Solid state disk service life prediction method

Abstract

The invention discloses a method for predicting the service life of a solid state disk, and relates to the technical field of computer hardware, and the method comprises the following steps: constructing a digital twinborn model of a same type of wear-free solid state disk, and carrying out an operation test at a fixed flash memory write-in amount and an operation temperature to determine the average total service life equivalent and the standard write-in strength of the solid state disk; for to-be-tested solid state disks of the same type, operating parameters such as flash memory write-in quantity and operating temperature of the to-be-tested solid state disks are acquired in real time in a preset acquisition period and serialized, and wear equivalents of each acquisition period are calculated and accumulated according to a life wear model, so that the life health degree of the to-be-tested solid state disks is evaluated and graded alarm is performed; and precise prediction and monitoring of the service life of the solid state disk are realized.

Description

Technical Field

[0001] This invention belongs to the field of computer hardware technology, specifically, it relates to a method for predicting the lifespan of a solid-state drive. Background Technology

[0002] With the rapid development of information technology, solid-state drives (SSDs) have become the mainstream storage devices, and their lifespan prediction technology is of paramount importance.

[0003] Existing methods generally rely on theoretical write cycles (such as TBW) provided by manufacturers or accelerated test models based on constant ideal conditions to estimate lifespan. Such static models cannot reflect the real impact of complex and variable operating conditions on lifespan in actual operation. They ignore the dynamic fluctuations of key operating parameters, especially failing to perform time-series analysis on real-time flash memory write intensity and dynamic changes in operating temperature, resulting in a serious disconnect between the predicted results and actual wear. Existing technologies typically use a single threshold alarm (such as when spare blocks are below a certain percentage), lacking continuous cumulative assessment of the lifespan consumption process and failing to quantify the remaining lifespan health. Furthermore, existing methods cannot establish benchmark lifespan standards and wear response models based on the specific characteristics of a particular hard drive model, and can only apply general or empirical formulas, resulting in insufficient personalization and low accuracy in prediction results, especially when dealing with non-standard write loads or high-temperature operating environments with large errors.

[0004] To address the aforementioned problems, this invention proposes a method for predicting the lifespan of a solid-state drive. Summary of the Invention

[0005] To address the shortcomings of existing technologies, this invention provides a method for predicting the lifespan of solid-state drives (SSDs), which solves the problem of inaccurate SSD lifespan prediction caused by ignoring dynamic changes in actual operating conditions and lacking personalized benchmarks.

[0006] The objective of this invention can be achieved through the following technical solutions: A method for predicting the lifespan of a solid-state drive (SSD) includes the following steps: Step 1: Extract several solid-state drives of the same type without wear and tear and construct corresponding digital twin models of the solid-state drives; The solid-state drive digital twin model was subjected to operational tests using fixed operating parameters until it was damaged. Determine the duration of the test run for the digital twin model of the solid-state drive, and determine the average total lifetime equivalent and standard write intensity associated with this type of solid-state drive; Step 2: Identify the solid-state drive to be tested, extract the associated operating parameters of the solid-state drive to be tested in time sequence within the acquisition period, and perform serialization processing to obtain the operating parameter sequence associated with each operating parameter; Step 3: Based on the combination of operating parameter sequence and life wear model, determine the wear equivalent of the acquisition cycle associated with the solid-state drive under test within the acquisition cycle, and accumulate the wear equivalent of the acquisition cycle in all acquisition cycles of the solid-state drive under test to obtain the cumulative wear equivalent. Step 4: Assess the lifespan health of the SSD under test based on the determined average total lifespan equivalent and cumulative wear equivalent, and issue graded alarms.

[0007] As a further aspect of the present invention, in step two, the operating parameters include: flash memory write volume and operating temperature.

[0008] As a further aspect of the present invention, in step one, the fixed operating parameters are: fixed flash memory write volume and fixed operating temperature, both of which are obtained by the operator based on preset parameters, and are respectively denoted as... as well as .

