Testing device

Abstract

The invention relates to the technical field of superconducting material testing equipment, and discloses a testing device. Comprising a device body, a pressurizing component, a liquid level detection component and a control component, a testing chamber and a liquid supplementing chamber are formed in the device body, the testing chamber is communicated with the liquid supplementing chamber, and the testing chamber and the liquid supplementing chamber are both used for containing a liquid low-temperature medium; the pressurizing part is connected with the device body and is used for increasing the pressure intensity of the liquid supplementing chamber; the liquid level detection part is arranged on the device body and is used for detecting a first liquid level of the test chamber; the control part is electrically connected with the liquid level detection part and the pressurizing part; under the condition that the first liquid level is smaller than a first set threshold value, the control part outputs a liquid supplementing control instruction, and the pressurizing part acts according to the liquid supplementing control instruction to increase the pressure intensity of the liquid supplementing cavity, so that the liquid low-temperature medium in the liquid supplementing cavity flows to the testing cavity. The problems that in the prior art, a testing system cannot meet the requirement for long-time liquid level stability and electromagnetic interference exists are effectively solved.

Description

Technical Field

[0001] The present invention relates to the technical field of superconducting material testing equipment, and in particular to a testing device. Background Art

[0002] The primary testing of superconducting chips requires a low-temperature environment of 4.2K, while also isolating them from electromagnetic interference. Testing superconducting chips immersed in liquid helium is the optimal option. Testing complex superconducting chip circuits also requires a test device capable of providing extended testing time. Furthermore, during testing, the superconducting chip must remain below the liquid helium level for extended periods, necessitating a system to maintain a stable liquid helium level. However, current low-temperature liquid helium testing systems cannot meet the need for long-term liquid level stability, while testing superconducting chips using a closed-loop refrigerator system presents electromagnetic interference issues. Therefore, ensuring liquid level stability and avoiding electromagnetic interference during extended testing periods are pressing challenges for the industry. Summary of the Invention

[0003] The present invention provides a testing device for solving the problems in the prior art that the testing system cannot meet the requirement of long-term liquid level stability and has electromagnetic interference.

[0004] The present invention provides a testing device, comprising:

[0005] The device body has a test chamber and a fluid replenishment chamber formed therein, the test chamber is communicated with the fluid replenishment chamber, and both the test chamber and the fluid replenishment chamber are used to accommodate a liquid low-temperature medium;

[0006] a pressurizing component connected to the device body and configured to increase the pressure in the fluid infusion chamber;

[0007] a liquid level detection component, disposed on the device body, for detecting a first liquid level in the test chamber;

[0008] a control component electrically connected to the liquid level detection component and the pressurizing component;

[0009] When the first liquid level is less than a first set threshold, the control component outputs a liquid replenishment control instruction, and the boosting component operates according to the liquid replenishment control instruction to increase the pressure of the liquid replenishment chamber, so that the liquid low-temperature medium in the liquid replenishment chamber flows to the test chamber.

[0010] According to the testing device provided by the present invention, the pressurizing component includes:

[0011] A first heating component is provided in the fluid replenishment chamber and is electrically connected to the control component; the first heating component is used to heat the liquid low-temperature medium to generate gas, thereby increasing the pressure of the fluid replenishment chamber.

[0012] According to the testing device provided by the present invention, the pressurizing component includes:

[0013] An inflation component is communicated with the fluid infusion chamber, the inflation component is electrically connected to the control component, and the inflation component is used to introduce gas into the fluid infusion chamber to increase the pressure of the fluid infusion chamber.

[0014] The testing device provided by the present invention further includes:

[0015] An exhaust component is formed on the device body with an exhaust channel, and the exhaust channel is communicated with the liquid infusion chamber; the exhaust component is arranged on the device body and is used to open or close the exhaust channel.

[0016] According to the testing device provided by the present invention, the exhaust component is electrically connected to the control component.

[0017] According to the testing device provided by the present invention, the testing chamber is located above the fluid replenishing chamber, and the testing chamber is connected to the bottom of the fluid replenishing chamber through a connecting tube.

