Array substrate, repairing method thereof and display device

Abstract

The invention discloses an array substrate, a repairing method thereof and a display device. The array substrate comprises multiple stages of cascaded gate drive circuit units, a plurality of pixel circuits distributed in an array; the scanning lines extend in the first direction, and each scanning line is electrically connected with the output end of the first-stage gate drive circuit unit and one row of pixel circuits; the at least one repairing unit comprises a first repairing line, a second repairing line and a third repairing line, the first repairing line and the second repairing line extend in the second direction, the third repairing line extends in the first direction, the first repairing line and the second repairing line are arranged at intervals in the first direction, and the first repairing line and the two adjacent scanning lines are arranged in a crossed mode; the second repair line and at least one of the two adjacent scanning lines are arranged in a crossed mode, and the two ends of the third repair line are electrically connected with the first repair line and the second repair line respectively. By arranging at least one repairing unit, the problems of scanning line breakage and / or grid driving circuit unit failure and the like can be repaired, and the yield of the display device is improved.

Description

Technical Field

[0001] This invention relates to the field of display device technology, and in particular to an array substrate and its repair method, and a display device. Background Technology

[0002] In the display panel, multiple scan lines are positioned in the display area and extend into the non-display area, electrically connected to the Gate Driver on Array (GOA) circuit in the non-display area. The GOA circuit drives the pixel units in the display area line by line by outputting scan signals in stages.

[0003] However, during the manufacturing process, problems such as poor connection between the GOA circuit and the scan line, malfunction of the GOA circuit itself, or broken scan lines can all prevent the scan signal from being transmitted normally to the corresponding pixel row. Such signal transmission abnormalities will directly cause defects such as horizontal bright / dark lines in the displayed image, seriously reducing the yield of the display device. Summary of the Invention

[0004] In view of the above problems, the present invention proposes an array substrate and its repair method, and a display device. By setting at least one repair unit, problems such as broken scan lines and / or gate drive circuit unit failure can be repaired, so that the scan signal can be transmitted normally to the pixel circuit of the corresponding row, thereby improving the yield of the display device.

[0005] In a first aspect, an array substrate is provided, the array substrate including a display area and a non-display area, the array substrate comprising:

[0006] A gate driving circuit, located in the non-display area, includes multiple cascaded gate driving circuit units;

[0007] Multiple pixel circuits arranged in an array are located in the display area;

[0008] Multiple scan lines extend along a first direction, and each scan line is electrically connected to the output terminal of the first-level gate drive circuit unit and a row of pixel circuits.

[0009] At least one repair unit is located in the non-display area. The repair unit includes a first repair line, a second repair line, and a third repair line. The first repair line and the second repair line extend along a second direction, and the third repair line extends along the first direction. The second direction intersects with the first direction. The first repair line and the second repair line are spaced apart in the first direction. The first repair line intersects with two adjacent scan lines. The second repair line intersects with at least one of the two adjacent scan lines. One end of the third repair line is electrically connected to the first repair line, and the other end is electrically connected to the second repair line.

[0010] In some embodiments, the at least one repair unit includes a first repair unit, wherein the second repair line in the first repair unit is arranged to intersect with the two adjacent scan lines.

[0011] In some embodiments, the array substrate includes a plurality of first repair units, the plurality of first repair units are arranged along the second direction, the first repair lines in adjacent first repair units are electrically connected to each other, and the second repair lines in adjacent first repair units are electrically connected to each other.

[0012] In some embodiments, the array substrate includes a second repair unit, wherein the second repair line in the second repair unit is arranged to intersect with one of the two adjacent scan lines.

[0013] In some embodiments, the array substrate includes a plurality of second repair units, the plurality of second repair units are arranged along the second direction, the first repair lines in adjacent second repair units are electrically connected to each other, and / or the first repair lines in adjacent second repair units are electrically connected to the second repair lines.

[0014] In some embodiments, the array substrate includes a first repair unit and a second repair unit, wherein the second repair line in the first repair unit is arranged to intersect with the two adjacent scan lines, and the second repair line in the second repair unit is arranged to intersect with one of the two adjacent scan lines.

[0015] In some embodiments, the array substrate includes a plurality of first repair units and a plurality of second repair units, the plurality of first repair units and the plurality of second repair units are arranged along the second direction, and any one of the first repair lines and the second repair lines in the first repair unit is electrically connected to any one of the first repair lines and the repair lines in the adjacent second repair unit.

[0016] In some embodiments, the two adjacent scan lines include a first scan line, the first scan line includes a first trace segment and a second trace segment, one end of the first trace segment extends from the display area to the non-display area, one end of the second trace segment is disconnected from one end of the first trace segment, and the other end is connected to the output terminal of the gate drive circuit unit;

[0017] The first trace segment is arranged to intersect with the first repair line in the non-display area, and the first repair line and the first trace segment are electrically connected at the intersection. The second trace segment is arranged to intersect with the second repair line, and the second repair line and the second trace segment are electrically connected at the intersection.

[0018] In some embodiments, the two adjacent scan lines include a second scan line and a third scan line. The gate drive circuit unit connected to the second scan line fails. The first repair line is intersected with the second scan line and the third scan line. The first repair line is electrically connected to the second scan line at the intersection. The first repair line is electrically connected to the third scan line at the intersection.

[0019] In some embodiments, the first repair line and the two adjacent scan lines are disposed in different layers at their intersection, and the second repair line and at least one of the two adjacent scan lines are disposed in different layers at their intersection.

[0020] In some embodiments, the array substrate includes a substrate and a first conductive layer and a second conductive layer that are sequentially stacked and insulated from the substrate in a direction away from the substrate.

[0021] The multiple scan lines are located in the first conductive layer, and the first repair line, the second repair line, and the third repair line are located in the second conductive layer.

