Calibration method and device of measuring device, medium and program product

By using a pair of calibration parts and three profilometers, the pose transformation relationship is determined and the coordinate system is transformed, which solves the vibration error problem introduced by the rotation of a single 3D profilometer and improves the accuracy of 3D measurement of apex rubber.

CN120628005AActive Publication Date: 2025-09-12凯多智能科技(上海)有限公司
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Patent Information

Application Number
CN202511133838.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-08-14
Publication Date
2025-09-12
Estimated Expiration
2045-08-14

AI Technical Summary

Technical Problem

In the prior art, when using a single 3D profilometer to scan apex adhesive, the workpiece or the instrument needs to be manually rotated, resulting in vibration errors and affecting the accuracy of three-dimensional detection.

Method used

A pair of calibration parts and three profilometers are used to determine the posture transformation relationship through feature patterns and measurement data, realize the unified transformation of the coordinate system, and avoid the calibration deviation caused by the rotation of a single profilometer.

Benefits of technology

The accuracy of three-dimensional measurement is improved, the problem of inaccurate detection caused by calibration error is avoided, and efficient three-dimensional measurement of triangle glue is achieved.

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Abstract

The invention provides a calibration method and device of a measuring device, a medium and a program product. The method comprises the following steps of: irradiating the surfaces of a pair of calibration pieces through each contourgraph to obtain first measurement data under a respective contourgraph coordinate system; a feature pattern constructed by a pair of calibration pieces is located in a common view field of each contourgraph; determining first pose conversion relation information between each contourgraph and a pair of calibration parts based on the first measurement data; wherein the first pose conversion relation information comprises an included angle between the optical axis direction of the contourgraph and a reference line determined by the feature pattern, and a distance, obtained based on the first measurement data, of each contourgraph relative to the reference line; and based on the first pose conversion relation information of each contourgraph, obtaining coordinate conversion information from each contourgraph coordinate system to a unified coordinate system. Calibration deviation caused by rotation of a single contourgraph can be avoided, and the problem of inaccurate three-dimensional measurement caused by calibration errors is solved.
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Description

Technical Field

[0001] The present disclosure relates to the field of measurement technology, and in particular to a calibration method, device, medium, and program product for a measurement device. Background Art

[0002] The apex is the main filler of the tire bead, which plays a role in supporting the tire sidewall. If the size of the apex is incomplete, it cannot effectively fill the tire bead, which will greatly reduce the role of supporting the tire sidewall. Therefore, the integrity of the apex is crucial to the tire.

[0003] In related technologies, when inspecting apex dimensions, a single 3D profilometer is often used to obtain single-view, single-side dimensions. However, single-side 3D data cannot capture the complete dimensions of the apex. Therefore, the workpiece or the 3D profilometer must be manually rotated to achieve 360-degree coverage of the apex to obtain the complete 3D profile of the apex. However, this method is prone to introducing vibration errors during rotation, resulting in reduced 3D inspection accuracy. Summary of the Invention

[0004] In view of the above-mentioned shortcomings of the prior art, the purpose of the present disclosure is to provide a calibration method, device, medium and program product for a measuring device to solve the problems in the related art.

[0005] A first aspect of the present disclosure provides a calibration method, comprising:

[0006] Each profilometer irradiates the surface of a pair of calibration pieces to obtain first measurement data in the respective profilometer coordinate systems; wherein the pair of calibration pieces are spaced apart and arranged in an area between the three profilometers; and a characteristic pattern constructed by the pair of calibration pieces is located in a common field of view of each of the profilometers;

[0007] Determining first pose conversion relationship information between each of the profilometers and a pair of the calibration pieces based on the first measurement data; wherein the first pose conversion relationship information includes an angle between an optical axis direction of the profilometer and a reference line determined by the characteristic pattern, and a spacing between each profilometer and the reference line obtained based on the first measurement data;

[0008] Based on the first pose conversion relationship information of each of the profilometers, coordinate conversion information of each of the profilometer coordinate systems to a unified coordinate system is obtained.

