Processing method and device for equipment simulation operation, equipment and storage medium

Abstract

The invention provides an equipment simulation operation processing method and device, electronic equipment and a readable storage medium. Comprising the following steps: acquiring a waveform file, an analysis program and standard data of equipment simulation; the analysis program is operated to automatically analyze the waveform data, waveform segments in the waveform data are traversed according to instructions in the analysis program, the analysis result of the traversed waveform segments is compared with the standard data, and whether a fault occurs in the first waveform segment or not and specific fault information are judged according to the analysis result. All the data are automatically written into a comparison result; determining the fault of the equipment according to the comparison result; and faults occurring in the waveform data can be positioned. According to the processing process of the whole equipment simulation operation, the computer is controlled by the analysis program to analyze the waveform file of the equipment simulation, so that the analysis of the operation state of the equipment can be automatically and accurately completed.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of simulation, in particular to a device simulation running processing method and device, electronic equipment and readable storage medium. BACKGROUND

[0002] Verilog Procedural Interface (VPI) is used to implement complex process control in the simulation process of Verilog programming and hardware verification.

[0003] In the field of hardware development, confirming hardware functions is a very important step; when verifying hardware, developers usually analyze waveform data obtained by hardware simulation, and analyze the running state of the hardware according to whether there is waveform anomaly and the position of the waveform anomaly. In the process of analyzing waveform data, developers generally use waveform visualization software or specific waveform analysis tools to analyze the signal change of the waveform, so as to achieve the purpose of analyzing the running state of the hardware.

[0004] However, in the process of analyzing the signal change of the waveform, the developer needs to use the naked eye to carefully observe and judge whether the waveform data is abnormal, and analyze the running state of the hardware reflected by the waveform data, which not only consumes a lot of time and energy, but also is prone to omissions and errors through eye observation and judgment. SUMMARY

[0005] The embodiments of the present application provide a device simulation running processing method and device, electronic equipment and readable storage medium, which are used to solve the problems of low efficiency and poor detection accuracy caused by manual observation.

[0006] In a first aspect, the embodiments of the present application provide a device simulation running processing method, which comprises: Obtaining a waveform file of a running signal in a device simulation running process, an analysis program used for analyzing the waveform file, and standard data, wherein the analysis program comprises instructions for analyzing and processing the waveform, and the standard data comprises standard results of each preset event; the device simulation running process is performed according to the order of the preset events.

[0007] Reading the waveform file to obtain waveform data, wherein the waveform data comprises waveform segments of the preset events arranged in sequence, and each waveform segment corresponds to a preset event; running the analysis program, traversing the waveform segments in the waveform data according to the instructions in the analysis program, and comparing the analysis result of a first waveform segment with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result.

[0008] According to the comparison result, a running state of the device is determined.

[0009] In a second aspect, an embodiment of the present application provides a processing device for device simulation running, and the device comprises: An acquisition module is configured to acquire a waveform file of a running signal in a device simulation running process, an analysis program for analyzing the waveform file, and standard data, wherein the analysis program comprises instructions for analyzing and processing the waveform, and the device simulation running process is performed according to a preset event sequence.

[0010] A reading module is configured to read the waveform file to obtain waveform data, wherein the waveform data comprises a plurality of waveform segments arranged according to the preset event sequence, and each waveform segment corresponds to one preset event.

[0011] A comparison module is configured to run the analysis program, traverse the waveform segments in the waveform data according to the instructions in the analysis program, compare the analysis result of a first waveform segment with a standard result of a preset event corresponding to the first waveform segment in the standard data, and obtain a comparison result.

[0012] A positioning module is configured to determine a running state of the device according to the comparison result.

[0013] In a third aspect, an embodiment of the present application further provides an electronic device, comprising a processor, and a memory configured to store instructions executable by the processor, wherein the processor is configured to execute the instructions to implement the method of the first aspect.

[0014] In a fourth aspect, an embodiment of the present application further provides a readable storage medium, when instructions in the readable storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute the method of the first aspect.

[0015] In the embodiment of the present application, the waveform file of the running signal in the simulation running process of the device is acquired, the waveform file is read to obtain waveform data, the waveform data includes a plurality of waveform segments arranged in the order of the preset events; the waveform data is analyzed automatically by using an analysis program containing instructions for analyzing the waveform file, according to the instructions in the analysis program, the computer or the like is controlled to automatically traverse the waveform segments in the waveform data, and the first waveform segment traversed is compared with the standard result of the preset event corresponding to the first waveform segment in the standard data, according to the comparison result, the running state of the device is determined. In the process of traversing the waveform segments by using the analysis program, the computer can be controlled by the analysis program without human power, and the traversal of the waveform segments is automatically completed; and in the process of traversing by using the analysis program to control the computer, the calculation ability of the computer is much better than that of human power, and the traversal accuracy of the computer is higher, and the result is more accurate. The whole process of locating the fault in the simulation waveform data of the device in the embodiment of the present application can automatically complete the analysis of the running state of the device simulation waveform without consuming human power, and the fault locating result obtained by calculation is extremely accurate.

[0016] The above description is only a summary of the technical scheme of the present application, in order to more clearly understand the technical means of the present application, the content of the specification can be implemented, and in order to make the above and other purposes, characteristics and advantages of the present application more obvious and easy to understand, the following specific embodiments of the present application are described. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 is a step flow chart of a device simulation running processing method provided by the embodiment of the present application; Figure 2 is a specific step flow chart of a device simulation running processing method provided by the embodiment of the present application; Figure 3 is a structure schematic diagram of a waveform simulation intermediate layer provided by the embodiment of the present application; Figure 4 is a schematic diagram of traversing a waveform file in a device simulation running processing method provided by the embodiment of the present application; Figure 5 is a schematic diagram of accessing a waveform in a device simulation running processing method provided by the embodiment of the present application; Figure 6 is a flow chart of a device simulation running processing method provided by the embodiment of the present application; Figure 7 is a block diagram of a device simulation running processing device provided by the embodiment of the present application; Figure 8is a block diagram of an electronic device provided by an embodiment of the present application. Figure 9 is a block diagram of an electronic device according to an exemplary embodiment provided by an embodiment of the present application. DETAILED DESCRIPTION

[0018] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application.

