Fastener phased array defect detection method, electronic equipment and storage medium
The phased array defect detection method solves the problem of blind spots in fastener detection, realizes all-round defect detection of fasteners, and improves the ease of use and accuracy of detection.
Patent Information
- Application Number
- CN202411993866.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-09-12
AI Technical Summary
In the prior art, ultrasonic testing of fasteners cannot effectively detect defects in all positions and directions, and there are blind spots in detection, especially for embedded fasteners that cannot be disassembled.
The phased array defect detection method is adopted. By retrieving the data information on the fastener module, an overall scan is performed, the sound velocity is tested and the parameters are adjusted to obtain the best imaging display. The phased array imaging display image is used to determine the defect location and direction.
It realizes defect detection of all positions and directions of fasteners, has strong ease of use and practicality, and can discover and deal with potential defects in a timely manner.
Smart Images
Figure CN120629355A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of nondestructive testing of fasteners, and in particular to a phased array defect detection method for fasteners, an electronic device, and a storage medium. Background Art
[0002] Embedded fasteners in hydropower units and anchor foundations are subject to constant tensile and torque loads, leading to defects often forming an angle with the fastener's axis. Conventional A-type pulsed ultrasonic technology employs single-element longitudinal wave straight probes and low-angle probes on both sides of the fastener to detect defects perpendicular or nearly perpendicular to the fastener's axis. Shear wave angled probes are used on the fastener's shank to detect defects forming an angle with the fastener's axis. These three probes complement each other to detect defects in all directions throughout the fastener.
[0003] However, for ultrasonic testing of embedded fasteners that cannot be disassembled, the probe can only be placed on the exposed end face of the fastener. Longitudinal wave probes and small-angle probes are used to detect defects in the threads on this side that are perpendicular or nearly perpendicular to the fastener axis. Defects in all positions and directions of the fastener cannot be detected, and there are blind spots in the detection.
[0004] Therefore, how to detect defects in all positions and directions of fasteners becomes an unresolved problem. Summary of the Invention
[0005] The purpose of this application is to provide a fastener phased array defect detection method that can solve the problem in the prior art that defects in all positions and directions of fasteners cannot be detected.
[0006] In a first aspect, an embodiment of the present application provides a fastener phased array defect detection method, the method comprising: Retrieve the fastener module and set the data information of the fastener to be tested on the fastener module; Scan the entire fastener to be inspected, make sure the length data in the displayed data information corresponding to the set data information is consistent with the actual length, and test the sound velocity of the fastener to be inspected; Adjust the test parameters based on the sound velocity of the fastener to ensure that the displayed data is consistent with the actual data, and adjust the phased array imaging display to obtain the optimal phased array imaging display image; The leaked end face of the fastener to be inspected is scanned with the adjusted detection sensitivity, and the phased array defect detection results of the fastener are determined based on the optimal phased array imaging display image.
[0007] In a possible implementation of the first aspect, the data information of the fastener to be inspected includes: the type, material, length and diameter of the fastener to be inspected, and the length, thread profile, pitch and height of the thread on the fastener to be inspected.
[0008] In a possible implementation of the first aspect, the method further includes: Adjust the display depth and focus depth; wherein the display depth is a preset multiple of the length of the fastener to be inspected, and the focus depth is the stress concentration area on the fastener to be inspected.
[0009] In a possible implementation of the first aspect, the phased array imaging display includes: A-type imaging display, electronic scanning imaging display, and three-dimensional imaging display.
[0010] In a possible implementation manner of the first aspect, before scanning the end surface of the leaked side of the fastener to be inspected with the adjusted detection sensitivity, the method further includes: Test a comparison block containing a specific reflector and adjust the detection sensitivity to ensure the same detection sensitivity at different depths at different locations on the comparison block. The comparison test block and the fastener to be tested are made of the same material and specifications, and the specific reflector is a grooved reflector with a preset depth, preset length, and a preset angle to the axial direction of the comparison test block in the stress concentration area. There are one or more grooved reflectors, and the grooved reflectors represent defects in the fastener.
