A business function testing method, device, medium and product
By directly connecting the test host and test equipment within a local area network, the problem of low testing efficiency within multiple test fixtures is solved, enabling parallel processing and flexible partitioning within the local area network, thus improving the efficiency of functional testing.
Patent Information
- Application Number
- CN202511196911.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-26
- Publication Date
- 2025-10-28
- Estimated Expiration
- 2045-08-26
AI Technical Summary
In functional testing, multiple test hosts and test devices within multiple test fixtures are connected to the central server. This means that the system can only restart after the test devices in the same group have been found and completed, which increases the search waiting time and reduces testing efficiency.
By assigning multiple test hosts and test devices to the same local area network (LAN), a direct communication connection is formed between the target test host and the target test device. The search and waiting process only occurs within the LAN, narrowing the search scope and allowing for parallel processing of the target test devices within the LAN, thereby improving testing efficiency.
It enables flexible partitioning and parallel processing of target test devices within a local area network, shortens the search waiting time, and improves the efficiency and flexibility of functional testing.
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Figure CN120692195B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of computer technology, and in particular to a business function testing method, apparatus, medium, and product. Background Technology
[0002] When functional test fixtures test test devices, a one-to-many connection (one test host and multiple test devices) is typically used as a group. Multiple test fixture groups are all connected to a central server. If one test device completes testing, it must wait for the other test devices in the same group to complete their tests before the test host belonging to the same group can be restarted to test the next function. During this waiting period, the central server needs to be checked to see if the device is in the same group. Every time a test device completes testing, the central server must be checked to see if it is in the same group or if it corresponds to a server in the same group. This search process takes a significant amount of time, reducing the overall testing efficiency of the functional tests.
[0003] Therefore, improving the efficiency of functional testing is a problem that urgently needs to be solved by those skilled in the art. Summary of the Invention
[0004] This application provides a business function testing method, apparatus, medium, and product to at least solve the problem in related technologies where multiple test hosts and multiple test devices in multiple test fixtures are all connected to a central server, and there is no communication connection between the test hosts and test devices, which requires the search process to traverse all test devices, resulting in reduced testing efficiency.
[0005] This application provides a service function testing method applied to a service function testing device, including a controller, multiple test hosts, and multiple test devices; the multiple test hosts and multiple test devices are all connected to the controller, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are located within the same local area network; the method includes:
[0006] Identify the target test host and target test device within the current local area network;
[0007] While controlling the target test host to complete the functional test of one of the target test devices, locate and wait for other target test devices in the same local area network to perform functional tests.
[0008] After the target test device in the current local area network has completed the test, restart the target test host and the target test device in the same local area network to proceed to the next functional test.
[0009] This application provides a business function testing device, including a controller, multiple test hosts, and multiple test devices;
[0010] Multiple test hosts and multiple test devices are connected to the controller, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are in the same local area network;
[0011] The controller is used to execute the steps of the business function testing method described above.
[0012] This application also provides a computer-readable storage medium storing a computer program, wherein when the computer program is executed by a processor, it implements the steps of any of the above-described business function testing methods.
[0013] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of any of the above-described business function testing methods.
[0014] This application addresses the issue that conventional solutions connect multiple test hosts and devices within multiple test fixtures to a central server. This results in a time-consuming process of searching and waiting for other devices in the same group to complete their tests before restarting, as each device's completion requires a significant amount of time. Firstly, this application addresses a functional testing device where multiple test hosts and devices are connected to a controller. The target test host and at least one target test device are located on the same local area network (LAN), establishing a direct communication connection. This allows functional testing to focus on the target test host and at least one target test device within the same LAN, reducing the search and waiting scope. Compared to the conventional approach of connecting all test hosts and devices to a central server, which requires searching and waiting across all devices, this application only requires searching within the LAN. Secondly, the target test host and at least one target test device among multiple test hosts are located within the same local area network (LAN), enabling flexible partitioning of test hosts and test devices. This LAN-based isolation improves the flexibility and versatility of testing for different functional requirements. Thirdly, due to the presence of multiple LANs, the controller can perform functional testing within multiple LANs while simultaneously performing parallel processing for finding target test devices within each LAN. It controls one target test device in the current LAN to complete its functional test, searches for and waits for other target test devices in the same LAN to perform their functional tests, and then restarts the target test host and the corresponding target test device after the current LAN's test is complete. Compared to conventional solutions where only one test device can be searched at a time, this application improves testing efficiency by employing LAN isolation.
[0015] Therefore, this solution addresses the technical problem of reduced testing efficiency caused by multiple test hosts and test devices within multiple test fixtures all being connected to a central server, and the lack of communication between the test hosts and test devices necessitating a search process that traverses all test devices. The solution achieves direct communication between the target test host and at least one target test device within a single local area network (LAN). Users only need to monitor the testing progress of the target test device within that LAN, narrowing the search waiting range while enabling parallel processing of the search for target test devices within each LAN, thus improving testing efficiency. Attached Figure Description
[0016] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a schematic diagram of a business function testing scenario in a conventional technical solution;
[0018] Figure 2 This is a schematic diagram of a single-point interconnection between the test host and the test equipment in a conventional technical solution.
[0019] Figure 3 This is a schematic diagram of a one-to-two interconnection between the test host and the test equipment in a conventional technical solution.