[0009] As a further aspect of the present invention, the specific method for determining the average total lifetime equivalent associated with this type of solid-state drive in step one is as follows: Determine the total number of wear-free solid-state drives of the same type, denoted as . , build The digital twin model of each solid-state drive (SSD). ; The current time is designated as the start time of the test run. Using fixed operating parameters Execute the runtime test; Sure Any solid-state drive digital twin model The time of damage is recorded as follows: ; use have to Associated runtime test duration ; Similarly, determine The duration of each test run, and recorded sequentially as follows: ; right Take the average to obtain the average test duration. ; Extracting the average run test duration The numerical part, representing the average total lifespan equivalent associated with this type of solid-state drive, is denoted as... .

[0010] As a further aspect of the present invention, the specific method for determining the standard write strength in step one is as follows: Extract fixed flash memory write volume The numerical part, used as the standard write strength for this type of solid-state drive, is denoted as... .

[0011] As a further aspect of the present invention, in step two, the specific method for extracting the operating parameters associated with the solid-state drive under test in a time sequence within the acquisition period and performing serialization processing to obtain the operating parameter sequence associated with each operating parameter is as follows: Obtain the data collection cycle preset by the operator. and determine the collection cycle. The total number of moments within a given time period, denoted as m; During the preset collection period Internally, the flash memory write volume and operating temperature associated with the solid-state drive under test are extracted in time sequence. Determine the collection period The flash memory write amounts corresponding to each of the m time points within a given timeframe are recorded as a flash memory write amount sequence in chronological order. ; Similarly, determine the operating temperature sequence. .

[0012] As a further aspect of the present invention, the specific method for determining the wear equivalent of the solid-state drive under test associated with the acquisition cycle in step three is as follows: S71, will A digital twin model of a solid-state drive Restore the initial state and repeat the test; Determine the write intensity associated with different flash memory write volumes and the average total lifetime equivalent associated with this type of solid-state drive under different operating temperatures, and fit the relationship between the average total lifetime equivalent and the write intensity associated with different flash memory write volumes and different operating temperatures. S72, with fixed flash memory write volume Using the associated standard write intensity and the average total lifetime equivalent corresponding to a fixed operating temperature as a benchmark, a lifetime wear model is constructed in conjunction with the content described in step S71. S73, Extraction as well as Substituting the write intensity and operating temperature associated with the flash memory write volume at any given moment into the lifetime wear model yields the lifetime wear ratio at that moment. ; S74, Duration of the data acquisition cycle Multiply by the wear factor associated with the SSD under test during the sampling period. , get duration The numerical value is taken as the wear equivalent of the SSD under test within this acquisition period, denoted as . .

[0013] As a further aspect of the present invention, in step three, all data collection cycles of the solid-state drive under test from the time it was put into use until the present time are determined; Repeat steps S71 to S74, according to the determined wear equivalent of the collection cycle. The method determines the wear equivalent of all acquisition cycles and summarizes them to obtain the cumulative wear equivalent associated with the solid-state drive under test, denoted as . ,and .

[0014] As a further aspect of the present invention, the specific method for assessing the lifespan and health of the solid-state drive under test and issuing graded alarms in step four is as follows: Extract the average total lifespan equivalent of this type of solid-state drive And determine the cumulative wear equivalent of the solid-state drive under test. By adopting The lifespan and health status of the solid-state drive under test were obtained. ; No processing required; Operators are advised to reduce the frequency of high flash memory write operations. This serves as a reminder to the operators that maintenance is required.

[0015] The beneficial effects of this invention are: This invention, by constructing an operational test based on a digital twin model, reflects the "average total lifespan equivalent" and "standard write intensity" of solid-state drives of the same type. It solves the problem of inaccurate prediction benchmarks caused by traditional methods relying on general theoretical values ​​or fixed acceleration models, effectively eliminates individual differences and physical test losses, and establishes the average total lifespan equivalent of this type of solid-state drive efficiently and at low cost. It also improves the accuracy of subsequent prediction operations and provides a reliable basis for the health management and preventive maintenance of solid-state drives. This invention provides a unified and objective wear measurement benchmark for the entire prediction system by explicitly defining "fixed flash memory write volume" as standard write intensity, ensuring the comparability between different prediction results. Secondly, it collects the actual operating parameters of the solid-state drive under test in a time-series manner to form a continuous sequence, laying a data foundation for subsequent real-time life assessment, thereby improving the accuracy, efficiency, and real-time performance of life assessment and prediction. This invention first constructs a lifespan wear model by quantifying the combined impact of write intensity and operating temperature on the lifespan of solid-state drives (SSDs) using the controlled variable method. This breaks through the limitations of single parameters and better reflects the actual wear mechanism of SSDs. Second, it substitutes the time-series collected operating parameters into the lifespan wear model moment by moment to dynamically calculate the instantaneous lifespan wear ratio. Then, it combines the collection cycle duration to generate the collection cycle wear equivalent. By accumulating the wear equivalent of all historical collection cycles, it forms the cumulative wear equivalent for the entire lifespan. Finally, it proposes a lifespan health index and triggers differentiated early warning strategies through health level classification. This forms a preventive maintenance closed loop, avoiding sudden failures and extending the usable lifespan of the hard drive. Attached Figure Description

