Measurement method and device for high and low voltage ride through test

Abstract

The invention discloses a measurement method and device for high and low voltage ride through test, a user can configure a vernier trigger mechanism based on measurement requirements, a measurement device can generate a corresponding vernier trigger process according to the trigger mechanism, and the measurement device detects measurement data in a sliding window mode during measurement. And when the measurement data meets the vernier triggering mechanism, calling and starting the vernier triggering process: determining the position of the measurement data meeting the vernier triggering mechanism on the measurement curve, displaying the vernier at the determined position and identifying the corresponding measurement data according to a set rule, for example, displaying the measurement data in different colors, different line bodies and the like. Therefore, a user can visually know the measurement condition without manual marking and calculation, the operation time is saved, and the measurement accuracy is improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of signal measurement, and in particular relates to a measurement method and device for high and low voltage ride-through testing. Background Art

[0002] When photovoltaic power stations are connected to the power system, voltage fluctuations often need to be measured. The typical measurement method involves manual monitoring by testers to capture voltage fluctuations. For example, they pause the waveform display, manually drag a cursor to mark key points, and then manually calculate parameters such as the slope and time difference of the voltage or current change. This method has the following problems: Inefficiency: Manual operation is time-consuming, especially when processing large amounts of data or multi-channel signals; Human error: The positioning accuracy of the cursor is affected by the operator's experience, resulting in deviations in the calculation results; Insufficient dynamic response: Unable to identify waveform features that meet standards in real time. Summary of the Invention

[0003] The present invention proposes a measurement method and device for high and low penetration tests. The user can configure a trigger mechanism according to the measurement requirements. When the measurement data meets the trigger mechanism, the cursor calibration is automatically triggered and the fluctuation characteristics of the numerical value, such as the rate of change, time interval, difference and other information, are calculated. No manual marking and calculation are required, which saves operation time and improves measurement accuracy.

[0004] The present invention is achieved by adopting the following technical solutions: A measurement method for high and low voltage ride-through tests is proposed, including: Configure the cursor trigger mechanism and generate the cursor trigger process based on the cursor trigger mechanism; Acquiring measurement data and displaying the measurement data in a curve form; The measurement data is detected in a sliding window manner, and the cursor trigger process is started when the measurement data meets the cursor trigger mechanism; the cursor trigger process is configured as follows: Determine the position of the measurement data on the measurement curve that satisfies the cursor trigger mechanism; The cursor is displayed at the determined position and the corresponding measurement data is identified according to the set rules.

[0005] In some embodiments of the present invention, before configuring the cursor trigger mechanism, the method further includes: Create configuration controls and display them on the configuration interface; Create programmable data streams for measurement data based on user-selected configuration controls and incorporating measurement standards; The vernier trigger mechanism is generated according to the programmable data flow.

[0006] In some embodiments of the present invention, the method further comprises: The configuration control is set as an editable control to receive measurement parameters input by a user, and after being triggered and confirmed, the measurement parameters are used to create the programmable data flow.

[0007] In some embodiments of the present invention, the method further comprises: Displays the measurement data and measurement standard data of the cursor position.

[0008] In some embodiments of the present invention, the method further comprises: The vernier trigger mechanism is updated based on the noise level of the measurement signal.

[0009] A measurement device for high and low voltage ride-through tests is proposed, comprising: A configuration unit is used to configure a cursor trigger mechanism and generate a cursor trigger process based on the cursor trigger mechanism; A measuring unit, used for performing measurement and acquiring measurement data; A display unit, configured to display the measurement data in a curve form; The cursor trigger unit is used to detect the measurement data in a sliding window manner and start the cursor trigger process when the measurement data meets the cursor trigger mechanism; the cursor trigger process is configured to: Determine the position of the measurement data on the measurement curve that satisfies the cursor trigger mechanism; The cursor is displayed at the determined position and the corresponding measurement data is identified according to the set rules.

[0010] In some embodiments of the present invention, the apparatus further comprises: The editing unit is used to create a configuration control and display it on the configuration interface of the display unit; based on the configuration control selected by the user, a programmable data stream is created for the measurement data in combination with the measurement standard; and the cursor trigger mechanism is generated according to the programmable data stream.

