Duty cycle test method and apparatus for millimeter wave radar

Abstract

The application discloses a duty cycle test method and device of a millimeter wave radar, and relates to the technical field of duty cycle test, which comprises the following steps: obtaining the working frequency of a millimeter wave radar to be tested; selecting a target test port according to the working frequency; performing time domain scanning on the millimeter wave radar to be tested through the target test port to obtain a time domain signal; performing first abstract processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal; determining a processing strategy according to the signal type of the time domain signal; obtaining a target period interval according to the processing strategy and the initial high-low level curve; and calculating the duty cycle of the millimeter wave radar to be tested according to the target period interval, so as to complete the duty cycle test of the millimeter wave radar to be tested. Through time domain scanning on the target test port, the time domain signal of the radar can be accurately obtained. Compared with traditional mobile communication and short distance communication, the duty cycle test of the application is relatively simple, and the efficiency and accuracy of the duty cycle test are improved.

Description

Technical Field

[0001] The present application relates to the field of duty cycle testing technology, and in particular to a method and device for testing the duty cycle of a millimeter-wave radar. Background Art

[0002] A radar signal's duty cycle is a key parameter in measuring the characteristics of a radar's transmitted signal. It refers to the ratio of the radar's transmitted signal's pulse width to its pulse repetition period, typically expressed as a percentage or decimal. The duty cycle affects radar performance, such as range resolution and maximum detection range.

[0003] Traditional millimeter-wave radar duty cycle testing mainly calculates the duty cycle by measuring the pulse width and pulse period of the radar transmission signal. Traditional measurement methods require multiple adjustments to equipment parameters, and the measurement process is relatively complex and time-consuming. Summary of the Invention

[0004] The main purpose of this application is to provide a method and device for testing the duty cycle of a millimeter-wave radar, aiming to solve the technical problems that traditional measurement methods require multiple adjustments to equipment parameters, the measurement process is relatively complex, and it takes a long time.

[0005] To achieve the above objectives, the present application proposes a method for testing the duty cycle of a millimeter-wave radar, the method comprising:

[0006] Get the operating frequency of the millimeter-wave radar to be tested;

[0007] selecting a target test port according to the operating frequency;

[0008] Performing a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal;

[0009] Performing a first abstract processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal; the first abstract processing marks the time domain signal as a first constant value and a second constant value based on a rising edge and a falling edge to obtain the initial high-low level curve;

[0010] Determining corresponding processing strategies according to different signal types of the time domain signal; wherein the signal type includes a frequency modulated continuous wave type or a non-frequency modulated continuous wave type;

[0011] A target period interval is obtained according to the processing strategy and the initial high and low level curves; wherein, when the signal type is a frequency modulated continuous wave type, the processing strategy is determined to be performing a second abstract processing and a third abstract processing on the initial high and low level curves; the second abstract processing is to obtain a reference high and low level curve based on an off time threshold of a linear frequency modulation signal; the third abstract processing is to obtain a target high and low level curve based on all rising edges and falling edges in the reference high and low level curves; and the target period interval is obtained through the target high and low level curves;

[0012] The duty cycle of the millimeter-wave radar to be tested is calculated according to the target period interval to complete the duty cycle test of the millimeter-wave radar to be tested.

[0013] In one embodiment, the step of performing a first abstract processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal includes:

[0014] Obtaining first determination thresholds for rising and falling edges;

[0015] Performing a first abstract processing on the time domain signal, traversing signal data at all time points on the time domain signal, and obtaining a signal strength corresponding to each time point;

[0016] When the signal strength is greater than the first determination threshold, determining that the corresponding signal is in a high level state and marking it as a first constant value;

[0017] When the signal strength is less than the first determination threshold, determining that the corresponding signal is in a low level state and marking it as a second constant value;

[0018] An initial high-low level curve corresponding to the time domain signal is obtained according to the high level state, the first constant value, the low level state, and the second constant value.

[0019] In one embodiment, the step of determining a processing strategy according to the signal type of the time domain signal includes:

[0020] Obtaining a signal type of the time domain signal;

[0021] When the signal type is a frequency modulated continuous wave type, determining a processing strategy as performing a second abstract processing and a third abstract processing on the initial high and low level curves;

[0022] When the signal type is a non-frequency modulated continuous wave type, the processing strategy is determined to determine the target cycle interval based on the initial high and low level curves.

[0023] In one embodiment, obtaining a target cycle interval according to the processing strategy and the initial high-low level curve includes:

[0024] When the processing strategy is to perform the second abstract processing and the third abstract processing on the initial high and low level curves, obtaining a closing time threshold of the linear frequency modulation signal;

[0025] Performing a second abstraction process on the initial high-low level curve according to the closing time threshold to obtain a reference high-low level curve;

[0026] determining whether to perform a third abstraction process on the reference high and low level curves;

[0027] When determining to perform the third abstract processing on the reference high-low level curve, the target cycle interval is obtained according to the result of the third abstract processing.

[0028] In one embodiment, the step of performing a second abstraction process on the initial high-low level curve according to the closing time threshold to obtain a reference high-low level curve includes:

[0029] Traversing the initial high and low level curves, querying adjacent falling edges and rising edges, and calculating a first time difference between adjacent falling edges and rising edges;

[0030] comparing the first time difference with the closing time threshold;

[0031] When the first time difference is less than the closing time threshold, marking the interval between adjacent falling edges and rising edges as a high level interval;

[0032] When the first time difference is greater than or equal to the closing time threshold, marking the interval between adjacent falling edges and rising edges as a low-level interval;

[0033] The initial high-low level curve is updated according to the marked high level interval and the low level interval to obtain a reference high-low level curve.

[0034] In one embodiment, the step of determining whether to perform the third abstraction processing on the reference high-low level curve includes:

[0035] Traversing the reference high and low level curves to obtain a linear frequency modulation period in the reference high and low level curves;

[0036] Calculating the duty cycle data of the linear frequency modulation period in each linear frequency modulation period;

[0037] Obtaining a maximum duty cycle of a linear frequency modulation period and a minimum duty cycle of a linear frequency modulation period based on the linear frequency modulation period duty cycle data;

[0038] When the difference between the maximum duty cycle of the linear frequency modulation period and the minimum duty cycle of the linear frequency modulation period is less than a preset threshold, determining not to perform the third abstraction processing on the reference high and low level curve;

[0039] When the difference between the maximum duty cycle of the linear frequency modulation period and the minimum duty cycle of the linear frequency modulation period is greater than or equal to a preset threshold, it is determined to perform a third abstract processing on the reference high-low level curve.

[0040] In one embodiment, when determining to perform the third abstraction processing on the reference high-low level curve, the step of obtaining the target cycle interval according to the result of the third abstraction processing includes:

[0041] When determining to perform the third abstract processing on the reference high-low level curve, traversing the reference high-low level curve to obtain all rising edges and falling edges in the reference high-low level curve, and calculating a second time difference between adjacent rising edges and falling edges;

[0042] Obtaining a second time difference maximum value and a second time difference minimum value according to the second time difference;

[0043] Calculating an average of the maximum value of the second time difference and the minimum value of the second time difference;

[0044] When the average value is greater than the turn-on time threshold, marking the interval between the adjacent falling edge and rising edge as a high level interval;

[0045] When the average value is less than or equal to the turn-on time threshold, marking the interval between adjacent falling edges and rising edges as a low-level interval;

[0046] Obtaining a result of a third abstraction process according to the marked high-level interval and the marked low-level interval, and updating the reference high-low level curve according to the result of the third abstraction process to obtain a target high-low level curve;

[0047] The target cycle interval is obtained through the target high and low level curves.