[0011] In one possible implementation of the first aspect, testing a comparison test block containing a specific reflector and adjusting the detection sensitivity so that the depths corresponding to different positions of the comparison test block have the same detection sensitivity include: Scan the end face of the comparison test block and adjust the echo amplitude of the specific reflector to reach the preset value of the full-screen amplitude of the imaging display; use the preset value of the adjusted echo amplitude gain as the standard detection sensitivity; based on the standard detection sensitivity, compensate the detection sensitivity corresponding to different depths to the standard detection sensitivity, and draw a sensitivity curve based on the depth, amplitude, and standard detection sensitivity; Among them, the sensitivity curve shows that the detection sensitivity corresponding to different depths is the standard detection sensitivity.
[0012] In a possible implementation of the first aspect, drawing a sensitivity curve based on depth, amplitude, and standard detection sensitivity includes: With depth as the horizontal axis and amplitude as the vertical axis, the discrete points formed by different depths and standard detection sensitivity are connected into a curve, which is the sensitivity curve.
[0013] In one possible implementation of the first aspect, the defect detection result includes: the location, size, and shape of the fastener defect; scanning the leaked end surface of the fastener to be inspected with the adjusted detection sensitivity, and determining the phased array defect detection result of the fastener based on the optimal phased array imaging display image, including: The exposed end face of the fastener to be inspected is scanned with standard detection sensitivity to obtain a defect signal of the fastener to be inspected; based on the defect signal, the optimal phased array imaging display image is determined; based on the optimal phased array imaging display image, the interference signal of the undercut reflected wave is determined; The interference signal of the reflected wave of the undercut groove is eliminated; the position, size and shape of the fastener defect are determined based on the defect signal after the interference signal is eliminated.
[0014] In a second aspect, an embodiment of the present application provides a fastener phased array defect detection device, the device comprising: A setting unit, used to call the fastener module and set data information of the fastener to be tested on the fastener module; A testing unit is used to perform an overall scan of the fastener to be tested, so that the length data in the displayed data information corresponding to the set data information is consistent with the actual length, and to test the sound velocity of the fastener to be tested; An adjustment unit is used to adjust the test parameters according to the sound velocity of the fastener to be tested so that the displayed data information is consistent with the actual data information, and to adjust the phased array imaging display to obtain the best phased array imaging display image; The processing unit is used to scan the leaked end face of the fastener to be inspected with the adjusted detection sensitivity, and determine the phased array defect detection result of the fastener based on the optimal phased array imaging display image.
[0015] In a third aspect, an embodiment of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the fastener phased array defect detection method according to any one of the first aspects described above is implemented.
[0016] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the fastener phased array defect detection method of any one of the above-mentioned first aspects.
[0017] In a fifth aspect, an embodiment of the present application provides a computer program product. When the computer program product is run on an electronic device, the electronic device executes the fastener phased array defect detection method according to any one of the first aspects above.
[0018] The present application solution calls a fastener module and sets data information of the fastener to be inspected on the fastener module; performs an overall scan on the fastener to be inspected so that the length data in the displayed data information corresponding to the set data information is consistent with the actual length, and tests the sound velocity of the fastener to be inspected; adjusts the test parameters according to the sound velocity of the fastener to be inspected so that the displayed data information is consistent with the actual data information, and adjusts the phased array imaging display to obtain an optimal phased array imaging display image; scans the leaked end face of the fastener to be inspected with the adjusted detection sensitivity, and determines the phased array defect detection result of the fastener based on the optimal phased array imaging display image.
[0019] The present application solution adopts phased array defect detection, which can detect defects in all positions and directions of fasteners and has strong ease of use and practicality.
[0020] Other features and advantages of the present application will be described in detail in the subsequent detailed description. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.
