Component and component testing device for supporting in-cabin on-orbit maintenance

Abstract

A component and assembly test device supporting in-cabin on-orbit maintenance comprises a device main body structure, an external test structure, an internal test structure, a power supply management structure and a central control structure, the device main body structure is a box-shaped structure composed of a front baffle, a rear baffle, a left side plate, a right side plate, a top plate and a bottom plate, and provides installation support for other structures; the lower partition plate horizontally divides the space between the top plate and the bottom plate into an upper part and a lower part. The middle partition plate vertically divides the upper space into two parts; a plurality of positioning guide rails are arranged on the inner sides of the left side plate and the right side plate and on the two faces of the middle partition plate in the horizontal direction; mounting guide grooves are formed in the upper surface of the bottom plate; the external test structure is installed outside the right side plate. The internal test structure is horizontally mounted in an upper space between the top plate and the bottom plate through opposite positioning guide rails on the left side plate and the middle partition plate or on the right side plate and the middle partition plate; the power supply management structure is used for installing a power supply circuit; the central control structure is used for installing a control circuit board.

Description

TECHNICAL FIELD

[0001] The application relates to a device for testing components and assemblies supporting in-orbit maintenance in a cabin and belongs to the technical field of spaceflight equipment. BACKGROUND

[0002] With the rapid development of commercial spaceflight, the marketization of the spaceflight industry makes the competition for the establishment and launching of space vehicles more and more fierce. Reducing the grade and quality assurance cost of components and assemblies through appropriate means to reduce the cost of components and assemblies of space vehicles is an effective way to enhance the market competitiveness of commercial space vehicles. As an important means to test the in-orbit performance of components, the demand for in-orbit testing of components and assemblies will be more and more in the future.

[0003] At present, the in-orbit testing device of components and assemblies in China is single-use, and is destroyed together with the satellite after the in-orbit testing is completed, without in-orbit maintenance design. SUMMARY

[0004] The technical problem of the application is to overcome the shortcomings of the prior art and provide a device for testing components and assemblies supporting in-orbit maintenance in a cabin, which supports maintenance personnel to quickly replace and maintain the faulty components in the cabin of a space vehicle, reduces the maintenance cost of in-orbit testing of components, and improves the maintenance efficiency.

[0005] The technical solution of the application is a device for testing components and assemblies supporting in-orbit maintenance in a cabin, comprising a device main structure, an external testing structure, an internal testing structure, a power supply management structure and a central control structure, wherein:

[0006] The device main structure is a box-shaped structure composed of a front baffle, a rear baffle, a left side plate, a right side plate, a top plate and a bottom plate, which provides mounting support for the external testing structure, the internal testing structure, the power supply management structure and the central control structure. The lower partition plate is horizontally arranged in the box-shaped structure, and the space in the device main structure is divided into two parts; the middle partition plate is vertically arranged between the top plate and the lower partition plate and parallel to the left side plate and the right side plate, and the upper space between the top plate and the bottom plate is further divided into two parts.

[0007] The front baffle, the rear baffle, the left side plate and the right side plate are defined as the inner side facing the inside of the device main structure, and the other side is the outer side;

[0008] The inner side of the left side plate and the right side plate, and the two sides of the middle partition plate are provided with a plurality of positioning guide rails in the horizontal direction; the upper surface of the bottom plate is provided with a mounting guide groove;

[0009] The external testing structure is installed on the outer side of the right side plate and is used for installing a test circuit;

[0010] The inner test structure level is installed in the upper space between the top plate and the bottom plate through the opposite positioning guide rails on the left side plate and the middle partition plate, or the right side plate and the middle partition plate, for installing test circuit;

[0011] The power supply management structure is used for installing power supply circuit, and is installed on the bottom plate of the device main body structure through the mounting guide groove on the upper surface of the bottom plate;

[0012] The center control structure is used for installing the control circuit board, and is horizontally installed between the lower partition plate and the power supply management structure through the opposite positioning guide rails on the left side plate and the right side plate.

