Shale logging resistivity correction method, device, equipment and medium

Abstract

The invention discloses a shale logging resistivity correction method, device and equipment and a medium, and relates to the technical field of shale gas exploration, a shale core sample is pretreated, and shale organic matter is obtained; the method comprises the following steps: performing X-ray photoelectron spectroscopy experiment and data correction on shale organic matters to obtain first carbon atom scanning atlas data, performing peak-splitting fitting on the first carbon atom scanning atlas data to obtain a first peak area, and calculating a first graphite bond peak area proportion; performing X-ray photoelectron spectroscopy experiment and standard correction on the graphene sample to obtain second carbon atom scanning spectrum data, performing peak-splitting fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and calculating a second graphite bond peak area proportion; the graphitization degree of the organic matter is calculated according to the first graphite key peak area proportion and the second graphite key peak area proportion, the logging resistivity of shale is corrected, the graphitization degree of the organic matter is accurately and rapidly measured, and the accuracy of shale logging resistivity correction is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of shale gas exploration, and in particular to a shale well logging resistivity correction method, device, equipment and medium. Background Art

[0002] Organic matter graphitization refers to the process by which carbon-rich organic matter, under high-temperature and high-pressure geological conditions, undergoes complex physical and chemical changes, gradually transforming into a graphite crystal structure. The carbon in shale organic matter typically has an irregular structure. After undergoing diagenesis and metamorphism, numerous chemical reactions occur, breaking down a significant amount of kerogen into lower molecular weight compounds. As hydrocarbon generation and expulsion proceed, the carbon content of the residual organic matter gradually increases, fatty chains break, and aromatic hydrocarbon content rises. Under high-temperature and high-pressure conditions, this matter gradually transforms into graphite. Graphitization of shale organic matter is used to correct shale logging resistivity.

[0003] There are currently two main methods for measuring shale organic matter graphitization: one is to calculate shale graphitization through logging curves. According to the conductivity value, conductivity contribution value and organic carbon content of shale samples, the conductivity of graphitized organic matter is calculated, and the degree of graphitization of shale organic matter is determined based on the conductivity of graphitized organic matter. This method cannot eliminate the influence of formation water, resulting in inaccurate organic matter graphitization identified by logging; the other is to convert the asphalt reflectivity into the degree of graphitization after measurement. Due to the problem of the conversion formula between asphalt reflectivity and graphitization, it can only be described qualitatively, and it is difficult to quantitatively determine the degree of organic matter graphitization.

[0004] As can be seen from the above, how to accurately and quickly measure the degree of graphitization of organic matter and improve the accuracy of shale logging resistivity correction is a problem to be solved in this field. Summary of the Invention

[0005] In view of this, the purpose of the present invention is to provide a shale logging resistivity correction method, device, equipment and medium, which can accurately and quickly measure the degree of graphitization of organic matter and improve the accuracy of shale logging resistivity correction. The specific scheme is as follows:

[0006] In a first aspect, the present application discloses a shale logging resistivity correction method, comprising:

[0007] Obtaining a shale core sample, and pre-treating the shale core sample to obtain shale organic matter; the pre-treatment includes mud removal, acid washing, alkaline washing, filtration, and extraction;

[0008] performing an X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data, performing peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculating a first graphite bond peak area ratio using the first peak area;

[0009] performing an X-ray photoelectron spectroscopy experiment and standard correction on the graphene sample to obtain second carbon atom scanning spectrum data, performing peak fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and calculating a second graphite bond peak area ratio using the second peak area;

[0010] The first graphite bond peak area ratio and the second graphite bond peak area ratio are used to calculate the degree of graphitization of the organic matter, and the well logging resistivity of the shale is corrected based on the degree of graphitization of the organic matter.

[0011] Optionally, the obtaining of a shale core sample and pre-processing of the shale core sample to obtain shale organic matter includes:

[0012] Obtain shale core samples that meet the preset organic matter content;

[0013] The shale core sample is ground, soaked in distilled water, pickled, alkali washed, dispersed by ultrasonic vibration, centrifuged, and filtered to obtain shale organic matter.

[0014] Optionally, performing an X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data includes:

[0015] Performing an X-ray photoelectron spectroscopy experiment on the shale organic matter to obtain a first carbon atom scanning spectrum;

[0016] performing data correction on the first carbon atom scanning spectrum to obtain first carbon atom scanning spectrum data including a first binding energy correction value and a first corrected binding energy corresponding to the carbon element;

[0017] The calculation formula for the first binding energy correction value is:

[0018] ;

[0019] in, is the first binding energy correction value, is the binding energy corresponding to the peak signal intensity;

[0020] The calculation formula for the binding energy of carbon element after the first correction is:

[0021] ;

[0022] in, is the binding energy of carbon element after the first correction, is the binding energy of carbon element in the original data.

[0023] Optionally, performing peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculating the first graphite bond peak area ratio using the first peak area, includes:

[0024] Performing peak fitting on the first carbon atom scanning spectrum data to obtain graphite bond peak area, carbon-carbon single bond peak area, and carbon-oxygen bond peak area;

[0025] Calculating the first graphite bond peak area ratio using the graphite bond peak area, the carbon-carbon single bond peak area, and the carbon-oxygen bond peak area;

[0026] The formula for calculating the first graphite bond peak area ratio is:

[0027] ;

[0028] in, is the area ratio of the first graphite bond peak, is the graphite bond peak area, is the carbon-carbon single bond peak area, is the carbon-oxygen bond peak area.

