A testing method and apparatus for an electronic controller

Abstract

This application provides a testing method and apparatus for an electronic controller, relating to the field of braking testing technology and applicable to vehicle braking systems. The method includes: controlling a simulated relay to connect a simulated sensor to the electronic controller; the simulated sensor containing one or more pre-set test items among signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition; each test item containing test data; triggering the corresponding test item in the simulated sensor to generate a test signal and sending it to the electronic controller; the test signal carrying the test data of the corresponding test item; and obtaining an evaluation result of the electronic controller based on the processing result of the test signal by the electronic controller, the evaluation result being used to characterize the signal processing performance quality of the electronic controller. This improves the comprehensiveness and accuracy of ECU performance testing without damaging the real sensor.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of brake testing, in particular to a test method and device for an electronic controller. BACKGROUND

[0002] ECU (Electronic Control Unit) is an electronic controller unit, also known as the "driving computer" of a vehicle. Its purpose is to control the driving state of the vehicle and realize various functions. Mainly, it uses various sensors and bus data acquisition and exchange to determine the vehicle state and the intention of the driver, and controls the vehicle through actuators. For example, the ECU can receive wheel speed information from a wheel speed sensor and control the vehicle based on the wheel speed information.

[0003] In related technologies, a test bench is usually built for the ECU to simulate the real components of the vehicle braking system and the connection mode of the real components, to obtain the operating environment of the ECU, and to monitor the processing result of the ECU by triggering the real sensors in the real components to generate corresponding test signals and send them to the ECU. Thus, according to the processing result of the corresponding test signals, the signal processing performance and quality of the ECU can be obtained. However, this method still has some defects, including: 1. The signal value fed back by the real sensor is constrained by the product characteristics, and cannot reach the maximum signal value of the real sensor, so the identification and processing of the ECU for the maximum signal value cannot be tested; 2. The real sensor cannot send a fault signal without damaging the real sensor; 3. The time for sending a fault signal to the ECU to identify the fault signal cannot be measured. Moreover, the accuracy of the signal identification and processing of the test ECU is affected by the difference between the signal generated by the real sensor and the expected signal, which makes the information processing performance test of the ECU inaccurate.

[0004] Therefore, there is an urgent need for a test method and device for an electronic controller that can improve the comprehensiveness and accuracy of ECU performance testing without damaging the real sensor. SUMMARY

[0005] The embodiments of the present application provide a test method and device for an electronic controller that can improve the comprehensiveness and accuracy of ECU performance testing without damaging the real sensor.

[0006] In a first aspect, the embodiments of the present application provide a test method for an electronic controller, which is suitable for a vehicle braking system, the electronic controller is connected to a simulated sensor through a simulated relay, and the test method comprises the following steps:

[0007] The control unit controls the analog relay to connect the analog sensor and the electronic controller, the analog sensor contains any one or more test items of preset signal value identification, system time base identification, fault code and state bit identification and cyclic redundancy check code identification, and the test items contain test data;

[0008] The first test unit triggers the corresponding test item in the analog sensor to generate a test signal, and sends the test signal to the electronic controller, the test signal is used to test the signal processing performance of the electronic controller, and the test signal carries the test data of the corresponding test item;

[0009] According to the processing result of the electronic controller on the test signal, the electronic controller is evaluated to obtain an evaluation result, and the evaluation result is used to represent the signal processing performance quality of the electronic controller.

[0010] In a second aspect, the embodiments of the present application provide a test device of an electronic controller, which is suitable for a vehicle braking system, the electronic controller is connected with an analog sensor through an analog relay, and the test device comprises:

[0011] A control unit is configured to control the analog relay to connect the analog sensor and the electronic controller, the analog sensor contains any one or more test items of preset signal value identification, system time base identification, fault code and state bit identification and cyclic redundancy check code identification;

[0012] A first test unit is configured to trigger the corresponding test item in the analog sensor to generate a test signal, and send the test signal to the electronic controller, the test signal is used to test the signal processing performance of the electronic controller;

[0013] A second test unit is configured to evaluate the electronic controller according to the processing result of the electronic controller on the test signal, and obtain an evaluation result, and the evaluation result is used to represent the signal processing performance quality of the electronic controller.

[0014] Optionally, the triggered test item is a signal value identification test item, and the first test unit is specifically configured to:

[0015] Trigger the signal value identification test item in the analog sensor to generate a fast frame signal value command, and send the fast frame signal value command to the electronic controller;

[0016] The second test unit is specifically configured to: acquire an identification signal value of a command signal value of the fast frame signal value command by the electronic controller, and obtain the evaluation result according to a signal difference between the command signal value and the identification signal value, the command signal value being any signal value in a signal value range executable by the fast frame signal value command.

[0017] Optionally, the triggered test item is a system time base identification test item, and the first test unit is specifically configured to: trigger the system time base identification test item in the analog sensor to generate a system time base command, and send the system time base command to the electronic controller.

[0018] The second test unit is specifically configured to: acquire an identification time base value of a system time base value of the system time base command by the electronic controller, and obtain the evaluation result according to a time base difference between the system time base value and the identification time base value.

[0019] Optionally, the triggered test item is a fault code and state bit identification test item, and the first test unit is specifically configured to: trigger the fault code and state bit identification test item in the analog sensor to generate a fault code and state bit command, and send the fault code and state bit command to the electronic controller.

