Brightness illumination test fixture for electronic product

Abstract

The invention discloses an electronic product brightness illumination test fixture, which comprises a test platform, a console is arranged at the front end of the test platform, the console is composed of a display screen and a plurality of control buttons, a pin power-on station is arranged at the center of the upper end of the test platform, a plurality of pin jacks are arranged in the upper end of the pin power-on station, and the pin jacks are connected with the display screen. A segmented supporting plate is arranged on the upper side of the pin electrifying table, a supporting plate groove is formed in the front side of the upper end of the segmented supporting plate, a lamp bead supporting plate is rotationally connected into the front end of the supporting plate groove, and the lamp bead supporting plate is connected into the supporting plate groove in a clamped mode. After the electric connection pins of the LED lamp beads are completely inserted into the pin jacks and are in stable contact, the segmented supporting plate is pressed downwards to enable the pin power-on station and the brightness detection plate to be electrically connected with the test platform, it is ensured that the pins of the lamp beads are in reliable contact with the jacks before power-on, flicker or damage caused by poor contact is avoided, and the test stability and safety are improved.

Description

Technical Field

[0001] The present invention belongs to the technical field related to brightness testing, and in particular relates to a brightness lighting test fixture for electronic products. Background Art

[0002] In the traditional LED lamp brightness test process, direct electrical contact is usually used for testing. This method has obvious technical defects: the electrical connection pins of the LED lamp bead and the jack of the test fixture are prone to poor contact during the initial contact, resulting in unstable instantaneous current, which in turn causes the lamp bead to flicker or be damaged, affecting the test accuracy and shortening the lamp bead life.

[0003] At the same time, traditional fixtures are unable to adjust the test current according to the characteristics of LED lamp beads with different power, resulting in inaccurate test data or being unable to adapt to the testing needs of products of various specifications; in addition, most existing test equipment uses a fixed connection structure, and the installation and removal efficiency of the lamp beads is low, which seriously affects production efficiency during batch testing.

[0004] In response to the above problems, this patent proposes a LED lamp brightness testing solution that can achieve stable contact, segmented power supply, automatic detection, rapid replacement, and is safe and reliable. Summary of the Invention

[0005] The purpose of the present invention is to provide a brightness lighting test fixture for electronic products to solve the problem raised in the above background technology that during the traditional LED lamp bead brightness test, the electrical connection pins of the LED lamp bead and the jack of the test fixture are easily unstable due to poor contact during the initial contact, thereby causing the lamp bead to flicker or be damaged.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a brightness lighting test fixture for electronic products, comprising a test platform, a console is provided at the front end of the test platform, the console is composed of a display screen and a plurality of control buttons, a pin-connection station is provided at the center of the upper end of the test platform, a plurality of pin jacks are provided inside the upper end of the pin-connection station, a segmented support plate is provided on the upper side of the pin-connection station, a support plate slot is provided on the front side of the upper end of the segmented support plate, a lamp bead support plate is rotatably connected to the interior of the front end of the support plate slot, and the lamp bead support plate is clamped in the support plate slot Internally, a plurality of lamp bead slots are provided at the upper end of the lamp bead support plate, and the lower ends of the plurality of lamp bead slots are connected to two pin positioning holes, LED lamp beads are arranged inside the plurality of lamp bead slots, and the lower ends of the plurality of LED lamp beads are connected to two electrical connection pins, and the rear side of the upper end of the pin communication station is connected to a connecting pressure plate by rotating the connecting seat, a brightness detection plate is arranged inside the front end of the connecting pressure plate, a plurality of photoresistors are arranged inside the front end of the brightness detection plate, and a transparent downward pressure glass is arranged at the front end of the brightness detection plate, and a pressure handle is connected to the center of the upper end of the connecting pressure plate.

[0007] Preferably, spring grooves are provided at the four corners of the upper end of the test platform, and the centers of the inner walls of the lower ends of the four spring grooves are connected to limiting slide bars, and the upper ends of the four limiting slide bars respectively pass through the four corners of the segmented support plate, and through the position of the limit and segmented support plate, the four limiting slide bars are all slidably connected to the segmented support plate.