[0029] Optionally, the second carbon atom scanning spectrum data includes a second binding energy correction value and a second corrected binding energy corresponding to the carbon element; the calculation formula for the second binding energy correction value is:

[0030] ;

[0031] in, is the second binding energy correction value, is the binding energy corresponding to the peak intensity of carbon element signal of graphene sample;

[0032] The calculation formula for the binding energy of carbon element after the second correction is:

[0033] ;

[0034] in, is the binding energy of carbon element after the second correction, is the corresponding binding energy of carbon element in the original data of graphene sample.

[0035] Optionally, calculating the degree of graphitization of organic matter using the first graphite bond peak area ratio and the second graphite bond peak area ratio includes:

[0036] Determining whether the second graphite bond peak area ratio is greater than a preset threshold;

[0037] If the second graphite bond peak area ratio is greater than a preset threshold, the graphitization degree of the organic matter is calculated using the first graphite bond peak area ratio and the second graphite bond peak area ratio;

[0038] If the second graphite bond peak area ratio is not greater than the preset threshold, the process jumps to the process of obtaining a shale core sample until the second graphite bond peak area ratio is greater than the preset threshold.

[0039] Optionally, calculating the degree of graphitization of organic matter using the first graphite bond peak area ratio and the second graphite bond peak area ratio includes:

[0040] The organic matter graphitization degree calculation formula is used to calculate the first graphite bond peak area ratio and the second graphite bond peak area ratio to obtain the organic matter graphitization degree;

[0041] The calculation formula for the degree of graphitization of organic matter is:

[0042] ;

[0043] in, is the degree of graphitization of organic matter, is the area ratio of the first graphite bond peak, is the area ratio of the second graphite bond peak.

[0044] In a second aspect, the present application discloses a shale logging resistivity correction device, comprising:

[0045] The sample acquisition and pretreatment module is used to obtain shale core samples and pretreat the shale core samples to obtain shale organic matter; the pretreatment includes mud removal, acid washing, alkaline washing, filtration, and extraction;

[0046] a first graphite bond peak area ratio calculation module, configured to perform an X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data, perform peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculate the first graphite bond peak area ratio using the first peak area;

[0047] a second graphite bond peak area ratio calculation module, configured to perform an X-ray photoelectron spectroscopy experiment and standard correction on the graphene sample to obtain second carbon atom scanning spectrum data, perform peak fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and calculate the second graphite bond peak area ratio using the second peak area;

[0048] The organic matter graphitization degree calculation module is used to calculate the organic matter graphitization degree by using the first graphite bond peak area ratio and the second graphite bond peak area ratio, and to correct the logging resistivity of the shale based on the organic matter graphitization degree.

[0049] In a third aspect, the present application discloses an electronic device, comprising:

[0050] a memory for storing a computer program;

[0051] a processor for executing the computer program to implement the shale logging resistivity correction method.

[0052] In a fourth aspect, the present application discloses a computer storage medium for storing a computer program; wherein the computer program is executed by a processor to implement the steps of the shale logging resistivity correction method disclosed above.

[0053] It can be seen that the present application provides a shale logging resistivity correction method, which comprises obtaining a shale core sample, pretreating the shale core sample to obtain shale organic matter; the pretreatment comprises desilting, acid washing, alkali washing, filtering and extraction; performing X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data, performing peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculating a first graphite bond peak area ratio by using the first peak area; performing X-ray photoelectron spectroscopy experiment and standard correction on a graphene sample to obtain second carbon atom scanning spectrum data, performing peak fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and calculating a second graphite bond peak area ratio by using the second peak area; calculating the graphitization degree of organic matter by using the first graphite bond peak area ratio and the second graphite bond peak area ratio, and correcting the logging resistivity of shale based on the graphitization degree of organic matter. The present application obtains a shale core sample, pretreats the shale core sample to obtain shale organic matter, performs X-ray photoelectron spectroscopy experiment, data correction and standard correction on the shale organic matter and the graphene sample to obtain first carbon atom scanning spectrum data and second carbon atom scanning spectrum data, respectively performs peak fitting to obtain a first peak area and a second peak area, calculates a first graphite bond peak area ratio and a second graphite bond peak area ratio, so as to calculate the graphitization degree of organic matter, which can realize accurate and rapid measurement of the graphitization degree of organic matter, provide important parameters for the identification of high-quality low-resistance shale, correct the logging resistivity of shale based on the graphitization degree of organic matter, and improve the accuracy of shale logging resistivity correction. BRIEF DESCRIPTION OF DRAWINGS

[0054] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor based on the provided drawings.