[0048] In one embodiment, the step of calculating the duty cycle of the millimeter-wave radar to be tested according to the target period interval to complete the duty cycle test of the millimeter-wave radar to be tested includes:

[0049] Obtaining the number of cycles and the start time coordinate and the end time coordinate values ​​within the target cycle interval according to the target cycle interval;

[0050] In the time interval between the starting time coordinate and the ending time coordinate, record the time differences between all adjacent falling edges and rising edges, and accumulate the time differences to obtain an accumulated time difference;

[0051] The duty cycle of the millimeter-wave radar to be tested is calculated according to the number of cycles and the accumulated time difference to complete the duty cycle test of the millimeter-wave radar to be tested.

[0052] In one embodiment, the step of performing time domain scanning on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal includes:

[0053] Performing a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain a declared center frequency of the millimeter-wave radar to be tested;

[0054] When the declared center frequency is not used, determining whether the set center frequency is automatically selected;

[0055] When the center frequency is set to automatic selection, the millimeter-wave radar to be tested is pre-scanned according to the pre-scan setting rule, and the frequency point at which the maximum level is located is obtained during the pre-scan process;

[0056] A final sweep setting rule is obtained, and a final sweep is performed at the frequency point where the maximum level is located according to the final sweep setting rule to obtain a time domain signal.

[0057] In addition, to achieve the above-mentioned purpose, the present application also proposes a duty cycle test device for a millimeter-wave radar, the duty cycle test device for the millimeter-wave radar comprising:

[0058] An acquisition module is used to obtain the operating frequency of the millimeter-wave radar to be tested;

[0059] A selection module, configured to select a target test port according to the operating frequency;

[0060] A time domain scanning module, configured to perform time domain scanning on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal;

[0061] A processing module, configured to perform a first abstract processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal; the first abstract processing is to mark the time domain signal as a first constant value and a second constant value based on a rising edge and a falling edge to obtain the initial high-low level curve;

[0062] A determination module, configured to determine a corresponding processing strategy according to different signal types of the time domain signal; wherein the signal type includes a frequency modulated continuous wave type or a non-frequency modulated continuous wave type;

[0063] The acquisition module is further configured to obtain a target period interval based on the processing strategy and the initial high-low level curve; wherein, when the signal type is a frequency modulated continuous wave type, the processing strategy is determined to be performing a second abstract processing and a third abstract processing on the initial high-low level curve; the second abstract processing is to obtain a reference high-low level curve based on an off-time threshold of a linear frequency modulation signal; the third abstract processing is to obtain a target high-low level curve based on all rising edges and falling edges in the reference high-low level curve; and the target period interval is obtained through the target high-low level curve;

[0064] A calculation module is used to calculate the duty cycle of the millimeter-wave radar to be tested according to the target period interval to complete the duty cycle test of the millimeter-wave radar to be tested.

[0065] In addition, to achieve the above-mentioned purpose, the present application also proposes a duty cycle testing device for millimeter-wave radar, which includes: a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the computer program is configured to implement the steps of the duty cycle testing method for millimeter-wave radar as described above.

[0066] In addition, to achieve the above-mentioned purpose, the present application also proposes a storage medium, which is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by the processor, the steps of the duty cycle test method of the millimeter wave radar as described above are implemented.

[0067] In addition, to achieve the above-mentioned purpose, the present application also provides a computer program product, which includes a computer program. When the computer program is executed by a processor, it implements the steps of the duty cycle testing method of the millimeter wave radar as described above.

[0068] One or more technical solutions proposed in this application have at least the following technical effects:

[0069] 1) By obtaining the working frequency of the millimeter wave radar to be tested, and selecting the target test port based on the frequency, it can be ensured that the test process matches the actual working environment of the radar. Avoiding the deviation of test results caused by selecting the wrong port or the frequency not matching, thereby improving the accuracy and reliability of the test. By time domain scanning of the target test port, the time domain signal of the radar can be accurately obtained, which provides basic data for further signal processing, so that the performance of the radar in actual operation can be better understood. By performing first abstract processing on the time domain signal, the complexity of the signal is simplified, the core features of the signal are extracted, and the initial high-low level curve is obtained. Thus, the noise is removed and the important periodic characteristics are retained, and the processing strategy is determined according to the type of the time domain signal. Different analysis methods can be used for different signal characteristics, which can more accurately adapt to various radar signal modes, further improving the flexibility and accuracy of the test. Different signal types may involve different duty cycle characteristics, so this way of dynamically adjusting the processing strategy can effectively improve the test efficiency and accuracy, so as to obtain the duty cycle of the millimeter wave radar to be tested. Compared with traditional mobile communication and short distance communication, the duty cycle test of the application is relatively simple, which improves the efficiency and accuracy of the duty cycle test.

[0070] 2) By obtaining the first determination threshold of the rising edge and the falling edge, it is helpful to accurately divide the high-low level state of the time domain signal. The first abstract processing is performed on the time domain signal, and all signal data at all time points are traversed, so that the change trend of the signal can be captured as a whole. By analyzing the signal strength at each time point, the strength change of the signal can be more comprehensively understood, which is crucial for subsequent processing and analysis. When the signal strength is greater than the first determination threshold, the signal is determined to be in a high level state and marked as a first constant value; when the signal strength is less than the threshold, the signal is determined to be in a low level state and marked as a second constant value. Thus, the time domain signal curve is abstracted into a high-low level curve of 0 and 1, ensuring the consistency and reliability of the signal state judgment. By combining the high level state, the first constant value, the low level state and the second constant value, the initial high-low level curve corresponding to the time domain signal can be accurately obtained. This high-low level curve is the basis of time domain signal analysis, which provides a clear signal characteristic representation for subsequent signal processing, feature extraction and duty cycle calculation. The curve can accurately reflect the high-low level distribution of the signal, which is helpful for subsequent signal feature analysis and parameter calculation.

[0071] 3) Through multi-level abstract processing, key signal information, such as period and frequency variations, can be effectively extracted, avoiding noise interference and improving processing accuracy. The second abstract processing, by closing the time threshold, helps remove invalid or interfering signals, ensuring a clearer reference high and low level curve. By determining whether to perform the third abstract processing, the processing strategy becomes more flexible, allowing the decision to further refine the signal analysis based on actual conditions. Through staged abstract processing, the signal analysis quality can be gradually improved at each step, ultimately determining the accurate target period interval, facilitating subsequent frequency analysis or other time domain feature extraction. BRIEF DESCRIPTION OF THE DRAWINGS

[0072] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0073] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0074] Figure 1 A flowchart illustrating a first embodiment of a method for testing the duty cycle of a millimeter-wave radar according to the present invention;

[0075] Figure 2 A schematic diagram of a flow chart for performing time domain scanning on a millimeter-wave radar to be tested, provided in accordance with an embodiment of a method for testing a duty cycle of a millimeter-wave radar of the present application;

[0076] Figure 3 A flow chart illustrating a second embodiment of a method for testing the duty cycle of a millimeter-wave radar according to the present invention;

[0077] Figure 4 A flowchart illustrating a third embodiment of a method for testing the duty cycle of a millimeter-wave radar according to the present invention;

[0078] Figure 5 A schematic diagram of a simplified flow chart of an embodiment of a method for testing the duty cycle of a millimeter-wave radar according to the present application;

[0079] Figure 6 This is a schematic diagram of the module structure of the duty cycle test device of the millimeter wave radar according to an embodiment of the present application;

[0080] Figure 7 This is a schematic diagram of the device structure of the hardware operating environment involved in the duty cycle testing method of the millimeter wave radar in the embodiment of the present application.

[0081] The purpose, features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0082] It should be understood that the specific embodiments described herein are merely used to explain the technical solutions of the present application and are not intended to limit the present application.