[0020] Figure 4 A flowchart of a business function testing method provided in this application embodiment;
[0021] Figure 5 A structural diagram of a service function testing device provided in an embodiment of this application;
[0022] Figure 6 Flowchart of another business function testing method provided in the embodiments of this application;
[0023] Figure 7 A structural diagram of another service function testing device provided in the embodiments of this application;
[0024] Figure 8 This is a schematic diagram illustrating the communication interaction between two local area networks provided in an embodiment of this application.
[0025] Figure 9 A pin diagram of a switch port provided in an embodiment of this application;
[0026] Figure 10 This is a structural diagram of a service function testing device provided in an embodiment of this application. Detailed Implementation
[0027] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.
[0028] It should be noted that, in the description of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. The terms "first," "second," etc., in this application are used to distinguish similar objects and are not used to describe a specific order or sequence.
[0029] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0030] As the cornerstone of artificial intelligence, the data processing capabilities of the Data Processing Unit (DPU) card have become an important technology for enterprises to improve their competitiveness and seize opportunities. In the DPU design process, in order to reduce R&D costs, various factories will integrate more and more functions into one device, and then implement different functions by writing different software according to specific business scenarios, thereby maximizing the utilization of hardware.
[0031] In traditional server manufacturing, Functional Circuit Test (FCT) plays a crucial role as the final step in quality control. In DPU FCT testing, engineers need to flash different firmware for different business scenarios and perform corresponding functional tests. Switching firmware or business scenarios requires system restarts, which means that a single board requires multiple restarts or state transitions between itself and the server during testing. The network card and server are interdependent during these state transitions, yet they cannot communicate directly. Therefore, if one device malfunctions, the entire process cannot execute correctly, making programming increasingly difficult for developers and reducing production yield. For daily production of several thousand units, FCT capacity becomes a bottleneck, severely impacting output. To increase output, factories prepare numerous FCT test stations and fixtures, each costing hundreds of thousands of dollars, significantly increasing the factory's burden.
[0032] The conventional technical solution is to have one network card corresponding to one server. This single-point interconnection will waste the server's resource utilization during functional business testing. Therefore, a method of communication and interaction is used where multiple network cards correspond to one server. Figure 1 This is a schematic diagram of a business function testing scenario in a conventional technical solution, such as... Figure 1 As shown, each network card (test device) Figure 1 (represented by devices) and each server (test host, Figure 1 (In this example, all network cards, represented by hosts, are connected to a central server.) There is no direct connection between the network cards and the servers; all communication is handled through the central server. During functional testing, some network cards are assigned to server A for testing, while others are assigned to server B. On server A, multiple network cards are being tested simultaneously. This can lead to a situation where network card 1 finishes testing, then network card 2 waits, then network card 3, and so on, until all network cards on server A have completed their current functional tests before the server can be restarted. However, this waiting process requires traversing all network cards across all servers, necessitating manual intervention and collective waiting. During this waiting process, the central server is needed to determine which network card is controlling which server. This entire traversal and search process consumes a significant amount of time, sometimes even longer than the functional testing itself, resulting in reduced overall testing efficiency.
[0033] In the FCT testing solution, the test host and test equipment are connected at a single point. Figure 2 This is a schematic diagram of a single-point interconnection between the test host and test equipment in a conventional technical solution, such as... Figure 2 As shown, the status of the other end needs to be constantly checked during the test before proceeding to the next verification step. If any device experiences a startup anomaly, manual intervention is required. To improve production efficiency, in a one-to-two testing process... Figure 3 This is a schematic diagram illustrating a one-to-two interconnection between the test host and test equipment in a conventional technical solution, such as... Figure 3 As shown, the test host can only continue testing if all DPUs are in normal condition. If individual devices have software or hardware abnormalities, the test cannot continue. In the R&D stage, the test yield is generally low, the test pass rate is very low, and the production capacity is very poor.
[0034] The business function testing method provided in this application can solve the above-mentioned technical problems.
[0035] This application provides a business function testing method, applied to a business function testing device, including a controller, multiple test hosts, and multiple test devices; the multiple test hosts and multiple test devices are all connected to the controller, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are in the same local area network; Figure 4 A flowchart of a business function testing method provided in this application embodiment is shown below. Figure 4 As shown, the method includes:
[0036] S11: Determine the target test host and target test device within the current local area network;
[0037] S12: While controlling the target test host to complete the functional test of one of the target test devices, search for and wait for other target test devices in the same local area network to perform functional tests.
[0038] S13: After the target test device in the current local area network has completed the test, restart the target test host and the target test device in the same local area network to proceed to the next functional test.
[0039] Specifically, the target test host and target test device within the current local area network (LAN) are identified. It should be noted that this step assumes the LAN has already been established and the target test host and target test device for communication connections within the LAN have been clearly identified. First, after the device is powered on, its configuration information is read, primarily including control commands, the number of test hosts and test devices, input / output port (IO port) device information, and LAN functionality. The presence status of the test host and test devices needs to be checked to complete initialization.
[0040] In step S12, during the current functional test, the target test host synchronously tests all target test devices directly connected to it. If one target test device has completed its functional test (i.e., the first target test device has finished), it needs to check whether the other target test devices have also completed their functional tests. This check only checks the progress of the target test devices within the current local area network. If any target test devices have not yet completed their current functional test, it is necessary to wait. This check is determined by checking the device serial number of the completed target test devices. Only after all target test devices within the current local area network have completed their tests can the target test host and target test devices be restarted to proceed to the next functional test. The restart process requires first restarting the target test host, and then restarting the target test devices after a successful restart.
