Detection device and method for Feiteng S5000C processor

Abstract

The invention discloses a detection device and method for a Feiteng S5000C processor, a complete intelligent detection system is constructed by integrating a processor clamp, a voltage and current detection module, a temperature monitoring module, an MCU control module and a man-machine interaction module, and real-time data acquisition, multi-dimensional performance evaluation and intelligent grading judgment algorithms are adopted. Accurate testing and automatic grading of the power consumption characteristic and the temperature tolerance of the Feiteng S5000C processor are achieved. The detection device provides an intuitive man-machine interaction interface, and breaks through the limitation that a traditional detection scheme depends on PC terminal control, lacks field real-time display and is prone to errors in manual recording.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of processor testing, and in particular to a detection device and method for Feiteng S5000C processor. BACKGROUND

[0002] There are two major defects in the mass production testing of the current Feiteng S5000C processor: one is the inconsistency of power consumption under the same load condition, and the other is the discrete range of working temperature tolerance of individual chips. According to actual measurement and verification, the power consumption fluctuation of processors in the same batch under the same load condition is as high as ± 15%, resulting in a large number of chips being disabled due to excessive energy efficiency, which seriously restricts the yield improvement of domestic high-performance processors. More importantly, due to the inherent differences in semiconductor manufacturing processes, the failure temperature threshold of individual chips has significant discreteness, and in extreme temperature application scenarios such as industrial control and aerospace, traditional testing schemes cannot accurately screen out qualified chips that meet the wide temperature range requirements (-40℃ to 125℃).

[0003] The existing detection tool generally relies on PC software control, and cannot display power consumption and temperature data in real time on site during testing. The operator needs to manually record the test results through external instruments, and the single batch detection takes a long time and has a high error rate. More seriously, the existing scheme can only perform basic function testing and lacks dynamic analysis capability for the correlation between power consumption and temperature. It cannot identify the differentiated chip characteristics of "low power consumption but poor temperature resistance" or "high power consumption but wide temperature range", nor can it provide a classification basis for subsequent chip sorting, resulting in a waste of a large number of potentially usable chips.

[0004] Application Content

[0005] The present application provides a detection device and method for Feiteng S5000C processor to solve the problem of low testing efficiency caused by the lack of real-time monitoring, dynamic classification and data tracing capability in the prior art.

[0006] In a first aspect, the present application provides a detection device for Feiteng S5000C processor, comprising:

[0007] a processor clamp, a voltage and current detection module, a temperature monitoring module, an MCU control module and a human-computer interaction module;

[0008] the processor clamp is used for fixing the target processor;

[0009] the voltage and current detection module is used for real-time detection of the working voltage and working current of the target processor;

[0010] the temperature monitoring module is used for real-time monitoring of the temperature data of the target processor;

[0011] The MCU control module is connected with the voltage and current detection module and the temperature monitoring module, and is configured to calculate power consumption data of the target processor according to the working voltage and the working current, and perform hierarchical determination on the target processor according to the power consumption data and the temperature data.

[0012] The man-machine interaction module is configured to display the temperature data, the power consumption data and the hierarchical result corresponding to the hierarchical determination of the target processor.

[0013] In a second aspect, the application provides a detection method for a Feiteng S5000C processor, comprising:

[0014] determining power consumption threshold and normal temperature range corresponding to the target processor;

[0015] acquiring working voltage and working current of the target processor through the voltage and current detection module;

[0016] collecting temperature data of the target processor through the temperature monitoring module;

[0017] calculating the product of the working voltage and the working current through the MCU control module to determine the power consumption data corresponding to the target processor;

[0018] performing hierarchical determination on the target processor according to the power consumption threshold, the normal temperature range, the temperature data and the power consumption data to determine the hierarchical result corresponding to the target processor.

[0019] The application provides a detection device and method for a Feiteng S5000C processor, and a complete intelligent detection system is constructed by integrating a processor clamp, a voltage and current detection module, a temperature monitoring module, an MCU control module and a man-machine interaction module. Real-time data acquisition, multi-dimensional performance evaluation and intelligent hierarchical determination algorithm are adopted to realize accurate testing and automatic hierarchical determination of the power consumption characteristics and temperature tolerance of the Feiteng S5000C processor. The detection device provides an intuitive man-machine interaction interface, and breaks through the limitations of traditional detection schemes, such as dependence on PC end control, lack of real-time display on site and easy-to-make mistakes in manual recording.