[0022] Figure 1 Schematic diagram of an application scenario of the fastener phased array defect detection method provided in an embodiment of the present application; Figure 2 Schematic diagram of the steps of the fastener phased array defect detection method provided in an embodiment of the present application; Figure 3 Schematic diagram of the structure of the comparison test block provided in the embodiment of the present application; Figure 4 is a schematic diagram of an optimal phased array imaging display image provided by an embodiment of the present application; Figure 5 is a structural schematic diagram of a fastener phased array defect detection device provided in an embodiment of the present application; Figure 6 Schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION
[0023] In the following description, specific details such as specific system structures and technologies are provided for illustration rather than limitation to facilitate a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid obstructing the description of the present application with unnecessary details.
[0024] It will be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or photovoltaic components, but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, photovoltaic components and / or groups thereof.
[0025] It should also be understood that the terms used in this specification are for the purpose of describing specific embodiments only and are not intended to limit the present application. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms unless the context clearly indicates otherwise.
[0026] It should be further understood that the term "and / or" used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
[0027] As used in this specification and the appended claims, the term "if" can be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.
[0028] In addition, in the description of the present application, the terms "first", "second", "third", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.
[0029] References to "one embodiment" or "some embodiments" in this specification mean that a particular feature, structure, or characteristic described in conjunction with that embodiment is included in one or more embodiments of the present invention. Thus, phrases such as "in one embodiment," "in some embodiments," "in some other embodiments," and "in some other embodiments" appearing in various places in this specification do not necessarily refer to the same embodiment, but rather mean "one or more but not all embodiments," unless otherwise specifically emphasized. The terms "including," "comprising," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.
[0030] As a reliable supplier of clean energy, hydropower stations bear primary responsibility for ensuring energy supply. Due to their advantages of rapid startup and shutdown and flexible load adjustment, they can adjust loads within a wide range according to grid dispatch orders, shouldering the mission of peak load regulation and ensuring energy supply. However, the frequent startup and shutdown of units and load fluctuations expose critical fasteners and bolts to long-term vibration, stress release, and fatigue loads. This can lead to some bolts breaking and failing, resulting in flooding of power plants.
[0031] Therefore, hydropower units need to be dismantled and overhauled every 6-7 years according to regulations. During this period, important fasteners and bolts need to be inspected and tested in order to discover harmful defects early and deal with them in time to eliminate safety hazards of the equipment.
[0032] As critical metal components in hydropower units, bolts connect various metal components and transmit various loads and torques. These bolts are subject to long-term fatigue loads, putting them at risk of fracture and failure. During overhauls and maintenance of hydropower units, bolts larger than M32 must be disassembled and ultrasonically inspected. This inspection uses a longitudinal wave straight probe and a low-angle probe on both ends of the bolt, and a shear wave oblique probe on the bolt shank to inspect the threads on both sides.
[0033] However, embedded bolts cast in concrete and anchor bolts with one side of the bolt threaded into the foundation in advance cannot be disassembled and only one side of the bolt end face is exposed. In reality, the probe can only be placed on the exposed end face for testing, and cannot be placed on the opposite side of the bolt end face and the rod for ultrasonic testing.
[0034] Embedded bolts and foundation bolts in hydropower units are subject to long-term tensile and torque loads, leading to cracks that often form a certain angle with the bolt's axis. Conventional A-type pulsed ultrasonic testing uses a single-element longitudinal wave straight probe and a small-angle probe on both sides of the bolt to detect cracks that are perpendicular or nearly perpendicular to the bolt's axis. A shear wave oblique probe is used on the bolt shank to detect cracks that form a certain angle with the bolt's axis. The combination of these three probes is crucial for complete crack detection in all directions throughout the bolt.
[0035] However, for ultrasonic testing of embedded bolts that cannot be disassembled, the probe can only be placed on the exposed end face of the bolt, and a longitudinal wave probe and a small-angle probe can be used to detect cracks in the thread on this side that are perpendicular or nearly perpendicular to the bolt axis. Cracks in all positions and directions of the bolt cannot be detected, and there is a blind spot in the detection.
