivity compensation amount corresponding to a target batch of photodetectors; the sensitivity compensation amount is determined based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, the first sensitivity being obtained by performing a sensitivity test on the first sample photodetector at a first time length, and the second sensitivity being obtained by performing a sensitivity test on the first sample photodetector at a second time length; performing a sensitivity test on each photodetector in the target batch of photodetectors according to the second time length to determine the pending sensitivity corresponding to each photodetector; the second time length is less than the first time length, and the total number of photodetectors included in the target batch of photodetectors is greater than the set number; determining the target sensitivity corresponding to each photodetector based on the pending sensitivity and the sensitivity compensation amount of each photodetector.

[0092] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one location or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of the present embodiment. Persons of ordinary skill in the art will be able to understand and implement the present invention without inventive effort.

[0093] Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented using software plus a necessary general-purpose hardware platform, or of course, hardware. Based on this understanding, the essence of the above technical solution, or the portion that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, or an optical disk, and includes a number of instructions for causing a computer device (such as a personal computer, server, or network device) to execute the methods described in each embodiment or certain portions of the embodiments.

[0094] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A method for testing the sensitivity of a photodetector, characterized in that: include: Obtain the sensitivity compensation amount corresponding to the target batch of photoelectric detectors; The sensitivity compensation amount is determined based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, where the first sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a first duration, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a second duration; performing a sensitivity test on each photodetector in the target batch of photodetectors according to the second time duration to determine the pending sensitivity corresponding to each photodetector; the second time duration is shorter than the first time duration, and the total number of photodetectors included in the target batch of photodetectors is greater than the set number; The target sensitivity corresponding to each photodetector is determined according to the undetermined sensitivity of each photodetector and the sensitivity compensation amount.

2. The photodetector sensitivity testing method according to claim 1, wherein: The step of obtaining the sensitivity compensation amount corresponding to the target batch of photoelectric detectors includes: Obtaining test parameters corresponding to the target batch of photodetectors; the test parameters include a transmission rate corresponding to the target batch of photodetectors, a bit error rate requirement required to be achieved by the target batch of photodetectors, a confidence requirement required to be achieved by the target batch of photodetectors, and a test duration allowed for the target batch of photodetectors, where the test duration is equal to the second duration; Acquire the set number of first sample photoelectric detectors from the target batch of photoelectric detectors; the total number of first photoelectric detection channels corresponding to the set number of first sample photoelectric detectors is greater than or equal to 3; Determining the first duration according to the transmission rate, the bit error rate requirement, and the confidence requirement, and performing a sensitivity test on each of the first photoelectric detection channels using the first duration to determine a first sensitivity corresponding to each of the first photoelectric detection channels; and performing a sensitivity test on each of the first photoelectric detection channels according to the second duration to determine a second sensitivity corresponding to each of the first photoelectric detection channels; The sensitivity compensation amount is determined according to the first sensitivity and the second sensitivity of each of the first photodetection channels.

3. The photoelectric detector sensitivity testing method according to claim 2, characterized in that: The determining the sensitivity compensation amount according to the first sensitivity and the second sensitivity of each first photoelectric detection channel includes: performing difference processing on the first sensitivity and the second sensitivity of each first photoelectric detection channel to determine a first sensitivity difference corresponding to each first photoelectric detection channel; The sensitivity compensation amount is determined according to each of the first sensitivity differences.

4. The photodetector sensitivity testing method according to claim 3, wherein: Before determining the sensitivity compensation amount according to each of the first sensitivity differences, the method further includes: Obtaining a maximum first sensitivity difference and a minimum first sensitivity difference among the first sensitivity differences, and performing difference processing on the maximum first sensitivity difference and the minimum first sensitivity difference to obtain a range; According to the range and a preset threshold, it is determined whether to return to the step of determining the sensitivity compensation amount according to each of the first sensitivity differences.

5. The method for testing the sensitivity of a photodetector according to claim 4, wherein: The step of determining whether to return to the step of determining the sensitivity compensation amount according to each of the first sensitivity differences based on the range and a preset threshold value includes: If the range is not less than the preset threshold, a retest operation is performed until the range is less than the preset threshold, the retest operation including: Reacquire two second sample photodetectors of the second photodetection channel from the target batch of photodetectors; Performing a sensitivity test on each of the second photoelectric detection channels according to the bit error rate requirement and the confidence requirement to determine the first sensitivity corresponding to each of the second photoelectric detection channels; and performing a sensitivity test on each of the second photoelectric detection channels according to the second time length to determine the second sensitivity corresponding to each of the second photoelectric detection channels; performing difference processing on the first sensitivity and the second sensitivity of each second photoelectric detection channel to determine a second sensitivity difference corresponding to each second photoelectric detection channel; Eliminate the maximum and minimum values ​​among the first sensitivity differences and the second sensitivity differences, determine the candidate sensitivity differences, use each of the candidate sensitivity differences as a new first sensitivity difference, and return to execute the step of obtaining the maximum first sensitivity difference and the minimum first sensitivity difference among the first sensitivity differences.

6. The method for testing the sensitivity of a photodetector according to claim 4, wherein: The step of determining whether to return to the step of determining the sensitivity compensation amount according to each of the first sensitivity differences based on the range and a preset threshold value includes: If the range is smaller than the preset threshold, the process returns to the step of determining the sensitivity compensation amount according to each of the first sensitivity differences.

7. A photoelectric detector sensitivity testing device, characterized in that: include: An acquisition module is used to obtain the sensitivity compensation amount corresponding to the target batch of photoelectric detectors; The sensitivity compensation amount is determined based on a first sensitivity and a second sensitivity corresponding to a set number of first sample photodetectors in the target batch of photodetectors, where the first sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a first duration, and the second sensitivity is obtained by performing a sensitivity test on the first sample photodetectors at a second duration; a sensitivity testing module, configured to perform a sensitivity test on each photodetector in the target batch of photodetectors according to the second duration to determine a pending sensitivity corresponding to each photodetector; the second duration is less than the first duration, and the total number of photodetectors included in the target batch of photodetectors is greater than the set number; The target sensitivity determination module is used to determine the target sensitivity corresponding to each photodetector according to the undetermined sensitivity of each photodetector and the sensitivity compensation amount.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the photodetector sensitivity testing method according to any one of claims 1 to 6 is implemented.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the photodetector sensitivity testing method according to any one of claims 1 to 6 is implemented.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the photodetector sensitivity testing method according to any one of claims 1 to 6 is implemented.

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