[0020] The second test unit is specifically configured to: acquire a fault identification result of the fault code and state bit command by the electronic controller, and evaluate the electronic controller according to the fault identification result to obtain the evaluation result.

[0021] Optionally, the triggered test item is a cyclic redundancy check code identification test item, and the first test unit is specifically configured to: trigger the cyclic redundancy check code identification test item in the analog sensor to generate an error check code command, and send the error check code command to the electronic controller.

[0022] The second test unit is specifically configured to: acquire an abnormality identification result of the error check code command by the electronic controller, and evaluate the electronic controller according to the abnormality identification result to obtain the evaluation result.

[0023] Optionally, the second test unit is further configured to: record a fault injection time point of sending the error check code command, and collect an abnormality fault time point of obtaining the abnormality identification result by the electronic controller, and evaluate the electronic controller according to a time difference between the fault injection time point and the abnormality fault time point to obtain the evaluation result.

[0024] Optionally, the electronic controller is connected with a real relay and a real sensor, the real sensor has the same function as a sensor actually used by a controller in a brake system, and the control unit is further configured to control the real relay to disconnect the real sensor and the electronic controller.

[0025] Optionally, the first test unit is further configured to:

[0026] Optionally, the first test unit is further configured to:

[0027] The application has the following beneficial effects:

[0028] The application provides a test method for an electronic controller, the electronic controller is connected with an analog relay and an analog sensor, and the analog relay can be used to control the connection and disconnection between the analog sensor and the electronic controller, wherein the analog sensor can be preconfigured with any one or more of the following test items: signal value identification, system time base identification, fault code and state bit identification, and cyclic redundancy check code identification. In this way, the corresponding test item in the analog sensor is triggered to generate a test signal, and the test signal is sent to the electronic controller to obtain the processing result of the electronic controller on the test signal, so that the signal processing performance and quality of the electronic controller can be evaluated.

[0029] The test item in the analog sensor contains test data, and the test signal generated by triggering the test item contains the test data in the corresponding test item, that is, the test signal containing any required test data can be generated by setting the test item and its test data in the analog sensor. Compared with the related art, the maximum signal value cannot be reached due to the product characteristics of the sensor, and the processing capability of the ECU on the maximum signal value cannot be tested. However, the application can test the processing capability of the ECU on any signal value, thereby improving the comprehensiveness of the test. Moreover, the sensor does not need to be damaged, and the test data such as the fault code and the state bit can be set in the corresponding test item, so that the analog sensor generates a fault signal (test signal) when the test item is triggered, and the processing capability of the ECU on the fault signal is obtained. In addition, compared with the related art, the time when the real sensor is triggered to send a signal cannot be accurately known, but the time when the analog sensor is triggered to send a signal can be accurately known, and then the speed of the ECU processing the signal can be accurately known.

[0030] Finally, compared with the real sensor generated signal, the application can generate test signal directly by skipping a series of processing logic required by the real sensor to generate test signal, which can accurately control the test data carried by the test signal, ensure the accuracy of the test data, and improve the accuracy and comprehensiveness of the ECU performance test without damaging the real sensor, and reduce the test cost.

[0031] These and other implementation manners of the application will be more apparent in the following description of the embodiments. BRIEF DESCRIPTION OF DRAWINGS

[0032] In order to more clearly illustrate the technical solutions in the embodiments of the application, the following will briefly introduce the drawings needed to be used in the embodiment description. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor.

[0033] Figure 1 A structural schematic diagram of a test system of an electronic controller provided by the embodiment of the application;

[0034] Figure 2 A flowchart of a test method of an electronic controller provided by the embodiment of the application;

[0035] Figure 3 A configuration interface schematic diagram of MCP_Configuration-data self-defined input of an analog sensor by a host computer provided by the embodiment of the application;

[0036] Figure 4 A configuration interface schematic diagram of MCP_Send_ch1ch2-message sending in a protocol by a host computer provided by the embodiment of the application;

[0037] Figure 5 A configuration interface schematic diagram of a fast frame signal value command-MCP_ch1 in a host computer provided by the embodiment of the application;

[0038] Figure 6 A simple schematic diagram of a recognition signal value result and a signal change fold line recognized by an ECU in a host computer provided by the embodiment of the application;

[0039] Figure 7 A configuration interface schematic diagram of a system time base command-MCP_Tick in a host computer provided by the embodiment of the application;

[0040] Figure 8A simple schematic diagram of Tick results and signal change fold lines identified by an upper computer for an ECU identification system time base command provided in an embodiment of the present application;

[0041] Figure 9 A configuration interface schematic diagram of a fault code and state bit command-MCP_ExData in an upper computer provided in an embodiment of the present application;

[0042] Figure 10 A simple schematic diagram of results and signal change fold lines identified by an upper computer for an ECU identification fault code and state bit command provided in an embodiment of the present application;

[0043] Figure 11 A configuration interface schematic diagram of an error check code command-MCP CrcSet in an upper computer provided in an embodiment of the present application;

[0044] Figure 12 A simple schematic diagram of results and signal change fold lines identified by an upper computer for an ECU identification error check code command provided in an embodiment of the present application;

[0045] Figure 13 A simple schematic diagram of FTTI related information displayed by an upper computer in an ECU functional safety provided in an embodiment of the present application;

[0046] Figure 14 A device schematic diagram of a test device of an electronic controller provided in an embodiment of the present application. DETAILED DESCRIPTION

[0047] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0048] It should be noted that the "connection" in the embodiments of the present application can be understood as an electrical connection, and the connection between two electrical elements can be a direct or indirect connection between the two electrical elements. For example, A and B are connected, which can be that A and B are directly connected, or A and B are indirectly connected through one or more other electrical elements, for example, A and B are connected, or A and C are directly connected, C and B are directly connected, and A and B are connected through C. In some scenarios, "connection" can also be understood as coupling, such as electromagnetic coupling between two inductors. In summary, A and B are connected, which can enable A and B to transmit electrical energy.