[0009] In an embodiment of the first aspect, each of the profilometers is irradiated on the surface of a pair of calibration parts after height change to obtain a second measurement data in the respective profilometer coordinate systems; measurement deviation data is obtained based on the first measurement data and the second measurement data; wherein the measurement deviation data is used to compensate for the calibration deviation in the unified coordinate system.

[0010] In an embodiment of the first aspect, the unified coordinate system is implemented as a profiler coordinate system of one of the profilers.

[0011] In an embodiment of the first aspect, the characteristic pattern includes a line connecting the same points on a pair of the calibration elements or an extension of the line.

[0012] In an embodiment of the first aspect, the characteristic pattern includes a line connecting the centers of a pair of the calibration elements or an extension of the line.

[0013] In an embodiment of the first aspect, the scanning heights of the three profilometers are the same; and / or the cross section of the calibration piece is implemented as a circle center or a regular polygon.

[0014] A second aspect of the present disclosure provides a measuring device, comprising:

[0015] Three profilometers, spaced apart in the circumferential direction;

[0016] Two calibration pieces, spaced apart and height-adjustable, are disposed in the area between the three profilometers;

[0017] A control unit is communicatively coupled to each of the profilometers, and is used to obtain first measurement data obtained by each of the profilometers irradiating the surface of a pair of calibration parts; determine first position transformation relationship information between each of the profilometers and the pair of calibration parts based on the first measurement data; and obtain coordinate transformation information from the coordinate system of each of the profilometers to a unified coordinate system based on the first position transformation relationship information of each of the profilometers.

[0018] In an embodiment of the second aspect, the angle between two adjacent profilometers is 120 degrees.

[0019] A third aspect of the present disclosure provides a computer-readable storage medium storing program instructions, wherein the program instructions are executed to perform the calibration method as described in any one of the first aspects.

[0020] A fourth aspect of the present disclosure provides a computer program product, comprising: program instructions for executing the calibration method as described in any one of the first aspects.

[0021] As described above, the present disclosure provides a calibration method, device, medium, and program product for a measuring device. The method includes: irradiating the surface of a pair of calibration pieces with each profilometer to obtain a first measurement data in the coordinate system of each profilometer; wherein the pair of calibration pieces are spaced apart in the area between the three profilometers; the characteristic pattern constructed by the pair of calibration pieces is located in the common field of view of each profilometer; based on the first measurement data, determining the first pose transformation relationship information between each profilometer and the pair of calibration pieces; wherein the first pose transformation relationship information includes the angle between the optical axis direction of the profilometer and the reference line determined by the characteristic pattern, and the spacing of each profilometer relative to the reference line obtained based on the first measurement data; based on the first pose transformation relationship information of each profilometer, obtaining the coordinate transformation information of each profilometer coordinate system to a unified coordinate system. The present disclosure uses a pair of calibration pieces and three profilometers to not only efficiently realize the calibration of the measuring device, but also avoid the calibration deviation caused by the rotation of a single profilometer, thereby being used in the subsequent three-dimensional measurement of apex rubber to solve the problem of inaccurate three-dimensional measurement due to calibration errors. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 ] is a schematic top view of the calibration piece entering the profilometer's viewing angle in one embodiment of the present disclosure.

[0023] Figure 2 FIG. 1 is a schematic diagram of a scanning area of ​​a profilometer according to an embodiment of the present disclosure.

[0024] Figure 3 FIG. 2 is a schematic diagram of a scanning area of ​​another profilometer according to an embodiment of the present disclosure.

[0025] Figure 4 ] is a schematic diagram of a scanning area of ​​yet another profilometer in an embodiment of the present disclosure.

[0026] Figure 5 , which is a flow chart of a calibration method for a measuring device in one embodiment of the present disclosure.

[0027] Figure 6 ] is a schematic diagram of the first pose conversion relationship information in one embodiment of the present disclosure.

