A method for judging micro-discharge risk of a traveling wave tube collector

Abstract

The present application relates to a kind of for the judgment method of the micro-discharge risk of traveling wave tube collector, belong to the technical field of high-power electric vacuum device research;Obtain the voltage difference of two adjacent electrodes of traveling wave tube collector;The leakage test of different high voltage is carried out to any two adjacent electrodes of traveling wave tube collector, obtain the data of voltage difference and current, convert the data of voltage difference and current into new data expression form;According to new data expression form, draw data curve;The data in data curve is segmented linear fitting, obtains positive slope straight line and negative slope straight line;And find the corresponding abscissa value of each inflection point, obtain the voltage value V of inflection point corresponding;Judge the risk size of micro-discharge between the two adjacent electrodes;And complete the risk size of micro-discharge of entire traveling wave tube collector;The result of the present application can be used to evaluate the possibility of micro-discharge of traveling wave tube, carry out early screening to the micro-discharge of traveling wave tube, improve the screening efficiency of traveling wave tube product.

Description

Technical Field

[0001] This invention belongs to the field of high-power vacuum electronic device research technology, and relates to a method for judging the risk of extremely small discharges in traveling wave tubes. Background Technology

[0002] A space traveling wave tube amplifier mainly consists of a traveling wave tube power supply (EPC) and a traveling wave tube (TWT). To meet the requirements of long-term, high-efficiency operation of the space TWT, a high-voltage power supply is needed to provide DC voltage to the TWT. The TWT operates under high voltage continuously. If a minute discharge occurs inside the TWT, it will cause disturbances in the voltage across its electrodes, increasing the solenoid current and affecting the TWT's lifespan. To ensure the TWT's lifespan, the solenoid current is typically monitored. When the solenoid current reaches a certain level, the EPC will automatically shut down for protection. Although this minute discharge is a low-probability event, it can still potentially interrupt real-time communication and data transmission, severely impacting communication continuity.

[0003] The micro-discharge in a traveling wave tube (TWT) is essentially a high-voltage vacuum discharge inside the TWT. Currently, no international manufacturer of vacuum components has completely solved the high-voltage vacuum discharge phenomenon that affects the stable on-orbit operation of TWT amplifiers. Due to the diverse electrode structures and complex electric fields inside TWT amplifiers, research institutions both domestically and internationally have remained at the level of problem identification and prevention / improvement, lacking in-depth physical understanding and effective solutions. Summary of the Invention

[0004] The technical problem solved by this invention is to overcome the shortcomings of the prior art and propose a method for judging the risk of extremely small discharges in traveling wave tubes. The results of this invention can be used to assess the possibility of small discharges in traveling wave tubes, screen for small discharges in advance, and improve the screening efficiency of traveling wave tube products.

[0005] The solution of the present invention is:

[0006] A method for assessing the risk of extremely small discharges in a traveling wave tube, comprising:

[0007] Step 1: Based on the design operating voltage of each stage of the traveling wave tube's collector, calculate the voltage difference between any two adjacent electrodes to obtain the voltage difference between any two adjacent electrodes of the traveling wave tube's collector. Let the voltage difference between any two adjacent electrodes be denoted as U. j-(j+1) j represents the electrode number;

[0008] Step 2: Use a DC high-voltage power supply to perform leakage current tests on any two adjacent electrodes of the traveling wave tube collector under different high voltages, and obtain the data of voltage difference and current during the leakage current test of the two adjacent electrodes;

[0009] Step 3: Convert the voltage difference and current data from the leakage current test into a new data expression format;

[0010] Step 4: Draw the data curve based on the new data representation format;

[0011] Step 5: Perform piecewise linear fitting on the data curve to obtain positive slope lines and negative slope lines; and find the x-coordinate value corresponding to each inflection point to obtain the voltage value V corresponding to the inflection point;

[0012] Step 6: Record the voltage value V obtained in Step 5 and the voltage difference between the corresponding two adjacent electrodes in Step 1 as U. j-(j+1) The comparison is performed to determine the risk of a micro-discharge between the two adjacent electrodes, and the risk of a micro-discharge occurring at the collector of the entire traveling wave tube is determined.

[0013] In the aforementioned method for assessing the risk of extremely small discharges in a traveling wave tube, in step two, the voltage difference and current data during the leakage current test of the two adjacent electrodes are recorded as (V i I i ); i = 1, 2, ..., n, where n is the number of test data points; i is the sequence number of the test data points; when performing leakage current testing, V i I is the voltage difference applied across two adjacent electrodes; i This refers to the leakage current during the test.

[0014] In the aforementioned method for assessing the risk of extremely small discharges using a traveling wave tube, step three involves using the voltage difference and current data (V) from the leakage current test. i I i Transforming data into a new data representation form, that is...