[0055] Figure 1 This is a flow chart of a shale logging resistivity correction method disclosed in this application;

[0056] Figure 2 A diagram showing a specific pretreatment process of a shale core sample disclosed in this application;

[0057] Figure 3 A full spectrum scan diagram disclosed in this application;

[0058] Figure 4 A carbon atom scanning spectrum disclosed in this application;

[0059] Figure 5 A peak fitting diagram disclosed in this application;

[0060] Figure 6 This is a full spectrum scan of a standard graphite sample disclosed in this application;

[0061] Figure 7 A carbon atom scanning spectrum of a standard graphene sample disclosed in this application;

[0062] Figure 8 This is a peak fitting diagram after standard correction of a graphite sample disclosed in this application;

[0063] Figure 9 This is a peak fitting diagram of the carbon atom scanning spectrum data after correction of a graphene sample disclosed in this application;

[0064] Figure 10 This is a schematic structural diagram of a shale logging resistivity correction device disclosed in this application;

[0065] Figure 11 This is a structural diagram of an electronic device provided in this application. DETAILED DESCRIPTION

[0066] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0067] Organic matter graphitization refers to the process by which carbon-rich organic matter, under high-temperature and high-pressure geological conditions, undergoes complex physical and chemical changes, gradually transforming into a graphite crystal structure. The carbon in shale organic matter typically has an irregular structure. After undergoing diagenesis and metamorphism, numerous chemical reactions occur, breaking down a significant amount of kerogen into lower molecular weight compounds. As hydrocarbon generation and expulsion proceed, the carbon content of the residual organic matter gradually increases, fatty chains break, and aromatic hydrocarbon content rises. Under high-temperature and high-pressure conditions, this matter gradually transforms into graphite. Graphitization of shale organic matter is used to correct shale logging resistivity. There are currently two main methods for measuring shale organic matter graphitization: one is to calculate shale graphitization through logging curves. Based on the conductivity value, conductivity contribution value, and organic carbon content of the shale sample, the conductivity of the graphitized organic matter is calculated, and the degree of graphitization of the shale organic matter is determined based on the conductivity of the graphitized organic matter. This method cannot eliminate the influence of formation water, resulting in inaccurate organic matter graphitization identified by logging; the other is to convert the asphalt reflectivity into the degree of graphitization. However, due to the problem of the conversion formula between asphalt reflectivity and graphitization, it can only be described qualitatively and it is difficult to quantitatively determine the degree of organic matter graphitization. As can be seen from the above, how to accurately and quickly measure the degree of organic matter graphitization and improve the accuracy of shale logging resistivity correction is a problem to be solved in this field.

[0068] See also Figure 1 As shown, the embodiment of the present invention discloses a shale logging resistivity correction method, which may specifically include:

[0069] Step S11: obtaining a shale core sample, and pre-treating the shale core sample to obtain shale organic matter; the pre-treatment includes mud removal, acid washing, alkaline washing, filtration, and extraction.

[0070] In this embodiment, a shale core sample having a preset organic matter content is obtained; the shale core sample is ground, soaked in distilled water, acid washed, alkaline washed, dispersed by ultrasonic vibration, centrifuged, and filtered to obtain shale organic matter.

[0071] Among them, the specific pretreatment process of shale core samples is as follows: Figure 2As shown, first, prepare 300g of fresh shale core sample. Select shale samples with a high organic matter content, such as those with a TOC (total organic carbon) content greater than 2.0%. Grind the sample into a powder (50-100 mesh). Soak in distilled water to remove mud. Acid wash is performed: add hydrochloric acid to remove carbonates. Shake in a 60°C water bath for 4 hours until no carbon dioxide bubbles are generated. Centrifuge at 3000 rpm for 10 minutes. Remove the supernatant from the centrifuge tube, and retain the solid sediment at the bottom. Then, add hydrofluoric acid to remove silicates. The acid wash residue is transferred to a polytetrafluoroethylene container, and hydrofluoric acid is added. React in a water bath at 80°C for 24 hours, and the supernatant is discarded. The remaining sediment is neutralized by washing with water, repeatedly centrifuged with deionized water until neutral, and oven-dried at 60°C for 48 hours. Alkali washing: Add the dried sample powder to a sodium hydroxide solution, shake in a 60°C water bath for 10 minutes, centrifuge at 3000 rpm for 10 minutes, and discard the supernatant. Repeatedly centrifuge and wash with deionized water until neutral. Add hydrochloric acid and arsenic-free zinc particles, disperse using ultrasonic vibration, and centrifuge at 3000 rpm for 20 minutes. Absorb the light fraction and collect it by filtration to obtain shale organic matter.

[0072] Step S12: performing an X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data, performing peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculating a first graphite bond peak area ratio using the first peak area.

[0073] In this embodiment, an X-ray photoelectron spectroscopy experiment is performed on the shale organic matter to obtain a first carbon atom scanning spectrum; data correction is performed on the first carbon atom scanning spectrum to obtain first carbon atom scanning spectrum data including a first binding energy correction value and a first corrected binding energy corresponding to the carbon element; peak fitting is performed on the first carbon atom scanning spectrum data to obtain a graphite bond peak area, a carbon-carbon single bond peak area, and a carbon-oxygen bond peak area; and the first graphite bond peak area ratio is calculated using the graphite bond peak area, the carbon-carbon single bond peak area, and the carbon-oxygen bond peak area;

[0074] The calculation formula for the first binding energy correction value is:

[0075] ;

[0076] in, is the first binding energy correction value, Counts / s, is the binding energy corresponding to the peak signal intensity, eV;

[0077] The calculation formula for the binding energy of carbon element after the first correction is:

[0078] ;

[0079] wherein, is the first corrected carbon element corresponding binding energy, eV, is the original data of the carbon element corresponding binding energy, eV;

[0080] The formula for calculating the first graphite bond peak area ratio is:

[0081] ;

[0082] wherein, is the first graphite bond peak area ratio, %, is the graphite bond peak area, a.u., is the carbon-carbon single bond peak area, a.u., is the carbon-oxygen bond peak area, a.u.