[0016] The invention will now be further described with reference to the accompanying drawings.

[0017] Figure 1 This is a flowchart illustrating the method described in this invention; Figure 2 This is a flowchart illustrating the method described in Embodiment 2 of the present invention; Figure 3 This is a flowchart illustrating the method described in Embodiment 4 of the present invention. Detailed Implementation

[0018] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0019] Example 1 A method for predicting the lifespan of a solid-state drive, such as Figure 1 As shown, the specific steps include the following: The implementation of this method requires simulation using digital twin technology, which is a mature existing technology and will not be elaborated on in this method.

[0020] Choose any type of solid-state drive (SSD) as the example for the following steps (or the operator can choose other types of SSDs as the research object, ensuring that the SSD is kept in a fixed state).

[0021] Extract no fewer than three batches (to prevent the same problem from occurring in the same batch) of normal, unworn solid-state drives (SSDs, as referred to below) of the same model as samples.

[0022] Digital twin technology is used to construct digital twin models of all extracted solid-state drives (SSDs), and fixed flash memory write volume and fixed operating temperature are used as operating parameters for the digital twin models of the SSDs to conduct running tests until the digital twin models simulate the corresponding SSD failure (i.e., inability to be used normally).

[0023] By using the digital twin model of all SSDs associated with each SSD, the duration, or time frame, of any SSD from the start of the test run until the SSD fails can be determined.

[0024] Extract the duration simulated by the digital twin model of all solid-state drives (SSDs), calculate the average value, remove the unit of the average value, remove the dimension, and quantify the numerical part as the average total lifetime equivalent associated with this type of SSD.

[0025] At the same time, a fixed flash memory write volume is determined, and the dimensionless value is also removed, which is recorded as the standard write intensity (the determined average total lifespan equivalent is a value obtained under the influence of standard write intensity and fixed temperature. The following steps in this solution are all based on these two parameters (write intensity and operating temperature) to analyze and process the lifespan of the solid-state drive).

[0026] Next, determine the preset acquisition cycle and the duration of the acquisition cycle, and then extract any solid-state drive of the same type as the solid-state drive mentioned in the above steps (it should be noted that when implementing the following scheme, it is necessary to ensure that the solid-state drive under test is used as a fixed parameter during the acquisition cycle, except for the operating temperature and flash memory write volume, which can vary, that is, the same as the other parameters in the digital twin model constructed in the above method, i.e., control variables are analyzed).

[0027] Put the SSD under test into normal use scenarios and monitor it from the start time of use (the SSD under test should be in a normal, wear-free state before being put into use).

[0028] The operating parameters of the solid-state drive under test in any acquisition cycle are extracted according to the time sequence, namely the "variables" mentioned in the above steps: operating temperature and flash memory write volume. The operating temperature and flash memory write volume are then processed by time sequence serialization to obtain the operating temperature sequence associated with the operating temperature and the flash memory write volume sequence associated with the flash memory write volume.

[0029] Then, by combining the digital twin model of the solid-state drive with the controlled variable method, the operating temperature and flash memory write volume are controlled under different conditions to obtain the corresponding average total lifespan equivalent. This determines the relationship between the operating temperature and flash memory write volume of this type of solid-state drive and the average total lifespan equivalent. Based on this relationship, a lifespan wear model is constructed (with a fixed operating temperature and a fixed flash memory write volume as the comparison benchmark).

[0030] The wear equivalent of the solid-state drive under test is obtained by combining the operating temperature sequence associated with the operating temperature and the flash memory write volume sequence associated with the flash memory write volume in several collection cycles from the time the solid-state drive under test was put into use until now with the life wear model. After summarizing, the cumulative wear equivalent is obtained.