[0011] In some embodiments of the present invention, the configuration unit is further configured to: The configuration control is set as an editable control to receive measurement parameters input by a user, and after being triggered and confirmed, the measurement parameters are used to create the programmable data flow.

[0012] In some embodiments of the present invention, the apparatus further comprises: The calculation unit is used to calculate the measurement data of the cursor position and control the display of the measurement data and measurement standard data on the measurement interface of the display unit.

[0013] In some embodiments of the present invention, the apparatus further comprises: An adaptive adjustment unit is configured to update the cursor trigger mechanism according to a noise level of the measurement data.

[0014] Compared with the prior art, the advantages and positive effects of the present invention are: in the measurement method and device for high and low voltage ride-through testing proposed by the present invention, the user can configure the cursor trigger mechanism based on the measurement requirements, and the measuring device can generate a corresponding cursor trigger process according to the trigger mechanism. The measuring device detects the measurement data in a sliding window manner during the measurement. When the measurement data meets the cursor trigger mechanism, the cursor trigger process is called and started: the position of the measurement data that meets the cursor trigger mechanism on the measurement curve is determined; the cursor is displayed at the determined position and the corresponding measurement data is identified according to the set rules, for example, the part of the measurement data is displayed in different colors, different lines, etc., so that the user can intuitively understand the measurement situation without manual marking and calculation, saving operation time and improving measurement accuracy.

[0015] Other features and advantages of the present invention will become more apparent after reading the detailed description of the embodiments of the present invention in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings, as part of the present invention, are used to provide a further understanding of the present invention. The exemplary embodiments and descriptions of the present invention are intended to explain the present invention but do not constitute undue limitations thereon. Obviously, the drawings described below are merely examples, and those skilled in the art can derive other drawings based on these drawings without inventive effort.

[0017] Figure 1 The present invention provides a schematic diagram of the measurement method steps for high and low voltage ride-through tests; Figure 2 This is a schematic diagram of a process for generating a programmable data flow based on a configuration control in an embodiment of the present invention; Figure 3 This is a schematic diagram of the configuration interface when configuring the cursor trigger mechanism in an embodiment of the present invention; Figure 4 This is an example of triggering a cursor based on the provided measurement method in an embodiment of the present invention; Figure 5 This is a schematic diagram of the functional structure of the measurement device for high and low voltage ride through tests proposed by the present invention.

[0018] It should be noted that these drawings and textual descriptions are not intended to limit the conceptual scope of the present invention in any way, but rather to illustrate the concept of the present invention for those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. The following embodiments are used to illustrate the present invention but are not used to limit the scope of the present invention.

[0020] like Figure 1 As shown, the measurement method for high and low voltage ride through test proposed by the present invention includes the following steps: S1: Configure the cursor trigger mechanism and generate a cursor trigger process based on the cursor trigger mechanism.

[0021] In the embodiment of the present invention, Figure 2 As shown, several configuration controls are created and displayed on the configuration interface, such as the parameter type control, conditional control, loop control, count control, etc. in the example in the figure. Each type of control can extend several sub-configuration controls. For example, the conditional control extends the following sub-configuration controls: drop, rise, resume, delay, wait until, if...else, prompt, etc.

[0022] In the configuration interface, users can drag and drop the required configuration controls to build the required cursor trigger mechanism. For example, if the cursor trigger mechanism is: when the voltage is between 20% and 90% below the standard value, mark the cursor. Then, the voltage control, 20% drop control, 90% drop control, and delay control can be dragged and dropped into the configuration box in sequence from the control list. These controls form a programming sequence in sequence. The device background creates a programmable data stream for the voltage measurement data based on the measurement standard. This programmable data stream is: when the voltage is 20%-90% below the voltage standard value and the delay time reaches the set duration, the cursor is displayed at the corresponding data position on the curve. Furthermore, a cursor trigger process that can be called and executed is generated based on this programmable data stream.

[0023] After the measurement is started, the cursor trigger process is also started. The cursor trigger process includes basic cursor display control, data display control, etc., and is updated in combination with the measurement parameters contained in the configuration control to generate a cursor trigger process that adapts to user needs.