[0028] Figure 7 , which is a flow chart of a calibration method for a measuring device in another embodiment of the present disclosure.

[0029] Figure 8 The present disclosure is shown in Figure 7 Schematic diagram of the structure of the calibration component in the example.

[0030] Figure 9 The present disclosure is shown in Figure 7 Schematic cross-sectional view of the calibration component in the example.

[0031] Figure 10 ] is a flow chart of the measuring method of the measuring device in an embodiment of the present disclosure.

[0032] Figure 11 ] is a schematic diagram of the circuit structure of a computer device in one embodiment of the present disclosure.

[0033] Reference numerals: measuring device 10 ; profilometer 11 ; first telescopic member 111 ; calibration member 12 ; first cylinder 121 ; second cylinder 122 ; second telescopic member 123 ; computer device 200 ; bus 201 ; processor 202 ; memory 203 ; communicator 204 . DETAILED DESCRIPTION

[0034] The following describes the embodiments of the present disclosure through specific examples. Those skilled in the art can easily understand the other advantages and effects of the present disclosure from the information disclosed in this disclosure. The present disclosure can also be implemented or applied through different specific embodiments. The details of the present disclosure can also be modified or changed according to different viewpoints and application modules without departing from the spirit of the present disclosure. It should be noted that the embodiments and features in the embodiments of the present disclosure can be combined with each other unless there is a conflict.

[0035] The following is a detailed description of the embodiments of the present disclosure with reference to the accompanying drawings so that those skilled in the art can easily implement the present disclosure. The present disclosure can be embodied in many different forms and is not limited to the embodiments described herein.

[0036] Throughout the present disclosure, reference to terms such as "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with that embodiment or example is included in at least one embodiment or example of the present disclosure. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or a group of embodiments or examples. Furthermore, those skilled in the art may combine and integrate different embodiments or examples, and features of different embodiments or examples, as described in the present disclosure, without conflicting requirements.

[0037] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the context of this disclosure, "a group" means two or more, unless otherwise specifically defined.

[0038] In order to clearly describe the present disclosure, components not related to the description are omitted, and the same or similar components throughout the specification are denoted by the same reference numerals.

[0039] Throughout this specification, when a device is said to be "connected" to another device, this includes not only "direct connection" but also "indirect connection" with other elements interposed therebetween. Furthermore, when a device is said to "include" a certain component, unless otherwise stated, this does not exclude the inclusion of other components but rather implies that the device may include other components.

[0040] Although the terms first, second, etc. are used in this document to represent various elements in some examples, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, the first interface and the second interface, etc. are represented. Furthermore, as used in this document, the singular forms "one," "an," and "the" are intended to also include the plural forms, unless there is a contrary indication in the context. It should be further understood that the terms "comprise" and "include" indicate the presence of the described features, steps, operations, elements, modules, projects, types, and / or groups, but do not exclude the presence, occurrence, or addition of one or a group of other features, steps, operations, elements, modules, projects, types, and / or groups. The terms "or" and "and / or" used herein are interpreted as inclusive, or mean any one or any combination. Therefore, "A, B, or C" or "A, B, and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B, and C." Exceptions to this definition only occur when the combination of elements, functions, steps, or operations is inherently mutually exclusive in some way.

[0041] The technical terms used herein are intended only to refer to specific embodiments and are not intended to limit the present disclosure. The singular form used herein also includes the plural form unless the statement explicitly indicates otherwise. The term "comprising" as used in this specification is intended to specify specific features, regions, integers, steps, operations, elements, and / or components and does not exclude the presence or addition of other features, regions, integers, steps, operations, elements, and / or components.

[0042] Although not defined differently, all terms used herein, including technical and scientific terms, have the same meanings as those generally understood by those skilled in the art to which this disclosure belongs. Terms defined in commonly used dictionaries are additionally interpreted as having meanings consistent with relevant technical literature and the current message. Unless otherwise defined, they should not be overly interpreted as ideal or highly formalized meanings.