[0041] This application addresses the issue that conventional solutions connect multiple test hosts and devices within multiple test fixtures to a central server. This results in a time-consuming process of searching and waiting for other devices in the same group to complete their tests before restarting, as each device's completion requires a significant amount of time. Firstly, this application addresses a functional testing device where multiple test hosts and devices are connected to a controller. The target test host and at least one target test device are located on the same local area network (LAN), establishing a direct communication connection. This allows functional testing to focus on the target test host and at least one target test device within the same LAN, reducing the search and waiting scope. Compared to the conventional approach of connecting all test hosts and devices to a central server, which requires searching and waiting across all devices, this application only requires searching within the LAN. Secondly, the target test host and at least one target test device among multiple test hosts are located within the same local area network (LAN), enabling flexible partitioning of test hosts and test devices. This LAN-based isolation improves the flexibility and versatility of testing for different functional requirements. Thirdly, due to the presence of multiple LANs, the controller can perform functional testing within multiple LANs while simultaneously performing parallel processing for finding target test devices within each LAN. It controls one target test device in the current LAN to complete its functional test, searches for and waits for other target test devices in the same LAN to perform their functional tests, and then restarts the target test host and the corresponding target test device after the current LAN's test is complete. Compared to conventional solutions where only one test device can be searched at a time, this application improves testing efficiency by employing LAN isolation.
[0042] Therefore, this solution addresses the technical problem of reduced testing efficiency caused by multiple test hosts and test devices within multiple test fixtures all being connected to a central server, and the lack of communication between the test hosts and test devices necessitating a search process that traverses all test devices. The solution achieves direct communication between the target test host and at least one target test device within a single local area network (LAN). Users only need to monitor the testing progress of the target test device within that LAN, narrowing the search waiting range while enabling parallel processing of the search for target test devices within each LAN, thus improving testing efficiency.
[0043] In some embodiments, the system further includes a port extender and a logic device; the port extender includes multiple switches; the multiple switches are sequentially connected to enable inter-switch communication; multiple test hosts and multiple test devices are each connected to the ports of their respective switches; and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are each connected to the ports of a switch providing the same local area network; the logic device is connected to the multiple test hosts and multiple test devices, and the logic device is connected to a controller; before controlling the target test host to complete functional testing on one of the target test devices, the system further includes:
[0044] Determine the device information of the target test equipment and the configuration information of the target test host;
[0045] If the device information matches the configuration information, it is determined that the device information meets the test conditions, and a power-on command is sent to the target test host to complete the power-on of the target test host.
[0046] If the device information and configuration information do not match, determine that the device status of the target test host is abnormal, the device status display of the corresponding control logic device is abnormal, and stop the functional test in the current local area network.
[0047] Specifically, before conducting functional testing, it is necessary to check whether the target test host and target test device are in normal working order. Functional testing can only proceed if they are in normal working order. First, determine the device information and configuration information of the target test device. The device information can be the performance parameters of the target test device. The configuration information is the configuration settings corresponding to the target test host, such as Internet Protocol Address (IP) information, subnet mask, and gateway.
[0048] If the device information matches the configuration information, the device information is deemed to meet the test conditions, and a power-on command is sent to the target test host to power it on. If they do not match, it is necessary to determine that the target test host's device status is abnormal. In this case, the corresponding device status display of the control logic device needs to be abnormal, which can be indicated by a light-emitting diode (LED). Functional tests within the current local area network need to be stopped to facilitate the replacement of the target test host.
[0049] Before conducting functional testing, this embodiment requires ensuring that the target test host is in a normal state, completing the initialization of the target test host, and ensuring that the target test device meets the test conditions, thus providing a guarantee for subsequent functional testing.
[0050] In some embodiments, after the target test host is powered on, the method further includes:
[0051] Send a power-on command to the target test device to power it on;
[0052] If the device status of the target test device is abnormal during the power-on process, the device status display of the corresponding control logic device will be abnormal, and the functional test in the current local area network will be stopped.
[0053] If the target test device is in normal condition, the process proceeds to the step of controlling the target test host to complete the functional test on one of the target test devices.
[0054] Specifically, after powering on the target test host, a power-on command needs to be issued to power on the target test device. If the target test device is in an abnormal state, the corresponding device status display of the control logic device needs to be displayed as abnormal, and the functional test should be stopped. If the device status is normal, subsequent functional tests can be performed.
[0055] This embodiment provides a method to perform a power-on test on the target test device after the target test host has been powered on, ensuring that the target test device is in a normal state before proceeding with subsequent functional tests.
[0056] In some embodiments, the partitioning process between target test hosts of multiple test hosts and at least one target test device of multiple test devices includes:
[0057] Determine the business function and / or product type corresponding to the functional test;
[0058] Use the test equipment corresponding to the same business function and / or the same product type as the target test equipment;
[0059] Among multiple test hosts, the test host with the highest overall capabilities is selected based on business functions and / or product type, and used as the target test host;
[0060] The target test device and the target test host are placed in the same local area network.
[0061] It should be noted that the matching of device information of the target test device and configuration information of the target test host in the above embodiments corresponds to the compatibility between the target test device and the target test host. The current partitioning process is for partitioning within the same local area network to determine the number of target test devices within that local area network. The partitioning basis here can be based on business capabilities, product type, or a combination of both.
[0062] Test devices corresponding to the same business function and / or the same product type are selected as target test devices. Based on this, and considering the factors mentioned above, the test host with the highest overall capabilities is selected as the target test host. This selection process is based on the set of test hosts that can match the target test device. The target test devices and target test hosts are then placed on the same local area network to complete the partitioning process.
