Testing device for phase sequence protection capacitor

Abstract

The invention discloses a testing device for a phase sequence protection capacitor. The testing device for the phase sequence protection capacitor comprises a testing host, the testing host is provided with a plugboard, the plugboard is provided with a slot, the slot is internally provided with a power-on probe, and the testing host is provided with a driving member above the slot; during testing, the phase sequence protection capacitor is placed in the slot, the testing host controls the driving part to work to drive the phase sequence protection capacitor to be pressed downwards until the phase sequence protection capacitor is electrically connected with the power-on probe, and the testing host tests the phase sequence protection capacitor. According to the invention, the plug board with the slot and the power-on probe are arranged, and the automatic pressing action of the driving member is matched, so that the phase sequence protection capacitor placed in the slot can be quickly and accurately plugged to the power-on probe, power-on connection is realized, the test host can perform automatic test on the capacitor, manual repeated operation is not needed, and the test efficiency is improved. The detection time of a single capacitor is shortened, and the detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of capacitor testing, and in particular to a testing device for phase sequence protection capacitors. Background Art

[0002] During the operation of power electronic equipment and electrical control systems, the correct phase sequence is a core element in ensuring safe and stable operation. Incorrect phase sequence in the three-phase power supply can lead to motor reversal, equipment damage, and even accidents. Therefore, phase sequence protection devices, as key safety components, are widely used in industrial automation, renewable energy generation, rail transit, and other fields. Phase sequence protection capacitors, as the core component for phase sequence detection, have a performance stability that directly impacts the reliability of phase sequence protection.

[0003] However, existing testing methods for phase sequence protection capacitors have significant flaws. Currently, the industry generally adopts manual testing, which uses a multimeter or dedicated tester to measure the parameters of each capacitor one by one. This testing method has the following problems:

[0004] Manual operation requires repeated plugging and unplugging of test lines and recording of data. A single test takes a long time and is difficult to adapt to the rapid testing needs of large-scale production lines.

[0005] Therefore, developing a phase sequence protection capacitor testing technology that can replace manual work and realize batch automated detection has become a technical problem that needs to be solved urgently in this field. Summary of the Invention

[0006] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a testing device for phase sequence protection capacitors.

[0007] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0008] An embodiment of the present invention provides a testing device for a phase sequence protection capacitor, comprising: a testing host, the testing host being provided with an insert board, the insert board being provided with a slot, a power-on probe being provided inside the slot, and the testing host being located above the slot and further provided with a driving component; during testing, a phase sequence protection capacitor is placed in the slot, the testing host controls the driving component to drive the phase sequence protection capacitor downward until it is electrically connected to the power-on probe, and the testing host performs a test on the phase sequence protection capacitor.

[0009] In a specific embodiment, a telescopic member is further provided between the plug board and the test host.

[0010] In a specific embodiment, a sensor is further provided in the telescopic member, and the sensor is electrically connected to the test host.

[0011] In a specific embodiment, the power-on probe is sunk into the slot.

[0012] In a specific embodiment, the plug board is evenly distributed with a plurality of slots, the driving member is a cylinder, the cylinder includes a piston rod, the end of the piston rod is connected to a pressure plate, and the pressure plate is used to press down the phase sequence protection capacitor.

[0013] In a specific embodiment, there are two piston rods.

[0014] In a specific embodiment, the test host is provided with a bracket, the bracket is connected to a mounting seat, and the mounting seat is connected to the driving member.

[0015] In a specific embodiment, the test host is further provided with a display screen.

[0016] In a specific embodiment, the test host is further provided with an indicator light group.

[0017] In a specific embodiment, the test host is further provided with a buzzer.

[0018] The testing device for phase sequence protection capacitors of the present invention has the following advantages compared with the prior art: by providing a plug-in board with a slot and a power-on probe, and cooperating with the automatic downward pressing action of the driving part, the phase sequence protection capacitor placed in the slot can be quickly and accurately plugged into the power-on probe to achieve power-on connection. The test host can perform an automated testing process on the capacitor according to a preset program without the need for repeated manual operations, which greatly shortens the detection time of a single capacitor and can easily realize continuous automated detection of batch capacitors, thereby improving the overall detection efficiency and meeting the rapid detection needs of large-scale production lines. In addition, the automatic connection between the capacitor and the power-on probe is realized through a mechanical structure, and the operator does not need to directly contact the high-voltage components during the detection process, effectively avoiding the risk of electric shock and ensuring the safety of the detection process.

[0019] The present invention will be further described below with reference to the accompanying drawings and specific embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0021] Figure 1 A schematic diagram of a testing device for a phase sequence protection capacitor provided by the present invention in a pressed state;

[0022] Figure 2A schematic diagram of a testing device for phase sequence protection capacitors provided by the present invention in a recovery state.

[0023] Reference numerals:

[0024] Test host 10 , plugboard 20 , slot 21 , drive member 30 , piston rod 31 , telescopic member 40 , pressing plate 50 , bracket 60 , mounting base 70 , display screen 80 , indicator light group 90 , buzzer 100 , button group 110 . DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making any creative efforts shall fall within the scope of protection of the present invention.

[0027] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0028] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0029] In the present invention, unless otherwise expressly specified or limited, terms such as "mounted," "connected," "connect," and "fixed" should be understood broadly. For example, these terms may refer to connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; and internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of these terms in the present invention based on specific circumstances.

[0030] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Furthermore, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0031] In the description of this specification, the reference terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" mean that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic expressions of the above terms should not be understood as necessarily referring to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification.

[0032] See also Figures 1 to 2 As shown, the present invention discloses a specific embodiment of a testing device for a phase sequence protection capacitor, comprising: a testing host 10, wherein the testing host 10 is provided with a plug-in board 20, the plug-in board 20 is provided with a slot 21, a power-on probe is provided inside the slot 21, and the testing host 10 is located above the slot 21 and is further provided with a driving member 30; during testing, the phase sequence protection capacitor is placed in the slot 21, and the testing host 10 controls the driving member 30 to drive the phase sequence protection capacitor downward until it is electrically connected to the power-on probe, and the testing host 10 performs the test on the phase sequence protection capacitor.

