Zinc oxide resistor disc AC / DC aging test device and test method

Abstract

The invention relates to the technical field of electrical engineering, and discloses a zinc oxide resistor disc alternating-current and direct-current aging test device and method, a main loop module of the aging test device applies an alternating-current high-voltage power supply or a direct-current high-voltage power supply to two ends of a test article to simulate continuous operation of the test article on a line, and a temperature control module sets a test temperature; the measurement data acquisition module measures data of each test article and uploads the data to the computer control module, and the computer control module controls the test process and displays, processes and exports the test data in real time; and the safety control module realizes safety detection and safety warning. The aging test method is applied to the aging test device. Different alternating-current voltages or direct-current voltages can be set at the same time, accelerated aging tests under different temperature and different voltage conditions can be carried out on zinc oxide resistor discs of different specifications, different test requirements are met, all test parameters can be measured and recorded in real time, and the device has the overcurrent and overtemperature fault protection function and is safe and reliable.

Description

Technical Field

[0001] The present disclosure relates to the field of electrical engineering technology, and in particular to an AC / DC aging test device and a test method for zinc oxide resistors. Background Art

[0002] Zinc oxide resistors are the core components of zinc oxide arresters. Composed primarily of zinc oxide and a small amount of additives, their properties directly determine the performance of the arrester. Under normal operating voltage, zinc oxide's resistance is very high, making it considered an insulator. However, under overvoltage, its resistance drops rapidly, limiting the overvoltage to a certain level. During the production and processing process, additives can be added to improve the electrical and mechanical properties of zinc oxide, enhancing its stability and reliability.

[0003] According to statistics from relevant departments, the proportion of transmission line trips caused by lightning strikes exceeds 30%. This is generally due to the lack of lightning protection devices installed on existing lines or the uneven quality of lightning protection devices installed, resulting in poor protection. Accelerated aging testing of zinc oxide resistant sheets is an important method for verifying the long-term operational stability and lifespan assessment of lightning arresters and is a key type test item. According to national or industry standards for lightning arresters, lightning arresters or their core component, zinc oxide resistant sheets, undergo accelerated AC aging testing at 115°C for 1000 hours to verify their long-term operational stability. However, the requirements for DC aging testing have not yet been clarified.

[0004] Therefore, in order to more realistically simulate the continuous pressurized environment of actual lines and more accurately evaluate the aging performance of lightning arresters or core component zinc oxide resistors, the field urgently needs suitable aging test equipment and test methods for zinc oxide resistors. Summary of the Invention

[0005] In order to solve the above technical problems, the present disclosure provides an AC / DC aging test device and test method for zinc oxide resistors to solve the technical problems that the lightning arrester aging test device in the prior art can only perform a single AC aging test, cannot truly simulate various continuous pressurized environments of actual lines, and is inconvenient to operate.

[0006] The present disclosure provides an AC / DC aging test device for zinc oxide resistors, comprising:

[0007] The main circuit module is configured to apply a continuous AC high voltage power supply or a DC high voltage power supply to both ends of the test product, simulating the test product to operate continuously on the line;

[0008] The temperature control module is configured to set the test temperature and automatically stabilize at the required test temperature;

[0009] The measurement data acquisition module is configured to measure the voltage and current parameters applied to the two ends of the test product by the main circuit module and the test temperature set by the temperature control module, perform data processing, and upload the data processing results to the computer control module;

[0010] The computer control module is configured to control the test process, display the test data in real time, process the test data, and export the test data;

[0011] The safety control module is configured to implement safety detection and safety warning based on the test data provided by the computer control module.

[0012] Optionally, a power supply module is further included, the power supply module is configured to output corresponding AC high-voltage power supply and DC high-voltage power supply, so that each test circuit can independently switch and select AC high-voltage power supply or DC high-voltage power supply;

[0013] The power supply module includes an AC regulated power supply, an AC high-voltage power supply, a DC high-voltage power supply, and an AC / DC switching mechanism; wherein the AC high-voltage power supply includes an AC voltage regulator and an AC transformer;

[0014] The AC voltage-stabilized power supply is electrically connected to the DC high-voltage power supply and the AC high-voltage power supply respectively, and an AC / DC switching mechanism is provided between the DC high-voltage power supply and the AC high-voltage power supply.

[0015] Optionally, the safety control module is also configured to implement a linked emergency stop based on the test data provided by the computer control module. If the voltage parameters and current parameters provided by the computer control module exceed the preset safety values, or if the device operates abnormally, an alarm signal is displayed and the device is controlled to stop operating.

[0016] Further optionally, the main circuit module includes multiple high-temperature and high-pressure sleeves, the temperature control module includes multiple high-temperature ovens for placing test products, and the power supply module is electrically connected to the multiple high-temperature ovens through the multiple high-temperature and high-pressure sleeves, so as to apply AC high-voltage power or DC high-voltage power of different amplitudes to the multiple high-temperature ovens.

[0017] Further optionally, the high-temperature oven includes an oven body and a control interface, the control interface is located on the front of the high-temperature oven, and the oven body includes a glass window.

[0018] Further optionally, the measurement data acquisition module includes a temperature sensor, a voltage sensor and a current sensor;

[0019] The temperature sensor is configured to measure the test temperature of the test article in the high-temperature oven in real time;

[0020] The voltage sensor is electrically connected to the high-temperature oven through a voltage connection, and the voltage sensor is configured to measure a voltage parameter applied to both ends of the test object by a main circuit module in the high-temperature oven;

[0021] The current sensor is electrically connected to the high-temperature oven through a current connection, and the current sensor is configured to measure current parameters applied to both ends of the test object by the main circuit module in the high-temperature oven;

[0022] The temperature sensor includes a temperature measuring probe PT100, the voltage sensor includes a resistor divider, and the current sensor includes a high-precision resistor.