[0013] Preferably, the center control structure is provided with wedge locking structures on both sides, for cooperating with the positioning guide rails on the inner side walls of the left side plate and the right side plate;

[0014] The wedge locking structure comprises a locking screw, a locking guide rail, a head wedge block, a central wedge block and a tail wedge block, wherein:

[0015] The locking guide rail is fixed on the center control structure, and the locking guide rail is provided with a guide groove;

[0016] The central wedge block is installed in the guide groove of the locking guide rail, and the central wedge block can slide in the horizontal direction of the guide groove and move in the vertical direction of the guide groove;

[0017] The head wedge block is installed at one end of the locking guide rail through the guide groove on the locking guide rail, and the tail wedge block is fixed at the other end of the locking guide rail;

[0018] The locking screw is threadedly connected with the locking guide rail through the head wedge block, and the relative position of the head wedge block and the tail wedge block and the height of the central wedge block and the mounting surface of the locking guide rail are adjusted by adjusting the tightening depth of the locking screw.

[0019] Preferably, the inner side of the front baffle and the rear baffle is provided with a protruding grid, and the periphery is provided with a positioning jaw for auxiliary positioning;

[0020] Loose screws are distributed on the outer edge of the front baffle and the rear baffle, for connecting the front baffle, the rear baffle, the left side plate, the right side plate, the top plate, the bottom plate and the lower partition plate.

[0021] Preferably, the number and shape of the outer test structure are designed according to actual needs;

[0022] The edge of each outer test structure is designed with two positioning pin holes of different sizes, and the right side plate is provided with two special-shaped positioning pins of different sizes at positions corresponding to the positioning pin holes, so as to ensure the rapid and accurate positioning of the outer test structure;

[0023] Loose screw mounting threads are arranged on both sides of each positioning pin hole, and the outer test structure is installed on the outer side of the right side plate through the loose screws.

[0024] Preferably, the bottom plate lower surface is provided with a non-loose screw for screwing and fixing the power supply management structure; the screwing mode of the non-loose screw makes the power supply management structure in close contact with the bottom plate upper surface, thereby providing a heat conduction path for the power supply management structure.

[0025] Preferably, the internal test structure is box-shaped, and is provided with a wedge-shaped locking structure and a pulling aid mechanism, wherein:

[0026] The internal test structure is provided with the wedge-shaped locking structure horizontally installed on both sides of the internal test structure, for cooperating with the opposite positioning guide rails on the left side plate and the middle partition plate, or the right side plate and the middle partition plate;

[0027] The installation surface of the pulling aid mechanism faces the outside of the device main structure, is located close to the locking screw of the wedge-shaped locking structure, is rectangular in shape, and is used for assisting the internal test structure to be taken out.

[0028] Preferably, the inner sides of the left side plate and the right side plate, and the two surfaces of the middle partition plate are provided with positioning guide rails in the horizontal direction, and the starting end of each positioning guide rail is a horn mouth decreasing from large to small.

[0029] Compared with the prior art, the present application has the following advantages:

[0030] (1) The device of the present application is composed of a center control structure replaceable on orbit, a power supply management structure replaceable on orbit, an external test structure replaceable on orbit, an internal test structure replaceable on orbit, and a device structure supporting on-orbit maintenance. When any module fails on orbit, it can be quickly and individually replaced in the spacecraft, thereby reducing the maintenance cost and time of the test device;

[0031] (2) The center control structure replaceable on orbit of the present application is installed through the cooperation of the wedge-shaped locking structure and the guide rails of the device structure, thereby increasing the operability of the center control structure for replacement in the spacecraft and shortening the replacement time of the center control structure;

[0032] (3) The power supply management structure replaceable on orbit of the present application is installed through the cooperation of the non-loose screw mounting interface, the guide rails of the device structure, and the non-loose screw, thereby increasing the operability of the power supply management module for replacement in the spacecraft, shortening the replacement time of the power supply management structure, and increasing the safety of screw disassembly;

