Judgment method for tiny discharge risk of traveling wave tube collector

Abstract

The invention relates to a method for judging the tiny discharge risk of a traveling wave tube collector, and belongs to the technical field of high-power electric vacuum device research. Obtaining a voltage difference between two adjacent electrodes of the traveling wave tube collector; the method comprises the following steps: carrying out electric leakage test on any two adjacent electrodes of a traveling wave tube collector under different high voltages to obtain voltage difference and current data, and converting the voltage difference and current data into a new data expression form; drawing a data curve according to the new data expression form; performing segmented straight line fitting on data in the data curve to obtain a positive slope straight line and a negative slope straight line; finding out abscissa values corresponding to the inflection points, and obtaining voltage values V corresponding to the inflection points; judging the risk of micro discharge between the two adjacent electrodes; and judging the risk of micro discharge of the whole traveling wave tube collector. The result of the invention can be used for evaluating the possibility of micro discharge of the traveling wave tube, screening the micro discharge of the traveling wave tube in advance, and improving the screening efficiency of traveling wave tube products.

Description

Technical Field

[0001] The invention belongs to the technical field of research on high-power electric vacuum devices and relates to a method for judging the risk of collecting extremely small discharges in a traveling wave tube. Background Art

[0002] A space traveling wave tube amplifier (TWT) primarily consists of a traveling wave tube power supply (EPC) and a traveling wave tube (TWT). To ensure the long-term, efficient operation of a space TWT, a high-voltage power supply is required to provide the TWT with a DC voltage. The TWT operates at high voltage. Once a small discharge occurs within the TWT, it causes a disturbance in the voltage at each pole, increasing the spiral current in the TWT and thus affecting the lifespan of the TWT. To ensure the lifespan of the TWT, the spiral current is typically monitored. When the current reaches a certain amplitude, the EPC automatically shuts down for protection. Although this small discharge is a low-probability event, it can still disrupt services such as real-time communications and data transmission, seriously impacting communication continuity.

[0003] Micro-discharges in traveling wave tubes (TWTs) are essentially high-voltage discharges within the vacuum tube itself. International manufacturers of vacuum components have yet to fully address the problem, which impacts the stable operation of TWT amplifiers on-orbit. Due to the diverse electrode structures and complex electric fields within TWT amplifiers, research institutions both domestically and internationally have focused on problem identification and preventative measures, lacking in-depth physical understanding and effective solutions. Summary of the Invention

[0004] The technical problem solved by the present invention is to overcome the shortcomings of the existing technology and propose a method for judging the risk of extremely small discharges collected by a traveling wave tube. The results of the present invention can be used to evaluate the possibility of small discharges occurring in a traveling wave tube, screen the small discharges of the traveling wave tube in advance, and improve the screening efficiency of traveling wave tube products.

[0005] The solution of the present invention is:

[0006] A method for determining the risk of extremely small discharges collected by a traveling wave tube, comprising:

[0007] Step 1: According to the designed working voltage of each level of the traveling wave tube collector, the voltage difference between two adjacent electrodes is calculated to obtain the voltage difference between two adjacent electrodes of the traveling wave tube collector. The voltage difference between any two adjacent electrodes is recorded as U j-(j+1) ; j is the electrode number;

[0008] Step 2: Using a DC high-voltage power supply, perform leakage tests on any two adjacent electrodes of the traveling wave tube collector at different high voltages to obtain data on the voltage difference and current during the leakage test of the two adjacent electrodes;

[0009] Step 3: Convert the voltage difference and current data during the leakage test into a new data expression form;

[0010] Step 4: Draw a data curve based on the new data expression form;

[0011] Step 5: Perform piecewise straight line fitting on the data in the data curve to obtain a positive slope straight line and a negative slope straight line; and find the horizontal coordinate value corresponding to each inflection point to obtain the voltage value V corresponding to the inflection point;

[0012] Step 6: record the voltage value V obtained in step 5 and the voltage difference between the two adjacent electrodes in step 1 as U j-(j+1) Compare and judge the risk of micro discharge between the two adjacent electrodes; and complete the judgment of the risk of micro discharge in the entire traveling wave tube collector.

[0013] In the above-mentioned method for judging the risk of extremely small discharge collected by a traveling wave tube, in step 2, the voltage difference and current data of the two adjacent electrodes during the leakage test are recorded as (V i , I i ); i=1,2,……,n, n is the number of test data points; i is the test data point sequence number; when conducting leakage test, V i is the voltage difference between two adjacent electrodes; I i is the leakage current during the test.