[0063] The partitioning process provided in this embodiment uses business functions and / or product types as the basis for partitioning, enabling flexible partitioning of test hosts and test devices within the same local area network and improving the decoupling function of functional testing.
[0064] In some embodiments, locating and waiting for other target test devices within the same local area network to perform functional testing includes:
[0065] The functional test constraints of the target test host and multiple target test devices in the current local area network are pre-mapped using an instruction set method;
[0066] The boot operation of the target test host within the current local area network is processed by the host boot command setting, and the host boot command setting command sequence number is set.
[0067] Determine the device serial number corresponding to the target test host and multiple target test devices;
[0068] Set the device serial number dependency of multiple target test devices to the instruction serial number of the host power-on command;
[0069] After powering on the target test host using the host power-on command, power on multiple target test devices according to the dependency conditions to perform current function testing;
[0070] One of the target test devices is designated as the first target test device, and the other target test devices are designated as the second target test devices.
[0071] If the current functional test is completed in the second target test device, receive the device serial number of the second target test device fed back by the target test host;
[0072] If the device serial number of the second target test device is the same as the recorded device serial number of the second target test device, then it is determined that multiple second target test devices have completed the current functional test.
[0073] Specifically, during the search and waiting period, various commonly used collaborative command functions will be provided, allowing users to focus solely on the business logic. The functional test constraints of the target test host and multiple target test devices within the current local area network are pre-mapped using command sets. These functional test constraints stipulate that the target test device can only be restarted after the target test host has been restarted.
[0074] The power-on process for the target test host involves mapping it to a command, specifically a host power-on command, which is then assigned a command sequence number. This determines the corresponding device sequence number for the target test host and the multiple target test devices.
[0075] The device serial numbers of multiple target test devices are set to the instruction serial numbers corresponding to the host power-on command. After the test host is powered on, the multiple target test devices are powered on according to the dependency conditions corresponding to the instruction serial numbers to complete the current functional test.
[0076] Since there are multiple second target test devices, when one second target test device completes the current functional test, the device serial number of that second target test device is received and checked against the recorded device serial number. If they match, it means that all test devices of the second target test device have completed the current functional test. Table 1 is the instruction function table. As shown in Table 1, Sequence: A numerical sequence of instructions, uniquely represented, providing lookup for subsequent dependencies. Instruction Identifier (ID): The identifier for execution, coordinating with the system's working instruction ID to call the instruction. Instruction Set: A combination of instructions under the Linux system, which can be multiple. Dependency Conditions: Conditions that must be met before the current instruction is executed by setting dependencies. If the dependency value is not empty, the instruction sequence in the dependency must be executed first before executing the current instruction. Device: 1) represents the test host, 2) represents the test device.
[0077] Table 1
[0078]
[0079] Taking a test host and a test device as an example, if the test device completes the firmware upgrade and needs to be restarted, the business requires that all test devices must complete the restart before the test host can be restarted. After the restart is completed, the business test can be performed. At this time, the configuration command sequence (3) and (4) can be completed. When the main device restarts (4), the test device must complete the restart (3) before the business test can continue.
[0080] The power-on collaborative control method and functional testing method between the test host and the test equipment provided in this embodiment are completed through command functions, which simplifies the complexity of control operations and improves execution efficiency.
[0081] In some embodiments, the target test host and the target test device on the same local area network are restarted to perform the next functional test, including:
[0082] The restart operation of the target test host within the current local area network is handled by the host restart command setting, and the host restart command is set with a command sequence number.
[0083] Set the restart dependency condition of the device serial numbers of multiple target test devices to the instruction serial number of the host restart command;
[0084] After restarting the target test host using the host restart command, restart multiple target test devices according to the restart dependencies to proceed with the next functional test.
[0085] As shown in Table 1, after completing the current functional test, the target test host and target test devices need to be restarted before the next functional test. The restart operation is processed by the host restart command, such as Power cycle. The host restart command is set as the command sequence number, such as sequence number (7). The restart dependency condition of the device sequence numbers of multiple target test devices is set as the command sequence number executed by the host restart, and the sequence number (7) is depended on in this process. After restarting the target test host through the host restart command, the multiple target test devices are restarted according to the restart dependency condition in order to perform the next functional test.
[0086] This embodiment requires restarting the target test host and target test device within the current local area network after the current function test is completed and before switching to the next function test. During the restart operation, the restart is limited by the restart dependency conditions, focuses only on the business itself, and improves the execution efficiency through command execution.
[0087] In some embodiments, the direct memory access configuration process corresponding to functional testing of the target test host and multiple target test devices includes:
[0088] Configure and process the registers of multiple target test devices according to the direct memory access configuration scenario;
[0089] When the target test host restarts, the completeness of register settings for multiple target test devices is checked and processed according to the host restart command of the target test host;
[0090] If the target test equipment has an abnormal status, then the target test equipment with the abnormal status will be skipped.
[0091] If the registration settings of the target test device are incomplete, a preset time will be set.
[0092] If the registers of the target test device are still not set by the preset time, it is determined that the device status of the target test device that has not completed the setting by the preset time is abnormal.
[0093] If the target test device's registers are not fully configured by the preset time, the target test host will be restarted to complete the direct memory access configuration process.
