Sample analysis system

Abstract

The embodiment of the invention provides a sample analysis system, a first analysis module comprises a first detection device and a first scheduling device, and a first scheduling assembly of the first scheduling device is at least used for scheduling a sample put in by a first sample introduction assembly to the first detection device; the second analysis module comprises a second detection device and a second scheduling device; a second scheduling assembly of the second scheduling device is at least used for scheduling the sample put in by the second sample introduction assembly to the second detection device; the target scheduling component can schedule samples between the first analysis module and the second analysis module; when the first scheduling device is at least partially in a non-working state, the second scheduling device at least schedules a sample put in by the second sample introduction assembly to the second detection device for detection; and / or when at least part of the second scheduling device is in a non-working state, the first scheduling device at least schedules the sample placed in the first sample introduction assembly to the first detection device for detection. And the reliability of the sample analysis system is improved.

Description

Technical Field

[0001] The present application relates to the technical field of medical equipment, and in particular to a sample analysis system. Background Art

[0002] To improve testing efficiency, some hospitals or laboratories use multiple sample analyzers for sample testing. In related technologies, multiple sample analyzers are typically cascaded, sharing a single independent sample scheduling device and front-end track. A malfunction in the sample scheduling device can render multiple analyzers inoperable, impacting user work. Summary of the Invention

[0003] This application provides a sample analysis system that can improve the reliability of the sample analysis system

[0004] In a first aspect, an embodiment of the present application provides a sample analysis system, comprising:

[0005] a first analysis module, the first analysis module comprising a first detection device and a first scheduling device, the first scheduling device comprising a first sample injection component and a first scheduling component, the first sample injection component being used by a user to insert a sample; when the first scheduling device is in operation, the first scheduling component is at least used to dispatch the sample inserted by the first sample injection component to the first detection device, and the first detection device is used to detect the sample;

[0006] a second analysis module, the second analysis module comprising a second detection device and a second scheduling device, the second scheduling device comprising a second sampling assembly and a second scheduling assembly, the second sampling assembly being used for a user to insert a sample; when the second scheduling device is in operation, the second scheduling assembly is at least used to schedule the sample inserted by the second sampling assembly to the second detection device, and the second detection device is used to detect the sample;

[0007] a target scheduling component capable of scheduling samples between the first analysis module and the second analysis module;

[0008] When the first scheduling device is at least partially in a non-working state, the second scheduling device at least schedules the sample placed by the second injection component to the second detection device for detection; and / or, when the second scheduling device is at least partially in a non-working state, the first scheduling device at least schedules the sample placed by the first injection component to the first detection device for detection.

[0009] In a second aspect, an embodiment of the present application provides a sample analysis system, comprising:

[0010] a first analysis module, the first analysis module comprising a first detection device and a first scheduling device, the first scheduling device comprising a first sample injection component, a first scanning component, and a first scheduling component, the first scheduling device being configured to perform a sample scheduling operation to schedule a sample to the first detection device, the first detection device being configured to perform a test on the sample;

[0011] a second analysis module, the second analysis module comprising a second detection device and a second scheduling device, the second scheduling device comprising a second sample injection component, a second scanning component and a second scheduling component, the second scheduling device being configured to perform a sample scheduling operation to schedule the sample to the second detection device, the second detection device being configured to perform testing on the sample;

[0012] a target scheduling component capable of scheduling samples between the first analysis module and the second analysis module;

[0013] in:

[0014] The sample scheduling operation at least includes: the scheduling component scheduling the sample put into the sampling component to the scanning component for scanning, and scheduling the scanned sample to the detection device for detection;

[0015] When the first target component in the first scheduling device is in a non-working state, the second target component in the second scheduling device cooperates with at least one other component in the first scheduling device to perform the sample scheduling operation; the first target component and the second target component are both the scheduling components, or both are the sampling components, or both are the scanning components.

[0016] In a second aspect, an embodiment of the present application provides a sample analysis system, comprising:

[0017] a first analysis module, the first analysis module comprising a first detection device and a first scheduling device, the first scheduling device comprising a first injection component and a first scheduling component, the first injection component being used for a user to insert a sample, the first scheduling component being used at least to schedule the sample inserted by the first injection component to the first detection device, the first detection device being used to detect the sample;

[0018] a second analysis module, the second analysis module comprising a second detection device and a second scheduling device, the second scheduling device comprising a second injection component and a second scheduling component, the second injection component being used for a user to insert a sample, the second scheduling component being used at least to schedule the sample inserted by the second injection component to the second detection device, the second detection device being used to detect the sample;

[0019] When the first detection device is in a non-working state, the first scheduling device and / or the second scheduling device schedules the sample placed in the first injection component to the second detection device for detection; and / or

[0020] When the second detection device is in a non-working state, the second scheduling device and / or the first scheduling device schedules the sample placed in the second injection component to the first detection device for detection.

[0021] The sample analysis system provided in an embodiment of the present application includes a first analysis module, a second analysis module, and a target scheduling component. The first analysis module includes a first detection device and a first scheduling device. The first scheduling device includes a first sampling assembly and a first scheduling component. The first sampling assembly is used for a user to insert a sample. When the first scheduling device is in an operating state, the first scheduling component is at least used to schedule the sample inserted by the first sampling assembly to the first detection device, which is used to test the sample. The second analysis module includes a second detection device and a second scheduling device. The second scheduling device includes a second sampling assembly and a second scheduling component. The second sampling assembly is used for a user to insert a sample. When the second scheduling device is in an operating state, the second scheduling component is at least used to schedule the sample inserted by the second sampling assembly to the second detection device, which is used to test the sample. The target scheduling component is capable of scheduling samples between the first analysis module and the second analysis module. When the first scheduling device is at least partially in an inoperative state, the second scheduling device at least schedules the sample inserted by the second sampling assembly to the second detection device for testing. And / or, when the second scheduling device is at least partially in an inoperative state, the first scheduling device at least schedules the sample inserted by the first sampling assembly to the first detection device for testing. The sample analysis system can schedule samples normally when some components of the analysis module are in a non-working state, thereby improving the reliability of the sample analysis system.