[0033] (4) The external test structure replaceable on orbit of the present application is installed through the cooperation of the non-loose screw, the positioning hole, the positioning pin of the device structure, and the non-loose screw mounting interface, thereby increasing the operability of the external test structure for replacement in the spacecraft, shortening the replacement time of the external test structure, and increasing the safety of screw disassembly;

[0034] (5) The on-orbit replaceable internal test structure of the present application is installed through the cooperation of the wedge locking structure and the device structure guide rail, which increases the operability of the internal test structure in the spacecraft, and shortens the time for replacing the internal test module. BRIEF DESCRIPTION OF DRAWINGS

[0035] Figure 1 The figure is a schematic diagram of the device of the present application;

[0036] Figure 2 The figure is a schematic diagram of the center control structure of the present application;

[0037] Figure 3 The figure is a schematic diagram of the power supply management structure of the present application: (a) is a schematic diagram of the power supply management structure in the installed state, and (b) is a schematic diagram of the power supply management structure in the overturned state;

[0038] Figure 4 The figure is a schematic diagram of the external test structure of the present application;

[0039] Figure 5 The figure is a schematic diagram of the internal test structure of the present application;

[0040] Figure 6 The figure is a schematic diagram of the device main body structure of the present application;

[0041] Figure 7 The figure is a schematic diagram of the wedge locking structure of the present application;

[0042] Figure 8 The figure is a schematic diagram of the front baffle of the present application: (a) is an internal schematic diagram, and (b) is an external schematic diagram;

[0043] Figure 9 The figure is a schematic diagram of the left side plate, right side plate, and middle partition plate guide rail of the present application;

[0044] Figure 10 The figure is a schematic diagram of the right side plate positioning pin of the present application;

[0045] Figure 11 The figure is a schematic diagram of the bottom plate of the present application.

[0046] The figure is a schematic diagram of the bottom plate of the present application.

[0047] 1 Main structure of the device, 2 External test structure, 3 Internal test structure, 4 Power supply management structure, 5 Central control structure, 6 Wedge-shaped locking structure, 7 Captive screw mounting interface, 8 Special-shaped positioning pin, 9 Captive screw; 1-1 Front baffle, 1-2 Rear baffle, 1-3 Left side panel, 1-4 Right side panel, 1-5 Top panel, 1-6 Bottom panel, 1-7 Middle partition, 1-8 Lower partition, 1-6-1 Mounting guide groove, 1-9 Positioning guide rail's flare, 1-1-1 Positioning tooth mouth; 5-9 Locking screw, 5-10 Locking guide rail, 5-11 Head wedge block, 5-12 Central wedge block, 5-13 Tail wedge block, 2-1 Positioning pin hole, 3-1 Pull-out aid mechanism. DETAILED DESCRIPTION

[0048] The purpose of the present invention is to provide a component and assembly testing device that can support maintenance personnel in the spacecraft cabin to quickly replace and repair faulty components, thereby reducing the maintenance cost of on-orbit component testing and improving maintenance efficiency.

[0049] like Figure 1 As shown, the component and assembly testing device supporting on-orbit maintenance in a cabin of the present invention specifically includes the following structure:

[0050] A central control structure 5 that can be replaced on-orbit, a power supply management structure 4 that can be replaced on-orbit, an external test structure 2 that can be replaced on-orbit, an internal test structure 3 that can be replaced on-orbit, and a main structure 1 of the device that supports on-orbit maintenance.

[0051] The main structure of the device provides installation support for other structures, such as Figure 6 As shown, it includes: a box-like structure consisting of a front baffle 1-1, a rear baffle 1-2, a left side panel 1-3, a right side panel 1-4, a top panel 1-5 and a bottom panel 1-6, a lower partition 1-8 is horizontally placed in the box-like structure, and the space between the top panel 1-5 and the bottom panel 1-6 is divided into two parts, upper and lower, respectively, and recorded as an upper space and a lower space; a middle partition 1-7 is vertically located between the top panel 1-5 and the lower partition 1-8, and is parallel to the left side panel 1-3 and the right side panel 1-4, with its upper and lower ends contacting the top panel 1-5 and the lower partition 1-8 respectively, and its left and right ends contacting the front baffle 1-1 and the rear baffle 1-2 respectively, and further dividing the upper space between the top panel 1-5 and the bottom panel 1-6 into two parts;

