A domain control chip computing performance automatic test method and platform system

By constructing a full-stack closed-loop automated testing platform system, the problems of low efficiency and data fragmentation caused by manual operation in domain controller chip testing are solved, achieving efficient and reliable performance evaluation, supporting complex working condition simulation and anomaly protection, and meeting the performance evaluation needs of intelligent driving scenarios.

CN120973608BActive Publication Date: 2026-06-09CHINA AUTOMOTIVE ENG RES INST +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHINA AUTOMOTIVE ENG RES INST
Filing Date
2025-08-12
Publication Date
2026-06-09

AI Technical Summary

Technical Problem

Existing domain controller chip testing methods rely on manual operation, have lengthy testing cycles, limited scenario coverage, lack automated scheduling mechanisms, and cannot synchronously collect key parameters, resulting in inaccurate performance evaluations and difficulty in meeting the needs of intelligent driving scenarios. Furthermore, data fragmentation makes it difficult to locate performance bottlenecks.

Method used

Construct a full-stack closed-loop automated testing platform system, including the domain controller chip system under test, data connection system, automated platform system, and test host computer system. It achieves millisecond-level synchronous acquisition of electrical parameters and communication load data through high-speed interfaces, dynamically schedules test cases, generates three-dimensional performance curves of computing power, power consumption, and temperature, and supports complex working condition simulation and anomaly protection.

Benefits of technology

It achieves fully automated testing, with comprehensive test indicators, reliable results, high efficiency, and the ability to reproduce real-world scenarios, meeting the requirements of ISO 26262 functional safety certification and improving the efficiency of chip iteration and optimization.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application relates to the technical field of vehicle chip testing, and discloses a domain control chip computing performance automatic testing method and platform system, the platform system comprising: a to-be-tested domain control chip system, which is used for executing pre-designed computing tasks and outputting real-time performance data; a data connection system, which comprises a power analyzer and a protocol analyzer and is used for collecting electrical parameter and communication load data; an automatic platform system, which is used for dynamically scheduling test cases, converging multi-source data and triggering an abnormal protection mechanism; a test host computer system, which is used for configuring a test strategy and generating a visual report, and supports historical data comparison and performance trend analysis; and the to-be-tested domain control chip system, the data connection system, the automatic platform system and the test host computer system are interconnected through physical or communication links to form a closed-loop test architecture. The application can realize full-stack closed-loop automatic testing, and the test indexes are comprehensive, the test results are reliable, and the test efficiency is relatively high.
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