Aging test method for solid state disk
By accelerating the aging of solid-state drives under high-temperature conditions and using storage and read speeds to build a dataset to train a classification model, the problem of complex detection equipment in existing technologies is solved, and efficient aging level assessment is achieved.
Patent Information
- Application Number
- CN202511341321.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-19
- Publication Date
- 2025-10-21
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
Existing technologies require complex testing equipment for solid-state drive aging detection, which is inconvenient and makes it difficult to efficiently assess the degree of aging.
By accelerating the aging of solid-state drives in a high-temperature environment and using storage and read speeds to construct an aging dataset, a neural network classifier model is trained to detect the aging level.
The aging level assessment of solid-state drives can be achieved by testing storage and read speeds without the need for complex equipment, improving testing efficiency and accessibility.
Smart Images

Figure CN120823874A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to a solid state hard disk, and in particular to an aging test method for a solid state hard disk. Background Art
[0002] Solid State Disk (SSD) is a hard disk made of solid-state electronic storage chip arrays. It can be widely used in many fields such as military, automotive, industrial control, video surveillance, network monitoring, network terminals, electricity, medical care, aviation, navigation equipment, etc.
[0003] Solid-state drives (SSDs) age over time. Continuing to use them for data storage when they are severely aged can result in data loss, leading to adverse consequences. Therefore, SSD aging testing is necessary for critical data applications. However, current testing methods require complex equipment, which makes SSD aging testing inconvenient. Summary of the Invention
[0004] The purpose of the present invention is to overcome the shortcomings of the existing technology and provide an aging test method for solid-state drives, which can accelerate the aging of solid-state drives in a high-temperature environment, thereby obtaining test data with different aging degrees, and by training a classification model, in actual testing, only the storage speed and read speed need to be detected to achieve the aging level of the solid-state drive.
[0005] The object of the present invention is achieved through the following technical solution: A method for aging testing of a solid state drive comprises the following steps: S1. Use high temperature environment to accelerate the aging of solid state hard disk. When the solid state hard disk is not aged, and after aging begins, it will be aged every set time. , test the storage speed and reading speed of the solid state drive; S2. Construct a solid-state drive aging dataset based on storage speed and read speed; S3. Repeat steps S1 to S2 for multiple SSDs of the same model, and merge the aging data sets of all SSDs to obtain an aging test training set. S4 constructs a classifier model through a neural network, and trains the constructed classifier model using the aging test training set obtained in step S3 to obtain an aging test model; S5. For SSDs with unknown aging levels, test the storage speed vector and the read speed vector, and use the test sample features consisting of the superposition of the storage speed and the read speed as input to the aging test model, which then outputs the aging level.
[0006] The beneficial effects of the present invention are: it can accelerate the aging of solid-state hard drives through a high-temperature environment, thereby obtaining test data of different aging degrees; and it obtains test data of multiple solid-state hard drives with the same signal, which has a higher degree of application. By training the classification model, in actual testing, it is only necessary to detect the storage speed and read speed to achieve the aging level of the solid-state hard drive, without the need for complex testing equipment, thereby improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0007] Figure 1 Flow chart of the method of the present invention. DETAILED DESCRIPTION
[0008] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings, but the protection scope of the present invention is not limited to the following.
[0009] like Figure 1 As shown, a solid state drive aging test method includes the following steps: S1. Use high temperature environment to accelerate the aging of solid state hard disk. When the solid state hard disk is not aged, and after aging begins, it will be aged every set time. , test the storage speed and reading speed of the solid state drive; S2. Construct a solid-state drive aging dataset based on storage speed and read speed; S3. Repeat steps S1 to S2 for multiple SSDs of the same model, and merge the aging data sets of all SSDs to obtain an aging test training set. S4 constructs a classifier model through a neural network, and trains the constructed classifier model using the aging test training set obtained in step S3 to obtain an aging test model; S5. For SSDs with unknown aging levels, test the storage speed vector and the read speed vector, and use the test sample features consisting of the superposition of the storage speed and the read speed as input to the aging test model, which then outputs the aging level.
[0010] In an embodiment of the present application, step S1 includes: S101. Perform a storage speed and read speed test when the SSD is not in use, i.e., not aged; S102. Place the solid-state drive in a high-temperature aging test chamber, and keep the chamber in a high-temperature environment to accelerate the aging of the solid-state drive. At regular intervals, remove the solid-state drive from the chamber, return it to room temperature, and then perform a storage speed and read speed test.
[0011] In an embodiment of the present application, the temperature range of the high temperature environment is any fixed temperature between 90° C. and 120° C.
[0012] In the embodiment of the present application, the set time 1 hour or 2 hours.