[0015] In the aforementioned method for assessing the risk of extremely small discharges in a traveling wave tube, step four involves plotting the data curve as follows:

[0016] by As the x-axis, Using the y-axis as the data axis, and plotting the data of n test points on the xy-axis, we get the data curve.

[0017] In the aforementioned method for assessing the risk of extremely small discharges using a traveling wave tube, in step five, the intersection of the positive slope line and the negative slope line is the inflection point; the x-coordinate value corresponding to the inflection point is... beg The reciprocal of the value is the voltage V corresponding to the inflection point.

[0018] In the aforementioned method for determining the risk of extremely small discharges in a traveling wave tube, step six involves determining the magnitude of the risk of a small discharge between two adjacent electrodes as follows:

[0019] Connect V with the corresponding U j-(j+1) Compare; when V > U j-(j+1) If the risk of a small discharge between the two adjacent electrodes is low, then the risk of a small discharge between the two adjacent electrodes is high.

[0020] In the aforementioned method for assessing the risk of extremely small discharges in a traveling wave tube, when V > U j-(j+1) Then, repeat steps two through six to test other adjacent electrodes of the traveling wave tube collector.

[0021] In the aforementioned method for assessing the risk of minute discharges in the collector electrode of a traveling wave tube, the test results for all adjacent electrodes of the collector electrode of the traveling wave tube satisfy V > U. j-(j+1) If the risk of a small discharge occurring at the collector of the entire traveling wave tube is low, then it can be determined that the risk is small.

[0022] In the aforementioned method for assessing the risk of extremely small discharges in a traveling wave tube, when V≤U occurs during steps two through six of the cycle... j-(j+1) When the cycle stops, it is determined that there is a high risk of a minute discharge occurring at the collector of the entire traveling wave tube.

[0023] In the above-mentioned method for judging the risk of minute discharge in the collector of a traveling wave tube, when the result of judging that the risk of minute discharge between two adjacent electrodes is high for the first time occurs, the leakage test is stopped and the risk of minute discharge in the entire collector of the traveling wave tube is judged to be high.

[0024] The advantages of this invention compared to the prior art are:

[0025] (1) The present invention evaluates the safety withstand voltage margin of the collector electrode of the traveling wave tube by performing a high voltage leakage current test on adjacent electrodes in the collector electrode of the traveling wave tube.

[0026] (2) This invention designs a logic for judging the risk of micro-discharge between adjacent electrodes, and based on this, completes the design of a logic for judging the risk of micro-discharge between the collector of the entire traveling wave tube.

[0027] (3) This invention designs the voltage difference and current data for leakage current testing of two adjacent electrodes, denoted as (V i I i (and convert it into a new data representation, that is...) At the same time As the x-axis, Using the y-axis as the basis, n test point data are plotted on the xy-axis to form a data curve, thus enabling the entire logical judgment to be supported by data charts, ensuring accurate judgment. Attached Figure Description

[0028] Figure 1 This is a flowchart illustrating the risk assessment process for collecting extremely small discharges using a traveling wave tube, as described in this invention.

[0029] Figure 2 This is a schematic diagram of the data curves for receiver 1 and receiver 2 in an embodiment of the present invention;

[0030] Figure 3 This is a schematic diagram of the data curves for receiving electrode 2 and receiving electrode 3 in an embodiment of the present invention. Detailed Implementation

[0031] The present invention will be further described below with reference to the embodiments.

[0032] This invention evaluates the safety withstand voltage margin of the traveling wave tube (TWT) collector electrode by performing a cold high-voltage leakage current test on adjacent electrodes in the TWT collector. This allows for the assessment of the likelihood of micro-discharges occurring in the TWT. This method can improve the screening efficiency of TWT products.

[0033] Methods for assessing the risk of extremely small discharges in traveling wave tubes, such as... Figure 1 As shown, the specific steps include the following:

[0034] Step 1: Based on the design operating voltage of each stage of the traveling wave tube's collector, calculate the voltage difference between any two adjacent electrodes to obtain the voltage difference between any two adjacent electrodes of the traveling wave tube's collector. Let the voltage difference between any two adjacent electrodes be denoted as U. j-(j+1) j represents the electrode number.

[0035] Step 2: Use a DC high-voltage power supply to perform leakage current tests on any two adjacent electrodes of the traveling wave tube collector under different high voltages, and obtain the data of voltage difference and current during the leakage current test of the two adjacent electrodes.

[0036] The voltage difference and current data during the leakage current test of the two adjacent electrodes are recorded as (V). i I i ); i = 1, 2, ..., n, where n is the number of test data points; i is the sequence number of the test data points; when performing leakage current testing, V i I is the voltage difference applied across two adjacent electrodes; i This refers to the leakage current during the test.

[0037] Step 3: Convert the voltage difference and current data from the leakage current test into a new data representation format. Convert the voltage difference and current data (V...) from the leakage current test... i I iTransforming data into a new data representation form, that is...

