Method and system for evaluating lightning trip-out rate of 10 kV overhead line in plain area

Abstract

The invention belongs to the technical field of disaster prevention and reduction of a power distribution network, and particularly relates to a method and a system for evaluating a lightning trip-out rate of a 10kV overhead line in a plain area, which are used for solving the problems of high calculation complexity and long consumed time in the prior art. The method comprises the following steps: obtaining the lightning ground lightning density and the soil resistivity of an area where the overhead line is located, the insulator dry arc distance of the line and the average height of a wire, and rapidly calculating the lightning trip-out rate. Geographic parameters and empirical formulas are fused, traditional multi-physical field simulation is replaced, the calculation time is shortened to the second level from several hours, efficient evaluation can be achieved without professional lightning simulation knowledge, the method is suitable for basic power operation and maintenance units to quickly make lightning protection strategies, and the method is suitable for popularization and application. The method is especially suitable for a plain area with the altitude less than or equal to 1000 m, the soil resistivity of 50-1000 omega.m and the average height of the wire of 10-22 m.

Description

Technical Field

[0001] The present invention belongs to the field of disaster prevention and mitigation of distribution networks, and in particular relates to a method and system for evaluating the lightning tripping rate of 10kV overhead lines in plain areas. Background Art

[0002] Because the lightning withstand threshold of 10kV overhead insulators is significantly lower than that of 110kV and above high-voltage lines, even moderate lightning overvoltages can easily trigger insulator flashover, leading to severe lightning failures such as conductor melting. In areas with frequent lightning activity and poor soil conductivity, the risk of lightning damage to these overhead lines increases exponentially.

[0003] The traditional evaluation method for the lightning trip rate of 10kV overhead lines has significant technical bottlenecks and operational obstacles: 1) Existing simulation models (such as distributed parameter models and finite element models) require accurate construction of electromagnetic transient processes, involving multi-physics field coupling calculations. This not only results in high modeling complexity and long calculation time, but also presents a high application threshold for non-lightning protection professionals. 2) During the evaluation process, it is necessary to analyze the differentiated flashover paths of direct lightning (directly hitting the conductor) and induced lightning (electromagnetic induction of nearby lightning), resulting in a lengthy calculation process.

[0004] 3) For plain areas with flat terrain, their spatial parameters and geological conditions are relatively homogeneous, which provides the feasibility of simplifying calculations - through historical data regression analysis and multivariate mathematical fitting, the correlation formula between parameters is established to replace complex simulations. Summary of the Invention

[0005] The purpose of the present invention is to provide a method and system for evaluating the lightning trip rate of 10kV overhead lines in plain areas, so as to solve the problem in the prior art that the calculation of the lightning trip rate of 10kV overhead lines is complex and time-consuming.

[0006] In order to achieve the above object, the present invention adopts the following technical solutions: In a first aspect, the present invention provides a method for evaluating the lightning trip rate of 10kV overhead lines in plain areas, comprising: Obtain lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located; Obtain the insulator dry arc distance and average conductor height of 10kV overhead lines; Based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, the lightning trip rate of the 10kV overhead line is evaluated to obtain a lightning trip rate evaluation result.

[0007] Furthermore, based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, the lightning trip rate of the 10kV overhead line is evaluated to obtain a lightning trip rate evaluation result, including:

[0008] in, P is the lightning trip rate; N g is the lightning ground flash density; e is a natural constant; l is the insulator dry arc distance; ρ is the soil resistivity; h is the average height of the conductor.

[0009] Furthermore, the area where the 10kV overhead line is located: the altitude in the plain area is ≤1000m, the soil resistivity is 50Ω·m≤≤1000Ω·m, the dry arc distance of the insulator is 0.2m≤0.8m, and the average height of the conductor is 10m≤22m.

[0010] Furthermore, the lightning ground flash density in the area where the 10kV overhead line is located is obtained, including: Obtain lightning ground flash data for the past five years in the area where the 10kV overhead line is located; The average annual number of lightning-to-ground flashes per unit area is calculated based on lightning-to-ground flash data to obtain the lightning-to-ground flash density.

