Composite insulator silicone rubber ultraviolet ray and high and low temperature aging test device

Abstract

The invention discloses a composite insulator silicone rubber ultraviolet ray and high and low temperature aging test device, and relates to the aging test technology field, the composite insulator silicone rubber ultraviolet ray and high and low temperature aging test device comprises an aging test box body and an ultraviolet ray lamp, the aging test box body is internally provided with a high temperature cabin and a low temperature cabin, and the middle part of the aging test box body is provided with a semiconductor refrigeration sheet; a split type heat insulation inner bin is arranged in the aging test box body, transfer openings and telescopic partition plates are arranged on the left side and the right side of the fixed partition plate, and the heat insulation inner bin and the sample supporting frame rotate between the high-temperature bin and the low-temperature bin for detection through the transfer openings when unfolded. The device is provided with a double-layer heat insulation structure, the stability of a test environment is ensured, the problem that the traditional single-bin temperature change response speed is slow is avoided by matching with double-bin switching while equipment miniaturization is kept through semiconductor chilling plate integration, the higher temperature alternating speed is achieved by combining the switching design of the movable top cover, and the test efficiency is improved. And efficient collaborative testing of multi-factor aging of a miniaturized structure is realized, and ultraviolet rays and heat loss are reduced.

Description

Technical Field

[0001] This invention relates to the field of aging testing technology, specifically to a device for testing the ultraviolet and high / low temperature aging of composite insulator silicone rubber. Background Technology

[0002] In power systems, insulators are used to support and isolate high-voltage conductors. For a long time, porcelain or glass insulators have dominated the market. However, with the development of synthetic materials, such as silicone rubber synthetic insulators, they have gradually become more popular due to their advantages. Composite insulators have advantages such as high strength, light weight, high voltage resistance, easy maintenance, and resistance to breakage, which has led to their widespread use in high-voltage lines. However, the aging resistance of composite insulators is not as good as that of traditional materials, which limits their service life.

[0003] The main factors causing composite insulator aging include solar ultraviolet radiation, high and low temperature changes, pollution, and corona discharge. Currently, most composite insulator aging test equipment on the market is a single-chamber design, such as ultraviolet aging chambers and high and low temperature test chambers. Some high-end environmental test chambers, such as those from Germany's Binder and the United States' Q-Lab, support temperature and humidity cycling and light exposure combined tests. However, these usually require manual sample transfer or the use of complex external robotic arm systems, using multiple independent chambers in conjunction with mechanical transfer. Some high and low temperature aging tests use two sets of equipment simultaneously, occupying a large space. Moreover, the ultraviolet and temperature control equipment inside the equipment is actually far from the sample, resulting in significant losses during ultraviolet irradiation and temperature control. Considering the small volume of actual composite insulator test samples, this approach is somewhat inefficient. There is also a modular high and low temperature aging test chamber, such as CN115414979B, which has only one chamber. The temperature and humidity changes inside the chamber are controlled by a control device. However, it cannot conduct high and low temperature aging experiments simultaneously and is also limited by factors such as volume. The temperature switching speed through a single chamber is slow. In view of this, in-depth research was conducted on the above issues, which led to the creation of this case. Summary of the Invention

[0004] The purpose of this invention is to provide a composite insulator silicone rubber ultraviolet and high and low temperature aging test device to solve the problem mentioned in the background art of the lack of a miniaturized and flexible testing device for insulator aging.