[0038] Step 4: Plot the data curve based on the new data representation. The method for plotting the data curve is as follows:

[0039] by As the x-axis, Using the y-axis as the data axis, and plotting the data of n test points on the xy-axis, we get the data curve.

[0040] Step 5: Perform piecewise linear fitting on the data curve to obtain positive and negative slope lines; and find the x-coordinate value corresponding to each inflection point to obtain the voltage value V corresponding to the inflection point.

[0041] In this invention, the intersection of a positive slope line and a negative slope line is the inflection point; the x-coordinate value corresponding to the inflection point is... beg The reciprocal of the value is the voltage V corresponding to the inflection point.

[0042] Step 6: Record the voltage value V obtained in Step 5 and the voltage difference between the corresponding two adjacent electrodes in Step 1 as U. j-(j+1) The comparison is performed to determine the risk of a micro-discharge between the two adjacent electrodes, and the risk of a micro-discharge occurring at the collector of the entire traveling wave tube is determined.

[0043] The method for determining the risk of a minute discharge between two adjacent electrodes is as follows:

[0044] Connect V with the corresponding U j-(j+1) Compare; when V > U j-(j+1) If the risk of a small discharge between the two adjacent electrodes is low, then the risk of a small discharge between the two adjacent electrodes is high.

[0045] When V>U j-(j+1) Then, repeat steps two through six to test the other adjacent electrodes of the traveling wave tube collector. The test results for all adjacent electrodes of the traveling wave tube collector must satisfy V > U. j-(j+1) If the risk of a small discharge occurring at the collector of the entire traveling wave tube is low, then it can be determined that the risk is small.

[0046] When V≤U occurs during steps two through six of the loop. j-(j+1) When the cycle stops, it is determined that there is a high risk of a minute discharge occurring at the collector of the entire traveling wave tube.

[0047] When the first result indicates a high risk of micro-discharge between the two adjacent electrodes, the leakage test is stopped, and the risk of micro-discharge in the entire traveling wave tube collector is determined to be high.

[0048] Example

[0049] Taking a traveling wave tube amplifier as an example, the steps for assessing the risk of extremely small discharges in the traveling wave tube are as follows:

[0050] 1. Based on the design operating voltages of each stage of the traveling wave tube's collector, the voltage difference between two adjacent electrodes of the traveling wave tube's collector is obtained as U. 1-2 =6.6kV and U 2-3 =6kV.

[0051] 2. Using a DC high-voltage power supply, leakage current tests were performed on the receiver electrodes 1 and 2 of the traveling wave tube under different high voltages. During the test, the voltage value was gradually increased from small to large, and the corresponding leakage current was measured and recorded. A set of voltage-current correspondences was obtained ((V... i I i (i = 1, 2, 3…, n) (Test results are shown in Table 1). During the test, the voltage range needs to cover the voltage difference between the two electrodes. In this example, the tested voltage range is (0.7 * U c1-c2 1.3*U c1-c2 )

[0052] Table 1

[0053] 1 4.653 0.57 2 4.877 0.68 3 5.098 0.81 4 5.32 0.86 5 5.542 0.88 6 5.764 0.97 7 5.985 0.93 8 6.207 0.98 9 6.429 1.14 10 6.651 1.01 11 6.872 1.42 12 7.094 1.17 13 7.315 1.29 14 7.537 1.14 15 7.759 1.36 16 7.98 1.79 17 8.202 2.14 18 8.423 3.31 19 8.645 5.06

[0054] 3. Regarding the test data (V) i I i Mathematical processing is performed to obtain a new data list.

[0055] 4. As the x-axis, Plot the data curve using the y-axis as an example, such as Figure 2 As shown.

[0056] 5. Perform piecewise linear fitting on the data in the curve to obtain lines with positive and negative slopes. The intersection of the two lines is the inflection point; record the x-coordinate value corresponding to the inflection point. Thus, the voltage value V corresponding to the inflection point is obtained. a =7.537kV.

[0057] 6. The voltage value V obtained in step 5 a =7.537kV and the voltage difference U between the test electrode c1-c2 =6.6kV for comparison. Since 7.537kV > 6.6kV, that is, the measured electrode withstand voltage is greater than the design value, it can be considered that the risk of micro-discharge of receiver 1 electrode and receiver 2 electrode is small.

[0058] Proceed to step 2, and perform leakage current tests on the receiver 2 and receiver 3 electrodes of the traveling wave tube under different voltages. The test data are shown in Table 2. Then proceed to steps 3, 4, and 5 to obtain the voltage value V corresponding to the inflection point. b =7.735kV (e.g.) Figure 3 (As shown). By comparing the measured value V b =7.735kV > Design value U c2-c3 =6kV, so the risk of micro-discharge at electrode 2 and electrode 3 can be considered low.