[0014] In the above-mentioned method for judging the risk of extremely small discharge in a traveling wave tube, in step 3, the voltage difference and current data (V i , I i ) is converted into a new data expression form, which is

[0015] In the above-mentioned method for determining the risk of extremely small discharges collected by a traveling wave tube, in step 4, the method for drawing the data curve is:

[0016] by As the x-axis, As the y-axis, and draw n test point data on the xy-axis, which is the data curve.

[0017] In the above-mentioned method for determining the risk of extremely small discharges collected by a traveling wave tube, in step 5, the intersection of the positive slope straight line and the negative slope straight line is the inflection point; the x-coordinate value corresponding to the inflection point is beg The reciprocal of is the voltage value V corresponding to the inflection point.

[0018] In the above-mentioned method for determining the risk of extremely small discharges collected by a traveling wave tube, in step 6, the method for determining the magnitude of the risk of a small discharge occurring between two adjacent electrodes is:

[0019] V and the corresponding U j-(j+1) Compare; when V>U j-(j+1) When , it is judged that the risk of micro-discharge occurring between the two adjacent electrodes is small; otherwise, it is judged that the risk of micro-discharge occurring between the two adjacent electrodes is large.

[0020] In the above-mentioned method for judging the risk of extremely small discharge collected by a traveling wave tube, when V>U j-(j+1) When the 2nd to 6th steps are repeated, the other adjacent electrodes of the traveling wave tube collector are tested.

[0021] In the above-mentioned method for judging the risk of micro-discharge at the collector of a traveling wave tube, when the test results of all adjacent electrodes of the collector of the traveling wave tube satisfy V>U j-(j+1) When , it is judged that the risk of micro discharge occurring in the entire traveling wave tube collector is small.

[0022] In the above-mentioned method for judging the risk of extremely small discharge collected by a traveling wave tube, when V≤U j-(j+1) When the circuit is stopped, it is judged that there is a high risk of micro discharge occurring in the entire traveling wave tube collector.

[0023] In the above-mentioned method for judging the risk of extremely small discharge in a traveling wave tube collector, when the result of judging that the risk of small discharge between two adjacent electrodes is high for the first time appears, the leakage test is stopped and the risk of small discharge in the entire traveling wave tube collector is judged to be high.

[0024] The beneficial effects of the present invention compared with the prior art are:

[0025] (1) The present invention evaluates the safety withstand voltage margin of the traveling wave tube collector electrode by performing a high voltage leakage current test on adjacent electrodes in the traveling wave tube collector;

[0026] (2) The present invention designs a judgment logic for the risk of micro-discharges occurring at adjacent electrodes, and based on this, completes the design of a judgment logic for the risk of micro-discharges occurring at the entire traveling wave tube collector;

[0027] (3) The present invention designs the voltage difference and current data of two adjacent electrodes during leakage test as (V i , I i ) and convert it into a new data expression form, which is At the same time As the x-axis, As the y-axis, and draw n test point data on the xy axis to form a data curve, so that the entire logical judgment is supported by the data chart and the judgment is accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 A flow chart for determining the risk of extremely small discharges collected by the traveling wave tube of the present invention;

[0029] Figure 2 Schematic diagram of the data curves of receiving electrode 1 and receiving electrode 2 according to an embodiment of the present invention;

[0030] Figure 3 Schematic diagram of the data curves of receiving 2 electrodes and receiving 3 electrodes according to an embodiment of the present invention. DETAILED DESCRIPTION

[0031] The present invention will be further described below in conjunction with the embodiments.

[0032] This method evaluates the safety withstand voltage margin of a traveling wave tube's collector electrodes by performing a cold high-voltage leakage current test on adjacent electrodes. This method can therefore assess the likelihood of micro-discharges occurring in the traveling wave tube. This method can improve the efficiency of screening traveling wave tube products.

[0033] Method for judging the risk of extremely small discharge collected by traveling wave tube, such as Figure 1 As shown, the specific steps include:

[0034] Step 1: According to the designed working voltage of each level of the traveling wave tube collector, the voltage difference between two adjacent electrodes is calculated to obtain the voltage difference between two adjacent electrodes of the traveling wave tube collector. The voltage difference between any two adjacent electrodes is recorded as U j-(j+1) ; j is the electrode number.

[0035] Step 2: Use a DC high-voltage power supply to perform leakage tests on any two adjacent electrodes of the traveling wave tube collector at different high voltages to obtain data on the voltage difference and current during the leakage test of the two adjacent electrodes.

[0036] The voltage difference and current data of the two adjacent electrodes during the leakage test are recorded as (V i , I i ); i=1,2,……,n, n is the number of test data points; i is the test data point sequence number; when conducting leakage test, V i is the voltage difference between two adjacent electrodes; I i is the leakage current during the test.