[0049] In the field of modern industry and automotive, the signal processing capability of electronic control unit is the core to ensure the reliability and performance of the system, and testing its performance is crucial to product quality. However, the existing testing method is limited by the signal generation characteristics of real sensors, and it is difficult to comprehensively and accurately evaluate the processing capability of electronic controller.

[0050] Specifically, real sensors are limited by their own characteristics and cannot generate maximum signal values or specific fault signals, resulting in that the test is difficult to cover all signal processing scenarios of the electronic controller and cannot test the extreme signal processing capability of the electronic controller. At the same time, the time when the real sensor generates the signal is difficult to accurately determine, which affects the accurate evaluation of the response speed of the electronic controller. In addition, the real sensor may cause signal deviation due to complex processing logic, which reduces the reliability of the test data.

[0051] In view of the above problems, the electronic controller test faces a core technical problem: how to break through the limitations of real sensors, flexibly generate test signals containing arbitrary test data, and accurately control the signal generation time to comprehensively evaluate the signal processing capability and response speed of the electronic controller. This problem specifically manifests as: first, the test signal containing the maximum signal value or specific fault code cannot be generated by the real sensor, which limits the comprehensive test of the performance of the electronic controller; second, the uncertainty of the signal generation time makes it difficult to accurately evaluate the processing speed of the electronic controller. These problems directly affect the coverage and data accuracy of the test, and a new testing method is needed to solve the limitations of real sensors in signal generation and improve the comprehensiveness and accuracy of the test.

[0052] In view of this, the embodiments of the present application provide a test system for an electronic controller. The electronic controller is connected to a real sensor through a real relay, the real sensor has the same function as the sensor actually used in the controller of the brake system, and the electronic controller is connected to a simulated sensor through a simulated relay. Figure 1 As shown in the test system for an electronic controller provided by the embodiments of the present application, the test system comprises a real sensor, a simulated sensor, a real relay, a simulated relay, an electronic controller, a test device and a test platform. Figure 1The 0x412x_KA28-0x412x_KA38 wiring shown on the left side of the middle left connects MCP_V+, MCP_V-, MCP_2, MCP_1, PSU_V+, PSU_V-, PSU_2, PSU_1, MPS_V+, and MPS_V- respectively. Among them, MPC and ECP in the real sensor respectively represent different pressure sensors, and MPS and PTS represent other sensors. The MPC as a real sensor can send signals to the MCP_1 of the ECU through the real relay 0x412x_KA47, and the analog sensor can send test signals to the PSU_1 of the ECU through the analog relay 0x412x_KA48. MCP_V+ and MCP_V- represent the power supply of the receiving end of the pressure sensor, PSU_V+ and PSU_V- represent the power supply of the receiving end of the other pressure sensor, MCP_2 and PSU_2 represent the redundant signal receiving end, and MPS_V+ and MPS_V- represent the power supply of the receiving end of other sensors. That is Figure 1 The left side of the middle circuit is the receiving signal end of the ECU, and the right side is the real / analog sensor end.

[0053] In one embodiment, the analog sensor model can be SENT 0x4000x, which has multiple pins containing multiple receiving ends and sending ends.

[0054] In one embodiment, two relays (one for connecting or disconnecting the ECU and the real sensor- real relay, and one for connecting or disconnecting the ECU and the analog sensor- analog relay) are used and are connected in series in the circuit between the ECU and the sensor. By default, the real relay between the ECU and the real sensor is closed, and the analog relay between the ECU and the analog sensor is disconnected. The host computer controls the closing / opening of the analog relay \ real relay by sending a control analog relay \ real relay board card instruction. For example, when the analog sensor needs to be tested, the real relay of the real sensor is disconnected, and the analog relay of the analog sensor is closed, so that the test of a specific scenario is realized by controlling the analog sensor. That is, the real sensor can also generate test signals after being triggered, but the application can selectively generate test signals from the real sensor when the processing logic execution process of the test item needs to include the real sensor. In the case that the processing logic execution of other real sensors may cause changes in test data, resulting in differences between the data in the test signal and the required test data, and in the case that the test data cannot be realized by the product characteristics of the real sensor, the analog sensor test can be used. In this way, the ECU performance can be tested and evaluated comprehensively and accurately.

[0055] Before testing using the analog sensor, that is, before controlling the analog relay to turn on the connection between the analog sensor and the electronic controller, the test items for configuring the analog sensor can be initialized, so that each test item generates a corresponding command when triggered to test the electronic controller.

[0056] Based on the above test system, an embodiment of the present application provides a test method flow of an electronic controller, as shown in Figure 2 The test method is applicable to a vehicle braking system, the electronic controller is connected with the analog sensor through the analog relay, and the test method comprises the following steps.

[0057] In step 201, the connection between the analog sensor and the electronic controller is controlled by the analog relay, the analog sensor contains one or more test items of pre-set signal value identification, system time base identification, fault code and state bit identification, and cyclic redundancy check code identification, and the test item contains test data.