[0020] The further effects of the above-mentioned non-conventional preferred modes will be described in the following in combination with the specific embodiments. BRIEF DESCRIPTION OF DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or the prior art description. Obviously, the drawings described below are only some embodiments described in the application, and those skilled in the art can also obtain other drawings according to these drawings without creating any inventive labor.

[0022] Figure 1A structural schematic diagram of a detection device for a Feiteng S5000C processor is provided for an embodiment of the present application.

[0023] Figure 2 A flowchart of a detection method for a Feiteng S5000C processor is provided for an embodiment of the present application.

[0024] Figure 3 A flowchart of another detection method for a Feiteng S5000C processor is provided for an embodiment of the present application. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solutions and advantages of the present application clearer, the technical solutions of the present application will be described clearly and completely below in combination with specific embodiments and corresponding drawings. Obviously, the described embodiments are only some of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0026] There are two major core defects in the mass production test of the current Feiteng S5000C processor: one is the inconsistency of power consumption under the same load condition, and the other is the discrete range of working temperature tolerance of individual chips. According to the actual test verification, the power consumption fluctuation of the same batch of processors under the same load condition is as high as ±15%, which leads to the failure of a large number of chips due to excessive energy efficiency, and seriously restricts the yield improvement of domestic high-performance processors. More importantly, due to the inherent differences of semiconductor manufacturing process, the failure temperature threshold of individual chips has significant discreteness, and in extreme temperature application scenarios such as industrial control and aerospace, the traditional test scheme cannot accurately screen out qualified chips that meet the wide temperature range (-40℃ to 125℃) requirements.

[0027] The existing detection tool generally relies on PC software control, and cannot display power consumption and temperature data in real time on site during the test. The operator needs to manually record the test results through external instruments, and the single batch detection takes a long time and has a high error rate. More seriously, the existing scheme can only perform basic function test, and lacks dynamic analysis capability for the correlation between power consumption and temperature. It cannot identify the differentiated chip characteristics of "low power consumption but poor temperature resistance" or "high power consumption but wide temperature range", nor can it provide grading basis for subsequent chip sorting, resulting in waste of a large number of potentially available chips.

[0028] In order to solve this problem, the present application provides a detection device for a Feiteng S5000C processor, which aims to solve the problem of low test efficiency caused by the lack of real-time monitoring, dynamic grading and data tracing capability in the prior art. Referring to Figure 1As shown, it is a specific embodiment of a detection device for Feiteng S5000C processor provided by the application. In this embodiment, a detection device for Feiteng S5000C processor includes: a processor clamp 101, a voltage and current detection module 102, a temperature monitoring module 103, an MCU control module 104 and a human-computer interaction module 105.

[0029] The processor clamp 101 is used for fixing the target processor.

[0030] The target processor is Feiteng S5000C processor. The processor clamp 101 adopts a precision mechanical structure design and is specially customized and developed for the packaging form and pin layout of Feiteng S5000C processor. The main body of the processor clamp 101 is made of high-strength aluminum alloy material, has excellent heat conduction performance and mechanical stability, and can maintain structural stability during long-term testing.

[0031] The processor clamp 101 integrates an elastic contact array inside, ensures reliable electrical connection with each pin of the processor, controls the contact resistance at the level of milliohm, and avoids test errors caused by poor contact. In order to adapt to the possible slight size difference of different batches of processors, the clamp is designed with an adjustable positioning mechanism, which realizes micron-level position compensation through precise thread adjustment. In addition, the surface of the clamp is subjected to special oxidation-resistant treatment, which can be used for a long time in harsh industrial environments without corrosion or wear, ensuring the consistency and repeatability of test results.

[0032] The voltage and current detection module 102 is used for real-time detection of the working voltage and working current of the target processor.

[0033] The voltage and current detection module 102 adopts a detection architecture combining high-precision shunt and differential amplification circuit, which can realize synchronous monitoring of multi-channel power supply of Feiteng S5000C processor. The voltage and current detection module 102 integrates a high-precision current sensor with a precision of 0.1% inside, which uses Hall effect principle for non-contact current detection, avoiding the power loss and thermal effect caused by traditional series resistance method.

