Lighting lamp damage state monitoring method and device and storage medium

Abstract

The invention relates to the technical field of lamp damage monitoring, in particular to a lighting lamp damage state monitoring method and device and a storage medium, and the method comprises the steps: collecting external sensor data and line internal data of each lighting lamp, building a three-phase electric unbalance compensation model according to the line internal data of each lighting lamp, and calculating the damage state of each lighting lamp; the method comprises the following steps: acquiring line internal data pairs of lighting lamps, compensating the line internal data pairs of the lighting lamps, acquiring a circuit connection diagram among the lighting lamps, performing feature modeling on the lines of the lighting lamps according to the compensated line internal data of the lighting lamps, and monitoring operation data of the lighting lamps in real time; and the lamp damage state is judged based on the acquired external sensor data and operation data of each lighting lamp, and the fault line is analyzed by combining the lamp damage state with the feature modeling result of the lighting lamp line. According to the invention, the damage monitoring efficiency of the lighting equipment is effectively improved.

Description

Technical Field

[0001] The present invention relates to the technical field of lamp damage monitoring, and in particular to a method, device and storage medium for monitoring the damage status of a lighting fixture. Background Art

[0002] With the prevalence of complex lighting systems in smart buildings, large venues, and other applications, traditional manual inspections are no longer sufficient to meet the demands of efficient operations and maintenance. Given the large number of densely distributed lighting fixtures, a single fixture failure can trigger a chain reaction (such as a three-phase load imbalance). Existing monitoring methods rely primarily on regular manual inspections or basic sensor alarms. These methods suffer from delayed response times, making it difficult to accurately locate hidden damage and distinguishing between inherent fixture failures and anomalies caused by grid harmonic interference.

[0003] Therefore, there is an urgent need for an intelligent lighting fixture damage status monitoring method to solve the above technical problems. Summary of the Invention

[0004] An object of the present invention is to provide a method, device and storage medium for monitoring the damage status of a lighting fixture, so as to solve at least one of the problems existing in the prior art.

[0005] To achieve the above objectives, according to one aspect of the present application, the present invention provides a method for monitoring the damage status of a lighting fixture, comprising:

[0006] Collect external sensor data and internal circuit data of each lighting fixture;

[0007] Construct a three-phase power imbalance compensation model based on the internal data of the circuits of each lighting fixture, and compensate for the internal data of the circuits of the lighting fixtures;

[0008] Obtaining a circuit connection diagram between each lighting fixture, and performing feature modeling on each lighting fixture circuit based on the internal circuit data of the compensated lighting fixture;

[0009] Monitor the operating data of each lighting fixture in real time, and determine the damage status of each lighting fixture based on the collected external sensor data and operating data of each lighting fixture;

[0010] The faulty circuit is analyzed by combining the damage status of the lamp with the characteristic modeling results of the lighting fixture circuit.

[0011] Optionally, the process of constructing a three-phase unbalance compensation model is as follows:

[0012] Calculate the global phase compensation coefficient and the local branch compensation coefficient of each lighting fixture, and record the global phase compensation coefficient as △φglobal, set △φ global =α×(V-Va) / Vnom, and the local branch compensation coefficient of each lighting fixture is recorded as △φk local, set △φk local =γk×△Lk×Ik;

[0013] Where α represents the phase sensitivity factor, V represents the maximum effective value of the three-phase voltage of the distribution cabinet, Va represents the maximum average value of the three-phase voltage of the distribution cabinet, Vnom represents the rated voltage of the distribution cabinet, γk represents the line impedance sensitivity coefficient of the k-th lighting fixture, △Lk represents the length of the distribution cable of the k-th lighting fixture, and Ik represents the effective value of the current of the k-th lighting fixture;

[0014] The current phase difference data set is compensated according to the global phase compensation coefficient and the local branch compensation coefficient of each lighting fixture. The compensation process is to subtract the global phase compensation coefficient and the local branch compensation coefficient of the corresponding lighting fixture from each element in the set.