[0036] The failure mode of bolts, a key fastener in hydropower units, is often fatigue cracking. Initially, tiny cracks develop, but then undergo a long crack growth process before breaking instantly when the load reaches the bolt's yield strength. Prompt detection and treatment of fatigue cracks during this growth phase can prevent plant flooding caused by bolt breakage.
[0037] For pre-embedded bolts cast in concrete, or foundation bolts with one side of the bolt threaded into the foundation, only one end face is exposed, and only this exposed end face can be used for inspection. Due to this limitation, conventional ultrasonic testing cannot detect cracks in all locations and directions along the bolt's end faces and shank using three different probes.
[0038] Therefore, how to detect defects in all positions and directions of fasteners becomes an unresolved problem.
[0039] In response to the above defects, an embodiment of the present application provides a fastener phased array defect detection method, which calls a fastener module and sets data information of the fastener to be detected on the fastener module; performs an overall scan on the fastener to be detected, so that the length data in the displayed data information corresponding to the set data information is consistent with the actual length, and tests the sound velocity of the fastener to be detected; adjusts the test parameters according to the sound velocity of the fastener to be detected so that the displayed data information is consistent with the actual data information, and adjusts the phased array imaging display to obtain an optimal phased array imaging display image; scans the leaked end face of the fastener to be detected with the adjusted detection sensitivity, and determines the phased array defect detection result of the fastener based on the optimal phased array imaging display image.
[0040] The present application solution adopts phased array defect detection, which can detect defects in all positions and directions of fasteners and has strong ease of use and practicality.
[0041] The specific process implemented in this application is introduced below through specific embodiments.
[0042] See Figure 1 , Figure 1 Schematic diagram of the application scenario of the fastener phased array defect detection method provided in the embodiment of the present application. Figure 1 As shown, the fasteners are bolts that are screwed into the foundation equipment to connect the foundation equipment to the connecting equipment. The foundation equipment is the foundation poured in concrete, and the connecting equipment is the metal equipment of the hydropower unit.
[0043] A bolt protrudes from the connecting nut on one side of the foundation equipment, and the bolt has a crack. The phased array probe scans the end face of the protruding bolt to detect defects. The phased array probe can be a daisy array probe, with a diameter that matches the bolt diameter within a tolerance of 5mm. The frequency is 2MHz-5MHz, and the 64 array elements are evenly arranged in a circular pattern.
[0044] See Figure 2 , Figure 2 Schematic diagram of the steps of the fastener phased array defect detection method provided in the embodiment of the present application. Figure 2 As shown, the method may include the following steps: S201, calling a fastener module, and setting data information of the fastener to be detected on the fastener module.
[0045] In some embodiments, the fasteners to be inspected can be bolts, screws, and the like, such as embedded bolts in hydropower units and foundation bolts. The phased array device retrieves the bolt module and sets the bolt and thread data based on the actual data required for bolt inspection.
[0046] According to one embodiment of the present application, the data information of the fastener to be inspected includes: the type, material, length and diameter of the fastener to be inspected, and the length, thread shape, pitch and height of the thread on the fastener to be inspected.
[0047] S202 , performing an overall scan on the fastener to be inspected, ensuring that the length data in the displayed data information corresponding to the set data information is consistent with the actual length, and testing the sound velocity of the fastener to be inspected.
[0048] In some embodiments, a probe is selected based on the bolt specifications and material. The phased array device scans the entire bolt at the bolt end using the probe to obtain the actual length of the bolt, determine the first and second bottom waves of the bolt, make the displayed bolt length data consistent with the actual length, and test the sound velocity of the bolt.
[0049] S203 , adjusting the test parameters according to the sound velocity of the fastener to be tested so that the displayed data information is consistent with the actual data information, and adjusting the phased array imaging display to obtain the best phased array imaging display image.
[0050] In some embodiments, test parameters are adjusted based on the sound velocity of the fastener being inspected, ensuring that values such as bolt length and thread pitch displayed by the phased array match the actual data. For example, if a thread defect is 100 mm from the probe, the phased array device will display the defect signal for the thread 100 mm from the probe.