[0019] The terms "first", "second", and the like in the specification of the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described herein, and the objects distinguished by "first", "second", etc. are generally a class, and do not limit the number of objects, for example, the first object can be one or more. In addition, the term "and / or" in the specification is used to describe the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B can represent: A exists alone, A and B exist together, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects. The term "multiple" in the embodiments of the present application means two or more, and other quantifiers are similar.

[0020] Figure 1 is a step flowchart of a processing method for device simulation running provided by an embodiment of the present application, as shown in the figure, the method can include: Figure 1 Step 101, acquiring a waveform file of a running signal in a device simulation running process, an analysis program for analyzing the waveform file, and standard data, the analysis program including instructions for analyzing and processing waveform data; the standard data contains standard results of each preset event; the device simulation running process is performed according to the order of the preset events.

[0021] ​In the embodiments of the present application, the final purpose of device simulation is hardware verification, and the hardware verification is the functional verification of the design model of hardware, aiming to find potential problems as much as possible. The task of hardware verification is to ensure that the design model can complete all the pre-designed functions, including functional coverage, protocol compliance, etc., and find the design flaws. The device simulation is performed in the order of preset events, that is, the pre-designed functions to be verified in the hardware verification. The waveform file is the corresponding waveform generated when each function is implemented during the device running in the device simulation process. The analysis program is used to analyze the device running state reflected by the waveform generated in the device simulation process, and to monitor whether a fault occurs. The standard data is the data obtained when each design function works completely normally during the device simulation process.

[0022] In the embodiments of the present application, after obtaining the waveform file of the running signal in the device simulation running process, the analysis program for analyzing the waveform file, and the standard data, a set of program for implementing the automatic analysis of the running state and the fault of each preset event in the waveform file is designed. For example, based on the verification requirement of a chip, the cache coherency, low-speed interface and clock system of the chip are simulated. First, a completely normally working chip is prepared, and the running data file generated when the cache coherency, low-speed interface and clock system of the chip are simulated is extracted. The running data file includes the simulation waveforms of the cache coherency, low-speed interface and clock system, and the data in the running data file is used as the standard data. The analysis program is written, which is used to analyze the simulation waveforms of the cache coherency, low-speed interface and clock system of the chip, detect the running state of the cache coherency, low-speed interface and clock system of the chip, and locate the fault. For example, the cache coherency, low-speed interface and clock system of a chip to be verified are simulated, based on the analysis program, the analysis data corresponding to the waveform segment generated in the simulation process is compared with the data corresponding to the cache coherency, low-speed interface and clock system in the standard data, the comparison result of the cache coherency, low-speed interface and clock system in the chip to be verified is obtained, and whether the running state of each preset event in the chip to be verified is normal and the function is normal is judged according to the comparison result.

[0023] Step 102, reading the waveform file to obtain waveform data, the waveform data including a plurality of waveform segments arranged in the order of the preset events, the waveform segments corresponding to the preset events one by one.

[0024] In this embodiment, waveform data is parsed from a waveform file. The waveform segments in the waveform data are arranged in the order of their corresponding preset events. For example, the preset events include cache coherency, low-speed interface, and clock system. The waveforms in the waveform data are divided into three parts, namely three waveform segments, arranged in the order of the preset events, labeled A1-A3. Each waveform segment from A1 to A3 corresponds to a corresponding preset event. These three waveform segments are strictly arranged in the order of the preset events, that is, in the order of A1, A2, and A3. Waveform segment A1 corresponds to cache coherency, waveform segment A2 corresponds to low-speed interface, and waveform segment A3 corresponds to clock system.

[0025] In this embodiment, waveform data is obtained from a waveform file and divided into multiple waveform segments according to the order of preset events. This simplifies the process of analyzing waveform data using an analysis program, while ensuring that the results obtained from analyzing waveform segments using the analysis program are error-free.

[0026] Step 103: Run the analysis program to traverse the waveform segments in the waveform data according to the instructions in the analysis program, and compare the parsing result of the first waveform segment with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain the comparison result.

[0027] In the embodiments of the present application, for the waveform data in the simulation of the equipment in each different working state, there is corresponding standard data as a comparison. The first waveform segment is obtained by traversing the waveform data, and the analysis of the first waveform segment and the waveform data can be quickly performed by comparing the analysis result of the first waveform segment with the standard result of the corresponding preset event in the standard data, so as to determine whether an abnormality occurs in the first waveform segment and the waveform data. For example, when verifying the cache consistency, low-speed interface and clock system in the chip to be detected, a chip that has completely passed the verification of the cache consistency, low-speed interface and clock system needs to be prepared, and the cache consistency, low-speed interface and clock system are the preset events; the data obtained by analyzing the waveform file generated in the simulation of the chip that has passed the verification when verifying the cache consistency, low-speed interface and clock system is taken as the standard data. The running process of the cache consistency, low-speed interface and clock system of the chip to be detected is simulated to obtain the corresponding waveform file, the waveform data in the waveform file is read, and the waveform data is divided into three waveform segments, namely, the cache consistency waveform segment, low-speed interface waveform segment and clock system waveform segment, according to the preset events. The analysis result of the three waveform segments divided in the waveform file is compared with the standard result of the three preset events in the standard data according to the order of the preset events, and the comparison result is obtained according to whether the analysis result of the three preset events in the waveform file is consistent with the standard result of the three preset events in the standard data.