[0043] The apex is the main filler of the tire bead, which plays a role in supporting the tire sidewall. If the size of the apex is incomplete, it cannot effectively fill the tire bead, which will greatly reduce the role of supporting the tire sidewall. Therefore, the integrity of the apex is crucial to the tire.

[0044] In related technologies, when inspecting apex dimensions, a single 3D profilometer is often used to obtain single-view, single-side dimensions. However, single-side 3D data cannot capture the complete dimensions of the apex. Therefore, the workpiece or the 3D profilometer must be manually rotated to achieve 360-degree coverage of the apex to obtain the complete 3D profile of the apex. However, this method is prone to introducing vibration errors during rotation, resulting in reduced 3D inspection accuracy.

[0045] Based on the above problems, the present disclosure provides a calibration method for a measuring device. By using a pair of calibration parts and three profilometers, the measuring device can be calibrated efficiently while avoiding calibration deviations caused by the rotation of a single profilometer. The method can be used in subsequent three-dimensional measurement of apex rubber to solve the problem of inaccurate three-dimensional measurement caused by calibration errors.

[0046] Figure 1 , which is a top view schematic diagram of the calibration piece 12 in the viewing angle of the profilometer 11 in one embodiment of the present disclosure. Figure 2 FIG. 1 is a schematic diagram of a scanning area of ​​a profilometer 11 in one embodiment of the present disclosure. Figure 3 FIG. 2 is a schematic diagram of a scanning area of ​​another profilometer 11 in an embodiment of the present disclosure. Figure 4 FIG is a schematic diagram of a scanning area of ​​another profilometer 11 in an embodiment of the present disclosure. Figure 1 In this example, the measuring device 10 includes three profilometers 11 and a pair of calibration members 12. The three profilometers 11 are arranged at intervals in the circumferential direction, and the pair of calibration members 12 are arranged at intervals in the area surrounded by the three profilometers 11.

[0047] For example, the angles between the three profilometers 11 are configured to be 120 degrees, so that the sum of the scanning areas of the three profilometers 11 can completely cover the outer edges of the pair of calibration objects 12. In other embodiments, the angles between the three profilometers 11 are configured to be other degrees that can enable the sum of the scanning areas of the three profilometers 11 to completely cover the outer edges of the pair of calibration objects 12, but the present invention is not limited thereto.

[0048] For example, the three profilometers 11 have the same scanning height (Z-axis height). As will be appreciated, first, this same height ensures that the measurement reference surfaces (e.g., laser emission point) of the three profilometers 11 are coplanar, avoiding measurement reference offsets caused by height differences. This allows for direct comparison or fusion of the three sets of data, improving the reliability of the calibration results. Second, it eliminates the need for additional calculation of height (Z-axis) compensation parameters during calibration, reducing calibration complexity. For example, when calibrating multiple profilometers 11, height alignment can reduce the number of degrees of freedom required during coordinate system transformations, improving calibration efficiency. It is important to note that the three profilometers 11 must have identical specifications. As will be appreciated, identical sensor characteristics (e.g., laser wavelength, sampling frequency, detection accuracy, optical resolution, etc.) ensure consistent response across the three devices to the same surface, avoiding measurement deviations due to hardware differences. Unified calibration parameters (e.g., zero offset, gain factor, and temperature compensation curve) can be directly reused, eliminating the need for separate calibration for each device and reducing human error.

[0049] Those skilled in the art will appreciate that multiple profilometers 11 can collect data from different angles or positions, further verifying the response consistency of the calibration object 12 at different spatial locations and reducing local errors (such as the effects of mechanical installation deviations or optical distortion). Furthermore, joint calibration of three profilometers 11 can identify the effects of tilt or offset of mechanical structures (such as fixtures and platforms) on measurement, compensating for errors through multi-viewpoint data.