[0052] The sides of the front baffle 1-1, rear baffle 1-2, left side panel 1-3, and right side panel 1-4 facing the interior of the device main structure are defined as the inner side, and the other sides are defined as the outer side; the inner sides of the left side panel 1-3 and right side panel 1-4, as well as both sides of the middle partition 1-7, are provided with multiple positioning guide rails in the horizontal direction; the upper surface of the bottom panel 1-6 is provided with a mounting guide groove;

[0053] The external test structure is installed on the outside of the right side panel 1-4 and is used to install the test circuit;

[0054] The internal test structure level is installed in the upper space between the top plate 1-5 and the bottom plate 1-6 through the opposite positioning guide rails on the left side plate 1-3 and the middle partition plate 1-7, or the right side plate 1-4 and the middle partition plate 1-7, for installing test circuit;

[0055] The power supply management structure is used for installing power supply circuit, and is installed on the bottom plate 1-6 of the device main body structure through the mounting guide groove on the upper surface of the bottom plate 1-6;

[0056] A, the center control structure

[0057] As shown in Figure 2 The center control structure is used for installing control circuit board, and is horizontally installed between the lower partition plate 1-8 and the power supply management structure through the opposite positioning guide rails on the left side plate 1-3 and the right side plate 1-4.

[0058] The position where the two sides of the center control structure are matched with the positioning guide rails on the inner side walls of the left side plate 1-3 and the right side plate 1-4 is provided with a wedge locking structure, which is matched with the positioning guide rails on the inner side walls of the left side plate 1-3 and the right side plate 1-4, so as to fix the center control structure on the device main structure, and enable the center control structure to be quickly disassembled and assembled in the device;

[0059] The wedge locking structure 6 comprises a locking screw 5-9, a locking guide rail 5-10, a head wedge block 5-11, a central wedge block 5-12 and a tail wedge block 5-13, and the connection mode of the above-mentioned parts is as follows:

[0060] The locking screw 5-9 connects the head wedge block 5-11, the central wedge block 5-12 and the tail wedge block 5-13 in series through the threads on the locking guide rail 5-10.

[0061] The locking guide rail 5-10 is fixed on the two sides of the center control structure through M2 screws; the tail wedge block 5-13 is fixed on the tail of the locking guide rail 5-10 through M2 screws; the central wedge block 5-12 is installed on the locking guide rail 5-10, and can slide horizontally along the guide groove, and can only move in a small range vertically along the guide groove, and the moving distance is less than 12.5 mm; the head wedge block 5-11 is installed on one end of the locking guide rail 5-12 through the guide groove on the locking guide rail 5-12; the locking screw 5-9 is threadedly connected with the locking guide rail 5-10 by penetrating the head wedge block, and the relative position of the head wedge block 5-11 and the tail wedge block 5-13 is adjusted by adjusting the screwing depth of the threads of the locking screw 5-9, so as to adjust the height of the central wedge block 5-12 and the mounting surface of the locking guide rail 5-10.

[0062] B, the inner sides of the front baffle 1-1 and the rear baffle 1-2 are provided with protruding grids, and positioning notches and loose screws 9 are arranged, and the specific arrangement is as follows:

[0063] Positioning teeth are located at the four corners of the front baffle 1-1 and the rear baffle 1-2, and are matched with the left side plate 1-3, the right side plate 1-4, the top plate 1-5, the bottom plate 1-6, the middle partition plate 1-7, and the lower partition plate 1-8 to quickly position the front baffle 1-1 and the rear baffle 1-2;

[0064] The loose screws 9 are distributed on the outer edges of the front baffle 1-1 and the rear baffle 1-2, and are used to connect the front baffle 1-1, the rear baffle 1-2, the left side plate 1-3, and the right side plate 1-4.