[0015] Optionally, the feature modeling method for the lighting fixture circuit includes:

[0016] Obtain a circuit connection diagram between each lighting fixture;

[0017] Based on the circuit connection diagram between each lighting fixture, the lighting fixture electrical correlation matrix is ​​established with the internal circuit data of the lighting fixture after compensation;

[0018] A set of risky fault lines is generated based on the electrical association matrix of the lighting fixtures, and the set of high-risk fault lines is used as the characteristic modeling result of the lighting fixture lines.

[0019] Optionally, the process of establishing the electrical correlation matrix of the lamps is as follows:

[0020] Calculate the line correlation coefficient β(i,j) of each lighting device based on the relevant electrical parameters and current phase difference data set between each lighting fixture, and set β(i,j) = μ(i,j) × Z(i,j) / {|Z(i,j)| × sin(△φi - △φj)};

[0021] Where β(i,j) represents the line correlation coefficient between the i-th lighting fixture and the j-th lighting fixture, μ(i,j) represents the branch relationship index between the i-th lighting fixture and the j-th lighting fixture, and Z(i,j) represents the line coupling impedance between the i-th lighting fixture and the j-th lighting fixture;

[0022] The electrical correlation matrix of the lighting fixtures is established with the line correlation coefficient β(i,j) of each lighting device as the matrix element.

[0023] Optionally, all connection line sets are enumerated according to the electrical association matrix of the lamps, and the matrix elements in each connection line set are sorted in descending order, so as to use the sorted connection line sets as risk fault line sets.

[0024] Optionally, real-time collection of operating data of each lighting fixture;

[0025] Determine the damage status of each lighting fixture based on the collected external sensor data and operation data of each lighting fixture;

[0026] Establish a light detection and judgment model for each lighting fixture: if t(i) is less than a preset time and the lighting fixture illumination value falls within a first preset illumination value range, it is determined that some of the lamp beads in the i-th lighting fixture are damaged, and an alarm is issued to the user; if t(i) is less than a preset time and the lighting fixture illumination value falls within a second preset illumination value range, it is determined that the i-th lighting fixture is damaged, and an alarm is issued to the user; if t(i) is greater than a preset time and the lighting fixture illumination value falls within the first preset illumination value range, it is determined that the illumination of the i-th lighting fixture is abnormal, and an alarm for lighting maintenance is issued to the user; if t(i) is greater than a preset time and the lighting fixture illumination value falls within the second preset illumination value range or the third preset illumination value range, it is determined that the power of the i-th lighting fixture is abnormal;

[0027] Wherein, t(i) represents the leading edge duration of the current pulse of the i-th lighting fixture.

[0028] Optionally, the damage status of the lamp is further analyzed based on the light detection judgment model: when the power of the i-th lighting fixture is abnormal, if the operating voltage of the i-th lighting fixture exceeds 120% of the rated voltage of the i-th lighting fixture, it is determined that there is a load reduction in the branch where the lighting fixture is located; otherwise, it is determined that there is a voltage drop in the branch where the i-th lighting fixture is located.

[0029] Optionally, when there is a load reduction on the branch where the i-th lighting fixture is located, the risk fault line set where the i-th lighting fixture is located is retrieved, and each lighting fixture in the set is sequentially checked based on the retrieved risk fault line set to determine the damage status of the lighting fixture, and the checking results are displayed;

[0030] When there is a voltage drop in the branch where the i-th lighting fixture is located, the total load impedance of each lighting fixture in each risk fault line is calculated based on the risk fault line set, and the load ratio of each branch is calculated: if the load ratio of each branch is not 1, it is determined that the line load is unbalanced, and the inspection result is alarmed.

[0031] According to another aspect of the present application, a device for monitoring the damage status of a lighting fixture is provided, comprising:

[0032] Data acquisition unit, used to collect external sensor data and internal circuit data of each lighting fixture;

[0033] A data compensation unit, configured to construct a three-phase power imbalance compensation model based on the internal circuit data of each lighting fixture, and to compensate for the internal circuit data of the lighting fixture;

[0034] A feature modeling unit, configured to obtain a circuit connection diagram between each lighting fixture and perform feature modeling on each lighting fixture circuit based on internal circuit data of the compensated lighting fixture;

[0035] A damage judgment unit, configured to monitor the operating data of each lighting fixture in real time and judge the damage status of the lighting fixture based on the collected external sensor data and operating data of each lighting fixture;

[0036] The circuit analysis unit is used to analyze the fault circuit by combining the damage status of the lamp with the characteristic modeling results of the lighting fixture circuit.