[0058] In step 202, the corresponding test item in the analog sensor is triggered to generate a test signal, and the test signal is sent to the electronic controller, the test signal is used to test the signal processing performance of the electronic controller, and the test signal carries the test data of the corresponding test item.

[0059] In step 203, the electronic controller is evaluated according to the processing result of the electronic controller to the test signal, and an evaluation result is obtained, and the evaluation result is used to represent the signal processing performance quality of the electronic controller.

[0060] In one embodiment, before the corresponding test item in the analog sensor is triggered to generate a test signal in step 202, the connection between the real sensor and the electronic controller is controlled by the real relay to be disconnected.

[0061] In one embodiment, the analog sensor meets the requirements of SAE_J2716-2010 (format) & SAE_J2716-2016 protocol, and simultaneously opens the control interface of the test items such as tick time, status, data self-defined input, CRC self-defined rule, fast frame / slow frame and the like in the protocol, as shown below, and the manual or automatic monitoring control of the control interface of the analog sensor by the upper computer comprises:

[0062] MCP Start Stop_set: setting to start or stop some functions or operations in the test system.

[0063] MCP TickSize_Set: setting of tick time in the test system.

[0064] MCP_Slow_Clear: setting of clearing slow frame data in the test system.

[0065] MCP_Configuration: Settings in the test system about data custom input.

[0066] MCP_Slow_Config: Settings in the test system about fast frame / slow frame.

[0067] MCP_Listen_Set: Settings in the test system about listening mode.

[0068] MCP_Control: Settings in the test system about signal value sent conversion physical value coefficient.

[0069] MCP_Rx_Val: Settings in the test system about receiving end.

[0070] MCP_Send_ExData: Settings in the test system about sending data.

[0071] MCP_Send_ch1ch2: Settings in the test system about sent physical value in the protocol.

[0072] That is, the time point and control state of the control interface can be monitored by the host computer to realize the measurement of the ECU identification signal precision / fault and reaction time, etc.

[0073] In one embodiment, based on the above Figure 1 The test system and "manual or automatic monitoring control of the control interface of the host computer for the analog sensor", the specific operation process is exemplified by the MCP_1 sensor circuit (relay number 0x412x_KA48) in the control circuit, and the steps are as follows:

[0074] Send initialization configuration analog sensor command (including Tick time (system time base command), CRC (error check code command), signal value (fault code and status bit command, fast frame signal value command, etc.), as shown in Figure 3 Fig. 1 is a configuration interface schematic diagram of the host computer for the "MCP_Configuration-data custom input" of the analog sensor provided by the embodiment of the application, wherein the related data items include signal name, data byte, signal generator (including operable area), generator, original value, original progress value, physical value, physical progress value and annotation, etc. The testable test signals of each test item include:

[0075] MCP_Out_Polarity: Output high-low level effective setting of MCP sensor protocol.

[0076] MCP Tick: Bit time of MCP sensor protocol.

[0077] MCP_Loop_Trig: Output mode of MCP sensor protocol.

[0078] MCp_SensorClasse: Configuration of channel signal length of MCP sensor protocol.

[0079] MCP_Serial: Configuration of slow frame channel output mode of MCP sensor protocol.

[0080] MCP_BitConfig: Configuration of slow frame data bit type and length of MCP sensor protocol.

[0081] MCP_CrcSet: Configuration of crc check of MCP sensor protocol.

[0082] MCP_SyncTime: Configuration of synchronization time delay of MCP sensor protocol.

[0083] Corresponding physical value of each test signal (one of the test data):

[0084] MCP_Out_Polarity-[0] Orthophase: High level effective.

[0085] MCP Tick-[5] Tick=3us: Bit time is 3 microseconds.

[0086] MCP_Loop_Trig-[0] Loop_0ut: Periodic output.

[0087] MCp_SensorClasse-[0] Channel1 (12bit) + Channel2 (12bit): Channel 1 is 12bit + Channel 2 is 12bit.

[0088] MCP_Serial-[0] LongForm_18: 18 frames constitute 1 frame channel signal.

[0089] MCP_BitConfig-[0] c=0, D=8, Data=12: Type=0, ID=8bit, Data=12bit.

[0090] MCP_CrcSet-[0] General: General crc algorithm.

[0091] As Figure 4As shown in the figure, the configuration interface of the host computer for the message sending in the MCP_Send_ch1ch2-protocol of the analog sensor provided by the embodiment of the present application, which includes the signal name, data byte, signal generator (including the operable area), generator, original value, original progress value, physical value, physical progress value, and annotation, and other related data items. The test signal can be configured to include:

[0092] MCP_ch1: the data physical value of MCP fast frame channel 1.

[0093] MCP_ch2: the data physical value of MCP fast frame channel 2.

[0094] The above Figure 3 and Figure 4 Each column can be regarded as a test item. The test item can be manually or automatically changed in the parameters, types, and other related data, so as to trigger the analog sensor to generate the test signal reflecting the parameters, types, and other related data, and send the test signal to the ECU.

[0095] The embodiment of the present application provides a test method for the signal value recognition capability of the electronic controller. The triggered test item is the signal value recognition test item. In step 202, the corresponding test item in the analog sensor is triggered to generate the test signal, and the test signal is sent to the electronic controller, including: triggering the signal value recognition test item in the analog sensor to generate the fast frame signal value command, and sending the fast frame signal value command to the electronic controller;

[0096] In step 203, according to the processing result of the test signal of the electronic controller, the electronic controller is evaluated to obtain the evaluation result, including: obtaining the recognition signal value of the command signal value in the fast frame signal value command of the electronic controller, and obtaining the evaluation result according to the signal difference between the command signal value and the recognition signal value. The command signal value is any signal value in the executable signal value range of the fast frame signal value command.