[0083] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0084] The main solution of the embodiment of the present application is: obtaining the operating frequency of the millimeter-wave radar to be tested; selecting a target test port according to the operating frequency; performing a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal; performing a first abstract processing on the time domain signal to obtain an initial high and low level curve corresponding to the time domain signal; the first abstract processing is based on marking the time domain signal as a first constant value and a second constant value to obtain the initial high and low level curve; determining a corresponding processing strategy according to different signal types of the time domain signal; wherein the signal type includes a frequency modulated continuous wave type or a non-frequency modulated continuous wave type; according to The processing strategy and the initial high and low level curves obtain a target period interval; wherein, when the signal type is a frequency modulated continuous wave type, the processing strategy is determined to perform a second abstract processing and a third abstract processing on the initial high and low level curves; the second abstract processing is to obtain a reference high and low level curve based on the off time threshold of the linear frequency modulation signal; the third abstract processing is to obtain a target high and low level curve based on all rising edges and falling edges in the reference high and low level curves; the target period interval is obtained through the target high and low level curves; the duty cycle of the millimeter wave radar to be tested is calculated according to the target period interval to complete the duty cycle test of the millimeter wave radar to be tested.

[0085] Since existing technologies mainly calculate the duty cycle by measuring the pulse width and pulse period of the radar transmission signal, the traditional measurement method requires multiple adjustments to the equipment parameters, and the measurement process is relatively complicated and time-consuming.

[0086] This application provides a solution and develops a new testing method. Compared with traditional mobile communications and short-range communications, the duty cycle test of this application is simpler and improves the efficiency and accuracy of the duty cycle test.

[0087] It should be noted that the execution subject of this embodiment can be a computing service device with data processing, network communication, and program execution functions, such as a tablet computer, personal computer, mobile phone, etc., or an electronic device capable of implementing the above functions, or a duty cycle test for a millimeter-wave radar. This embodiment and the following embodiments are described below using the duty cycle test of a millimeter-wave radar as an example.

[0088] Based on this, the embodiment of the present application provides a method for testing the duty cycle of a millimeter wave radar. Figure 1 , Figure 1 This is a flow chart of the first embodiment of the duty cycle testing method for millimeter-wave radar of the present application.

[0089] In this embodiment, the millimeter wave radar duty cycle test method includes steps S10 to S70:

[0090] Step S10: Obtain the operating frequency of the millimeter-wave radar to be tested.

[0091] It's important to note that the operating frequency of the millimeter-wave radar under test can be directly detected, for example, by using a spectrum analyzer to measure the frequency of the radar's transmitted signal. Connecting the spectrum analyzer to the radar's output port analyzes its spectrum to determine the actual operating frequency. If the operating frequency of the millimeter-wave radar under test varies, different test ports can be selected to maximize the spectrum analyzer's capabilities and obtain reliable test data.

[0092] In a specific implementation, this embodiment mainly uses a spectrum analyzer to measure the duty cycle test of the millimeter wave radar.

[0093] Step S20: selecting a target test port according to the operating frequency.

[0094] It should be noted that in RF test equipment such as spectrum analyzers, IF Input (Intermediate Frequency Input) and RF Input (Radio Frequency Input) refer to different types of input ports for receiving signals. Different test ports can be selected when the operating frequency is different. When the operating frequency of the device under test does not exceed 40GHz, it is generally recommended to use RF Input for testing because it can directly process signals in this frequency range and is relatively simple to operate. If the operating frequency of the millimeter-wave radar to be tested is higher than 40GHz, it is recommended to use IF Input because the high-frequency signal must first be converted into an intermediate-frequency signal for subsequent processing and analysis.

[0095] For example, if the millimeter-wave radar under test operates at a frequency greater than 40 GHz, the instrument's IF Input port is used for testing. Otherwise, the RF Input port is used. The IF Input port and RF Input port are each suitable for signal processing in different frequency ranges. For example, if the operating frequency is 50 GHz, the target test port is the spectrum analyzer's IF Input port.

[0096] Step S30: performing a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal.

[0097] In a specific implementation, after determining the target test port, the target test port navigated by the frequency meter can be used to perform a duty cycle test on the millimeter-wave radar to be tested. The duty cycle test first involves performing a time domain scan on the millimeter-wave radar to be tested to obtain a time domain signal.

[0098] It should be noted that the time domain scan includes pre-scan and final scan. Specifically, whether to perform a pre-scan can be determined based on the inherent parameters of the millimeter-wave radar to be tested. The pre-scan (if any) and final scan are performed based on the determined results to finally obtain the time domain signal.

[0099] In a feasible implementation, step S30 may include steps A11 to A14:

[0100] Step A11: performing a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain the declared center frequency of the millimeter-wave radar to be tested;

[0101] It should be noted that the millimeter-wave radar under test can be scanned in the time domain through the target test port, and the declared center frequency of the millimeter-wave radar under test can be obtained at the same time. The declared center frequency is an inherent parameter of the millimeter-wave radar under test, indicating the center frequency at which the millimeter-wave radar under test (EUT) is expected to operate or the center frequency point that needs to be focused on during spectrum measurement. The declared center frequency can be 24 GHz, 60 GHz, 77 GHz, etc., and this embodiment does not impose any restrictions on this.

[0102] Step A12: When the declared center frequency is not used, determining whether the set center frequency is automatically selected;

[0103] In the specific implementation, it can be determined whether to measure according to the center frequency declared by the equipment manufacturer or the test specification. Specifically, the user's needs can be obtained. If the user's needs are to measure using the declared center frequency, the pre-scan is skipped and the final scan is performed directly on the millimeter-wave radar to obtain the time domain signal. <opermodesinfo> <list opermodename="xxx">The final sweep is performed directly using the center frequency value @CenterFreq_GHz. The center frequency can be a specific frequency value read from the test script. Node path located in the XML configuration file.

[0104] If the declared center frequency is not used, it is possible to further determine whether the center frequency is automatically selected, and then perform a pre-scan based on the result of the determination.

[0105] Step A13: When the center frequency is set to automatic selection, pre-scan the millimeter-wave radar to be tested according to the pre-scan setting rule, and obtain the frequency point with the maximum level during the pre-scan process;

[0106] In a specific implementation, if the center frequency (CenterFreq_GHz) is set to automatic selection, the pre-scan setting rule can be obtained. The pre-scan setting rule is a rule set in advance by a script, that is, <group title=" Pre Sweep(Frequency domain)" ...>, specifically including the scanning start frequency, end frequency, number of scanning points, scanning time, detection method, resolution bandwidth, etc., so as to perform a pre-scan spectrum scan on the millimeter-wave radar to be tested according to the pre-scan setting rules to obtain the frequency point where the Peak Vaule is located, that is, the frequency point where the maximum level is located.

[0107] In the specific implementation, if the frequency center is not set to automatic selection but a numerical value, the pre-scan is skipped and the frequency is set to the value specified in the script configuration.<CenterFreq_GHz> The value is used as the center frequency and the final sweep is performed directly.

[0108] Step A14: Acquire a final sweep setting rule, and perform a final sweep at the frequency point where the maximum level is located according to the final sweep setting rule to obtain a time domain signal.

[0109] In specific implementation, the final scan setting rules can be configured in advance through scripts. <group title="Final" sweep(time domain)"...>Thus, the terminal scanning is performed on the frequency point where the maximum level is located by setting the terminal scanning rule, and the time domain signal is obtained.

[0110] It should be noted that if the frequency center is a numerical value, the terminal scanning can be directly performed by using the set numerical value as the center frequency, and the time domain signal is obtained.

[0111] It should be noted that when the terminal scanning is performed, the number of scanning points can be determined by judging <ifusetimeresoluation>Content confirmed, <ifusetimeresoluation>Is a Boolean parameter that determines whether to calculate the number of scan points based on the time resolution.

[0112] if <ifusetimeresoluation>If it is 1, this parameter indicates the total scan time in milliseconds (ms). The number of scan points can be dynamically calculated based on the time resolution. The number of scan points =<SwpTime_ms> / <TimeResoluation_ms> +1, SwpTime_ms refers to the scan time in milliseconds, and Time Resolution refers to the time resolution in milliseconds.

[0113] if <ifusetimeresoluation>If it is 1, this parameter represents the time resolution of each scanning point, that is, the time interval between each sampling, and the unit is also milliseconds (ms).