[0051] The test parameters include: the model, diameter, frequency, number of chips, array element size and array element spacing of the daisy array probe.
[0052] In one embodiment, the phased array imaging display is adjusted to optimize the phased array imaging display image to facilitate better defect detection.
[0053] According to one embodiment of the present application, the method further includes: Adjust the display depth and focus depth; wherein the display depth is a preset multiple of the length of the fastener to be inspected, and the focus depth is the stress concentration area on the fastener to be inspected.
[0054] In some embodiments, the display depth and focus depth are adjusted, the display depth is 1.2 to 1.5 times the bolt length, and the focus depth is the stress concentration area of the 1st to 3rd threads of the probe's own thread and the opposite thread.
[0055] In some embodiments, the local thread, opposite thread, and bolt shank thread are distinguished based on the bolt specification and the position of the defect signal. For example, if the thread length of a stud bolt is 100mm and the shank length is 150mm, based on one side of the probe, if the defect signal is within 100mm, it indicates a thread defect on the local thread; if the defect signal is within the range of 100-250mm, it indicates a shank defect; and if the defect signal is within the range of 250-350mm, it indicates a thread defect on the opposite thread.
[0056] According to an embodiment of the present application, phased array imaging display includes: A-type imaging display, electronic scanning imaging display and three-dimensional imaging display.
[0057] S204 , scanning the leaked end face of the fastener to be inspected with the adjusted detection sensitivity, and determining a phased array defect detection result of the fastener based on the optimal phased array imaging display image.
[0058] According to one embodiment of the present application, before scanning the end surface of the leaked side of the fastener to be inspected with the adjusted detection sensitivity, the method further includes: Test a comparison block containing a specific reflector and adjust the detection sensitivity to ensure the same detection sensitivity at different depths at different locations on the comparison block. The comparison test block and the fastener to be tested are made of the same material and specifications, and the specific reflector is a grooved reflector with a preset depth, preset length, and a preset angle to the axial direction of the comparison test block in the stress concentration area. There are one or more grooved reflectors, and the grooved reflectors represent defects in the fastener.
[0059] In some embodiments, the information of the groove reflector includes: shape, length, depth, position, and angle with the bolt axis. Bolts of the same material and specifications are selected, and groove reflectors with a depth of 1mm, a length of 30mm, and angles of 45°, 90°, and 135° with the bolt axis are machined in the stress concentration area. The structural diagram of the comparison test block is shown in FIG. Figure 3 As shown, there are three grooves on the comparison test block, namely groove 1, groove 2 and groove 3.
[0060] According to one embodiment of the present application, testing a comparison test block containing a specific reflector and adjusting the detection sensitivity so that the depths corresponding to different positions of the comparison test block have the same detection sensitivity include: Scan the end face of a comparison test block and adjust the echo amplitude of a specific reflector to achieve the preset value for full-screen imaging. Use the adjusted echo amplitude gain preset value as the standard detection sensitivity. Based on the standard detection sensitivity, compensate the detection sensitivity at different depths to the standard detection sensitivity. Then, plot a sensitivity curve based on depth, amplitude, and the standard detection sensitivity.
[0061] Among them, the sensitivity curve shows that the detection sensitivity corresponding to different depths is the standard detection sensitivity.
[0062] In some embodiments, the phased array device scans the end face of a comparison test block with a probe placed on it, adjusts the reflector echo amplitude to 80% of the full-screen amplitude, and then gains 6dB as the scanning sensitivity. A sensitivity curve is then created so that comparison test blocks of the same size have the same sensitivity at different depths, facilitating the determination of the size of defects in bolts.
[0063] For example, the amplitude of the reflector echo reaches 8dB, and then the gain is increased by 6dB (reaching 14dB) as the scanning sensitivity (when the phased array device scans the comparison test block based on the probe, the echo amplitude at different depths must reach 14dB), and a sensitivity curve is created so that the comparison test blocks of the same size have the same sensitivity at different depths. For example, when the corresponding depths of the comparison test blocks of the same size are 5, 6, 7, and 8mm, the echo amplitude must reach 14dB.