[0022] It should be understood that the above general description and the following detailed description are merely exemplary and explanatory and do not limit the disclosure of the embodiments of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0024] Figure 1 This is a schematic diagram of the structure of a sample analysis system provided in an embodiment of the present application;

[0025] Figures 2 to 3bis a schematic diagram of the structure of a sample analysis system in some embodiments of the present application;

[0026] Figure 4 is a schematic structural diagram of a detection device in some embodiments of the present application;

[0027] Figure 5 It is a structural diagram of a sample analysis system in other embodiments of the present application.

[0028] Description of reference numerals:

[0029] 100, first analysis module; 110, first detection device; 120, first scheduling device; 121, first sample injection assembly; 122, first scheduling assembly; 123, first common channel; 124, first scanning assembly; 200, second analysis module; 210, second detection device; 220, second scheduling device; 221, second sample injection assembly; 222, second scheduling assembly; 223, second common channel; 224, second scanning assembly; 300, third scheduling assembly; S, public area;

[0030] 11. Sample component; 12. Sample dispensing mechanism; 13. Reagent component; 14. Reagent dispensing mechanism; 15. Mixing mechanism; 16. Reaction component; 17. Optical detection component. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0032] The flowcharts shown in the accompanying drawings are for illustrative purposes only and do not necessarily include all contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps may be decomposed, combined, or partially merged, so the actual execution order may vary depending on the actual situation.

[0033] The following describes some embodiments of the present application in detail with reference to the accompanying drawings. In the absence of conflict, the following embodiments and features therein may be combined with each other.

[0034] See also Figure 1 , Figure 1 It is a structural diagram of a sample analysis system provided in an embodiment of the present application.

[0035] like Figure 1 As shown, the sample analysis system includes: a first analysis module 100, a second analysis module 200 and a target scheduling component.

[0036] The first analysis module 100 includes a first detection device 110 and a first scheduling device 120. The first scheduling device 120 includes a first sample injection component 121 and a first scheduling component 122. The first sample injection component 121 is for the user to insert the sample; when the first scheduling device 120 is in working state, the first scheduling component 122 is at least used to schedule the sample inserted by the first sample injection component 121 to the first detection device 110, and the first detection device 110 is used to detect the sample.

[0037] For example, the first dispatching component 122 includes at least one of the following: a dispatching cart, a conveyor belt, and a robot.

[0038] Exemplarily, the first sample injection assembly 121 is for the user to insert a sample container containing a sample. For example, Figure 1 As shown, the first injection assembly 121 includes one or more injection channels, which can be used to accommodate a sample rack loaded with one or more sample containers, or a sample seat loaded with one sample container.

[0039] Illustratively, the first scheduling component 122 can schedule at least part of the sample container provided by the first sampling component 121 to the first detection device 110 , and the first detection device 110 detects at least part of the sample in the sample container to obtain a first detection result.

[0040] The second analysis module 200 includes a second detection device 210 and a second scheduling device 220. The second scheduling device 220 includes a second sampling component 221 and a second scheduling component 222. The second sampling component 221 is for the user to insert the sample; when the second scheduling device 220 is in working state, the second scheduling component 222 is at least used to schedule the sample inserted by the second sampling component 221 to the second detection device 210, and the second detection device 210 is used to detect the sample.

[0041] For example, the second dispatching component 222 includes at least one of the following: a dispatching cart, a conveyor belt, and a robot.

[0042] Exemplarily, the second sample injection assembly 221 is for the user to insert a sample container containing a sample. Figure 1 As shown, the second injection assembly 221 includes one or more injection channels, which can be used to place a sample rack loaded with one or more sample containers, or to place a sample seat loaded with one sample container.

[0043] Illustratively, the second scheduling component 222 can schedule at least part of the sample container provided by the second sampling component 221 to the second detection device 210, and the second detection device 210 detects at least part of the sample in the sample container to obtain a second detection result.

[0044] In some embodiments, as Figure 2 As shown, the first detection device 110, the first scheduling component 122, the second scheduling component 222 and the second detection device 210 are arranged side by side in sequence along the first horizontal direction, and the first scheduling component 122 and the second scheduling component 222 are spliced ​​between the first detection device 110 and the second detection device 210.

[0045] Illustratively, the housings of the first analysis module 100 and the second analysis module 200 are connected using a connector to achieve the connection between the first scheduling component 122 and the second scheduling component 222. Illustratively, the movement of the first scheduling component 122 includes movement along the first horizontal direction, and the movement of the second scheduling component 222 includes movement along the first horizontal direction; for example, the first scheduling component 122 and the second scheduling component 222 can move on one or two guide rails, and the guide rails extend in a direction parallel to the first horizontal direction.

[0046] The target scheduling component can schedule samples between the first analysis module 100 and the second analysis module 200 .

[0047] In some embodiments, see Figure 1 and Figure 2 The target scheduling component includes at least one of the following: the first scheduling component 122 , the second scheduling component 222 , and a third scheduling component 300 other than the first scheduling component 122 and the second scheduling component 222 .

[0048] Illustratively, the first scheduling component 122 is further configured to schedule at least one sample located in the first sample injection component 121 to the second analysis module 200 , so that the second detection device 210 detects the sample to obtain a third detection result.

[0049] For example, the first scheduling component 122 can schedule at least one sample located in the first sampling component 121 to be tested by the second detection device 210 to obtain a third test result. Alternatively, the first scheduling component 122 can schedule at least one sample located in the first sampling component 121 to the second scheduling component 222, which then schedules the sample to be tested by the second detection device 210 to obtain a third test result.

[0050] In some embodiments, the second scheduling component 222 is further configured to schedule at least one sample located in the second sample injection component 221 to the first analysis module 100 , so that the first detection device 110 detects the sample to obtain a fourth detection result.