[0023] Further optionally, the measurement data acquisition module also includes a data acquisition board and a communication component;

[0024] The data acquisition board is configured to collect data from the temperature sensor, the voltage sensor, and the current sensor, and perform data processing;

[0025] The communication component is configured to transmit the data processing results of the data acquisition board to the computer control module.

[0026] Optionally, the computer control module includes a charging control component, a temperature control component, a voltage control component, a display component, a data processing component, and a data export component;

[0027] The charging control component communicates with the power module, and the charging control component is configured to control whether the power module charges the device;

[0028] The temperature control assembly communicates with the temperature control module, and the temperature control assembly is configured to control a test temperature of the temperature control module;

[0029] The voltage control component communicates with the main circuit module, and the voltage control component is configured to control the application of an AC high voltage power supply or a DC high voltage power supply to both ends of the test product;

[0030] The display components are electrically connected to the measurement and data acquisition modules respectively, and the display components are configured to display the test temperature, voltage parameters, and current parameters measured by the measurement and data acquisition modules in real time;

[0031] The data processing component is configured to convert the test data measured by the measurement data acquisition module into waveform data in real time;

[0032] The data export component is configured to export the waveform data of the data processing component in real time and store and manage it on the host computer, making it convenient for users to query and export data.

[0033] Based on the same inventive concept, the present disclosure also provides an AC and DC aging test method for zinc oxide resistors, comprising:

[0034] Provide multiple zinc oxide resistors as test products and place them in multiple high-temperature ovens;

[0035] Provide corresponding AC high-voltage power supply and DC high-voltage power supply, so that each test circuit can independently switch and select AC high-voltage power supply or DC high-voltage power supply;

[0036] AC high-voltage power supply and DC high-voltage power supply are provided to different high-temperature ovens, so that the two ends of the test product in the high-temperature oven are continuously applied with AC high-voltage power supply or DC high-voltage power supply according to the test requirements, simulating the test product to run continuously on the line;

[0037] Set the test temperature in the high temperature oven and automatically stabilize at the required test temperature;

[0038] Measure the voltage and current parameters applied to the two ends of the test product and the test temperature of the high-temperature oven, process the data, and upload the data processing results to the host computer;

[0039] The host computer controls the test process, displays the test data in real time, processes the test data, and exports the test data;

[0040] Based on the test data provided by the host computer, safety detection and safety warning are realized.

[0041] Optionally, safety detection and safety warnings can be implemented based on the test data provided by the host computer, including: if the voltage parameters and current parameters provided by the host computer exceed the preset safety values, corresponding abnormal prompts will appear and the safety indicator light will light up;

[0042] If the door of the high-temperature oven is opened and the whole machine is powered off or the test product is powered off, an alarm signal will be displayed, the machine will stop running, and an emergency stop will be executed.

[0043] The technical solution provided by the embodiments of the present disclosure has the following advantages over the prior art:

[0044] The present invention provides an AC / DC aging test device and method for zinc oxide resistors, which achieves precise control of the temperature and AC / DC voltage at both ends of the zinc oxide resistor test sample, can continuously apply AC voltage or DC voltage to the test sample at different temperatures for accelerated aging, effectively simulating the continuous pressure condition of the zinc oxide resistor sample of a lightning protection product or a core component during actual circuit operation, and has the advantages of simple operation, high degree of automation, and safety and reliability. The present invention provides different AC high-voltage power supplies or DC high-voltage power supplies through a power module, and a temperature control module flexibly adjusts the test temperature, communicates with a computer control module, and cooperates with various mechanical components to achieve automatic control of the aging test process, real-time monitoring of the test status, obtain test data, analyze, manage, and export it, and can simultaneously set different AC voltages or DC voltages to perform accelerated aging tests on different specifications of lightning arresters or core components of zinc oxide resistors under different temperature and voltage conditions. By applying AC voltages or DC voltages of different amplitudes, different accelerated aging test requirements can be met, and various test parameters can be measured and automatically recorded in real time. At the same time, it has overcurrent and overtemperature fault protection functions, which can automatically cut off the fault circuit, ensuring safety and reliability. In addition, when the zinc oxide resistor AC and DC aging test device provided by the present invention conducts the zinc oxide resistor AC and DC aging test, the voltage can be adjusted within the range of 0-20kV, the output voltage change does not exceed 1%, the test temperature can be adjusted within the range of 0-200℃, and the voltage and current measurement accuracy difference does not exceed 1%. It can meet the AC and DC continuous pressure of 0-5000h at different temperatures for the entire 10kV lightning arrester or the zinc oxide resistor test product with a diameter of 30-100mm, and meet the AC and DC aging test requirements of lightning protection products or resistors. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0046] In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0047] Figure 1 This is a schematic structural diagram of an AC / DC aging test device for zinc oxide resistors provided in an embodiment of the present disclosure;

[0048] Figure 2 This is a schematic diagram of the AC and DC high-voltage circuit wiring between the power module and a single high-temperature oven provided by an embodiment of the present disclosure;

[0049] Figure 3This is a physical connection diagram of the AC / DC aging test device for zinc oxide resistors provided by an embodiment of the present disclosure;

[0050] Figure 4 yes Figure 1 A schematic block diagram of the connection structure between the measurement data acquisition module and the computer control module;

[0051] Figure 5 yes Figure 1 A schematic block diagram of the connection structure between the computer control module and other modules;

[0052] Figure 6 This is a flowchart of the AC and DC aging test method for zinc oxide resistors provided by the embodiment of the present disclosure;

[0053] Figure 7 yes Figure 6 Schematic diagram of the front view structure in which the test sample is placed in a single high-temperature oven in the test method;

[0054] Figure 8 yes Figure 6 A schematic side view of the structure in which the test article is placed in a single high-temperature oven in the test method;

[0055] Figure 9 yes Figure 6 Schematic diagram of the top view of the test sample placed in a single high-temperature oven in the test method. DETAILED DESCRIPTION

[0056] In order to more clearly understand the above-mentioned objectives, features and advantages of the present disclosure, the scheme of the present disclosure will be further described below. It should be noted that the embodiments of the present disclosure and the features therein can be combined with each other in the absence of conflict.