[0114] like <ifusetimeresoluation>0 means to use the predefined scanning points directly <swpt>For example, if <swpt>If set to 50, 50 points will be collected regardless of the time resolution.

[0115] In a specific implementation, after performing the final scan, the time domain signal can be directly obtained by using the spectrum analyzer related instructions. Figure 2 As shown, Figure 2 This is a flow chart of time domain scanning of the millimeter-wave radar under test. When performing the time domain scan, first determine whether the declared center frequency is used. If so, perform a final scan on the millimeter-wave radar under test directly to obtain the time domain signal. If the declared center frequency is not used, determine the center frequency content set by the script. If it is a numerical value, perform a final scan on the millimeter-wave radar under test directly to obtain the time domain signal. If it is an automatically set value, perform a pre-scan on the millimeter-wave radar under test, and perform a final scan on the millimeter-wave radar under test based on the result of the pre-scan to obtain the time domain signal.

[0116] Step S40: performing a first abstraction process on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal.

[0117] It should be noted that the first abstract processing is to perform a digital processing on the time domain signal, and the initial high-low level curve is the high-low level curve obtained after performing a digital processing on the time domain signal.

[0118] Step S50: determining a processing strategy according to the signal type of the time domain signal.

[0119] In a specific implementation, the signal type of the time domain signal may include that the time domain signal is a frequency modulated continuous wave type or that the time domain signal is not a frequency modulated continuous wave type. Different signal types correspond to different processing strategies.

[0120] For example, if the signal type of the time domain signal is FMCW (Frequency Modulated Continuous Wave) type, it is necessary to perform secondary and tertiary abstraction processing on the initial high and low level curves.

[0121] In a feasible implementation, step S50 may include steps A21 to A23:

[0122] Step A21: Obtaining the signal type of the time domain signal;

[0123] Step A22: When the signal type is a frequency modulated continuous wave type, determining a processing strategy of performing a second abstract processing and a third abstract processing on the initial high and low level curves;

[0124] In the specific implementation, due to the characteristics of the FMCW radar time domain signal, the acquisition of its maximum period is relatively complex. Therefore, it is possible to first determine whether the signal type of the time domain signal of the millimeter wave radar to be tested is FMCW radar. Specifically, it can be determined<Modulation_Enum> Content, which represents the enumeration parameter or field of the modulation type. If it is FMCW, secondary and tertiary data abstraction is required. Therefore, the processing strategy is to perform secondary and tertiary abstraction processing on the initial high and low level curves. The second abstraction processing is to set the Chirp frame period to 1, and the third abstraction processing is to set the small Chirp frame period to zero.

[0125] Step A23: When the signal type is a non-frequency modulated continuous wave type, a processing strategy is determined to determine a target cycle interval based on the initial high and low level curves.

[0126] In a specific implementation, if the signal type is non-FMCW, that is, the signal type is not FMCW, the maximum cycle interval is directly sought. Therefore, the processing strategy is to determine the target cycle interval based on the initial high and low level curves, and the target cycle interval is the maximum cycle interval.

[0127] Step S60: Obtaining a target cycle interval according to the processing strategy and the initial high and low level curves.

[0128] It should be noted that after determining a specific processing strategy, the initial high and low levels can be processed in a certain manner using the processing strategy to obtain a target cycle interval.

[0129] In a specific implementation, the target cycle interval is the maximum cycle interval. Specifically, the initial high and low level curves or the final high and low level intervals obtained by processing the initial high and low level curves through a processing strategy can be traversed to traverse the time difference between adjacent rising edges, find the maximum value, record it as the cycle T, and record the coordinate values ​​T_start and T_stop of the start and end time of the interval, and record the coordinate value T_down of the falling edge, and mark T_start (Marker1), T_down (Marker2) and T_stop (Marker3) on the spectrum analyzer.

[0130] Step S70: Calculate the duty cycle of the millimeter-wave radar to be tested according to the target period interval to complete the duty cycle test of the millimeter-wave radar to be tested.

[0131] It should be noted that the duty cycle of the millimeter-wave radar to be tested can be calculated within the target period interval to obtain the final test result.

[0132] In a feasible implementation, step S70 may include steps A31 to A33:

[0133] Step A31: obtaining the number of cycles and the start time coordinate and end time coordinate values ​​within the target cycle interval according to the target cycle interval;

[0134] It should be noted that since the period T and the start and end time coordinates within the interval are recorded when searching for the target period interval, the period number T, the interval start time coordinate T_start, and the interval end time coordinate T_stop can be obtained according to the target period interval.

[0135] Step A32: within the time interval between the starting time coordinate and the ending time coordinate, record the time differences between all adjacent falling edges and rising edges, and accumulate the time differences to obtain an accumulated time difference;

[0136] In a specific implementation, within the time interval of T_start and T_stop, the time differences between all adjacent falling edges and rising edges (note the relationship between them) can be recorded and accumulated based on the abstract data, thereby obtaining the accumulated time difference OffTime_total.

[0137] Step A33: Calculate the duty cycle of the millimeter-wave radar to be tested according to the number of cycles and the accumulated time difference to complete the duty cycle test of the millimeter-wave radar to be tested

[0138] It should be noted that the duty cycle of the millimeter-wave radar to be tested can be calculated based on the number of cycles T and the accumulated time difference Off Time_total, as shown in the following formula:

[0139]

[0140] in, is the duty cycle, T is the number of cycles, is the accumulated time difference.

[0141] The embodiment provides a duty cycle test method of a millimeter wave radar. The working frequency of the millimeter wave radar to be tested is acquired, and a target test port is selected based on the frequency, so that the test process can be matched with the actual working environment of the radar. Deviation of a test result caused by selection of a wrong port or inconsistency of a frequency is avoided, so that the accuracy and reliability of the test are improved. The time domain signal of the radar can be accurately acquired through time domain scanning of the target test port. The time domain signal provides basic data for further signal processing, so that the performance of the radar in actual operation can be better understood. Through first abstract processing of the time domain signal, the complexity of the signal is simplified, core features of the signal are extracted, and an initial high-low level curve is obtained. Thus, noise is removed, and important periodic features are retained. A processing strategy is determined according to the type of the time domain signal. Different analysis methods can be used for different signal features. In this way, various radar signal modes can be more accurately adapted, and the flexibility and accuracy of the test are further improved. Different signal types can involve different duty cycle features. Therefore, the dynamic adjustment of the processing strategy can effectively improve the test efficiency and accuracy, so that the duty cycle of the millimeter wave radar to be tested is obtained. Compared with traditional mobile communication and short distance communication, the duty cycle test of the application is relatively simple, and the efficiency and accuracy of the duty cycle test are improved.

[0142] Based on the first embodiment of the application, in the second embodiment of the application, the same or similar contents as the above-mentioned first embodiment can be referred to the above introduction, and the following will not be repeated. On this basis, please refer to Figure 3 , step S40 includes steps S401-S405:

[0143] Step S401: acquiring first determination thresholds of rising edges and falling edges.

[0144] It should be noted that the first determination thresholds of the rising edges and the falling edges can be obtained in advance. Specifically, the content of the script setting <RiseFallThreshold_dBm> can be set. RiseFallThreshold_dBm is a parameter for setting the determination threshold of the rising edge and the falling edge of the signal, and the unit is dBm (decibel milliwatt).

[0145] In a specific implementation, it can be judged whether the content of the script setting <RiseFallThreshold_dBm> is automatic or a numerical value. If it is Auto, the first determination thresholds of the rising edges and the falling edges are (Max Value + Min Value) / 2, where MaxValue and Min Value are the maximum value and the minimum value of the amplitude of the scanning curve, respectively.

[0146] If it is a numerical value, the first determination thresholds of the rising edges and the falling edges are the numerical value input by the user.

[0147] Step S402: performing a first abstract processing on the time domain signal, traversing the signal data at all time points on the time domain signal, and obtaining the signal strength corresponding to each time point.