[0064] According to one embodiment of the present application, drawing a sensitivity curve based on depth, amplitude, and standard detection sensitivity includes: With depth as the horizontal axis and amplitude as the vertical axis, the discrete points formed by different depths and standard detection sensitivity are connected into a curve, which is the sensitivity curve.
[0065] According to one embodiment of the present application, the defect detection results include the location, size, and shape of the fastener defect. Using the adjusted detection sensitivity, the end face of the fastener to be inspected, where the defect is visible, is scanned. Based on the optimal phased array imaging display image, the phased array defect detection results for the fastener are determined, including: Using standard inspection sensitivity, the exposed end face of the fastener under inspection is scanned to obtain a defect signal. Based on the defect signal, the optimal phased array imaging display is determined. Based on this optimal phased array imaging display, the interference signal of the undercut reflected wave is determined.
[0066] The interference signal of the reflected wave of the undercut groove is eliminated, and the position, size and shape of the fastener defect are determined based on the defect signal after the interference signal is eliminated.
[0067] In some embodiments, the defect of the fastener may be a crack. The phased array device scans the exposed end face of the bolt with a probe to obtain defect signals located in the probe side thread, the opposite side thread, and the bolt shank thread. Based on the defect signals, the optimal phased array imaging display image is determined. The schematic diagram of the optimal phased array imaging display image is shown as follows: Figure 4 As shown, from Figure 4 It can be seen that the phased array equipment detected the bottom wave of the bolt and multiple defect reflection waves.
[0068] In some embodiments, based on the optimal phased array imaging display, the undercut reflection wave, located on the thread side and before the first thread on the opposite side, as well as other interference waves such as inherent echoes, are determined. After eliminating the undercut reflection wave, a circumferential scan is performed along the probe's end face on the bolt side. The location, size, and shape of the bolt crack are determined based on the remaining signal displayed in the image.
[0069] The fastener phased array defect detection method provided in an embodiment of the present application calls a fastener module and sets data information of the fastener to be detected on the fastener module; performs an overall scan on the fastener to be detected so that the length data in the displayed data information corresponding to the set data information matches the actual length, and tests the sound velocity of the fastener to be detected; adjusts test parameters based on the sound velocity of the fastener to be detected so that the displayed data information is consistent with the actual data information, and adjusts the phased array imaging display to obtain an optimal phased array imaging display image; scans the leaked end face of the fastener to be detected with the adjusted detection sensitivity, and determines the phased array defect detection result of the fastener based on the optimal phased array imaging display image.
[0070] The present application solution adopts phased array defect detection, which can detect defects in all positions and directions of fasteners and has strong ease of use and practicality.
[0071] Compared with the existing conventional A-type pulse ultrasonic detection method, which uses three probes on both sides of the bolt end faces and the rod to detect cracks in different positions and directions in the threaded area on both sides of the bolt. This application adopts an ultrasonic phased array daisy array probe, which can use the end face of the embedded bolt exposed on only one side as the detection surface. It realizes the detection of cracks in various positions and directions of the embedded bolts, and has a three-dimensional imaging display, which is more intuitive and accurately positioned, so that bolts with fatigue cracks can be discovered in time, and corresponding measures can be taken to deal with them, ensuring the good quality of the bolts.
[0072] The present application solution exposes only one side of the end face of the embedded bolt as the detection surface for probe placement, and utilizes ultrasonic phased array technology and a daisy array probe to perform all-round, blind-spot-free detection of cracks in all positions and directions of the entire bolt, thereby solving the problem of large blind spots in all-round detection of embedded bolts using conventional ultrasonic single-chip probes without detection conditions.
[0073] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.
[0074] Corresponding to the method of the above embodiment, Figure 5 1 is a schematic diagram of the structure of a fastener phased array defect detection device provided in an embodiment of the present application. For ease of explanation, only the parts related to the embodiment of the present application are shown.