[0022] In some embodiments, the non-display area includes a first non-display area and a second non-display area disposed opposite to each other. The first non-display area is provided with a plurality of data bonding pins and at least one redundant data bonding pin. The array substrate further includes:

[0023] Multiple data lines, one end of each data line is electrically connected to a data binding pin, and the other end extends through the display area to the second non-display area;

[0024] At least one fourth repair line includes a first extension segment and a second extension segment. One end of the first extension segment is electrically connected to the redundant data binding pin, and the other end is electrically connected to the second extension segment. The second extension segment is located in a second non-display area and is arranged to cross the at least one data line. The second extension segment and the at least one data line are arranged on different layers at the intersection.

[0025] In some embodiments, the other end of the first extension is electrically connected to the second extension via a repair line in at least one repair unit.

[0026] In some embodiments, the plurality of data lines include a target data line, the target data line being disconnected between the first non-display area and the corresponding data binding pin, the target data line being intersected with the second extension of the fourth repair line, the second extension of the fourth repair line being electrically connected to the target data line at the intersection, and the data signal output by the redundant data binding pin connected to one end of the first extension of the fourth repair line being configured to be the same as the data signal output by the data binding pin connected to the target data line.

[0027] In some embodiments, the array substrate includes a substrate and a third conductive layer and a fourth conductive layer that are stacked and insulated along a direction away from the substrate.

[0028] The plurality of data lines are located in the third conductive layer, and the second extension of the at least one fourth repair line is located in the fourth conductive layer.

[0029] In a second aspect, a display device is provided, comprising an array substrate as described in the first aspect.

[0030] Thirdly, a method for repairing an array substrate is provided, applied to the array substrate as described in the first aspect, wherein two adjacent scan lines intersecting the first repair line are respectively a first scan line and a second scan line, and the second repair line intersects the first scan line at least once; the repair method includes:

[0031] When the first scan line breaks and the break point is located between the first intersection point and the second intersection point, laser melting is used to electrically connect the first repair line and the first scan line at the first intersection point, and the second repair line and the first scan line at the second intersection point. The first intersection point is the intersection area of ​​the first scan line and the first repair line, and the second intersection point is the intersection area of ​​the first scan line and the second repair line.

[0032] When the gate drive circuit unit connected to the second scan line is in a failed state and the gate drive circuit unit connected to the first scan line is in a normal state, laser melting is used to electrically connect the first repair line and the first scan line at their intersection positions, and the first repair line and the second scan line at their intersection positions.

[0033] The technical solutions provided in the embodiments of the present invention have at least the following technical effects or advantages:

[0034] This invention provides an array substrate, a repair method, and a display device. By providing at least one repair unit, it can repair problems such as broken scan lines, enabling the scan signal to be transmitted normally to the pixel circuit of the corresponding row. The at least one repair unit includes a first repair line intersecting two adjacent scan lines, a second repair line intersecting at least one of the two adjacent scan lines, and a third repair line electrically connected to the first and second repair lines. Since the first and second repair lines are spaced apart in a first direction, when at least one of the two adjacent scan lines breaks between its intersection with the first and second repair lines, laser melting can be used to electrically connect the first and second repair lines at the intersection with the scan line. This allows the scan line to be connected at the break point through the first, third, and second repair lines, achieving normal transmission of the scan signal, ensuring normal display of the display device, and effectively improving the yield of the display device.

[0035] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are specifically listed below. Attached Figure Description

[0036] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0037] Figure 1 This is a front view schematic diagram of an array substrate provided in an embodiment of the present invention;

[0038] Figure 2 This is a schematic diagram of the arrangement of a repair unit provided in an embodiment of the present invention;

[0039] Figure 3 This is a schematic diagram of another repair unit arrangement provided in an embodiment of the present invention;

[0040] Figure 4 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention;

[0041] Figure 5 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention;

[0042] Figure 6 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention;

[0043] Figure 7 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention;

[0044] Figure 8 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention;

[0045] Figure 9 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention;

[0046] Figure 10 This is a partial structural cross-sectional view of an array substrate provided in an embodiment of the present invention;

[0047] Figure 11 This is a front view of another array substrate provided in an embodiment of the present invention;

[0048] Figure 12 This is a schematic diagram of a method for repairing an array substrate provided in an embodiment of the present invention. Detailed Implementation

[0049] To enable those skilled in the art to more clearly understand this application, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0050] Figure 1 This is a front view structural diagram of an array substrate provided in an embodiment of the present invention, as shown below. Figure 1 As shown, the array substrate 100 includes a display area AA and a non-display area NA located on one side of the display area AA. The array substrate 100 includes a gate driving circuit 10, a plurality of pixel circuits 20, a plurality of scan lines 30, and at least one repair unit 40.

[0051] The gate driving circuit 10 is located in the non-display area NA and includes a multi-stage cascaded gate driving circuit unit (hereinafter referred to as GOA unit) 11. Multiple pixel circuits 20 are arrayed and located in the display area AA. Multiple scan lines 30 extend along a first direction X, and each scan line 30 is electrically connected to the output terminal of a first-stage GOA unit 11 and a row of pixel circuits. At least one repair unit 40 is located in the non-display area NA. Each repair unit 40 includes a first repair line 41, a second repair line 42, and a third repair line 43. The first repair line 41 and the second repair line 42 extend along a second direction Y, and the third repair line 43 extends along the first direction X. The second direction Y intersects with the first direction X. The first repair line 41 and the second repair line 42 are spaced apart in the first direction X. The first repair line 41 intersects with two adjacent scan lines 30, and the second repair line 42 intersects with at least one of the two adjacent scan lines 30. One end of the third repair line 43 is electrically connected to the first repair line 41, and the other end is electrically connected to the second repair line 42.

[0052] In this embodiment, the first repair line 41 and the second repair line 42 are configured to be electrically connected to the corresponding scan line 30 at their intersection by laser melting. Laser melting is a surface modification technique that uses a high-energy laser beam to rapidly melt and cool the surface of a material. Specifically, a high-energy laser beam can form a conductive path at the intersection of the repair line and the scan line 30, allowing the repair line to rapidly melt onto the surface of the scan line and cool, thereby achieving an electrical connection between the repair line and the scan line.