[0031] The lifespan health of the SSD under test is then assessed based on the determined average total lifespan equivalent and the cumulative wear equivalent associated with the SSD under test. The average total lifespan equivalent is used as the benchmark (the average maximum lifespan of this type of SSD under ideal conditions) for assessment, and a graded alarm strategy is formulated for the assessed lifespan health.

[0032] Example 2 This embodiment discloses a method for determining the average total lifetime equivalent of solid-state drives of the same type and the standard write strength associated with the average total lifetime equivalent, such as... Figure 2 As shown, the specific steps include the following: As described in Example 1, several normal, wear-free solid-state drives (SSDs) of the same type were identified. The total number of these identified SSDs was counted and marked as follows: Then, digital twin technology is used to build The digital twin models of each solid-state drive (SSD) are associated with it and represented in the order they were constructed as follows: .

[0033] Next, extract the current time and record it as the start time of the test. Obtain the fixed operating parameters (fixed flash memory write volume and fixed temperature) preset by the operator. A digital twin model of a solid-state drive Perform runtime testing until A digital twin model of a solid-state drive All were damaged, and during this process, the digital twin model of each solid-state drive was recorded from the start of the test. The duration between the moment of failure and the moment of damage.

[0034] Among them, extracting fixed flash memory write volume The numerical part is dimensionless, and the extracted numerical part is used as the standard write strength for this type of solid-state drive, and is marked as... .

[0035] For example, determine A digital twin model of a solid-state drive Any solid-state drive digital twin model The time when the damage occurred is recorded as follows: ,use Calculate the digital twin model of the solid-state drive Duration of the run test during which damage occurs during the simulation. .

[0036] According to the determined solid-state drive digital twin model Associated runtime test duration Methods for determining digital twin models of solid-state drives The duration of each test run, recorded in sequence: .

[0037] For the determined Duration of each run test The average duration of the test run was obtained by averaging, and denoted as: .

[0038] Then from the determined average running test duration The numerical value is extracted, dimensions are eliminated, and the extracted numerical value is used as the average total lifetime equivalent associated with this type of solid-state drive, and is labeled as... .

[0039] This embodiment uses virtual simulation to predict the average durability (lifespan) of this type of SSD under a specific constant workload (fixed write intensity and temperature) in a standardized manner.

[0040] The specific approach is as follows: construct multiple digital twin models of the same model of fault-free SSDs, apply preset standard write strength and temperature conditions in a digital environment to accelerate the "run test", record the simulated duration of each model from the start of the test to "failure"; calculate the average of these durations; finally, define the numerical part of this average time (eliminating the time unit) as the key reliability indicator of this model of SSD - "average total lifetime equivalent".

[0041] The purpose of this embodiment is to overcome the time and material limitations of physical testing, and to use digital twins to quickly generate quantifiable and comparable SSD lifespan benchmark values, providing key data support for the lifespan prediction process, namely "average total lifespan equivalent".

[0042] Example 3 This embodiment discloses a method for generating a sequence of operating parameters associated with operating parameters, specifically including the following steps: As can be seen from the content described in Example 1, it is necessary to serialize the operating parameters acquired by the solid-state drive under test during the acquisition period.

[0043] First, extract the data collection cycle and its duration preset by the operator. And determine within a collection cycle The total number of moments within a given time period is denoted as m.

[0044] Next, a solid-state drive (SSD) of the same type as the constructed digital twin model of the SSD is selected for testing, and data is collected at any preset sampling period. It can acquire real-time operating data of the solid-state drive under test during actual use, such as flash memory write volume and operating temperature.

[0045] The flash memory write volume and operating temperature are serialized according to timing to determine this acquisition cycle. The flash memory write volume corresponding to any given moment within a time frame, for a total of m moments, yields m flash memory write volumes. These m flash memory write volumes are then arranged in chronological order to form a flash memory write volume sequence, represented as: .

[0046] Similarly, determine this collection period. The operating temperature corresponding to any given moment within the time frame can be used to obtain m operating temperatures. These m operating temperatures are then arranged in chronological order to form an operating temperature sequence, which is represented as: .