[0011] Furthermore, the soil resistivity of the area where the 10kV overhead line is located is obtained, including: Determine the measurement points along the path of the 10kV overhead line; Based on each measurement point, the soil resistivity of each measurement point is measured using the four-pole method, and the arithmetic average of the soil resistivity of each measurement point is taken as the soil resistivity of the area where the 10kV overhead line is located.

[0012] Furthermore, the dry arc distance of the insulator of the 10kV overhead line is obtained, including: Determine the insulator model and specification parameters, and directly obtain the insulator dry arc distance based on the insulator model and specification parameters; Alternatively, the shortest air gap distance between the two-pole metal accessories on the insulator surface can be measured as the insulator dry arc distance.

[0013] Furthermore, the average conductor height of the 10kV overhead line is obtained, including: Determine the spacing between each tower of the 10kV overhead line and between two adjacent towers; Within the same span, measure the height of the conductor suspension point to the ground or the height of the conductor's lowest point to the ground, as well as the conductor's maximum sag; The average height of the conductor is calculated according to the following formula:

[0014] or

[0015] in: h : average height of conductor, m; h xg : Height of conductor suspension point to the ground, unit: m; h zd : Height of the lowest point of the conductor to the ground, unit: m; h hc : Maximum sag of conductor, unit: m.

[0016] In a second aspect, the present invention provides a device for evaluating the lightning trip rate of a 10 kV overhead line in a plain area, comprising: The first data acquisition module is used to obtain the lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located; The second data acquisition module is used to obtain the dry arc distance of the insulator and the average height of the conductor of the 10kV overhead line; The evaluation module is used to evaluate the lightning trip rate of the 10kV overhead line based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, and obtain a lightning trip rate evaluation result.

[0017] In a third aspect, the present invention provides an electronic device comprising a processor and a memory, wherein the processor is configured to execute a computer program stored in the memory to implement the above-mentioned method for evaluating the lightning tripping rate of 10kV overhead lines in plain areas.

[0018] In a fourth aspect, the present invention provides a computer-readable storage medium storing at least one instruction, which, when executed by a processor, implements the above-mentioned method for evaluating the lightning tripping rate of 10kV overhead lines in plain areas.

[0019] Compared with the prior art, the beneficial effects of the present invention are as follows: The method provided by the present invention, by integrating four key parameters, namely, lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, constructs an empirical formula to directly calculate the lightning tripping rate, replacing the multi-physics field coupling simulation of the traditional distributed parameter model or finite element model, and optimizing the original calculation process of several hours to output results in seconds, thus solving the core problem of complex and time-consuming calculations. There is no need to analyze the differentiated flashover paths of direct lightning and induced lightning, nor is there a need for professionals to master electromagnetic transient simulation technology. Grassroots power operation and maintenance personnel can directly complete the evaluation based on the actual measured parameters on site, significantly improving the engineering applicability of the method. In view of the characteristics of flat terrain and relatively homogeneous geological conditions in plain areas, the model is simplified by parameter correlation to avoid redundant calculations, and rapid evaluation is achieved while ensuring accuracy.

[0020] This solution limits the range of plain areas to ≤1000m above sea level, 50-1000Ω·m soil resistivity, 0.2-0.8m dry arc distance, and 10-22m average conductor height. This ensures the applicability of the formula in typical plain scenarios and avoids calculation errors caused by parameter out-of-limit.

[0021] This solution is based on the historical data statistics of the lightning location system in the past five years, combined with the elimination of invalid records to ensure the accuracy of the lightning ground flash density Ng.

[0022] Through parametric modeling and standardized data collection methods, this invention shifts traditional lightning trip rate assessment from reliance on specialized simulation software to rapid, field-based calculations. This approach is particularly suitable for grassroots organizations lacking specialized lightning protection professionals. In typical plain scenarios, calculation time is reduced from hours to seconds, providing real-time support for decision-making such as prioritizing lightning protection retrofits and optimizing insulator selection.