[0053] In the absence of scan line breakage or GOA unit failure, the first repair line 41 and the second repair line 42 intersect with the scan line 30 and are insulated at least in the intersection area. At this time, the first repair line 41 and the second repair line 42 are in a non-repair state.

[0054] When one of two adjacent scan lines is broken, laser melting can be used to electrically connect the first and second repair lines at their intersection with the broken scan line. This allows the broken scan line to be connected at the break point through the first, third, and second repair lines, thus enabling normal transmission of the scan signal.

[0055] When one of the two adjacent scan lines is connected to a GOA unit that is in a failed state, a first repair line can be electrically connected to the two adjacent scan lines at the intersection by laser melting. This allows the two adjacent scan lines to be connected through the first repair line, and the GOA unit connected to the other adjacent scan line, which is in a normal state, can provide a scan signal for that scan line, thereby achieving normal transmission of the scan signal.

[0056] Understandably, by setting up at least one repair unit, issues such as broken scan lines and / or GOA unit failures can be addressed. When multiple repair units are used, if a large area of ​​broken scan lines or GOA unit failures occur on the array substrate, multiple faults can be repaired simultaneously at multiple points, ensuring normal display and effectively improving the yield of the display device. Furthermore, it eliminates the need to spend considerable effort finding and setting different repair methods for different faults, significantly reducing production costs and shortening the repair cycle.

[0057] It should be noted that GOA unit failure means that the GOA unit cannot send a scan signal, or the scan signal it sends is abnormal, or the scan line is poorly connected to the corresponding GOA unit, causing the scan line to be unable to transmit the scan signal sent by the GOA unit.

[0058] Optionally, the second direction Y is perpendicular to the first direction X. In some embodiments, the second direction Y may not be perpendicular to the first direction X.

[0059] In some embodiments, each repair unit 40 includes a plurality of second repair lines 42 that intersect at least one of two adjacent scan lines 30.

[0060] Figure 2 This is a schematic diagram of the arrangement of a repair unit provided in an embodiment of the present invention, as shown below. Figure 2 As shown, multiple second repair lines 42 extend along the second direction Y, and are spaced apart in the first direction X. Correspondingly, each repair unit 40 includes multiple repair connecting lines 44, with each end of each connecting line 44 electrically connected to two adjacent second repair lines 42. By arranging multiple second repair lines 42 and multiple connecting lines 44 in this manner, multiple intersection points exist between the scan line 30 and the second repair lines 42, dividing the scan line 30 into multiple repair segments. When a break occurs at any location on the scan line 30, technicians can quickly locate the two adjacent second repair lines 42 based on the specific location of the break, and fuse these two second repair lines 42 together with the scan line using laser melting. This allows the scanning signal to bypass the break area and continue transmission through the conductive path formed by the second repair lines 42, the connecting lines, and the second repair lines 42, thereby achieving precise repair of the break. This repair method achieves full coverage of the scan line 30, which is beneficial for improving the coverage and repair capability of multi-point breakage fault areas.

[0061] It should be noted that, Figure 2 Only two second repair lines 42 are shown, but in practice, three, four or more second repair lines can be set according to repair needs.

[0062] For example, such as Figure 2As shown, each repair unit 40 includes a first repair line 41, two second repair lines 42, a third repair line 43, and a repair connecting line 44. The first repair line 41 is electrically connected to one of the second repair lines 42 through the third repair line 43, and two adjacent second repair lines 42 are electrically connected through the repair connecting line 44. If the break point M1 of the scan line 31 is located between the two second repair lines 42, the two second repair lines 42 can be electrically connected to the broken scan line 31 at intersections K1 and K2 respectively by laser melting to repair the break; or, the second repair line 42 can be electrically connected to the broken scan line 31 at intersection K1 and the first repair line 41 can be electrically connected to the broken scan line 31 at intersection K3 by laser melting to repair the break. If the GOA unit connected to the second scan line 32 is in a failed state, the first repair line 41 can be electrically connected to the first scan line 31 at intersection K3 and the first repair line 41 can be electrically connected to the second scan line 32 at intersection K4 by laser melting to repair the GOA failure. At this time, each repair unit 40 has the ability to simultaneously repair scan line breakage and GOA failure.

[0063] It should be noted that, Figure 2 In the repair unit 40, both second repair lines intersect with both adjacent scan lines 30. Therefore, the two second repair lines 42 in the repair unit 40 also possess the capability to repair GOA failures. GOA failure repair can be performed using either the first repair line 41 or any two of the two second repair lines 42, and scan line breakage repair can be performed using either the first repair line 41 or any two of the two second repair lines 42. In the case where both second repair lines 42 in the repair unit intersect only with the same scan line 30 among the two adjacent scan lines, see [reference needed]. Figure 2 In the repair unit 40', only the first repair line 41 in the repair unit 40' has the ability to repair GOA failures; the two second repair lines 42 can only be used to repair scan line breaks. Repair unit 40 has a more powerful repair capability than repair unit 40'.

[0064] In this embodiment, the first repair line 41, the second repair line 42, and the third repair line 43 are configured to be disconnected by laser melting. If the repair units are electrically connected and one of the repair units needs to repair the scan line, the repair line connecting that repair unit to the other repair units can be melted by laser melting, so that the repair unit can work independently without affecting the normal function of the other repair units.

[0065] In some embodiments, the array substrate 100 includes a first repair unit 40a, wherein a second repair line 42 in the first repair unit 40a is arranged to intersect with two adjacent scan lines 30.