[0005] To achieve the above objectives, the present invention provides the following technical solution: a composite insulator silicone rubber ultraviolet and high and low temperature aging test device, comprising an aging test chamber and an ultraviolet lamp; The aging test chamber is a vertical cylindrical structure, with a high-temperature chamber at the front and a low-temperature chamber at the back, and a fixed partition is installed between the high-temperature chamber and the low-temperature chamber. A semiconductor cooling chip is installed in the middle of the fixed partition, and the aging test chamber is equipped with a split heat-insulating inner chamber. The heat-insulating inner chamber forms a folding and unfolding structure in front of and behind the fixed partition, and sample support frames are provided in front of and behind the fixed partition. The ultraviolet lamp and the sample support frames are located inside the heat-insulating inner chamber. When the heat-insulating inner chamber is folded up, it fits against the fixed partition to form a closed inner chamber. The fixed partition is equipped with transfer ports and telescopic partitions on both the left and right sides. When the heat-insulated inner chamber and sample support frame are unfolded, they can rotate and switch between the high-temperature chamber and the low-temperature chamber for testing through the transfer ports.

[0006] Preferably, the fixed partition has telescopic grooves on both the left and right sides, and the telescopic partition forms a telescopic structure between the telescopic grooves and the transfer port.

[0007] Using the above technical solution, a fixed partition is used in conjunction with a telescopic partition to isolate the high-temperature chamber and the low-temperature chamber. At the same time, the movable telescopic partition facilitates the rapid transfer of samples from the insulated inner chamber and the sample support frame through the transfer port, which is convenient for rapid high and low temperature alternating heating and cooling testing.

[0008] Preferably, the inner wall surfaces of the fixed partition, the telescopic partition, the heat-insulating inner chamber, and the aging test chamber are all provided with a heat insulation layer, and the surface of the heat insulation layer inside the heat-insulating inner chamber is provided with polished aluminum foil.

[0009] The above technical solution uses an insulated inner chamber to form a double-layer insulation structure with the aging test chamber. The internal structure of the insulated inner chamber is more compact, and the small space structure facilitates rapid temperature control. At the same time, the close-range irradiation of the ultraviolet lamp reduces ultraviolet loss, reducing the detection power while facilitating rapid and stable testing.

[0010] Preferably, the hot end and cold end of the semiconductor cooling chip face the high-temperature chamber and the low-temperature chamber respectively, and heat exchange fins and a fan are provided on the surface of both the hot end and the cold end of the semiconductor cooling chip.

[0011] The above technical solution directly utilizes the hot and cold ends of the semiconductor cooling chip for efficient heat exchange, while simultaneously enabling high and low temperature settings for the high-temperature and low-temperature chambers. The fan accelerates air circulation, improves heat exchange efficiency, ensures stable temperatures in the high-temperature and low-temperature chambers, and guarantees rapid switching and uniform temperature alternation detection of samples in different temperature zones.

[0012] Preferably, the fans are arranged in pairs on the left and right sides of the heat-insulated inner chamber, and the airflow of the two fans is opposite, and the air in the heat-insulated inner chamber and the heat exchange fins forms a circulating airflow through the fans.

[0013] By adopting the above technical solution, optimizing the fan layout, forming a circulating airflow, further improving heat exchange efficiency, ensuring the uniformity of temperature inside the insulated inner chamber, ensuring stable testing of samples in the high and low temperature environments of the high-temperature chamber and the low-temperature chamber, and improving the accuracy and reliability of test results.

[0014] Preferably, each of the sample support frame, telescopic partition and heat-insulating inner chamber is provided with a movable connector at its upper end. The aging test chamber is provided with a movable top cover, and the bottom of the movable top cover is provided with a radial adjustment groove corresponding to the movable connector. The movable connector forms an adjustable structure for unfolding and retracting along the adjustment groove.

[0015] Using the above technical solution, the movable connector is adjusted along the adjustment groove, which enables flexible adjustment of the sample support frame, telescopic partition and heat-insulated inner chamber to unfold and retract. On the one hand, it facilitates stable testing in a compact space, and on the other hand, it facilitates flexible switching between high-temperature chamber and low-temperature chamber after unfolding and bypassing the transfer port.