[0051] Exemplarily, the second scheduling component 222 is further configured to schedule at least one sample located in the second sampling component 221 to be tested by the first detection device 110 to obtain a fourth test result. Alternatively, the second scheduling component 222 may schedule at least one sample located in the second sampling component 221 to the first scheduling component 122, which then schedules the sample to be tested by the first detection device 110 to obtain a fourth test result.

[0052] In some embodiments, as Figure 2 As shown, a common area S is provided in the sample analysis system, and both the first scheduling component 122 and the second scheduling component 222 can move to the common area S.

[0053] For example, the first scheduling component 122 can schedule at least one sample located in the first sampling component 121 to the public area S, and the second scheduling component 222 can schedule the sample in the public area S to the second detection device 210 for testing to obtain a third test result. Alternatively, the second scheduling component 222 can first schedule the sample in the public area S to the second sampling component 221, and then schedule the sample to the second detection device 210 for testing based on a preset scheduling strategy to obtain a third test result.

[0054] For example, the second scheduling component 222 can schedule at least one sample located in the second sampling component 221 to the public area S, and the first scheduling component 122 can schedule the sample in the public area S to the first detection device 110 for testing to obtain the fourth test result. Alternatively, the first scheduling component 122 can first schedule the sample in the public area S to the first sampling component 121, and then schedule the sample to the first detection device 110 for testing based on a preset scheduling strategy to obtain the fourth test result.

[0055] For example, Figure 2 As shown, a common area S in the sample analysis system is provided with a common channel, and both the first scheduling component 122 and the second scheduling component 222 can move to the common channel to perform sample scheduling on the common channel.

[0056] like Figure 3a As shown, the first scheduling device 120 also includes a first common channel 123; Figure 3b As shown, the second scheduling device 220 further includes a second public channel 223. In some other embodiments, the public channel may be provided between the first scheduling device 120 and the second scheduling device 220.

[0057] For example, if Figure 3a As shown, the first scheduling device 120 includes a first common channel 123, and the first scheduling component 122 is also used to schedule the sample placed by the first injection component 121 to the first common channel 123 for caching, and the second scheduling component 222 is also used to schedule the sample cached in the first common channel 123 to the second detection device 210 for detection; and / or the second scheduling component 222 is also used to schedule the sample placed by the second injection component 221 to the first common channel 123 for caching, and the first scheduling component 122 is also used to schedule the sample cached in the first common channel 123 to the first detection device 110 for detection.

[0058] For example, if Figure 3b As shown, the second scheduling device 220 also includes a second common channel 223, the first scheduling component 122 is also used to schedule the sample placed by the first injection component 121 to the second common channel 223 for caching, and the second scheduling component 222 is also used to schedule the sample cached in the second common channel 223 to the second detection device 210 for detection; and / or the second scheduling component 222 is also used to schedule the sample placed by the second injection component 221 to the second common channel 223 for caching, and the first scheduling component 122 is also used to schedule the sample cached in the second common channel 223 to the first detection device 110 for detection.

[0059] In other embodiments, see Figure 2 The sample analysis system further includes a third scheduling component 300. The third scheduling component 300 can, for example, schedule samples in the first analysis module 100 to the second analysis module 200, and / or schedule samples in the second analysis module 200 to the first analysis module 100. For example, the first scheduling component 122 can schedule at least one sample in the first sample injection component 121 to the first common channel 123 for caching. The third scheduling component 300 schedules the sample cached in the first common channel 123 to the second common channel 223 for caching. The second scheduling component 222 schedules the sample cached in the second common channel 223 to the second detection device 210 for detection to obtain a third detection result. For example, the third scheduling component 300 includes at least one of the following: a scheduling cart, a conveyor belt, and a robotic arm.

[0060] In some embodiments, the first detection device 110 includes, but is not limited to, at least one of the following: a biochemical analysis unit, an immunoassay unit, an electrolyte analysis unit, a coagulation analysis unit, and a urine analysis unit. The second detection device 210 includes, but is not limited to, at least one of the following: a biochemical analysis unit, an immunoassay unit, an electrolyte analysis unit, a coagulation analysis unit, and a urine analysis unit.

[0061] The analysis unit in the first detection device 110 and the analysis unit in the second detection device 210 can be of the same or different types. It is understood that the test items corresponding to the first test result, the second test result, the third test result, and the fourth test result can be the same or different. For ease of explanation, the present embodiment is mainly described as follows: the first detection device 110 includes a biochemical analysis unit and the second detection device 210 includes an immunoassay analyzer. The first analysis module 100 can be referred to as a biochemical analyzer, and the second analysis module 200 can be referred to as an immunoassay analyzer.

[0062] In some embodiments, see Figure 4 At least one of the first detection device 110 and the second detection device 210 may include a sample component 11, a sample dispensing mechanism 12, a reagent component 13, a reagent dispensing mechanism 14, a mixing mechanism 15, a reaction component 16 and a light detection component 17, etc.

[0063] The sample part 11 is used to carry the sample. Figure 4 See Figure 5 The sample component 11 may include a sample aspiration channel, the scheduling component may schedule the sample to the sample aspiration channel, and the sample dispensing mechanism 12 may be used to aspirate the sample from the sample aspiration channel. Optionally, the sample component 11 may further include a front buffer channel, a rear buffer channel, and a first drive mechanism; the scheduling component may schedule the sample container to the front buffer channel for caching, the first drive mechanism may schedule the sample container cached in the front buffer channel to the sample aspiration channel for sample aspiration by the sample dispensing mechanism 12, and the first drive mechanism may also schedule the sample container after aspiration to the rear buffer channel for caching, thereby facilitating the release of the scheduling component and thereby improving the scheduling efficiency of the scheduling component.