[0065] C, external test structure 2

[0066] As shown in Figure 4 , the external test structure 2 can be designed in number and shape according to actual needs;

[0067] The edges of each external test structure 2 are designed with two positioning pin holes 2-1 of different sizes, and the right side plate 1-4 is provided with two special-shaped positioning pins 8 of different sizes at positions corresponding to the positioning pin holes, to ensure the quick and accurate positioning of the external test structure;

[0068] The two sides of each positioning pin hole are provided with loose screw mounting interfaces 7, and the external test structure 2 is mounted on the outer side of the right side plate 1-4 by the loose screws.

[0069] D, the mounting guide slot 1-6-1 for installing the power supply management structure 4 is located on the upper surface of the bottom plate 1-6, and is matched with the power supply management structure to support the quick fixing and installation of the power supply management structure;

[0070] The loose screws are located on the lower surface of the bottom plate 1-6, and are used to tighten and fix the power supply module;

[0071] The loose screw locking form provides a good heat conduction path for the power supply module and the device structure.

[0072] E, internal test structure 3

[0073] As shown in Figure 5 , the internal test structure 3 is box-shaped, and is provided with a wedge-shaped locking structure 6 and a pulling assisting mechanism 3-1, wherein:

[0074] The internal test structure is also provided with a wedge-shaped locking structure, which is horizontally installed on the two sides of the internal test structure and is matched with the opposite positioning guide rails on the left side plate 1-3 and the middle partition plate 1-7, or the right side plate 1-4 and the middle partition plate 1-7;

[0075] The installation surface of the auxiliary pull-out mechanism faces the outside of the main structure of the device, is located near the locking screw 5-9 of the wedge-shaped locking structure, is rectangular, and the rotation trajectory is fan-shaped, which is used to cooperate with the internal test structure: the auxiliary pull-out mechanism interferes with the left side plate during rotation, and after contact, there will be a force during rotation, thereby pushing out the internal test structure.

[0076] The central control structure, power supply management structure, external test structure and internal test structure are installed on the device structure.

[0077] The central control structure that can be replaced on the track includes a wedge-shaped locking structure and a body structure for mounting a control circuit board;

[0078] The on-orbit replaceable power supply management structure includes a captive screw mounting interface for mounting the main structure of the power supply circuit;

[0079] The on-orbit replaceable external test structure includes positioning holes and captive screw mounting interfaces for mounting the test circuit;

[0080] The on-rail replaceable internal test structure includes a wedge-shaped locking structure and an auxiliary extraction mechanism for installing a test circuit;

[0081] Further, if Figure 7 As shown, the wedge-shaped locking structure of the internal test structure includes a locking screw 5-9, a locking guide rail 5-10, a head wedge 5-11, a central wedge 5-12, and a tail wedge 5-13. By tightening or loosening the locking screw with an Allen wrench, the head wedge exerts or eliminates the squeezing force on the central wedge, thereby increasing or decreasing the distance between the top of the central wedge and the bottom of the locking guide rail, thereby increasing or decreasing the friction between the wedge-shaped locking structure and the mounting guide rail, thereby achieving the fixing and removal of the central control structure and the internal test structure from the device structure.

[0082] Further, if Figure 8 As shown, the inner sides of the front baffle 1-1 and the rear baffle 1-2 are provided with protruding grids, and positioning teeth are provided on all sides; the outer edges of the front baffle 1-1 and the rear baffle 1-2 are distributed with captive screws; the front baffle 1-1 and the rear baffle 1-2 are designed with positioning teeth 1-1-1 and captive screws 9, which are used for rapid disassembly and assembly of the front baffle 1-1 and the rear baffle 1-2 on the track. The positioning teeth can help maintenance personnel to quickly position the front baffle 1-1 and the rear baffle 1-2 when installing them. When installing / removing the front baffle 1-1 and the rear baffle 1-2, the design of the captive screws can avoid unnecessary objects floating on the track causing clutter and safety hazards in the cabin;

