Testers and resource boards thereof
By introducing a synchronization control module and a processing module into the test machine, and utilizing a phase-locked loop and a pre-synchronization module to achieve synchronous control of multiple FPGAs, the problem of collaborative control of multiple FPGAs is solved, the test reliability is improved, and the cost is reduced.
CN120743831BActive Publication Date: 2026-06-23CHANGMAI SEMICONDUCTOR (CHENGDU) CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGMAI SEMICONDUCTOR (CHENGDU) CO LTD
- Filing Date
- 2025-05-16
- Publication Date
- 2026-06-23
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Figure CN120743831B_ABST
Abstract
The application relates to a test machine and a resource board thereof, the resource board comprising a first processing device and two or more second processing devices, the first processing device comprising a first synchronization control module and a first processing module, the first synchronization control module controlling the first processing module to start after receiving a clock signal output by a control board for a first preset time length, the first processing module performing graphic generation processing after starting and outputting corresponding data; each second processing device comprising a second synchronization control module and a second processing module, the second synchronization control module controlling the second processing module to start after receiving a clock signal output by the control board for a second preset time length, the second processing module acquiring the data output by the first processing module for processing after starting and outputting a test signal to a device to be tested. The different second processing devices can synchronously perform signal processing, the test signals output by the second processing devices are synchronous, and the test reliability of the test machine is improved.
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