[0094] Specifically, in Direct Memory Access (DMA) testing involving test equipment, the DPU needs to be instructed to configure the Field-Programmable Gate Array (FPGA) registers. This means configuring the registers of multiple target test equipment according to the DMA configuration scenario. Then, the collaborative system is notified to perform a host restart, and the completion status of register configuration for multiple target test equipment is checked based on the host restart command from the target test host.
[0095] When the collaborative system receives a host restart request, it first checks whether all target test devices have completed FPGA register settings. Target test devices that have failed abnormal tests will no longer be checked. That is, if there are target test devices with abnormal device status, the target test devices with abnormal device status will be skipped.
[0096] If a target test device has not completed the setup, continue to wait until the timeout period expires and the target test device fails to be notified of the setup error. In other words, if the setup status of the registers of a target test device is still not completed when the preset time is reached, it is determined that the device status of the target test device that has not completed the setup after the preset time is abnormal.
[0097] If all target test devices have completed setup, the host will restart. After restarting, the collaborative system will notify all target test devices to perform DMA testing, and the host configuration update status will be completed.
[0098] This embodiment provides a DMA scenario test for host configuration changes. After the test is completed, it ensures fast and efficient data transmission, enhancing system reliability. The test also allows for the timely detection of test equipment problems, preventing functional test failures due to equipment malfunctions.
[0099] In some embodiments, the service function testing apparatus further includes a video imaging device and a network interface card (NIC) device; the controller is connected to the video imaging device and the NIC device; the method further includes:
[0100] Collect the first test log during the current functional testing of the target test host;
[0101] Collect corresponding second test logs during the current functional testing of multiple target test devices;
[0102] The first test log and multiple second test logs are merged to obtain the third test log;
[0103] The third test log is displayed using a video imaging device and uploaded to the central server via a network card device.
[0104] Specifically, test logs need to be collected and merged during the current functional testing of the target test host and multiple target test devices, and then displayed through video imaging devices and uploaded to the central server through network card devices.
[0105] Figure 5 A structural diagram of a service function testing device provided in this application embodiment is shown below. Figure 5 As shown, the device boards connect via RJ45 Ethernet ports, which are common in Graphics Processing Units (GPUs), DPUs, and test hosts, using standard network cables. For vulnerable device boards, a decoupled module design is employed to reduce maintenance complexity and repair costs. The testing setup uses a Video Graphics Array (VGA) device to display the real-time progress of each device for easy monitoring by testers. Test logs are integrated and uploaded to the central server via a Virtual Local Area Network (VLAN) port.
[0106] Figure 6 A flowchart of another business function testing method provided in this application embodiment is shown below. Figure 6 As shown, the steps are as follows:
[0107] 1. After the collaborative system is powered on, it first reads the configuration information of the current DPU test machine, including reading control commands, the number of target test hosts and target test devices, and the corresponding IO port device information. At the same time, it interconnects each target test device and target test host through the VLAN function of the switch, checks the presence status of each device according to the number, lights up the indicator light, and completes the initialization.
[0108] 2. The collaborative system reads the information of the target test host and the target test device, establishes a connection between the target test host and the target test device, and displays the connection status of each device on the monitor.
[0109] 3. The collaborative system connects to the central server system to confirm the device information of each target test device, ensuring that the current device meets the normal testing conditions. The collaborative system sends a power-on command to the target test host to complete the power-on process. After the power-on is complete, it sends a command to notify the target test device to power on. If an anomaly occurs, the corresponding LED of the device will light up, and an alarm message will be displayed on the monitor, indicating that the current board test has failed. After a failure, the subsequent processes for the device on the corresponding port will not be tested.
[0110] 4. Issuing instructions: Based on diagnostic needs, the collaborative system can query information or set status for the target test host out of band, and query information or set status for all target test devices in normal state.
[0111] 5. Business Scenario Update: When a business scenario test is completed, each GPU / DPU card needs to update its firmware information. At this time, the collaborative system updates the firmware of all target test devices through the out-of-band system and monitors the update progress of each device. After the firmware update is completed, the wireless access controller (AC) command is sent to the corresponding target test device to restart until the new service replacement is completed. The collaborative system needs to check that all devices have completed the restart and are in normal condition before sending the command to the target test host to restart and complete the initialization operation of the server-side device.
[0112] 6. Host Configuration Change: When testing DMA scenarios involving the DPU, the collaborative system first instructs the DPU to configure the FPGA registers, and then notifies the collaborative system that a host restart is required. Upon receiving the host restart request, the collaborative system first checks whether all target test devices have completed the FPGA register configuration. Target test devices that have failed abnormal tests are no longer checked. If any target test device has not completed the configuration, it continues to wait until the timeout occurs and the unnotified target test device fails to complete the configuration. If all target test devices have completed the configuration, the host restarts. After the restart is complete, the collaborative system notifies all target test devices to perform DMA testing, and the host configuration update status is completed.
[0113] 7. The collaborative system repeats steps 4-6 for different business scenarios based on user settings until all instructions are executed.
[0114] 8. The collaborative system collects the test logs of the target test host, then queries the logs of each target test device in turn, and finally merges them into a complete test log, which is uploaded to the server system as the final test conclusion of the test device. Then, the test results are output through VGA to allow operators to quickly check the test status of each board.
[0115] The test logs corresponding to the target test host and target test equipment provided in this embodiment are displayed through video imaging equipment and uploaded to the central server through network card equipment, which facilitates observation and integration by testers and reduces maintenance complexity and repair costs.