[0083] Furthermore, the left side panels 1-3, right side panels 1-4, and middle partition panels 1-7 are designed with positioning rails to support the rapid installation and fixation of the central control structure and the internal test structure wedge-shaped locking structure, such as Figure 9 As shown, the positioning rail is designed with flares from large to small at the beginning (flares 1-9 of the positioning rail), so that the internal test structure 3 can be quickly positioned when the rail is installed;

[0084] Furthermore, if Figure 10 As shown, the right side panels 1-4 are designed with special-shaped locating pins 8 and captive screw mounting interfaces 7 to support the rapid installation and fixation of external test structures. Each installation position of the external test structure is designed with two locating pin holes of different sizes. The design of special-shaped double locating pins ensures the rapid installation of the external test structure and avoids posture errors during installation of the external test structure.

[0085] Furthermore, if Figure 11 As shown, the base plate 1-6 is designed with installation guide grooves and captive screws to support the rapid fixation and installation of the power supply management structure. The power supply management structure is as shown in FIG. Figure 3 As shown in the figure, the design of the installation guide groove ensures the rapid installation of the power supply management structure, and the captive screws are used to tighten and fix the power supply management structure, which not only avoids the mess and safety hazards in the cabin caused by floating excess objects on the track when installing and removing the power supply management structure, but also provides a good heat conduction path between the power supply management structure and the device structure.

[0086] In summary, this invention addresses the future demands of component and assembly flight testing by proposing a component and assembly testing device that supports on-board maintenance. This device, designed to facilitate installation and positioning, reduces maintenance costs and improves efficiency. This device, designed to support on-board maintenance, will help reduce the cost of on-orbit testing of components and assemblies in the future.

[0087] The present invention has been described in detail above with reference to specific embodiments and exemplary examples. However, these descriptions are not to be construed as limiting the present invention. Those skilled in the art will appreciate that various equivalent substitutions, modifications, or improvements may be made to the technical solutions and implementations of the present invention without departing from the spirit and scope of the present invention, all of which fall within the scope of the present invention. The scope of protection of the present invention shall be determined by the appended claims.

[0088] The contents not described in detail in the specification of the present invention belong to the prior art known to those skilled in the art.

Claims

1. A component and assembly test device supporting on-orbit maintenance in a cabin, characterized by include: The device comprises a main structure (1), an external test structure (2), an internal test structure (3), a power supply management structure (4), and a central control structure (5), wherein: The main structure (1) of the device is a box-shaped structure composed of a front baffle (1-1), a rear baffle (1-2), a left side plate (1-3), a right side plate (1-4), a top plate (1-5) and a bottom plate (1-6), which provides installation support for an external test structure (2), an internal test structure (3), a power supply management structure (4) and a central control structure (5). The lower partition (1-8) is horizontally placed in the box-shaped structure, dividing the space inside the main structure (1) of the device into upper and lower parts; the middle partition (1-7) is vertically placed between the top plate (1-5) and the lower partition (1-8) and is parallel to the left side plate (1-3) and the right side plate (1-4), further dividing the upper space between the top plate (1-5) and the bottom plate (1-6) into left and right parts; The sides of the front baffle (1-1), the rear baffle (1-2), the left side panel (1-3) and the right side panel (1-4) facing the interior of the device main structure are defined as inner sides, and the other sides are defined as outer sides; The inner sides of the left side plate (1-3) and the right side plate (1-4), as well as both sides of the middle partition plate (1-7) are all provided with a plurality of positioning guide rails in the horizontal direction; the upper surface of the bottom plate (1-6) is provided with a mounting guide groove; The external test structure (2) is installed on the outside of the right side panel (1-4) and is used to install the test circuit; The internal test structure (3) is horizontally installed in the upper space between the top plate (1-5) and the bottom plate (1-6) through the positioning guide rails on the left side plate (1-3) and the middle partition plate (1-7), or the right side plate (1-4) and the middle partition plate (1-7), for installing the test circuit; The power supply management structure (4) is used for installing the power supply circuit and is installed on the bottom plate (1-6) of the device main structure through the installation guide groove on the upper surface of the bottom plate (1-6); The central control structure (5) is used for installing a control circuit board and is horizontally installed between the lower partition (1-8) and the power supply management structure (4) through relative positioning rails on the left side plate (1-3) and the right side plate (1-4).