[0083] Specifically, the XPS (X-ray Photoelectron Spectroscopy, X-ray photoelectron spectroscopy) experiment can obtain the full spectrum and high-resolution spectrum of carbon atoms, and the XPS full spectrum shows that the most important elements in organic matter are carbon and oxygen (the corresponding binding energies are 284eV and 532eV, respectively), which accounts for more than 80% of the organic matter XPS element spectrum, followed by nitrogen and sulfur elements (the corresponding binding energies are 400eV and 164eV, respectively), which are less in organic matter and have less content on the C1s (carbon element high-resolution first carbon atom scanning spectrum). The high-resolution scanning spectrum C1s represents the number of photoelectrons of carbon-containing substances with different binding energies. In the C1s peak fitting calculation process, C—N (carbon-nitrogen) bond and C—S (carbon-sulfur) bond can not be considered. In addition, the C—H (carbon-hydrogen) bond cannot be detected by XPS experiment, and C—H bond is not considered in this study.

[0084] XPS experiment carbon atom scanning spectrum data correction (284.8eV): The C1s data is corrected to find the BE (Binding Energy, binding energy) corresponding to the highest peak of the signal intensity (unit: Counts / s). The sample needs to correct the charge accumulation effect, and usually takes C1s (284.8eV, adsorbed carbon) as the reference to find the first binding energy correction value.

[0085] Peak fitting of corrected data: The total binding energy and photoelectron intensity of the C1s carbon peaks of organic matter with different degrees of graphitization vary. This is due to differences in the carbon structure of the organic matter, which in turn results in different carbon peak contents in the C1s peak fitting curve. Based on this, the total functional group data of the carbon peaks can be peak fitted according to the bond energy values ​​of the functional groups. During the calculation, the relative contents of graphite bonds (284.3 eV), C—C (carbon-carbon) single bonds (284.8 eV), and C—O (carbon-oxygen) bonds (285.6 eV) in the C1s peaks are primarily analyzed. The distribution of three peaks, graphite bonds, C—C single bonds, and C—O bonds, is fitted to the corrected sample C1s data. The peak areas of these three peaks are calculated to obtain the graphite bond peak area, carbon-carbon single bond peak area, and carbon-oxygen bond peak area. The graphite bond peak area reflects the relative content of graphitized carbonaceous materials in the shale organic matter, and the area proportion of the first graphite bond peak is calculated.

[0086] Step S13: performing an X-ray photoelectron spectroscopy experiment and standard correction on the graphene sample to obtain second carbon atom scanning spectrum data, performing peak fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and using the second peak area to calculate the second graphite bond peak area ratio.

[0087] In this embodiment, an X-ray photoelectron spectroscopy experiment and standard correction are performed on the graphene sample to obtain second carbon atom scanning spectrum data; the second carbon atom scanning spectrum data includes a second binding energy correction value and a second corrected binding energy corresponding to the carbon element; the calculation formula for the second binding energy correction value is:

[0088] ;

[0089] in, is the second binding energy correction value, Counts / s, is the binding energy corresponding to the peak intensity of carbon element signal of graphene sample, eV;

[0090] The calculation formula for the binding energy of carbon element after the second correction is:

[0091] ;

[0092] in, is the binding energy of carbon element after the second correction, eV, is the binding energy of carbon element in the original data of graphene sample, eV.

[0093] In this embodiment, the graphene sample is subjected to XPS experiment and standard correction (284.3 eV): by subjecting the graphene sample to XPS experiment, the full spectrum and high-resolution second carbon atom scanning spectrum of the carbon element of the graphene sample can be obtained, and the binding energy corresponding to the highest peak of the signal intensity in the second carbon atom scanning spectrum is corrected to 284.3 eV. The bond energy of graphene (284.3 eV) is fixed, and the accuracy of this method is verified by the graphene sample.

[0094] Data peak fitting after standard correction of the graphene sample: the second carbon atom scanning spectrum data is subjected to peak fitting to calculate the second graphite bond peak area ratio. The formula for calculating the second graphite bond peak area ratio is:

[0095] ;

[0096] wherein, is the second graphite bond peak area ratio, %, is the graphite bond peak area in the second peak area, a.u., is the carbon-carbon single bond peak area in the second peak area, a.u., is the carbon-oxygen bond peak area in the second peak area, a.u.

[0097] Step S14: calculating the degree of graphitization of organic matter by using the first graphite bond peak area ratio and the second graphite bond peak area ratio, and correcting the logging resistivity of shale based on the degree of graphitization of organic matter.