[0037] According to another aspect of the present application, an electronic device is provided, comprising:

[0038] one or more processors;

[0039] a storage device for storing one or more programs;

[0040] When the one or more programs are executed by the one or more processors, the one or more processors implement the lighting fixture damage status monitoring method.

[0041] Compared with existing technologies, this invention offers significant advantages: through a comprehensive, integrated design encompassing simultaneous multi-source data acquisition, dynamic compensation for three-phase imbalance, electrical correlation matrix modeling, multi-dimensional damage status determination, and closed-loop analysis of faulty lines, it overcomes the challenges of traditional methods, such as data fragmentation, high false alarm rates, and low location efficiency. It is particularly well-suited for complex lighting systems such as smart buildings, improving monitoring efficiency by over 40% while reducing operational costs. Its core value lies in the deep integration of power system analysis and optical monitoring, achieving a technological leap from passive maintenance to active prediction. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0043] Figure 1 Schematic diagram of the flow of the lighting fixture damage status monitoring method of this embodiment.

[0044] Figure 2 Schematic diagram of the flow of the feature modeling method for lighting fixture circuits in this embodiment.

[0045] Figure 3 Schematic diagram of the damage monitoring method of this embodiment.

[0046] Figure 4 This is a schematic diagram of the structure of the lighting fixture damage status monitoring device provided in this embodiment.

[0047] Figure 5 This is a schematic diagram of the structure of the electronic device provided in this embodiment. DETAILED DESCRIPTION

[0048] In order to more clearly illustrate the present invention, the present invention is further described below in conjunction with preferred embodiments and accompanying drawings. Similar components in the accompanying drawings are represented by the same reference numerals. It should be understood by those skilled in the art that the following detailed description is illustrative rather than restrictive and should not be used to limit the scope of protection of the present invention.

[0049] It should be noted that, although the terms "first," "second," and "third" may be used to describe the embodiments of the present application, the description should not be limited to these terms. These terms are merely used to distinguish the descriptions. For example, without departing from the scope of the embodiments of the present application, "first" may also be referred to as "second," and similarly, "second" may also be referred to as "first."

[0050] The acquisition, storage, use, and processing of data in this application's technical solution comply with relevant national laws and regulations.

[0051] Specifically, the lighting fixture damage status monitoring method described in the present application is applied to fault monitoring of a continuous lighting fixture circuit network that is powered by a three-phase power supply and then hard-wired in series or parallel in an intelligent building emergency lighting system.

[0052] Applied to the above application scenarios, this application provides a method for monitoring the damage status of lighting fixtures. Figure 1 FIG. 1 is a flow chart of a method for monitoring the damage status of a lighting fixture according to the present application, comprising:

[0053] Step S101, collecting external sensor data and internal circuit data of each lighting fixture; the external sensor data includes: the set historical operating illuminance value of each lighting fixture; wherein the set historical operating illuminance value is the average illuminance value of the corresponding lighting fixture under the same historical operating voltage and current; the internal circuit data includes the current phase difference data set {△φk}, and the circuit coupling impedance, wherein k = 1, 2...m, and m is the total number of lamps; the circuit coupling impedance represents the circuit coupling impedance between each lighting fixture.

[0054] Exemplarily, the external sensor data and the line internal data described in this application can be collected by setting sensors outside the line and inside the line respectively.

[0055] Illustratively, in the present application, the process of collecting the external sensor data and the internal circuit data of each lighting fixture is synchronous periodic collection.

[0056] Please continue reading Figure 1 As shown, the lighting fixture damage status monitoring method further includes:

[0057] Step S102: construct a three-phase power imbalance compensation model based on the internal data of the circuits of each lighting fixture, and compensate for the internal data of the circuits of the lighting fixtures.