[0057] In the following description, many specific details are set forth to facilitate a full understanding of the present disclosure, but the present disclosure may also be implemented in other ways different from those described herein; it is obvious that the embodiments in the specification are only part of the embodiments of the present disclosure, rather than all of the embodiments.

[0058] Please refer to Figure 1 , Figure 1 This is a schematic structural diagram of an AC / DC aging test device for zinc oxide resistors provided in an embodiment of the present disclosure. The AC / DC aging test device for zinc oxide resistors provided in this embodiment includes:

[0059] The main circuit module 20 is configured to apply a continuous AC high voltage power supply or a DC high voltage power supply to both ends of the test product (such as a zinc oxide resistor) to simulate the test product running continuously on the line;

[0060] The temperature control module 30 is configured to set the test temperature and automatically stabilize at the desired test temperature;

[0061] The measurement and data acquisition module 40 is configured to measure the voltage and current parameters applied to the two ends of the test product by the main circuit module 20 and the test temperature set by the temperature control module 30, perform data processing, and upload the data processing results to the computer control module 50;

[0062] The computer control module 50 is configured to control the test process, display the test data in real time, process the test data, and export the test data;

[0063] The safety control module 60 is configured to perform safety detection and safety warnings based on the test data provided by the computer control module 50. Optionally, if the voltage parameters and current parameters provided by the computer control module 50 exceed the preset safety values, or if the device operates abnormally, an alarm signal is displayed and the device is controlled to stop operating.

[0064] Specifically, the zinc oxide resistor AC / DC aging test device provided in the present embodiment can be used to perform accelerated aging tests on zinc oxide resistor samples in lightning arresters, as an important means to verify the long-term operation stability and life assessment of lightning arresters. The zinc oxide resistor AC / DC aging test device includes a main circuit module 20, a temperature control module 30, a measurement and data acquisition module 40, a computer control module 50 and a safety control module 60. Optionally, it can also include a power supply module 10, wherein the power supply module 10 is used to output corresponding AC high-voltage power supply and DC high-voltage power supply, so that each test circuit can independently switch and select AC high-voltage power supply or DC high-voltage power supply. The main circuit module 20 is electrically connected to the power supply module 10 and the temperature control module 30. The main circuit module 20 can apply continuous AC high-voltage power supply or DC high-voltage power supply to both ends of the test product (such as zinc oxide resistor), simulating the test product to continuously run pressurized on the line. The temperature control module 30 includes multiple high-temperature ovens 301 for placing test products. The test products can be placed in the high-temperature ovens 301 for aging tests. The different high-temperature ovens 301 included in the temperature control module 30 can be set to different test temperatures and automatically stabilize at the required test temperature, so that the test temperature in each high-temperature oven 301 can be flexibly adjusted for different models or the same model of test products.

[0065] The measurement and data acquisition module 40 is electrically connected to the temperature control module 30 and the main circuit module 20, respectively. The measurement and data acquisition module 40 can measure the voltage and current parameters applied to the test object by the main circuit module 20 and the test temperature set by the temperature control module 30, perform data processing, and upload the data processing results to the computer control module 50. Optionally, the test data measured by the measurement and data acquisition module 40 can be processed by a data acquisition board, and the processed signals can be uploaded to the computer control module 50 via a communication component to achieve automatic and accurate measurement.

[0066] The computer control module 50 is configured to control the test process, display the test data in real time, process the test data, and export the test data. That is, the computer control module 50 has functions such as test process control, real-time display of test data, data processing, and data export, which is conducive to improving the convenience of control and test efficiency.

[0067] The safety control module 60 is configured to implement safety detection, safety warning and interlocked emergency stop based on the test data provided by the computer control module 50. If the voltage parameters and current parameters provided by the computer control module 50 exceed the preset safety values, or if the device operates abnormally, an alarm signal will be displayed and the device will be controlled to stop operating. That is, the safety control module 60 has a safety detection function, a safety indicator light and an interlocked emergency stop, etc. If the real-time voltage and real-time current monitored during the test exceed the safety value or the equipment is abnormal, an alarm signal will be displayed, which is conducive to improving the safety of personnel operation.

[0068] The AC / DC aging test device for zinc oxide resistors provided in this embodiment achieves precise control of the temperature and AC / DC voltage at both ends of the zinc oxide resistor test product, and can continuously apply AC voltage or DC voltage to the test product at different temperatures for accelerated aging, effectively simulating the continuous pressurization conditions of zinc oxide resistor samples of lightning protection products or core components during actual line operation. The device has the advantages of simple operation, high degree of automation, safety and reliability.

[0069] In this embodiment, the temperature control module 30 includes multiple high-temperature ovens 301 for placing test products, which can simultaneously set different AC voltages or DC voltages to perform accelerated aging tests on lightning arresters or core components such as zinc oxide resistors of different specifications under different temperature and voltage conditions.