[0098] In this embodiment, it is determined whether the second graphite bond peak area ratio is greater than a preset threshold value. If the second graphite bond peak area ratio is greater than the preset threshold value, the degree of graphitization of organic matter is calculated by using the first graphite bond peak area ratio and the second graphite bond peak area ratio. If the second graphite bond peak area ratio is not greater than the preset threshold value, the process of obtaining the shale core sample is jumped to until the second graphite bond peak area ratio is greater than the preset threshold value.

[0099] For example, it is determined whether the second graphite bond peak area ratio is greater than 95%. If the second graphite bond peak area ratio is greater than 95%, it indicates that the fitting method is feasible, and then the degree of graphitization of organic matter is calculated by using the first graphite bond peak area ratio and the second graphite bond peak area ratio.

[0100] The specific process of calculating the degree of graphitization of organic matter is that the degree of graphitization of organic matter is calculated by using the degree of graphitization of organic matter calculation formula to calculate the first graphite bond peak area ratio and the second graphite bond peak area ratio.

[0101] The degree of graphitization of organic matter calculation formula is:

[0102] ;

[0103] in, is the degree of graphitization of organic matter, %, is the area ratio of the first graphite bond peak, %, is the area ratio of the second graphite bond peak, %.

[0104] In this embodiment, the second graphite bond peak area ratio is the graphite bond peak area ratio of the graphene sample C1s corrected with 284.8eV as the benchmark, and the second graphite bond peak area ratio is the graphite bond peak area ratio of the graphite sample C1s corrected with 284.8eV as the benchmark. As a standard, the ratio of the relative content of graphitized bond energy to the sum of the total carbon bond energy of organic matter can be defined as the degree of graphitization of organic matter. The degree of graphitization of organic matter is calculated by the ratio of graphite bond energy to total organic carbon.

[0105] Take Well N233 in the southern part of a basin as an example. The shale of the Wufeng Formation-Longmaxi Formation in this well is buried at a depth of more than 3000m. The burial history shows that the shale has experienced a high burial depth, high organic matter maturity, and high degree of graphitization. A shale core sample with an organic matter content of >3% from a small layer of the Longmaxi Formation in this well was selected. First, shale organic matter powder was obtained, and then the organic matter XPS experimental full spectrum scan and carbon atom scan were obtained. The full spectrum scan is shown in the figure below. Figure 3 As shown, the carbon atom scanning spectrum is as follows Figure 4 shown.

[0106] Then, the binding energy corresponding to the highest peak of the carbon atom scanning spectrum of the organic sample is found to be 283.08 eV, and the sample binding energy correction value is calculated using the calculation formula of the first binding energy correction value. The corrected carbon atom scanning spectrum data of the sample is obtained according to the calculation formula of the corresponding binding energy of the carbon element after the first correction, where is 1.72eV:

[0107] 1.72=284.3-283.08;

[0108] Then, the sample corrected carbon atom scanning spectrum data is peak fitted, and the peak fitting is as follows Figure 5 As shown, the proportion of the three peaks is obtained, and the sample peak fitting table is shown in Table 1. The proportion of graphite peak 23.55%:

[0109] Table 1 Sample peak fitting table

[0110]

[0111] Then, the graphene sample was taken for XPS experiment, and the full spectrum scan of the standard graphite sample was as follows: Figure 6 As shown, the carbon atom scanning spectrum of the standard graphene sample is as follows Figure 7As shown, the binding energy corresponding to the highest peak of the carbon atom scanning spectrum is found to be 283.08 eV, and the standard correction value of the binding energy of the standard graphene sample is obtained. is 1.22eV. According to the calculation formula of the corresponding binding energy of carbon element after the second correction, The carbon atom scanning spectrum data of the graphene sample after standard correction is obtained for 1.22eV, 1.22=284.3-283.08, and the peak fitting table after standard correction of the graphite sample is shown in Table 2:

[0112] Table 2 Peak fitting table of graphite sample after standard correction

[0113]

[0114] Then, the carbon atom scanning spectrum data after graphene sample standard correction is peak fitted. The peak fitting after graphite sample standard correction is as follows: Figure 8 As shown, the proportions of the three peaks are obtained. It is 99.9997%, which is greater than 95%, indicating that the fitting method is applicable.

[0115] Then, find the binding energy corresponding to the highest peak of the carbon atom scanning spectrum is 283.08eV, and obtain the binding energy correction value of the graphene sample is 1.72eV. According to the calculation formula of the binding energy of carbon element after the first correction, The corrected carbon atom scanning spectrum data of the graphene sample is obtained at 1.72eV. The peak fitting of the corrected carbon atom scanning spectrum data of the graphene sample is as follows: Figure 9 As shown, the proportions of the three peaks are obtained, and the peak fitting table after correction of the graphite sample is shown in Table 3. 44.11%:

[0116] Table 3 Peak fitting table of graphite sample after correction

[0117]

[0118] Then according to the calculation formula of organic matter graphitization degree, the N233 sample The graphite sample has a The graphitization degree of N233 sample is calculated to be 53.39%.