[0016] Preferably, the movable top cover is provided with an adjusting turntable inside, and the surface of the adjusting turntable is provided with a guide groove corresponding to the movable connecting member; The upper end of the movable connector is integrally provided with a guide column, and the guide column forms a sliding structure along the guide groove. The guide chute includes a first guide chute and a second guide chute, with the first guide chute corresponding to the top of the heat-insulated inner chamber and the sample support frame, and the second guide chute corresponding to the top of the telescopic partition. Both the first guide chute and the second guide chute are inclined relative to the adjustment chute, and the inclination directions of the first guide chute and the second guide chute are opposite.

[0017] Using the above technical solution, by adjusting the turntable, the movable column is guided to move precisely in the first and second guide grooves. The sliding trajectory of the movable column corresponds to the radial sliding trajectory of the movable connector at the adjustment groove, forming a multi-dimensional adjustment mechanism. When the adjustment turntable rotates, the heat-insulating inner chamber and sample support frame unfold, and the telescopic partition retracts. At this time, the movable top cover can be rotated to rotate the sample support frame and switch the detection area. When the adjustment turntable rotates in the opposite direction, the heat-insulating inner chamber and sample support frame retract, and the telescopic partition unfolds, thus reconstructing a double-layer closed heat-insulating detection space.

[0018] Preferably, the inner ring of the adjusting turntable is provided with a transmission tooth groove, an adjusting knob is provided above the movable top cover, and a meshing gear is provided at the lower end of the adjusting knob. The meshing gear and the transmission tooth groove constitute a meshing transmission structure.

[0019] Using the above technical solution, when the adjustment knob is rotated, the meshing gear drives the transmission gear groove to rotate synchronously, thereby controlling the rotation of the adjustment turntable, so that the movable connecting part slides and adjusts under the cooperation of the guide slide groove and the adjustment slide groove, realizing the switching of the detection space.

[0020] Preferably, a handle is provided on the top of the movable top cover.

[0021] By adopting the above technical solution, the equipment is miniaturized and compact in structure. The handle facilitates the movement of the equipment and also allows for easy rotation of the movable top cover, which facilitates the switching and adjustment of the testing space.

[0022] Preferably, the aging test chamber is provided with a sealed switch door on the front, and both the aging test chamber and the sealed switch door are double-layer heat insulation structures.

[0023] By adopting the above technical solution, the expandable and closable structure of the heat-insulated inner chamber can be easily matched with the sealed opening and closing door to form a good double-layer sealed heat-insulating structure when conducting closed testing, without affecting the placement and removal of the test items.

[0024] Compared with the prior art, the beneficial effects of the present invention are as follows: The composite insulator silicone rubber ultraviolet and high and low temperature aging test device is equipped with a double-layer heat insulation structure to ensure a stable test environment. By integrating a semiconductor cooling chip, the complexity of the compressor refrigerant system is avoided, and the device is kept small. At the same time, the dual-compartment switching avoids the problem of slow temperature change response speed in traditional single-compartment devices. Combined with the movable top cover design, the double-layer heat insulation structure does not affect the rapid switching and transfer of the test area, achieving a faster temperature alternation rate. This enables efficient and coordinated testing of multi-factor aging in a small structure, improves the portability of the device, and reduces ultraviolet and heat loss.

[0025] The design, through the interplay of the movable top cover, adjusting turntable, guide chute, and adjustment chute, simplifies and flexibly facilitates the unfolding and retraction of the insulated inner chamber, sample support frame, and telescopic partition. When switching testing areas, the operator simply rotates the adjusting knob. The meshing gears and transmission grooves drive the adjusting turntable, guiding the movable column to slide in the first and second guide grooves, achieving radial sliding adjustment of the movable connector within the adjustment chute. This design not only ensures that the insulated inner chamber and sample support frame can smoothly bypass the transfer port during unfolding, flexibly switching between high-temperature and low-temperature chambers, but also guarantees that when retracted, they can cooperate with the telescopic partition to reconstruct a double-layered enclosed insulated testing space. Furthermore, the movable top cover design also considers the equipment's portability and ease of use. The handle allows the operator to easily move the entire device or rotate the entire movable top cover when needed to switch testing spaces. This design makes the equipment more flexible and convenient to use, while also improving its portability and applicability.