[0050] For example, the calibration object 12 is cylindrical, and the first measurement data acquired by each profilometer 11 is the measurement data of an arc composed of multiple consecutive points. The arc of the measurement data acquired by the three profilometers 11 for the same calibration object 12 can completely cover the circumference of the calibration object 12. The data of the cylindrical calibration object 12 is calculated, and a circle is fitted using the data to obtain the center, diameter, and a straight line between the two center points, so as to facilitate subsequent judgment and calibration.

[0051] For example, the optical axis direction of each of the profilometers 11 is aligned with the pair of calibration pieces 12, but the angles between the optical axis direction and the line connecting the pair of calibration pieces 12 are different, so the first measurement data obtained by each of the profilometers 11 are also different. Figure 2 、 Figure 3 and Figure 4 The bold arcs in this example represent image data captured by the three profilometers 11, and the first measurement data is then calculated based on the image data. This shows that the combined scanning areas of the three profilometers 11 can completely cover the outer edges of the pair of calibration components 12, thereby avoiding the situation where the calibration accuracy is reduced due to the scanning area not fully covering the outer edges of the pair of calibration components 12.

[0052] For example, one of the three profilometers 11 is aligned with the pair of calibration pieces 12, and the other two are aligned obliquely with the pair of calibration pieces 12. Preferably, the scanning direction of one of the three profilometers 11 is perpendicular to the line connecting the centers of the pair of calibration pieces 12.

[0053] In other embodiments, the calibration element 12 may also be implemented as a square column or a regular pentagonal column, but is not limited thereto.

[0054] Figure 5 FIG is a flow chart of a calibration method of a measuring device 10 according to an embodiment of the present disclosure. Figure 5 In this example, the calibration method can be applied to Figure 1 In this example, three profilometers 11 are spaced apart in the circumferential direction.

[0055] exist Figure 5 In this example, the calibration method includes: Step S101 : each of the profilometers 11 is used to illuminate the surfaces of a pair of calibration objects 12 to obtain first measurement data in the coordinate system of each profilometer 11 .

[0056] Exemplarily, a pair of calibration elements 12 are spaced apart in the area between the three profilometers 11, and a characteristic pattern constructed by the pair of calibration elements 12 is located in the common field of view of each profilometer 11. Exemplarily, the characteristic pattern comprises a line connecting points on the pair of calibration elements 12 or an extension of that line. In this embodiment, the characteristic pattern is implemented as a line connecting the centers of the cylindrical calibration elements 12 derived from the first measurement data. Preferably, the two selected points are at the same height (i.e., have the same Z-axis coordinate value).

[0057] In other embodiments, the characteristic pattern may also be implemented as a pair of two points at different positions on the calibration member 12, such as any point on the top wall, the side wall, or the arc of the top wall.

[0058] Step S102: Determine the first pose conversion relationship information between each of the profilometers 11 and a pair of the calibration parts 12 based on the first measurement data.

[0059] Figure 6 The diagram shown in FIG is a schematic diagram of the first posture conversion relationship information in one embodiment of the present disclosure. Figure 6In this example, the first pose transformation relationship information includes the angle α between the optical axis direction of the profilometer 11 and the reference line determined by the characteristic pattern, and the spacing L between each profilometer 11 and the reference line obtained based on the first measurement data. Those skilled in the art will appreciate that each of the first pose transformation relationship information can enable each corresponding profilometer 11 to obtain the angle between itself and the calibration object 12 in space, thereby obtaining the process of angular calibration of the profilometer 11 in space. In the subsequent calibration process, the angle is used to rotate the first measurement data, and the spacing is used to translate the first measurement data.

[0060] Step S103: Based on the first pose conversion relationship information of each of the profilometers 11 , coordinate conversion information of each of the profilometers 11 to a unified coordinate system is obtained.

[0061] It is understood by those skilled in the art that when calibrating or measuring the profilometer 11 , the point cloud data at different perspectives need to be transformed into a unified coordinate system through a rotation matrix and a translation matrix, and then spliced ​​into a complete three-dimensional model.