[0119] In the embodiment, a shale core sample is obtained, the shale core sample is pretreated to obtain shale organic matter, the pretreatment includes argillan removal treatment, acid washing, alkali washing, filtration and extraction, X-ray photoelectron spectroscopy experiment and data correction are performed on the shale organic matter to obtain first carbon atom scanning spectrum data, peak fitting is performed on the first carbon atom scanning spectrum data to obtain a first peak area, and the first graphite bond peak area ratio is calculated by using the first peak area; X-ray photoelectron spectroscopy experiment and standard correction are performed on the graphene sample to obtain second carbon atom scanning spectrum data, peak fitting is performed on the second carbon atom scanning spectrum data to obtain a second peak area, and the second graphite bond peak area ratio is calculated by using the second peak area; the organic matter graphitization degree is calculated by using the first graphite bond peak area ratio and the second graphite bond peak area ratio, and the logging resistivity of the shale is corrected based on the organic matter graphitization degree. In the application, the shale core sample is obtained, the shale core sample is pretreated to obtain shale organic matter, X-ray photoelectron spectroscopy experiment, data correction and standard correction are performed on the shale organic matter and the graphene sample to obtain first carbon atom scanning spectrum data and second carbon atom scanning spectrum data, peak fitting is performed respectively to obtain a first peak area and a second peak area, the first graphite bond peak area ratio and the second graphite bond peak area ratio are calculated, the organic matter graphitization degree is calculated, the organic matter graphitization degree can be accurately and quickly measured, important parameters for distinguishing high-quality low-resistance shale are provided, the logging resistivity of the shale is corrected based on the organic matter graphitization degree, and the accuracy of shale logging resistivity correction is improved.

[0120] Referring to Figure 10 The embodiment of the application discloses a shale logging resistivity correction device, which can specifically include:

[0121] The sample acquisition and pretreatment module 11 is used for obtaining a shale core sample, pretreating the shale core sample to obtain shale organic matter, and the pretreatment includes argillan removal treatment, acid washing, alkali washing, filtration and extraction;

[0122] The first graphite bond peak area ratio calculation module 12 is used for performing X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data, performing peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculating the first graphite bond peak area ratio by using the first peak area;

[0123] The second graphite bond peak area ratio calculation module 13 is used for performing X-ray photoelectron spectroscopy experiment and standard correction on the graphene sample to obtain second carbon atom scanning spectrum data, performing peak fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and calculating the second graphite bond peak area ratio by using the second peak area;

[0124] The organic matter graphitization degree calculation module 14 is configured to calculate the organic matter graphitization degree using the first graphite bond peak area ratio and the second graphite bond peak area ratio, and to correct the logging resistivity of the shale based on the organic matter graphitization degree.

[0125] In this embodiment, a shale core sample is obtained, and the shale core sample is pretreated to obtain shale organic matter; the pretreatment includes mud removal, acid washing, alkaline washing, filtration, and extraction; the shale organic matter is subjected to an X-ray photoelectron spectroscopy experiment and data correction to obtain first carbon atom scanning spectrum data, the first carbon atom scanning spectrum data is subjected to peak fitting to obtain a first peak area, and the first peak area is used to calculate the first graphite bond peak area ratio; the graphene sample is subjected to an X-ray photoelectron spectroscopy experiment and standard correction to obtain second carbon atom scanning spectrum data, the second carbon atom scanning spectrum data is subjected to peak fitting to obtain a second peak area, and the second peak area is used to calculate the second graphite bond peak area ratio; the first graphite bond peak area ratio and the second graphite bond peak area ratio are used to calculate the degree of graphitization of the organic matter, and the logging resistivity of the shale is corrected based on the degree of graphitization of the organic matter. The present application obtains shale core samples, pre-treats the shale core samples to obtain shale organic matter, performs X-ray photoelectron spectroscopy experiments, data correction, and standard correction on the shale organic matter and graphene samples to obtain first carbon atom scanning spectrum data and second carbon atom scanning spectrum data, performs peak fitting on each of them to obtain the first peak area and the second peak area, calculates the first graphite bond peak area ratio and the second graphite bond peak area ratio, so as to calculate the degree of graphitization of the organic matter, and can accurately and quickly measure the degree of graphitization of the organic matter, provide important parameters for the identification of high-quality low-resistance shale, correct the logging resistivity of the shale based on the degree of graphitization of the organic matter, and improve the accuracy of the shale logging resistivity correction.

[0126] In some specific embodiments, the sample acquisition and preprocessing module 11 may specifically include:

[0127] A sample acquisition module is used to obtain shale core samples that meet a preset organic matter content;

[0128] The pretreatment module is used to grind, soak in distilled water, pickle, alkali wash, disperse by ultrasonic vibration, centrifuge, and filter the shale core sample to obtain shale organic matter.

[0129] In some specific embodiments, the first graphite bond peak area ratio calculation module 12 may specifically include:

[0130] A first carbon atom scanning spectrum determination module is used to perform an X-ray photoelectron spectroscopy experiment on the shale organic matter to obtain a first carbon atom scanning spectrum;

[0131] a first carbon atom scanning spectrum data determination module, configured to perform data correction on the first carbon atom scanning spectrum to obtain first carbon atom scanning spectrum data including a first binding energy correction value and a first corrected binding energy corresponding to the carbon element;

[0132] The calculation formula for the first binding energy correction value is:

[0133] ;

[0134] in, is the first binding energy correction value, is the binding energy corresponding to the peak signal intensity;

[0135] The calculation formula for the binding energy of carbon element after the first correction is:

[0136] ;

[0137] in, is the binding energy of carbon element after the first correction, is the binding energy of carbon element in the original data.