[0047] The core objective of this embodiment is to construct a standardized dynamic input dataset for subsequent lifespan assessment. The flash memory write volume collected at each moment is arranged into a flash memory write volume sequence in chronological order, and the operating temperature values ​​are arranged into an operating temperature sequence. The aim is to accurately capture the evolution of the SSD's operating status under the fluctuation of flash memory write volume and the change of operating temperature in actual complex working environments.

[0048] Example 4 This embodiment discloses a method for obtaining the cumulative wear equivalent associated with the solid-state drive under test by determining the wear equivalent of the acquisition cycle, such as... Figure 3 As shown, the specific steps include the following: According to the content described in Example 2, the constructed A digital twin model of a solid-state drive Restore to the initial state (that is, the corresponding solid-state drive is in a state of no wear).

[0049] The controlled variable method is used to sequentially apply the write intensity associated with the flash memory write volume and the operating temperature as variables. During this process, the impact of different flash memory write volumes on the write intensity and different operating temperatures on the average total lifespan of this type of solid-state drive is recorded. This determines the relationship between the write intensity associated with different flash memory write volumes and different operating temperatures and the average total lifespan of this type of solid-state drive (this step is existing technology and can be implemented using the variable method and model inference techniques, and will not be elaborated on in this solution).

[0050] The write intensity associated with different flash memory write volumes and different operating temperatures in the above process need to be determined by a fixed flash memory write volume. The associated standard write strength and fixed operating temperature are used as benchmarks, that is, fixed flash memory write volume. The associated standard write strength and the average total lifetime equivalent associated with a fixed operating temperature will be used as the baseline value after processing by the above control variable method.

[0051] Based on the above analytical principles, a lifespan wear model is constructed: in, Expressed as life wear ratio, This is a constant value, determined by the operator based on actual conditions. It is generally set to 1 and is used to adjust the life wear ratio. For write strength, The write acceleration index is determined by the controlled variable method (the greater the amount of flash memory written, the higher the write acceleration index). The larger the value, the more likely it is to be (the specific value needs to be determined by the operator based on the results of the controlled variable method). For running temperature acceleration function, This refers to the operating temperature.

[0052] What needs to be explained is: the running temperature acceleration function Expressed as: ,in, Activation energy is expressed in electron volts or kilojoules per mole. Boltzmann constant, To fix the operating temperature, This refers to the operating temperature.

[0053] Running temperature acceleration function In This indicates an exponential operation used to describe the effect of operating temperature on lifespan wear (consumption).

[0054] The life wear ratio This is a coefficient used to adjust the wear equivalent of a acquisition cycle calculated under non-ideal conditions. For example, under ideal conditions, the wear equivalent of a acquisition cycle corresponds to one index (this one index is only an example). Nowadays, due to changes in operating temperature and flash memory write volume, the wear equivalent of a acquisition cycle will also change. This is achieved by calculating the lifetime wear ratio within this acquisition cycle. Adjusting the wear equivalent of the acquisition cycle can clarify the actual wear equivalent of the acquisition cycle, and determine the wear ratio within this acquisition cycle. If the value is 1.5, it means that the solid-state drive (SSD) is affected by changes in operating temperature and flash memory write volume during this collection cycle, which exacerbates wear. Originally, the wear equivalent of one collection cycle was 1 index. However, due to the impact of changes in operating temperature and flash memory write volume on the SSD during this collection cycle, the wear equivalent of this collection cycle becomes 1.5 * 1 index, which is 1.5 indexes.

[0055] Next, the solid-state drive under test is determined in this sampling period according to the method described in Example 3. The associated flash memory write volume sequence and operating temperature sequence .

[0056] Flash write volume sequence and operating temperature sequence According to the time sequence correspondence method ( correspond ... correspond Paired input life wear models Write strength and operating temperature .

[0057] Based on life wear model The lifetime wear ratio associated with each moment within this acquisition cycle is obtained, and finally... The lifetime wear ratio associated with each time point is averaged to obtain the lifetime wear ratio associated with this acquisition period. .

[0058] According to the duration of the data collection cycle preset by the operator Through life wear ratio Multiply by the duration of the data collection period The method to obtain the duration Then check the duration Dimensionless measurements are eliminated, and only the numerical value is taken. This extracted numerical value is used as the wear equivalent of the SSD under test within this acquisition cycle, and is denoted as... .