[0062] Figure 7 FIG is a flow chart of a calibration method of a measuring device 10 according to another embodiment of the present disclosure. Figure 7 In another embodiment, the calibration method includes: Step S201 : each of the profilometers 11 is used to illuminate the surfaces of a pair of calibration objects 12 to obtain first measurement data in the coordinate system of each profilometer 11 .

[0063] Step S202: Determine the first pose conversion relationship information between each of the profilometers 11 and a pair of the calibration parts 12 based on the first measurement data.

[0064] Step S203: Based on the first pose conversion relationship information of each of the profilometers 11 , coordinate conversion information of each of the profilometers 11 to a unified coordinate system is obtained.

[0065] Step S204 : each of the profilometers 11 is used to illuminate the surfaces of the pair of calibration objects 12 after the height change to obtain a second measurement data in the coordinate system of each profilometer 11 .

[0066] Step S204: obtaining measurement deviation data based on the first measurement data and the second measurement data; wherein the measurement deviation data is used to compensate for the calibration deviation in the unified coordinate system.

[0067] Those skilled in the art will appreciate that using a calibration piece 12 with varying heights can be used to test the repeatability and linearity errors of the profilometer 11 at different heights. For example, height differences can cause optical path refraction, shadowing effects, or variations in sensor response. Calibration at multiple heights can expose and correct these issues. Calibration at a single height can mask these height-dependent errors, leading to systematic deviations in actual measurements.

[0068] Figure 8 The present disclosure is shown in Figure 7 A schematic diagram of the structure of the profilometer 11 in the example. Figure 7 In the embodiment, the height of each profilometer 11 is adjustable to meet the requirement that the profilometer 11 can illuminate another height of the calibration object 12. Figure 8 In the example, the profilometer 11 is driven and connected to a first telescopic member 111 arranged vertically so as to rise and fall under the telescopic movement of the telescopic member. Exemplarily, the telescopic member is implemented as one of an oil cylinder, a pneumatic cylinder or an electric cylinder. It will be understood by those skilled in the art that by changing the height of the calibration member 12 through the telescopic movement of the telescopic member, the position error caused by replacing the calibration members 12 of different heights can be avoided, thereby further improving the accuracy of the calibration method. Preferably, the three profilometers 11 are still at the same height after being raised or lowered at the same time, that is, the three profilometers 11 rise or fall by the same distance. It should be noted that a pair of the calibration members 12 are still within the field of view of the three profilometers 11 after rising or falling.

[0069] Figure 9 The present disclosure is shown in Figure 7 A schematic cross-sectional view of the calibration member 12 in the example. Figure 7 In an embodiment, the height of the calibration piece 12 is adjustable to allow the profilometer 11 to illuminate another height of the calibration piece 12. Figure 9 In this example, the calibration member 12 includes a first cylinder 121 with an opening at the top, a second cylinder 122 with an opening at the bottom and sleeved outside the first cylinder 121, and a second telescopic member 123 disposed within the first and second cylinders 121, 122 and drivingly connected to the first and second cylinders 121, 122. Those skilled in the art will appreciate that the second cylinder 122, located at the top and sleeved outside the first cylinder 121, can prevent changes in the diameter of the calibration member 12 scanned by the profilometer 11 after the second cylinder 122 is raised or lowered, thereby reducing variables in the calibration process. Preferably, the pair of calibration members 12 are raised and lowered the same distance.

[0070] Figure 10 , which is a flow chart of the measuring method of the measuring device 10 in the embodiment of the present disclosure. Figure 10In this example, three profilometers 11 are defined as a first profilometer, a second profilometer, and a third profilometer. The measuring method includes: S301: Calculation process starts; S302: Start the profilometer 11 to collect data; S303: Load calibration parameters; S304: Calculating first profilometer data; S305: Calculating second profilometer data; S306: Calculating third profilometer data; S307: Data rotation; S308: data translation; S309: Data fusion; S3010: Generate 360-degree profile; S3011: End.

[0071] It is understandable that Figure 10 The data in the example is the first measurement data and the first posture conversion relationship information; or, the first measurement data, the second measurement data and the first posture conversion relationship information.