[0138] In some specific embodiments, the first graphite bond peak area ratio calculation module 12 may specifically include:

[0139] A peak fitting module is used to perform peak fitting on the first carbon atom scanning spectrum data to obtain graphite bond peak area, carbon-carbon single bond peak area, and carbon-oxygen bond peak area;

[0140] A first calculation module is used to calculate a first graphite bond peak area ratio using the graphite bond peak area, the carbon-carbon single bond peak area, and the carbon-oxygen bond peak area;

[0141] The formula for calculating the first graphite bond peak area ratio is:

[0142] ;

[0143] in, is the area ratio of the first graphite bond peak, is the graphite bond peak area, is the carbon-carbon single bond peak area, is the carbon-oxygen bond peak area.

[0144] In some specific embodiments, the second carbon atom scanning spectrum data includes a second binding energy correction value and a second corrected binding energy corresponding to the carbon element; the calculation formula for the second binding energy correction value is:

[0145] ;

[0146] in, is the second binding energy correction value, is the binding energy corresponding to the peak intensity of carbon element signal of graphene sample;

[0147] The calculation formula for the binding energy of carbon element after the second correction is:

[0148] ;

[0149] in, is the binding energy of carbon element after the second correction, is the corresponding binding energy of carbon element in the original data of graphene sample.

[0150] In some specific embodiments, the organic matter graphitization degree calculation module 14 may specifically include:

[0151] A judgment module, used to judge whether the second graphite bond peak area ratio is greater than a preset threshold;

[0152] an organic matter graphitization degree calculation module, configured to calculate the organic matter graphitization degree using the first graphite bond peak area ratio and the second graphite bond peak area ratio if the second graphite bond peak area ratio is greater than a preset threshold;

[0153] The jump module is used to jump to the process of obtaining the shale core sample if the second graphite bond peak area ratio is not greater than the preset threshold, until the second graphite bond peak area ratio is greater than the preset threshold.

[0154] In some specific embodiments, the organic matter graphitization degree calculation module 14 may specifically include:

[0155] The specific calculation module of the degree of graphitization of organic matter is used to calculate the first graphite bond peak area ratio and the second graphite bond peak area ratio using the organic graphitization degree calculation formula to obtain the degree of graphitization of organic matter;

[0156] The calculation formula for the degree of graphitization of organic matter is:

[0157] ;

[0158] in, is the degree of graphitization of organic matter, is the area ratio of the first graphite bond peak, is the area ratio of the second graphite bond peak.

[0159] Figure 11This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. The electronic device 20 may include: at least one processor 21, at least one memory 22, a power supply 23, a communication interface 24, an input / output interface 25, and a communication bus 26. The memory 22 is used to store a computer program, which is loaded and executed by the processor 21 to implement the relevant steps of the shale logging resistivity correction method performed by the electronic device as disclosed in any of the aforementioned embodiments.

[0160] In this embodiment, the power supply 23 is used to provide operating voltage for each hardware device on the electronic device 20; the communication interface 24 can create a data transmission channel between the electronic device 20 and the external device. The communication protocol it follows is any communication protocol that can be applied to the technical solution of this application and is not specifically limited here; the input and output interface 25 is used to obtain external input data or output data to the outside world. Its specific interface type can be selected according to specific application needs and is not specifically limited here.

[0161] In addition, the memory 22, as a carrier for resource storage, can be a read-only memory, random access memory, disk or CD, etc. The resources stored thereon include an operating system 221, a computer program 222 and data 223, etc. The storage method can be temporary storage or permanent storage.

[0162] The operating system 221 is used to manage and control the hardware devices and computer program 222 on the electronic device 20, enabling the processor 21 to operate and process data 223 in the memory 22. It can be run under Windows, Unix, Linux, or other operating systems. In addition to including computer programs capable of implementing the shale logging resistivity correction method performed by the electronic device 20 as disclosed in any of the aforementioned embodiments, the computer program 222 may also include computer programs capable of performing other specific tasks. Data 223 may include data transmitted from external devices to the shale logging resistivity correction device, as well as data collected by its own input / output interface 25.

[0163] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0164] Furthermore, an embodiment of the present application also discloses a computer-readable storage medium, in which a computer program is stored. When the computer program is loaded and executed by a processor, the steps of the shale logging resistivity correction method disclosed in any of the aforementioned embodiments are implemented.

[0165] Finally, it should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0166] The above is a detailed introduction to the shale logging resistivity correction method, device, equipment and storage medium provided by the present invention. Specific examples are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method and core ideas of the present invention. At the same time, for those skilled in the art, according to the ideas of the present invention, there may be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A shale logging resistivity correction method, characterized in that: include: Obtaining a shale core sample, and pre-treating the shale core sample to obtain shale organic matter; the pre-treatment includes mud removal, acid washing, alkaline washing, filtration, and extraction; performing an X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data, performing peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculating a first graphite bond peak area ratio using the first peak area; performing an X-ray photoelectron spectroscopy experiment and standard correction on the graphene sample to obtain second carbon atom scanning spectrum data, performing peak fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and calculating a second graphite bond peak area ratio using the second peak area; The first graphite bond peak area ratio and the second graphite bond peak area ratio are used to calculate the degree of graphitization of the organic matter, and the well logging resistivity of the shale is corrected based on the degree of graphitization of the organic matter.