[0028] In the embodiments of the present application, in the comparison process, when the analysis result of the first waveform segment in the waveform file is completely the same as the standard result of the corresponding preset event of the first waveform segment in the standard data, it is considered that the function of the preset event corresponding to the first waveform segment does not currently fail. For example, when verifying whether the hardware queue in the chip is normally running, the standard result of the hardware queue is first determined, and the standard result is related to the nature of the preset event; the nature of the hardware queue is first-in first-out, that is, after sequentially inputting "1", "2" and "3" into the hardware queue, the output result of the hardware queue is "1", "2" and "3" in sequence. After determining the standard result of the hardware queue, the hardware queue is simulated: "4", "5" and "6" are input into the hardware queue and simulated, the waveform data obtained by simulation is analyzed, the output result of the hardware queue is "4", "4" and "6", which is compared with the standard result "4", "5" and "6" of the hardware queue, and the comparison result is inconsistent. It is determined that the execution of the hardware queue is abnormal, and the comparison result of the waveform segment is written into the comparison result and the hardware queue.

[0029] In the embodiment of the present application, according to the instruction in the analysis program, the waveform file is automatically compared, and whether the waveform segment in the waveform file is faulty is quickly obtained, thereby shortening the comparison time.

[0030] In step 104, the running state of the device is determined according to the comparison result.

[0031] In the embodiment of the present application, the comparison result obtained in step 103 includes the waveform segment with fault and the fault specific information corresponding to the waveform segment. According to the comparison result, the fault information corresponding to the waveform segment with fault can be automatically determined, thereby facilitating the troubleshooting. For example, in step 103, the hardware queue is simulated, and the waveform segment corresponding to the simulated hardware queue is analyzed. The analysis result is compared with the standard result of the hardware queue, and it is found that the simulation result of the hardware queue is abnormal. The abnormality and the hardware queue are written into the comparison result of the waveform segment corresponding to the hardware queue. The comparison result is analyzed, and it is found that the running of the hardware queue is abnormal, and the fault in the hardware queue needs to be investigated.

[0032] In the embodiment of the present application, the waveform file of the running signal in the device simulation running process is obtained, the waveform file is read to obtain waveform data, the waveform data includes a plurality of waveform segments arranged in the order of the preset events; an analysis program containing instructions for analyzing the waveform file is used to automatically analyze the waveform data. According to the instruction in the analysis program, the computer is automatically controlled to traverse the waveform segment in the waveform data, and the first waveform segment is compared with the standard result of the preset event corresponding to the first waveform segment in the standard data. According to the comparison result, the running state of the device is determined. In the process of using the analysis program to traverse the waveform segment, the computer can be automatically controlled by the analysis program without human intervention. Moreover, in the process of using the analysis program to control the computer to traverse, the computing ability of the computer is much better than that of human beings, and the accuracy of the computer is also higher, and the result is more accurate. In the embodiment of the present application, the process of locating the fault in the device simulation waveform data can be automatically completed without consuming human labor, the running state of the device simulation waveform can be automatically analyzed, and the fault locating result obtained by calculation is extremely accurate.

[0033] Figure 2 is a specific step flowchart of a device simulation running processing method provided in the embodiment of the present application, as shown in Figure 2 The method can include the following steps. Step 201: Obtain waveform files of the operating signals during the equipment simulation operation, an analysis program for analyzing the waveform files, and standard data. The analysis program includes instructions for analyzing and processing the waveforms; the standard data contains standard results for each preset event; the equipment simulation operation proceeds in the order of the preset events.

[0034] This step can be referred to as step 101 above, and will not be repeated here.

[0035] Step 202: Read the waveform file to obtain waveform data, which includes multiple waveform segments arranged in the order of the preset events; each waveform segment corresponds to a preset event.

[0036] This step can be referred to as step 102 above, and will not be repeated here.

[0037] Step 203: Control the waveform cursor variable through the instructions in the analysis program, and traverse the waveform segments in the waveform data in sequence according to the order of the preset events corresponding to the waveform segments; the value of the waveform cursor variable reflects the preset event corresponding to the first waveform segment traversed.

[0038] like Figure 4 As shown in the embodiments of this application, the analysis program defines an incrementing waveform cursor variable. The waveform cursor variable corresponds one-to-one with the preset events corresponding to the waveform segments traversed in the waveform data. That is, after each increment, the waveform cursor variable will only point to one waveform segment. For example, the waveform data in the waveform file is divided into 10 waveform segments A1-A10 according to the number of preset events contained in the waveform file. When using the waveform cursor variable, the initial value of the waveform cursor variable is set to n, and it increments by 1 each time. During the traversal of waveform segments A1 to A10, the waveform cursor variable n is used when traversing A1, the waveform cursor variable (n+1) is used when traversing waveform segment A2, and the waveform cursor variable changes according to the pattern (n+2) to (n+9) when traversing waveform segments A3 to A10. The change of the waveform cursor variable corresponds one-to-one with the waveform segment traversal process.

[0039] In this embodiment of the application, the waveform cursor variable is controlled to traverse the waveform segments in the waveform data sequentially according to the preset events corresponding to the waveform segments, ensuring that the traversal of the waveform data is executed correctly in the order of the preset events, and that the traversal results are uniquely corresponding.

[0040] Step 204: When the first waveform segment encountered is the rising edge or falling edge, execute the callback instruction, compare the parsing result of the first waveform segment encountered with the standard result of the corresponding preset event in the standard data, and obtain the comparison result.

[0041] This step can refer to step 103 above, and will not be repeated here.

[0042] Optionally, step 204 can further include sub-steps 2041-2042: In sub-step 2041, each waveform segment in the standard data corresponds to a preset event, and the preset event is used to represent the step performed by the device corresponding to the waveform segment in the standard data.

[0043] When the analysis result of the first waveform segment is inconsistent with the standard result of the preset event corresponding to the waveform segment in the standard data, it is determined that the first waveform segment has a fault, and the preset event corresponding to the first waveform segment is added to the comparison result corresponding to the first waveform segment as fault information.

[0044] In the embodiments of the present application, each waveform segment in the standard data has a unique corresponding preset event, that is, a previously set device simulation link. For example, when verifying the functions of cache consistency, low-speed interface, and clock system of a chip, all three items need to be simulated, and the three items of cache consistency, low-speed interface, and clock system have a unique corresponding standard result set in advance. In the waveform file obtained by simulation, each preset event has a corresponding waveform segment. The function of each waveform segment in the waveform file is referred to as a preset event.