[0064] like Figure 4 As shown, the sample dispensing mechanism 12 is used to aspirate the sample and discharge it into a cuvette to be loaded. For example, the sample dispensing mechanism 12 may include a sample needle, which is spatially moved in two or three dimensions by a two-dimensional or three-dimensional drive mechanism. The sample needle can then be moved to aspirate the sample carried by the sample component 11, move to the cuvette to be loaded, and discharge the sample into the cuvette.

[0065] The reagent component 13 is used to hold reagents. In one embodiment, the reagent component 13 may be a reagent tray, which is a disc-shaped structure with multiple positions for holding reagent containers. The reagent component 13 can rotate and drive the reagent containers it holds to rotate, and is used to rotate the reagent containers to a specific position, such as a position for the reagent to be drawn by the reagent dispensing mechanism 14. There can be one or more reagent components 13.

[0066] The reagent dispensing mechanism 14 is used to draw reagent and discharge it into a cuvette to be added. In one embodiment, the reagent dispensing mechanism 14 may include a reagent needle, which is spatially moved two-dimensionally or three-dimensionally by a two-dimensional or three-dimensional drive mechanism. This allows the reagent needle to move to draw reagent from the reagent component 13, move to the cuvette to be added, and discharge the reagent into the cuvette.

[0067] The mixing mechanism 15 is used to mix the reaction solution in the reaction cup. The number of the mixing mechanism 15 can be one or more.

[0068] The reaction component 16 has at least one placement location for placing a cuvette and incubating the reaction solution in the cuvette. For example, the reaction component 16 may be a reaction tray, which is a disc-shaped structure having one or more placement locations for the cuvettes. The reaction tray is capable of rotating, driving the cuvettes in the placement locations to rotate, thereby arranging the cuvettes within the reaction tray and incubating the reaction solution in the cuvettes.

[0069] The optical measurement unit 17 is used to perform optical measurements on the incubated reaction solution to obtain sample reaction data. For example, the optical measurement unit 17 detects the luminescence intensity of the reaction solution and, using a calibration curve, calculates the concentration of the component being measured in the sample. In one embodiment, the optical measurement unit 17 is located separately from the reaction unit 16.

[0070] In some embodiments, see Figure 5 , the first scheduling device 120 also includes a first scanning component 124, and the second scheduling device 220 also includes a second scanning component 224. Exemplarily, each scanning component includes a scanning channel and a scanning device arranged on the scanning channel. The scanning component can scan the sample rack or sample container to obtain sample information. The sample analysis system may further include a controller (not shown), which can control the first scheduling component 122 and / or the second scheduling component 222 to schedule the sample according to the sample information, for example, determining the detection item of the sample according to the sample information, and controlling the target scheduling component to schedule the sample to the first detection device 110 and / or the second detection device 210 for detection according to the detection item.

[0071] Exemplarily, the sample scheduling operation includes at least: the scheduling component scheduling the sample placed by the injection component to the scanning component for scanning, and scheduling the scanned sample to the detection device for detection. For example, the first scheduling component 122 schedules the sample placed by the first injection component 121 to the first scanning component 124 for scanning, controls the first scheduling component 122 to schedule the sample to the first detection device 110 for detection when the detection items of the sample include the detection items of the first detection device 110, and / or controls the first scheduling component 122 to schedule the sample to the second detection device 210 for detection when the detection items of the sample include the detection items of the second detection device 210.

[0072] In the sample analysis system of the embodiment of the present application, the first analysis module 100 and the second analysis module 200 each have their own independent scheduling device; the first scheduling device 120 and the second scheduling device 220 can independently schedule samples, or can schedule samples in parallel, to improve the efficiency of sample analysis. For example, while the first scheduling component 122 schedules the sample located in the first injection component 121 to the first detection device 110, the second scheduling component 222 can schedule the sample located in the second injection component 221 to the second detection device 210, or schedule the sample located in the second injection component 221 to the second detection device 210 to the public area S, or schedule the sample in the public area S to the second injection component 221 or the second detection device 210.

[0073] Specifically, when the first scheduling device 120 is at least partially in a non-working state, the second scheduling device 220 at least schedules the sample placed in the second injection component 221 to the second detection device 210 for detection; and / or, when the second scheduling device 220 is at least partially in a non-working state, the first scheduling device 120 at least schedules the sample placed in the first injection component 121 to the first detection device 110 for detection.

[0074] In some embodiments, the non-operating state includes at least one of the following: a fault, a stopped state according to user control, a debugging state, a diagnostic state, and a shutdown state. Exemplarily, the first scheduling device 120 being at least partially in a non-operating state includes at least one of the following: a fault in the first scheduling component 122, at least a partial fault in the first injection component 121, a fault in the control board of the first scheduling device 120, the first scheduling device 120 being stopped according to user control, the first scheduling device 120 being in a debugging state, the first scheduling device 120 being in a diagnostic state, or the first analysis module 100 being in a shutdown state.

[0075] Illustratively, even if the first scheduling device 120 is at least partially in a non-working state, the second scheduling component 222 can still schedule samples between the second injection component 221, the public area S, and the second detection device 210; and / or the second scheduling component 222 can also schedule samples located at the second injection component 221 to the first detection device 110 for detection, and / or the second scheduling component 222 can also schedule samples located at the first injection component 121 to the second detection device 210 for detection.

[0076] The sample analysis system of the embodiment of the present application can schedule samples normally when some components of the analysis module are in a non-working state, thereby fully utilizing the currently available resources of the sample analysis system and improving the reliability of the sample analysis system.

[0077] In some embodiments, when the first detection device 110 is in a non-working state, the target scheduling component schedules the sample placed in by the first injection component 121 to the second detection device 210 for detection; and / or when the second detection device 210 is in a non-working state, the target scheduling component schedules the sample placed in by the second injection component 221 to the first detection device 110 for detection.