[0018] According to the testing device provided by the present invention, the device body comprises:

[0019] A housing assembly having an accommodating cavity formed therein;

[0020] a partition plate, horizontally arranged with the accommodating chamber, for dividing the accommodating chamber into the test chamber and the rehydration chamber arranged up and down;

[0021] The upper end of the connecting tube passes through the partition and is communicated with the bottom of the testing chamber, and the lower end of the connecting tube is communicated with the bottom of the rehydration chamber.

[0022] The testing device provided by the present invention further includes:

[0023] A fluid infusion tube, the shell assembly is provided with a second through hole, the partition is provided with a third through hole, the fluid infusion tube is passed through the second through hole and the third through hole and is connected to the fluid infusion chamber, a first gap is formed between the fluid infusion tube and the second through hole, the fluid infusion tube and the third through hole are interference fit; the first gap is connected to the test chamber.

[0024] The testing device provided by the present invention further includes:

[0025] The heat insulating component is sleeved on the outside of the test chamber and the fluid replenishing chamber.

[0026] According to the testing device provided by the present invention, the thermal insulation component includes:

[0027] a heat exchanger disposed in the first gap;

[0028] A cooling component is formed in the shell wall of the outer shell component. A second gap is sleeved on the outside of the test chamber and the fluid replenishing chamber. The cooling component is arranged in the second gap and is connected to the heat exchanger.

[0029] The present invention provides a testing device that forms a test chamber and a fluid replenishment chamber within the device body, provides a liquid level detection component for detecting a first liquid level in the test chamber, and provides a pressurizing component and a control component. When the first liquid level is less than a first set threshold, the control component outputs a fluid replenishment control instruction to control the pressurizing component to increase the pressure in the fluid replenishment chamber, making the pressure in the fluid replenishment chamber greater than that in the test chamber. Liquid cryogenic medium in the fluid replenishment chamber flows into the test chamber, replenishing the test chamber and stabilizing the first liquid level in the test chamber at the first set threshold. This ensures that during testing, a workpiece to be tested, such as a superconducting chip, placed in the test chamber is submerged in the liquid cryogenic medium, thereby improving test accuracy. Furthermore, because the testing device of the present invention does not use components containing magnetic elements, such as pumps, during testing, electromagnetic interference is avoided, further improving test accuracy. This effectively addresses the problems of prior art testing systems that cannot meet the requirement for long-term liquid level stability and are subject to electromagnetic interference. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction is given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0031] Figure 1 It is a schematic cross-sectional structural diagram of the testing device provided by the present invention.

[0032] Reference numerals:

[0033] 100, device body; 110, housing assembly; 120, partition; 130, connecting pipe; 140, test chamber; 150, rehydration chamber; 101, first gap; 102, second gap; 103, insertion port;

[0034] 200, pressurized components;

[0035] 300, liquid level detection component; 310, first liquid level sensor; 320, second liquid level sensor;

[0036] 400, control components;

[0037] 500, exhaust components; 510, exhaust pipe; 520, exhaust valve body;

[0038] 600, fluid infusion tube;

[0039] 700. Insulation component; 710. Heat exchanger; 720. Cooling component. DETAILED DESCRIPTION

[0040] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0041] In the description of the embodiments of the present invention, it should be noted that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the embodiments of the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore should not be understood as limiting the embodiments of the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only and should not be understood as indicating or implying relative importance.

[0042] In the description of the embodiments of the present invention, it should be noted that, unless otherwise specified or limited, the terms "connected" and "connection" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; and direct connections or indirect connections through an intermediary. Those skilled in the art will understand the specific meanings of the above terms in the embodiments of the present invention based on the specific circumstances.

[0043] In the embodiments of the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Furthermore, a first feature being "above," "above," or "above" a second feature may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. A first feature being "below," "below," or "below" a second feature may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0044] In the description of this specification, the reference terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" mean that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the embodiment of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0045] The following combination Figure 1 The test device of the present invention is described in detail. Figure 1 It is a schematic cross-sectional structural diagram of the testing device provided by the present invention.

[0046] like Figure 1 As shown, a specific embodiment of the present invention provides a testing device. The testing device includes a device body 100, a pressurizing component 200, a liquid level detection component 300, and a control component 400;

[0047] The device body 100 includes a test chamber 140 and a liquid replenishing chamber 150. The test chamber 140 and the liquid replenishing chamber 150 are connected to each other and are both used to accommodate a liquid low-temperature medium. A pressurizing component 200 is connected to the device body 100 and is used to increase the pressure in the liquid replenishing chamber 150. A liquid level detecting component 300 is provided in the device body 100 and is used to detect a first liquid level in the test chamber 140. A control component 400 is electrically connected to the liquid level detecting component 300 and the pressurizing component 200.