[0058] Specifically, in step S102, the process of constructing the three-phase unbalance compensation model is as follows:

[0059] Calculate the global phase compensation coefficient and the local branch compensation coefficient of each lighting fixture, and record the global phase compensation coefficient as △φglobal, set △φ global =α×(V-Va) / Vnom, and the local branch compensation coefficient of each lighting fixture is recorded as △φk local , set △φk local =γk×△Lk×Ik;

[0060] Where α represents the phase sensitivity factor, V represents the maximum effective value of the three-phase voltage of the distribution cabinet, Va represents the maximum average value of the three-phase voltage of the distribution cabinet, Vnom represents the rated voltage of the distribution cabinet, γk represents the line impedance sensitivity coefficient of the k-th lighting fixture, △Lk represents the length of the distribution cable of the k-th lighting fixture, and Ik represents the effective value of the current of the k-th lighting fixture;

[0061] The current phase difference data set is compensated according to the global phase compensation coefficient and the local branch compensation coefficient of each lighting fixture. The compensation process is to subtract the global phase compensation coefficient and the local branch compensation coefficient of the corresponding lighting fixture from each element in the set.

[0062] It is worth noting that the unit of the phase sensitivity factor described in this application is radians. At the same time, the process of compensating the internal data of the lighting fixture in this application is based on the physical model of signal propagation delay and is independent of the current amplitude. At the same time, the unit of the line impedance sensitivity coefficient described in this application is rad / (m×A), and its value can be assigned by measuring the radian value change of the phase change within the test distance and test current.

[0063] For example, this application does not make any specific restrictions on the value of the phase sensitivity factor, and those skilled in the art can set it freely as long as the value requirements of the phase sensitivity factor are met. This application determines the average value of the interference ratio between the three-phase voltage imbalance and the current phase difference in the actual distribution cabinet. In this application, the optimal value of the phase sensitivity factor is set to 0.23.

[0064] Specifically, a global and local dual compensation model is constructed to specifically eliminate measurement errors caused by grid harmonic phase drift and line length differences. At the same time, the introduction of the phase sensitivity factor α and the impedance sensitivity coefficient makes the compensation process fit the actual physical propagation delay model, significantly improving the accuracy of current phase data and providing a pure data source for fault location.

[0065] Please continue reading Figure 1 As shown, the lighting fixture damage status monitoring method further includes:

[0066] Step S103 , obtaining a circuit connection diagram between each lighting fixture, and performing feature modeling on the circuit of each lighting fixture based on the internal data of the circuit of the lighting fixture after compensation.

[0067] Specifically, a luminaire electrical correlation matrix is ​​constructed based on compensated data, and the strength of electrical coupling between luminaires is quantified using the correlation coefficient. The branch relationship index is used to distinguish main / branch circuit correlations. Combined with descending sorting of risky fault lines, this allows for rapid location of high-risk fault areas, providing early warning of line-level hazards and reducing manual troubleshooting costs.

[0068] See also Figure 2 As shown, this is the characteristic modeling method of the lighting fixture circuit of the present application, including:

[0069] Step S301: Obtain a circuit connection diagram between the lighting fixtures.

[0070] Specifically, the circuit connection diagram between the lighting fixtures is the circuit connection relationship between the lighting fixtures.

[0071] Please continue reading Figure 2 As shown, the feature modeling method of the lighting fixture circuit further includes:

[0072] Step S302 : Based on the circuit connection diagram between the lighting fixtures, an electrical correlation matrix of the lighting fixtures is established using internal circuit data of the lighting fixtures after compensation.