[0024] Furthermore, the configuration control can be set as an editable control. When the user combines and builds the cursor trigger mechanism, the user can modify the measurement parameters associated with the editable control according to the actual measurement requirements. For example, if the user wants to observe data when the voltage value is between 20% and 90% lower than the standard voltage value, the user can select two drop controls, edit and modify the measurement parameter associated with the first drop control to: 20% (assuming the default parameter is 5%), and modify the measurement parameter associated with the second drop control to: 90%. The programmable data stream created is: when the voltage is 20%-90% lower than the voltage standard value and the delay time reaches the set duration, the cursor is displayed at the corresponding data position on the curve.

[0025] When the cursor trigger mechanism is configured, it can be illustrated on the configuration interface so that users can judge whether the configuration is successful and meets the requirements. Figure 3 shown.

[0026] S2: Acquire measurement data and display the measurement data in the form of a curve.

[0027] like Figure 3 As shown, when the measurement program is started, the measuring device displays the measurement data in the required curve form.

[0028] S3: Detect the measurement data in a sliding window manner.

[0029] Set a detection window and perform segmented detection on the measurement data in a sliding window manner to determine whether the measurement data within the sliding window meets the cursor trigger mechanism.

[0030] S4: Start the cursor trigger process when the measurement data meets the cursor trigger mechanism.

[0031] The cursor trigger process performs the following measurement control: 1. Determine the corresponding position of the measurement data that meets the cursor trigger mechanism on the measurement curve; 2. Display the cursor at the determined position (display a single cursor for a data point, double cursors for segment data, multiple cursors for multi-point data, etc.); 3. On the measurement curve, the measurement data that meets the cursor trigger mechanism is marked according to the set rules to emphasize the display of this part of the data; for example, marking the segment of the curve in red, or making the segment of the curve bold, etc.

[0032] Furthermore, the measurement interface displays the corresponding measurement data, cursor position, and corresponding measurement standard data. This measurement standard data is automatically matched to the cursor trigger process when the user selects the measurement type. Furthermore, other calculations can be performed on the corresponding measurement data based on user-defined requirements (implemented during the configuration step), such as calculating differences and curve slopes.

[0033] In an embodiment of the present invention, a sliding window variance analysis is introduced. That is, the cursor trigger mechanism is adjusted in real time according to the noise level of the measurement signal. When the signal noise is greater than the threshold, the tolerance of the trigger threshold is automatically increased to avoid false triggering. For example, when the detected curve standard deviation exceeds 5% of the rated value, the cursor trigger mechanism automatically modifies the measurement parameter associated with the configuration control by ±3%.

[0034] The present invention also proposes a measuring device for high and low voltage ride through test, such as Figure 5 As shown, including: Configuration unit 1 is used to configure a cursor trigger mechanism and generate a cursor trigger process based on the cursor trigger mechanism.

[0035] The measuring unit 2 is used to perform measurement and obtain measurement data.

[0036] The display unit 3 is used to display the measurement data in a curve form.

[0037] The cursor trigger unit 4 is used to detect the measurement data in a sliding window manner. When the measurement data meets the cursor trigger mechanism, the cursor trigger process is started; the cursor trigger process is configured to: determine the position of the measurement data that meets the cursor trigger mechanism on the measurement curve; display the cursor at the determined position and identify the corresponding measurement data according to the set rules.

[0038] The editing unit 5 is used to create configuration controls and display them on the configuration interface of the display unit; create a programmable data stream for the measurement data based on the configuration controls selected by the user and in combination with the measurement standard; and generate a cursor trigger mechanism based on the programmable data stream.

[0039] The calculation unit 6 is used to calculate the measurement data of the cursor position and control the display of the measurement data and measurement standard data on the measurement interface of the display unit.

[0040] The adaptive adjustment unit 7 is configured to update the cursor trigger mechanism according to the noise level of the measurement data.

[0041] In some embodiments of the present invention, the configuration unit 1 is further configured to set the configuration control as an editable control, receive measurement parameters input by a user, and use the measurement parameters to create a programmable data stream after being triggered and confirmed.

[0042] The specific measurement method of the device has been described in detail and will not be repeated here.