[0048] When the first liquid level is less than the first set threshold, the control component 400 outputs a liquid replenishment control instruction, and the boosting component 200 operates according to the liquid replenishment control instruction to increase the pressure of the liquid replenishment chamber 150, so that the liquid low-temperature medium in the liquid replenishment chamber 150 flows to the test chamber 140.

[0049] In a specific embodiment of the present invention, a test chamber 140 and a fluid replenishment chamber 150 are formed within the device body 100. A liquid level detection component 300 is provided for detecting a first liquid level in the test chamber 140. A pressurizing component 200 and a control component 400 are provided. When the first liquid level falls below a first set threshold, the control component 400 outputs a fluid replenishment control instruction to control the pressurizing component 200 to increase the pressure in the fluid replenishment chamber 150, thereby increasing the pressure in the fluid replenishment chamber 150 to a greater level than that in the test chamber 140. This allows the liquid cryogenic medium in the fluid replenishment chamber 150 to flow into the test chamber 140, thereby replenishing the test chamber 140 and stabilizing the first liquid level in the test chamber 140 at the first set threshold. This ensures that a workpiece to be tested, such as a superconducting chip, placed within the test chamber 140 is submerged in the liquid cryogenic medium during testing, thereby improving test accuracy. Furthermore, because the testing device of this embodiment does not utilize components containing magnetic elements, such as pumps, during testing, electromagnetic interference is avoided, further improving test accuracy. The present invention effectively solves the problems that the test system in the prior art cannot meet the requirement of long-term liquid level stability and has electromagnetic interference.

[0050] Furthermore, this embodiment achieves liquid level stabilization and control during chip testing through a dual-cavity structure, a boosting component 200, a liquid level detection component 300, and a control component 400, ensuring the liquid level stability and automatic rise and fall of the liquid low-temperature medium during chip testing, thereby solving the requirements of long-term testing and liquid level control of complex superconducting chips.

[0051] In some embodiments, the liquid cryogenic medium includes liquid helium or liquid nitrogen. Specifically, when testing a superconducting chip, the preferred liquid cryogenic medium is liquid helium.

[0052] In some embodiments, the liquid level detection component 300 includes a first liquid level sensor 310 and a second liquid level sensor 320; the first liquid level sensor 310 is arranged in the test chamber 140 and is electrically connected to the control component 400, and the first liquid level sensor 310 is used to detect the first liquid level of the test chamber 140; the second liquid level sensor 320 is arranged in the fluid replenishment chamber 150 and is electrically connected to the control component 400, and the second liquid level sensor 320 is used to detect the second liquid level of the fluid replenishment chamber 150.

[0053] If the first liquid level is less than the first set threshold, the control component 400 outputs a liquid replenishment control instruction, and the pressurizing component 200 operates according to the liquid replenishment control instruction to increase the pressure of the liquid replenishment chamber 150, causing the liquid low-temperature medium in the liquid replenishment chamber 150 to flow into the test chamber 140. If the first liquid level is not less than the first set threshold, the control component 400 outputs a stop liquid replenishment control instruction, and the pressurizing component 200 operates according to the stop liquid replenishment control instruction to stop increasing the pressure of the liquid replenishment chamber 150, ensuring that the first liquid level in the test chamber 140 is maintained at the first set threshold. This solves the problem of the existing test system being unable to meet the long-term liquid level stability requirement and improves test efficiency.

[0054] If the second liquid level is less than the second set threshold, the control component 400 outputs a first alarm instruction, and the alarm component operates according to the alarm instruction to remind the operator that the content of the liquid cryogenic medium in the liquid infusion chamber 150 is too low, so that the operator can promptly add liquid cryogenic medium to the liquid infusion chamber 150. If the second liquid level is not less than the second set threshold, the control component 400 outputs a first alarm cancellation control instruction, and the alarm component operates according to the first alarm cancellation control instruction to stop the alarm.