[0008] Preferably, a disconnect spring is provided inside each of the four spring slots, and the four disconnect springs are respectively sleeved on the outside of the four limiting slide rods and respectively fit into the four corners of the lower end of the segmented support plate. The rear side of the upper end of the segmented support plate is connected to a support plate, and the upper end of the support plate is arranged in an inclined surface and fits into the rear end of the connecting pressure plate.

[0009] Preferably, an electrical connector is provided on the rear side of the upper end of the test platform, and the electrical connector is connected to the rear end of the pin communication station. Two electrical connection slots are provided on the rear side of the upper end of the electrical connector, and the upper sides of the front ends of the two electrical connection slots are connected to the rear telescopic slots, and the front ends of the two rear telescopic slots are connected to the front telescopic slots.

[0010] Preferably, two limiting guard plates are connected to the rear side of the lower end of the segmented support plate, and an inclined sliding surface is provided between the lower end surface and the front end surface of the two limiting guard plates. The two limiting guard plates are respectively inserted into the two electrical connection slots, and a first electrode head is provided inside the rear end of the two limiting guard plates.

[0011] Preferably, the lower ends of the two first electrode heads are flush with the lower ends of the two limit guard plates respectively, and are connected to the brightness detection plate through a wiring harness. An inclined sliding surface is provided between the lower end face and the front end face of the two first electrode heads, and a first electrode plate is provided at the bottom of the inner cavity of the two electrical connection grooves.

[0012] Preferably, the two first electrode plates are connected to the test platform through a wiring harness and are respectively located directly below the two first electrode heads. The lower ends of the two first electrode heads are slidably connected to the first fitting heads, and the upper ends of the two first fitting heads are provided with first fitting springs and are elastically connected to the lower ends of the first electrode heads through the first fitting springs.

[0013] Preferably, the rear ends of the two rear telescopic slide grooves are slidably connected to linkage sliders, and inclined sliding surfaces are provided between the upper end faces and the rear end faces of the two linkage sliders, and are respectively fitted with the inclined sliding surfaces of the two first electrode heads, and a connecting slide rod is connected to the center of the front end of the two linkage sliders.

[0014] Preferably, the two connecting slide rods are respectively slidably connected between the two rear telescopic slide grooves and the two front telescopic slide grooves, the front ends of the two connecting slide rods are connected with second electrode heads, and the two second electrode heads are respectively slidably connected inside the two front telescopic slide grooves, the front ends of the two linkage sliders are respectively provided with third fitting springs, and are elastically connected to the inside of the rear telescopic slide groove through the third fitting springs, and the two third fitting springs are respectively sleeved on the outside of the two connecting slide rods.

[0015] Preferably, the front ends of the two front telescopic slide cavities are each provided with a second electrode plate, the two second electrode plates are both connected to the test platform through a wiring harness and are located directly in front of the second electrode head, the front ends of the two second electrode heads are both slidably connected to the inside of the second fitting heads, the rear ends of the two second fitting heads are both provided with a second fitting spring, and are elastically connected to the inside of the front end of the second electrode head through the second fitting spring.

[0016] Compared with the prior art, the present invention provides a brightness lighting test fixture for electronic products, which has the following beneficial effects:

[0017] 1. The present invention adopts a two-stage connection design in which the segmented support plate and the pin-connecting station move up and down. After the electrical connection pins of the LED lamp beads are fully inserted into the pin jacks and in stable contact, the segmented support plate is pressed down to electrically connect the pin-connecting station and the brightness detection board to the test platform, ensuring that the pins of the lamp beads are in reliable contact with the jacks before power is turned on, avoiding flickering or damage caused by poor contact, and improving test stability and safety.

[0018] 2. The console of the present invention adapts to LED lamp beads of different powers by adjusting the output current. At the same time, the brightness detection board has a built-in photoresistor, which automatically adjusts the resistance value as the LED brightness changes. The test platform calculates the brightness data in real time and displays it on the console screen, realizing accurate testing of multi-specification lamp beads and automatic data feedback.