[0043] It should be noted that, in the specific implementation process, the above-mentioned control part is implemented by executing computer execution instructions in the form of software stored in the FPGA execution memory, which will not be described in detail here. The programs corresponding to the actions performed by the above-mentioned control circuit can be stored in the form of software in the FPGA-readable storage medium of the system, so that the FPGA can call and execute the operations corresponding to the above-mentioned modules.

[0044] The computer-readable storage medium mentioned above may include volatile memory, such as random access memory; may also include non-volatile memory, such as read-only memory, flash memory, hard disk or solid-state drive; may also include a combination of the above types of memory.

[0045] The processor mentioned above can also be a collective term for multiple processing elements. For example, the processor can be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices (PLDs), discrete gate or transistor logic devices (LDDs), discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor, etc., and can also be a special-purpose processor.

[0046] It should be pointed out that the above description is not a limitation of the present invention, and the present invention is not limited to the above examples. Changes, modifications, additions or substitutions made by ordinary technicians in this technical field within the essential scope of the present invention should also fall within the scope of protection of the present invention.

Claims

1. A measurement method for high and low voltage ride-through test, characterized in that: include: Configure the cursor trigger mechanism and generate the cursor trigger process based on the cursor trigger mechanism; Acquiring measurement data and displaying the measurement data in a curve form; Detecting the measurement data in a sliding window manner, and starting the cursor trigger process when the measurement data meets the cursor trigger mechanism; The cursor trigger process is configured as follows: Determine the position of the measurement data on the measurement curve that satisfies the cursor trigger mechanism; The cursor is displayed at the determined position and the corresponding measurement data is identified according to the set rules.

2. The measurement method for high and low voltage ride through test according to claim 1, characterized in that: Before configuring the cursor trigger mechanism, the method further includes: Create configuration controls and display them on the configuration interface; Create programmable data streams for measurement data based on user-selected configuration controls and incorporating measurement standards; The vernier trigger mechanism is generated according to the programmable data flow.

3. The measurement method for high and low voltage ride through test according to claim 2, characterized in that: The method further comprises: The configuration control is set as an editable control to receive measurement parameters input by a user, and after being triggered and confirmed, the measurement parameters are used to create the programmable data flow.

4. The measurement method for high and low voltage ride through test according to claim 1, characterized in that: The method further comprises: Displays the measurement data and measurement standard data of the cursor position.

5. The measurement method for high and low voltage ride through test according to claim 1, characterized in that: The method further comprises: The vernier trigger mechanism is updated based on the noise level of the measurement signal.

6. A measuring device for high and low voltage ride through test, characterized in that: include: A configuration unit is used to configure a cursor trigger mechanism and generate a cursor trigger process based on the cursor trigger mechanism; A measuring unit, used for performing measurement and acquiring measurement data; A display unit, configured to display the measurement data in a curve form; A cursor trigger unit is used to detect the measurement data in a sliding window manner, and when the measurement data meets the cursor trigger mechanism, start the cursor trigger process; The cursor trigger process is configured as follows: Determine the position of the measurement data on the measurement curve that satisfies the cursor trigger mechanism; The cursor is displayed at the determined position and the corresponding measurement data is identified according to the set rules.

7. The measuring device for high and low voltage ride through test according to claim 6, characterized in that: The device further comprises: The editing unit is used to create a configuration control and display it on the configuration interface of the display unit; based on the configuration control selected by the user, a programmable data stream is created for the measurement data in combination with the measurement standard; and the cursor trigger mechanism is generated according to the programmable data stream.

8. The measuring device for high and low voltage ride through test according to claim 7, characterized in that: The configuration unit is further configured to: The configuration control is set as an editable control to receive measurement parameters input by a user, and after being triggered and confirmed, the measurement parameters are used to create the programmable data flow.

9. The measuring device for high and low voltage ride through test according to claim 6, characterized in that: The device further comprises: The calculation unit is used to calculate the measurement data of the cursor position and control the display of the measurement data and measurement standard data on the measurement interface of the display unit.

10. The measuring device for high and low voltage ride through test according to claim 6, characterized in that: The device further comprises: An adaptive adjustment unit is configured to update the cursor trigger mechanism according to a noise level of the measurement data.

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