[0055] In some embodiments, the first liquid level sensor 310 and the second liquid level sensor 320 are both started periodically to detect the liquid levels of the test chamber 140 and the liquid replenishing chamber 150, respectively, which can reduce the heat generation of the first liquid level sensor 310 and the second liquid level sensor 320 and reduce the evaporation rate of the liquid low-temperature medium.

[0056] It is understandable that in some embodiments, when the test device of this embodiment is used to test the workpiece to be tested, such as a superconducting chip, the first liquid level sensor 310 and the second liquid level sensor 320 may not be started to prevent interference with the workpiece to be tested and improve the accuracy of the test results.

[0057] In a specific embodiment of the present invention, a temperature sensor is further provided in the test chamber 140; the temperature sensor is electrically connected to the control component 400, and the temperature sensor is used to detect the actual temperature of the test chamber 140 to ensure that the test temperature of the test chamber 140 meets the test requirements.

[0058] In some embodiments, a second heating component is further provided in the test chamber 140 . The second heating component is provided in the test chamber 140 and operates according to the temperature control instruction output by the control component 400 so that the actual temperature of the test chamber 140 meets the test requirements.

[0059] It can be understood that both the first set threshold and the second set threshold can be set according to the specific requirements of the workpiece to be measured.

[0060] In a specific embodiment of the present invention, the pressurizing component 200 includes a first heating component; the first heating component is disposed in the rehydration chamber 150, and the first heating component is electrically connected to the control component 400; the first heating component is used to heat the liquid low-temperature medium to generate gas, thereby increasing the pressure of the rehydration chamber 150. By adding the first heating component to the rehydration chamber 150, the first heating component heats the liquid low-temperature medium when in operation, and the liquid low-temperature medium vaporizes and turns into gas due to the heat, thereby increasing the pressure within the rehydration chamber 150. The liquid low-temperature medium within the rehydration chamber will flow to the test chamber 140, achieving a rehydration effect on the test chamber 140, ensuring that during the test process, the first liquid level within the test chamber 140 can be stabilized at the first set threshold, thereby improving the accuracy of the test. In addition, by providing the first heating component to increase the pressure of the rehydration chamber 150, the structure of the device can be simplified, and the cost can be reduced.

[0061] In a specific embodiment of the present invention, the pressurizing component 200 includes an inflation assembly; the inflation assembly is in communication with the fluid infusion chamber 150 and electrically connected to the control component 400. The inflation assembly is used to introduce gas into the fluid infusion chamber 150 to increase the pressure in the fluid infusion chamber 150. The provision of the inflation assembly avoids consumption of the liquid cryogenic medium in the fluid infusion chamber 150, enables instant on / off inflation, and facilitates control of the pressure within the fluid infusion chamber.

[0062] In some embodiments, the gas introduced by the inflation component into the fluid infusion chamber 150 is a gaseous liquid cryogenic medium. Specifically, the inflation component introduces helium into the fluid infusion chamber 150 .

[0063] It should be noted that the best choice for both liquid cryogenic medium and gas is one that cannot chemically react with the workpiece to be tested. Specifically, the liquid cryogenic medium is preferably liquid helium, and the gas is preferably helium.

[0064] In a specific embodiment of the present invention, the testing device further includes an exhaust component 500 ; the device body 100 is formed with an exhaust channel, which is connected to the rehydration chamber 150 ; the exhaust component 500 is disposed on the device body 100 for opening or closing the exhaust channel.

[0065] In a specific embodiment of the present invention, the exhaust component 500 can be operated to open the exhaust passage, allowing the liquid replenishment chamber 150 to communicate with the atmosphere, thereby reducing the pressure in the liquid replenishment chamber 150. When the pressure in the liquid replenishment chamber 150 drops to the same level as the pressure in the test chamber 140, the liquid cryogenic medium in the test chamber 140 flows back into the liquid replenishment chamber 150, exposing the workpiece to the liquid cryogenic medium.

[0066] When testing a superconducting chip using the test apparatus of this embodiment, if a quench operation is required on the superconducting chip, the liquid helium in the test chamber 140 needs to be refluxed to the liquid replenishment chamber 150. The specific process includes: operating the exhaust component 500 to open the exhaust channel, thereby connecting the liquid replenishment chamber 150 to the outside atmosphere until the pressure in the liquid replenishment chamber 150 is no greater than the pressure in the test chamber 140. The liquid helium in the test chamber 140 then automatically refluxes to the liquid replenishment chamber 150, completing the quench operation on the superconducting chip.