[0019] 3. The segmented support plate of the present invention is slid up and down by four limit slide bars and disconnect springs. After the test is completed, when the connecting pressure plate returns to its position, the spring pushes the segmented support plate to automatically reset, so that the pins of the lamp beads are quickly separated from the sockets, and the electrical connection is disconnected at the same time, avoiding live plugging and unplugging, improving operating efficiency and protecting the test equipment.

[0020] 4. When the segmented support plate of the present invention is pressed down, the limiting guard plate drives the first electrode head to contact the first electrode plate, and at the same time the linkage slider pushes the second electrode head to connect with the second electrode plate, forming a dual stable circuit, ensuring that the pin-powered station and the brightness detection board are energized only after the lamp beads are fully in place, avoiding instantaneous poor contact and enhancing test reliability.

[0021] 5. The lamp bead support plate of the present invention is reversible and fixed in the support plate slot by snapping. After testing, the LED lamp beads can be taken out by flipping it over. Combined with the automatic reset function of the segmented support plate, the lamp beads can be quickly loaded and unloaded, greatly improving the efficiency of batch testing.

[0022] 6. The connecting pressure plate of the present invention presses down the LED lamp beads through the transparent glass to avoid direct contact and damage to the brightness detection board. At the same time, the inclined design of the support plate ensures that the pressure plate is firmly placed after returning to its position, preventing accidental power-on caused by accidental contact, thereby improving operational safety. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 Schematic diagram of the three-dimensional structure of the brightness lighting test fixture of the present invention.

[0024] Figure 2 Schematic diagram of the explosion of the brightness lighting test fixture of the present invention.

[0025] Figure 3 It is a schematic diagram of the electrical connector connection structure of the present invention.

[0026] Figure 4 This is a schematic diagram of the left side cross-sectional structure of the brightness lighting test fixture of the present invention.

[0027] Figure 5 For the present invention Figure 4 Enlarged schematic diagram of point A in the middle.

[0028] Figure 6 It is a schematic diagram of the linkage slider connection structure of the present invention.

[0029] In the figure: 1. Test platform; 2. Control console; 3. Pin communication station; 4. Pin jack; 5. Segmented support plate; 6. Support plate slot; 7. Lamp bead support plate; 8. Lamp bead slot; 9. LED lamp bead; 10. Connecting pressure plate; 11. Brightness detection board; 12. Pressure handle; 13. Spring slot; 14. Limit slide bar; 15. Disconnect spring; 16. Back plate; 17. Electrical connection seat; 18. Electrical connection slide; 19. Rear telescopic slide; 20. Front telescopic slide; 21. Limit guard plate; 22. First electrode head; 23. First electrode plate; 24. First fitting head; 25. First fitting spring; 26. Linkage slider; 27. Connecting slide bar; 28. Second electrode head; 29. ​​Third fitting spring; 30. Second electrode plate; 31. Second fitting head; 32. Second fitting spring. DETAILED DESCRIPTION