[0059] This gives the data for the solid-state drive under test in one acquisition cycle. The wear equivalent of the acquisition cycle associated with it.

[0060] According to the determined collection cycle wear equivalent The method determines the acquisition cycle wear equivalent associated with all acquisition cycles, identifies the acquisition cycle wear equivalent associated with all acquisition cycles of the SSD under test from the time it was put into use until the current moment, and obtains the cumulative wear equivalent associated with the SSD under test by summing them up, which is then marked as... It is important to note that... This indicates that the cumulative wear equivalent does not exceed the average total lifespan equivalent of this type of solid-state drive under ideal conditions. .

[0061] The purpose of this embodiment is to convert the life loss of the solid-state drive under test in actual non-ideal operating conditions (variable flash memory write intensity and operating temperature) into an accumulative wear equivalent of the acquisition cycle by establishing a life wear model.

[0062] Example 5 This embodiment discloses a method for obtaining the cumulative wear equivalent associated with the solid-state drive under test by determining the wear equivalent of the acquisition cycle, specifically including the following steps: Based on the content described in Example 4, the cumulative wear equivalent associated with the solid-state drive under test from the time it was put into use until the present moment can be obtained. .

[0063] Next, the average total lifespan equivalent of the solid-state drive type under test is extracted. (Obtained in Example 2), and by adopting: The lifespan and health status of the solid-state drive under test were calculated. .

[0064] if This indicates that the wear level of the tested solid-state drive is low, its remaining lifespan is ample, and its performance and reliability are expected to be in good condition, requiring no further action.

[0065] if This indicates that the solid-state drive under test has experienced a certain degree of wear and tear, and its remaining lifespan has entered a stage that requires attention. Although it can still work normally, long-term high-load use may accelerate its lifespan consumption, and the potential risk of failure begins to rise slowly. Operators should be reminded to reduce the frequency of high flash memory write operations.

[0066] like This indicates that the wear and tear on the tested solid-state drive is high, and its remaining lifespan is significantly shortened. Its reliability and data integrity risks have increased significantly. It may experience a sharp decline in performance or even complete failure and data loss at any time due to the depletion of flash memory cells, an increase in bad blocks, or other lifespan-related failures. Therefore, it is necessary to remind operators to replace or repair it in a timely manner.

[0067] The classification defined above: , , All of these can be adjusted by the operator according to the actual situation to suit the actual usage scenario and different types of solid-state drives.

[0068] All data in the formulas described above are numerical calculations performed after removing their dimensions. Furthermore, any content not described in detail in this specification is existing technology known to those skilled in the art.

[0069] The above description is merely an example and illustration of the present invention. Those skilled in the art can make various modifications or additions to the specific embodiments described, or use similar methods to replace them, as long as they do not deviate from the invention or exceed the scope defined in the claims, all of which should fall within the protection scope of the present invention.

[0070] It should be stated that all user data collected in this application was collected with the user's consent and authorization. Furthermore, the uses of user data are legal and compliant, and the use and processing of user data comply with the relevant laws, regulations, and standards of the relevant regions.

Claims

1. A method for predicting the lifespan of a solid-state drive, characterized in that, This method includes the following steps: Step 1: Extract several solid-state drives of the same type without wear and tear and construct corresponding digital twin models of the solid-state drives; The solid-state drive digital twin model was subjected to operational tests using fixed operating parameters until it was damaged. Determine the duration of the test run for the digital twin model of the solid-state drive, and determine the average total lifetime equivalent and standard write intensity associated with this type of solid-state drive; Step 2: Identify the solid-state drive to be tested, extract the associated operating parameters of the solid-state drive to be tested in time sequence within the acquisition period, and perform serialization processing to obtain the operating parameter sequence associated with each operating parameter; Step 3: Based on the combination of operating parameter sequence and life wear model, determine the wear equivalent of the acquisition cycle associated with the solid-state drive under test within the acquisition cycle, and accumulate the wear equivalent of the acquisition cycle in all acquisition cycles of the solid-state drive under test to obtain the cumulative wear equivalent. Step 4: Assess the lifespan health of the SSD under test based on the determined average total lifespan equivalent and cumulative wear equivalent, and issue graded alarms.