[0148] In a specific implementation, the time domain signal can be subjected to a first abstract processing, specifically by traversing the signal data at all time points on the time domain signal. The time domain signal data is usually a series of values ​​with time as the horizontal axis and signal strength as the vertical axis. By traversing the signal data at all time points, for each time point t, the signal strength s(t) at time point t is obtained, thereby obtaining the signal strength s(t) corresponding to each time point.

[0149] Step S403: When the signal strength is greater than the first determination threshold, determine that the corresponding signal is in a high level state and mark it as a first constant value.

[0150] In a specific implementation, the signal strength may be compared with a first determination threshold. If the signal strength is greater than the first determination threshold, the signal is considered to be in a high level state and may be marked as a first constant value, which is 1.

[0151] Step S404: When the signal strength is less than the first determination threshold, determine that the corresponding signal is in a low level state and mark it as a second constant value.

[0152] In a specific implementation, when the signal strength is less than the first judgment threshold, the signal is considered to be in a low level state and marked as a second constant value, and the second constant value is 0. For the case where the signal strength is equal to the first judgment threshold, it can be defined as a high level or a low level according to actual application requirements.

[0153] In a specific implementation, for the processing of boundary conditions, when the signal changes from below the first judgment threshold to above the first judgment threshold from one time point to the next time point, this moment is recorded as a rising edge; when the signal changes from above the first judgment threshold to below the first judgment threshold, this moment is recorded as a falling edge.

[0154] Step S405: obtaining an initial high-low level curve corresponding to the time domain signal according to the high level state, the first constant value, the low level state, and the second constant value.

[0155] In a specific implementation, the original time domain signal is converted into a high and low level curve consisting of 0 and 1 by determining the high and low level states of the signal and the marked value, which facilitates further analysis of characteristics such as duty cycle and period.

[0156] This embodiment obtains first thresholds for rising and falling edges; performs a first abstraction process on the time domain signal, traverses the signal data at all time points on the time domain signal, and obtains the signal strength corresponding to each time point; when the signal strength is greater than the first threshold, determines the corresponding signal as being in a high-level state and marks it as a first constant value; when the signal strength is less than the first threshold, determines the corresponding signal as being in a low-level state and marks it as a second constant value; and obtains the initial high- and low-level curve corresponding to the time domain signal based on the high-level state, the first constant value, the low-level state, and the second constant value. Obtaining first thresholds for rising and falling edges facilitates accurate classification of the high and low-level states of the time domain signal. Performing the first abstraction process on the time domain signal and traversing the signal data at all time points allows for a holistic capture of the signal's changing trends. By analyzing the signal strength at each time point, a more comprehensive understanding of the signal's strength changes can be achieved, which is crucial for subsequent processing and analysis. When the signal strength is greater than the first threshold, the signal is determined to be in a high-level state and marked as the first constant value; when the signal strength is less than the threshold, the signal is determined to be in a low-level state and marked as the second constant value. The time domain signal curve is thus abstracted into high and low level curves of 0 and 1, ensuring the consistency and reliability of signal state judgment. By combining the high level state, the first constant value, the low level state, and the second constant value, the initial high and low level curves corresponding to the time domain signal can be accurately obtained. This high and low level curve is the basis for time domain signal analysis and provides a clear signal characteristic representation for subsequent signal processing, feature extraction, and duty cycle calculation. This curve can accurately reflect the high and low level distribution of the signal, which is helpful for subsequent signal feature analysis and parameter calculation.

[0157] Based on the first embodiment of the present application, in the third embodiment of the present application, the same or similar contents as those in the above embodiment 1 can be referred to the above introduction and will not be described in detail later. Figure 4 , step S60 includes steps S601 to S604:

[0158] Step S601: when the processing strategy is to perform the second abstract processing and the third abstract processing on the initial high and low level curves, obtaining a closing time threshold of a linear frequency modulation signal.

[0159] It should be noted that if the processing strategy is to perform secondary abstraction processing and tertiary abstraction processing on the initial high and low level curves, the off time threshold of the linear frequency modulation signal, that is, the determination threshold of the Off Time, can be obtained.

[0160] In a specific implementation, the closing time threshold can be determined by<OffTimeThreshold_ms> The OffTimeThreshold_ms parameter is used to set the Off Time threshold in the Chirp signal. The unit is milliseconds. The Off Time threshold can be set to a value or automatically. If it is set to Auto, the Off Time Threshold = <offtimefactor>* T_min, where T_min is the minimum Off Time in the primary abstract curve, and OffTimeFactor is a preset scaling factor (e.g., 1.2, 1.5, etc.) used to relax the minimum Off Time value to avoid false positives. If the Off Time Threshold is a numeric value, the Off Time value is directly derived from the user-entered value.

[0161] Step S602: performing a second abstraction process on the initial high-low level curve according to the closing time threshold to obtain a reference high-low level curve.

[0162] In a specific implementation, after determining the closing time threshold, the initial high and low level curves can be subjected to secondary abstraction processing according to the closing time threshold, thereby setting the Chirp frame period to unity and obtaining the high and low level curves after secondary abstraction processing, that is, the reference high and low level curves.

[0163] The secondary abstraction process is to abstract an abstract chirp frame period into a single high level according to the off-time threshold of the chirp signal, also known as the linear frequency modulated signal (LFM) (used to eliminate the chirp signal characteristics of FMCW modulation).

[0164] In a feasible implementation, step S602 may include steps B11 to B15:

[0165] Step B11: traversing the initial high and low level curves, querying adjacent falling edges and rising edges, and calculating a first time difference between adjacent falling edges and rising edges;

[0166] It should be noted that the data before the first falling edge and the data after the last rising edge in the initial high and low level curves are not processed. For the remaining falling edges and rising edges, you can traverse to query adjacent falling edges and rising edges. In this case, if the falling edge is before the rising edge, calculate the first time difference between the adjacent falling edges and rising edges.

[0167] Step B12: comparing the first time difference with the closing time threshold;

[0168] It is understandable that the first time difference may be compared with the closing time threshold to determine whether the specific interval is a high level or a low level.

[0169] Step B13: when the first time difference is less than the closing time threshold, marking the interval between adjacent falling edges and rising edges as a high level interval;

[0170] In a specific implementation, if the first time difference is less than the closing time threshold, it is considered that this period belongs to the same Chirp frame and should be marked as a high-level interval, and the interval between adjacent falling edges and rising edges is marked as a high-level interval.

[0171] Step B14: when the first time difference is greater than or equal to the closing time threshold, marking the interval between adjacent falling edges and rising edges as a low-level interval;

[0172] In a specific implementation, if the first time difference is greater than or equal to the off time threshold, it is considered to be a true off time, which means that the two segments before and after are different chirp frames, and the low level in the middle should be retained as a low level, that is, the interval between the adjacent falling edge and rising edge is marked as a low level interval.

[0173] Step B15: updating the initial high-low level curve according to the marked high-level interval and the low-level interval to obtain a reference high-low level curve.

[0174] The intervals in the initial high- and low-level curves can be updated by marking the high-level intervals and low-level intervals, thereby filtering out those short low-level intervals caused by noise or other interference, and abstracting the Chirp frame period into a single high level.

[0175] Step S603: Determine whether to perform third abstract processing on the reference high-low level curve.

[0176] In a specific implementation, after the secondary abstraction process is performed, it may be determined whether the tertiary abstraction process is required based on the reference high and low level curves.

[0177] In a feasible implementation, step S603 may include steps B21 to B25:

[0178] Step B21: traversing the reference high and low level curves to obtain a linear frequency modulation period in the reference high and low level curves;

[0179] It should be noted that the data before the first rising edge and after the last falling edge of the reference high- and low-level curve after secondary abstraction are not processed. The remaining rising and falling edge periods of the reference high- and low-level curves can be traversed to obtain the linear frequency modulation period, i.e., the chirp frame period. Specifically, for each pair of adjacent rising and falling edges, the time difference between them can be calculated. This time difference is a chirp frame period.