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0031] The present invention provides Figures 1-6 The brightness lighting test fixture of an electronic product shown in the figure includes a test platform 1, a console 2 is provided at the front end of the test platform 1, the console 2 is composed of a display screen and multiple control buttons, a pin-pass radio station 3 is provided at the center of the upper end of the test platform 1, a plurality of pin jacks 4 are provided inside the upper end of the pin-pass radio station 3, a segmented support plate 5 is provided on the upper side of the pin-pass radio station 3, a support plate slot 6 is provided on the front side of the upper end of the segmented support plate 5, a lamp bead support plate 7 is rotatably connected to the front end of the support plate slot 6, and the lamp bead support plate 7 is clamped in the interior of the support plate slot 6, a plurality of lamp bead slots 8 are provided on the upper end of the lamp bead support plate 7, and the lower ends of the plurality of lamp bead slots 8 are connected with two pin positioning holes, the plurality of lamp bead slots 8 are provided with LED lamp beads 9, and the lower ends of the plurality of LED lamp beads 9 are connected to two electrical connection pins, the rear side of the upper end of the pin-pass radio station 3 is rotatably connected to a connecting pressure plate 10 through a connecting seat, and a brightness test pin is provided inside the front end of the connecting pressure plate 10. Testing board 11, multiple photoresistors are arranged inside the front end of brightness detection board 11, and transparent downward pressing glass is arranged at the front end of brightness detection board 11, and a pressing handle 12 is connected to the center of the upper end of connecting pressure plate 10. In the process of performing brightness lighting test on LED lamp beads 9 installed on electronic products, multiple LED lamp beads 9 are placed inside multiple lamp bead slots 8 opened at the upper end of lamp bead supporting plate 7, and the electrical connection pins of multiple LED lamp beads 9 are inserted into the pin positioning holes at the lower ends of multiple lamp bead slots 8, and multiple electrical connection pins are protruded outside the lower end of lamp bead supporting plate 7, and then the connecting pressure plate 10 is rotated forward by pressing handle 12, so that the brightness detection board 11 at the front end of connecting pressure plate 10 is pressed on the upper ends of multiple LED lamp beads 9, and the brightness detection board 11 is pressed on the upper ends of multiple LED lamp beads 9 through the transparent front end, so that multiple LED lamp beads 9 are respectively located at the lower ends of multiple photoresistors arranged inside brightness detection board 11.

[0032] At this time, continue to press down the pressure handle 12. The pressure handle 12 squeezes the multiple LED lamp beads 9 downward through the transparent glass connecting the pressure plate 10 and the front end of the brightness detection board 11. Since the lamp bead support plate 7 is clamped in the support plate groove 6 opened on the front side of the upper end of the segmented support plate 5, the multiple LED lamp beads 9 can drive the lamp bead support plate 7 and the segmented support plate 5 to move downward together, and allow the electrical connection pins of the multiple LED lamp beads 9 to be inserted into the multiple pin jacks 4 set inside the upper end of the pin communication station 3 to perform the first connection. When the segmented support plate 5 moves downward to fit with the pin communication station 3, the pin communication station 3 and the brightness detection board 11 are electrically connected to the test platform 1 at the same time to perform the second connection, so that the multiple pin jacks 4 are powered at the same time, and the multiple LED lamp beads 9 are lit, so that the brightness detection board 11 can detect the brightness of the multiple LED lamp beads 9.

[0033] Among them, the brightness lighting test device can connect multiple LED lamp beads 9 to the pin socket 4 through the electrical connection between the LED lamp beads 9 and the pin socket 4 and the two-stage connection between the pin communication station 3 and the brightness detection board 11 and the test platform 1, so that multiple LED lamp beads 9 can be stably connected to the pin communication station 3 before being powered on, thereby preventing the electrical connection pins of the LED lamp beads 9 and the pin socket 4 from having poor contact when they are just connected, causing the LED lamp beads 9 to flicker and be damaged.

[0034] In addition, the console 2 can adjust the current output to multiple pin jacks 4 through the control button to adapt to the testing of LED lamp beads 9 of different powers. The photoresistor set inside the brightness detection board 11 can change the internal resistance according to the brightness of the LED lamp beads 9, and the resistance of the photoresistor decreases as the brightness increases. The test platform 1 calculates the brightness of multiple LED lamp beads 9 based on the resistance value, and displays the brightness of multiple LED lamp beads 9 on the display screen of the console 2.