[0033] Specifically, the test host 10 serves as a core control unit, and functional modules such as circuit control, sensor reception, and test result analysis are integrated internally. A plugboard 20 is provided on the test host 10. The plugboard 20 is designed with a slot 21. The slot 21 is used to accommodate the phase sequence protection capacitor. A power-on probe is provided inside the slot 21. The power-on probe is used to connect to the capacitor during the detection process to perform electrical testing. The test host 10 is located above the slot 21 and is provided with a driver 30. The function of the driver 30 is to drive a piston through air pressure to drive the phase sequence protection capacitor downward. When the capacitor is placed in the slot 21, the driver 30 works to press the capacitor downward until it contacts the power-on probe in the slot 21, ensuring that the contact between the capacitor and the probe is stable and tight. After the capacitor contacts the power-on probe, the test host 10 automatically performs a test on the phase sequence protection capacitor. Through the built-in test module, the test host 10 performs electrical performance testing on the capacitor, such as parameters such as capacitance value, phase sequence, and withstand voltage. The test results are fed back in real time and displayed on the interface of the test host 10. After the test is completed, the test host 10 will automatically record the test results and generate a test report as needed.

[0034] That is to say, by providing a plug-in board 20 with a slot 21 and a power-on probe, and coordinating with the automatic downward pressure of the driver 30, the phase sequence protection capacitor placed in the slot 21 can be quickly and accurately plugged into the power-on probe to achieve power-on connection. The test host 10 can perform an automated test process on the capacitor according to a preset program, without the need for repeated manual operations, greatly shortening the detection time of a single capacitor, and easily realizing continuous automated detection of batch capacitors, thereby improving the overall detection efficiency and meeting the rapid detection requirements of large-scale production lines. In addition, the automatic connection between the capacitor and the power-on probe is achieved through a mechanical structure, and the operator does not need to directly contact the high-voltage components during the detection process, effectively avoiding the risk of electric shock and ensuring the safety of the detection process. In addition, during the manual inspection process, the operator's skill level, operating force, testing techniques, and environmental factors may interfere with the test results, resulting in large data fluctuations and poor repeatability. The device uses a mechanized drive part 30 to press down, ensuring that the insertion force and position of the capacitor and the power probe are highly consistent each time, avoiding the uncertainty of manual operation. The test host 10 performs the test based on precise algorithms and standard parameters, reducing human errors, making the test results more stable and accurate, and improving the reliability of product quality control. In addition, traditional manual inspection methods require a lot of manpower, and long-term repetitive operations can easily cause operator fatigue, further affecting detection efficiency and accuracy. The device realizes automated inspection, requiring only a small number of personnel to be responsible for the loading and unloading of capacitors and simple monitoring and maintenance of the device, greatly reducing manpower requirements and reducing the company's labor costs; at the same time, automated operation reduces the labor intensity of operators, improves the working environment, and helps to improve employee job satisfaction and production enthusiasm.

[0035] In one embodiment, a telescopic member 40 is further provided between the plugboard 20 and the test host 10. Preferably, the telescopic member 40 is a telescopic stud.

[0036] Specifically, the telescopic member 40 is retractable to support the plugboard 20. More specifically, the telescopic member 40 consists of an outer threaded sleeve and an inner screw. The outer threaded sleeve is fixedly mounted on the test host 10 and has an inner threaded hole. The inner screw engages the outer threaded sleeve via threads, allowing it to rotate within the outer threaded sleeve, thereby enabling up and down movement. The top of the inner screw is designed with a connection structure for connecting to the plugboard 20, such as a threaded hole, a slot, or a flat connection, so that the plugboard 20 is securely mounted on the inner screw. Inside the telescopic member 40, a spring is disposed between the inner screw and the bottom of the outer threaded sleeve. The spring is made of a metal material with good elasticity and durability, such as stainless spring steel. The specifications of the spring are precisely selected and designed based on factors such as the weight of the plugboard 20, the stress conditions during capacitance testing, and the required telescopic travel. During installation, one end of the spring is fixed to the bottom of the outer threaded sleeve, and the other end is in contact with or fixedly connected to the bottom of the inner screw, ensuring that the spring can produce corresponding elastic deformation when the inner screw moves up and down.

[0037] When the phase sequence protection capacitor is not placed, the spring within the telescopic member 40 is in a naturally extended state, and the plugboard 20, supported by the spring, is in a relatively high initial position. This initial height can be pre-set based on the overall design of the test device and the typical size of the capacitor. When the operator places the phase sequence protection capacitor in the slot 21 of the plugboard 20, the weight of the capacitor exerts downward pressure on the plugboard 20. This pressure is transmitted through the plugboard 20 to the inner screw of the telescopic member 40, causing the inner screw to move downward, overcoming the elastic force of the spring. The spring is compressed under the pressure, and its expansion and contraction amount is determined by the weight of the capacitor and the elastic coefficient of the spring. As the inner screw moves downward, the plugboard 20 also descends until the capacitor is stably placed in the slot 21 and the elastic force of the spring and the weight of the capacitor reach equilibrium. When the test host 10 controls the driver 30 to push the capacitor downward to connect it to the power-on probe, the capacitor is subjected to the downward pressure of the driver 30 and the reaction force of the power-on probe. These external forces will further act on the plugboard 20 and the telescopic member 40, causing the spring to continue to deform elastically. The elastic deformation of the spring can act as a buffer, reducing the impact of external forces on other components of the test device and protecting the internal structure of the test host 10 and key components such as the power-on probe. At the same time, the elastic force of the spring can ensure that the contact pressure between the capacitor and the power-on probe is stable, ensuring a good electrical connection and improving the accuracy and reliability of the test. When the test is completed, the drive member 30 is reset and the external force on the capacitor disappears. At this time, the spring gradually returns to its original state under the action of its own elastic force, pushing the inner screw to move upward, thereby driving the plugboard 20 and the capacitor to rise, and then pulling out the capacitor, i.e., returning to the initial state, ready for the next test.