[0073] Specifically, in step S302, the process of establishing the lamp electrical correlation matrix is ​​as follows:

[0074] Calculate the line correlation coefficient β(i,j) of each lighting device based on the relevant electrical parameters and current phase difference data set between each lighting fixture, and set β(i,j) = μ(i,j) × Z(i,j) / {|Z(i,j)| × sin(△φi - △φj)};

[0075] Where β(i,j) represents the line correlation coefficient between the i-th lighting fixture and the j-th lighting fixture, μ(i,j) represents the branch relationship index between the i-th lighting fixture and the j-th lighting fixture, and Z(i,j) represents the line coupling impedance between the i-th lighting fixture and the j-th lighting fixture;

[0076] The electrical correlation matrix of the lighting fixtures is established with the line correlation coefficient β(i,j) of each lighting device as the matrix element.

[0077] Specifically, the branch relationship index μ(i,j) between the i-th lighting fixture and the j-th lighting fixture described in the present application has the following values: when the i-th lighting fixture and the j-th lighting fixture are in the same branch of the distribution cabinet, the value of μ(i,j) is set to 1; when the i-th lighting fixture and the j-th lighting fixture are in two different branches of the distribution cabinet, the value of μ(i,j) is set to 0; when the i-th lighting fixture is in the main line and the j-th lighting fixture is in the branch, the value of μ(i,j) is set to I(j) / I; where I(j) represents the rated current of the j-th lighting fixture at the rated output power, and I represents the rated current of the main line.

[0078] Please continue reading Figure 2 As shown, the feature modeling method of the lighting fixture circuit further includes:

[0079] Step S303: Generate a risk fault line set based on the lamp electrical association matrix, and use the high-risk fault line set as a feature modeling result of the lighting fixture line.

[0080] Specifically, in step S303, the process of generating a risk fault line set is as follows:

[0081] All connection line sets are enumerated according to the electrical association matrix of the lamps, and the matrix elements in each connection line set are sorted in descending order, so that the sorted connection line sets are used as risk fault line sets.

[0082] It can be understood that the enumeration process of the connection line set described in this application is: when the line association coefficient β(i,j) of each lighting fixture is not 0, the i-th lighting fixture and the j-th lighting fixture are included in the connection line set. For example: β(1,3), β(3,4), β(4,7) are all not 0 and β(7,k) are all 0, then the 1st, 3rd, 4th, and 7th lighting fixtures are included as the connection line set.

[0083] Please continue reading Figure 1 As shown, the lighting fixture damage status monitoring method further includes:

[0084] Step S104 : monitoring the operating data of each lighting fixture in real time, and determining the damage status of each lighting fixture based on the collected external sensor data and operating data of each lighting fixture.

[0085] To implement the function in step S104 above, please refer to Figure 3 As shown, it is a flow chart of the damage monitoring method provided by this application, including:

[0086] Step S401 , collecting operating data of each lighting fixture in real time; the operating data of each lighting fixture includes: operating voltage, operating current, load impedance, lamp illumination value, and current pulse leading edge duration.

[0087] Illustratively, the process of collecting operating data of each lighting fixture in the present application can be performed by setting electrical monitoring sensors inside the lighting fixture or at both ends of the access line of the lighting fixture. The sensor is not an internal device of the circuit, and its operation is not affected by the operation of the lighting fixture circuit.

[0088] Please continue reading Figure 3 As shown, the damage monitoring method further includes:

[0089] Step S402 : determining the damage status of each lighting fixture based on the collected external sensor data and operation data of each lighting fixture.

[0090] Specifically, in step S402 of the present application, the process of determining the damage status of the lamp is as follows:

[0091] Establish a light detection and judgment model for each lighting fixture: if t(i) is less than a preset time and the lighting fixture illumination value falls within a first preset illumination value range, it is determined that some of the lamp beads in the i-th lighting fixture are damaged, and an alarm is issued to the user; if t(i) is less than a preset time and the lighting fixture illumination value falls within a second preset illumination value range, it is determined that the i-th lighting fixture is damaged, and an alarm is issued to the user; if t(i) is greater than a preset time and the lighting fixture illumination value falls within the first preset illumination value range, it is determined that the illumination of the i-th lighting fixture is abnormal, and an alarm for lighting maintenance is issued to the user; if t(i) is greater than a preset time and the lighting fixture illumination value falls within the second preset illumination value range or the third preset illumination value range, it is determined that the power of the i-th lighting fixture is abnormal;

[0092] Wherein, t(i) represents the duration of the current pulse leading edge of the i-th lighting fixture;

[0093] The damage status of the lamp is further analyzed based on the light detection judgment model: when the power of the i-th lighting fixture is abnormal, if the operating voltage of the i-th lighting fixture exceeds 120% of the rated voltage of the i-th lighting fixture, it is determined that there is a load reduction in the branch where the lighting fixture is located; otherwise, it is determined that there is a voltage drop in the branch where the i-th lighting fixture is located.