[0066] Figure 3 This is a schematic diagram of another repair unit arrangement provided in an embodiment of the present invention, as shown below. Figure 3 As shown, the array substrate 100 includes multiple first repair units 40a, which are arranged along the second direction Y. First repair lines 41 in adjacent first repair units 40a are electrically connected, and second repair lines 42 in adjacent first repair units 40a are electrically connected. In this case, the array substrate uniformly uses first repair units, resulting in a high degree of consistency and standardization in the entire repair system. This helps establish unified design standards and specifications, facilitates modular design and layout by designers, and improves the repeatability and scalability of the design. Simultaneously, multiple first repair units connected together can form a collaborative repair network. When a large-area or multi-point fault occurs, this network can simultaneously provide repair paths for multiple fault areas, enhancing repair capability and reliability, and helping to reduce the process difficulty and manufacturing cost of the repair units.

[0067] In some embodiments, the array substrate 100 includes a second repair unit 40b, wherein a second repair line 42 in the second repair unit 40b is intersected with one of two adjacent scan lines 30.

[0068] Figure 4 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention, as shown below. Figure 4 As shown, the array substrate 100 includes a plurality of second repair units 40b, which are arranged along the second direction Y, and two first repair lines 41 in adjacent second repair units 40b are electrically connected.

[0069] Figure 5 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention, as shown below. Figure 5 As shown, the array substrate 100 includes a plurality of second repair units 40b, which are arranged along the second direction Y. The first repair line 41 and the second repair line 42 in adjacent second repair units 40b are electrically connected, that is, the first repair line 41 in the second repair unit 40b is electrically connected to the second repair line 42 in the adjacent second repair unit 40b.

[0070] Figure 6 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention, as shown below. Figure 6 As shown, the array substrate 100 includes a plurality of second repair units 40b, which are arranged along the second direction Y. Two first repair lines 41 in some adjacent second repair units 40b are electrically connected, and the first repair lines 41 and second repair lines 42 in some adjacent second repair units 40b are electrically connected.

[0071] It is understandable that Figures 4 to 6 The arrangement of the repair units shown, by electrically connecting the first repair line 41 of adjacent second repair units 40b, or electrically connecting the first repair line 41 and the second repair line 42, compared to Figure 3 The arrangement of the repair units shown allows for resource sharing by utilizing the adjacency of the repair units, thereby reducing the total number of repair lines. Furthermore, when multiple repair units repair multiple failures and require disconnection of electrical connections between them, setting up multiple second repair units 40b requires fewer laser melting operations compared to setting up multiple first repair units 40a.

[0072] In some embodiments, such as Figure 1 As shown, the array substrate 100 includes a first repair unit 40a and a second repair unit 40b. In the first repair unit 40a, the second repair line 42 intersects with two adjacent scan lines 30. In the second repair unit 40b, the second repair line 42 intersects with one of the two adjacent scan lines 30. The way the second repair line 42 intersects with the scan line 30 differs in different repair units, providing more options for dealing with different fault conditions. When facing complex fault scenarios, such as combinations of scan line breaks at different locations and failures of different GOA units, the appropriate repair unit can be flexibly selected for repair operation based on the specific fault location and type, improving the targeting and effectiveness of the repair.

[0073] Understandably, the second repair unit 40b requires fewer repair lines than the first repair unit 40a, which helps reduce costs. The first repair unit 40a has more intersections with the scan line 30 than the second repair unit 40b, resulting in stronger line break repair capabilities. By appropriately combining the first repair unit 40a and the second repair unit 40b, a balance can be achieved between production costs and repair performance.

[0074] In some embodiments, the array substrate 100 includes a plurality of first repair units 40a and a plurality of second repair units 40b, which are arranged along a second direction Y. Any one of the first repair lines 41 and the second repair lines 42 in the first repair unit 40a is electrically connected to any one of the first repair lines 41 and the second repair lines 42 in the adjacent second repair unit 40b.

[0075] Figure 7 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention, as shown below. Figure 7As shown, multiple first repair units 40a and multiple second repair units 40b are arranged alternately along the second direction. The first repair line 41 in the first repair unit 40a is electrically connected to the second repair line 42 of the adjacent second repair unit 40b, and the second repair line 42 in the first repair unit 40a is electrically connected to the second repair line 41 of the adjacent second repair unit 40b. Alternatively, the first repair line 41 in the first repair unit 40a is electrically connected to the first repair line 41 of the adjacent second repair unit 40b, and the second repair line 42 in the second repair unit 40b is electrically connected to the second repair line 42 of an adjacent first repair unit 40a.

[0076] Figure 8 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention, as shown below. Figure 8 As shown, multiple first repair units 40a and multiple second repair units 40b are arranged non-alternatingly along the second direction Y. If two first repair units 40a are adjacent to each other, the two first repair lines 41 and the two second repair lines 42 in the adjacent first repair units 40a are electrically connected. If two second repair units 40b are adjacent to each other, the two first repair lines 41 in the adjacent second repair units 40b are electrically connected, and / or the first repair lines 41 and the second repair lines 42 in the adjacent second repair units 40b are electrically connected. If the first repair unit 40a and the second repair unit 40b are adjacent, then the first repair line 41 in the first repair unit 40a is electrically connected to the second repair line 42 in the adjacent second repair unit 40b, and the second repair line 42 in the first repair unit 40a is electrically connected to the second repair line 41 in the adjacent second repair unit 40b; and / or, the first repair line 41 in the first repair unit 40a is electrically connected to the first repair line 41 in the adjacent second repair unit 40b, and the second repair line 42 in the second repair unit 40b is electrically connected to the second repair line 42 of an adjacent first repair unit 40a.

[0077] Figure 9 This is a schematic diagram of the arrangement of another repair unit provided in an embodiment of the present invention, as shown below. Figure 9 As shown, at this time, multiple first repair units 40a and multiple second repair units 40b are arranged along the second direction Y, and the multiple first repair units 40a and multiple second repair units 40b are not connected to each other.