[0023] The present invention provides a device for evaluating the lightning tripping rate of a 10kV overhead line in a plain area, an electronic device, and a computer-readable storage medium, which also solve the problems raised in the background technology section. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] The accompanying drawings, which constitute part of this application, are intended to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are intended to explain the present invention and do not constitute an undue limitation of the present invention. In the accompanying drawings: Figure 1 This is a flow chart of a method for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to an embodiment of the present invention; Figure 2 This is a structural block diagram of a device for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to an embodiment of the present invention; Figure 3 The figure is a structural block diagram of an electronic device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0025] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments. It should be noted that, unless there is a conflict, the embodiments and features in the embodiments of the present application can be combined with each other.

[0026] The following detailed description is an exemplary description, which is intended to provide further detailed description of the present invention. Unless otherwise indicated, all technical terms used in the present invention have the same meaning as those generally understood by those skilled in the art. The terms used in the present invention are only for describing specific embodiments, and are not intended to limit the exemplary embodiments according to the present invention.

[0027] Example 1 An embodiment of the present invention provides a method for evaluating the lightning trip-out rate of 10kV overhead lines in plain areas. The method can quickly calculate the lightning trip-out rate of the 10kV overhead line based on the lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located, as well as the line insulator dry arc distance and the average conductor height.

[0028] The above solution breaks through the calculation framework of traditional models and adopts a field-circuit coupling equivalent algorithm to integrate geographical characteristic parameters to achieve simultaneous analysis of direct and induced lightning flashover rates. Based on empirical formulas for key parameters such as soil resistivity and average conductor height, the calculation process of traditional electromagnetic transient simulation that takes several hours is optimized to a second-level operation that can quickly obtain results. Non-professionals can complete general lightning damage risk assessments without mastering lightning simulation technology, providing grassroots power operation and maintenance units with efficient decision-making tools.

[0029] like Figure 1 As shown in FIG, a method for evaluating the lightning trip rate of 10 kV overhead lines in plain areas includes: S1. Obtain the lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located.

[0030] In one embodiment, obtaining the lightning-to-ground flash density in the area where the 10kV overhead line is located includes: obtaining lightning-to-ground flash data for the past five years in the area where the 10kV overhead line is located; and calculating the average annual number of lightning-to-ground flashes per unit area based on the lightning-to-ground flash data to obtain the lightning-to-ground flash density.

[0031] As a specific example, the lightning ground flash density in the area where the 10kV overhead line is located can be obtained as follows: Connect to the provincial meteorological department's lightning monitoring network to obtain the last five years of lightning location system (LLS) data within the latitude and longitude range of the target 10kV overhead line. Eliminate invalid records with fewer than three return strokes or peak currents less than 5kA, and retain the cloud-to-ground lightning data. The lightning ground flash density is calculated according to the following formula:

[0032] Among them, N g represents the lightning ground flash density; N represents the total number of effective cloud-to-ground flashes; A represents the area of ​​the line corridor (km 2 , calculated as line length × 1km width on both sides); T represents the statistical years, and the past five years are selected in this plan.

[0033] In a preferred embodiment, if the coverage rate of the lightning location system LLS is less than 90%, the satellite lightning imager LIS data correction is supplemented to ensure that the error is less than 15%.

[0034] In one embodiment, obtaining the soil resistivity of the area where the 10kV overhead line is located includes: determining each measurement point on the path of the 10kV overhead line; based on each measurement point, using a quadrupole method to measure the soil resistivity of each measurement point, and taking the arithmetic average of the soil resistivity of each measurement point as the soil resistivity of the area where the 10kV overhead line is located.

[0035] It's important to note that soil resistivity (ρ) measures soil conductivity and is measured in Ω·m (ohm·meter). The higher the ρ value, the lower the soil conductivity. For example, rock has a ρ value as high as several thousand Ω·m, while moist clay may have a ρ value as low as tens of Ω·m. Soil resistivity directly affects lightning current dissipation. The higher the ρ value, the more likely a lightning strike will generate high voltage, causing line tripping.