[0094] For example, the preset duration described in this application is assigned based on the actual normal value of the pulse leading edge of the lamp. In this application, the preset duration is set to 50ns; at the same time, the first preset illuminance value range is [set historical operating illuminance value × 90%, set historical operating illuminance value], the second preset illuminance value range is [set historical operating illuminance value, set historical operating illuminance value × 120%], and the third preset illuminance range is (set historical operating illuminance value × 90).

[0095] Specifically, by innovatively integrating the duration of the current pulse front and the range of illumination values, a multi-level damage determination logic is established. This model covers the complete fault spectrum, from local lamp failure to system-level anomalies.

[0096] Please continue reading Figure 1 As shown, the lighting fixture damage status monitoring method further includes:

[0097] Step S105 , analyzing the faulty circuit by combining the damage status of the lamp with the characteristic modeling result of the lighting lamp circuit.

[0098] Specifically, the process of predicting the fault line in step S105 of the present application is as follows:

[0099] When there is a load reduction on the branch where the i-th lighting fixture is located, the risk fault line set where the i-th lighting fixture is located is retrieved, and each lighting fixture in the set is sequentially checked based on the retrieved risk fault line set to determine the damage status of the lighting fixture, and the checking results are reported to an alarm;

[0100] When a voltage drop occurs in the branch where the i-th lighting fixture is located, the total load impedance of each lighting fixture in each risk fault line is calculated based on the risk fault line set, and the load ratio of each branch is calculated: if the load ratio of each branch is not 1, the line load is determined to be unbalanced and an alarm is issued to the user.

[0101] For example, this application does not analyze the situation where there is a voltage drop in the branch where the i-th lighting fixture is located and the load ratio of each branch is 1. The analysis results are not within the scope of analysis of this application. It can be understood that the causes of this phenomenon include: external interference, short circuit, poor contact, transformer failure, etc., and this application does not conduct a detailed analysis.

[0102] Specifically, the single-point failure status is linked to the risk of faulty lines. When the load decreases, the associated lighting fixtures are quickly located for chain troubleshooting. When the voltage drops, branch load ratios are calculated to identify three-phase imbalances. This step establishes a link between single-point failure and line topology analysis, enabling closed-loop diagnosis from symptoms to root causes.

[0103] See also Figure 4As shown in FIG, it is a structural diagram of the lighting fixture damage status monitoring device provided by this application, including:

[0104] Data acquisition unit, used to collect external sensor data and internal circuit data of each lighting fixture;

[0105] A data compensation unit, configured to construct a three-phase power imbalance compensation model based on the internal circuit data of each lighting fixture, and to compensate for the internal circuit data of the lighting fixture;

[0106] A feature modeling unit, configured to obtain a circuit connection diagram between each lighting fixture and perform feature modeling on each lighting fixture circuit based on internal circuit data of the compensated lighting fixture;

[0107] A damage judgment unit, configured to monitor the operating data of each lighting fixture in real time and judge the damage status of the lighting fixture based on the collected external sensor data and operating data of each lighting fixture;

[0108] The circuit analysis unit is used to analyze the fault circuit by combining the damage status of the lamp with the characteristic modeling results of the lighting fixture circuit.

[0109] The lighting fixture damage status monitoring device provided in the embodiment of the present application can execute the lighting fixture damage status monitoring method provided in any embodiment of the present application, and has the corresponding functional modules and beneficial effects of the execution method.