[0180] Step B22: calculating the duty cycle data of the linear frequency modulation period under the linear frequency modulation period;

[0181] In a specific implementation, the duty cycle data of the linear frequency modulation period can be calculated in each Chirp frame period as follows:

[0182] Linear frequency modulation cycle duty cycle = On Time / Period × 100%

[0183] Among them, On Time is the duration of the high level, and Period is the total time from the current rising edge to the next rising edge (that is, a complete Chirp frame period). The above formula can be used to calculate the duty cycle data of multiple linear frequency modulation periods.

[0184] Step B23: obtaining a maximum duty cycle of a linear frequency modulation period and a minimum duty cycle of a linear frequency modulation period based on the linear frequency modulation period duty cycle data;

[0185] In a specific implementation, the maximum duty cycle of the linear frequency modulation cycle DutyCycle_Max and the minimum duty cycle of the linear frequency modulation cycle DutyCycle_Min in the linear frequency modulation cycle duty cycle data may be obtained.

[0186] Step B24: when the difference between the maximum duty cycle of the linear frequency modulation period and the minimum duty cycle of the linear frequency modulation period is less than a preset threshold, determining not to perform the third abstraction processing on the reference high and low level curve;

[0187] The preset threshold value may be set to 1%, or may be set to other values, which is not limited in this embodiment.

[0188] If the difference between DutyCycle_Max and DutyCycle_Min is less than 1%, it is considered that all chirp frame periods are basically the same, and there is no need to set the small chirp frame period to zero (that is, three-level abstraction). At this time, the target cycle interval can be directly found through the reference high and low level curves after the second level abstraction.

[0189] Step B25: When the difference between the maximum duty cycle of the linear frequency modulation period and the minimum duty cycle of the linear frequency modulation period is greater than or equal to a preset threshold, determine to perform a third abstraction process on the reference high and low level curve.

[0190] It should be noted that if the difference between DutyCycle_Max and DutyCycle_Min is greater than or equal to 1%, it is considered that there are significantly different Chirp frame periods, and three abstract processings are required to optimize the results. Therefore, it is determined to perform the third abstract processing on the reference high and low level curves.

[0191] Step S604: when determining to perform the third abstraction processing on the reference high-low level curve, obtaining a target cycle interval according to the result of the third abstraction processing.

[0192] It should be noted that when determining to perform the third abstract processing on the reference high and low levels, the target cycle interval, ie, the maximum cycle interval, can be obtained by performing the third abstract processing on the reference high and low levels and according to the result of the third abstract processing.

[0193] In a feasible implementation, step S604 may include steps B31 to B37:

[0194] Step B31: when determining to perform the third abstract processing on the reference high-low level curve, traverse the reference high-low level curve to obtain all rising edges and falling edges in the reference high-low level curve, and calculate a second time difference between adjacent rising edges and falling edges;

[0195] It should be noted that when determining to perform the third abstract processing on the reference high and low level curves, the reference high and low level curves can be traversed. The data before the first rising edge and the data after the last falling edge in the reference high and low level curves are not processed. The remaining rising edges and falling edges are traversed to obtain the second time difference between adjacent rising edges and falling edges.

[0196] Step B32: Obtaining a second time difference maximum value and a second time difference minimum value according to the second time difference;

[0197] In a specific implementation, a maximum second time difference value On Time_Max and a minimum second time difference value On Time_Min among all the second time differences may be obtained.

[0198] Step B33: Calculate the average of the second time difference maximum value and the second time difference minimum value;

[0199] It should be noted that the average value can be calculated based on On Time_Max and On Time_Min.

[0200] Step B34: when the average value is greater than the on-time threshold, marking the interval between adjacent falling edges and rising edges as a high-level interval;

[0201] Step B35: When the average value is less than or equal to the on-time threshold, marking the interval between adjacent falling edges and rising edges as a low-level interval;

[0202] In a specific implementation, the on-time threshold can be manually set based on the specific application scenario or automatically calculated using an algorithm. If the average value is greater than the on-time threshold, the interval between adjacent falling and rising edges is marked as a high-level interval. If the average value is less than or equal to the on-time threshold, the interval between adjacent falling and rising edges is marked as a low-level interval.

[0203] Step B36: obtaining a result of a third abstraction process according to the marked high-level interval and the marked low-level interval, and updating the reference high- and low-level curve according to the result of the third abstraction process to obtain a target high- and low-level curve;

[0204] In a specific implementation, the marked high-level interval and low-level interval can be used as the result of the third abstract processing, and the reference high-level and low-level curves can be updated by the marked high-level and low-level intervals, so that the smaller Chirp frame period is set to zero to obtain the target high-level and low-level curves.

[0205] Step B37: Obtain a target cycle interval through the target high and low level curves.

[0206] It should be noted that the target high and low level curves can be traversed to traverse the time differences between adjacent rising edges to find the maximum value, which is recorded as the period T, thereby obtaining the target period interval.

[0207] In this embodiment, when the processing strategy involves performing the second and third abstract processing on the initial high- and low-level curves, the following steps are performed: obtaining an off-time threshold for the linear frequency modulation signal; performing the second abstract processing on the initial high- and low-level curves based on the off-time threshold to obtain a reference high- and low-level curve; determining whether to perform the third abstract processing on the reference high- and low-level curves; and, if the decision is made to perform the third abstract processing on the reference high- and low-level curves, obtaining a target cycle interval based on the results of the third abstract processing. Through step-by-step abstraction and processing, valuable signal information is extracted from the original high- and low-level curves, optimized, and ultimately obtained as a target cycle interval.

[0208] For example, to help understand the implementation process of the millimeter wave radar duty cycle test method obtained by combining this embodiment with the above embodiment 1, please refer to Figure 5 , Figure 5 A simplified flow chart of a millimeter-wave radar duty cycle test method is provided. Specifically, the millimeter-wave radar to be tested is scanned in the time domain, the time domain signal is digitized for the first time (first abstraction), and the EUT adjustment type is determined. If it is FMCW, the Off Time threshold is obtained and the Chirp frame period is reset to 1 using the Off Time threshold (second abstraction). The duty cycle difference is then determined. If it is greater than or equal to 1%, the small Chirp frame period is reset to zero (nth abstraction). If it is less than 1%, the maximum period interval is searched to calculate the duty cycle. If the EUT adjustment type is Others, the maximum period interval is searched to calculate the duty cycle.

[0209] It should be noted that the above examples are only used for understanding the present application and do not constitute a limitation on the duty cycle test method of the millimeter wave radar of the present application, and more forms of simple transformation based on this technical concept are within the protection scope of the present application.

[0210] The present application also provides a duty cycle test device for a millimeter wave radar, please refer to Figure 6 , the duty cycle test device for a millimeter wave radar comprises:

[0211] The acquisition module 10 is used for acquiring the working frequency of the millimeter wave radar to be tested.

[0212] The selection module 20 is used for selecting a target test port according to the working frequency.

[0213] The time domain scanning module 30 is used for performing time domain scanning on the millimeter wave radar to be tested through the target test port to obtain a time domain signal.

[0214] The processing module 40 is used for performing first abstraction processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal.

[0215] The determination module 50 is used for determining a processing strategy according to the signal type of the time domain signal.

[0216] The acquisition module 10 is also used for obtaining a target period interval according to the processing strategy and the initial high-low level curve.

[0217] The calculation module 60 is used for calculating the duty cycle of the millimeter wave radar to be tested according to the target period interval, so as to complete the duty cycle test of the millimeter wave radar to be tested.