[0045] In the traversal, the waveform cursor variable traverses each preset event corresponding to the waveform segment in the waveform file, and the first waveform segment traversed is analyzed. The analysis result obtained after analysis is compared with the standard result corresponding to the preset event in the standard data, and the comparison result is obtained after comparison. When analyzing the waveform data in the waveform file, the waveform segments in the waveform data are divided according to the corresponding preset events, so the analysis rule of the waveform data depends on the waveform analysis rule of the corresponding preset event. For example, when simulating the event of accessing the chip cache, the obtained simulation waveform is a square wave, and the high level in the simulation waveform represents that the computer attempts to access the chip cache, and the low level represents that the computer does not attempt to access the chip cache, that is, the number of times of high level appearance is counted to obtain the number of times of computer attempts to access the chip cache. This way of traversing the waveform segments in the waveform data can quickly find the abnormal waveform segment; for example, when simulating and verifying the clock system of a chip at this moment, to determine whether the clock system of the chip works normally, the waveform segment corresponding to the clock system in the simulation waveform file is analyzed, and the analysis result obtained by analysis is compared with the standard result corresponding to the clock system in the standard data to determine whether the clock system of the chip works normally.

[0046] Once the abnormal waveform segment is identified, the preset event corresponding to the abnormal waveform segment is the specific fault in the equipment simulation operation.

[0047] Sub-step 2042: When the parsing result of the first waveform segment is consistent with the standard result of the preset event corresponding to the first waveform segment in the standard data, the comparison result of the first waveform segment is that no fault has occurred.

[0048] In this embodiment, when the parsing result of the first waveform segment is consistent with the standard result of the preset event corresponding to the first waveform segment in the standard data, it means that the preset event corresponding to the first waveform segment is running normally and no fault has occurred; if the parsing result of the first waveform segment is inconsistent with the standard result of the preset event corresponding to the first waveform segment in the standard data, it is considered that the operation of the preset event corresponding to the first waveform segment has failed; the failure is written into the comparison result of the first waveform segment; and the preset time corresponding to the first waveform segment is written into the comparison result of the first work segment.

[0049] In this embodiment of the application, based on the standard data, the device can be quickly judged to determine whether a fault has occurred based on the device's simulated waveform, and the fault can be quickly located when a fault occurs.

[0050] Optionally, steps preceding step 204 may include, for example, substep 2043: Sub-step 2043: Convert the instructions included in the analysis program into instructions in the set language format through the preset interface function.

[0051] In this embodiment, the analysis program is used to perform traversal analysis on the waveform data in the waveform file and locate the faults in the waveform data. When designing the analysis program, different developers may use different programming languages, such as C, JAVA, or Python. Different programming languages ​​have different characteristics. In order to take into account the characteristics of different programming languages ​​and improve the flexibility of the functions in the analysis program, a preset interface function is used to convert the analysis program, converting the instructions in the analysis program developed in different programming languages ​​into instructions in the set language format.

[0052] like Figure 3 As shown, this application embodiment provides a waveform simulation intermediate layer including the preset interface functions. The waveform simulation intermediate layer includes the preset interface functions, namely the VPI interface layer, a process scheduling controller, and a waveform parser.

[0053] The VPI interface layer is responsible for the interaction between the VPI interface function and the process scheduler. The VPI interface layer provides standard VPI interface functions to the outside. Regardless of the programming language used, the implementation of the analysis program is to implement the VPI standard function in the VPI interface layer, that is, to achieve the purpose of controlling the analysis of the waveform. The VPI interface layer converts the VPI standard function implemented in the programming language into instructions in the specified language format.

[0054] It can be seen that the preset interface function mentioned above is the VPI interface layer in the waveform simulation intermediate layer, which plays a role in converting the language format.

[0055] The process scheduling controller is composed of three parts, including a waveform cursor controller, a callback pool and a VPI-waveform parser compatible layer.

[0056] The waveform cursor controller is used to control the waveform cursor variable in the waveform simulation process.

[0057] The callback pool is used to save the callback function information registered by the VPI interface layer. In the analysis program for automatic analysis of the waveform file, the callback function is the main and important part of the analysis program in the automatic analysis process of the waveform file. The process of analyzing the waveform file can be considered as a process of identifying and fault analyzing the rising edge and falling edge in the waveform data. The callback function used in the analysis program can perform fault analysis on the identified rising edge / falling edge when the waveform cursor variable identifies the rising edge and falling edge. Therefore, in the callback function used in the embodiment of the present application, the function type mainly includes the rising edge and the falling edge. The function type is the specific type of the variable to be identified, that is, the rising edge and the falling edge. The programming is usually written as posedge and negedge. When a delay of a period of time is required before identifying the rising edge and the falling edge, a callback function including a type of timer is also used. In the embodiment of the present application, the callback function type mainly includes the rising edge (posedge), the falling edge (negedge) and the timer (timer).

[0058] In the waveform simulation intermediate layer in the embodiment of the present application, the callback function is written in the programming language before being input into the VPI interface layer, that is, the preset interface function. After being converted by the VPI interface layer, the callback function is converted into the specified language format defined in the waveform simulation intermediate layer.

[0059] The VPI-waveform parser compatible layer is responsible for interacting with the waveform parser and providing the internal interface at the bottom of the process scheduler for interacting with the waveform simulator, and is used to receive the waveform data analyzed by the waveform parser.

[0060] The waveform parser is configured to receive an externally input waveform file, parse the waveform file to obtain waveform data in the waveform file, and provide a process scheduler related interface to obtain waveform file information. The waveform parser can be a library with a waveform parsing function in any programming language.