[0110] From the hardware level, this application is to realize the function of the lighting fixture damage status monitoring method in a computer. This application also provides an electronic device, please refer to Figure 5 As shown, it is a schematic structural diagram of the electronic device described in this application, including:

[0111] Processor 1, memory 2, communication interface 3 and bus 4; wherein, data is transmitted between the processor 1 and memory 2, and between the memory 2 and communication interface 3 via the bus 4; the processor is used to process data in the memory and generate commands, the memory is used to store data, the communication interface is used to receive and send data, and the bus is used to realize data transmission between the processor, memory, and communication interface.

[0112] In this embodiment, the method for monitoring the damage status of lighting fixtures can be implemented as an executable computer program. When the computer program is loaded into a processor, one or more steps of the method for monitoring the damage status of lighting fixtures can be executed.

[0113] This embodiment further provides a computer-readable storage medium, which is used to store the computer-executable instructions. The computer-readable storage medium is a tangible physical storage medium that can store the above-mentioned computer program and various types of data used in the program; the physical storage medium includes but is not limited to existing physical storage media such as random access memory, read-only memory, optical disk, hard disk, or a combination of media.

[0114] Thus far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it will be readily understood by those skilled in the art that the scope of protection of the present invention is obviously not limited to these specific embodiments. Without departing from the principles of the present invention, those skilled in the art may make equivalent changes or substitutions to the relevant technical features, and the technical solutions after such changes or substitutions will fall within the scope of protection of the present invention.

Claims

1. A method for monitoring the damage status of a lighting fixture, characterized in that: include: Collect external sensor data and internal circuit data of each lighting fixture; Construct a three-phase power imbalance compensation model based on the internal data of the circuits of each lighting fixture, and compensate for the internal data of the circuits of the lighting fixtures; Obtaining a circuit connection diagram between each lighting fixture, and performing feature modeling on each lighting fixture circuit based on the internal circuit data of the compensated lighting fixture; Monitor the operating data of each lighting fixture in real time, and determine the damage status of each lighting fixture based on the collected external sensor data and operating data of each lighting fixture; The faulty circuit is analyzed by combining the damage status of the lamp with the characteristic modeling results of the lighting fixture circuit.

2. The lighting fixture damage status monitoring method according to claim 1, characterized in that: The process of building a three-phase unbalance compensation model is as follows: Calculate the global phase compensation coefficient and the local branch compensation coefficient of each lighting fixture, and record the global phase compensation coefficient as △φglobal, set △φ global =α×(V-Va) / Vnom, and the local branch compensation coefficient of each lighting fixture is recorded as △φk local , set △φk local =γk×△Lk×Ik; Where α represents the phase sensitivity factor, V represents the maximum effective value of the three-phase voltage of the distribution cabinet, Va represents the maximum average value of the three-phase voltage of the distribution cabinet, Vnom represents the rated voltage of the distribution cabinet, γk represents the line impedance sensitivity coefficient of the k-th lighting fixture, △Lk represents the length of the distribution cable of the k-th lighting fixture, and Ik represents the effective value of the current of the k-th lighting fixture; The current phase difference data set is compensated according to the global phase compensation coefficient and the local branch compensation coefficient of each lighting fixture. The compensation process is to subtract the global phase compensation coefficient and the local branch compensation coefficient of the corresponding lighting fixture from each element in the set.

3. The lighting fixture damage status monitoring method according to claim 2, characterized in that: The feature modeling methods for lighting fixture circuits include: Obtain a circuit connection diagram between each lighting fixture; Based on the circuit connection diagram between each lighting fixture, the lighting fixture electrical correlation matrix is ​​established with the internal circuit data of the lighting fixture after compensation; A set of risky fault lines is generated based on the electrical association matrix of the lighting fixtures, and the set of high-risk fault lines is used as the characteristic modeling result of the lighting fixture lines.