[0059] Table 2

[0060]

[0061]

[0062] 7. The three adjacent electrodes of the collector of this traveling wave tube simultaneously satisfy V a >U c1-c2 and V b >U c2-c3 Therefore, it can be determined that the withstand voltage margin of each electrode of the traveling wave tube collector meets the requirements, and the risk of a small discharge in the entire traveling wave tube collector is small.

[0063] This invention evaluates the safety withstand voltage margin of the collector electrode of a traveling wave tube by performing a high-voltage leakage current test on adjacent electrodes in the collector electrode.

[0064] This invention designs a logic for judging the risk of micro-discharge occurring between adjacent electrodes, and based on this, completes the design of a logic for judging the risk of micro-discharge occurring at the collector of the entire traveling wave tube.

[0065] This invention designs a method for recording the voltage difference and current data during leakage current testing of two adjacent electrodes as (V). i I i (and convert it into a new data representation form, that is...) At the same time As the x-axis, Using the y-axis as the basis, n test point data are plotted on the xy-axis to form a data curve, thus enabling the entire logical judgment to be supported by data charts, ensuring accurate judgment.

[0066] Although the present invention has been disclosed above with reference to preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make possible changes and modifications to the technical solutions of the present invention by utilizing the methods and techniques disclosed above without departing from the spirit and scope of the present invention. Therefore, any simple modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solutions of the present invention shall fall within the protection scope of the technical solutions of the present invention.

Claims

1. A method for determining the risk of extremely small discharges in a traveling wave tube, characterized in that: include: Step 1: Based on the design operating voltage of each stage of the traveling wave tube's collector, calculate the voltage difference between any two adjacent electrodes to obtain the voltage difference between any two adjacent electrodes of the traveling wave tube's collector. The voltage difference between any two adjacent electrodes is denoted as... ; Electrode serial number; Step 2: Use a DC high-voltage power supply to perform leakage current tests on any two adjacent electrodes of the traveling wave tube collector under different high voltages, and obtain the data of voltage difference and current during the leakage current test of the two adjacent electrodes; The voltage difference and current data during the leakage current test of the two adjacent electrodes are recorded as ( , ); , The number of test data points; This refers to the test data point number; during leakage current testing, The voltage difference applied across two adjacent electrodes; This refers to the leakage current during the testing process; Step 3: Convert the voltage difference and current data from the leakage current test into a new data expression format; The data of voltage difference and current during leakage current testing ( , ) is transformed into a new data representation form, that is, ( , ); Step 4: Draw the data curve based on the new data representation format; The method for plotting data curves is as follows: by As the x-axis, As the y-axis, and plotted on the xy-axis. The data from each test point constitutes the data curve; Step 5: Perform piecewise linear fitting on the data curve to obtain lines with positive and negative slopes; and find the x-coordinate value corresponding to each inflection point to obtain the voltage value corresponding to the inflection point. ; The intersection of a line with a positive slope and a line with a negative slope is the inflection point; the x-coordinate corresponding to the inflection point is... ,beg The reciprocal of the value is the voltage value corresponding to the inflection point. ; Step 6: Convert the voltage value obtained in Step 5. The voltage difference between the two adjacent electrodes corresponding to those in step one is recorded as follows: The comparison is made to determine the risk of a small discharge between the two adjacent electrodes. And determine the risk of a small discharge occurring at the collector of the entire traveling wave tube.

2. The method for determining the risk of extremely small discharges in a traveling wave tube according to claim 1, characterized in that: In step six, the method for determining the risk of a minor discharge between two adjacent electrodes is as follows: Will With the corresponding Compare; when If the risk of a small discharge between the two adjacent electrodes is low, then the risk of a small discharge between the two adjacent electrodes is high.

3. The method for determining the risk of extremely small discharges in a traveling wave tube according to claim 2, characterized in that: when Then, repeat steps two through six to test other adjacent electrodes of the traveling wave tube collector.

4. The method for determining the risk of extremely small discharges in a traveling wave tube according to claim 3, characterized in that: When the test results for all adjacent electrodes of the traveling wave tube collector meet the requirements If the risk of a small discharge occurring at the collector of the entire traveling wave tube is low, then it can be determined that the risk is small.

5. The method for determining the risk of extremely small discharges in a traveling wave tube according to claim 4, characterized in that: When the loop from step two to step six occurs When the cycle stops, it is determined that there is a high risk of a minute discharge occurring at the collector of the entire traveling wave tube.

6. The method for determining the risk of extremely small discharges in a traveling wave tube according to claim 2, characterized in that: When the first result indicates a high risk of micro-discharge between the two adjacent electrodes, the leakage test is stopped, and the risk of micro-discharge in the entire traveling wave tube collector is determined to be high.

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