[0070] This embodiment can realize functions such as test process control, real-time display of test data, data processing, and data export through the computer control module 50. The test process control function may include charging control, temperature control, and voltage control, etc., all of which communicate with each module through optical fiber or wireless communication to set relevant parameters and issue a series of instructions; and according to the resistive current, test voltage and other data of each test product collected and measured in real time by the measurement data acquisition module 40, the display of each measured signal is a direct reading display, which can realize automatic inspection of each test current, voltage, power consumption, and test product temperature at a set time point or time interval, and store them in the computer host computer. It can also save data according to user requirements, and has waveform storage and database management functions for test data during long-term operation, which is convenient for users to query and export data.

[0071] This embodiment can realize the functions of safety detection, safety indicator light and linkage emergency stop through the safety control module 60, detect the voltage, current and working status in real time, limit the range of some software parameter settings, and have voltage and current protection and temperature protection functions to prevent over-temperature and over-current; if the voltage, current, and temperature exceed the safety value or the equipment is abnormal during the test, an alarm signal will be displayed, a corresponding abnormal prompt will appear on the software interface, and the safety indicator light will light up; it has the protection function of powering off the whole machine and the test product when the box door of the high-temperature oven is opened, and can also be configured with an additional mechanical emergency stop switch. When the emergency stop is executed, the high voltage is quickly disconnected, which can be used for emergency discharge of electrical energy when the computer system fails.

[0072] The AC / DC aging test device for zinc oxide resistors provided in this embodiment provides different AC high-voltage power supplies or DC high-voltage power supplies through the power module 10, and the temperature control module 30 flexibly adjusts the test temperature, communicates with the computer control module 50, and cooperates with various mechanical components to achieve automatic control of the aging test process, real-time monitoring of the test status, obtain test data, analyze, manage and export it, and can set different AC voltages or DC voltages at the same time. It can perform accelerated aging tests under different temperature and voltage conditions on lightning arresters or core components of zinc oxide resistors of different specifications, and can perform real-time measurement and automatic recording of various test parameters. It also has overcurrent and overtemperature fault protection functions, which can automatically cut off the fault circuit, making it safe and reliable.

[0073] In some optional embodiments, please refer to Figure 1 、 Figure 2 and Figure 3 , Figure 2 This is a schematic diagram of the AC / DC high voltage circuit connection between the power module and a single high temperature oven provided by the embodiment of the present disclosure (it can be understood that the circuit connection between the power module and multiple high temperature ovens of the temperature control module can be Figure 2 analogy), Figure 31 is a physical connection diagram of an AC / DC aging test device for zinc oxide resistors provided in an embodiment of the present disclosure. In this embodiment, the power module 10 includes an AC regulated power supply 101, an AC high-voltage power supply 102, a DC high-voltage power supply 103, and an AC / DC switching mechanism 104; wherein the AC high-voltage power supply 102 includes an AC voltage regulator 1021 and an AC transformer 1022;

[0074] The AC regulated power supply 101 is electrically connected to the DC high voltage power supply 103 and the AC high voltage power supply 102 , respectively. An AC / DC switching mechanism 104 is provided between the DC high voltage power supply 103 and the AC high voltage power supply 102 .

[0075] Optionally, the power supply module 10 , the main circuit module 20 , and the measurement data acquisition module 40 may all be integrated into the high-voltage power supply cabinet 00 , so that the layout of each component is reasonable.

[0076] This embodiment explains that the power supply module 10 includes an AC regulated power supply 101. Through the input of the AC regulated power supply 101, a DC high-voltage power supply 103 and an AC high-voltage power supply 102 can be generated, and through an AC-DC switching mechanism 104 such as an AC-DC voltage switching switch, AC-DC power supply switching for AC-DC aging tests is realized. The output voltage can be adjusted manually or automatically, which is not limited in this embodiment.

[0077] In some optional embodiments, the main circuit module 20 includes multiple high-temperature and high-pressure bushings, and the power supply module 10 is electrically connected to multiple high-temperature ovens 301 through the multiple high-temperature and high-pressure bushings, so as to apply AC high-voltage power or DC high-voltage power of different amplitudes to the multiple high-temperature ovens 301 respectively to meet different accelerated aging test requirements.

[0078] In some optional embodiments, in the temperature control module 30, the high-temperature oven 301 adopts an integral design structure. The high-temperature oven 301 may include an oven body and a control interface. The control interface is located on the front of the high-temperature oven for easy operation. The oven body includes a glass window for real-time observation of the test product in the high-temperature oven 301 during the aging test.

[0079] In some optional embodiments, please refer to Figure 1-Figure 3 and Figure 4 , Figure 4 yes Figure 1 A schematic block diagram of a connection structure between the measurement data acquisition module and the computer control module. In this embodiment, the measurement data acquisition module 40 includes a temperature sensor 401, a voltage sensor 402 and a current sensor 403;

[0080] The temperature sensor 401 is configured to measure the test temperature of the test product in the high-temperature oven 301 in real time;

[0081] The voltage sensor 402 is electrically connected to the high-temperature oven 301 through a voltage connection. The voltage sensor 402 is configured to measure the voltage parameters applied to the two ends of the test product by the main circuit module 20 in the high-temperature oven 301;

[0082] The current sensor 403 is electrically connected to the high-temperature oven 301 through a current connection. The current sensor 403 is configured to measure the current parameters applied to the two ends of the test product by the main circuit module 20 in the high-temperature oven 301;

[0083] The temperature sensor 401 includes a temperature measuring probe PT100, the voltage sensor 402 includes a resistor divider, and the current sensor 403 includes a high-precision resistor.