[0078] For example, see Figure 4 , the detection device is in a non-working state, including at least one of the following: the sample component 11 is abnormal, such as the first driving mechanism corresponding to the sample aspiration channel is abnormal; the sample dispensing mechanism 12 is abnormal, such as the sample needle is blocked or the driving mechanism of the sample needle is abnormal; the reagent component 13 is in a non-working state, such as the reagent is replaced in the reagent component 13; the reagent dispensing mechanism 14 is abnormal, such as the driving mechanism of the reagent needle is abnormal; the reaction component 16 is abnormal, such as the incubation component is abnormal; the light detection component 17 is abnormal, such as the light sensor fails; the detection device is in a calibration state.

[0079] When a detection device in the sample analysis system is in a non-working state, the target scheduling component can transport the sample rack of the sampling component corresponding to the detection device to another detection device for detection.

[0080] Illustratively, when the first detection device 110 is in a non-working state, the first scheduling device 120 and / or the second scheduling device 220 schedules the sample placed in the first injection component 121 to the second detection device 210 for detection; and / or when the second detection device 210 is in a non-working state, the second scheduling device 220 and / or the first scheduling device 120 schedules the sample placed in the second injection component 221 to the first detection device 110 for detection.

[0081] For example, when one detection device in the sample analysis system is in a non-operating state, the sampling component and the scheduling component of the analysis module where the detection device is located can still work, which can increase the simultaneous sample loading capacity of another detection device.

[0082] In some embodiments, when the first target component in the first scheduling device 120 is in a non-working state, the second target component in the second scheduling device 220 cooperates with at least one other component in the first scheduling device 120 to perform a sample scheduling operation; the first target component and the second target component are both scheduling components, or are both sampling components, or are both scanning components.

[0083] Illustratively, when the first target component in the first scheduling device 120 is abnormal, the second target component in the second scheduling device 220 can replace the first target component and perform operations that should be completed by the first target component; for example, in addition to completing operations in the second analysis module 200, the second target component can also serve as a backup for the first target component; it can be achieved that when the first target component is abnormal, the sample analyzer can still work normally and continue sample scheduling and testing.

[0084] Exemplarily, when the second target component in the second scheduling device 220 is in an inoperative state, the first target component in the first scheduling device 120 cooperates with at least one other component in the second scheduling device 220 to perform sample scheduling operations. The first target component and the second target component are both scheduling components, or both are injection components, or both are scanning components. For example, the first target component in the first scheduling device 120 and the second target component in the second scheduling device 220 can serve as backups for each other. For example, when at least one target component in one scheduling device is in an inoperative state, the target component of the same type in the other scheduling device can be used to complete the scheduling operation of the sample rack corresponding to the injection component of the scheduling device.

[0085] For example, see Figure 5 When the first scanning component 124 is in a non-working state, the target scheduling component schedules the sample placed in by the first injection component 121 to the second scanning component 224 for scanning; and / or when the second scanning component 224 is in a non-working state, the target scheduling component schedules the sample placed in by the second injection component 221 to the first scanning component 124 for scanning.

[0086] For example, if two scheduling devices in a sample analysis system both have scanning components, and one scanning component malfunctions, the target scheduling component can dispatch samples from the scheduling device with the malfunctioning scanning component to the scanning component area of ​​the other scheduling device for scanning. Alternatively, the malfunctioning scanning component can be disabled, and the other scanning component can be used to scan the samples placed in the first sampling component 121 and the second sampling component 221 to obtain sample information, and then perform the required test items.

[0087] For example, when the first scanning component 124 is in a non-working state, the first sampling component 121, the first scheduling component 122 and the first detection device 110 in the first analysis module 100 can still be used; the currently available resources of the sample analysis system can be fully utilized to improve the reliability of the sample analysis system.

[0088] Illustratively, when the first scheduling component 122 is in a non-working state, the second scheduling component 222 is also used to schedule the sample placed in by the first injection component 121 to the first detection device 110 for detection; and / or when the second scheduling component 222 is in a non-working state, the first scheduling component 122 is also used to schedule the sample placed in by the second injection component 221 to the second detection device 210 for detection.

[0089] For example, the scheduling component is in a non-working state, including at least one of the following: the scheduling component is being reset, the scheduling mechanism (such as a motor) of the scheduling component is abnormal, and the control board of the scheduling component is abnormal; of course, it is not limited to this.

[0090] For example, the first scheduling component 122 and the second scheduling component 222 can serve as backups for each other. For example, if the first scheduling component 122 malfunctions, the second scheduling component 222 can replace the first scheduling component 122 to schedule samples within the first analysis module 100, fully utilizing the first sample injection component 121 and the first detection device 110 within the first analysis module 100. The second scheduling component 222 can also schedule the sample placed by the first sample injection component 121 to be scanned by the first scanning component 124. This can fully utilize the currently available resources of the sample analysis system and improve the reliability of the sample analysis system.

[0091] For example, see Figure 5The first injection component 121 includes several injection channels. When the several injection channels of the first injection component 121 are all in a non-working state, the target scheduling component schedules the sample placed in the second injection channel to the first scanning component 124 for scanning and / or to the first detection device 110 for detection; and / or the second injection component 221 includes several injection channels. When the several injection channels of the second injection component 221 are all in a non-working state, the target scheduling component schedules the sample placed in the first injection channel to the second scanning component 224 for scanning and / or to the second detection device 210 for detection.

[0092] For example, the injection channel is in a non-working state, including an abnormality of an on-site detection sensor in the injection channel, such as the signal output by the on-site detection sensor cannot accurately identify whether there is a sample in the corresponding injection channel.

[0093] For example, the first injection assembly 121 and the second injection assembly 221 can serve as backups for each other. For example, if all injection channels of the first injection assembly 121 are in an inoperative state, the user can place a sample into the injection channel of the second injection assembly 221. The target scheduling assembly can then dispatch the sample from the second analysis module 200 to the first analysis module 100 for testing by the first detection device 110. In other words, if the first injection assembly 121 malfunctions, the second injection assembly 221 can replace the first injection assembly 121 to load the sample, further fully utilizing the first scheduling assembly 122, first detection device 110, and first scanning assembly 124 within the first analysis module 100. By fully utilizing the currently available resources of the sample analysis system, the reliability of the sample analysis system is improved.