[0218] The duty cycle test device for a millimeter wave radar provided by the present application adopts the duty cycle test method for a millimeter wave radar in the above embodiments, and can solve the technical problem that the conventional measurement method needs to adjust the equipment parameters multiple times, the measurement process is relatively complex, and the time consumption is relatively long. Compared with the prior art, the beneficial effects of the duty cycle test device for a millimeter wave radar provided by the present application are the same as those of the duty cycle test method for a millimeter wave radar provided by the above embodiments, and the other technical features in the duty cycle test device for a millimeter wave radar are the same as those disclosed in the above embodiment method, which will not be repeated here.

[0219] The present application provides a duty cycle test device for a millimeter wave radar, which comprises at least one processor and a memory in communication connection with the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the duty cycle test method for a millimeter wave radar in the above embodiment one.

[0220] Reference below Figure 7 , which shows a schematic diagram of the structure of a duty cycle test device suitable for implementing the millimeter-wave radar in the embodiments of the present application. The duty cycle test device for the millimeter-wave radar in the embodiments of the present application may include, but is not limited to, mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions), PMPs (Portable Media Players), in-vehicle terminals (such as in-vehicle navigation terminals), and fixed terminals such as digital TVs and desktop computers. Figure 7 The duty cycle test equipment of the millimeter-wave radar shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0221] like Figure 7 As shown, the millimeter-wave radar duty cycle test equipment may include a processing device 1001 (e.g., a central processing unit, graphics processing unit, etc.), which can perform various appropriate actions and processes based on programs stored in ROM (Read Only Memory) 1002 or programs loaded from storage device 1003 into RAM (Random Access Memory) 1004. RAM 1004 also stores various programs and data required for the operation of the millimeter-wave radar duty cycle test equipment. Processing device 1001, ROM 1002, and RAM 1004 are interconnected via bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Typically, the following systems can be connected to the I / O interface 1006: input devices 1007, such as a touch screen, touchpad, keyboard, mouse, image sensor, microphone, accelerometer, and gyroscope; output devices 1008, such as an LCD (Liquid Crystal Display), speaker, and vibrator; storage devices 1003, such as a magnetic tape and hard disk; and communication devices 1009. Communication devices 1009 can allow the millimeter-wave radar duty cycle test equipment to communicate wirelessly or wired with other devices to exchange data. While the figure shows a millimeter-wave radar duty cycle test equipment with various systems, it should be understood that not all of the illustrated systems are required to be implemented or present. More or fewer systems may alternatively be implemented or present.

[0222] In particular, according to the embodiments disclosed in the present application, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, the embodiments disclosed in the present application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program comprising program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network via a communication device, or installed from a storage device 1003, or installed from a ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present application are executed.

[0223] The millimeter-wave radar duty cycle test device provided in this application utilizes the millimeter-wave radar duty cycle test method described in the aforementioned embodiment, resolving the technical issues associated with traditional measurement methods, which require multiple adjustments to device parameters, resulting in a complex and time-consuming measurement process. Compared to the prior art, the millimeter-wave radar duty cycle test device provided in this application achieves the same beneficial effects as the millimeter-wave radar duty cycle test method described in the aforementioned embodiment. Other technical features of the millimeter-wave radar duty cycle test device are the same as those disclosed in the aforementioned embodiment and are not further elaborated upon here.

[0224] It should be understood that the various parts disclosed in this application can be implemented using hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials, or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0225] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

[0226] The present application provides a computer-readable storage medium having computer-readable program instructions (i.e., a computer program) stored thereon, and the computer-readable program instructions are used to execute the duty cycle testing method of the millimeter-wave radar in the above-mentioned embodiment.

[0227] The computer-readable storage medium provided herein may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems, or devices, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to, an electrical connection having one or more wires, a portable computer disk, a hard disk, RAM (Random Access Memory), ROM (Read Only Memory), EPROM (Erasable Programmable Read Only Memory or Flash memory), optical fiber, CD-ROM (CD-Read Only Memory), optical storage device, magnetic storage device, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, system, or device. The program code contained on the computer-readable storage medium may be transmitted using any suitable medium, including, but not limited to, wires, optical cables, RF (Radio Frequency), etc., or any suitable combination thereof.

[0228] The computer-readable storage medium may be included in the duty cycle test device of the millimeter-wave radar; or it may exist independently without being assembled into the duty cycle test device of the millimeter-wave radar.

[0229] The computer-readable storage medium carries one or more programs. When the one or more programs are executed by the millimeter-wave radar duty cycle test device, the millimeter-wave radar duty cycle test device: obtains the operating frequency of the millimeter-wave radar to be tested;

[0230] Select a target test port according to the operating frequency; perform a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal; perform a first abstract processing on the time domain signal to obtain an initial high and low level curve corresponding to the time domain signal; the first abstract processing is based on marking the time domain signal as a first constant value and a second constant value on the rising edge and the falling edge to obtain the initial high and low level curve; determine the corresponding processing strategy according to the different signal types of the time domain signal; wherein, the signal type includes a frequency modulated continuous wave type or a non-frequency modulated continuous wave type; according to the processing strategy and the initial high and low level The target periodic interval is obtained by curve; wherein, when the signal type is a frequency modulated continuous wave type, a processing strategy is determined to perform a second abstract processing and a third abstract processing on the initial high and low level curves; the second abstract processing is to obtain a reference high and low level curve based on the off time threshold of the linear frequency modulation signal; the third abstract processing is to obtain a target high and low level curve based on all rising edges and falling edges in the reference high and low level curves; the target periodic interval is obtained through the target high and low level curves; the duty cycle of the millimeter-wave radar to be tested is calculated according to the target periodic interval to complete the duty cycle test of the millimeter-wave radar to be tested.

[0231] The computer program code for performing the operations of the present application may be written in one or more programming languages, or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, as well as conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as a stand-alone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer via any type of network, including a LAN (Local Area Network) or a WAN (Wide Area Network), or may be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0232] The flow and block diagrams in the drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flow and block diagrams can represent a module, a segment, or a portion of code, which comprises one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions noted in the blocks can occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and / or flowchart illustrations, and combinations thereof, can be implemented by a dedicated hardware-based system that performs the specified functions or operations, or combinations of hardware and software.

[0233] The modules involved in the embodiments of the present application can be implemented in the form of software or in the form of hardware. In some cases, the name of the module does not constitute a limitation on the unit itself.

[0234] The readable storage medium provided by the present application is a computer readable storage medium, which stores computer readable program instructions (i.e. computer programs) for executing the duty cycle test method of the millimeter wave radar, and can solve the technical problem that the conventional measurement method needs to adjust the device parameters multiple times, the measurement process is relatively complex, and the time consumption is relatively long. Compared with the prior art, the beneficial effects of the computer readable storage medium provided by the present application are the same as those of the duty cycle test method of the millimeter wave radar provided by the above-mentioned embodiments, and will not be repeated here.

[0235] The present application also provides a computer program product comprising a computer program, which, when executed by a processor, implements the steps of the duty cycle test method of the millimeter wave radar as described above.

[0236] The computer program product provided by the present application can solve the technical problem that the conventional measurement method needs to adjust the device parameters multiple times, the measurement process is relatively complex, and the time consumption is relatively long. Compared with the prior art, the beneficial effects of the computer program product provided by the present application are the same as those of the duty cycle test method of the millimeter wave radar provided by the above-mentioned embodiments, and will not be repeated here.