[0038] In other words, the spring has good elasticity and can undergo elastic deformation when the plugboard 20 is subjected to external forces, playing a role in buffering and shock absorption. Various external force impacts generated during the placement of the capacitor, the downward pressure of the driver 30, and the test process can be effectively alleviated by the expansion and contraction of the spring, avoiding rigid impacts on key components such as the test host 10 and the power probe, reducing damage and wear of the components, extending the service life of the device, and reducing the maintenance cost of the equipment. In addition, when the capacitor and the power probe are plugged in for testing, stable contact pressure is the key to ensuring good electrical connection and accurate test results. The elastic force of the spring can be automatically adjusted according to the weight of the capacitor and the stress conditions during the test process, always providing appropriate contact pressure between the capacitor and the power probe. Even if the external force changes or the capacitor has a certain dimensional deviation, the spring can maintain a stable contact state through its own expansion and contraction, avoiding test errors caused by poor contact and improving the accuracy and repeatability of the test. In addition, phase sequence protection capacitors of different specifications may differ in weight and size. Through the elasticity of the spring, the telescopic member 40 can automatically adapt to the pressure generated by capacitors of different weights, so that the plugboard 20 can be adjusted to the appropriate height when placing capacitors of different specifications and maintain a stable support state. In this way, the test device does not need to be specially adjusted and set for each specification of capacitor, which improves the versatility and adaptability of the device and facilitates rapid switching and diversified detection in the production process. In addition, due to the automatic adjustment effect of the spring, the operator does not need to manually accurately adjust the height of the plugboard 20 when placing the capacitor, and only needs to place the capacitor into the slot 21. During the test process, the spring can also automatically adapt to changes in external force without the need for additional intervention by the operator. This automated support and adjustment method simplifies the operating process, reduces the time and error of manual operation, improves the overall test efficiency, and can better meet the demand for fast and efficient detection on large-scale production lines.

[0039] In one embodiment, a sensor is further provided in the telescopic member 40 , and the sensor is electrically connected to the test host 10 .

[0040] Specifically, according to demand, select a sensor that can detect switching signal, such as a common micro switch sensor or a proximity switch sensor. The micro switch sensor has the characteristics of sensitive action and high reliability. When an external force touches its contact, the switch state can be changed rapidly; the proximity switch sensor does not need physical contact and outputs switching signal by sensing the proximity of the target object, which is applicable to some scenes with requirements for contact. Inside the telescopic member 40, the installation position of the sensor is determined according to its structure and functional requirements. If a micro switch sensor is used, it can be installed near the extreme position of the relative motion of the inner screw and the outer screw sleeve of the telescopic member 40, such as when the inner screw moves downward to the lowest position (i.e., when the plugboard 20 drops to the extreme position), the bottom of the inner screw can touch the contact of the micro switch sensor; If a proximity switch sensor is used, it can be installed on the side of the outer screw sleeve, corresponding to the position of a specific mark (such as a metal sheet) on the inner screw, when the inner screw moves to the extreme position, when the mark enters the sensing range of the proximity switch, the sensor output signal is given to the test host 10. In addition, the sensor is stably installed in the telescopic member 40 using a suitable fixing method. For the micro switch sensor, you can use screws to fix it on the specially designed sensor mounting base 70, and then fix the mounting base 70 to the appropriate position of the outer screw sleeve or inner screw; for the proximity switch sensor, you can use its own mounting hole to fix it directly on the outer screw sleeve with screws, and adjust its relative position and distance with the mark on the inner screw to ensure that the sensor can detect accurately.

[0041] Select an appropriate connecting cable based on the interface type of the sensor and the test host 10. The cable should have good insulation and anti-interference capabilities to ensure stable signal transmission. For example, if both the sensor and the test host 10 use common terminal blocks, a multi-core shielded cable can be used to accurately connect the sensor's signal output terminal to the corresponding signal input terminal of the test host 10. Furthermore, securely connect one end of the connecting cable to the sensor's signal output terminal and the other end to the designated interface on the test host 10. During the connection process, pay attention to the polarity of the cable and the corresponding interface to avoid incorrect connections that may cause signal transmission errors or damage the device. After the connection is completed, use insulating tape or heat shrink tubing to wrap and secure the connection to prevent the cable from loosening or shorting. When the device is not operating, the sensor in the telescopic member 40 is in a trigger-ready state. At this time, the test host 10 continuously monitors the sensor's signal input port but does not receive a valid switching signal. When the plugboard 20 moves to the preset limit position during the capacitor placement and the downward pressure of the driver 30, the sensor in the telescopic member 40 is triggered. If it is a micro switch sensor, the movement of the inner screw causes its contacts to contact the micro switch, changing the on / off state of the micro switch, thereby outputting a switch signal; if it is a proximity switch sensor, the mark on the inner screw enters its sensing range, and the proximity switch outputs the corresponding switch signal. The switch signal output by the sensor is transmitted to the test host 10 via a connecting cable. After the test host 10 receives the signal, its internal microprocessor identifies and processes the signal. According to the preset program logic, the test host 10 determines whether the plug board 20 has reached the limit position and performs the corresponding operation. For example, if the plug board 20 drops to the limit position, the test host 10 stops the downward pressing action of the drive member 30 to prevent damage to the equipment; if the plug board 20 rises to the limit position, the test host 10 may allow the next capacitor placement operation to proceed.