[0061] The waveform simulation intermediate layer in the embodiment of the present application provides a VPI interface layer. The waveform is analyzed by implementing an interface function in the VPI interface layer. After the interface function is implemented, the VPI interface layer can convert programs written in different programming languages with different characteristics into programs in the same format, which well balances the characteristics of the programming languages. The waveform simulation intermediate layer provides a waveform parser, which can quickly parse a waveform file without introducing and relying on other programs for parsing the waveform file, thereby accelerating the running efficiency. The waveform simulation intermediate layer provides a process scheduling controller, including a waveform cursor controller, a callback pool, and a VPI-waveform parser compatible layer. According to the callback function in the callback pool and the waveform cursor controller, the waveform data is parsed, and the waveform data in the waveform file can be quickly analyzed and information collected.

[0062] Optionally, the substep 2043 can specifically include substeps A1-A3. Substep A1, inputting the analysis program into the interface function.

[0063] Substep A2, the interface function reads instructions included in the analysis program.

[0064] Substep A3, converting the instructions into instructions in a specified language format.

[0065] In the embodiment of the present application, the interface function (VPI interface layer) converts instructions included in the analysis program into instructions in a specified language format. For example, an analysis program for analyzing waveform data is written in Python, that is, the interface function for analyzing whether the rising edge and the falling edge in the waveform segment appear a fault in the waveform simulation intermediate layer is implemented by using Python. The Python program is converted by using the VPI interface layer in the waveform simulation intermediate layer into an analysis program based on C language uniformly defined in the simulation intermediate layer.

[0066] In the embodiment of the present application, the callback function is used as the instruction. The callback function is used to judge whether the rising edge / falling edge appears a fault when the waveform cursor variable traverses the waveform data and detects that the rising edge / falling edge appears.

[0067] The instructions are converted into instructions in a setting language format, which unifies the instructions in the analysis program written in different programming languages, does not require the developer to make a specific programming language, and can utilize the characteristics of different programming languages.

[0068] In step 205, the running state of the device is determined according to the comparison result.

[0069] In the embodiment of the present application, the comparison result includes whether each waveform segment in the waveform data corresponds to a fault and the corresponding information of the fault, and the running state and related running information of the device in the simulation running process can be obtained by checking the comparison result. Optionally, step 205 can further include sub-steps 2051-2053. In sub-step 2051, the comparison result is analyzed to obtain an analysis result.

[0070] In sub-step 2052, if the analysis result includes the preset event, it is determined that the device has a running fault, and the device operation represented by the preset event is taken as the occurrence position of the running fault.

[0071] In sub-step 2053, if the analysis result does not include the preset event, it is determined that the device runs normally.

[0072] In the embodiment of the present application, sub-steps 2051-2053 further explain how to obtain the analysis result. When the analysis result does not include the preset event, it means that the waveform segment does not have a fault. When the analysis result includes the preset event, it is determined that a fault occurs in the device running link corresponding to the preset event in the device running process. When the comparison result includes the waveform segment where the fault occurs and the specific fault information corresponding to the waveform segment, the fault information corresponding to the waveform segment where the fault occurs can be automatically determined according to the comparison result, which facilitates the troubleshooting of the fault. For example, the cache consistency, low-speed interface and clock system in the chip to be detected are verified, and the preset event includes the cache consistency, low-speed interface and clock system. The comparison result obtained by verification shows that the second waveform segment and the third waveform segment in the three waveform segments obtained by dividing the waveform data in the waveform file according to the preset event have faults, the second waveform segment corresponds to the low-speed interface, the third waveform segment corresponds to the clock system, and the fault is located in the low-speed interface and the clock system. At this time, it can be determined that the low-speed interface and the clock system in the chip have faults, and the faults of the low-speed interface and the clock system in the chip need to be confirmed and investigated.

[0073] In the embodiments of the present application, the waveform simulation intermediate layer is used to analyze the waveform file of the device simulation, and the running state of the device simulation and the information in the running are obtained. For example, the running information in the simulation waveform file of the cache hit of the chip is collected, and the process of collecting the cache hit rate of the chip includes: preparing an analysis program for analyzing the waveform of the cache hit of the chip, for example, using JAVA, Python and the like to write; inputting the prepared analysis program into the simulation intermediate layer, and the simulation intermediate layer converts the analysis program through the VPI interface layer into a format defined in the VPI interface layer; then the VPI interface layer reads the simulation waveform file of the cache hit of the chip through the VPI-waveform parser compatible layer and the waveform parser, obtains the waveform data of the cache hit of the chip, and according to the instructions for analyzing the waveform data of the cache hit defined in the analysis program, the number of times of attempting to access the cache of the chip and the number of times of accessing the cache of the chip are counted according to the effective level defined in the instructions, and the cache access times and the cache hit times are counted, and then the running information of the cache hit rate is calculated. As shown in Figure 5 The waveform of the cache access is parsed, the high level in the waveform of the cache access represents an attempt to access the cache of the chip, and the high level in the waveform of the cache hit represents a successful access to the cache of the chip, that is, a cache hit. It is parsed that there are five cache access behaviors in total (dashed line + solid line), two of which are represented by dashed lines, and the hit rate is calculated to be 2 / 5*100%=40%.

[0074] In the embodiments of the present application, on the basis of the waveform simulation intermediate layer that can take into account programs written in different programming languages, the waveform data in the waveform file is analyzed, and the running state of the device and the related running information are obtained.

[0075] As shown in Figure 6 The complete flow of the processing method for the simulation running of the device in the embodiments of the present application can include: Step 301, the waveform simulation starts.

[0076] In the embodiments of the present application, in step 301, the simulation work of the device starts, and the waveform is generated in the simulation software.

[0077] In the embodiments of the present application, before the simulation work starts, the link to be simulated in the device has been set in advance, that is, the preset event is set.

[0078] Step 302, execute the business code.

[0079] In the embodiment of the present application, in step 302, the callback function is executed before taking effect. The signal value or some data (such as bit width, etc.) of the signal can be obtained through some interface functions in the VPI interface layer; the access of the interface functions in the VPI interface layer is converted through the VPI-waveform analysis compatible layer, and then the underlying waveform analyzer is called to obtain the required information. The waveform analyzer is invisible to the interface functions in the VPI interface layer called in the service code. The service code is executed until the registration of the callback is started.