[0037] Step 3: Convert the voltage difference and current data during the leakage test into a new data expression format. i , I i) is converted into a new data expression form, which is

[0038] Step 4: Draw a data curve based on the new data expression. The method for drawing a data curve is:

[0039] by As the x-axis, As the y-axis, and draw n test point data on the xy-axis, which is the data curve.

[0040] Step 5: Perform piecewise straight line fitting on the data in the data curve to obtain a straight line with a positive slope and a straight line with a negative slope; and find the horizontal coordinate value corresponding to each inflection point to obtain the voltage value V corresponding to the inflection point.

[0041] In the present invention, the intersection of the positive slope straight line and the negative slope straight line is the inflection point; the x-coordinate value corresponding to the inflection point is beg The reciprocal of is the voltage value V corresponding to the inflection point.

[0042] Step 6: record the voltage difference between the voltage value V obtained in step 5 and the voltage of the two adjacent electrodes in step 1 as U j-(j+1) Compare and judge the risk of micro discharge between the two adjacent electrodes; and complete the judgment of the risk of micro discharge in the entire traveling wave tube collector.

[0043] The method for determining the risk of a small discharge between two adjacent electrodes is as follows:

[0044] V and the corresponding U j-(j+1) Compare; when V>U j-(j+1) When , it is judged that the risk of micro-discharge occurring between the two adjacent electrodes is small; otherwise, it is judged that the risk of micro-discharge occurring between the two adjacent electrodes is large.

[0045] When V>U j-(j+1) When the test results of all the adjacent electrodes of the traveling wave tube collector satisfy V>U j-(j+1) When , it is judged that the risk of micro discharge occurring in the entire traveling wave tube collector is small.

[0046] When the cycle from step 2 to step 6 occurs, V≤U j-(j+1) When the circuit is stopped, it is judged that there is a high risk of micro discharge occurring in the entire traveling wave tube collector.

[0047] When the result that the risk of micro discharge between the two adjacent electrodes is high appears for the first time, the leakage test is stopped and it is determined that the risk of micro discharge in the entire traveling wave tube collector is high.

[0048] Example

[0049] Taking a traveling wave tube amplifier as an example, the steps to determine the risk of extremely small discharges collected by the traveling wave tube are as follows:

[0050] 1. According to the design working voltage of each level of the traveling wave tube collector, the voltage difference between the two adjacent electrodes of the traveling wave tube collector is U 1-2 =6.6kV and U 2-3 =6kV.

[0051] 2. Use a DC high-voltage power supply to test the leakage current of the receiving electrode 1 and the receiving electrode 2 in the traveling wave tube collector under different high voltages. During the test, gradually increase the voltage value from small to large, test and record the corresponding leakage current. A set of voltage-current correspondences ((V i , I i )(i=1,2,3…,n))(The test results are shown in Table 1. During the test, the voltage range needs to cover the voltage difference between the two electrodes. The voltage range tested in this example is (0.7*U c1-c2 , 1.3*U c1-c2 )

[0052] Table 1

[0053] Test serial number Voltage (kV) Leakage current (nA) 1 4.653 0.57 2 4.877 0.68 3 5.098 0.81 4 5.32 0.86 5 5.542 0.88 6 5.764 0.97 7 5.985 0.93 8 6.207 0.98 9 6.429 1.14 10 6.651 1.01 11 6.872 1.42 12 7.094 1.17 13 7.315 1.29 14 7.537 1.14 15 7.759 1.36 16 7.98 1.79 17 8.202 2.14 18 8.423 3.31 19 8.645 5.06

[0054] 3. Test data (V i , I i ) to perform mathematical processing and obtain a new data list

[0055] 4. As the x-axis, As the y-axis, draw the data curve, such as Figure 2 shown.

[0056] 5. Perform segmented straight line fitting on the data in the curve to obtain a positive slope straight line and a negative slope straight line. The intersection of the two straight lines is the inflection point, and record the x-coordinate value corresponding to the inflection point. Thus, the voltage value V corresponding to the inflection point is obtained a =7.537kV.

[0057] 6. The voltage value V obtained in step 5 a =7.537kV and the voltage difference between the test electrode and U c1-c2 =6.6kV. Since 7.537kV>6.6kV, that is, the measured electrode withstand voltage is greater than the designed value, it can be assumed that the risk of micro-discharges occurring at the receiving electrodes 1 and 2 is low.

[0058] Go to step 2 and perform leakage current test on the collecting electrode 2 and collecting electrode 3 of the traveling wave tube collector at different voltages. The test data are shown in Table 2. Then proceed to steps 3, 4, and 5. Obtain the voltage value V corresponding to the inflection point b =7.735kV (such as Figure 3 By comparing the measured value V b =7.735kV>design value U c2-c3 =6kV, it can be considered that the risk of micro discharge occurring at the receiving electrodes 2 and 3 is small.