[0067] It should be noted that the exhaust component 500 is in a normally closed state, so that the liquid infusion chamber 150 is not connected to the atmosphere under normal conditions.

[0068] It should be noted that the exhaust component 500 can be operated manually or automatically.

[0069] In some embodiments, the exhaust component 500 is electrically connected to the control component 400, and the control component 400 outputs a pressure reduction control instruction. The exhaust component 500 operates according to the pressure reduction control instruction to open the exhaust channel, so that the fluid replenishment chamber 150 is connected to the atmosphere, thereby achieving pressure reduction and exhaust of the fluid replenishment chamber 150, and the liquid low-temperature medium in the test chamber 140 flows back to the fluid replenishment chamber 150.

[0070] In some embodiments, the exhaust component 500 includes an exhaust pipe 510 and an exhaust valve body 520. The exhaust pipe 510 is disposed in the exhaust passage and communicates with the refill chamber 150. The exhaust valve body 520 is disposed in the exhaust pipe 510 and is used to open or close the exhaust pipe 510. Specifically, the exhaust valve body 520 is electrically connected to the control component 400. When the control component 400 outputs a pressure reduction control command, the exhaust valve body 520 is actuated to open the exhaust pipe 510, thereby exhausting and reducing the pressure in the refill chamber 150. Furthermore, the exhaust valve body 520 is preferably a normally closed solenoid valve. That is, when the test device of this embodiment is used to test a workpiece, the solenoid valve is de-energized to close the exhaust pipe 510. This ensures that the pressure in the refill chamber 150 is slightly greater than the pressure in the test chamber 140, preventing the liquid low-temperature medium in the test chamber 140 from flowing back into the refill chamber 150, and also prevents electromagnetic interference with the workpiece.

[0071] In some embodiments, the testing device further includes a pressure sensor; the pressure sensor is arranged in the exhaust pipe 510 to monitor the pressure of the fluid infusion chamber 150; and the control component 400 is electrically connected to the pressure sensor.

[0072] The pressure sensor outputs pressure information, the control component 400 outputs a pressure display control instruction according to the pressure information, and the display module operates according to the pressure display control instruction to display the pressure information of the pressure sensor; the operator can check the pressure of the fluid infusion chamber 150 and make the pressure of the fluid infusion chamber 150 less than the safety pressure threshold, thereby improving the safety of use.

[0073] In some embodiments, the pressure sensor periodically detects the pressure of the fluid replenishing chamber 150. Furthermore, during the test process, the pressure sensor is not activated to avoid electromagnetic interference to the workpiece to be tested.

[0074] In a specific embodiment of the present invention, the test chamber 140 is located above the rehydration chamber 150, and the test chamber 140 is connected to the bottom of the rehydration chamber 150 via the connecting tube 130. Because the test chamber 140 is located above the rehydration chamber 150, the liquid low-temperature medium can flow back to the rehydration chamber 150 by gravity, simplifying the structure of the device body 100 and reducing costs. Because the lower end of the connecting tube 130 is located at the bottom of the rehydration chamber 150 and is connected to the rehydration chamber 150, the liquid low-temperature medium in the rehydration chamber 150 can seal the connecting tube 130, making the pressure in the test chamber 140 slightly lower than the pressure in the rehydration chamber 150, thereby preventing the liquid low-temperature medium in the test chamber 140 from flowing back to the rehydration chamber 150 when not needed.

[0075] In a specific embodiment of the present invention, the device body 100 includes a housing assembly 110 and a partition 120. A housing assembly 110 defines an interior of the housing chamber. The partition 120 is disposed horizontally with the housing chamber, and is used to divide the housing chamber into a test chamber 140 and a fluid infusion chamber 150, arranged vertically. The upper end of the connecting tube 130 passes through the partition 120 and communicates with the bottom of the test chamber 140, while the lower end of the connecting tube 130 communicates with the bottom of the fluid infusion chamber 150. By disposing the partition 120 within the housing chamber, and disposing the partition 120 horizontally, the housing chamber can be divided into the test chamber 140 and the fluid infusion chamber 150, arranged vertically. Compared to machining two chamber structures, dividing a single chamber into two vertical chamber structures using a single partition 120 can reduce manufacturing difficulty and cost.