[0116] Furthermore, this application also provides a business function testing device. Figure 7 A structural diagram of another service function testing device provided in the embodiments of this application is shown below. Figure 7 As shown, the device includes a controller 1, multiple test hosts, and multiple test devices;
[0117] Multiple test hosts and multiple test devices are connected to controller 1, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are in the same local area network;
[0118] Controller 1 is used to control the target test host in the current local area network to find and wait for other target test devices in the same local area network to complete their functional tests, and then restart the target test host and the target test devices in the same local area network to proceed to the next functional test.
[0119] Specifically, a controller connects multiple test hosts and multiple test devices. The number of test hosts and test devices connected depends on the number of ports the controller can provide. The controller can directly connect to the test hosts and test devices. Alternatively, to reduce the number of ports occupied by the controller, a port extender can be added to occupy one port on the controller, with both test hosts and test devices connected to the port extender. There is no limitation here; it can be configured according to the actual situation.
[0120] In this scenario, multiple target test hosts and at least one target test device are located within the same local area network (LAN). It's understood that within this LAN, both the target test hosts and at least one target test device support Ethernet communication, enabling direct communication between them. This contrasts with conventional solutions where direct connection is not used, but rather an indirect connection via a central server.
[0121] It's important to note that multiple test hosts and devices can exist across multiple local area networks (LANs). Test hosts and devices on different LANs cannot be simultaneously used. If a test host or device is used within a LAN, it will not be used again in subsequent LANs. In other words, a test host and a test device can only be used within one LAN. The division of multiple test hosts and devices within a LAN is not limited; they can be based on the same or similar services, or test devices under the same product, etc. The selection of test hosts can correspond to the performance requirements of the test host for that service or product. The selection process is not restricted and can be configured according to the actual situation.
[0122] Of course, this flexible division is not fixed after the first division, but can be further divided and expanded according to the current business or product needs after a batch of functional tests are completed. There are no restrictions on this.
[0123] Regarding the expansion of the test host and test equipment, feel free to expand as long as the number of ports can support it. Of course, expansion should also be appropriate based on the overall performance resources of the test setup.
[0124] Within the same local area network, there must be a target test host and at least one target test device to enable parallel service function testing in different local area networks.
[0125] The controller issues control commands to instruct the target test host within the current local area network (LAN) to perform functional tests on multiple target test devices within the same LAN. After one target test device completes its test, it needs to check if any other target test devices are still pending testing. If so, it needs to wait. This check only needs to examine the test devices within the current LAN, unlike conventional solutions that require checking the serial numbers and other information of all test devices on the LAN simultaneously to identify their testing status. During this search process, multiple LANs are searched and waited for simultaneously, which narrows the search scope and simplifies the search process and time compared to a single LAN.
[0126] If all target test devices within the same local area network have completed functional testing, the target test host and the corresponding target test devices need to be restarted before proceeding to the next functional test.
[0127] The business function testing device provided in this application has the same beneficial effects as the aforementioned business function testing method.
[0128] In some embodiments, considering that the controller's instructions are not limited to issuing instructions for business function testing, but may also involve monitoring device status and transmitting data, the number of ports is limited. If all controller ports are used in the test host and test equipment for business function testing, the number of ports will be insufficient, making it impossible to complete other normal operations. Therefore, a port extender 2 is also included;
[0129] Multiple test hosts and multiple test devices are connected to port extender 2;
[0130] Controller 1 is connected to port extender 2.
[0131] Specifically, multiple test hosts and multiple test devices are connected to a port extender. This port extender can be an integrated circuit, a network interface card, a serial port, or a network device like a switch; no specific limitation is made here. The port extender connects to the controller to receive commands from the controller, enabling the transmission of control commands to test hosts and test devices within different local area networks.
[0132] The port extender connection provided in this embodiment saves the port burden on the controller while ensuring that the controller can complete other operations such as non-business function testing normally, thereby realizing port expansion and management and achieving a one-to-many connection relationship between the controller.
[0133] In some embodiments, the port extender includes multiple switches; the multiple switches are connected in sequence to enable communication between the switches.
[0134] Multiple test hosts and multiple test devices are connected to the ports of their respective switches, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are all connected to the ports of the switch providing the same local area network.
[0135] Multiple switches are connected to the controller.
[0136] like Figure 7 As shown, a port extender includes multiple switches. This is because a port extender not only expands the number of ports but also expands network ports and enables data exchange. The switches are connected to each other via their respective internal ports, forming a sequential connection.
[0137] Figure 8 This is a schematic diagram illustrating the communication interaction between two local area networks provided in an embodiment of this application, such as... Figure 8 As shown, multiple test hosts and multiple test devices are connected to their respective switch ports. Each switch provides one local area network (LAN) function, meaning that one switch connects the target test host and at least one target test device. All switches are connected to the controller.
[0138] by Figure 8 For example, this testing device can support the control of various testing equipment. Figure 8 The two products each require a test host, and each test host supports four test devices for simultaneous testing. A single switch provides seven ports, with internal ports interconnected and six ports exposed externally. To prevent interference between devices sending information, VLANs are automatically configured for each port based on the number of test services.
[0139] The port extender provided in this embodiment includes switch functionality and directly supports VLAN configuration. Network administrators can complete port expansion and VLAN segmentation on a single device without needing to configure a separate switch. Configuration and monitoring can be performed through a unified management interface. Administrators can easily view and manage the status, traffic statistics, and VLAN configurations of all ports.
[0140] In some embodiments, logic devices are also included;
[0141] Logic device 3 is connected to multiple test hosts and multiple test devices to determine the device status of the corresponding connected test host or test device.