[0026] In summary, this composite insulator silicone rubber UV and high / low temperature aging testing device achieves efficient and coordinated testing of multi-factor aging in a miniaturized structure through a series of ingenious designs. Its double-layer thermal insulation structure ensures the stability of the testing environment, the integration of the semiconductor cooling chip avoids the complexity of the compressor refrigerant system, and the design of the movable top cover and guide slides makes the switching and transfer of testing areas faster and more flexible. These features together give this device significant advantages and promising application prospects in the field of aging testing of composite insulator silicone rubber. Attached Figure Description

[0027] Figure 1 This is a schematic diagram of the internal structure of the movable top cover of the present invention; Figure 2 For the present invention Figure 1 Enlarged structural diagram at point a; Figure 3 This is a schematic diagram of the heat-insulating inner compartment retractable structure of the present invention; Figure 4 This is a schematic diagram of the unfolded structure of the heat-insulating inner chamber of the present invention; Figure 5 This is a schematic diagram of the fixed partition and semiconductor cooling chip structure of the present invention; Figure 6 This is a schematic diagram of the heat-insulating inner chamber structure of the present invention; Figure 7 This is a schematic diagram of the movable top cover and adjusting turntable structure of the present invention; Figure 8 This is a schematic diagram of the structure of the adjusting turntable rotating relative to the movable top cover of the present invention; Figure 9 This is a schematic diagram of the overall structure of the present invention; Figure 10 This is a schematic diagram of the overall structure of the present invention from another perspective.

[0028] In the diagram: 1. Aging test chamber; 2. Ultraviolet lamp; 3. High-temperature chamber; 4. Low-temperature chamber; 5. Fixed partition; 6. Semiconductor cooling chip; 7. Insulated inner chamber; 8. Sample support frame; 9. Transfer port; 10. Telescopic partition; 11. Telescopic movable groove; 12. Insulation layer; 13. Heat exchange fins; 14. Fan; 15. Movable top cover; 16. Movable connector; 161. Guide movable column; 17. Adjustment slide; 18. Adjustment turntable; 181. Transmission gear groove; 19. Guide slide; 191. First guide groove; 192. Second guide groove; 20. Adjustment knob; 21. Meshing gear; 22. Handle; 23. Sealed switch door. Detailed Implementation

[0029] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0030] Example 1, please refer to Figures 1-10 This invention provides a technical solution: a composite insulator silicone rubber ultraviolet and high / low temperature aging test device, comprising an aging test chamber 1 and an ultraviolet lamp 2; the aging test chamber 1 is a vertical cylindrical structure, and the front and rear of the aging test chamber 1 are respectively a high-temperature chamber 3 and a low-temperature chamber 4, with a fixed partition 5 installed between the high-temperature chamber 3 and the low-temperature chamber 4; a semiconductor cooling chip 6 is installed in the middle of the fixed partition 5, with the hot end and cold end of the semiconductor cooling chip 6 facing the high-temperature chamber 3 and the low-temperature chamber 4 respectively, and as shown... Figure 5 The hot and cold ends of the thermoelectric cooler 6 shown are equipped with heat exchange fins 13 and fans 14. Efficient heat exchange is achieved directly between the hot and cold ends of the thermoelectric cooler 6, simultaneously enabling high and low temperature settings in the high-temperature chamber 3 and the low-temperature chamber 4. Fans 14 accelerate airflow, improving heat exchange efficiency and ensuring temperature stability in both chambers, guaranteeing rapid switching and uniform temperature alternation testing of the sample across different temperature zones. Fans 14 are arranged in pairs on the left and right sides of the insulated inner chamber 7, with opposite airflow directions, creating a circulating airflow between the insulated inner chamber 7 and the heat exchange fins 13. Optimizing the fan 14 layout and forming a circulating airflow further improves heat exchange efficiency, ensures temperature uniformity within the insulated inner chamber 7, guarantees stable testing of the sample in the high and low temperature environments of the high-temperature chamber 3 and the low-temperature chamber 4, and improves the accuracy and reliability of the test results.