[0078] It is understandable that Figure 7 and Figure 8 Multiple repair units are electrically connected via a first repair line 41 or a second repair line 42, and... Figure 9Compared to the arrangement where multiple first repair units 40a and multiple second repair units 40b are not interconnected, this reduces the number of independent wirings. Designers do not need to plan complex wiring paths for each repair unit; they only need to design a relatively simple common connection line to connect the relevant repair lines. This not only reduces the complexity of the design work and shortens the design cycle, but also reduces the material and process costs required for complex wiring. When the repair lines of multiple repair units are interconnected, they can form a unified repair network. When facing large-area or complex faults, this network can work collaboratively to provide stronger repair capabilities. For example, if a fault in a scan line involves the coverage area of ​​multiple repair units, the electrically connected repair lines can simultaneously provide signal transmission paths to the faulty scan line from multiple directions, increasing the success rate and reliability of the repair. Figure 9 The multiple first repair units 40a and multiple second repair units 40b shown are not connected to each other; each repair unit operates independently and is not dependent on the others. When one repair unit fails, it will not affect the normal function of the other repair units. This independence improves the reliability of the entire repair system and reduces the risk of large-scale repair failure due to the failure of a single repair unit.

[0079] In some embodiments, such as Figure 1 As shown, two adjacent scan lines include a first scan line 31, which includes a first trace segment 31a and a second trace segment 31b. One end of the first trace segment 31a extends from the display area AA to the non-display area NA. One end of the second trace segment 31b is disconnected from one end of the first trace segment 31a, and the other end is connected to the output terminal of the corresponding GOA unit 11. The first trace segment 31a intersects with the first repair line 41 in the non-display area NA, and the first repair line 41 and the first trace segment 31a are electrically connected at the intersection A. The second trace segment 31b intersects with the second repair line 42, and the second repair line 42 and the second trace segment 31b are electrically connected at the intersection B. The first repair line 41 and the second repair line 42 intersect with the first routing segment 31a and the second routing segment 31b at the two ends of the broken section of the first scan line 31, respectively. The first repair line 41 can be electrically connected to the scan line 30 at the intersection A by laser melting, and the second repair line 42 can be electrically connected to the scan line 30 at the intersection B. This allows the first routing segment 31a and the second routing segment 31b of the scan line 30 to be connected through the first repair line 41, the third repair line 43 and the second repair line 42, thereby achieving the repair of the broken scan line.

[0080] In some embodiments, such as Figure 1As shown, two adjacent scan lines 30 include a second scan line 32 and a third scan line 33. The GOA unit connected to the second scan line 32 fails. The first repair line 41 is intersected with the second scan line 32 and the third scan line 33. The first repair line 41 is electrically connected to the second scan line 32 at the intersection C, and to the third scan line 33 at the intersection D. When the GOA unit connected to the second scan line 32 fails, the pixels in that row connected to the second scan line 32 will be in an abnormal state throughout the entire display cycle, either always bright or always dark, thus forming a noticeable horizontal bright or dark line on the display screen, severely affecting the uniformity of the image and the overall visual effect. By electrically connecting the GOA unit connected to the third scan line 33 to the second scan line 32 through the first repair line 41, the GOA unit connected to the third scan line 33 can provide scanning signals to the second scan line 32, thereby achieving GOA unit failure repair. In this way, the pixel circuits of the rows connected to the second scan line 32 can be activated and deactivated at the appropriate time, just like normal rows, thereby eliminating bright or dark lines caused by the absence of a scan signal and making the image more uniform and clear.

[0081] It is understandable that by setting at least one repair unit, not only can scan line breakage repair and GOA unit failure repair be performed independently, but it also has the ability to repair both scan line breakage and GOA unit failure simultaneously. When the array substrate 100 simultaneously experiences a breakage in the first scan line 31 and a failure in the GOA unit corresponding to the second scan line 32, that is, when both scan line breakage and GOA unit failure exist, a specific repair path can be constructed by simply using laser melting of the repair line at the corresponding position, thus achieving fault repair. In specific repair scenarios, when at least two repair units are in an active repair state and each is performing repair work on scan lines at different positions, if there are electrically connected repair lines between the at least two repair units, it is necessary to use laser melting to melt the electrically connected repair lines between the at least two repair units to prevent different repair lines from conducting to each other, thereby causing signal interference, affecting the repair effect and the normal operation of the array substrate.

[0082] For example, Figure 1 The first repair unit 40a shown is used to repair the broken line of the first scan line 31, and the second repair unit 40b is used to repair the GOA failure of the second scan line 32. The first repair line 41 in the first repair unit 40a is electrically connected to the first repair line 41 in the second repair unit 40b. At this time, it is possible to... Figure 1At point E, the first repair line 41, which is electrically connected to the first repair unit 40a and the second repair unit 40b, is melted by laser melting to prevent mutual interference between the scanning signals transmitted by the first repair unit 40a and the second repair unit 40b.

[0083] In some embodiments, a repair unit is provided between every two adjacent scan lines 30. This full-coverage arrangement ensures timely repair of any scan line failure, thereby maintaining the stable operation of the array substrate. In other embodiments, considering factors such as the rationality of the wiring architecture and the optimization of the spatial layout, repair units may be placed only at scan line locations where the failure rate is significantly higher than average or the probability of GOA unit failure is in a high range. This approach enables efficient resource allocation and precise fault location for repair while ensuring the overall performance of the array substrate.

[0084] In some embodiments, the first repair line 41 and two adjacent scan lines 30 are disposed in different layers at their intersection, and the second repair line 42 and at least one of the two adjacent scan lines 30 are disposed in different layers at their intersection.

[0085] Figure 10 This is a partial structural cross-sectional view of an array substrate provided in an embodiment of the present invention, such as... Figure 10 As shown, the array substrate 100 includes a substrate 110 and a first conductive layer 120 and a second conductive layer 130 sequentially stacked and insulated along a direction away from the substrate 110. Multiple scan lines 30 are located in the first conductive layer 120, and the first repair line 41, the second repair line 42, and the third repair line 43 are located in the second conductive layer 130. Figure 10 Only the first repair line 41 is shown in the second conductive layer 130.