[0142] Logic device 3 is connected to controller 1.
[0143] It should be noted that the logic device can be a Complex Programmable Logic Device (CPLD) or other devices; no specific limitation is made here. The logic device connects to the test host and test equipment to determine the device status of each device. This mainly corresponds to the in-situ detection of the device and the LED control corresponding to the device status, facilitating a visual display of the test results for each device.
[0144] The logic device provided in this embodiment monitors the device status in real time, promptly detecting whether the device is in place, effectively avoiding system operation interruptions caused by device absence or failure, and reducing the impact of failures on functional testing. Simultaneously, it can quickly respond to changes in device status.
[0145] In some embodiments, the ports connecting multiple test hosts, multiple test devices and corresponding switches include power pins, switch pins and status pins.
[0146] The switch's power pins are also connected to the controller's power supply pins;
[0147] The status pins of the logic device are connected to the status pins of the switch.
[0148] Specifically, a port is used to connect external devices or internal components to achieve data transmission and communication. A port has multiple pin configurations, each responsible for transmitting a specific signal. A pin is the physical connection point of the port, used to transmit electrical signals. Pins are metal contact points, and each pin corresponds to a different function. Figure 9 A pin diagram of a switch port provided in an embodiment of this application is shown below. Figure 9 As shown, this includes data / command (DC) pins, power pins, switch pins, and status pins. Combined with... Figure 7 As you can see, the power supply pins of the switch are also connected to the power supply pins of the controller, and the status pins of the logic devices are connected to the status pins of the switch.
[0149] In factory production, peripheral interfaces are most susceptible to damage. To improve equipment durability and maintainability, the development board is decoupled. The board receives 3.3V power from the controller's power pins and transmits network information via a Media-Dependent Interface (MDI). To prevent improper installation by operators, a position detection signal is provided. If the device information does not match the configured device information, an alarm message is generated. The board provides three LEDs: R, B, and G, to indicate different states. B indicates normal operation, R indicates test abnormality, and G indicates test completion. These LEDs greatly facilitate operators in understanding the test status of each device.
[0150] The connection relationships between different pins within the port provided in this embodiment satisfy the functions of power supply, switch communication, and device presence detection, achieving port functionality diversity while also saving on the number of ports required.
[0151] In some embodiments, a video imaging device and a network interface card (NIC) device are also included;
[0152] The controller connects to a video imaging device to display test logs and test progress for functional testing;
[0153] The controller connects to the network interface card (NIC) device and is used to interact with the central server through the NIC device.
[0154] Figure 7 In this system, the controller also connects video imaging devices and network interface cards (NICs). The video imaging devices are VGA devices, which display detailed test logs and different test progresses for easy user viewing. The network interface cards (NICs) connect the test equipment to the central server via a network.
[0155] The connection relationship between the video image device, network card device and controller provided in this embodiment not only ensures the smooth completion of functional testing, but also facilitates user viewing and interaction with the central server, thereby improving the functional versatility of the testing device.
[0156] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method.
[0157] Embodiments of this application also provide a service function testing device. Figure 10 A structural diagram of a service function testing device provided in an embodiment of this application is shown below. Figure 10 As shown, the device includes:
[0158] Module 11 is used to determine the target test host and target test device within the current local area network;
[0159] The lookup module 12 is used to look up and wait for other target test devices in the same local area network to perform functional tests when the target test host is controlling the target test host to complete the functional test of one of the target test devices.
[0160] Restart module 13 is used to restart the target test host and the target test devices in the same local area network after the target test devices in the current local area network have completed the test, so as to carry out the next functional test.
[0161] For a description of the features in the embodiment corresponding to the business function testing equipment, please refer to the relevant description of the embodiment corresponding to the business function testing method, which will not be repeated here.
[0162] Embodiments of this application also provide an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to perform the steps in any of the above-described business function testing method embodiments.
[0163] Embodiments of this application also provide a computer-readable storage medium storing a computer program, wherein the computer program is configured to execute the steps in any of the above-described business function testing method embodiments at runtime.
[0164] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.
[0165] The embodiments of this application also provide a computer program product, which includes a computer program that, when executed by a processor, implements the steps in any of the above-described business function testing method embodiments.
[0166] Embodiments of this application also provide another computer program product, including a non-volatile computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps in any of the above-described business function testing method embodiments.
[0167] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.
[0168] The above provides a detailed description of the business function testing apparatus, method, medium, and product provided in this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the embodiments above are only intended to help understand the method and core ideas of this application. It should be noted that those skilled in the art can make various improvements and modifications to this application without departing from its principles, and these improvements and modifications also fall within the protection scope of this application.
Claims
1. A method for testing business functions, characterized in that, It is used in business function testing equipment, including a controller, multiple test hosts and multiple test devices; Multiple test hosts and multiple test devices are all connected to the controller, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are located within the same local area network; the method includes: Identify the target test host and target test device within the current local area network; While controlling the target test host to complete the functional test of one of the target test devices, locate and wait for other target test devices in the same local area network to perform functional tests. After the target test device in the current local area network has completed the test, restart the target test host and the target test device in the same local area network to proceed to the next functional test.