[0035] like Figure 1 and Figure 2As shown, spring grooves 13 are provided at the four corners of the upper end of the test platform 1, and the centers of the inner walls of the lower ends of the four spring grooves 13 are connected to limit slide bars 14, and the upper ends of the four limit slide bars 14 respectively pass through the four corners of the segmented support plate 5, and through the position of the limit and the segmented support plate 5, the four limit slide bars 14 are slidably connected to the segmented support plate 5, and a disconnecting spring 15 is provided inside the four spring grooves 13, and the four disconnecting springs 15 are respectively sleeved on the outside of the four limit slide bars 14, and respectively fit at the four corners of the lower end of the segmented support plate 5, and a back plate 16 is connected to the rear side of the upper end of the segmented support plate 5, and the upper end of the back plate 16 is arranged with an inclined surface and is attached to the segmented support plate 5. It is closed at the rear end of the connecting pressure plate 10. After the brightness detection of multiple LED lamp beads 9 is completed, the connecting pressure plate 10 is flipped backward by pressing the handle 12, and the connecting pressure plate 10 is leaned against the inclined surface of the upper end of the support plate 16. The segmented support plate 5 slides upward along the outside of the four limit slides 14 under the action of the four disconnection springs 15, so that the pin connection station 3 and the connecting pressure plate 10 are first disconnected from the test platform 1, and then the electrical connection pins of the multiple LED lamp beads 9 are driven to separate from the multiple pin jacks 4 through the lamp bead support plate 7. At this time, the multiple LED lamp beads 9 can be quickly taken out from the inside of the multiple lamp bead slots 8 by flipping the lamp bead support plate 7, thereby improving the test efficiency.

[0036] like Figure 3-Figure 6As shown, an electric connection seat 17 is provided on the rear side of the upper end of the test platform 1, and the electric connection seat 17 is connected to the rear end of the pin communication station 3. Two electric connection slots 18 are provided on the rear side of the upper end of the electric connection seat 17. The upper sides of the front ends of the two electric connection slots 18 are connected to the rear telescopic slots 19, and the front ends of the two rear telescopic slots 19 are connected to the front telescopic slots 20. The rear side of the lower end of the segmented support plate 5 is connected to two limit guard plates 21. An inclined sliding surface is provided between the lower end surface and the front end surface of the two limit guard plates 21. The two limit guard plates 21 are respectively inserted into the two electric connection slots 18. The rear ends of the two limit guard plates 21 are respectively provided with first electrode heads 22. The lower ends of the two first electrode heads 22 are flush with the lower ends of the two limit guard plates 21, and are connected to the brightness detection board 11 through a wiring harness. The two first electrode heads 22 are connected, and an inclined sliding surface is provided between the lower end surface and the front end surface of each of the two first electrode heads 22. The bottom of the inner cavity of each of the two electrical connection chutes 18 is provided with a first electrode plate 23. The two first electrode plates 23 are connected to the test platform 1 through a harness and are respectively located directly below the two first electrode heads 22. The lower ends of the two first electrode heads 22 are slidably connected to the first fitting heads 24. The upper ends of the two first fitting heads 24 are provided with a first fitting spring 25, and are elastically connected to the lower ends of the first electrode heads 22 through the first fitting spring 25. The rear ends of the two rear telescopic chutes 19 are slidably connected to the linkage slider 26, and an inclined sliding surface is provided between the upper end surface and the rear end surface of the two linkage sliders 26, and are respectively connected to the two first electrode heads 22. The inclined sliding surface fits together, and the front centers of the two linkage sliders 26 are connected to connecting slide rods 27. The two connecting slide rods 27 are respectively slidably connected between the two rear telescopic slide grooves 19 and the two front telescopic slide grooves 20. The front ends of the two connecting slide rods 27 are connected to second electrode heads 28, and the two second electrode heads 28 are respectively slidably connected to the inside of the two front telescopic slide grooves 20. The front ends of the two linkage sliders 26 are provided with third fitting springs 29, and are elastically connected to the inside of the rear telescopic slide groove 19 through the third fitting springs 29, and the two third fitting springs 29 are respectively sleeved on the outside of the two connecting slide rods 27. The front ends of the inner cavities of the two front telescopic slide grooves 20 are provided with second electrode plates 30, and the two second electrode plates 30 are connected to the test platform 1 through wiring harnesses. The second electrode heads 28 are connected and located right in front of the second electrode heads 28. The front ends of the two second electrode heads 28 are slidably connected to the second fitting heads 31. The rear ends of the two second fitting heads 31 are provided with second fitting springs 32 and are elastically connected to the front ends of the second electrode heads 28 through the second fitting springs 32. In the process of the segmented support plate 5 sliding downward, since the electrical connection pins at the lower end of the LED lamp beads 9 protrude outside the lower end of the segmented support plate 5, the electrical connection pins will first be connected to the pin sockets 4. When the segmented support plate 5 continues to slide down, the segmented support plate 5 drives the first electrode head 22 to slide downward inside the electrical connection slide groove 18 through the limiting guard plate 21. When the segmented support plate 5 is fitted with the pin communication station 3, the first electrode head 22 just slides down to the bottom of the inner cavity of the electrical connection slide groove 18.The two first electrode heads 22 can be connected to the two first electrode plates 23 through the first bonding heads 24. The first bonding heads 24 can be tightly bonded to the first electrode plates 23 under the action of the first bonding springs 25, ensuring a stable connection between the first electrode heads 22 and the first electrode plates 23. This allows the brightness detection board 11 to be stably connected to the test platform 1 through the first electrode heads 22 and the first electrode plates 23.