[0086] For example, a first insulating layer 140 is provided between the first conductive layer 120 and the second conductive layer 130. When the repair lines and scan lines are electrically connected by laser melting, vias need to be opened at corresponding positions on the first insulating layer 140 so that the laser can pass through the vias and act on the intersection area of ​​the scan line 30 on the first conductive layer 120 and the repair line (first repair line 41, second repair line 42 or third repair line 43) on the second conductive layer 130 to achieve electrical connection between the two.

[0087] In some embodiments, the regions of the first repair line 41, the second repair line 42, and the third repair line 43 that do not intersect with the scan line 30 may also be located in the first conductive layer 120 to reduce the space occupied by the second conductive layer 130.

[0088] Figure 11This is a front view of another array substrate provided in an embodiment of the present invention. Figure 11 and Figure 1 The array substrates shown have basically the same structure, the difference being... Figure 11 The non-display area NA shown includes a first non-display area NA1 and a second non-display area NA2 that are set opposite to each other. The first non-display area NA1 is provided with multiple data binding pins and at least one redundant data binding pin (not shown in the figure). The multiple data binding pins and at least one redundant data binding pin are all pins of the source driver chip 70 used to output data signals. Figure 11 The array substrate 100 shown also includes multiple data lines 50 and at least one fourth repair line 60.

[0089] Each data line 50 has one end electrically connected to a data binding pin, and the other end extends through the display area AA to the second non-display area NA2, used to transmit the data signal output from the corresponding data binding pin to the corresponding column pixel circuit. The fourth repair line 60 includes a first extension segment 61 and a second extension segment 62. One end of the first extension segment 62 is electrically connected to a redundant data binding pin, and the other end is electrically connected to the second extension segment 62. The second extension segment 62 is located in the second non-display area NA2, intersecting with at least one data line 50, and the second extension segment 62 and at least one data line 50 are disposed on different layers at the intersection.

[0090] During normal data signal transmission, data line 50 plays a crucial role in transmitting the data signal output from the data bonding pin to the corresponding column pixel circuit. However, data line 50 may malfunction for various reasons, such as manufacturing defects causing poor contact between the data line and the corresponding data bonding pin. The fourth repair line provides a backup data signal transmission path. When a data line malfunctions and cannot transmit data signals normally, a specific repair operation can switch the signal originally transmitted through the faulty data line to the fourth repair line 60, thereby ensuring that the data signal can continue to be reliably transmitted to the corresponding pixel circuit and ensuring the normal display of the display device.

[0091] In this embodiment, the fourth repair line 60 is configured to be electrically connected to the corresponding scan line 30 at the intersection by laser melting.

[0092] In some embodiments, such as Figure 11 As shown, the multiple data lines 50 include a target data line 51, which is open-circuited between the first non-display area NA1 and the corresponding data bonding pin (see [reference]). Figure 11At point P), the target data line 51 and the second extension 62 of the fourth repair line 60 are intersected. The second extension 62 of the fourth repair line 60 and the target data line 51 are electrically connected at the intersection. The data signal output by the redundant data binding pin connected to one end of the first extension of the fourth repair line 60 is configured to be the same as the data signal output by the data binding pin connected to the target data line 51.

[0093] It should be explained that one end of the first extension 61 is fixedly connected to the redundant data binding pin, and the output signal of the redundant data binding pin is adjustable. When the target data line 51 is disconnected from the corresponding data binding pin, the output signal of the redundant data binding pin can be adjusted to be the same as the data signal output by the data binding pin connected to the target data line 51. At the same time, the fourth repair line 60 and the target data line 51 can be electrically connected at the intersection K by laser melting, so that the data signal can be transmitted to the corresponding column pixel circuit through the end of the target data line 51 away from the data binding pin via the fourth repair line 60.

[0094] In some embodiments, the other end of the first extension 61 is electrically connected to the second extension 62 via a repair wire in at least one repair unit 40. For example... Figure 11 As shown, when the first repair lines 41 in multiple repair units 40 are interconnected, the other end of the first extension segment 61 is electrically connected to the second extension segment 62 through the first repair line 41. In this case, the first repair line 41 in the repair unit 40 can only be used for data line malfunction repair, and cannot be used for scan line breakage repair or GOA failure repair. When the second repair line 42 is intersected with two adjacent scan lines, GOA failure repair can be achieved through the second repair line 42.

[0095] It should be noted that when the second repair line 42 is repaired for GOA failure, the third repair line 43 connecting the second repair line 42 and the first repair line 41 needs to be disconnected by laser fusing, for example, by laser fusing. Figure 11 Point Q is used to prevent mutual interference between the signals in the first repair line 41 and the second repair line 42.

[0096] In some embodiments, the other end of the first extension segment 61 can be electrically connected to the second extension segment 62 via a fourth repair sub-line. The fourth repair sub-line extends along a second direction and intersects with multiple scan lines 30. One end of the fourth repair sub-line is located in the first non-display area NA1, and the other end is located in the second non-display area NA2. The connection between the first extension segment 61 and the second extension segment 62 is achieved by independently configuring the fourth repair sub-line, specifically for repairing data line contact problems. This design does not rely on repair lines in the repair unit, thus enabling simultaneous scan line repair, GOA failure repair, and data line malfunction repair, effectively improving repair efficiency and flexibility.

[0097] In some embodiments, the array substrate 100 includes a substrate and a third conductive layer and a fourth conductive layer that are stacked and insulated in a direction away from the substrate. Multiple data lines 50 are located in the third conductive layer, and at least one second extension 62 of a fourth repair line 60 is located in the fourth conductive layer.

[0098] For example, a second insulating layer is provided between the third conductive layer and the fourth conductive layer. When the repair lines and data lines are electrically connected by laser melting, vias need to be opened at corresponding positions on the second insulating layer so that the laser can pass through the vias and act on the intersection area of ​​the data line on the third conductive layer and the fourth repair line on the fourth conductive layer to achieve electrical connection between the two.