[0031] Combination Figures 3-4As shown, the aging test chamber 1 has a split-type insulated inner chamber 7. The insulated inner chamber 7 forms a retractable and expandable structure before and after the fixed partition 5, and sample support frames 8 are provided before and after the fixed partition 5. The ultraviolet lamp 2 and the sample support frames 8 are both located inside the insulated inner chamber 7. When the insulated inner chamber 7 is retracted, it fits against the fixed partition 5 to form a closed inner chamber. Each split structure of the sample support frame 8, the telescopic partition 10, and the insulated inner chamber 7 is provided with a movable connector 16 at its upper end. A movable top cover 15 is provided on the top of the aging test chamber 1, and the bottom of the movable top cover 15 has radial adjustment grooves 17 corresponding to the movable connectors 16. The movable connectors 16 form an adjustable structure for expansion and retraction along the adjustment grooves 17. The movable connectors 16 are adjusted along the adjustment grooves 17 to realize flexible adjustment of the expansion and retraction of the sample support frame 8, the telescopic partition 10, and the insulated inner chamber 7, which facilitates stable testing in a compact space. On the other hand, it can also facilitate flexible switching between the high-temperature chamber 3 and the low-temperature chamber 4 after expansion, bypassing the transfer port 9.

[0032] The fixed partition 5 has transfer ports 9 and telescopic partitions 10 on both its left and right sides. Telescopic grooves 11 are also provided on both sides of the fixed partition 5, and the telescopic partitions 10 form a telescopic structure between the telescopic grooves 11 and the transfer ports 9. When the insulated inner chamber 7 and the sample support frame 8 are unfolded, they rotate and switch between the high-temperature chamber 3 and the low-temperature chamber 4 through the transfer ports 9. The fixed partition 5, in conjunction with the telescopic partitions 10, isolates the high-temperature chamber 3 and the low-temperature chamber 4. Simultaneously, the movable telescopic partitions 10 facilitate rapid transfer of samples from the insulated inner chamber 7 and the sample support frame 8 through the transfer ports 9, enabling rapid high and low temperature alternating temperature testing.

[0033] Combination Figures 7-8As shown, the interior of the movable top cover 15 is provided with an adjustment turntable 18, and the surface of the adjustment turntable 18 is provided with a guide groove 19 corresponding to the movable connector 16; the upper end of the movable connector 16 is integrally provided with a guide movable column 161, and the guide movable column 161 forms a sliding structure along the guide groove 19; the guide groove 19 includes a first guide groove 191 and a second guide groove 192, and the upper part of the heat-insulating inner chamber 7 and the sample support frame 8 corresponds to the first guide groove 191, and the upper part of the telescopic partition 10 corresponds to the second guide groove 192. The first guide groove 191 and the second guide groove 192 are both inclined relative to the adjustment groove 17, and the inclination directions of the first guide groove 191 and the second guide groove 192 are opposite. By adjusting the turntable 18, the guide column 161 moves precisely in the first guide groove 191 and the second guide groove 192. The sliding trajectory of the guide column 161 corresponds to the radial sliding trajectory of the movable connector 16 at the adjustment groove 17, forming a multi-dimensional adjustment mechanism. When the adjustment turntable 18 rotates, the heat-insulating inner chamber 7 and the sample support frame 8 unfold, and the telescopic partition 10 retracts. At this time, the movable top cover 15 can be rotated as a whole to rotate the sample support frame 8 to switch the detection area. When the adjustment turntable 18 rotates in the opposite direction, the heat-insulating inner chamber 7 and the sample support frame 8 retract, and the telescopic partition 10 unfolds, reconstructing a double-layer closed heat-insulating detection space.