[0084] This embodiment explains that in the measurement data acquisition module 40, a temperature sensor 401 such as a temperature probe PT100 can be installed in the electrode of the test product to monitor the temperature of the zinc oxide resistor and communicate it to the computer control module 50. A voltage sensor 402 such as a resistor divider is used to measure high voltage. The voltage sensor 402 can be electrically connected to the high temperature oven 301 through a voltage connection (such as Figure 2 As shown), the voltage sensor 402 can measure the voltage parameters applied to the two ends of the test product by the main circuit module 20 in the high-temperature oven 301. A current sensor 403 such as a high-precision resistor is used to measure the current. The current sensor 403 is electrically connected to the high-temperature oven 301 through a current connection (as shown). Figure 2As shown, the current sensor 403 can measure the current parameters applied to the two ends of the test product by the main circuit module 20 in the high-temperature oven 301, and similarly transmit the data to the computer control module 50. Further optionally, the measurement and data acquisition module 40 also includes a data acquisition board 404 and a communication component 405. The data acquisition board 404 and the communication component 405 can be integrated into the measurement and data acquisition module 40. The communication component 405 can be wireless communication, optical fiber communication, or other communication methods. As long as it can communicate with the computer control module and transmit the real-time collected test data to the computer control module, this embodiment does not limit the communication component 405. The data acquisition board 404 can collect data from the temperature sensor 401, the voltage sensor 402 and the current sensor 403, and perform data processing, and then transmit the data processing results of the data acquisition board 404 to the computer control module 50 through the communication component 405, thereby realizing the voltage parameters and current parameters applied to the two ends of the test product by the main loop module 20 measured by the measurement data acquisition module 40, and the test temperature set by the temperature control module 30, and performing data processing through the data acquisition board 404, the communication component 405, etc. and uploading the signal to the computer control module 50, thereby realizing automatic and accurate measurement. The data acquisition board 404 of this embodiment can be a hardware device for collecting, processing and transmitting various analog or digital signals in the physical world. It is a core component in the fields of industrial automation, test and measurement, scientific research, etc., and can be integrated into the measurement and data acquisition module 40. This embodiment does not limit the model of the data acquisition board 404. It only needs to be able to realize the voltage parameters and current parameters of the main loop module 20 applied to the two ends of the test product measured by the measurement and data acquisition module 40, and the test temperature set by the temperature control module 30, and perform data processing through the data acquisition board 404 to facilitate transmission by the communication component 405.

[0085] In some optional embodiments, please refer to Figure 1-Figure 4 and Figure 5 , Figure 5 yes Figure 1 A schematic block diagram of a connection structure of the computer control module and other modules. In this embodiment, the computer control module 50 includes a charging control component 501, a temperature control component 502, a voltage control component 503, a display component 504, a data processing component 505 and a data export component 506;

[0086] The charging control component 501 communicates with the power module 10 , and the charging control component 501 is configured to control whether the power module 10 charges the device;

[0087] The temperature control component 502 communicates with the temperature control module 30 , and the temperature control component 502 is configured to control the test temperature of the temperature control module 30 ;

[0088] The voltage control component 503 communicates with the main circuit module 20 and is configured to control the application of an AC high voltage power supply or a DC high voltage power supply to both ends of the test product;

[0089] The display component 504 is electrically connected to the temperature sensor 401, the voltage sensor 402 and the current sensor 403 of the measurement data acquisition module 40 respectively, and the display component 504 is configured to display the test temperature, voltage parameters and current parameters measured by the measurement data acquisition module 40 in real time;

[0090] The data processing component 505 is configured to convert the test data measured by the measurement data acquisition module 40 into waveform data in real time;

[0091] The data export component 506 is configured to export the waveform data of the data processing component 505 in real time and store and manage it in the host computer, so as to facilitate users to query and export data.

[0092] This embodiment illustrates that the computer control module 50 has functions such as test process control, real-time display of test data, data processing, and data export. The test process control function is mainly achieved through the charge control component 501, temperature control component 502, and voltage control component 503, respectively, to achieve charge control, temperature control, and voltage control. The charge control component 501, temperature control component 502, and voltage control component 503 all communicate with each module via optical fiber or wireless communication to set relevant parameters and issue a series of instructions. The computer control module 50 can also display the real-time collected and measured data through the display component 504, such as the real-time resistive current and test voltage in each test circuit. The display of each measured signal is a direct reading display, which is more intuitive. It can automatically inspect the test current, voltage, power consumption, and test sample temperature of each circuit at a set time point or time interval and store them in the computer. In addition, through the data processing component 505 and data export component 506, data can be saved according to user requirements, with waveform storage and database management functions for long-term test data during operation, convenient for users to query and export data.

[0093] In some optional embodiments, please refer to Figure 1-Figure 5 and Figure 6 、 Figure 7 、 Figure 8 、 Figure 9 , Figure 6 This is a flowchart of the AC and DC aging test method for zinc oxide resistors provided by the embodiment of the present disclosure. Figure 7 yes Figure 6 Schematic diagram of the structure in which the test sample is placed in a single high-temperature oven in the test method. Figure 8 yes Figure 6 Schematic diagram of the side view of the test sample placed in a single high-temperature oven in the test method. Figure 9 yes Figure 6 The AC and DC aging test method for zinc oxide resistors provided in this embodiment can be applied to Figure 1-Figure 5 The AC / DC aging test device for zinc oxide resistors in any embodiment; the test method provided in this embodiment includes:

[0094] S11: Provide multiple zinc oxide resistors as test products and place them in multiple high-temperature ovens 301;

[0095] S12: Provide corresponding AC high-voltage power supply and DC high-voltage power supply, so that each test circuit can independently switch and select AC high-voltage power supply or DC high-voltage power supply;

[0096] S13: AC high-voltage power and DC high-voltage power are provided to different high-temperature ovens 301, so that both ends of the test product in the high-temperature oven are continuously supplied with AC high-voltage power or DC high-voltage power according to the test requirements, simulating the test product to continuously operate on the circuit;

[0097] S14: Setting the test temperature in the high temperature oven 301 and automatically stabilizing it at the desired test temperature;

[0098] S15: Measure the voltage and current parameters applied to both ends of the test product and the test temperature of the high-temperature oven 301, perform data processing, and upload the data processing results to the host computer;

[0099] S16: The host computer controls the test process, displays the test data in real time, processes the test data, and exports the test data;

[0100] S17: Implement safety detection and safety warning based on the test data provided by the host computer.