[0037] In addition, the first electrode head 22 pushes the linkage slider 26 forward through the two inclined sliding surfaces during the sliding process, and the linkage slider 26 can be tightly fitted with the first electrode head 22 under the action of the third fitting spring 29. The linkage slider 26 slides forward inside the rear telescopic slide 19 and drives the second electrode head 28 to slide forward inside the front telescopic slide 20 through the connecting slide rod 27. When the linkage slider 26 slides to the front end of the first electrode head 22, the second electrode head 28 can contact the second electrode plate 30 through the second fitting head 31, and the second fitting head 31 can be in contact with the second electrode plate 30 through the second fitting spring 32. Under the action of , it fits tightly with the second electrode plate 30, so that the pin-connecting station 3 can be stably connected to the first electrode head 22 through the linkage slider 26, the connecting slide rod 27 and the second electrode head 28, and stably connected to the test platform 1 through the first electrode head 22 and the first electrode plate 23, and the pin-connecting station 3 and the brightness detection board 11 will only be connected to the test platform 1 when the pin-connecting station 3 and the segmented support plate 5 are fitted, ensuring that the pin-connecting station 3 and the brightness detection board 11 are connected to the test platform 1 after multiple LED lamp beads 9 are stably connected to the pin-connecting station 3, ensuring the stable operation of the two-stage connection.

[0038] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A brightness lighting test fixture for electronic products, characterized in that: The invention comprises a test platform (1), wherein a control console (2) is provided at the front end of the test platform (1), wherein the control console (2) is composed of a display screen and a plurality of control buttons, wherein a pin communication station (3) is provided at the center of the upper end of the test platform (1), wherein a plurality of pin jacks (4) are provided inside the upper end of the pin communication station (3), wherein a segmented support plate (5) is provided on the upper side of the pin communication station (3), wherein a support plate groove (6) is provided on the front side of the upper end of the segmented support plate (5), wherein a lamp bead support plate (7) is rotatably connected to the interior of the front end of the support plate groove (6), and the lamp bead support plate (7) is clamped inside the support plate groove (6), and wherein a plurality of pin jacks (4) are provided on the upper end of the lamp bead support plate (7). A lamp bead slot (8), and the lower ends of the plurality of lamp bead slots (8) are all connected to two pin positioning holes, the interiors of the plurality of lamp bead slots (8) are all provided with LED lamp beads (9), and the lower ends of the plurality of LED lamp beads (9) are all connected to two electrical connection pins, the rear side of the upper end of the pin connection station (3) is rotatably connected to a connecting pressure plate (10) through a connecting swivel seat, a brightness detection plate (11) is provided inside the front end of the connecting pressure plate (10), a plurality of photoresistors are provided inside the front end of the brightness detection plate (11), and a transparent downward pressing glass is provided at the front end of the brightness detection plate (11), and a pressing handle (12) is connected at the center of the upper end of the connecting pressure plate (10).

2. The brightness lighting test fixture for electronic products according to claim 1, characterized in that: The test platform (1) is provided with spring grooves (13) at the four corners of the upper end, and the centers of the inner walls of the lower ends of the four spring grooves (13) are connected to limit slide bars (14), and the upper ends of the four limit slide bars (14) respectively pass through the four corners of the segmented support plate (5), and through the position of the limit and segmented support plate (5), the four limit slide bars (14) are slidably connected to the segmented support plate (5).