[0080] Step 303, register the callback.

[0081] In the embodiment of the present application, in step 303, the callback function is registered, that is, the callback function is written. The type (rising edge, falling edge and timer, etc.) of the callback function, the parameters (including periodic pulse signal, etc.) of the callback function and the specific processing logic are written using a programming language. The most important thing is to implement the interface function in the VPI interface layer in the waveform simulation intermediate layer in the embodiment of the present application. The written callback function is converted through the VPI interface layer by the interface layer. These callback functions are the analysis programs mentioned above, which are used for analyzing and fault locating the rising edge and falling edge of the waveform data.

[0082] Step 304, put the callback into the callback pool.

[0083] In the embodiment of the present application, in step 304, the callback function is put into the callback pool. When the waveform cursor is incremented each time during the traversal of the waveform segment in the waveform data, whether the callback function of the corresponding type in the callback pool meets the triggering condition according to the type (rising edge, falling edge or timer) of the callback function is queried. The triggering condition is whether the waveform in the current waveform segment has the callback function of the corresponding type. If the triggering condition is met, the callback function is triggered, and the service code is continued to be executed at the corresponding position of the service code.

[0084] Step 305, increment the waveform cursor.

[0085] During the traversal of the waveform segment in the waveform data, the waveform cursor traverses the waveform data. The increment of the waveform cursor proposed in the embodiment of the present application is based on a waveform segment. The waveform cursor is incremented each time, which indicates that the traversal of the current waveform data runs to the next waveform segment.

[0086] Step 306, judge whether to end.

[0087] This application determines whether the traversal of waveform data in a waveform file has ended. Simply put, when the waveform cursor increments to the last waveform segment in the waveform data, if no new waveform segment is generated, the traversal of the waveform data can no longer continue, and the traversal of the waveform data ends.

[0088] Step 307: Determine if a callback has been triggered.

[0089] In this embodiment of the application, during the traversal of each waveform segment, it is checked whether there is a callback in the callback pool that meets the triggering condition. The triggering condition is the rising edge, falling edge or timer in the waveform mentioned above. If the triggering condition is met, the corresponding callback function, that is, the analysis program, will be executed to analyze the corresponding waveform segment.

[0090] Step 308: Simulation ends.

[0091] In this embodiment, if the result of determining whether to end in step 306 is "end," then the entire simulation process ends. In summary, in this embodiment, based on a waveform simulation intermediate layer that can accommodate programs written in different programming languages, the waveform data in the waveform file is analyzed to obtain the running status and related running information. Before analyzing the waveform file, the following steps are taken: first, acquire the waveform file of the operating signals during the device simulation operation; second, acquire the analysis program containing instructions for analyzing the waveform file; third, acquire standard data; fourth, read the waveform file to obtain waveform data, which includes multiple waveform segments arranged in the order of preset events, with each waveform segment corresponding to a preset event; fifth, run the analysis program to analyze the waveform data, traversing the waveform segments according to the instructions in the analysis program. This method of traversing waveform segments using the analysis program is not only efficient but, with proper program design, can also accurately traverse and analyze waveform segments; sixth, parse the first waveform segment encountered, and compare the parsed result with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result. By comparing the waveform data with the standard data through the analysis program, accurate fault analysis results can be quickly obtained; and seventh, based on the comparison result, accurately and quickly determine the operating status and related information of the device, and locate the faults appearing in the waveform data.

[0092] like Figure 7 As shown in the figure, a block diagram of a device simulation operation processing device 40 provided in this application embodiment is provided. The device includes: The acquisition module 401 is configured to acquire a waveform file of a running signal in a device simulation running process, an analysis program for analyzing the waveform file, and standard data, and the analysis program comprises instructions for analyzing and processing the waveform.

[0093] The reading module 402 is configured to read the waveform file to obtain waveform data, and the waveform data comprises a plurality of waveform segments arranged in the order of the preset events, and each of the waveform segments corresponds to a preset event.

[0094] The comparison module 403 is configured to run the analysis program, traverse the waveform segments in the waveform data according to the instructions in the analysis program, compare the analysis result of a first waveform segment with the standard result of the preset event corresponding to the first waveform segment in the standard data, and obtain a comparison result.

[0095] The positioning module 404 is configured to determine the running state of the device according to the comparison result.

[0096] Optionally, the positioning module 404 further comprises: The traversal submodule is configured to control a waveform cursor variable through the instructions in the analysis program, and sequentially traverse the waveform segments in the waveform data in the order of the preset events corresponding to the waveform segments; the value of the waveform cursor variable reflects the preset event corresponding to the first waveform segment that is traversed.

[0097] Optionally, the traversal submodule further comprises: The comparison unit is configured to execute the callback instruction when the first waveform segment that is traversed is the rising edge or the falling edge, analyze the first waveform segment that is traversed, compare the analysis result obtained by the analysis with the standard result of the preset event corresponding to the first waveform segment in the standard data, and obtain a comparison result.

[0098] Optionally, the comparison unit further comprises: The first judgment submodule is configured to, when the analysis result of the first waveform segment is inconsistent with the standard result of the preset event corresponding to the first waveform segment in the standard data, confirm that the first waveform segment has a fault, and add the preset event corresponding to the first waveform segment as fault information to the comparison result corresponding to the first waveform segment.

[0099] The second judgment submodule is configured to, when the analysis result of the first waveform segment is consistent with the standard result of the preset event corresponding to the first waveform segment in the standard data, confirm that the first waveform segment has no fault.

[0100] Optionally, the first judgment submodule further comprises: a parsing subunit, configured to parse the comparison result to obtain a parsed result.

[0101] a first judging subunit, configured to determine that the device has a running fault if the parsed result includes the preset event, and determine the device execution step represented by the preset event as a position where the running fault occurs.

[0102] a first judging subunit, configured to determine that the device is running normally if the parsed result does not include the preset event.

[0103] Optionally, the positioning module 404 further includes: an interface sub-module, configured to convert the instruction included in the analysis program into an instruction in a set language format through a preset interface function.