2. The business function testing method according to claim 1, characterized in that, It also includes port extenders and logic devices; the port extenders include multiple switches; the multiple switches are connected in sequence to enable communication between the switches, and multiple test hosts and multiple test devices are all connected to the ports of their respective switches, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are all connected to the ports of the switches providing the same local area network; the logic devices are connected to the multiple test hosts and multiple test devices, and the logic devices are connected to the controller; Before the host computer controls the target test device to complete the functional test on one of the target test devices, the following steps are also included: Determine the device information of the target test equipment and the configuration information of the target test host; If the device information matches the configuration information, it is determined that the device information meets the test conditions, and a power-on command is sent to the target test host to complete the power-on of the target test host; If the device information does not match the configuration information, it is determined that the device status of the target test host is abnormal, the device status display of the corresponding logic device is abnormal, and the functional test in the current local area network is stopped.
3. The business function testing method according to claim 2, characterized in that, After the target test host is powered on, the following steps are also included: A power-on command is sent to the target test device to power it on; If the device status of the target test device is abnormal during the power-on process, the device status display corresponding to the logic device will be abnormal, and the functional test in the current local area network will be stopped. If the target test device is in normal condition, the process proceeds to the step of controlling the target test host to complete the functional test on one of the target test devices.
4. The business function testing method according to claim 1, characterized in that, The partitioning process of target test hosts from multiple test hosts and at least one target test device from multiple test devices includes: Determine the business function and / or product type corresponding to the functional test; Use the test equipment corresponding to the same business function and / or the same product type as the target test equipment; Among multiple test hosts, the test host with the highest overall capabilities is selected based on business functions and / or product type, and used as the target test host; The target test device and the target test host are placed in the same local area network.
5. The business function testing method according to claim 3, characterized in that, Locate and wait for other target test devices within the same local area network to perform functional tests, including: The functional test constraints of the target test host and multiple target test devices in the current local area network are pre-mapped using an instruction set method; The power-on operation of the target test host within the current local area network is processed by the host power-on command setting, and the host power-on command setting command sequence number is set. Determine the device serial number corresponding to the target test host and multiple target test devices; The dependency condition of the device serial numbers of multiple target test devices is set to the instruction serial number of the host power-on instruction; After powering on the target test host using the host power-on command, power-on operations are performed on multiple target test devices according to the dependency conditions to perform the current function test; One of the target test devices is designated as the first target test device, and the other target test devices are designated as the second target test devices. If the current functional test is completed in the second target test device, the device serial number of the second target test device is received from the target test host. If the device serial number of the second target test device is the same as the device serial number recorded for the second target test device, then it is determined that multiple second target test devices have completed the current functional test.
6. The business function testing method according to claim 5, characterized in that, Restart the target test host and the target test device on the same local area network to proceed with the next functional test, including: The restart operation of the target test host within the current local area network is processed by the host restart command setting, and the host restart command is set with a command sequence number; The restart dependency condition of the device serial numbers of multiple target test devices is set to the instruction serial number of the host restart instruction; After restarting the target test host using the host restart command, multiple target test devices are restarted according to the restart dependency conditions in order to perform the next functional test.
7. The business function testing method according to claim 2, characterized in that, The direct memory access configuration process corresponding to the functional testing of the target test host and multiple target test devices includes: Configure and process the registers of multiple target test devices according to the direct memory access configuration scenario; When the target test host restarts, the completion status of the registers of multiple target test devices is checked and processed according to the host restart command of the target test host; If the target test equipment has an abnormal status, then the target test equipment with the abnormal status will be skipped. If the registration settings of the target test device are incomplete, a preset time will be set. If the registers of the target test device are still not set by the preset time, it is determined that the device status of the target test device that has not completed the setting by the preset time is abnormal. If the target test device's registers are not fully configured by the preset time, a restart operation is performed on the target test host to complete the direct memory access configuration process.
8. The business function testing method according to any one of claims 1 to 7, characterized in that, The service function testing device also includes video imaging equipment and network card equipment; the controller is connected to the video imaging equipment and the network card equipment; the method also includes: Collect the first test log during the current functional testing of the target test host; Collect corresponding second test logs during the current functional testing of multiple target test devices; The first test log and multiple second test logs are merged to obtain the third test log; The third test log is displayed using a video imaging device and uploaded to the central server via a network card device.
9. A business function testing device, characterized in that, Includes a controller, multiple test hosts, and multiple test devices; Multiple test hosts and multiple test devices are connected to the controller, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are in the same local area network; The controller is used to execute the steps of the business function testing method according to any one of claims 1 to 8.
10. The business function testing device according to claim 9, characterized in that, It also includes port extenders; Multiple test hosts and multiple test devices are connected to the port extender; The controller is connected to the port extender.
11. The business function testing device according to claim 10, characterized in that, The port extender includes multiple switches; the multiple switches are connected in sequence to enable communication between the switches. Multiple test hosts and multiple test devices are connected to the ports of their respective switches, and the target test hosts of the multiple test hosts and at least one target test device of the multiple test devices are all connected to the ports of the switch providing the same local area network. Multiple switches are connected to the controller.
12. The business function testing device according to claim 11, characterized in that, It also includes logic devices; The logic device is connected to multiple test hosts and multiple test devices to determine the device status of the corresponding connected test host or test device. The logic devices are connected to the controller.
13. The business function testing apparatus according to any one of claims 9 to 12, characterized in that, It also includes video imaging equipment and network interface card (NIC) devices; The controller is connected to the video image device and is used to display the test log and test progress of the functional test; The controller is connected to the network interface card (NIC) device and is used to interact with the central server through the NIC device.
14. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, it implements the steps of the business function testing method as described in any one of claims 1 to 8.
15. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the steps of the business function testing method as described in any one of claims 1 to 8.
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