2. The method for predicting the lifespan of a solid-state drive according to claim 1, characterized in that, In step two, the operating parameters include: flash memory write volume and operating temperature.

3. The method for predicting the lifespan of a solid-state drive according to claim 1, characterized in that, In step one, the fixed operating parameters are: fixed flash memory write volume and fixed operating temperature, both of which are obtained by the operator based on preset parameters, and are denoted as follows: as well as .

4. The method for predicting the lifespan of a solid-state drive according to claim 2, characterized in that, In step one, the specific method for determining the average total lifetime equivalent associated with this type of solid-state drive is as follows: Determine the total number of wear-free solid-state drives of the same type, denoted as . , build The digital twin model of each solid-state drive (SSD). ; The current time is designated as the start time of the test run. Using fixed operating parameters Execute the runtime test; Sure Any solid-state drive digital twin model The time of damage is recorded as follows: ; use have to Associated runtime test duration ; Similarly, determine The duration of each test run, and recorded sequentially as follows: ; right Take the average to obtain the average test duration. ; Extracting the average run test duration The numerical part, representing the average total lifespan equivalent associated with this type of solid-state drive, is denoted as... .

5. The method for predicting the lifespan of a solid-state drive according to claim 4, characterized in that, In step one, the specific method for determining the standard write strength is as follows: Extract fixed flash memory write volume The numerical part, used as the standard write strength for this type of solid-state drive, is denoted as... .

6. The method for predicting the lifespan of a solid-state drive according to claim 1, characterized in that, In step two, the operating parameters associated with the solid-state drive under test are extracted sequentially within the acquisition period and serialized to obtain the operating parameter sequence associated with each operating parameter. The specific method for this is as follows: Obtain the data collection cycle preset by the operator. and determine the collection cycle. The total number of moments within a given time period, denoted as m; During the preset collection period Internally, the flash memory write volume and operating temperature associated with the solid-state drive under test are extracted in time sequence. Determine the collection period The flash memory write amounts corresponding to each of the m time points within a given timeframe are recorded as a flash memory write amount sequence in chronological order. ; Similarly, determine the operating temperature sequence. .

7. The method for predicting the lifespan of a solid-state drive according to claim 6, characterized in that, In step three, the specific method for determining the wear equivalent of the solid-state drive under test associated with the acquisition cycle within the acquisition cycle is as follows: S71, will A digital twin model of a solid-state drive Restore the initial state and repeat the test; Determine the write intensity associated with different flash memory write volumes and the average total lifetime equivalent associated with this type of solid-state drive under different operating temperatures, and fit the relationship between the average total lifetime equivalent and the write intensity associated with different flash memory write volumes and different operating temperatures. S72, with fixed flash memory write volume Using the associated standard write intensity and the average total lifetime equivalent corresponding to a fixed operating temperature as a benchmark, a lifetime wear model is constructed in conjunction with the content described in step S71. S73, Extraction as well as Substituting the write intensity and operating temperature associated with the flash memory write volume at any given moment into the lifetime wear model yields the lifetime wear ratio at that moment. ; S74, Duration of the data acquisition cycle Multiply by the wear factor associated with the SSD under test during the sampling period. , get duration The numerical value is taken as the wear equivalent of the SSD under test within this acquisition period, denoted as . .

8. The method for predicting the lifespan of a solid-state drive according to claim 7, characterized in that, In step three, all data collection periods of the solid-state drive under test from the time it was put into use until the present time are determined. Repeat steps S71 to S74, according to the determined wear equivalent of the collection cycle. The method determines the wear equivalent of all acquisition cycles and summarizes them to obtain the cumulative wear equivalent associated with the solid-state drive under test, denoted as . .

9. The method for predicting the lifespan of a solid-state drive according to claim 8, characterized in that, In step four, the specific method for assessing the lifespan and health of the solid-state drive under test and issuing graded alarms is as follows: Extract the average total lifespan equivalent of this type of solid-state drive And determine the cumulative wear equivalent of the solid-state drive under test. By adopting The lifespan and health status of the solid-state drive under test were obtained. ; No processing required; Operators are advised to reduce the frequency of high flash memory write operations. This serves as a reminder to the operators that maintenance is required.

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