[0076] In a specific embodiment of the present invention, the housing assembly 110 is formed with an insertion port 103, which communicates with the test chamber 140 and is used to accommodate a workpiece under test. It is understood that the aperture of the insertion port 103 is just large enough to accommodate the workpiece under test. Therefore, the provision of the insertion port 103 can reduce the evaporation rate of the liquid cryogenic medium. After the workpiece under test is placed in the test chamber 140, the insertion port 103 is sealed with a sealing flange, further reducing the evaporation rate of the liquid cryogenic medium.

[0077] In a specific embodiment of the present invention, the housing assembly 110 includes a shell and a cover; a housing cavity is formed in the shell, the cover is disposed over the upper opening of the housing cavity, and the cover is connected to the shell to seal the upper opening. Furthermore, an exhaust port is provided on the cover, a first through hole is provided on the partition 120, an exhaust pipe 510 is provided through the exhaust port and the first through hole, the lower end of the exhaust pipe 510 is connected to the fluid infusion chamber 150, the upper end of the exhaust pipe 510 extends out of the exhaust port, and an exhaust valve body 520 is provided on the exhaust pipe 510. The separate design of the shell and cover makes this embodiment easier to process and less expensive than an integrated structure.

[0078] In a specific embodiment of the present invention, the testing device also includes a fluid infusion tube 600; the outer shell assembly 110 is provided with a second through hole, the partition 120 is provided with a third through hole, the fluid infusion tube 600 is passed through the second through hole and the third through hole and is connected to the fluid infusion chamber 150, a first gap 101 is formed between the fluid infusion tube 600 and the second through hole, and the fluid infusion tube 600 is interference fit with the third through hole; the first gap 101 is connected to the test chamber 140.

[0079] In a specific embodiment of the present invention, by providing a second through hole and forming a first gap 101 between the second through hole and the liquid infusion tube 600, it is avoided to open an additional through hole for communicating with the test chamber 140, thereby simplifying the processing technology and improving the strength of the device body 100.

[0080] In some embodiments, a second through hole is opened on the cover body, and an annular first gap 101 is formed between the liquid infusion tube 600 and the hole wall of the second through hole.

[0081] It is understandable that during the test process, the opening of the rehydration tube 600 is sealed to ensure that the pressure of the rehydration chamber 150 is greater than the pressure of the test chamber 140, thereby preventing the liquid low-temperature medium in the test chamber 140 from flowing back into the rehydration chamber 150.

[0082] In a specific embodiment of the present invention, the testing device further includes an insulating component 700; the insulating component 700 is mounted on the outside of the testing chamber 140 and the fluid replenishing chamber 150, and can insulate the testing chamber 140 and the fluid replenishing chamber 150, thereby reducing the consumption rate of the liquid low-temperature medium and reducing the loss of the liquid low-temperature medium.

[0083] In some embodiments, the insulation component 700 includes a heat exchanger 710 and a cooling assembly 720; the heat exchanger 710 is disposed in the first gap 101; a second gap 102 is formed in the shell wall of the outer shell assembly 110, and the second gap 102 is sleeved on the outside of the test chamber 140 and the rehydration chamber 150. The cooling assembly 720 is disposed in the second gap 102 and is connected to the heat exchanger 710. By disposing the heat exchanger 710 in the first gap 101 and connecting the heat exchanger 710 to the cooling assembly 720, the cooling capacity can be reused, thereby improving energy utilization. In addition, forming the second gap 102 in the shell wall of the outer shell assembly 110 can ensure the thermal insulation performance of the entire device. Disposing the cooling assembly 720 in the second gap 102 can further improve the thermal insulation performance of the entire device.

[0084] In some embodiments, the second gap 102 is disposed around the test chamber 140 and the liquid replenishing chamber 150 to provide thermal insulation for the test chamber 140 and the liquid replenishing chamber 150 , further reducing the evaporation rate of the liquid cryogenic medium and reducing the loss of the liquid cryogenic medium.