[0036] As a specific example, the soil resistivity in the area where the 10kV overhead line is located can be obtained as follows: Measuring points are set up every 2 km along the line. In areas of sudden geological changes, such as rivers and mountain foothills, the number of measuring points is increased to one every 500 m. A total of 10 or more measuring points is required to ensure coverage of the diverse geological regions along the entire line. The soil resistivity at each measuring point is measured using the quadrupole method. The quadrupole method simulates the distribution of current flowing into the soil by inserting four electrodes into the ground, and infers the soil resistivity. The arithmetic average of the soil resistivity at each measuring point is taken as the soil resistivity for the area where the 10 kV overhead line is located.

[0037] S2. Obtain the dry arc distance of the insulator and the average height of the conductor of the 10kV overhead line.

[0038] In one embodiment, obtaining the dry arc distance of the insulator of a 10kV overhead line includes: determining the insulator model specification parameters, and directly obtaining the insulator dry arc distance based on the insulator model specification parameters; or measuring the shortest air gap distance between the two-pole metal accessories on the insulator surface as the insulator dry arc distance.

[0039] As a specific example, the dry arc distance of the insulator of a 10kV overhead line can be obtained as follows: If the insulator model is known, the nominal dry arc distance of the corresponding model in GB / T 775.2-2022 Insulator Test Method can be directly quoted; When the insulator model is unknown or needs to be verified, a laser rangefinder can be used to measure the shortest air gap between the high-voltage terminal and the grounding metal attachment on the insulator surface as the insulator dry arc distance. Ten insulators of the same model can be randomly sampled and the arithmetic average taken after removing outliers with a ±5% deviation.

[0040] In one embodiment, obtaining the average height of a conductor of a 10 kV overhead line includes: determining each tower of the 10 kV overhead line and the spacing between two adjacent towers; Within the same span, measure the height of the conductor suspension point to the ground or the height of the conductor's lowest point to the ground, as well as the conductor's maximum sag; The average height of the conductor is calculated according to the following formula:

[0041] or

[0042] in: h : average height of conductor, m; h xg : Height of conductor suspension point to the ground, unit: m; h zd : Height of the lowest point of the conductor to the ground, unit: m; h hc : Maximum sag of conductor, unit: m.

[0043] It should be noted that the average conductor height in this scheme refers to the average height of the overhead line conductor above the ground within the span, which directly affects the calculation of lightning strike probability and trip rate. The span is the horizontal distance between two adjacent towers. Sag is the curve formed when the conductor sags in the center of the span due to its own weight and tension. The taller the conductor, the more susceptible it is to lightning strikes. However, the average conductor height is not a fixed value within the span. The conductor sags in the middle and is fixed to the tower at both ends, so its equivalent average height must be calculated through measurement.

[0044] As a specific example, the average conductor height of a 10kV overhead line can be obtained as follows: In windless, ice-free conditions, use a total station or laser rangefinder to measure the height of three locations within the same span: left, center, and right. For example, the height near the left tower, the center tower, and the right tower. Take the arithmetic average to avoid inaccurate single-point data due to terrain fluctuations or measurement errors. Randomly select 10 consecutive spans along the route, for example, the 10 spans between towers 1 to 10, measure the average height of each span, and then take the arithmetic average of these 10 values ​​to obtain the h value for the entire route.

[0045] Among the options, if the line passes through a slope (slope > 5%), a weighted height correction is required according to the DL / T 741-2019 specification. For example, if one side of the conductor on a slope is higher than the other, the average height needs to be adjusted based on the slope ratio.

[0046] For example, a 10kV line span in a plain area is 120 meters. Using a laser rangefinder, the single span measurements are: 20.1 meters at the left end, 18.3 meters in the center, and 20.0 meters at the right end, yielding an average of 19.5 meters. The averages of 10 consecutive spans are then calculated: 19.5 meters, 19.8 meters, 18.9 meters, 19.0 meters, 19.1 meters, 19.2 meters, 19.3 meters, 19.4 meters, 19.5 meters, and 19.3 meters, yielding an overall h of 19.3 meters.