[0059] Table 2

[0060]

[0061]

[0062] 7. The three adjacent electrodes of the traveling wave tube collector simultaneously meet V a >U c1-c2 and V b >U c2-c3 , thus judging that the withstand voltage margin of each electrode of the traveling wave tube collector meets the requirements, and the risk of micro discharge in the entire traveling wave tube collector is small.

[0063] The present invention evaluates the safety withstand voltage margin of the traveling wave tube collector electrode by performing a high voltage leakage current test on adjacent electrodes in the traveling wave tube collector.

[0064] The present invention designs a judgment logic for the risk of micro-discharge occurring in adjacent electrodes, and based on this, completes the design of the judgment logic for the risk of micro-discharge occurring in the entire traveling wave tube collector.

[0065] The present invention designs the voltage difference and current data of two adjacent electrodes during leakage test as (V i , I i ) and convert it into a new data expression form, which is At the same time As the x-axis, As the y-axis, and draw n test point data on the xy axis to form a data curve, so that the entire logical judgment is supported by the data chart and the judgment is accurate.

[0066] Although the present invention has been disclosed above in terms of preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art may make possible changes and modifications to the technical solutions of the present invention by using the methods and technical contents disclosed above without departing from the spirit and scope of the present invention. Therefore, any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solutions of the present invention shall fall within the scope of protection of the technical solutions of the present invention.

Claims

1. A method for determining the risk of extremely small discharges collected by a traveling wave tube, characterized by: include: Step 1: According to the designed working voltage of each level of the traveling wave tube collector, the voltage difference between two adjacent electrodes is calculated to obtain the voltage difference between two adjacent electrodes of the traveling wave tube collector. The voltage difference between any two adjacent electrodes is recorded as U j-(j+1) ; j is the electrode number; Step 2: Using a DC high-voltage power supply, perform leakage tests on any two adjacent electrodes of the traveling wave tube collector at different high voltages to obtain data on the voltage difference and current during the leakage test of the two adjacent electrodes; Step 3: Convert the voltage difference and current data during the leakage test into a new data expression form; Step 4: Draw a data curve based on the new data expression form; Step 5: Perform piecewise straight line fitting on the data in the data curve to obtain a positive slope straight line and a negative slope straight line; and find the horizontal coordinate value corresponding to each inflection point to obtain the voltage value V corresponding to the inflection point; Step 6: record the voltage difference between the voltage value V obtained in step 5 and the voltage of the two adjacent electrodes in step 1 as U j-(j+1) Compare and determine the risk of a micro discharge occurring between the two adjacent electrodes; And complete the judgment of the risk of micro-discharge occurring in the entire traveling wave tube collector.

2. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 1, characterized in that: In the step 2, the voltage difference and current data of the two adjacent electrodes during the leakage test are recorded as (V i , I i ); i = 1, 2, ..., n, n is the number of test data points; i is the test data point number; when conducting leakage test, V i is the voltage difference between two adjacent electrodes; I i is the leakage current during the test.

3. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 2, characterized in that: In step 3, the voltage difference and current data (V i , I i ) is converted into a new data expression form, which is 4. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 3, characterized in that: In step 4, the method for drawing the data curve is: by As the x-axis, As the y-axis, and draw n test point data on the xy-axis, which is the data curve.

5. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 4, characterized in that: In step 5, the intersection of the positive slope straight line and the negative slope straight line is the inflection point; the x-coordinate value corresponding to the inflection point is beg The reciprocal of is the voltage value V corresponding to the inflection point.

6. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 5, characterized in that: In step 6, the method for determining the risk of a micro-discharge between two adjacent electrodes is as follows: V and the corresponding U j-(j+1) Compare; when V>U j-(j+1) When , it is judged that the risk of micro-discharge occurring between the two adjacent electrodes is small; otherwise, it is judged that the risk of micro-discharge occurring between the two adjacent electrodes is large.

7. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 6, characterized in that: When V>U j-(j+1) When the 2nd to 6th steps are repeated, the other adjacent electrodes of the traveling wave tube collector are tested.

8. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 7, characterized in that: When the test results of all adjacent electrodes of the traveling wave tube collector satisfy V>U j-(j+1) When , it is judged that the risk of micro discharge occurring in the entire traveling wave tube collector is small.

9. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 8, characterized in that: When the cycle from step 2 to step 6 occurs, V≤U j-(j+1) When the circuit is stopped, it is judged that there is a high risk of micro discharge occurring in the entire traveling wave tube collector.

10. The method for determining the risk of extremely small discharges collected by a traveling wave tube according to claim 6, characterized in that: When the result that the risk of micro discharge between the two adjacent electrodes is high appears for the first time, the leakage test is stopped and it is determined that the risk of micro discharge in the entire traveling wave tube collector is high.

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