[0042] In other words, the sensor acts as a contact limit switch, accurately detecting the limit position of the plugboard 20. When the plugboard 20 reaches its limit position, the sensor promptly sends a signal to the test host 10, enabling the test host 10 to quickly take appropriate protective measures, such as stopping the movement of the driver 30 and cutting off the power supply. This prevents safety accidents such as equipment damage, capacitor damage, and even casualties caused by excessive movement of the plugboard 20, thereby greatly improving the safety and reliability of the device. In addition, by detecting the switch signal through the sensor, the test host 10 can accurately grasp the position information of the plugboard 20. In the automated testing process, precise position control is crucial to ensuring the correct connection between the capacitor and the power probe and the accurate operation of the driver 30. The real-time position feedback provided by the sensor enables the test host 10 to accurately adjust the operating state of the device according to actual conditions, improving the accuracy and repeatability of the test and ensuring the consistency of product quality. In addition, the use of the sensor enables the device to achieve automated limit detection and control, eliminating the need for the operator to manually determine whether the position of the plugboard 20 has reached the limit. The operator only needs to place and test the capacitor according to the normal process, and the device will automatically complete the corresponding actions and protective measures according to the sensor signal, which simplifies the operation process, reduces the difficulty of operation, and improves production efficiency. It is particularly suitable for batch testing of phase sequence protection capacitors on large-scale automated production lines. In addition, when the device fails, the signal output by the sensor can serve as an important basis for fault diagnosis. By monitoring the signal status of the sensor, the operator can quickly determine whether the plug-in board 20 can move normally to the extreme position, thereby determining the location where the fault may occur, such as whether the sensor is damaged, whether the connecting cable is loose, whether there is a problem with the control program of the test host 10, etc. This helps to shorten troubleshooting time, improve maintenance efficiency, reduce equipment downtime, and reduce production losses.

[0043] In one embodiment, the power-on probe is sunk into the slot 21 .

[0044] Specifically, the shape and size of the slot 21 are designed according to the dimensions and pin layout of the phase sequence protection capacitor. The slot 21 usually adopts a rectangular or square structure that matches the bottom contour of the capacitor to ensure that the capacitor can be firmly placed in the slot 21. At the same time, the depth of the slot 21 is reasonably determined to ensure that the pins can accurately contact the power-on probe after the capacitor is placed, while providing sufficient space for the sinking of the power-on probe. A special probe installation area is set at the bottom of the slot 21, and the shape and size of the area are adapted to the mounting base of the power-on probe. Around the probe installation area, some positioning protrusions or grooves can be designed to assist the precise installation of the power-on probe and prevent it from being displaced in the slot 21. In addition, according to the specifications and test requirements of the capacitor pins, a suitable power-on probe is selected. The power-on probe should have good conductivity, elasticity and wear resistance to ensure that it can maintain a stable and reliable electrical connection with the capacitor pins during multiple plugging and unplugging processes. Common power-on probes include spring probes, crown probes, etc., which can be selected according to actual needs. Align the mounting base of the power-on probe with the probe mounting area at the bottom of the slot 21, and securely install the power-on probe in the slot 21 by screwing, snap-on connection, or welding. During the installation process, ensure that the needle part of the power-on probe is accurately located at the designed position and maintains an appropriate perpendicularity to the plane at the bottom of the slot 21 to ensure that the capacitor pin can smoothly contact the probe when inserted. Through precise design and processing, the sinking depth of the needle of the power-on probe relative to the plane of the slot 21 is controlled. Generally speaking, the sinking depth should be determined according to the length of the capacitor pin and the operating habits of the operator, usually between a few millimeters and more than ten millimeters. For example, for capacitors with shorter pins, the sinking depth can be controlled at 3-5mm, which can not only ensure that the capacitor pin can be inserted and contact the probe, but also effectively prevent the operator from accidentally touching the probe.

[0045] That is to say, the power-on probe is sunken in the slot 21 so that the probe needle is not exposed outside the slot 21. When the operator places or removes the capacitor, the finger is not easily touched by the power-on probe, thereby effectively avoiding electric shock accidents caused by accidentally touching the probe, greatly improving the safety of the operator. In addition, the sunken power-on probe avoids stabbing the operator's fingers due to accidental collisions during operation, reduces the risk of mechanical injury, and provides a safer working environment for the operator. In addition, since the power-on probe is sunken in the slot 21, the capacitor pin can accurately contact the probe when inserted, reducing the poor contact problem caused by probe position deviation or external interference. The stable electrical connection ensures the accurate transmission of the test signal and improves the reliability and repeatability of the test results. The sunken power-on probe can shield the influence of external electromagnetic interference and mechanical vibration on the contact between the probe and the capacitor pin to a certain extent, further improving the stability and accuracy of the test, and ensuring that the test device can accurately detect the performance parameters of the phase sequence protection capacitor. In addition, the power-on probe is sunken in the slot 21, which can avoid the probe from being damaged by collisions, scratches, etc. in daily operation, extending the service life of the power-on probe. At the same time, oxidation and wear on the probe surface are reduced, the conductive performance of the probe is ensured, and the maintenance cost of the equipment is reduced. When placing or removing a capacitor, the operator does not need to deliberately avoid the power-on probe, but only needs to smoothly place the capacitor in or remove it from the slot 21, which is more convenient and quick, and improves work efficiency.

[0046] In one embodiment, the plug board 20 is evenly distributed with a plurality of slots 21, the driving member 30 is a cylinder, the cylinder includes a piston rod 31, the end of the piston rod 31 is connected to a pressure plate 50, and the pressure plate 50 is used to press down the phase sequence protection capacitor.