[0034] The voltage detection part adopts a high-input-impedance buffer amplifier to ensure that the influence on the measured circuit is minimized. In order to cope with the wide dynamic range current change of the processor in different working states, the voltage and current detection module 102 is designed with an adaptive range switching function, which can automatically switch the measurement range between microampere standby current and ampere peak current. The voltage and current detection module 102 also integrates a low-pass filter and an anti-aliasing filter, which effectively suppresses high-frequency noise and electromagnetic interference, ensuring stable and accurate measurement data in complex industrial environments.

[0035] The temperature monitoring module 103 is configured to monitor the temperature data of the target processor in real time.

[0036] The temperature monitoring module 103 adopts a multi-point distributed temperature sensor array, which can comprehensively monitor the temperature distribution of the surface of the processor chip and the surrounding environment. The main sensor of the temperature monitoring module 103 adopts a high-precision thermistor, with a measurement accuracy of ±0.1℃ and a response time of less than 1 second, which can quickly capture the transient temperature change of the processor during load switching.

[0037] In order to obtain more accurate internal temperature information of the chip, the temperature monitoring module 103 also integrates an infrared temperature sensor to directly monitor the surface temperature of the chip through a non-contact measurement method. Considering the possible local hot spot phenomenon of the Feiteng S5000C processor under high load, the temperature monitoring module 103 is arranged with multiple temperature measurement points on the surface of the chip, and the average temperature and the highest temperature of the chip are calculated through a temperature gradient analysis algorithm. The temperature monitoring module 103 is also equipped with an environmental temperature compensation function, which can automatically correct the influence of environmental temperature change on the measurement results, ensuring accurate temperature data in different working environments.

[0038] The MCU control module 104 is connected to the voltage and current detection module and the temperature monitoring module, and is configured to calculate the power consumption data of the target processor according to the working voltage and the working current, and to perform a hierarchical determination on the target processor according to the power consumption data and the temperature data.

[0039] The MCU control module 104 usually adopts a 32-bit ARM Cortex-M4 core microcontroller, which has powerful data processing capability and rich peripheral interfaces. The MCU control module 104 is internally integrated with a high-speed ADC converter, which can collect analog signals from the voltage and current detection module 102 and the temperature monitoring module 103 in real time.

[0040] The MCU control module 104 also integrates a digital signal processing unit, which can perform preprocessing operations such as filtering, averaging and outlier rejection on the collected raw data, improving data quality and measurement accuracy. In order to ensure the reliability of the system, the MCU control module 104 can also be equipped with a watchdog circuit and a power supply monitoring circuit, which can automatically reset and recover when the system is abnormal, ensuring the continuity and stability of the test process.

[0041] The product of the working voltage and the working current is calculated; and the power consumption data is determined based on the product value.

[0042] The MCU control module 104 multiplies the collected working voltage and working current values to obtain the instantaneous power consumption, and then uses a sliding average algorithm to smooth the continuous instantaneous power consumption data, eliminating the influence of high-frequency noise and occasional spikes. Considering the possibility of multiple power supply for the Feiteng S5000C processor, the system can simultaneously calculate the power consumption of each power supply and accumulate it to obtain the total power consumption of the processor. In order to improve the calculation accuracy, the system can also introduce a temperature compensation algorithm to correct the power consumption calculation results according to real-time temperature data, because the circuit resistance will drift with temperature changes.

[0043] The power consumption threshold and the normal temperature interval corresponding to the target processor are determined; if the power consumption data does not exceed the power consumption threshold and the temperature data is in the normal temperature interval, the target processor is determined to be of high quality grade; if the power consumption data does not exceed the power consumption threshold and the temperature data is not in the normal temperature interval, the target processor is determined to be of low power consumption grade; if the power consumption data exceeds the power consumption threshold and the temperature data is in the normal temperature interval, the target processor is determined to be of wide temperature grade; if the power consumption data exceeds the power consumption threshold and the temperature data is not in the normal temperature interval, the target processor is determined to be of elimination grade.