[0099] It is understood that multiple data lines 50 and multiple scan lines 30 are located on different layers. The fourth conductive layer and the second conductive layer can be the same layer or different layers. When the fourth conductive layer and the second conductive layer are located on different layers, an insulating layer is provided between each conductive layer. At least one first extension segment 61 and fourth repair sub-line of the fourth repair line 60 can be located on the same layer as the first repair line 41, the second repair line 42 and the third repair line 43, or at least one first extension segment 61 and fourth repair sub-line of the fourth repair line 60 can be located on a different layer from the first repair line 41, the second repair line 42 and the third repair line 43. This invention does not limit this.

[0100] Based on the same inventive concept, this invention also provides a method for repairing an array substrate, applied to the array substrate described in the above embodiments. In this method, two adjacent scan lines intersecting with the first repair line are respectively the first scan line and the second scan line, and the second repair line intersects with at least the first scan line. Figure 12 This is a schematic diagram of a method for repairing an array substrate provided in an embodiment of the present invention, as shown below. Figure 12 As shown, the repair method includes:

[0101] Step S1201: When the first scan line is broken and the broken line is located between the first intersection position and the second intersection position, laser melting is used to make the first repair line electrically connected to the first scan line at the first intersection position and the second repair line electrically connected to the first scan line at the second intersection position.

[0102] The first intersection position is the intersection area of ​​the first scan line and the first repair line, and the second intersection position is the intersection area of ​​the first scan line and the second repair line.

[0103] Step S1202: When the gate drive circuit unit connected to the second scan line is in a failed state and the gate drive circuit unit connected to the first scan line is in a normal state, laser melting is used to make the first repair line and the first scan line electrically connected at the intersection position, and the first repair line and the second scan line electrically connected at the intersection position.

[0104] It should be noted that when the first scan line breaks and the GOA unit connected to the second scan line fails at the same time, the above steps S1201 and S1202 can be performed simultaneously to repair both the scan line breakage and the GOA failure.

[0105] In some embodiments, the repair method may further include:

[0106] When two repair units are used to transmit different signals and there is an electrical connection between the two repair units, the repair line connecting the two repair units is disconnected by laser melting.

[0107] In the case where the two repair units are used to repair faults (including line breakage faults and GOA failure faults) of different scan lines respectively, the two repair units are used to transmit different scan signals respectively.

[0108] In some embodiments, the repair method may further include:

[0109] In the case where there is a target data line with an open circuit between the first non-display area and the corresponding data binding pin among multiple data lines, laser melting is used to make the target data line and the second extension of the fourth repair line electrically connected at the intersection, and the data signal output by the redundant data binding pin connected to one end of the first extension of the fourth repair line is adjusted to be the same as the data signal output by the data binding pin connected to the target data line.

[0110] The positional relationship between the data line and the fourth repair line can be found in the relevant description of the above array substrate embodiment, and will not be repeated here.

[0111] Based on the same inventive concept, this invention also provides a display device, including an array substrate as described in the above embodiments. The specific structure of the array substrate can be found in the relevant descriptions of the above embodiments, and will not be repeated here.

[0112] In specific implementation, the display device provided in the embodiments of the present invention can be any product or component with display function, such as a mobile phone, tablet computer, television, monitor, laptop computer, digital photo frame, or navigator.

[0113] The technical solutions provided in the embodiments of the present invention have at least the following technical effects or advantages:

[0114] This invention provides an array substrate and its repair method, as well as a display device. By providing at least one repair unit, it can simultaneously repair problems such as broken scan lines and / or GOA unit failure without affecting the normal display of the panel, allowing the scan signal to be transmitted normally to the pixel circuit of the corresponding row. The at least one repair unit includes a first repair line intersecting two adjacent scan lines, a second repair line intersecting at least one of the two adjacent scan lines, and a third repair line electrically connected to the first and second repair lines. Since the first and second repair lines are spaced apart in a first direction, when at least one of the two adjacent scan lines breaks between its intersection with the first and second repair lines, laser melting can be used to electrically connect the first and second repair lines at the intersection with the scan line. This allows the scan line to be connected at the break point through the first, third, and second repair lines, enabling normal transmission of the scan signal. If one of two adjacent scan lines fails in connection with its connected GOA unit, a first repair line can be electrically connected to the two adjacent scan lines at their intersection using laser melting. This allows the two adjacent scan lines to be connected, and the GOA circuit connected to the adjacent scan lines provides the scan signal to that scan line, enabling normal scan signal transmission. Even if a scan line breakage and a GOA unit failure occur simultaneously, this at least one repair unit can achieve simultaneous repair of large-area faults or multiple points, ensuring normal display and effectively improving the yield rate of the display device. Furthermore, it eliminates the need to spend considerable effort finding and setting different repair methods for different faults, significantly reducing production costs and shortening the maintenance cycle.

[0115] Numerous specific details are set forth in the specification provided herein. However, it will be understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures, and techniques have not been shown in detail so as not to obscure the understanding of this specification.

[0116] Similarly, it should be understood that, in order to simplify this disclosure and aid in understanding one or more of the various aspects of the invention, in the above description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof. However, this method of disclosure should not be construed as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim. Rather, as reflected in the following claims, inventive aspects lie in fewer than all features of a single foregoing disclosed embodiment. Therefore, the claims following the detailed description are hereby expressly incorporated into this detailed description, wherein each claim itself is a separate embodiment of the invention.

[0117] It should be noted that the above embodiments are illustrative of the invention and not restrictive, and that those skilled in the art can devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses should not be construed as limiting the claims. The word "comprising" does not exclude the presence of components or steps not listed in a claim. The word "a" or "an" preceding a component does not exclude the presence of a plurality of such components. The use of the words first, second, and third, etc., does not indicate any order. These words can be interpreted as names.