3. The brightness lighting test fixture for electronic products according to claim 2, characterized in that: A disconnecting spring (15) is provided inside each of the four spring slots (13), and the four disconnecting springs (15) are respectively sleeved on the outside of the four limiting slide bars (14) and respectively fitted at the four corners of the lower end of the segmented support plate (5). A support plate (16) is connected to the rear side of the upper end of the segmented support plate (5), and the upper end of the support plate (16) is arranged in an inclined surface and fits at the rear end of the connecting pressure plate (10).

4. The brightness lighting test fixture for electronic products according to claim 1, wherein: An electric connection seat (17) is provided on the rear side of the upper end of the test platform (1), and the electric connection seat (17) is connected to the rear end of the pin communication station (3). Two electric connection slots (18) are provided on the rear side of the upper end of the electric connection seat (17), and the upper sides of the front ends of the two electric connection slots (18) are connected to a rear telescopic slot (19), and the front ends of the two rear telescopic slots (19) are connected to a front telescopic slot (20).

5. The brightness lighting test fixture for electronic products according to claim 4, characterized in that: Two limiting guard plates (21) are connected to the rear side of the lower end of the segmented support plate (5), and an inclined sliding surface is provided between the lower end surface and the front end surface of the two limiting guard plates (21). The two limiting guard plates (21) are respectively inserted into the inside of the two electrical connection slide grooves (18), and the rear ends of the two limiting guard plates (21) are both provided with a first electrode head (22).

6. The brightness lighting test fixture for electronic products according to claim 5, characterized in that: The lower ends of the two first electrode heads (22) are respectively flush with the lower ends of the two limiting guard plates (21) and are connected to the brightness detection plate (11) through a wiring harness. An inclined sliding surface is provided between the lower end surface and the front end surface of the two first electrode heads (22), and a first electrode plate (23) is provided at the bottom of the inner cavity of the two electrical connection chutes (18).

7. The brightness lighting test fixture for electronic products according to claim 6, characterized in that: The two first electrode plates (23) are connected to the test platform (1) through a wiring harness and are respectively located directly below the two first electrode heads (22). The lower ends of the two first electrode heads (22) are slidably connected to the first fitting heads (24). The upper ends of the two first fitting heads (24) are provided with first fitting springs (25) and are elastically connected to the lower ends of the first electrode heads (22) through the first fitting springs (25).

8. The brightness lighting test fixture for electronic products according to claim 7, characterized in that: The rear ends of the two rear telescopic slide grooves (19) are both slidably connected to linkage sliders (26), and inclined sliding surfaces are provided between the upper end faces and the rear end faces of the two linkage sliders (26), and are respectively fitted with the inclined sliding surfaces of the two first electrode heads (22). The front ends of the two linkage sliders (26) are both connected to connecting slide rods (27).

9. The brightness lighting test fixture for electronic products according to claim 8, characterized in that: The two connecting slide bars (27) are respectively slidably connected between the two rear telescopic slide grooves (19) and the two front telescopic slide grooves (20); the front ends of the two connecting slide bars (27) are connected with second electrode heads (28), and the two second electrode heads (28) are respectively slidably connected inside the two front telescopic slide grooves (20); the front ends of the two linkage sliders (26) are respectively provided with third fitting springs (29), and are elastically connected inside the rear telescopic slide groove (19) through the third fitting springs (29), and the two third fitting springs (29) are respectively sleeved on the outside of the two connecting slide bars (27).

10. The brightness lighting test fixture for electronic products according to claim 9, characterized in that: A second electrode plate (30) is provided at the front end of the inner cavity of the two front telescopic slide grooves (20), and the two second electrode plates (30) are connected to the test platform (1) through a wiring harness and are located directly in front of the second electrode head (28). A second fitting head (31) is slidably connected to the interior of the front end of the two second electrode heads (28), and a second fitting spring (32) is provided at the rear end of the two second fitting heads (31) and is elastically connected to the interior of the front end of the second electrode head (28) through the second fitting spring (32).

Images