[0101] The test method provided in this embodiment is to perform AC and DC aging tests on zinc oxide resistors. First, multiple zinc oxide resistors are provided as test products 01 and placed in multiple high-temperature ovens 301 of a temperature control module 30. The optional temperature control module 30 may include at least three high-temperature ovens 301, such as Figure 3 As shown, a high-temperature oven 301 has four stations. One station can hold a zinc oxide resistor test piece 01. Two zinc oxide resistor test pieces 01 are randomly selected and powered on for testing. A temperature sensor 401, such as a temperature probe PT100, can be installed in the electrode 011 of the test piece 01 in the high-temperature oven 301. Optionally, a test piece holder 3011 can be provided in the high-temperature oven 301 to limit the four stations and provide a placement location for the test piece 01 (e.g., Figure 7-Figure 9As shown), to monitor the temperature of the zinc oxide resistor and communicate it to the computer control module 50. After the aging test begins, the power module 10 outputs corresponding AC high-voltage power and DC high-voltage power, allowing each test circuit to independently switch and select AC high-voltage power or DC high-voltage power. The main circuit module 20 provides the AC high-voltage power and DC high-voltage power output by the power module 10 to different high-temperature ovens 301, so that the test product in the high-temperature oven 301 is continuously supplied with AC high-voltage power or DC high-voltage power according to the test requirements, simulating the test product's continuous operation on the circuit. The temperature control module 30 can adjust the test temperature in the high-temperature oven 301 in real time and automatically stabilize it at the required test temperature. The measurement and data acquisition module 40 measures the voltage and current parameters applied to the test product by the main circuit module 20 and the test temperature of the high-temperature oven, performs data processing, and uploads the data processing results to a host computer, such as a computer control module 50. The computer control module 50 controls the entire test process, displays test data in real time, processes test data, and exports test data. Based on the test data provided by the computer control module 50, the safety control module 60 in the host computer can perform safety detection and safety warnings.

[0102] Optionally, safety detection and safety warnings can be implemented based on the test data provided by the host computer, including: if the voltage and current parameters provided by the computer control module 50 exceed the preset safety values, a corresponding abnormal prompt will appear and the safety indicator will light up; if the door of the high-temperature oven is opened, the entire machine is powered off or the test product is powered off, an alarm signal will be displayed, and operation will be stopped, executing an emergency stop. That is, the safety control module 60 of the host computer is set with a preset safety value. If the voltage and current parameters provided by the computer control module 50 exceed the preset safety value, the safety control module 60 will control the corresponding abnormal prompt to appear and the safety indicator to light up;

[0103] The safety control module 60 is also provided with a power-off protection component and a mechanical emergency stop switch. If the door of the high-temperature oven 301 is opened and the whole machine is powered off or the test product is powered off, an alarm signal is displayed, and the control device stops running and performs an emergency stop.

[0104] The test method provided in this embodiment is used to Figure 1-Figure 5 The AC / DC aging test device for zinc oxide resistors in the illustrated embodiment can perform AC / DC aging tests on zinc oxide resistors, and can achieve voltage adjustment within the range of 0-20kV, with an output voltage variation of no more than 1%. The test temperature can be adjusted within the range of 0-200°C, and the difference in voltage and current measurement accuracy does not exceed 1%. This device can meet the requirements of continuous AC / DC pressurization for 0-5000h at different temperatures for an entire 10kV lightning arrester or a zinc oxide resistor test product with a diameter of 30-100mm, thus meeting the requirements of AC / DC aging tests on lightning protection products or resistors.

[0105] The AC / DC aging test device and test method for zinc oxide resistors provided in this embodiment can be implemented by preparing two zinc oxide resistors with a diameter of 58 mm, two zinc oxide resistors with a diameter of 75 mm, and two zinc oxide resistors with a diameter of 100 mm. These can be placed in three different high-temperature ovens 301 of a temperature control module 30, with the temperature set to 136°C. The DC voltage output of the power module is set to 0.9 times the DC U1mA parameter of each resistor (U1mA is the most basic electrical performance parameter of a resistor, that is, the voltage value that the two ends of the resistor can withstand under 1mA DC or AC current). The voltage is set to be continuously applied for 168 hours, and the voltage, current, power, and surface temperature of each resistor are continuously measured and automatically recorded in real time. After the test is completed, the test results are automatically saved in a database. If overcurrent or overtemperature occurs, the fault circuit is automatically disconnected to ensure safety and reliability.

[0106] Optionally, the AC and DC aging test device and test method for zinc oxide resistors provided in this embodiment may also have the following test methods when implemented.

[0107] First, the power module 10 provides a DC high-voltage power supply:

[0108] Test method 1: Three zinc oxide resistor samples with a diameter of 58 mm were placed in high-temperature ovens 301 No. 1-3. The temperatures of high-temperature ovens 301 No. 1-3 were set to 100°C, 115°C, and 136°C, respectively, through the temperature control component 502 of the computer control module 50. The DC voltage output of the power module 10 was set to 0.9 times the DC U1mA parameter of each resistor through the voltage control component 503 of the computer control module 50. The continuous pressurization was set for 168 hours to obtain the aging test conditions of resistors of the same specifications after being set at different temperatures, the same DC voltage, and the same pressurization time in different high-temperature ovens 301.