[0072] It will be understood by those skilled in the art that after measuring the three-dimensional outline dimensions of the apex through the above steps, the dimension between each two adjacent vertices of the apex is measured, and the dimension is compared with the predetermined data. If the difference between the dimension and the predetermined data exceeds the predetermined tolerance, the apex is judged to be unqualified. Otherwise, the apex is judged to be qualified.

[0073] Figure 11 The figure shows a schematic diagram of the circuit structure of a computer device in one embodiment of the present disclosure. Figure 11 In this example, the computer device 200 can be implemented in a server, a desktop computer, a laptop computer, a tablet computer, a smart phone or other terminals. The computer device 200 can be used to implement Figure 6 The control unit in.

[0074] The computer device 200 includes a bus 201, a processor 202, and a memory 203. The processor 202 and the memory 203 can communicate with each other via the bus 201. The memory 203 can store program instructions. The processor 202 executes the program instructions in the memory 203 to implement the method steps in the previous embodiment, for example Figure 2 The steps in the calibration method of the embodiment, or Figure 5 The steps in the measurement method.

[0075] Bus 201 may be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus. Buses can be classified into address buses, data buses, control buses, and the like. For ease of illustration, although only one thick line is used in the figure, this does not necessarily mean that there is only one bus or only one type of bus.

[0076] In some embodiments, processor 202 may be implemented as a central processing unit (CPU), a microprocessor unit (MCU), a system on a chip (SoC), or a field programmable gate array (FPGA). Memory 203 may include volatile memory, such as random access memory (RAM), for temporarily storing data while running programs.

[0077] The memory 203 may also include a non-volatile memory (non-volatile memory) for data storage, such as a read-only memory (ROM), a flash memory, a hard disk drive (HDD), or a solid-state disk (SSD).

[0078] In some embodiments, the computer device 200 may further include a communicator 204. The communicator 204 is used to communicate with the outside world. In a specific example, the communicator 204 may include one or a group of wired and / or wireless communication circuit modules. For example, the communicator 204 may include one or more of a wired network card, a USB module, a serial interface module, etc. The wireless communication protocols followed by the wireless communication module include, for example, near field communication (NFC) technology, infrared (IR) technology, Global System for Mobile communications (GSM), General Packet Radio Service (GPRS), Code Division Multiple Access (CDMA), Wideband Code Division Multiple Access (WCDMA), Time-Division Code Division Multiple Access (TD-SCDMA), Long Term Evolution (LTE), Bluetooth (BT), Global Navigation Satellite System (GNSS), etc. One or more of the following.

[0079] In an embodiment of the present disclosure, a computer-readable storage medium may be provided, which stores program instructions. When the program instructions are executed, the method steps in any of the above embodiments are implemented, for example Figure 5 The steps in the calibration method of the embodiment, or Figure 7 The steps in the calibration method.

[0080] That is, the method steps in the above embodiments are implemented as software or computer code that can be stored in a recording medium (such as a CD ROM, RAM, floppy disk, hard disk or magneto-optical disk), or are implemented as computer code originally stored in a remote recording medium or a non-transitory machine-readable medium downloaded via a network and to be stored in a local recording medium, so that the method represented herein can be stored in such software processing on a recording medium using a general-purpose computer, a dedicated processor or programmable or dedicated hardware (such as an ASIC or FPGA).

[0081] In an embodiment of the present disclosure, a computer program product may also be provided, comprising: Figure 5 The steps in the calibration method of the embodiment, or Figure 7Program instructions for the steps in the calibration method.