[0075] Reference Figure 5 , the device comprises: The setting unit 501 is used to call the fastener module and set the data information of the fastener to be detected on the fastener module; The testing unit 502 is used to perform an overall scan of the fastener to be tested, so that the length data in the displayed data information corresponding to the set data information is consistent with the actual length, and to test the sound velocity of the fastener to be tested; An adjustment unit 503 is configured to adjust test parameters according to the sound velocity of the fastener to be tested so that the displayed data information is consistent with the actual data information, and to adjust the phased array imaging display to obtain an optimal phased array imaging display image; The processing unit 504 is configured to scan the leaked end face of the fastener to be inspected with the adjusted detection sensitivity, and determine a phased array defect detection result of the fastener based on the optimal phased array imaging display image.
[0076] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / units are based on the same concept as the method embodiment of this application. Their specific functions and technical effects can be found in the method embodiment section and will not be repeated here.
[0077] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.
[0078] Figure 6 Schematic diagram of the structure of the electronic device 6 provided in the embodiment of the present application. Figure 6 As shown, the electronic device 6 of this embodiment includes: at least one processor 601 ( Figure 6 Only one is shown in the figure), a memory 603, and a computer program 602 stored in the memory 603 and executable on at least one processor 601. When the processor 601 executes the computer program 602, the steps in the above method embodiment are implemented.
[0079] The electronic device 6 may be a phased array device connected to a daisy array probe (not shown in the figure). The electronic device 6 may include, but is not limited to, a processor 601 and a memory 603. Those skilled in the art will understand that Figure 6 This is merely an example of the electronic device 6 and does not constitute a limitation on the electronic device 6 . The electronic device 6 may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device 6 may also include input and output devices, network access devices, etc.
[0080] The processor 601 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware photovoltaic modules. A general-purpose processor may be a microprocessor or any conventional processor.
[0081] In some embodiments, the memory 603 may be an internal storage unit of the electronic device 6, such as a hard drive or memory of the electronic device 6. In other embodiments, the memory 603 may also be an external storage device of the electronic device 6, such as a plug-in hard drive, a Smart Media Card (SMC), a Secure Digital Card (SD), a Flash Card, etc. equipped on the electronic device 6. Furthermore, the memory 603 may include both an internal storage unit of the electronic device 6 and an external storage device. The memory 603 is used to store an operating system, application programs, a boot loader, data, and other programs, such as the program code of a computer program. The memory 603 may also be used to temporarily store data that has been output or is about to be output.
[0082] If the above-mentioned integrated unit is implemented as a software functional unit and sold or used as a standalone product, it can be stored in a computer-readable storage medium. Based on this understanding, when implementing all or part of the process steps in the above-mentioned method embodiments, the present application can instruct the relevant hardware to complete the process using a computer program. The computer program can be stored in a computer-readable storage medium. When executed by a processor, the computer program can implement the steps applied to the above-mentioned method embodiments. The computer program includes computer program code, which can be in source code form, object code form, executable file, or some intermediate form. The computer-readable storage medium can include at least: any entity or device capable of carrying computer program code to a computing device / electronic device, recording medium, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal, and software distribution medium, such as a USB flash drive, removable hard drive, magnetic disk, or optical disk. In some jurisdictions, based on legislation and patent practice, computer-readable storage media cannot be electric carrier signals or telecommunication signals.
[0083] An embodiment of the present application further provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.
[0084] An embodiment of the present application provides a computer program product. When the computer program product is run on an electronic device, the electronic device executes the steps in the above-mentioned various method embodiments.
[0085] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.
[0086] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.
[0087] In the embodiments provided in this application, it should be understood that the disclosed devices / electronic devices and methods can be implemented in other ways. The device / electronic device embodiments described above are merely schematic, and the division of the above modules or units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or photovoltaic modules can be combined or integrated into another system, and some features can be ignored and not executed. Another point is that the indirect coupling, direct coupling or communication connection between each other shown or discussed can be an indirect coupling, direct coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.
[0088] The units described above as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0089] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the above embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the above embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the scope of protection of the present application.