[0047] S3. Based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, the lightning trip rate of the 10kV overhead line is evaluated to obtain a lightning trip rate evaluation result.

[0048] In one embodiment, based on the lightning ground flash density, soil resistivity, insulator dry arc distance, and average conductor height, the lightning trip rate of a 10 kV overhead line is evaluated to obtain a lightning trip rate evaluation result, including:

[0049] in, P is the lightning tripping rate, times / (100km·a); N g is the lightning ground flash density, times / (km 2 a); e is a natural constant; l is the insulator dry arc distance, m; ρ is the soil resistivity, Ω·m; h is the average height of the conductor, m.

[0050] It should be noted that the evaluation formula for the lightning tripping rate in this scheme is applicable to areas where 10kV overhead lines are located: in plain areas, the altitude is ≤1000m, the soil resistivity is 50Ω·m≤≤1000Ω·m, the insulator dry arc distance is 0.2m≤≤0.8m, and the average conductor height is 10m≤≤22m.

[0051] The present invention provides an embodiment of a method for quickly calculating the lightning trip rate of a 10kV overhead line in a plain area.

[0052] Lightning ground flash density N in a certain area g 2 times / (km 2 a), soil resistivity ρ The resistance is 100Ω·m, and the average height of the 10kV overhead line conductor is h 15m, insulator dry arc distance l is 0.2m.

[0053] Collect lightning ground flash density in the area where 10kV overhead lines are located N g and soil resistivity ρ : In this embodiment, N g 2 times / (km 2 a), ρ 100Ω·m; Collect the dry arc distance of the 10kV overhead line insulator l , average height of the wire h: In this embodiment, l 0.3m, h is 15m.

[0054] Calculate the lightning trip rate of the 10kV overhead line P :

[0055] Example 2 like Figure 2 As shown, based on the same inventive concept as the above embodiment, the present invention also provides a device for evaluating the lightning trip rate of a 10kV overhead line in a plain area, comprising: The first data acquisition module is used to obtain the lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located; The second data acquisition module is used to obtain the dry arc distance of the insulator and the average height of the conductor of the 10kV overhead line; The evaluation module is used to evaluate the lightning trip rate of the 10kV overhead line based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, and obtain a lightning trip rate evaluation result.

[0056] Example 3 like Figure 3 As shown, the present invention also provides an electronic device 100 for implementing a method for evaluating the lightning trip rate of a 10kV overhead line in a plain area; The electronic device 100 includes a memory 101 , at least one processor 102 , a computer program 103 stored in the memory 101 and executable on the at least one processor 102 , and at least one communication bus 104 .

[0057] The memory 101 can be used to store a computer program 103. The processor 102 implements the steps of a method for evaluating the lightning tripping rate of 10kV overhead lines in plain areas in Example 1 by running or executing the computer program stored in the memory 101 and calling data stored in the memory 101.

[0058] The memory 101 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required for at least one function (such as a sound playback function, an image playback function, etc.), etc.; the data storage area may store data (such as audio data) created according to the use of the electronic device 100. In addition, the memory 101 may include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device.

[0059] The at least one processor 102 may be a central processing unit (CPU), or may be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The processor 102 may be a microprocessor or any conventional processor. The processor 102 is the control center of the electronic device 100 and connects various parts of the entire electronic device 100 using various interfaces and lines.

[0060] The memory 101 in the electronic device 100 stores a plurality of instructions to implement a method for evaluating the lightning trip rate of a 10 kV overhead line in a plain area. The processor 102 can execute the plurality of instructions to implement: Obtain lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located; Obtain the insulator dry arc distance and average conductor height of 10kV overhead lines; Based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, the lightning trip rate of the 10kV overhead line is evaluated to obtain a lightning trip rate evaluation result.

[0061] Example 4 If the module / unit integrated in the electronic device 100 is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the process in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form, etc. Computer-readable media may include: any entity or device that can carry computer program code, recording medium, U disk, mobile hard disk, magnetic disk, optical disk, computer memory and read-only memory (ROM, Read-Only Memory).