2. The shale logging resistivity correction method according to claim 1, characterized in that: The obtaining of a shale core sample and pre-processing of the shale core sample to obtain shale organic matter comprises: Obtain shale core samples that meet the preset organic matter content; The shale core sample is ground, soaked in distilled water, pickled, alkali washed, dispersed by ultrasonic vibration, centrifuged, and filtered to obtain shale organic matter.

3. The shale logging resistivity correction method according to claim 1, characterized in that: The X-ray photoelectron spectroscopy experiment and data correction are performed on the shale organic matter to obtain the first carbon atom scanning spectrum data, including: Performing an X-ray photoelectron spectroscopy experiment on the shale organic matter to obtain a first carbon atom scanning spectrum; performing data correction on the first carbon atom scanning spectrum to obtain first carbon atom scanning spectrum data including a first binding energy correction value and a first corrected binding energy corresponding to the carbon element; The calculation formula for the first binding energy correction value is: ； in, is the first binding energy correction value, is the binding energy corresponding to the peak signal intensity; The calculation formula for the binding energy of carbon element after the first correction is: ； in, is the binding energy of carbon element after the first correction, is the binding energy of carbon element in the original data.

4. The shale logging resistivity correction method according to claim 1, characterized in that: The performing peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculating the first graphite bond peak area ratio using the first peak area, comprises: Performing peak fitting on the first carbon atom scanning spectrum data to obtain graphite bond peak area, carbon-carbon single bond peak area, and carbon-oxygen bond peak area; Calculating the first graphite bond peak area ratio using the graphite bond peak area, the carbon-carbon single bond peak area, and the carbon-oxygen bond peak area; The formula for calculating the first graphite bond peak area ratio is: ； in, is the area ratio of the first graphite bond peak, is the graphite bond peak area, is the carbon-carbon single bond peak area, is the carbon-oxygen bond peak area.

5. The shale logging resistivity correction method according to claim 1, characterized in that: The second carbon atom scanning spectrum data includes a second binding energy correction value and a second corrected binding energy corresponding to the carbon element; the calculation formula of the second binding energy correction value is: ； in, is the second binding energy correction value, is the binding energy corresponding to the peak intensity of carbon element signal of graphene sample; The calculation formula for the binding energy of carbon element after the second correction is: ； in, is the binding energy of carbon element after the second correction, is the corresponding binding energy of carbon element in the original data of graphene sample.

6. The shale logging resistivity correction method according to claim 1, characterized in that: The calculating the degree of graphitization of organic matter by using the first graphite bond peak area ratio and the second graphite bond peak area ratio includes: Determining whether the second graphite bond peak area ratio is greater than a preset threshold; If the second graphite bond peak area ratio is greater than a preset threshold, the graphitization degree of the organic matter is calculated using the first graphite bond peak area ratio and the second graphite bond peak area ratio; If the second graphite bond peak area ratio is not greater than the preset threshold, the process jumps to the process of obtaining a shale core sample until the second graphite bond peak area ratio is greater than the preset threshold.

7. The shale logging resistivity correction method according to any one of claims 1 to 6, characterized in that: The calculating the degree of graphitization of organic matter by using the first graphite bond peak area ratio and the second graphite bond peak area ratio includes: The organic matter graphitization degree calculation formula is used to calculate the first graphite bond peak area ratio and the second graphite bond peak area ratio to obtain the organic matter graphitization degree; The calculation formula for the degree of graphitization of organic matter is: ； in, is the degree of graphitization of organic matter, is the area ratio of the first graphite bond peak, is the area ratio of the second graphite bond peak.

8. A shale logging resistivity correction device, characterized in that: include: A sample acquisition and preprocessing module is used to obtain shale core samples and preprocess the shale core samples to obtain shale organic matter; The pretreatment includes mud removal, acid washing, alkali washing, filtration and extraction; a first graphite bond peak area ratio calculation module, configured to perform an X-ray photoelectron spectroscopy experiment and data correction on the shale organic matter to obtain first carbon atom scanning spectrum data, perform peak fitting on the first carbon atom scanning spectrum data to obtain a first peak area, and calculate the first graphite bond peak area ratio using the first peak area; a second graphite bond peak area ratio calculation module, configured to perform an X-ray photoelectron spectroscopy experiment and standard correction on the graphene sample to obtain second carbon atom scanning spectrum data, perform peak fitting on the second carbon atom scanning spectrum data to obtain a second peak area, and calculate the second graphite bond peak area ratio using the second peak area; The organic matter graphitization degree calculation module is used to calculate the organic matter graphitization degree by using the first graphite bond peak area ratio and the second graphite bond peak area ratio, and to correct the logging resistivity of the shale based on the organic matter graphitization degree.

9. An electronic device, characterized in that: include: Memory, used to store computer programs; A processor, configured to execute the computer program to implement the shale logging resistivity correction method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that Used to store a computer program; wherein, when the computer program is executed by a processor, the shale logging resistivity correction method according to any one of claims 1 to 7 is implemented.

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