[0047] Specifically, multiple slots 21 are evenly distributed on the plugboard 20. During operation, the size and shape of the slots 21 are first determined based on the overall dimensions of the capacitor. They are generally designed to be rectangular or square to match the bottom contour of the capacitor. Then, the positions of the slots 21 are planned on the plugboard 20 according to a certain row and column spacing. For example, a matrix arrangement is used. The row and column spacing is reasonably set according to the pin spacing of the capacitor and the operating space requirements to ensure that each capacitor can be accurately and securely inserted into the slot 21, and there is sufficient spacing between adjacent capacitors to facilitate operator access. In addition, based on the total downward force required for the multiple phase sequence protection capacitors to be tested simultaneously and the space limitations of the test device, a driver 30 of appropriate specifications is selected. Parameters such as the cylinder diameter, stroke, and output force of the driver 30 must meet the test requirements. For example, if 10 capacitors need to be tested simultaneously and the downward force required for each capacitor test is 10N, the output force of the driver 30 must reach at least 100N, and a certain safety factor must be considered. The driver 30 is fixedly mounted in a suitable position on the test device, ensuring that the axis of the driver 30 is perpendicular to the plane of the plugboard 20. The piston rod 31 extends from the front end of the driver 30, and its end is attached to the pressure plate 50 via a threaded connection, welding, or snap-fit ​​connection. During installation, ensure that the piston rod 31 is securely connected to the pressure plate 50, and that the direction of movement of the piston rod 31 aligns with the downward pressure of the pressure plate 50 to avoid deviation or jamming. Furthermore, the shape of the pressure plate 50 is designed based on the distribution of the slots 21 on the insert plate 20. It is generally a rectangular flat plate, and its size should be sufficient to cover the capacitor positions corresponding to all slots 21 on the insert plate 20. The edges of the pressure plate 50 should be chamfered to prevent scratches on the capacitors or the operator during operation. Furthermore, the pressure plate 50 should be made of a material with a uniform texture and moderate hardness, such as stainless steel or hard plastic. The surface of the pressure plate 50 should be smoothed to reduce friction with the capacitors and ensure smooth and even application of pressure during downward pressure. A connecting hole matching the end of the piston rod 31 is provided at the center of the pressure plate 50, and the pressure plate 50 is secured to the end of the piston rod 31 with screws. During connection, the verticality of the pressing plate 50 and the piston rod 31 must be ensured so that the pressing plate 50 can remain horizontal during the pressing process, thereby ensuring that the pressure applied to each capacitor is uniform.

[0048] Among them, the operator inserts multiple phase sequence protection capacitors into the various slots 21 on the plug-in board 20 respectively, ensuring that the capacitor pins are in accurate contact with the power-on probes in the slots 21. The driver 30 is started by the control program of the test host 10, and the piston rod 31 of the driver 30 is extended, driving the pressure plate 50 to move downward. The pressure plate 50 gradually approaches the capacitor, eventually contacts the upper surface of the capacitor, and continues to press down to form a stable and reliable electrical connection between the capacitor and the power-on probe. At the same time, the test host 10 begins to perform performance tests on each capacitor, such as detecting parameters such as the capacitance and insulation resistance of the capacitor. After the test is completed, the test host 10 controls the piston rod 31 of the driver 30 to retract, driving the pressure plate 50 to move upward and return to its initial position. The operator can remove the tested capacitor from the slot 21 and proceed to the next step of processing or continue to place a new capacitor for the next round of testing.

[0049] That is to say, the multiple slots 21 are evenly distributed on the plugboard 20, which can simultaneously place multiple phase sequence protection capacitors for testing, greatly reducing the clamping and disassembly time required for single capacitor testing. Compared with the traditional single capacitor testing method, more capacitor tests can be completed in the same time, significantly improving production efficiency, and is particularly suitable for rapid detection of capacitors on large-scale production lines. By combining the automatic pressing function of the driver 30 and the pressure plate 50, the automated operation of the capacitor testing process is achieved. The operator only needs to place the capacitor into the slot 21 and start the test program. The driver 30 can automatically complete the pressing and resetting action, reducing manual intervention and further improving test efficiency. In addition, the pressure plate 50, driven by the piston rod 31 of the driver 30, can smoothly and evenly apply pressure to multiple capacitors at the same time, ensuring that the contact pressure between each capacitor and the power probe is consistent. Stable contact pressure is the key to ensuring good electrical connection and accurate test results, avoiding test errors caused by poor contact and improving the accuracy and repeatability of the test. Testing multiple capacitors simultaneously can eliminate the impact of environmental factors (such as temperature and humidity changes) that may be introduced due to differences in test time on the test results, making the test data more comparable and reliable, and helping to more accurately evaluate the performance and quality of the capacitors. In addition, the components such as the insert plate 20, the driver 30, the piston rod 31 and the pressing plate 50 form a stable mechanical structure. The uniform slot 21 design of the insert plate 20 ensures the stable placement of the capacitors. The rigid connection between the driver 30 and the piston rod 31 and the rational design of the pressing plate 50 enable the device to withstand greater pressure without deformation or damage during the pressing process, thereby improving the overall stability and reliability of the device. In addition, the operator only needs to perform simple capacitor placement and removal operations, without the need for complex debugging and manual pressurization processes, which reduces the requirements for the operator's skill level and makes the operation easier and faster. The automated pressing and resetting functions reduce the operator's physical labor, avoid fatigue caused by long-term manual operation, improve work efficiency and also improve the operator's working environment.

[0050] In one embodiment, there are two piston rods 31 .