[0097] In one embodiment, the signal value recognition accuracy of the test ECU (equivalence of functional safety / internal interface test) can trigger the signal value recognition test item in the analog sensor to generate the fast frame signal value command, and send the configured fast frame signal value command (such as Figure 5 As shown in the figure, the configuration interface of the host computer for the message sending in the MCP_Send_ch1ch2-protocol of the analog sensor provided by the embodiment of the present application, which includes the signal name, data byte, signal generator (including the operable area), generator, original value, original progress value, physical value, physical progress value, and annotation, and other related data items. The test signal can be configured to include: Figure 6As shown, a simple schematic diagram of the recognition signal value result and the signal change broken line (the broken line part of the figure represents the change of MCP_ch1, and Cdd represents the change of the signal (Cdd_HdyPres_MC1SampleInfo.ChannelPressureBar : the physical value variable of the signal of MCP channel 1 recognized by software) recognized by ECU) of the command of ECU recognition fast frame signal value provided by the embodiment of the application, the signal value 124.91 (recognition signal value) recognized by ECU meets the requirement, and then the ECU passes the test, and the column name: name represents the signal name, and the column name: Measurement cursor represents the signal value.

[0098] In this way, compared with the real sensor test method, due to the product characteristics, the maximum signal value in the real situation can only be about 0~50, which cannot meet the test item, and the simulation sensor can set any signal value, so as to test the ability of ECU to process any signal value in the corresponding command, and improve the test comprehensiveness.

[0099] The embodiment of the application provides a test method for system time base recognition capability of an electronic controller, and the triggered test item is a system time base recognition test item. In step 202, a test signal is generated in the simulation sensor according to the corresponding test item, and the test signal is sent to the electronic controller, including: a system time base command is generated in the simulation sensor according to the system time base recognition test item, and the system time base command is sent to the electronic controller.

[0100] In step 203, according to the processing result of the test signal of the electronic controller, the electronic controller is evaluated to obtain an evaluation result, including:

[0101] The recognition time base value of the system time base value in the system time base command of the electronic controller is obtained, and according to the time base difference between the system time base value and the recognition time base value, the evaluation result is obtained.

[0102] In one embodiment, the Tick time recognition (system time base recognition) of the ECU is tested, the system time base command-Tick time command is generated in the simulation sensor according to the system time base recognition test item, the configuration Tick time command (such as Figure 7 As shown, a configuration interface schematic diagram of the system time base command-MCP_Tick in the host computer provided by the embodiment of the application is shown, which is configured as 2.5us, and the system time base command is sent to the electronic controller, and whether the ECU recognizes the Tick time exception and reports a fault is monitored, such as Figure 8As shown, a simple schematic diagram of the Tick result of the ECU identification system time base command and the identified signal change fold line provided by the embodiment of the application is provided, the ECU identifies signal abnormal fault, meets the requirements, and the test passes.

[0103] wherein, Figure 8 The related content meaning description in the embodiment is as follows:

[0104] Measurement cursor: measurement line cursor.

[0105] MCP_Tick = Tick = 2.5us: MCP sensor bit time is equal to 2.5 microseconds.

[0106] Dem_FaultMemory.DetailFault._0_.FaultId = e_Flt_MC1HydPressSignalDataFault (the 0th fault record shows that the pressure sensor MCP1 data error fault is reported).

[0107] Dem_FaultMemory.DetailFault._0_.FaultStatus = 175 (the 0th fault record shows that the current fault is displayed under the fault status).

[0108] Dem_FaultMemory.DetailFault._1_.FaultId = e_Flt_MC1HydPressSignalDataFault (the 1st fault record shows that the pressure sensor MCP1 data error fault is reported).

[0109] Dem_FaultMemory.DetailFault._1_.FaultStatus = 47 (the 1st fault record shows that the current fault is displayed under the fault status).

[0110] In the above method, compared with the test by using the real sensor, due to the characteristics of the real sensor chip, only normal signal Tick time 3us can be sent all the time, which cannot meet the test item, and the Tick time can be randomly configured in the application.

[0111] The embodiment of the application provides a test method for the fault code and state bit identification ability of an electronic controller. The triggered test item is a fault code and state bit identification test item. In step 202, a test signal is generated in the corresponding test item in the simulation sensor, and the test signal is sent to the electronic controller. The method comprises the following steps: triggering the fault code and state bit identification test item in the simulation sensor to generate a fault code and state bit command, and sending the fault code and state bit command to the electronic controller.

[0112] In step 203, the electronic controller is evaluated according to the processing result of the test signal, and an evaluation result is obtained, including: obtaining the fault identification result of the electronic controller to the fault code and status bit command, and evaluating the electronic controller according to the fault identification result to obtain the evaluation result.