[0034] The inner ring of the adjusting turntable 18 has a transmission tooth groove 181. An adjusting knob 20 is located above the movable top cover 15, and a meshing gear 21 is located at the lower end of the adjusting knob 20. The meshing gear 21 and the transmission tooth groove 181 form a meshing transmission structure. When the adjusting knob 20 is rotated, the meshing gear 21 drives the transmission tooth groove 181 to rotate synchronously, thereby controlling the rotation of the adjusting turntable 18. This allows the movable connecting piece 16 to slide and adjust under the cooperation of the guide slide groove 19 and the adjusting slide groove 17, realizing the switching of the detection space.

[0035] The fixed partition 5, the telescopic partition 10, the heat-insulating inner chamber 7, and the inner wall surface of the aging test chamber 1 are all provided with a heat insulation layer 12, and the surface of the heat insulation layer 12 inside the heat-insulating inner chamber 7 is provided with polished aluminum foil. The heat-insulating inner chamber 7 and the aging test chamber 1 together form a double-layer heat insulation structure. At the same time, the internal structure of the heat-insulating inner chamber 7 is more compact, and the small space structure facilitates rapid temperature control. Meanwhile, the ultraviolet lamp 2 provides close-range irradiation, reducing ultraviolet loss and reducing detection power while facilitating rapid and stable detection.

[0036] A handle 22 is provided on the top of the movable top cover 15. The equipment is miniaturized and compact in structure. The handle 22 facilitates the movement of the equipment and also makes it easy to rotate the movable top cover 15 to facilitate the switching and adjustment of the detection space.

[0037] The aging test chamber 1 has a sealed door 23 on its front, and both the aging test chamber 1 and the sealed door 23 are double-layered heat-insulating structures. The expandable and closable structure of the heat-insulating inner chamber 7 can be used in conjunction with the sealed door 23 to form a good double-layered sealed heat-insulating structure during closed testing, without affecting the placement and removal of the test specimens.

[0038] In Embodiment Two, the present invention provides an additional technical solution. A first servo motor replaces the adjustment knob 20 in Embodiment One, while a second servo motor drives the rotation of the movable top cover 15. A controller panel corresponding to the servo motor is also provided. The remaining structure is the same as in Embodiment One. When area switching detection is required, the first servo motor can be controlled to drive the meshing gear 21 and the transmission groove 181 to mesh, causing the adjustment turntable 18 to rotate. This guides the movable column 161 to slide in the first guide groove 191 and the second guide groove 192, thus realizing the movable connecting piece. 16. The radial sliding adjustment in the adjustment groove 17 allows the heat-insulating inner chamber 7 and sample support frame 8 to unfold outwards smoothly around the transfer port 9. Then, the second servo motor drives the movable top cover 15 and the unfolded heat-insulating inner chamber 7 and sample support frame 8 to flexibly switch between the high-temperature chamber 3 and the low-temperature chamber 4. Finally, the first servo motor reverses, and when the heat-insulating inner chamber 7 and sample support frame 8 are retracted, the telescopic partition 10 is kept in place to unfold, reconstructing a double-layer closed heat-insulating detection space. With the help of the timer controller to control and drive the servo motor, it is easy to perform automatic detection with multiple area switching.