[0051] Specifically, the two piston rods 31 act simultaneously, and can balance the forces when the driver 30 pushes the pressure plate 50. Compared with the single piston rod 31 driver 30, the single piston rod 31 may cause the driver 30 or the pressure plate 50 to vibrate and shake due to the force on one side during movement. The dual piston rod 31 structure can effectively disperse this unbalanced force, making the movement of the pressure plate 50 more stable and smooth, reducing the mechanical vibration interference during the test process, and helping to improve the stability and accuracy of the test signal. In the test environment, there may be some external factors (such as vibration of other equipment, air flow, etc.) that interfere with the test device. The stable driving force provided by the two piston rods 31 can enable the pressure plate 50 to better resist these external interferences, maintain a stable downward pressing action, and ensure the reliability of the test process. In addition, the two piston rods 31 can ensure that the driving force is evenly distributed on the pressure plate 50, so that when the pressure plate 50 contacts the phase sequence protection capacitor, the force can be evenly transferred to each capacitor, so that the pressure on each capacitor is basically the same. Uniform pressure is the key to ensuring a good electrical connection between the capacitor and the power-on probe, avoiding the problem of poor contact or excessive extrusion damage of some capacitors due to uneven pressure, and improving the accuracy and consistency of the test results. For some irregularly shaped or large-sized pressure plates 50, it is difficult for a single piston rod 31 to ensure a uniform distribution of the driving force. The two piston rods 31 can be reasonably arranged according to the actual situation of the pressure plate 50, better adapting to pressure plates 50 of different shapes and sizes, so that the driving force can act evenly on the entire surface of the pressure plate 50, expanding the scope of application of the test device. In addition, the two piston rods 31 jointly bear the task of pushing the pressure plate 50, dispersing the larger force originally borne by the single piston rod 31 into two parts, reducing the stress intensity of each piston rod 31. This can reduce fatigue damage to the piston rod 31, the internal parts of the driver 30, and the connection parts, extend the service life of these components, and improve the overall reliability of the device. In addition, the double piston rod 31 structure has a certain degree of redundancy. Even if one of the piston rods 31 has a minor fault (such as poor sealing, slight deformation, etc.), the other piston rod 31 can still provide a certain pushing force to ensure that the pressure plate 50 can basically complete the downward pressing action, so that the test device can continue to operate to a certain extent and will not stop working immediately, which provides time for timely maintenance and replacement of parts and improves the stability of the device.

[0052] In one embodiment, the test host 10 is provided with a bracket 60 , the bracket 60 is connected to a mounting base 70 , and the mounting base 70 is connected to the driving member 30 .

[0053] Specifically, the appropriate material for the bracket 60 is selected based on the weight and size of the test host 10 and the test environment requirements. Common materials include aluminum alloy, stainless steel, and carbon steel. Aluminum alloy is lightweight and corrosion-resistant, making it suitable for testing scenarios with strict weight requirements and relatively benign environments. Stainless steel offers excellent corrosion resistance and high strength, making it suitable for use in humid or corrosive environments. Carbon steel is strong and low-cost, and its corrosion resistance can be improved through surface treatment (such as painting or galvanizing). It is often used in cost-sensitive environments with moderate environmental conditions. The structural design of the bracket 60 should take into account the stability and installation convenience of the test host 10. A frame structure can be used, consisting of multiple profiles (such as square or rectangular tubes) connected by welding or bolts. The frame dimensions should be appropriately designed based on the size of the test host 10 to ensure that the test host 10 can be securely placed on the bracket 60. Furthermore, adjustable feet can be installed at the bottom of the bracket 60. By rotating the adjustable feet, the bracket 60 can be adjusted to maintain a level position for accurate testing. In addition, the material of the mounting base 70 must match the bracket 60 and the driver 30. Typically, the same or similar material as the bracket 60 is selected to ensure the consistency and stability of the overall structure. The shape of the mounting base 70 should be designed according to the installation requirements and spatial layout of the driver 30. Generally, a rectangular or square flat plate is used. Its size should be able to meet the installation and fixation requirements of the driver 30 and leave a certain amount of operating space. In addition, the mounting base 70 is fixed to the bracket 60 by welding or bolting. If welding is used, the welding quality must be ensured to ensure that the connection between the mounting base 70 and the bracket 60 is firm and reliable, without defects such as cold welds and air holes. If bolting is used, bolt holes should be opened at corresponding positions on the mounting base 70 and the bracket 60, and bolts and nuts of appropriate specifications should be used for connection. Thread locker should be applied to the connection parts to prevent the bolts from loosening. At the same time, the position and angle of the mounting base 70 on the bracket 60 should be reasonably determined according to the movement direction and force conditions of the driver 30 to ensure that the driver 30 can operate normally. In addition, a dedicated mounting interface for the driver 30 is designed on the mounting base 70. The size and shape of the interface must be compatible with the mounting location of the driver 30. Common connection methods include flange connection and threaded connection. For flange connection, flanges are installed on the mounting base 70 and the driver 30 respectively, and the two flanges are connected together by bolts. For threaded connection, an internal threaded hole is machined on the mounting base 70, and an external thread is machined on the mounting end of the driver 30. The driver 30 is screwed into the internal threaded hole of the mounting base 70. During the connection process, it is necessary to ensure that the axis of the driver 30 is consistent with the designed axis of the mounting base 70 to avoid offset or tilting, which may affect the movement accuracy of the driver 30.

[0054] That is to say, the test host 10 is connected to the driver 30 in sequence through the bracket 60 and the mounting base 70, forming a stable mechanical structure system. The bracket 60 provides a stable support base for the test host 10, and the mounting base 70 serves as an intermediate connecting component to reliably connect the driver 30 to the bracket 60, so that the entire device can withstand the reaction force generated by the movement of the driver 30 and other external interferences during the test process, reducing the vibration and shaking of the device, and ensuring the accuracy and stability of the test. This connection method can evenly distribute the force generated by the movement of the driver 30 to the bracket 60, avoiding structural damage caused by excessive local force. For example, when the driver 30 pushes the pressure plate 50 to press down the phase sequence protection capacitor, the reaction force generated is transmitted to the bracket 60 through the mounting base 70. The frame structure of the bracket 60 can disperse these forces to each support point, thereby improving the bearing capacity and anti-deformation ability of the device.

[0055] In one embodiment, the testing host 10 is further provided with a display screen 80 .