4. The lighting fixture damage status monitoring method according to claim 3, characterized in that: The process of establishing the electrical correlation matrix of a lamp is as follows: Calculate the line correlation coefficient β(i,j) of each lighting device based on the relevant electrical parameters and current phase difference data set between each lighting fixture, and set β(i,j) = μ(i,j) × Z(i,j) / {|Z(i,j)| × sin(△φi - △φj)}; Where β(i,j) represents the line correlation coefficient between the i-th lighting fixture and the j-th lighting fixture, μ(i,j) represents the branch relationship index between the i-th lighting fixture and the j-th lighting fixture, and Z(i,j) represents the line coupling impedance between the i-th lighting fixture and the j-th lighting fixture; The electrical correlation matrix of the lighting fixtures is established with the line correlation coefficient β(i,j) of each lighting device as the matrix element.

5. The lighting fixture damage status monitoring method according to claim 4, characterized in that: All connection line sets are enumerated according to the electrical association matrix of the lamps, and the matrix elements in each connection line set are sorted in descending order, so that the sorted connection line sets are used as risk fault line sets.

6. The method for monitoring the damage status of a lighting fixture according to claim 5, characterized in that: Real-time collection of operating data of each lighting fixture; Determine the damage status of each lighting fixture based on the collected external sensor data and operation data of each lighting fixture; Establish a light detection and judgment model for each lighting fixture: if t(i) is less than a preset time and the lighting fixture illumination value falls within a first preset illumination value range, it is determined that some of the lamp beads in the i-th lighting fixture are damaged, and an alarm is issued to the user; if t(i) is less than a preset time and the lighting fixture illumination value falls within a second preset illumination value range, it is determined that the i-th lighting fixture is damaged, and an alarm is issued to the user; if t(i) is greater than a preset time and the lighting fixture illumination value falls within the first preset illumination value range, it is determined that the illumination of the i-th lighting fixture is abnormal, and an alarm for lighting maintenance is issued to the user; if t(i) is greater than a preset time and the lighting fixture illumination value falls within the second preset illumination value range or the third preset illumination value range, it is determined that the power of the i-th lighting fixture is abnormal; Wherein, t(i) represents the leading edge duration of the current pulse of the i-th lighting fixture.

7. The method for monitoring lighting fixture damage status according to claim 6, characterized in that: The damage status of the lamp is further analyzed based on the light detection judgment model: when the power of the i-th lighting fixture is abnormal, if the operating voltage of the i-th lighting fixture exceeds 120% of the rated voltage of the i-th lighting fixture, it is determined that the branch where the lighting fixture is located has a load reduction; Otherwise, it is determined that there is a voltage drop in the branch where the i-th lighting fixture is located.

8. The method for monitoring lighting fixture damage status according to claim 7, characterized in that: When there is a load reduction on the branch where the i-th lighting fixture is located, the risk fault line set where the i-th lighting fixture is located is retrieved, and each lighting fixture in the set is sequentially checked based on the retrieved risk fault line set to determine the damage status of the lighting fixture, and the checking results are displayed; When there is a voltage drop in the branch where the i-th lighting fixture is located, the total load impedance of each lighting fixture in each risk fault line is calculated based on the risk fault line set, and the load ratio of each branch is calculated: if the load ratio of each branch is not 1, it is determined that the line load is unbalanced, and the inspection result is alarmed.

9. A lighting fixture damage status monitoring device, applied to the lighting fixture damage status monitoring method according to any one of claims 1 to 8, characterized in that: include: Data acquisition unit, used to collect external sensor data and internal circuit data of each lighting fixture; A data compensation unit, configured to construct a three-phase power imbalance compensation model based on the internal circuit data of each lighting fixture, and to compensate for the internal circuit data of the lighting fixture; A feature modeling unit, configured to obtain a circuit connection diagram between each lighting fixture and perform feature modeling on each lighting fixture circuit based on internal circuit data of the compensated lighting fixture; A damage judgment unit, configured to monitor the operating data of each lighting fixture in real time and judge the damage status of the lighting fixture based on the collected external sensor data and operating data of each lighting fixture; The circuit analysis unit is used to analyze the fault circuit by combining the damage status of the lamp with the characteristic modeling results of the lighting lamp circuit.

10. An electronic device, characterized in that: The electronic device comprises: one or more processors; a storage device for storing one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the lighting fixture damage status monitoring method according to any one of claims 1 to 8.

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