[0237] The above only describes some embodiments of the present application, and does not limit the patent scope of the present application, and any equivalent structural transformation made by using the content of the present application specification and drawings, or direct / indirect application in other related technical fields is included in the patent protection scope of the present application.< / offtimefactor> < / swpt> < / swpt> < / ifusetimeresoluation> < / ifusetimeresoluation> < / ifusetimeresoluation> < / ifusetimeresoluation> < / ifusetimeresoluation> < / group> < / group> < / list> < / opermodesinfo>

Claims

1. A method for testing the duty cycle of a millimeter wave radar, characterized in that: The duty cycle test method of the millimeter wave radar includes: Get the operating frequency of the millimeter-wave radar to be tested; selecting a target test port according to the operating frequency; Performing a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal; Performing a first abstract processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal; the first abstract processing marks the time domain signal as a first constant value and a second constant value based on a rising edge and a falling edge to obtain the initial high-low level curve; Determining corresponding processing strategies according to different signal types of the time domain signal; wherein the signal type includes a frequency modulated continuous wave type or a non-frequency modulated continuous wave type; A target period interval is obtained according to the processing strategy and the initial high and low level curves; wherein, when the signal type is a frequency modulated continuous wave type, the processing strategy is determined to be performing a second abstract processing and a third abstract processing on the initial high and low level curves; the second abstract processing is to obtain a reference high and low level curve based on an off time threshold of a linear frequency modulation signal; the third abstract processing is to obtain a target high and low level curve based on all rising edges and falling edges in the reference high and low level curves; and the target period interval is obtained through the target high and low level curves; The duty cycle of the millimeter-wave radar to be tested is calculated according to the target period interval to complete the duty cycle test of the millimeter-wave radar to be tested.

2. The method according to claim 1, wherein The step of performing a first abstract processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal comprises: Obtaining first determination thresholds for rising and falling edges; Performing a first abstract processing on the time domain signal, traversing signal data at all time points on the time domain signal, and obtaining a signal strength corresponding to each time point; When the signal strength is greater than the first determination threshold, determining that the corresponding signal is in a high level state and marking it as a first constant value; When the signal strength is less than the first determination threshold, determining that the corresponding signal is in a low level state and marking it as a second constant value; An initial high-low level curve corresponding to the time domain signal is obtained according to the high level state, the first constant value, the low level state, and the second constant value.

3. The method according to claim 1, wherein The step of determining a processing strategy according to the signal type of the time domain signal comprises: Obtaining a signal type of the time domain signal; When the signal type is a frequency modulated continuous wave type, determining a processing strategy as performing a second abstract processing and a third abstract processing on the initial high and low level curves; When the signal type is a non-frequency modulated continuous wave type, the processing strategy is determined to determine the target cycle interval based on the initial high and low level curves.

4. The method according to claim 1, wherein Obtaining a target cycle interval according to the processing strategy and the initial high and low level curves includes: When the processing strategy is to perform the second abstract processing and the third abstract processing on the initial high and low level curves, obtaining a closing time threshold of the linear frequency modulation signal; Performing a second abstraction process on the initial high-low level curve according to the closing time threshold to obtain a reference high-low level curve; determining whether to perform a third abstraction process on the reference high and low level curves; When determining to perform the third abstract processing on the reference high-low level curve, the target cycle interval is obtained according to the result of the third abstract processing.

5. The method according to claim 4, wherein The step of performing a second abstraction process on the initial high-low level curve according to the closing time threshold to obtain a reference high-low level curve includes: Traversing the initial high and low level curves, querying adjacent falling edges and rising edges, and calculating a first time difference between adjacent falling edges and rising edges; comparing the first time difference with the closing time threshold; When the first time difference is less than the closing time threshold, marking the interval between adjacent falling edges and rising edges as a high level interval; When the first time difference is greater than or equal to the closing time threshold, marking the interval between adjacent falling edges and rising edges as a low-level interval; The initial high-low level curve is updated according to the marked high level interval and the low level interval to obtain a reference high-low level curve.

6. The method according to claim 4, wherein The step of determining whether to perform the third abstract processing on the reference high and low level curves comprises: Traversing the reference high and low level curves to obtain a linear frequency modulation period in the reference high and low level curves; Calculating the duty cycle data of the linear frequency modulation period in each linear frequency modulation period; Obtaining a maximum duty cycle of a linear frequency modulation period and a minimum duty cycle of a linear frequency modulation period based on the linear frequency modulation period duty cycle data; When the difference between the maximum duty cycle of the linear frequency modulation period and the minimum duty cycle of the linear frequency modulation period is less than a preset threshold, determining not to perform the third abstraction processing on the reference high and low level curve; When the difference between the maximum duty cycle of the linear frequency modulation period and the minimum duty cycle of the linear frequency modulation period is greater than or equal to a preset threshold, it is determined to perform a third abstract processing on the reference high-low level curve.

7. The method according to claim 4, wherein When determining to perform the third abstract processing on the reference high-low level curve, the step of obtaining the target cycle interval according to the result of the third abstract processing includes: When determining to perform the third abstract processing on the reference high-low level curve, traversing the reference high-low level curve to obtain all rising edges and falling edges in the reference high-low level curve, and calculating a second time difference between adjacent rising edges and falling edges; Obtaining a second time difference maximum value and a second time difference minimum value according to the second time difference; Calculating an average of the maximum value of the second time difference and the minimum value of the second time difference; When the average value is greater than the turn-on time threshold, marking the interval between the adjacent falling edge and rising edge as a high level interval; When the average value is less than or equal to the turn-on time threshold, marking the interval between adjacent falling edges and rising edges as a low-level interval; Obtaining a result of a third abstraction process according to the marked high-level interval and the marked low-level interval, and updating the reference high-low level curve according to the result of the third abstraction process to obtain a target high-low level curve; The target cycle interval is obtained through the target high and low level curves.

8. The method according to claim 1, wherein The step of calculating the duty cycle of the millimeter-wave radar to be tested according to the target period interval to complete the duty cycle test of the millimeter-wave radar to be tested includes: Obtaining the number of cycles and the start time coordinate and the end time coordinate values ​​within the target cycle interval according to the target cycle interval; In the time interval between the starting time coordinate and the ending time coordinate, record the time differences between all adjacent falling edges and rising edges, and accumulate the time differences to obtain an accumulated time difference; The duty cycle of the millimeter-wave radar to be tested is calculated according to the number of cycles and the accumulated time difference to complete the duty cycle test of the millimeter-wave radar to be tested.

9. The method according to any one of claims 1 to 8, characterized in that The step of performing time domain scanning on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal includes: Performing a time domain scan on the millimeter-wave radar to be tested through the target test port to obtain a declared center frequency of the millimeter-wave radar to be tested; When the declared center frequency is not used, determining whether the set center frequency is automatically selected; When the center frequency is set to be automatically selected, the millimeter-wave radar to be tested is pre-scanned according to the pre-scan setting rule, and the frequency point at which the maximum level is located is obtained during the pre-scan process; A final sweep setting rule is obtained, and a final sweep is performed at the frequency point where the maximum level is located according to the final sweep setting rule to obtain a time domain signal.

10. A duty cycle test device for millimeter wave radar, characterized in that: The device comprises: An acquisition module is used to obtain the operating frequency of the millimeter-wave radar to be tested; A selection module, configured to select a target test port according to the operating frequency; A time domain scanning module, configured to perform time domain scanning on the millimeter-wave radar to be tested through the target test port to obtain a time domain signal; A processing module, configured to perform a first abstract processing on the time domain signal to obtain an initial high-low level curve corresponding to the time domain signal; the first abstract processing is to mark the time domain signal as a first constant value and a second constant value based on a rising edge and a falling edge to obtain the initial high-low level curve; A determination module, configured to determine a corresponding processing strategy according to different signal types of the time domain signal; wherein the signal type includes a frequency modulated continuous wave type or a non-frequency modulated continuous wave type; The acquisition module is further configured to obtain a target period interval based on the processing strategy and the initial high-low level curve; wherein, when the signal type is a frequency modulated continuous wave type, the processing strategy is determined to be performing a second abstract processing and a third abstract processing on the initial high-low level curve; the second abstract processing is to obtain a reference high-low level curve based on an off-time threshold of a linear frequency modulation signal; the third abstract processing is to obtain a target high-low level curve based on all rising edges and falling edges in the reference high-low level curve; and the target period interval is obtained through the target high-low level curve; A calculation module is used to calculate the duty cycle of the millimeter-wave radar to be tested according to the target period interval to complete the duty cycle test of the millimeter-wave radar to be tested.

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