Claims

1. An array substrate, the array substrate comprising a display area and a non-display area, characterized in that, The array substrate includes: A gate driving circuit, located in the non-display area, includes multiple cascaded gate driving circuit units; Multiple pixel circuits arranged in an array are located in the display area; Multiple scan lines extend along a first direction, and each scan line is electrically connected to the output terminal of the first-level gate drive circuit unit and a row of pixel circuits. At least one repair unit is located in the non-display area. The repair unit includes a first repair line, a second repair line, and a third repair line. The first repair line and the second repair line extend along a second direction, and the third repair line extends along the first direction. The second direction intersects with the first direction. The first repair line and the second repair line are spaced apart in the first direction. The first repair line intersects with two adjacent scan lines. The second repair line intersects with at least one of the two adjacent scan lines. One end of the third repair line is electrically connected to the first repair line, and the other end is electrically connected to the second repair line.

2. The array substrate as described in claim 1, characterized in that, The at least one repair unit includes a first repair unit, wherein the second repair line in the first repair unit is arranged to intersect with the two adjacent scan lines.

3. The array substrate as described in claim 2, characterized in that, The array substrate includes a plurality of first repair units, which are arranged along the second direction. The first repair lines in adjacent first repair units are electrically connected to each other, and the second repair lines in adjacent first repair units are electrically connected to each other.

4. The array substrate as described in claim 1, characterized in that, The array substrate includes a second repair unit, wherein the second repair line in the second repair unit is arranged to intersect with one of the two adjacent scan lines.

5. The array substrate as described in claim 4, characterized in that, The array substrate includes a plurality of second repair units, which are arranged along the second direction. The first repair lines in adjacent second repair units are electrically connected to each other, and / or the first repair lines in adjacent second repair units are electrically connected to the second repair lines.

6. The array substrate as claimed in claim 1, characterized in that, The array substrate includes a first repair unit and a second repair unit. The second repair line in the first repair unit is arranged to intersect with the two adjacent scan lines, and the second repair line in the second repair unit is arranged to intersect with one of the two adjacent scan lines.

7. The array substrate as described in claim 6, characterized in that, The array substrate includes a plurality of first repair units and a plurality of second repair units, which are arranged along the second direction. Any one of the first repair lines and the second repair lines in the first repair unit is electrically connected to any one of the first repair lines and the repair lines in the adjacent second repair unit.

8. The array substrate as claimed in claim 1, characterized in that, The two adjacent scan lines include a first scan line, which includes a first trace segment and a second trace segment. One end of the first trace segment extends from the display area to the non-display area. One end of the second trace segment is disconnected from one end of the first trace segment, and the other end is connected to the output terminal of the gate drive circuit unit. The first trace segment is arranged to intersect with the first repair line in the non-display area, and the first repair line and the first trace segment are electrically connected at the intersection. The second trace segment is arranged to intersect with the second repair line, and the second repair line and the second trace segment are electrically connected at the intersection.

9. The array substrate as described in claim 1 or 8, characterized in that, The two adjacent scan lines include a second scan line and a third scan line. The gate drive circuit unit connected to the second scan line is faulty. The first repair line is intersected with the second scan line and the third scan line. The first repair line is electrically connected to the second scan line at the intersection. The first repair line is electrically connected to the third scan line at the intersection.

10. The array substrate as claimed in claim 1, characterized in that, The first repair line is disposed in a different layer at the intersection with the two adjacent scan lines, and the second repair line is disposed in a different layer at the intersection with at least one of the two adjacent scan lines.

11. The array substrate as claimed in claim 10, characterized in that, The array substrate includes a substrate and a first conductive layer and a second conductive layer that are sequentially stacked and insulated along a direction away from the substrate. The multiple scan lines are located in the first conductive layer, and the first repair line, the second repair line, and the third repair line are located in the second conductive layer.

12. The array substrate as claimed in claim 1, characterized in that, The non-display area includes a first non-display area and a second non-display area disposed opposite to each other. The first non-display area is provided with multiple data bonding pins and at least one redundant data bonding pin. The array substrate further includes: Multiple data lines, one end of each data line is electrically connected to a data binding pin, and the other end extends through the display area to the second non-display area; At least one fourth repair line includes a first extension segment and a second extension segment. One end of the first extension segment is electrically connected to the redundant data binding pin, and the other end is electrically connected to the second extension segment. The second extension segment is located in a second non-display area and is arranged to cross the at least one data line. The second extension segment and the at least one data line are arranged on different layers at the intersection.

13. The array substrate as claimed in claim 12, characterized in that, The other end of the first extension is electrically connected to the second extension via a repair line in at least one repair unit.

14. The array substrate as claimed in claim 12, characterized in that, The plurality of data lines include a target data line, which is disconnected between the first non-display area and the corresponding data binding pin. The target data line is intersected with the second extension of the fourth repair line. The second extension of the fourth repair line is electrically connected to the target data line at the intersection. The data signal output by the redundant data binding pin connected to one end of the first extension of the fourth repair line is configured to be the same as the data signal output by the data binding pin connected to the target data line.

15. The array substrate as claimed in claim 12, characterized in that, The array substrate includes a substrate and a third conductive layer and a fourth conductive layer that are stacked and insulated along a direction away from the substrate. The plurality of data lines are located in the third conductive layer, and the second extension of the at least one fourth repair line is located in the fourth conductive layer.

16. A display device, characterized in that, Includes the array substrate as described in any one of claims 1 to 15.

17. A method for repairing an array substrate, characterized in that, Applied to an array substrate as described in any one of claims 1 to 15, wherein the two adjacent scan lines intersecting the first repair line are respectively a first scan line and a second scan line, and the second repair line intersects the first scan line at least once, the repair method includes: When the first scan line breaks and the break point is located between the first intersection point and the second intersection point, laser melting is used to electrically connect the first repair line and the first scan line at the first intersection point, and the second repair line and the first scan line at the second intersection point. The first intersection point is the intersection area of ​​the first scan line and the first repair line, and the second intersection point is the intersection area of ​​the first scan line and the second repair line. When the gate drive circuit unit connected to the second scan line is in a failed state and the gate drive circuit unit connected to the first scan line is in a normal state, laser melting is used to electrically connect the first repair line and the first scan line at their intersection positions, and the first repair line and the second scan line at their intersection positions.

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