[0113] In one embodiment, the test ECU slow frame fault code and status bit identification - fault code and status bit identification (functional safety fault injection / error guessing method test) is performed, and the configuration fault code and status bit command (such as Figure 9 As shown in the figure, the configuration interface of the fault code and status bit command - MCP_ExData provided by the embodiment of the application in the host computer is provided, for example, the fault code is configured as 2064 (0x810h), and the status bit is configured as 1 error. The ECU identifies the abnormality and whether to report the fault, and the ECU identifies the abnormality and whether to report the fault, as shown in the figure. Figure 10 As shown in the figure, the configuration interface of the fault code and status bit command - MCP_ExData provided by the embodiment of the application in the host computer is provided, for example, the fault code is configured as 2064 (0x810h), and the status bit is configured as 1 error. The ECU identifies the abnormality and whether to report the fault, and the ECU identifies the abnormality and whether to report the fault, as shown in the figure.

[0114] Among them, Figure 9 Among them,

[0115] MCP_Ex_ID: Set the MCP slow frame channel.

[0116] MMCP_ExData: Set the MCP slow frame channel original value.

[0117] MCP_Er: Set the MCP slow frame channel error status bit.

[0118] Figure 10 Among them,

[0119] Measurement cursor: Measurement line cursor.

[0120] MCP_ExData = 0810h: Set the MCP slow frame channel original value to 2064 (0x810h).

[0121] MCP_Er = 1: Set the MCP slow frame channel error status bit to 1 error.

[0122] Dem_FaultMemory.DetailFault._0_.FaultId = e_Flt_MC1HydPressSignalDataFault (The 0th fault record is displayed as reporting a pressure sensor MCP1 data error fault).

[0123] Dem_FaultMemory.DetailFault._0_.FaultStatus = 175 (the 0th fault record shows as the current fault under the fault status).

[0124] Dem_FaultMemory.DetailFault._1_.FaultId = e_Flt_MC1HydPressGeneralASICSignalFault (the 1st fault record shows as the pressure sensor MCP1 chip fault fault).

[0125] Dem_FaultMemory.DetailFault._1_.FaultStatus = 175 (the 1st fault record shows as the current fault under the fault status).

[0126] Compared with the real sensor test method, the real sensor component needs to be damaged (short circuit / open circuit / power supply abnormality / removal of components, etc.), the test cost is high, and the repeated test condition is not met. The application does not need to damage the sensor, and can complete the test and can be repeated at no cost.

[0127] The embodiment of the application provides a test method for the cyclic redundancy check code identification capability of an electronic controller. The triggered test item is a cyclic redundancy check code identification test item. In step 202, a corresponding test item in the simulation sensor is triggered to generate a test signal, and the test signal is sent to the electronic controller, including: triggering the cyclic redundancy check code identification test item in the simulation sensor to generate an error check code command, and sending the error check code command to the electronic controller;

[0128] In step 203, the electronic controller is evaluated according to the processing result of the test signal, and an evaluation result is obtained, including: obtaining an abnormal identification result of the error check code command of the electronic controller, and evaluating the electronic controller according to the abnormal identification result to obtain an evaluation result.

[0129] In one embodiment, in the test of CRC (cyclic redundancy check code) error identification (function safety fault injection / error guessing method test), a configuration error CRC command-error check code command is sent (for example, as shown in Figure 11 The configuration interface schematic diagram of the host computer for the error check code command-MCP CrcSet provided by the embodiment of the application is configured as Add0000_Crc, and whether the ECU identifies an abnormality and reports a fault is monitored, as shown in Figure 12As shown, a simple schematic diagram of the result of the host computer command for ECU identification error check code and the identified signal change broken line provided by the embodiment of the application is shown, the ECU identifies signal abnormal fault, meets the requirement, and the test passes.

[0130] wherein, Figure 12 The change broken line part involves:

[0131] Measurement cursor: measurement line cursor.

[0132] MCP CrcSet: Add0000_Crc: Configure the crc calculation value of the error.

[0133] Dem_FaultMemory.DetailFault._0_.FaultId=e_Flt_MC1HydPressSignalDataFault (The 0th fault record shows that the pressure sensor MCP1 data error fault is reported).

[0134] Dem_FaultMemory.DetailFault._0_.FaultStatus=175 (The 0th fault record shows that the current fault is displayed in the state).

[0135] Dem_FaultMemory.DetailFault._1_.FaultId=e_Flt_MC2HydPressSignalDataFault (The 1st fault record shows that the pressure sensor MCP2 data error fault is reported).

[0136] Dem_FaultMemory.DetailFault._1_.FaultStatus=175 (The 1st fault record shows that the current fault is displayed in the state).

[0137] In the above method, compared with the real sensor test, due to the characteristics of the real sensor chip, the normal CRC is always sent and cannot be externally modified, so the test item cannot be met, but the application can be modified arbitrarily to obtain the CRC-error CRC command of the fault abnormality and obtain the ECU identification result.

[0138] The embodiment of the application provides a test method for the cyclic redundancy check code identification ability of an electronic controller, and further comprises:

[0139] Record the fault injection time point of the error check code command, collect the abnormal fault time point of the abnormal identification result obtained by the electronic controller, evaluate the electronic controller according to the time difference between the fault injection time point and the abnormal fault time point, and obtain an evaluation result.

[0140] In one embodiment, in addition to the advantages of being able to simulate the fault signal without damaging the components, the maximum and minimum signals of the sensor can also be simulated compared to using real sensor testing, thereby improving the signal value test coverage, including but not limited to functional safety FTTI / FDTI / fault injection / error guessing method tests. For example, test CRC error recognition, send a configuration error CRC command as the fault injection time starting point T0, monitor the ECU to identify the signal abnormality fault time point T1, calculate the FTTI time = T1-T0 = 0.003375s, which meets the FTTI requirement of ≤250ms, and the test passes, as shown in Figure 13 A simple schematic diagram of an upper computer displaying FTTI related information in ECU functional safety is provided in the embodiment of the application.