[0109] Test method 2: Three zinc oxide resistor samples with a diameter of 58 mm were placed in high-temperature ovens 301 No. 1-3. The temperature of high-temperature ovens 301 No. 1-3 was set to 136°C by the temperature control component 502 of the computer control module 50. The DC voltage output of the power module 10 was set to 0.85 times, 0.9 times, and 0.95 times the DC U1mA parameter of each resistor, respectively, by the voltage control component 503 of the computer control module 50. The continuous pressurization was set to 168 hours to obtain the aging test conditions of resistors of the same specifications after being set to the same temperature, different DC voltages, and the same pressurization time in different high-temperature ovens 301.

[0110] Test method 3: Three zinc oxide resistor samples with a diameter of 58 mm were placed in high-temperature ovens 301 No. 1-3. The temperature of high-temperature ovens 301 No. 1-3 was set to 136°C by the temperature control component 502 of the computer control module 50. The DC voltage output of the power module 10 was set to 0.85 times the DC U1mA parameter of each resistor by the voltage control component 503 of the computer control module 50. The continuous pressurization was set for 84 hours, 168 hours, and 256 hours, respectively, to obtain the aging test conditions of resistors of the same specifications after being set at the same temperature, the same DC voltage, and different pressurization times in different high-temperature ovens 301.

[0111] Then the power module 10 switches to provide AC high voltage power:

[0112] Test method 4: Three zinc oxide resistor samples with a diameter of 46 mm were placed in high-temperature ovens 301 No. 1-3. The temperatures of high-temperature ovens 301 No. 1-3 were set to 100°C, 115°C, and 136°C, respectively, through the temperature control component 502 of the computer control module 50. The AC voltage output of the power supply module 10 was set to 0.9 times the AC U1mA parameter of each resistor through the voltage control component 503 of the computer control module 50. The continuous pressurization was set to 1000 hours to obtain the aging test conditions of resistors of the same specifications after being set at different temperatures, the same AC voltage, and the same pressurization time in different high-temperature ovens 301.

[0113] Test method 5: Three zinc oxide resistor samples with a diameter of 46 mm were placed in high-temperature ovens 301 No. 1-3. The temperature of high-temperature ovens 301 No. 1-3 was set to 115°C by the temperature control component 502 of the computer control module 50. The 10 AC voltage output of the power module was set to 0.85 times, 0.9 times, and 0.95 times the AC U1mA parameter of each resistor, respectively, by the voltage control component 503 of the computer control module 50. The continuous pressurization was set to 1000 hours to obtain the aging test conditions of resistors of the same specifications after being set to the same temperature, different AC voltages, and the same pressurization time in different high-temperature ovens 301.

[0114] Test method 6: Three zinc oxide resistor samples with a diameter of 46 mm were placed in high-temperature ovens 301 No. 1-3. The temperature of high-temperature ovens 301 No. 1-3 was set to 115°C by the temperature control component 502 of the computer control module 50. The AC voltage output of the power supply module 10 was set to 0.9 times the AC U1mA parameter of each resistor by the voltage control component 503 of the computer control module 50. The continuous pressurization was set to 1000 h, 2500 h, and 5000 h, respectively, to obtain the aging test conditions of resistors of the same specifications after being set at the same temperature, the same AC voltage, and different pressurization times in different high-temperature ovens 301.

[0115] Then switch to resistors of different specifications and the same experimental conditions:

[0116] Test method 7: Place a zinc oxide resistor test piece with a diameter of 58 mm, a zinc oxide resistor test piece with a diameter of 75 mm, and a zinc oxide resistor test piece with a diameter of 100 mm in high-temperature ovens 301, respectively. Set the temperatures of high-temperature ovens 301, No. 1 to 3, to 136°C, respectively, through the temperature control component 502 of the computer control module 50. Set the DC voltage output of the power supply module 10 to 0.9 times the DC U1mA parameter of each resistor, and set continuous pressurization for 168 hours to obtain aging test conditions of resistors of different specifications after setting the same temperature, the same DC voltage, and the same pressurization time in different high-temperature ovens 301.

[0117] Test method 8: Place a zinc oxide resistor test piece with a diameter of 58 mm, a zinc oxide resistor test piece with a diameter of 75 mm, and a zinc oxide resistor test piece with a diameter of 100 mm in high-temperature ovens 301, respectively. Set the temperatures of high-temperature ovens 301, No. 1 to 3, to 115°C, respectively, through the temperature control component 502 of the computer control module 50. Set the AC voltage output of the power supply module 10 to 0.9 times the AC U1mA parameter of each resistor, and set continuous pressurization for 1000 hours to obtain aging test conditions of resistors of different specifications after setting the same temperature, the same AC voltage, and the same pressurization time in different high-temperature ovens 301.

[0118] The test method provided in this embodiment can set different AC voltages or DC voltages at the same time, and perform accelerated aging tests on lightning arresters of different specifications or core components, zinc oxide resistors, under different temperature and voltage conditions. By applying AC voltages or DC voltages of different amplitudes, different accelerated aging test requirements can be met. In addition, various test parameters can be measured and automatically recorded in real time. At the same time, it has overcurrent and overtemperature fault protection functions, which can automatically cut off the fault circuit, making it safe and reliable.

[0119] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.

[0120] The foregoing description is intended only to provide specific embodiments of the present disclosure, intended to enable those skilled in the art to understand and implement the present disclosure. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present disclosure. Therefore, the present disclosure is not intended to be limited to the embodiments described herein, but rather to be construed in the broadest manner consistent with the principles and novel features disclosed herein.