[0104] Optionally, the interface sub-module includes: an input unit, configured to input the analysis program into the interface function.

[0105] a reading unit, configured to read the instruction included in the analysis program by the interface function.

[0106] a conversion unit, configured to convert the instruction into an instruction in a set language format through the interface function.

[0107] For the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the related parts refer to the part of the method embodiment.

[0108] Each embodiment in the specification is described in a progressive manner, and each embodiment focuses on the difference from other embodiments. The same and similar parts between the embodiments can be referred to each other.

[0109] For the device in the above embodiments, the specific manner in which each module performs operations has been described in detail in the embodiments related to the method, and will not be described in detail here.

[0110] Embodiments of the present application provide a device simulation running processing device, including a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by one or more processors, and the one or more programs include a method for performing the method described in one or more embodiments.

[0111] In the embodiment of the present application, the waveform file of the running signal in the simulation running process of the device is acquired, the waveform file is read to obtain waveform data, the waveform data includes a plurality of waveform segments arranged in the order of the preset events; the waveform segment corresponds to a preset event one by one; the waveform data is automatically analyzed by running an analysis program containing instructions for analyzing the waveform file; according to the instructions in the analysis program, the computer and other devices are automatically controlled to traverse the waveform segments in the waveform data, the first waveform segment traversed is compared with the standard result of the preset event corresponding to the first waveform segment in the standard data, according to the comparison result, the running state of the device is determined, and the fault occurring in the device is accurately located. In the process of traversing the waveform segments by using the analysis program, the computer can be controlled by the analysis program without manpower, and the traversal of the waveform segments is automatically completed; moreover, in the process of traversing by using the analysis program to control the computer, the calculation ability of the computer is much better than that of manpower, and the traversal precision of the computer is higher, and the result is more accurate. The whole process of analyzing the running state of the device simulation waveform data in the embodiment of the present application can automatically complete the state analysis of the device simulation waveform and the information collection in the simulation waveform without consuming manpower, and can quickly locate the fault occurring in the device simulation process.

[0112] Figure 8 FIG. 6 is a block diagram of an electronic device 600 according to an example embodiment. The electronic device 600 can be a mobile phone, a computer, a digital broadcasting terminal, a message receiving device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, and the like, for example.

[0113] Referring to Figure 8 The electronic device 600 can include one or more of the following components: a processing component 602, a memory 604, a power supply component 606, a multimedia component 608, an audio component 610, an input / output (I / O) interface 612, a sensor component 614, and a communication component 616.

[0114] The processing component 602 usually controls overall operations of the electronic device 600, such as operations associated with display, phone call, data communication, camera operation, and recording operation. The processing component 602 can include one or more processors 620 to execute instructions to complete all or part of steps of the methods described above. Further, the processing component 602 can include one or more modules to facilitate the interaction between the processing component 602 and other components. For example, the processing component 602 can include a multimedia module to facilitate the interaction between the multimedia component 608 and the processing component 602.

[0115] The memory 604 is used for storing various types of data to support the operation of the electronic device 600. Examples of these data include instructions for any application programs or methods operating on the electronic device 600, contact data, phonebook data, messages, pictures, multimedia, etc. The memory 604 can be implemented by any type of volatile or nonvolatile storage devices or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read only memory (EEPROM), erasable programmable read only memory (EPROM), programmable read only memory (PROM), read only memory (ROM), magnetic storage, flash memory, magnetic or optical disk.

[0116] The power supply component 606 supplies power for various components of the electronic device 600. The power supply component 606 can include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power for the electronic device 600.

[0117] The multimedia component 608 includes a screen providing an output interface between the electronic device 600 and a user. In some embodiments, the screen can include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen can be implemented as a touch screen to receive input signals from a user. The touch panel includes one or more touch sensors to sense touch, swiping, and gestures on the touch panel. The touch sensors can not only sense a boundary of a touch or swiping action, but also detect duration and pressure associated with the touch or swiping action. In some embodiments, the multimedia component 608 includes a front camera and / or a rear camera. The front and rear cameras can receive external multimedia data when the electronic device 600 is in an operation mode, such as a photographing mode or a multimedia mode. Each of the front and rear cameras can be a fixed optical lens system or have a focal length and optical zoom capability.

[0118] The audio component 610 is configured to output and / or input audio signals. For example, the audio component 610 includes a microphone (MIC) for receiving an external audio signal when the electronic device 600 is in an operation mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signal can be further stored in the memory 604 or transmitted via the communication component 616. In some embodiments, the audio component 610 also includes a speaker for outputting audio signals.

[0119] The I / O interface 612 provides an interface between the processing component 602 and peripheral interface modules, which can be a keyboard, a click wheel, a button, etc. The buttons can include, but are not limited to, a home button, a volume button, a start button, and a lock button.

[0120] The sensor component 614 includes one or more sensors for providing status assessments for various aspects of the electronic device 600. For example, the sensor component 614 can detect an open / closed position of the electronic device 600, relative positioning of components, such as a display and a keypad of the electronic device 600, a change in position of the electronic device 600 or a component of the electronic device 600, presence or absence of user contact with the electronic device 600, orientation or acceleration / deceleration / g-force and temperature of the electronic device 600. The sensor component 614 can include an optical sensor for detecting ambient light, a proximity sensor for detecting nearby objects without any physical touch, a CMOS or CCD image sensor for use in imaging applications, or an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor in some embodiments.

[0121] The communication component 616 facilitates wired or wireless communication in a distributed network using one or more communication standards including, but not limited to, Global System for Mobile Communications (GSM), Code Division Multiple Access (CDMA), Long-Term Evolution (LTE), and others. The communication component 616 can further facilitate communication using other protocols such as Bluetooth, low power Bluetooth (BLE), Wireless Fidelity (Wi-Fi), and / or the like. In an example embodiment, the communication component 616 receives broadcast signals or broadcasting-related information from external broadcasting management systems using a plurality of broadcasting standards, such as MediaFLO®, Digital Video Broadcasting (DVB), Intelsat, and so on. In an example embodiment, the communication component 616 includes a Near Field Communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on Radio Frequency Identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and others.