[0094] In some embodiments, when some of the injection channels of the first injection component 121 are in a non-working state, the target scheduling component schedules the samples placed in the injection channels that are not in a non-working state to the first detection device 110 for detection, and / or schedules them to the second detection device 210 for detection; and / or when some of the injection channels of the second injection component 221 are in a non-working state, the target scheduling component schedules the samples placed in the injection channels that are not in a non-working state to the second detection device 210 for detection, and / or schedules them to the first detection device 110 for detection.

[0095] For example, when some injection channels of the first injection component 121 are abnormal, only the abnormal injection channels can be disabled, and the target scheduling component, such as the first scheduling component 122, can schedule the samples placed in the normal injection channels to the first detection device 110 for detection and / or to the second detection device 210 for detection; by making full use of the currently available resources of the sample analysis system, the reliability of the sample analysis system is improved.

[0096] In some embodiments, the sample analysis system may further include an input module, a display module, and an alarm module.

[0097] The input module is used to receive user input. Commonly, the input module can be a mouse and keyboard, etc. In some cases, it can also be a touch screen display, which provides functions for user input and display of content. In this example, the input module and display module are integrated. Of course, in some examples, the input module can even be a voice input device that provides voice recognition.

[0098] The display module can be used to display information. In some embodiments, the sample analysis system itself may be integrated with the display module. In other embodiments, the sample analysis system may be connected to a computer device (e.g., a computer) to display information via the computer device's display unit (e.g., a display screen). These are all within the scope of the display module defined and protected herein.

[0099] The alarm module is configured to generate an alarm when the controller determines that an alarm condition has been triggered. In some embodiments, when an alarm condition has a corresponding alarm indicator, the alarm module drives the display module to display the corresponding alarm indicator to generate an alarm. In some examples, the alarm module can be hardware with a display function, or even integrated with the display module to provide user alerts and notifications through displayed content.

[0100] The sample analyzer provided in the embodiment of the present application includes a first analysis module 100, a second analysis module 200 and a target scheduling component; the first analysis module 100 includes a first detection device 110 and a first scheduling device 120, the first scheduling device 120 includes a first sample injection component 121 and a first scheduling component 122, the first sample injection component 121 is for a user to insert a sample; when the first scheduling device 120 is in an operating state, the first scheduling component 122 is at least used to schedule the sample inserted by the first sample injection component 121 to the first detection device 110, and the first detection device 110 is used to detect the sample; the second analysis module 200 includes a second detection device 210 and a second scheduling device 220, the second scheduling device 220 includes a second sample injection component 221 and a second scheduling component 222, The second sample injection assembly 221 is used by the user to insert a sample. When the second scheduling device 220 is in operation, the second scheduling component 222 is at least used to dispatch the sample inserted by the second sample injection assembly 221 to the second detection device 210, which is used to test the sample. The target scheduling component can dispatch samples between the first analysis module 100 and the second analysis module 200. When the first scheduling device 120 is at least partially inoperative, the second scheduling device 220 at least dispatches the sample inserted by the second sample injection assembly 221 to the second detection device 210 for testing. And / or, when the second scheduling device 220 is at least partially inoperative, the first scheduling device 120 at least dispatches the sample inserted by the first sample injection assembly 121 to the first detection device 110 for testing. The sample analysis system can dispatch samples normally even when some analysis module components are inoperative, thereby improving the reliability of the sample analysis system.

[0101] In some embodiments, the sample analyzer provided by the embodiment of the present application, the first scheduling device 120 and the second scheduling device 220 can independently schedule samples, which can improve the efficiency and reliability of sample scheduling; for example, when the scheduling device of one analysis module is at least partially abnormal, the scheduling device of another analysis module can still perform sample scheduling normally without being affected by the abnormal scheduling device; for example, in a distribution module ...; for example, when the scheduling device of one analysis module is at least partially abnormal, the scheduling device of another analysis module can still perform sample scheduling normally without being affected by the abnormal scheduling device; for example, in a distribution module, the first scheduling device 120 and the second scheduling device 220 can independently schedule samples; for example, when the scheduling device of one analysis module is at least partially abnormal, the scheduling device of another analysis module can still perform sample scheduling normally without being affected by the abnormal scheduling device.

[0102] When at least part of the scheduling device of an analysis module is abnormal, the corresponding part of the scheduling device of another analysis module can be used as a backup for the abnormal part to fully utilize the currently available resources of the sample analysis system and improve the reliability of the sample analysis system.

[0103] Please refer to the above examples. Figure 5 The embodiment of the present application further provides a sample analysis system, which includes: a first analysis module 100, a second analysis module 200 and a target scheduling component.

[0104] The first analysis module 100 includes a first detection device 110 and a first scheduling device 120. The first scheduling device 120 includes a first sampling component 121, a first scanning component 124, and a first scheduling component 122. The first scheduling device 120 is used to perform sample scheduling operations to schedule samples to the first detection device 110, which is used to test the samples. The second analysis module 200 includes a second detection device 210 and a second scheduling device 220. The second scheduling device 220 includes a second sampling component 221, a second scanning component 224, and a second scheduling component 222. The second scheduling device 220 is used to perform sample scheduling operations to schedule samples to the second detection device 210, which is used to test the samples. The target scheduling component can schedule samples between the first analysis module 100 and the second analysis module 200.

[0105] In some embodiments, the target scheduling component includes at least one of the following: the first scheduling component 122 , the second scheduling component 222 , and a third scheduling component 300 other than the first scheduling component 122 and the second scheduling component 222 .