[0141] As can be seen, using analog sensor testing can meet most functional safety tests, and the fault injection / error guessing method test can be performed without damaging the real sensor, thereby reducing the test cost to some extent. And as the maturity of functional safety development increases, the feasibility of future boundary value, interface consistency, robustness, performance testing, stress testing and other implementations is increased. On the other hand, using real sensors cannot completely cover most functional safety tests. Secondly, subsequent custom configuration of analog sensors can be performed according to different project or sensor protocols, reducing the configuration of the test environment / conditions, laying a foundation for the update and iteration of new projects in the later stage. At the same time, it also increases the feasibility of subsequent interface debugging for underlying interface developers.

[0142] Based on the same concept, the embodiment of the application provides a test device of an electronic controller, as shown in Figure 14 The electronic controller is connected to the analog sensor through the analog relay, and the test device comprises:

[0143] A control unit 1401 is configured to control the analog relay to turn on the connection between the analog sensor and the electronic controller, and the analog sensor comprises one or more test items of pre-set signal value recognition, system time base recognition, fault code and state bit recognition, and cyclic redundancy check code recognition.

[0144] A first test unit 1402 is configured to trigger the corresponding test item in the analog sensor to generate a test signal, and send the test signal to the electronic controller, wherein the test signal is used to test the signal processing performance of the electronic controller.

[0145] The second test unit 1403 is configured to evaluate the electronic controller according to a processing result of the test signal of the electronic controller, and obtain an evaluation result, where the evaluation result is used to represent a signal processing performance quality of the electronic controller.

[0146] Optionally, the triggered test item is a signal value identification test item, and the first test unit 1402 is specifically configured to:

[0147] The first test unit 1402 is specifically configured to trigger the signal value identification test item in the analog sensor to generate a fast frame signal value command, and send the fast frame signal value command to the electronic controller.

[0148] The second test unit 1403 is specifically configured to obtain an identified signal value of the electronic controller for a command signal value in the fast frame signal value command, and obtain the evaluation result according to a signal difference between the command signal value and the identified signal value, where the command signal value is any signal value in a signal value range that can be executed by the fast frame signal value command.

[0149] Optionally, the triggered test item is a system time base identification test item, and the first test unit 1402 is specifically configured to trigger the system time base identification test item in the analog sensor to generate a system time base command, and send the system time base command to the electronic controller.

[0150] The second test unit 1403 is specifically configured to obtain an identified time base value of the electronic controller for a system time base value in the system time base command, and obtain the evaluation result according to a time base difference between the system time base value and the identified time base value.

[0151] Optionally, the triggered test item is a fault code and state bit identification test item, and the first test unit 1402 is specifically configured to trigger the fault code and state bit identification test item in the analog sensor to generate a fault code and state bit command, and send the fault code and state bit command to the electronic controller.

[0152] The second test unit 1403 is specifically configured to obtain a fault identification result of the electronic controller for the fault code and state bit command, and evaluate the electronic controller according to the fault identification result, and obtain an evaluation result.

[0153] Optionally, the triggered test item is a cyclic redundancy check code identification test item, and the first test unit 1402 is specifically configured to trigger the cyclic redundancy check code identification test item in the analog sensor to generate an error check code command, and send the error check code command to the electronic controller.

[0154] The second test unit 1403 is specifically configured to acquire an exception identification result of the electronic controller to the error check code command, and evaluate the electronic controller according to the exception identification result to obtain an evaluation result.

[0155] Optionally, the second test unit 1403 is further configured to record a fault injection time point of sending the error check code command, collect an exception fault time point of the electronic controller obtaining the exception identification result, and evaluate the electronic controller according to a time difference between the fault injection time point and the exception fault time point to obtain an evaluation result.

[0156] Optionally, the electronic controller is connected with a real sensor through a real relay, the real sensor has the same function as a sensor actually used by a controller in a brake system, and the control unit 1401 is further configured to control the real relay to disconnect the connection between the real sensor and the electronic controller.

[0157] Optionally, the first test unit 1402 is further configured to initialize each test item of the simulation sensor, so that each test item generates a corresponding command when triggered to test the electronic controller.

[0158] Those skilled in the art should understand that embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROMs, optical storage devices, etc.) containing computer-usable program code.

[0159] The present application is described with reference to flowcharts and / or block diagrams of the method, device (system), and computer program product according to the present application. It should be understood that each flow and / or block in the flowcharts and / or block diagrams, and the combination of the flows and / or blocks in the flowcharts and / or block diagrams can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing devices generate a means for implementing the functions specified in the flowcharts and / or block diagrams. Figure 1 The functions specified in one flow or multiple flows and / or blocks Figure 1 The functions specified in one flow or multiple flows and / or blocks

[0160] These computer program instructions can also be stored in a computer readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer readable memory produce an article of manufacture including instructions which implement the flow Figure 1 The flow or flows and / or blocks Figure 1 The flow or flows and / or blocks

[0161] These computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions that execute on the computer or other programmable apparatus provide steps for implementing the flow Figure 1 The flow or flows and / or blocks Figure 1 The flow or flows and / or blocks

[0162] Obviously, numerous modifications and variations of the present application are possible in light of the above teachings. It is therefore to be understood that within the scope of the appended claims and their equivalents, the application can be practiced otherwise than as specifically described.