[0122] In an example embodiment, the electronic device 600 can be implemented using one or more Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), Digital Signal Processing Devices (DSPDs), Programmable Logic Devices (PLDs), Field Programmable Gate Arrays (FPGAs), controllers, micro-controllers, microprocessors, or other electronic components, for performing the methods provided by the present application.

[0123] In an example embodiment, a non-transitory computer-readable medium, such as the memory 604 including instructions, is also provided which, when executed by the processor 620 of the electronic device 600, causes the processor 620 to perform a method described above. For example, the non-transitory computer-readable medium can be a ROM, a RAM, a CD-ROM, a magnetic tape, a floppy disc, and an optical data storage device, and so on.

[0124] Figure 9This is a block diagram illustrating an electronic device 700 according to an exemplary embodiment. For example, the electronic device 700 may be provided as a server. (Refer to...) Figure 9 The electronic device 700 includes a processing component 722, which further includes one or more processors, and memory resources represented by memory 732 for storing instructions, such as application programs, that can be executed by the processing component 722. The application programs stored in memory 732 may include one or more modules, each corresponding to a set of instructions. Furthermore, the processing component 722 is configured to execute instructions to perform the methods provided in the embodiments of this application.

[0125] Electronic device 700 may also include a power supply component 726 configured to perform power management of electronic device 700, a wired or wireless network interface 750 configured to connect electronic device 700 to a network, and an input / output (I / O) interface 758. Electronic device 700 may operate on an operating system stored in memory 732, such as Windows Server™, MacOSX™, Unix™, Linux™, FreeBSD™, or similar.

[0126] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the methods described in the above embodiments.

[0127] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the application disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this application are indicated by the following claims.

[0128] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. A processing method of device emulation run, characterized by, The method comprises: acquiring a waveform file of a running signal in a device simulation running process, an analysis program for analyzing the waveform file, and standard data, the analysis program comprising instructions for analyzing and processing waveform data, and the standard data comprising standard results of each preset event; the device simulation running process is performed according to the order of the preset events; reading the waveform file to obtain waveform data, the waveform data comprising a plurality of waveform segments arranged in the order of the preset events; the waveform segments correspond to the preset events one by one; running the analysis program, traversing the waveform segments in the waveform data according to the instructions in the analysis program, and comparing the analysis result of a first waveform segment traversed with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result; determining the running state of the device according to the comparison result.

2. The processing method of claim 1, wherein, The traversing the waveform segments in the waveform data according to the instructions in the analysis program comprises: controlling a waveform cursor variable according to the instructions in the analysis program to sequentially traverse the waveform segments in the waveform data in the order of the preset events corresponding to the waveform segments; the value of the waveform cursor variable reflects the preset event corresponding to the first waveform segment traversed.

3. The processing method of claim 1, wherein, The waveform segments comprise rising edges or falling edges; the instructions in the analysis program comprise callback instructions; the callback instructions are used to control the traversed object to perform a comparison operation; The comparing the analysis result of the first waveform segment traversed with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result comprises: when the first waveform segment traversed is the rising edge or the falling edge, executing the callback instructions, analyzing the first waveform segment traversed, comparing the analysis result obtained by the analysis with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result.

4. The processing method of claim 3, wherein, Each standard result in the standard data corresponds to a preset event; the preset event is used to represent a device execution step corresponding to the standard result in the standard data; The comparing the first waveform segment traversed with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result comprises: when the analysis result of the first waveform segment traversed is inconsistent with the standard result of the preset event corresponding to the first waveform segment in the standard data, confirming that the first waveform segment has a fault, and adding the preset event corresponding to the first waveform segment as fault information into the comparison result corresponding to the first waveform segment; when the analysis result of the first waveform segment traversed is consistent with the standard result of the preset event corresponding to the first waveform segment in the standard data, the comparison result of the first waveform segment is normal.

5. The processing method of device emulation run according to claim 4, wherein, The determining the running state of the device according to the comparison result comprises: analyzing the comparison result to obtain an analysis result; if the preset event is included in the analysis result, it is determined that the device has a running fault, and the device execution step represented by the preset event is taken as the occurrence position of the running fault. If the preset event is not included in the analysis result, it is determined that the device is running normally.

6. The processing method for device simulation running according to claim 1, wherein, Before the analysis program is run, and according to the instructions in the analysis program, the waveform segments in the waveform data are traversed, and the analysis result of the first waveform segment traversed is compared with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result, the method further comprises: The instructions included in the analysis program are converted into instructions in a set language format through a preset interface function.

7. The processing method of device emulation run according to claim 6, wherein, The instructions included in the analysis program are converted into instructions in a set language format through a preset interface function, including: The analysis program is input into the interface function; The interface function reads the instructions included in the analysis program; The instructions are converted into instructions in a set language format through the interface function.

8. A processing device for device emulation execution, the processing device comprising: Including: An acquisition module is configured to acquire a waveform file of a running signal in a device simulation running process, an analysis program for analyzing the waveform file, and standard data, the analysis program including instructions for analyzing and processing waveforms; the device simulation running process is performed according to a preset event sequence; A reading module is configured to read the waveform file to obtain waveform data, the waveform data including a plurality of waveform segments arranged according to the preset event sequence; The waveform segments correspond one-to-one to the preset events; A comparison module is configured to run the analysis program to traverse the waveform segments in the waveform data according to the instructions in the analysis program, and compare the analysis result of a first waveform segment traversed with the standard result of the preset event corresponding to the first waveform segment in the standard data to obtain a comparison result; A positioning module is configured to determine the running state of the device according to the comparison result.

9. An electronic device, comprising: Including: A processor; A memory for storing instructions executable by the processor; The processor is configured to execute the instructions to implement the method of any one of claims 1 to 7.

10. A readable storage medium, characterized by, When the instructions in the readable storage medium are executed by the processor of the electronic device, the electronic device can perform the method of any one of claims 1 to 7.

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