[0106] Among them: the sample scheduling operation at least includes: the scheduling component schedules the sample placed by the sampling component to the scanning component for scanning, and schedules the scanned sample to the detection device for detection; when the first target component in the first scheduling device 120 is in a non-working state, the second target component in the second scheduling device 220 cooperates with at least one other component in the first scheduling device 120 to perform the sample scheduling operation; the first target component and the second target component are both scheduling components, or both are sampling components, or both are scanning components.

[0107] Illustratively, when the first target component in the first scheduling device 120 is abnormal, the second target component in the second scheduling device 220 can replace the first target component and perform operations that should be completed by the first target component; for example, in addition to completing operations in the second analysis module 200, the second target component can also serve as a backup for the first target component; it can be achieved that when the first target component is abnormal, the sample analyzer can still work normally and continue sample scheduling and testing.

[0108] For example, the first target component in the first scheduling device 120 and the second target component in the second scheduling device 220 can serve as backup for each other; for example, when at least one target component of any scheduling device is in a non-working state, the same type of target component of another scheduling device is used to complete the scheduling operation of the sample rack of the corresponding injection component of the scheduling device.

[0109] In some embodiments, the first injection component 121 includes several injection channels. When the several injection channels of the first injection component 121 are all in a non-working state, the target scheduling component schedules the sample placed in the second injection channel to the first scanning component 124 for scanning and / or to the first detection device 110 for detection; and / or the second injection component 221 includes several injection channels. When the several injection channels of the second injection component 221 are all in a non-working state, the target scheduling component schedules the sample placed in the first injection channel to the second scanning component 224 for scanning and / or to the second detection device 210 for detection.

[0110] In some embodiments, when the first scheduling component 122 is in a non-working state, the second scheduling component 222 is also used to schedule the sample placed in by the first injection component 121 to the first detection device 110 for detection; and / or when the second scheduling component 222 is in a non-working state, the first scheduling component 122 is also used to schedule the sample placed in by the second injection component 221 to the second detection device 210 for detection.

[0111] In some embodiments, when the first scanning component 124 is in a non-working state, the target scheduling component schedules the sample placed in by the first injection component 121 to the second scanning component 224 for scanning; and / or when the second scanning component 224 is in a non-working state, the target scheduling component schedules the sample placed in by the second injection component 221 to the first scanning component 124 for scanning.

[0112] The specific principles and implementation methods of the sample analysis system provided in the embodiment of the present application are similar to those of the sample analyzer in the aforementioned embodiment and will not be repeated here.

[0113] Please refer to the above examples. Figure 1 The embodiment of the present application further provides a sample analysis system, which includes: a first analysis module 100 and a second analysis module 200.

[0114] The first analysis module 100 includes a first detection device 110 and a first scheduling device 120. The first scheduling device 120 includes a first sampling component 121 and a first scheduling component 122. The first sampling component 121 is for the user to insert the sample. The first scheduling component 122 is at least used to schedule the sample inserted by the first sampling component 121 to the first detection device 110. The first detection device 110 is used to detect the sample; the second analysis module 200 includes a second detection device 210 and a second scheduling device 220. The second scheduling device 220 includes a second sampling component 221 and a second scheduling component 222. The second sampling component 221 is for the user to insert the sample. The second scheduling component 222 is at least used to schedule the sample inserted by the second sampling component 221 to the second detection device 210. The second detection device 210 is used to detect the sample.

[0115] When the first detection device 110 is in a non-working state, the first scheduling device 120 and / or the second scheduling device 220 schedules the sample placed in the first injection component 121 to the second detection device 210 for detection; and / or when the second detection device 210 is in a non-working state, the second scheduling device 220 and / or the first scheduling device 120 schedules the sample placed in the second injection component 221 to the first detection device 110 for detection.

[0116] For example, when one detection device in the sample analysis system is in a non-operating state, the sampling component and the scheduling component of the analysis module where the detection device is located can still work, which can increase the simultaneous sample loading capacity of another detection device.

[0117] The specific principles and implementation methods of the sample analysis system provided in the embodiment of the present application are similar to those of the sample analyzer in the aforementioned embodiment and will not be repeated here.

[0118] It should be understood that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present application.

[0119] It will also be understood that the term "and / or" as used in this application and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

[0120] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present application, and such modifications or substitutions should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A sample analysis system, characterized in that: include: a first analysis module, the first analysis module comprising a first detection device and a first scheduling device, the first scheduling device comprising a first sample injection component and a first scheduling component, the first sample injection component being used by a user to insert a sample; when the first scheduling device is in operation, the first scheduling component is at least used to dispatch the sample inserted by the first sample injection component to the first detection device, and the first detection device is used to detect the sample; a second analysis module, the second analysis module comprising a second detection device and a second scheduling device, the second scheduling device comprising a second sampling assembly and a second scheduling assembly, the second sampling assembly being used for a user to insert a sample; when the second scheduling device is in operation, the second scheduling assembly is at least used to schedule the sample inserted by the second sampling assembly to the second detection device, and the second detection device is used to detect the sample; a target scheduling component capable of scheduling samples between the first analysis module and the second analysis module; When the first scheduling device is at least partially in a non-working state, the second scheduling device at least schedules the sample placed by the second injection component to the second detection device for detection; and / or, when the second scheduling device is at least partially in a non-working state, the first scheduling device at least schedules the sample placed by the first injection component to the first detection device for detection.

2. The sample analysis system according to claim 1, wherein: The non-working state includes at least one of the following: a fault, a stop state according to user control, a debugging state, a diagnostic state, and a shutdown state.

3. The sample analysis system according to claim 1, wherein: The target scheduling component includes at least one of the following: the first scheduling component, the second scheduling component, and a third scheduling component other than the first scheduling component and the second scheduling component.

4. The sample analysis system according to claim 3, characterized in that: The first scheduling device further includes a first common channel, and the second scheduling component is further used to schedule the sample placed by the second injection component to the first common channel; the first scheduling component is further used to schedule the sample buffered in the first common channel to the first detection device for detection; and / or The second scheduling device also includes a second common channel, and the first scheduling component is also used to schedule the sample placed by the first injection component to the second common channel; the second scheduling component is also used to schedule the sample cached in the second common channel to the second detection device for detection.