Claims

1. A zinc oxide resistor AC and DC aging test device, characterized in that: include: The main circuit module is configured to apply a continuous AC high voltage power supply or a DC high voltage power supply to both ends of the test product, simulating the test product to operate continuously on the line; The temperature control module is configured to set the test temperature and automatically stabilize at the required test temperature; The measurement and data acquisition module is configured to measure the voltage parameters and current parameters applied to the two ends of the test product by the main circuit module and the test temperature set by the temperature control module, perform data processing, and upload the data processing results to the computer control module; The computer control module is configured to control the test process, display the test data in real time, process the test data, and export the test data; The safety control module is configured to implement safety detection and safety warning according to the test data provided by the computer control module.

2. The AC / DC aging test device for zinc oxide resistors according to claim 1, characterized in that: Also included is a power supply module, the power supply module is configured to output corresponding AC high-voltage power and DC high-voltage power, so that each test circuit can independently switch and select the AC high-voltage power or the DC high-voltage power; The power supply module includes an AC regulated power supply, an AC high-voltage power supply, a DC high-voltage power supply, and an AC / DC switching mechanism; wherein the AC high-voltage power supply includes an AC voltage regulator and an AC transformer; The AC regulated power supply is electrically connected to the DC high-voltage power supply and the AC high-voltage power supply respectively, and the AC / DC switching mechanism is provided between the DC high-voltage power supply and the AC high-voltage power supply.

3. The AC / DC aging test device for zinc oxide resistor according to claim 1, characterized in that: The safety control module is also configured to implement a linked emergency stop based on the test data provided by the computer control module. If the voltage parameters and current parameters provided by the computer control module exceed the preset safety values, or if the device operates abnormally, an alarm signal is displayed and the device is controlled to stop operating.

4. The AC / DC aging test device for zinc oxide resistors according to claim 2, characterized in that: The main circuit module includes multiple high-temperature and high-pressure bushings, the temperature control module includes multiple high-temperature ovens for placing test products, and the power supply module is electrically connected to the multiple high-temperature ovens through the multiple high-temperature and high-pressure bushings, so as to apply the AC high-voltage power supply or the DC high-voltage power supply of different amplitudes to the multiple high-temperature ovens.

5. The AC / DC aging test device for zinc oxide resistor according to claim 4, characterized in that: The high-temperature oven includes an oven body and a control interface. The control interface is located on the front of the high-temperature oven. The oven body includes a glass window.

6. The AC / DC aging test device for zinc oxide resistors according to claim 4, characterized in that: The measurement data acquisition module includes a temperature sensor, a voltage sensor and a current sensor; The temperature sensor is configured to measure the test temperature of the test product in the high-temperature oven in real time; The voltage sensor is electrically connected to the high-temperature oven via a voltage connection, and the voltage sensor is configured to measure a voltage parameter applied by the main circuit module in the high-temperature oven to both ends of the test article; The current sensor is electrically connected to the high-temperature oven via a current connection, and the current sensor is configured to measure a current parameter applied by the main circuit module in the high-temperature oven to both ends of the test article; The temperature sensor includes a temperature measuring probe PT100, the voltage sensor includes a resistor divider, and the current sensor includes a high-precision resistor.

7. The AC / DC aging test device for zinc oxide resistors according to claim 6, characterized in that: The measurement data acquisition module also includes a data acquisition board and a communication component; The data acquisition board is configured to collect data from the temperature sensor, the voltage sensor, and the current sensor, and perform data processing; The communication component is configured to transmit the data processing result of the data acquisition board to the computer control module.

8. The AC / DC aging test device for zinc oxide resistors according to claim 2, characterized in that: The computer control module includes a charging control component, a temperature control component, a voltage control component, a display component, a data processing component and a data export component; The charging control component is in communication with the power module, and the charging control component is configured to control whether the power module charges the device; The temperature control assembly is in communication with the temperature control module, and the temperature control assembly is configured to control a test temperature of the temperature control module; The voltage control component is in communication with the main circuit module, and the voltage control component is configured to control the application of the AC high voltage power supply or the DC high voltage power supply at both ends of the test product; The display components are electrically connected to the measurement data acquisition modules respectively, and the display components are configured to display the test temperature, voltage parameters, and current parameters measured by the measurement data acquisition modules in real time; The data processing component is configured to convert the test data measured by the measurement data acquisition module into waveform data in real time; The data export component is configured to export the waveform data of the data processing component in real time and store and manage it in a host computer, making it convenient for users to query and export data.

9. A method for AC and DC aging test of zinc oxide resistors, characterized in that: include: Provide multiple zinc oxide resistors as test products and place them in multiple high-temperature ovens; Providing corresponding AC high-voltage power supply and DC high-voltage power supply, so that each test circuit can independently switch and select the AC high-voltage power supply or the DC high-voltage power supply; An AC high-voltage power supply and a DC high-voltage power supply are provided to different high-temperature ovens, so that the AC high-voltage power supply or the DC high-voltage power supply is continuously applied to both ends of the test object in the high-temperature oven according to the test requirements, simulating the continuous operation of the test object on the circuit; Setting the test temperature in the high temperature oven and automatically stabilizing it at the desired test temperature; measuring the voltage parameters and current parameters applied to both ends of the test product and the test temperature of the high-temperature oven, performing data processing, and uploading the data processing results to the host computer; The host computer controls the test process, displays the test data in real time, processes the test data, and exports the test data; Safety detection and safety warning are achieved based on the test data provided by the host computer.

10. The AC / DC aging test method for zinc oxide resistors according to claim 9, characterized in that: Based on the test data provided by the host computer, safety detection and safety warning are realized, including: If the voltage and current parameters provided by the host computer exceed the preset safety values, a corresponding abnormal prompt will appear and the safety indicator light will light up; If the door of the high-temperature oven is opened and the whole machine is powered off or the test product is powered off, an alarm signal will be displayed, the operation will be stopped, and an emergency stop will be executed.

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