[0013] In an embodiment of the present application, the storage speed and read speed test includes: Divide the solid-state drive into multiple storage areas; Using a processor, the same test data is sequentially stored in each storage area, and the storage time used to store the test data in each storage area is recorded. The storage speed of each storage area is obtained by dividing the size of the test data by the storage time corresponding to each storage area. The storage speed of each storage area constitutes a storage speed vector of the solid-state drive; Using the processor, the test data stored in each storage area is read in turn, and the reading time used to read the test data in each storage area is recorded. The reading speed of each storage area is obtained by dividing the test data size by the reading time corresponding to each storage area. The reading speed of each storage area constitutes the reading speed vector of the solid-state drive.
[0014] In an embodiment of the present application, step S2 includes: Assume that step S1 performs N storage speed and read speed tests, then the aging times corresponding to the N tests are , where N is a multiple of 4; According to the aging time, the aging degree is divided into four levels: mild, general, severe, and very severe. The aging time corresponding to mild is ; The corresponding aging time is generally , the corresponding aging time for severe , the aging time corresponding to very serious ; The aging levels corresponding to mild, moderate, severe, and very severe are recorded as 1 to 4 respectively; For the detection of storage speed and reading speed at each aging time obtained in step S1, the storage speed vector and the reading speed vector are superimposed to form a sample feature. The aging level corresponding to the aging time is used as the sample label to construct a hard disk aging dataset based on storage speed and reading speed.
[0015] The foregoing description shows and describes a preferred embodiment of the present invention. However, as previously stated, it should be understood that the present invention is not limited to the form disclosed herein and should not be construed as excluding other embodiments. Instead, the present invention is applicable to various other combinations, modifications, and environments and is capable of modification within the scope of the inventive concept described herein, through the teachings above, or through techniques or knowledge in the relevant art. Modifications and variations made by those skilled in the art that do not depart from the spirit and scope of the present invention are intended to be within the scope of the appended claims.
Claims
1. A method for aging testing a solid-state drive, characterized by: The following steps are involved: S1. Use high temperature environment to accelerate the aging of solid state hard disk. When the solid state hard disk is not aged, and after aging begins, it will be aged every set time. , test the storage speed and reading speed of the solid state drive; S2. Construct a solid-state drive aging dataset based on storage speed and read speed; S3. Repeat steps S1 to S2 for multiple SSDs of the same model, and merge the aging data sets of all SSDs to obtain an aging test training set. S4 constructs a classifier model through a neural network, and trains the constructed classifier model using the aging test training set obtained in step S3 to obtain an aging test model; S5. For SSDs with unknown aging levels, test the storage speed vector and the read speed vector, and use the test sample features consisting of the superposition of the storage speed and the read speed as input to the aging test model, which then outputs the aging level.
2. The aging test method for a solid state drive according to claim 1, wherein: The step S1 comprises: S101. Perform a storage speed and read speed test when the SSD is not in use, i.e., not aged; S102. Place the solid-state drive in a high-temperature aging test chamber, and keep the chamber in a high-temperature environment to accelerate the aging of the solid-state drive. At regular intervals, remove the solid-state drive from the chamber, return it to room temperature, and then perform a storage speed and read speed test.
3. The aging test method for a solid state drive according to claim 1, wherein: The temperature range of the high temperature environment is any fixed temperature between 90° C. and 120° C.
4. The aging test method for a solid state drive according to claim 1, wherein: The set time 1 hour or 2 hours.
5. The aging test method for a solid state drive according to claim 2, wherein: The storage speed and read speed test includes: Divide the solid-state drive into multiple storage areas; Using a processor, the same test data is sequentially stored in each storage area, and the storage time used to store the test data in each storage area is recorded. The storage speed of each storage area is obtained by dividing the size of the test data by the storage time corresponding to each storage area. The storage speed of each storage area constitutes a storage speed vector of the solid-state drive; Using the processor, the test data stored in each storage area is read in turn, and the reading time used to read the test data in each storage area is recorded. The reading speed of each storage area is obtained by dividing the test data size by the reading time corresponding to each storage area. The reading speed of each storage area constitutes the reading speed vector of the solid-state drive.
6. The aging test method for a solid state drive according to claim 1, wherein: The step S2 comprises: Assume that step S1 performs N storage speed and read speed tests, then the aging times corresponding to the N tests are , where N is a multiple of 4; According to the aging time, the aging degree is divided into four levels: mild, general, severe, and very severe. The aging time corresponding to mild is ; The corresponding aging time is generally , the corresponding aging time for severe , the aging time corresponding to very serious ; The aging levels corresponding to mild, moderate, severe, and very severe are recorded as 1 to 4 respectively; For the detection of storage speed and reading speed at each aging time obtained in step S1, the storage speed vector and the reading speed vector are superimposed to form a sample feature. The aging level corresponding to the aging time is used as the sample label to construct a hard disk aging dataset based on storage speed and reading speed.
Citation Information
Patent Citations
Bus testing device and method of CPU (Central Processing Unit)
CN104239173A
TF card aging test method, device and system
CN116312728A
Performance test method, intelligent terminal and computer readable storage medium
CN117637006A
Automatic testing method and system for solid state disk aging test
CN118173151A
Automatic testing method and system for solid state disk aging test
CN118398069A