[0056] Specifically, a suitable display screen 80 type is selected based on the usage scenario, cost budget, and display requirements of the test host 10. Common types include liquid crystal display (LCD), light emitting diode display (LED), and organic light emitting diode display (OLED).

[0057] LCD displays: They are relatively low-cost and consume minimal power, making them suitable for testing scenarios where display quality is not critical and long-term operation is required. For example, in some conventional capacitance test equipment, LCD displays can clearly display test parameters and results, meeting basic human-computer interaction requirements.

[0058] LED display: With its high brightness and wide viewing angle, it can clearly display information outdoors or in brightly lit environments. If the test host 10 needs to be used in a brightly lit place such as a workshop, the LED display can ensure that the operator can clearly see the displayed content from different angles.

[0059] OLED displays: With vibrant colors, high contrast, and a fast response time, they provide a more vivid and clear display. For high-end test equipment requiring high display quality, such as test consoles for precision electronic components, OLED displays can better display complex test parameters and detailed test status.

[0060] The connection between the display screen 80 and the test host 10 is based on the interface type. Common interfaces include HDMI, VGA, DVI, and LVDS. If both the test host 10 and the display screen 80 support HDMI, this is a high-speed, high-bandwidth connection method that can transmit high-quality audio and video signals and is suitable for displaying complex graphics and dynamic information. For some older test hosts 10 or certain types of display screens 80, a VGA or DVI interface may be required. Select a connecting cable of appropriate length and quality to ensure stable signal transmission. The cable length should be determined based on the actual installation location of the test host 10 and display screen 80 to avoid signal attenuation caused by excessive length or installation inconvenience caused by excessive shortness. Also, pay attention to the cable's shielding performance to prevent external electromagnetic interference from affecting the display signal. Install the corresponding display screen 80 driver in the operating system of the test host 10 so that the operating system can recognize and control the display screen 80. The driver must match the model and specifications of the display screen 80 to ensure that the display screen 80 can display various information normally. After installing the driver, you also need to set the display parameters of the display screen 80, such as resolution, refresh rate, and color mode, to achieve the best display effect.

[0061] In other words, through the human-computer interaction interface, the operator can set the test parameters directly on the display screen 80, without having to operate with complex physical buttons or knobs. The concise and clear interface layout and operation guidance enable the operator to complete parameter settings quickly and accurately, improving operational efficiency. The test status display interface provides real-time feedback on various information during the test process, allowing the operator to understand the progress and status of the test at any time without having to frequently check other parts of the test equipment. This allows problems that arise during the test to be discovered promptly and appropriate measures to be taken to address them, avoiding extended test times and inaccurate test results caused by untimely problem discovery. In addition, parameter setting on the display screen 80 allows for precise control of the test parameters, avoiding errors caused by manually adjusting physical buttons or knobs. At the same time, the test host 10 can perform precise tests based on the parameters set by the operator, ensuring the accuracy and reliability of the test results. If an abnormality occurs during the test, the display screen 80 can display the abnormality information in a timely and detailed manner, helping the operator quickly locate the problem. Operators can take appropriate measures to troubleshoot and repair according to the prompt information, reducing test errors and equipment damage caused by untimely troubleshooting and improving test reliability.

[0062] In one embodiment, the test host 10 is further provided with an indicator light group 90 .

[0063] Specifically, the indicator light group 90 includes a red light, a green light, and a yellow light. The red light, green light, and yellow light represent three different states: abnormal, normal operation, and stopped operation, respectively. Operators can quickly understand the current operating status of the test host 10 simply by observing the color of the indicator light, without having to view complex instruments or data. This intuitive display method greatly improves the efficiency of equipment status monitoring and reduces the workload of operators. When an abnormality occurs in the test host 10, the red light will immediately light up, allowing operators to detect the equipment failure immediately and take appropriate measures to address it. Timely abnormality prompts help prevent further expansion of the fault, reduce equipment damage and downtime, and improve equipment reliability and availability.

[0064] Furthermore, the illumination of the red abnormality indicator light serves as a strong safety warning to operators, reminding them not to perform any operations when an abnormality occurs, thereby preventing accidents. For example, when the test host 10 detects a dangerous condition such as overvoltage or overcurrent, the red light illuminates, prompting the operator to immediately stop operation and wait for maintenance personnel to perform repairs. The state changes of the indicator light group 90 guide operators in following the correct equipment operation procedures. For example, operators can only perform testing operations when the green light illuminates, indicating normal equipment operation; and when the yellow light illuminates, indicating equipment shutdown, operators can perform maintenance and servicing. This standardized operating procedure helps extend the service life of the equipment and the accuracy of test results. Furthermore, by observing the location and status of the red light, maintenance personnel can quickly locate the location and cause of equipment failures. For example, if the red light corresponding to a specific functional module illuminates, maintenance personnel can focus on inspecting components such as the module's circuitry, sensors, and actuators, improving troubleshooting efficiency. The state changes of the indicator light group 90 record the equipment's operating history, providing important information for equipment maintenance and management. By analyzing the time and frequency of indicator light status changes, maintenance personnel can understand the equipment's operating status and fault occurrence patterns, formulate maintenance plans in advance, rationally arrange maintenance resources, and reduce equipment maintenance costs.

[0065] In one embodiment, the testing host 10 is further provided with a buzzer 100 .

[0066] Specifically, if the operating current of the buzzer 100 is small, the positive pole of the buzzer 100 can be directly connected to the control signal output terminal of the test host 10, and the negative pole can be connected to the ground wire of the test host 10. The sounding and stopping of the buzzer 100 are controlled by the high and low levels of the control signal output terminal. When the control signal is at a high level, the buzzer 100 is powered on and sounds; when the control signal is at a low level, the buzzer 100 is powered off and stops sounding. If the operating current of the buzzer 100 is large, or the control signal output capacity of the test host 10 is limited, the buzzer 100 needs to be connected through a drive circuit. Commonly used drive circuits include transistor drive circuits and relay drive circuits. The transistor drive circuit has the advantages of low cost and fast response speed, and is suitable for driving low-power buzzers 100; the relay drive circuit has the characteristics of good isolation effect and strong driving capability, and is suitable for driving high-power buzzers 100.