[0062] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Thus, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0063] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowcharts and / or block diagrams. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0064] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0065] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0066] Throughout this specification, references to terms such as "one embodiment," "example," or "specific example" indicate that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in at least one embodiment or example of the present invention. In this specification, schematic representations of these terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0067] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered by the scope of protection of the claims of the present invention.

Claims

1. A method for evaluating the lightning trip rate of 10kV overhead lines in plain areas, characterized in that: include: Obtain lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located; Obtain the insulator dry arc distance and average conductor height of 10kV overhead lines; Based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, the lightning trip rate of the 10kV overhead line is evaluated to obtain a lightning trip rate evaluation result.

2. The method for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to claim 1, characterized in that: Based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, the lightning trip rate of the 10kV overhead line is evaluated, and the lightning trip rate evaluation results are obtained, including: in, P is the lightning trip rate; N g is the lightning ground flash density; e is a natural constant; l is the insulator dry arc distance; ρ is the soil resistivity; h is the average height of the conductor.

3. The method for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to claim 1, characterized in that: The area where the 10kV overhead line is located: the altitude in the plain area is ≤1000m, the soil resistivity is 50Ω·m≤1000Ω·m, the dry arc distance of the insulator is 0.2m≤0.8m, and the average height of the conductor is 10m≤22m.

4. The method for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to claim 1, characterized in that: Obtain the lightning ground flash density in the area where the 10kV overhead line is located, including: Obtain lightning ground flash data for the past five years in the area where the 10kV overhead line is located; The average annual number of lightning-to-ground flashes per unit area is calculated based on lightning-to-ground flash data to obtain the lightning-to-ground flash density.

5. The method for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to claim 1, characterized in that: Obtain the soil resistivity in the area where the 10kV overhead line is located, including: Determine the measurement points along the path of the 10kV overhead line; Based on each measurement point, the soil resistivity of each measurement point is measured using the four-pole method, and the arithmetic average of the soil resistivity of each measurement point is taken as the soil resistivity of the area where the 10kV overhead line is located.

6. The method for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to claim 1, characterized in that: Obtain the dry arc distance of the insulator of a 10kV overhead line, including: Determine the insulator model and specification parameters, and directly obtain the insulator dry arc distance based on the insulator model and specification parameters; Alternatively, the shortest air gap distance between the two-pole metal accessories on the insulator surface can be measured as the insulator dry arc distance.

7. The method for evaluating the lightning trip rate of 10kV overhead lines in plain areas according to claim 1, characterized in that: Obtain the average conductor height of 10kV overhead lines, including: Determine the spacing between each tower of the 10kV overhead line and between two adjacent towers; Within the same span, measure the height of the conductor suspension point to the ground or the height of the conductor's lowest point to the ground, as well as the conductor's maximum sag; The average height of the conductor is calculated according to the following formula: or in: h : average height of conductor, m; h xg : Height of conductor suspension point to the ground, unit: m; h zd : Height of the lowest point of the conductor to the ground, unit: m; h hc : Maximum sag of conductor, unit: m.

8. A device for evaluating the lightning trip rate of 10kV overhead lines in plain areas, characterized in that: include: The first data acquisition module is used to obtain the lightning ground flash density and soil resistivity in the area where the 10kV overhead line is located; The second data acquisition module is used to obtain the insulator dry arc distance and average conductor height of the 10kV overhead line; The evaluation module is used to evaluate the lightning trip rate of the 10kV overhead line based on the lightning ground flash density, soil resistivity, insulator dry arc distance and average conductor height, and obtain a lightning trip rate evaluation result.

9. An electronic device, characterized in that: The system comprises a processor and a memory, wherein the processor is used to execute a computer program stored in the memory to implement the method for evaluating the lightning tripping rate of 10kV overhead lines in plain areas as claimed in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores at least one instruction, and when the at least one instruction is executed by the processor, the method for evaluating the lightning tripping rate of 10kV overhead lines in plain areas according to any one of claims 1 to 7 is implemented.

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