2. The component and assembly testing device supporting in-cabin on-orbit maintenance according to claim 1, characterized in that: Wedge-shaped locking structures are respectively provided on both sides of the central control structure (5) for cooperating with the positioning guide rails on the inner side walls of the left side plate (1-3) and the right side plate (1-4); The wedge-shaped locking structure comprises: a locking screw (5-9), a locking guide rail (5-10), a head wedge block (5-11), a central wedge block (5-12), and a tail wedge block (5-13), wherein: The locking guide rail (5-10) is fixed on the central control structure, and a guide groove is provided on the locking guide rail (5-10); The central wedge block (5-12) is installed in the guide groove of the locking guide rail (5-10), and the central wedge block (5-12) can slide in the horizontal direction of the guide groove and move in the vertical direction of the guide groove; The head wedge block (5-11) is installed on one end of the locking guide rail (5-10) through the guide groove on the locking guide rail (5-10); the tail wedge block (5-13) is fixed on the other end of the locking guide rail (5-10); The locking screw (5-9) passes through the head wedge block (5-11) and is threadedly connected to the locking guide rail (5-10). By adjusting the tightening depth of the locking screw (5-9), the relative position of the head wedge block (5-11) and the tail wedge block (5-13), as well as the height of the installation surface of the central wedge block (5-12) and the locking guide rail (5-10) are adjusted.

3. The component and assembly testing device supporting in-orbit maintenance according to claim 1, characterized in that: The inner sides of the front baffle (1-1) and the rear baffle (1-2) are provided with protruding grids, and positioning teeth are provided on all sides for auxiliary positioning; Captive screws are distributed on the outer edges of the front baffle (1-1) and the rear baffle (1-2) for connecting the front baffle (1-1), the rear baffle (1-2), the left side plate (1-3), the right side plate (1-4), the top plate (1-5), the bottom plate (1-6) and the lower partition plate (1-8).

4. The component and assembly testing device supporting in-orbit maintenance according to claim 1, characterized in that: The number and shape of the external test structure (2) shall be designed according to actual needs; The edge of each external test structure (2) is designed with two positioning pin holes of different sizes, and two special-shaped positioning pins of different sizes are provided at positions corresponding to the positioning pin holes on the right side plate (1-4), thereby ensuring rapid and accurate positioning of the external test structure; Both sides of each positioning pin hole are provided with mounting threads of captive screws, and the external test structure (2) is mounted on the outside of the right side plate (1-4) through the captive screws.

5. The component and assembly testing device supporting in-cabin on-orbit maintenance according to claim 1, characterized in that: Captive screws are provided on the lower surface of the base plate (1-6) for tightening and fixing the power supply management structure (4); the fastening method of the captive screws enables the power supply management structure (4) to be in close contact with the upper surface of the base plate (1-6), providing a heat conduction path for the power supply management structure (4).

6. The component and assembly testing device supporting in-orbit maintenance according to claim 2, characterized in that: The internal test structure (3) is box-shaped and is provided with a wedge-shaped locking structure (6) and an auxiliary extraction mechanism, wherein: The internal test structure (3) is provided with wedge-shaped locking structures installed horizontally on both sides of the internal test structure, and is used to cooperate with the positioning guide rails on the left side plate (1-3) and the middle partition plate (1-7), or the right side plate (1-4) and the middle partition plate (1-7); The installation surface of the extraction assisting mechanism faces the outside of the device main structure and is located near the locking screw (5-9) of the wedge-shaped locking structure. It is rectangular in shape and is used to assist in removing the internal test structure (3).

7. The component and assembly testing device supporting in-orbit maintenance according to claim 2, characterized in that: Positioning guide rails are arranged on the inner sides of the left side plate (1-3) and the right side plate (1-4), and on both sides of the middle partition plate (1-7) in the horizontal direction, and the starting end of each positioning guide rail is a bell mouth from large to small.

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