[0085] In some embodiments, the housing assembly 110 is further provided with an exhaust hole connected to the second gap 102 , and the second gap 102 is evacuated through the exhaust hole to form a vacuum insulation layer, thereby further improving the overall thermal insulation performance of the device.

[0086] In some embodiments, the cooling assembly 720 includes a radiation screen. Furthermore, the radiation screen is made of a metal plate and is disposed around the test chamber 140 and the liquid replenishing chamber 150 to achieve heat preservation and insulation, thereby reducing the loss rate of the liquid cryogenic medium.

[0087] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A testing device, characterized in that: include: The device body (100) is internally formed with a test chamber (140) and a fluid replenishment chamber (150), wherein the test chamber (140) is communicated with the fluid replenishment chamber (150), and both the test chamber (140) and the fluid replenishment chamber (150) are used to accommodate a liquid low-temperature medium; a pressurizing component (200), connected to the device body (100), and used to increase the pressure of the fluid infusion chamber (150); a liquid level detection component (300), disposed on the device body (100), and configured to detect a first liquid level in the test chamber (140); a control component (400) electrically connected to the liquid level detection component (300) and the pressurizing component (200); When the first liquid level is less than a first set threshold, the control component (400) outputs a liquid replenishment control instruction, and the pressurizing component (200) operates according to the liquid replenishment control instruction to increase the pressure of the liquid replenishment chamber (150), so that the liquid low-temperature medium in the liquid replenishment chamber (150) flows to the test chamber (140).

2. The testing device according to claim 1, wherein: The pressurizing component (200) comprises: A first heating component is provided in the fluid replenishment chamber (150), and the first heating component is electrically connected to the control component (400); the first heating component is used to heat the liquid low-temperature medium to generate gas, thereby increasing the pressure of the fluid replenishment chamber (150).

3. The testing device according to claim 1, wherein: The pressurizing component (200) comprises: An inflation component is communicated with the fluid infusion chamber (150), and the inflation component is electrically connected to the control component (400). The inflation component is used to introduce gas into the fluid infusion chamber (150) to increase the pressure of the fluid infusion chamber (150).

4. The testing device according to claim 1, wherein: Also includes: An exhaust component (500) is formed on the device body (100) with an exhaust channel, and the exhaust channel is connected to the liquid replenishing chamber (150); the exhaust component (500) is arranged on the device body (100) and is used to open or close the exhaust channel.

5. The testing device according to claim 4, characterized in that: The exhaust component (500) is electrically connected to the control component (400).

6. The testing device according to any one of claims 1 to 5, characterized in that: The test chamber (140) is located above the rehydration chamber (150), and the test chamber (140) is connected to the bottom of the rehydration chamber (150) through a connecting tube (130).

7. The testing device according to claim 6, characterized in that The device body (100) comprises: A housing assembly (110) is formed with a receiving cavity therein; a partition (120) arranged horizontally with the accommodating chamber, for dividing the accommodating chamber into the test chamber (140) and the rehydration chamber (150) arranged vertically; The upper end of the connecting tube (130) passes through the partition (120) and communicates with the bottom of the test chamber (140), and the lower end of the connecting tube (130) communicates with the bottom of the rehydration chamber (150).

8. The testing device according to claim 7, characterized in that: Also includes: A fluid infusion tube (600), the housing component (110) is provided with a second through hole, the partition (120) is provided with a third through hole, the fluid infusion tube (600) is passed through the second through hole and the third through hole is connected to the fluid infusion chamber (150), a first gap (101) is formed between the fluid infusion tube (600) and the second through hole, the fluid infusion tube (600) is interference fit with the third through hole; the first gap (101) is connected to the test chamber (140).

9. The testing device according to claim 8, characterized in that: Also includes: The heat insulating component (700) is sleeved on the outside of the test chamber (140) and the fluid replenishing chamber (150).

10. The testing device according to claim 9, characterized in that: The thermal insulation component (700) comprises: a heat exchanger (710), disposed in the first gap (101); A cooling component (720) is provided, wherein a second gap (102) is formed in the shell wall of the housing component (110), the second gap (102) is sleeved on the outside of the test chamber (140) and the fluid infusion chamber (150), and the cooling component (720) is arranged in the second gap (102) and is connected to the heat exchanger (710).

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