[0067] In other words, the sound emitted by the buzzer 100 can instantly attract the operator's attention, especially in noisy work environments. Compared to visual cues (such as indicator lights), audio cues are more direct and effective. When the test host 10 experiences an abnormality, the buzzer 100 immediately sounds, allowing the operator to quickly detect the equipment problem and take timely measures to address it, preventing the abnormality from escalating further. By setting different sound patterns (such as continuous sounding and intermittent sounding), the severity of the abnormality can be distinguished. The operator can quickly determine the urgency of the abnormality based on the sound pattern of the buzzer 100, thereby rationally arranging the handling order. Urgent abnormalities can be handled first, ensuring the safety of equipment and personnel. In addition, when an equipment abnormality occurs, the alarm of the buzzer 100 can promptly remind the operator to stop equipment operation or take appropriate safety measures to prevent further escalation of the accident. For example, when the test host 10 detects an overload, the buzzer 100 sounds to remind the operator to reduce the load, avoiding equipment damage due to overload or safety accidents such as fire. By promptly reminding the operator to handle abnormal situations, it is possible to reduce equipment failures and damage caused by abnormal operation, and improve the operational stability and reliability of the equipment. At the same time, the operator can perform regular maintenance and care on the equipment based on the alarm information of the buzzer 100, thereby extending the service life of the equipment.

[0068] In one embodiment, the testing host 10 is further provided with a button group 110 .

[0069] Specifically, the button group 110 includes a start button, a start detection button, and a stop button. More specifically, in order to facilitate quick identification and operation by the operator, buttons with different functions should be of different colors. The start button is usually green. Green represents the meaning of start and passage in people's cognition, which can give the operator a positive psychological hint; the start detection button can be blue, which gives people a professional and calm feeling; the stop button is red. Red has a strong warning effect, which can remind the operator to quickly press the button to stop the equipment in an emergency. Alternatively, clear function labels such as "Start", "Start Detection", "Stop" and other words can be printed on the button surface, and corresponding icons can be used at the same time, such as a power symbol to indicate start, a magnifying glass symbol to indicate start detection, and a stop symbol to indicate stop. The labels should be printed with wear-resistant and non-fading materials to ensure that they remain clearly visible during long-term use.

[0070] In other words, buttons with different functions are clearly distinguished through color, labeling, and layout, allowing operators to quickly find the required button, reducing operation time and the possibility of misoperation. For example, in an emergency, the operator can quickly find and press the red stop button to stop the equipment in time and avoid an accident.

[0071] The operating procedures of the test device are as follows:

[0072] Press the start button to power on the test host 10. Two AC contactors and a phase sequence protection capacitor are used inside the test host 10 to detect the three-phase phase sequence of the line body. Press and hold the start / stop button for 3 seconds to automatically detect the three-phase phase sequence of the test host 10. When the AC contactor detects an incorrect phase sequence three times in a row, the buzzer 100 will sound an alarm. When the three-phase phase sequence is correct, the test host 10 will enter a voltage test until the external power supply is correct before proceeding to the next step. Then the operator only needs to place the phase sequence protection capacitor into the slot 21 and press the start test button. The test host 10 will issue a command to control the driver 30 to drive the pressure plate 50 to press down until the phase sequence protection capacitor and the power-on probe are plugged in place. After that, it will automatically power on and the test host 10 will automatically detect and determine the positive / reverse phase of the phase sequence protection capacitor. When the phase sequence protection capacitors of all workstations have passed the test, the driver 30 will automatically rise. If some workstations fail the test, the buzzer 100 will sound an alarm, the driver 30 will stop working, and the display 80 will display the unqualified workstations.

[0073] The above embodiments are preferred implementation schemes of the present invention. In addition, the present invention can also be implemented in other ways. Any obvious replacement without departing from the concept of the present technical solution is within the scope of protection of the present invention.

Claims

1. A testing device for phase sequence protection capacitors, characterized in that: include: A test host is provided with a plug-in board, the plug-in board is provided with a slot, a power-on probe is provided inside the slot, and the test host is located above the slot and is also provided with a driving component; during testing, the phase sequence protection capacitor is placed in the slot, and the test host controls the driving component to drive the phase sequence protection capacitor downward until it is electrically connected to the power-on probe, and the test host performs the test on the phase sequence protection capacitor.

2. The testing device for phase sequence protection capacitor according to claim 1, characterized in that: A telescopic member is further provided between the plug board and the test host.

3. The testing device for phase sequence protection capacitor according to claim 2, characterized in that: A sensor is also provided in the telescopic member, and the sensor is electrically connected to the test host.

4. The testing device for phase sequence protection capacitor according to claim 1, characterized in that: The power-on probe is sunk into the slot.

5. The testing device for phase sequence protection capacitor according to claim 1, characterized in that: The plug board is evenly distributed with a plurality of slots. The driving member is a cylinder. The cylinder includes a piston rod. The end of the piston rod is connected to a pressure plate. The pressure plate is used to press down the phase sequence protection capacitor.

6. The testing device for phase sequence protection capacitor according to claim 5, characterized in that: There are two piston rods.

7. The testing device for phase sequence protection capacitor according to claim 1, characterized in that: The test host is provided with a bracket, the bracket is connected to a mounting seat, and the mounting seat is connected to the driving member.

8. The testing device for phase sequence protection capacitor according to claim 1, characterized in that: The test host is also provided with a display screen.

9. The testing device for phase sequence protection capacitor according to claim 1, characterized in that: The test host is also provided with an indicator light group.

10. The testing device for phase sequence protection capacitor according to claim 1, characterized in that: The test host is also provided with a buzzer.

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