[0039] Contents not described in detail in this specification are prior art known to those skilled in the art. Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A composite insulator silicone rubber ultraviolet and high and low temperature aging test device, comprising an aging test chamber (1) and an ultraviolet lamp (2), characterized in that: The aging test chamber (1) is a vertical cylindrical structure, and the front and rear of the aging test chamber (1) are high temperature chamber (3) and low temperature chamber (4) respectively. A fixed partition (5) is installed between the high temperature chamber (3) and the low temperature chamber (4). A semiconductor cooling chip (6) is installed in the middle of the fixed partition (5), and the aging test chamber (1) is provided with a split heat-insulating inner chamber (7). The heat-insulating inner chamber (7) forms a folding and unfolding structure in front of and behind the fixed partition (5), and sample support frames (8) are provided in front of and behind the fixed partition (5). The ultraviolet lamp (2) and the sample support frame (8) are both located inside the heat-insulating inner chamber (7). When the heat-insulating inner chamber (7) is folded up, it fits against the fixed partition (5) to form a closed inner chamber. The fixed partition (5) is provided with transfer ports (9) and telescopic partitions (10) on both the left and right sides. When the heat-insulated inner chamber (7) and sample support frame (8) are unfolded, they can rotate and switch between the high-temperature chamber (3) and the low-temperature chamber (4) through the transfer ports (9) for detection.

2. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 1, characterized in that: The fixed partition (5) has telescopic grooves (11) on both the left and right sides, and the telescopic partition (10) forms a telescopic structure between the telescopic grooves (11) and the transfer port (9).

3. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 1, characterized in that: The inner walls of the fixed partition (5), the telescopic partition (10), the heat-insulating inner chamber (7) and the aging test chamber (1) are all provided with heat insulation layer (12), and the surface of the heat insulation layer (12) inside the heat-insulating inner chamber (7) is provided with polished aluminum foil.

4. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 1, characterized in that: The hot end and cold end of the semiconductor cooling chip (6) face the high temperature chamber (3) and the low temperature chamber (4) respectively, and heat exchange fins (13) and fans (14) are provided on the hot end and cold end surfaces of the semiconductor cooling chip (6).

5. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 4, characterized in that: The fans (14) are arranged in pairs on the left and right sides of the heat-insulated inner chamber (7), and the airflow of the two fans (14) is opposite. The air in the heat-insulated inner chamber (7) and the heat exchange fins (13) is circulated by the fans (14).

6. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 1, characterized in that: Each of the sample support frame (8), telescopic partition (10) and heat-insulating inner chamber (7) is provided with a movable connector (16) at the upper end of each of the separate structures. The aging test chamber (1) is provided with a movable top cover (15) on the top, and the bottom of the movable top cover (15) is provided with a radial adjustment groove (17) corresponding to the movable connector (16). The movable connector (16) forms an movable adjustment structure that can be expanded and retracted along the adjustment groove (17).

7. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 6, characterized in that: The movable top cover (15) is provided with an adjustment turntable (18) inside, and the surface of the adjustment turntable (18) is provided with a guide groove (19) corresponding to the movable connector (16). The upper end of the movable connector (16) is integrally provided with a guide movable column (161), and the guide movable column (161) forms a sliding structure along the guide slide groove (19). The guide chute (19) includes a first guide chute (191) and a second guide chute (192). The first guide chute (191) is located above the heat-insulating inner chamber (7) and the sample support frame (8), and the second guide chute (192) is located above the telescopic partition (10). The first guide chute (191) and the second guide chute (192) are both inclined relative to the adjustment chute (17), and the inclination directions of the first guide chute (191) and the second guide chute (192) are opposite.

8. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 7, characterized in that: The inner ring of the adjusting turntable (18) is provided with a transmission tooth groove (181), and an adjusting knob (20) is provided above the movable top cover (15), and a meshing gear (21) is provided at the lower end of the adjusting knob (20). The meshing gear (21) and the transmission tooth groove (181) constitute a meshing transmission structure.

9. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 8, characterized in that: A handle (22) is provided on the top of the movable top cover (15).

10. The composite insulator silicone rubber ultraviolet and high / low temperature aging test device according to claim 1, characterized in that: The aging test chamber (1) is provided with a sealed switch door (23) on the front, and both the aging test chamber (1) and the sealed switch door (23) are double-layer heat insulation structures.

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