5. The sample analysis system according to claim 3, wherein: When the first detection device is in a non-working state, the target scheduling component schedules the sample placed by the first sampling component to the second detection device for detection; and / or When the second detection device is in a non-working state, the target scheduling component schedules the sample placed by the second sampling component to the first detection device for detection.

6. The sample analysis system according to claim 3, wherein: The first scheduling device further includes a first scanning component, and the second scheduling device further includes a second scanning component; the sample scheduling operation at least includes: the scheduling component scheduling the sample placed by the injection component to the scanning component for scanning, and scheduling the scanned sample to the detection device for detection; When the first target component in the first scheduling device is in a non-working state, the second target component in the second scheduling device cooperates with at least one other component in the first scheduling device to perform the sample scheduling operation; the first target component and the second target component are both the scheduling components, or both are the sampling components, or both are the scanning components.

7. The sample analysis system according to claim 6, characterized in that: When the first scanning component is in a non-working state, the target scheduling component schedules the sample placed by the first sampling component to the second scanning component for scanning; and / or When the second scanning component is in a non-working state, the target scheduling component schedules the sample placed by the second sampling component to the first scanning component for scanning.

8. The sample analysis system according to claim 6, wherein: When the first scheduling component is in a non-working state, the second scheduling component is further used to schedule the sample placed by the first sampling component to the first detection device for detection; and / or When the second scheduling component is in a non-working state, the first scheduling component is further used to schedule the sample put in by the second sampling component to the second detection device for detection.

9. The sample analysis system according to claim 6, wherein: The first injection component includes a plurality of injection channels, and when the plurality of injection channels of the first injection component are in a non-working state, the target scheduling component schedules the sample placed in the second injection channel to the first scanning component for scanning and / or to the first detection device for detection; and / or The second injection component includes several injection channels. When the several injection channels of the second injection component are all in a non-working state, the target scheduling component schedules the sample placed in the first injection channel to the second scanning component for scanning and / or to the second detection device for detection.

10. The sample analysis system according to claim 9, characterized in that: When some of the injection channels of the first injection component are in a non-working state, the target scheduling component schedules the samples placed in the injection channels that are not in a non-working state to the first detection device for detection, and / or to the second detection device for detection; and / or When some injection channels of the second injection component are in a non-working state, the target scheduling component schedules samples placed in the injection channels that are not in a non-working state to the second detection device for detection, and / or to the first detection device for detection.

11. A sample analysis system, characterized in that: include: a first analysis module, the first analysis module comprising a first detection device and a first scheduling device, the first scheduling device comprising a first sample injection component, a first scanning component, and a first scheduling component, the first scheduling device being configured to perform a sample scheduling operation to schedule a sample to the first detection device, the first detection device being configured to perform a test on the sample; a second analysis module, the second analysis module comprising a second detection device and a second scheduling device, the second scheduling device comprising a second sample injection component, a second scanning component and a second scheduling component, the second scheduling device being configured to perform a sample scheduling operation to schedule the sample to the second detection device, the second detection device being configured to perform testing on the sample; a target scheduling component capable of scheduling samples between the first analysis module and the second analysis module; in: The sample scheduling operation at least includes: the scheduling component scheduling the sample put into the sampling component to the scanning component for scanning, and scheduling the scanned sample to the detection device for detection; When the first target component in the first scheduling device is in a non-working state, the second target component in the second scheduling device cooperates with at least one other component in the first scheduling device to perform the sample scheduling operation; the first target component and the second target component are both the scheduling components, or both are the sampling components, or both are the scanning components.

12. The sample analysis system according to claim 11, wherein: The target scheduling component includes at least one of the following: the first scheduling component, the second scheduling component, and a third scheduling component other than the first scheduling component and the second scheduling component.

13. The sample analysis system according to claim 11, wherein: The first injection component includes a plurality of injection channels, and when the plurality of injection channels of the first injection component are in a non-working state, the target scheduling component schedules the sample placed in the second injection channel to the first scanning component for scanning and / or to the first detection device for detection; and / or The second injection component includes several injection channels. When the several injection channels of the second injection component are all in a non-working state, the target scheduling component schedules the sample placed in the first injection channel to the second scanning component for scanning and / or to the second detection device for detection.

14. The sample analysis system according to claim 11, wherein: When the first scheduling component is in a non-working state, the second scheduling component is further used to schedule the sample placed by the first sampling component to the first detection device for detection; and / or When the second scheduling component is in a non-working state, the first scheduling component is further used to schedule the sample put in by the second sampling component to the second detection device for detection.

15. The sample analysis system according to claim 11, wherein: When the first scanning component is in a non-working state, the target scheduling component schedules the sample placed by the first sampling component to the second scanning component for scanning; and / or When the second scanning component is in a non-working state, the target scheduling component schedules the sample placed by the second sampling component to the first scanning component for scanning.

16. A sample analysis system, characterized in that: include: a first analysis module, the first analysis module comprising a first detection device and a first scheduling device, the first scheduling device comprising a first injection component and a first scheduling component, the first injection component being used for a user to insert a sample, the first scheduling component being used at least to schedule the sample inserted by the first injection component to the first detection device, the first detection device being used to detect the sample; a second analysis module, the second analysis module comprising a second detection device and a second scheduling device, the second scheduling device comprising a second injection component and a second scheduling component, the second injection component being used for a user to insert a sample, the second scheduling component being used at least to schedule the sample inserted by the second injection component to the second detection device, the second detection device being used to detect the sample; When the first detection device is in a non-working state, the first scheduling device and / or the second scheduling device schedules the sample placed in the first injection component to the second detection device for detection; and / or When the second detection device is in a non-working state, the second scheduling device and / or the first scheduling device schedules the sample placed in the second injection component to the first detection device for detection.

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