[0082] In summary, the present disclosure provides a calibration method, device, medium, and program product for a measuring device. The method includes: irradiating the surface of a pair of calibration pieces with each profilometer to obtain a first measurement data in the coordinate system of each profilometer; wherein the pair of calibration pieces are spaced apart in the area between the three profilometers; the characteristic pattern constructed by the pair of calibration pieces is located in the common field of view of each profilometer; based on the first measurement data, determining the first pose transformation relationship information between each profilometer and the pair of calibration pieces; wherein the first pose transformation relationship information includes the angle between the optical axis direction of the profilometer and the reference line determined by the characteristic pattern, and the spacing of each profilometer relative to the reference line obtained based on the first measurement data; based on the first pose transformation relationship information of each profilometer, obtaining the coordinate transformation information of each profilometer coordinate system to a unified coordinate system. The advantage of the above arrangement is that, through a pair of calibration pieces and three profilometers, the calibration of the measuring device can be efficiently realized, and the calibration deviation caused by the rotation of a single profilometer can be avoided, thereby being used in the subsequent three-dimensional measurement of apex rubber to solve the problem of inaccurate three-dimensional measurement due to calibration errors.

[0083] The above embodiments are merely illustrative of the principles and effects of this disclosure and are not intended to limit this disclosure. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of this disclosure. Therefore, any equivalent modifications or alterations made by a person skilled in the art without departing from the spirit and technical concepts disclosed herein shall be encompassed by the scope of protection of this disclosure.

Claims

1. A calibration method for a measuring device, characterized in that: The measuring device comprises at least three profilometers arranged at intervals in the circumferential direction and with scanning beams directed inward; the method comprises: Each profilometer irradiates the surface of a pair of calibration pieces to obtain first measurement data in the respective profilometer coordinate systems; wherein the pair of calibration pieces are spaced apart and arranged in an area between the three profilometers; and a characteristic pattern constructed by the pair of calibration pieces is located in a common field of view of each of the profilometers; Determining first pose conversion relationship information between each of the profilometers and a pair of the calibration pieces based on the first measurement data; wherein the first pose conversion relationship information includes an angle between an optical axis direction of the profilometer and a reference line determined by the characteristic pattern, and a spacing between each profilometer and the reference line obtained based on the first measurement data; Based on the first pose conversion relationship information of each of the profilometers, coordinate conversion information of each of the profilometer coordinate systems to a unified coordinate system is obtained.

2. The calibration method according to claim 1, characterized in that: Each profilometer is used to illuminate the surface of a pair of calibration parts after the height change to obtain a second measurement data in the respective profilometer coordinate system; measurement deviation data is obtained based on the first measurement data and the second measurement data; wherein the measurement deviation data is used to compensate for the calibration deviation in the unified coordinate system.

3. The calibration method according to claim 1, characterized in that: The unified coordinate system is implemented as a profilometer coordinate system of one of the profilometers.

4. The calibration method according to claim 1, characterized in that: The characteristic pattern includes a line connecting the same points on a pair of calibration pieces or an extension line of the line connecting the same points.

5. The calibration method according to claim 1, characterized in that: The characteristic pattern includes a line connecting the centers of a pair of calibration elements or an extension line of the line connecting the centers.

6. The calibration method according to claim 1, characterized in that: The scanning heights of the three profilometers are the same; and / or the cross section of the calibration piece is implemented as a circle center or a regular polygon.

7. A measuring device, characterized in that: include: Three profilometers, spaced apart in the circumferential direction; Two calibration pieces, spaced apart and height-adjustable, are disposed in the area between the three profilometers; A control unit is communicatively coupled to each of the profilometers, and is used to obtain first measurement data obtained by each of the profilometers irradiating the surface of a pair of calibration parts; determine first position transformation relationship information between each of the profilometers and the pair of calibration parts based on the first measurement data; and obtain coordinate transformation information from the coordinate system of each of the profilometers to a unified coordinate system based on the first position transformation relationship information of each of the profilometers.

8. The measuring device according to claim 7, characterized in that The included angle between two adjacent profilometers is 120 degrees.

9. A computer-readable storage medium, characterized in that Program instructions are stored, and the program instructions are executed to perform the calibration method according to any one of claims 1 to 6.

10. A computer program product, characterized in that include: Used to perform the calibration method according to any one of claims 1 to 6.

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