Claims

1. A method of testing an electronic controller, characterized by, The application is suitable for vehicle braking system, the electronic controller is connected with analog sensor through analog relay, the method comprises: Controlling the analog relay to connect the analog sensor and the electronic controller, the analog sensor contains one or more test items of preset signal value identification, system time base identification, fault code and state bit identification and cyclic redundancy check code identification, the test items contain test data; Triggering the corresponding test item in the analog sensor to generate test signal, and sending the test signal to the electronic controller, the test signal is used for testing the signal processing performance of the electronic controller, and the test signal carries the test data of the corresponding test item; According to the processing result of the test signal of the electronic controller, the electronic controller is evaluated to obtain an evaluation result, and the evaluation result is used for characterizing the signal processing performance quality of the electronic controller; The analog sensor is configured to comply with SAEJ2716-2010 format and SAEJ2716-2016 protocol specification, and provides control interface of a plurality of test items in the protocol; The test items include tick time, status, data self-defined input, CRC check rule and fast frame / slow frame mode; The time point and control state of the control interface are manually or automatically monitored and controlled; When the triggered test item is the signal value identification test item, the triggering the corresponding test item in the analog sensor to generate test signal, and sending the test signal to the electronic controller, comprises: Triggering the signal value identification test item in the analog sensor to generate fast frame signal value command, and sending the fast frame signal value command to the electronic controller; The evaluation result is obtained according to the signal difference between the command signal value and the identification signal value, and the command signal value is any signal value in the executable signal value range of the fast frame signal value command. The triggered test item is the system time base identification test item, the triggering the corresponding test item in the analog sensor to generate test signal, and sending the test signal to the electronic controller, comprises:

2. The method as claimed in claim 1, characterized in that, Triggering the system time base identification test item in the analog sensor to generate system time base command, and sending the system time base command to the electronic controller; The evaluation result is obtained according to the time base difference between the system time base value and the identification time base value. The triggered test item is the fault code and state bit identification test item, the triggering the corresponding test item in the analog sensor to generate test signal, and sending the test signal to the electronic controller, comprises: ​ 3. The method as claimed in claim 1, wherein, ​ triggering a fault code and status bit identification test item in the analog sensor to generate a fault code and status bit command, and sending the fault code and status bit command to the electronic controller; the evaluation result of the electronic controller according to the processing result of the test signal, including: obtaining the fault identification result of the electronic controller to the fault code and status bit command, and evaluating the electronic controller according to the fault identification result to obtain the evaluation result.

4. The method as claimed in claim 1, wherein, The triggered test item is a cyclic redundancy check code identification test item, and the triggering of the corresponding test item in the analog sensor to generate a test signal and the sending of the test signal to the electronic controller include: triggering a cyclic redundancy check code identification test item in the analog sensor to generate an error check code command, and sending the error check code command to the electronic controller; the evaluation result of the electronic controller according to the processing result of the test signal, including: obtaining the fault identification result of the electronic controller to the fault code and status bit command, and evaluating the electronic controller according to the fault identification result to obtain the evaluation result.

5. The method as claimed in claim 4, characterized in that, Further comprising: record the fault injection time point of sending the error check code command, and collect the abnormal fault time point of the electronic controller obtaining the abnormal identification result, and evaluate the electronic controller according to the time difference between the fault injection time point and the abnormal fault time point to obtain the evaluation result.

6. The method of any one of claims 1-5, wherein, The electronic controller is connected with a real sensor through a real relay, the real sensor has the same function as the sensor actually used in the controller of the brake system, Before the triggering of the corresponding test item in the analog sensor to generate a test signal, further comprising: controlling the real relay to disconnect the connection between the real sensor and the electronic controller.

7. The method of any one of claims 1-5, wherein, Before the control of the analog relay to connect the connection between the analog sensor and the electronic controller, further comprising: initializing and configuring each test item of the analog sensor, so that each test item generates a corresponding command when triggered to test the electronic controller.

8. A test apparatus for an electronic controller, characterized by The test device is suitable for a vehicle brake system, the electronic controller is connected with an analog sensor through an analog relay, and the test device comprises: a control unit for controlling the analog relay to connect the connection between the analog sensor and the electronic controller, the analog sensor comprising one or more of the following test items: pre-set signal value identification, system time base identification, fault code and status bit identification, and cyclic redundancy check code identification; a first test unit for triggering the corresponding test item in the analog sensor to generate a test signal, and sending the test signal to the electronic controller, the test signal being used to test the signal processing performance of the electronic controller; a second test unit for evaluating the electronic controller according to the processing result of the test signal, and obtaining an evaluation result, wherein the evaluation result is used to represent the quality of the signal processing performance of the electronic controller; The analog sensor is configured to conform to the SAE J2716-2010 format and the SAE J2716-2016 protocol specification, and provide a control interface of a plurality of test items in the protocol; the test items include tick time, status, data self-defined input, CRC check rule and fast frame / slow frame mode; time points and control states of the control interface are manually or automatically monitored and controlled; When the triggered test item is the signal value identification test item, the first test unit is specifically used for: triggering the signal value identification test item in the analog sensor to generate a fast frame signal value command, and sending the fast frame signal value command to the electronic controller; The second test unit is specifically used for: obtaining an identification signal value of a command signal value in the fast frame signal value command by the electronic controller, and obtaining the evaluation result according to a signal difference between the command signal value and the identification signal value, the command signal value being any signal value in a signal value range executable by the fast frame signal value command.

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