Claims
1. A fastener phased array defect detection method, characterized in that: The method comprises: Retrieving a fastener module, and setting data information of the fastener to be detected on the fastener module; Performing an overall scan of the fastener to be inspected, ensuring that the length data in the displayed data information corresponding to the set data information is consistent with the actual length, and testing the sound velocity of the fastener to be inspected; Adjusting test parameters according to the sound velocity of the fastener to be tested so that the displayed data information is consistent with the actual data information, and adjusting the phased array imaging display to obtain an optimal phased array imaging display image; The leaked end face of the fastener to be inspected is scanned with the adjusted detection sensitivity, and a phased array defect detection result of the fastener is determined based on the optimal phased array imaging display image.
2. The fastener phased array defect detection method according to claim 1, characterized in that: The data information of the fastener to be detected includes: the type, material, length and diameter of the fastener to be detected, and the length, thread shape, pitch and height of the thread on the fastener to be detected.
3. The fastener phased array defect detection method according to claim 1, characterized in that: The method further comprises: Adjust the display depth and focus depth; The display depth is a preset multiple of the length of the fastener to be inspected, and the focus depth is a stress concentration area on the fastener to be inspected.
4. The fastener phased array defect detection method according to claim 1 or 3, characterized in that: The phased array imaging display includes: A-type imaging display, electronic scanning imaging display and three-dimensional imaging display.
5. The fastener phased array defect detection method according to claim 1, characterized in that: Before scanning the end surface of the leaked side of the fastener to be inspected with the adjusted detection sensitivity, the method further includes: Testing a comparison test block containing a specific reflector and adjusting the detection sensitivity to achieve the same detection sensitivity at depths corresponding to different positions of the comparison test block; The comparison test block and the fastener to be tested are made of the same material and have the same specifications. The specific reflector is a grooved reflector with a preset depth, a preset length, and a preset angle with the axial direction of the comparison test block in the stress concentration area. There are one or more grooved reflectors, and the grooved reflectors represent defects in the fastener.
6. The fastener phased array defect detection method according to claim 5, characterized in that: Testing a comparison block containing a specific reflector and adjusting the detection sensitivity to achieve the same detection sensitivity at depths corresponding to different positions on the comparison block, including: Scanning the end face of the comparison test block, adjusting the echo amplitude of the specific reflector to reach a preset value of the full-screen amplitude of the imaging display image; The adjusted echo amplitude gain preset value is used as the standard detection sensitivity; Based on the standard detection sensitivity, compensating the detection sensitivities corresponding to different depths to the standard detection sensitivity, and drawing a sensitivity curve based on the depth, amplitude, and the standard detection sensitivity; The sensitivity curve indicates that the detection sensitivities corresponding to different depths are all the standard detection sensitivities.
7. The fastener phased array defect detection method according to claim 6, characterized in that: A sensitivity curve is drawn based on depth, amplitude, and the standard detection sensitivity, including: With depth as the horizontal axis and amplitude as the vertical axis, discrete points formed by different depths and the standard detection sensitivity are connected to form a curve, which is the sensitivity curve.
8. The fastener phased array defect detection method according to claim 6, characterized in that: The defect detection result includes: the location, size, and shape of the fastener defect; scanning the leaked end surface of the fastener to be inspected with the adjusted detection sensitivity, and determining the phased array defect detection result of the fastener based on the optimal phased array imaging display image, including: Scanning the leaked end surface of the fastener to be inspected at the standard detection sensitivity to obtain a defect signal of the fastener to be inspected; Determining the optimal phased array imaging display image based on the defect signal; Determining an undercut reflected wave interference signal based on the optimal phased array imaging display image; Eliminating the interference signal of the reflected wave of the undercut groove; The position, size and shape of the fastener defect are determined based on the defect signal after the interference signal is eliminated.
9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the fastener phased array defect detection method according to any one of claims 1 to 8 is implemented.
10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the fastener phased array defect detection method according to any one of claims 1 to 8 is implemented.
Citation Information
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CN121558502A