[0044] The grading determination algorithm uses a multi-dimensional evaluation matrix to comprehensively evaluate the processor performance based on the preset power consumption threshold and normal temperature interval. The system first reads the power consumption standard value set by the human-computer interaction module 105 as the power consumption threshold, and the normal temperature interval is usually set to -20℃ to 85℃, which is the standard working temperature range of most commercial electronic devices.

[0045] When the detected power consumption data is lower than the power consumption threshold and the processor can work stably within the normal temperature interval, the system determines it to be of high quality grade. This type of processor has low power consumption and standard temperature resistance characteristics, and is suitable for most application scenarios. If the power consumption meets the requirements but the temperature tolerance range exceeds the normal interval, it means that the processor has good power consumption control but may have performance degradation at extreme temperatures, so it is determined to be of low power consumption grade. On the contrary, if the power consumption is slightly high but can work stably in a wider temperature range, it is determined to be of wide temperature grade, and this type of processor is particularly suitable for industrial control and outdoor equipment and other applications with high temperature adaptability requirements. When both the power consumption and temperature performance cannot meet the requirements, the processor is determined to be of elimination grade and needs to be screened out in the production process.

[0046] The human-computer interaction module 105 is used to display the temperature data, power consumption data and grading results corresponding to the target processor.

[0047] The human-computer interaction module 105 adopts a modular design concept to provide an intuitive and friendly operation interface and clear state feedback for the operator. The design of the human-computer interaction module 105 fully considers the use environment of the industrial field, and all components have good anti-interference ability and environmental adaptability. The interface layout is optimized by human engineering to ensure that the operator can quickly and accurately complete various operations in a fast-paced production environment. The module also supports multi-language display function, which can switch between Chinese and English interfaces according to the needs of users in different regions. In order to improve work efficiency, the human-computer interaction module 105 also integrates data export function, which can quickly export test results to standard format report files, facilitating subsequent data analysis and quality traceability.

[0048] The human-computer interaction module 105 includes a display, a key array, and a state indicator light; the display is used to display temperature data, power consumption data, and grading results in real time; the key array is used to control the power on / off, test start / stop, and parameter setting of the human-computer interaction module; and the state indicator light is an RGB LED indicator light used to indicate the grading result.

[0049] The display usually adopts an 8-inch high-resolution liquid crystal screen that supports color display and touch operation, and the screen surface is treated with anti-glare to ensure clear display even in strong light environment. The display content adopts a regional design, and the real-time data display area displays the current temperature data and power consumption data in large font for easy observation by the operator at a distance, while the historical data and setting parameters are displayed in a separate area.

[0050] The key array adopts a mechanical key design, and each key is equipped with an independent LED backlight that can be correctly operated in dim environment. The key surface is marked with functional signs by laser etching process to ensure that it will not wear out during long-term use. The state indicator light adopts high-brightness RGB LED that can be clearly seen under various lighting conditions, and the brightness of the indicator light can be automatically adjusted according to the ambient light intensity to avoid dazzling the operator.

[0051] When the grading result is high-quality grade, the state indicator light displays green; when the grading result is low-power consumption grade or wide-temperature grade, the state indicator light displays yellow; and when the grading result is elimination grade, the state indicator light displays red.

[0052] The color coding of the status indicator light follows the internationally recognized industrial standard, with green representing a normal system and excellent processor performance, yellow as a warning color indicating that the processor is usable but has some performance limitations, and red explicitly indicating that the processor is unqualified or the system is abnormal. In order to enhance the visual effect, different levels of indication are also equipped with different flashing modes, with the high-quality level being constant green, the low-power and wide-temperature level being slow flashing yellow, and the obsolete level being fast flashing red. This design allows the operator to quickly identify the current test status and results even at a distance or when distracted.

[0053] The safety temperature threshold corresponding to the target processor is determined; when the temperature data exceeds the safety temperature threshold, the MCU control module stops the test; the status indicator light switches to a red fast flashing mode; and the display pops up an over-temperature warning interface.

[0054] The system sets the safety temperature threshold according to the technical specification of the Feiteng S5000C processor, which is usually 105℃, slightly lower than the absolute maximum operating temperature of the processor, leaving sufficient safety margin for system response and heat dissipation.

[0055] When the temperature monitoring module 103 detects that the temperature of any temperature measurement point exceeds the safety threshold, the MCU control module 104 will immediately execute an emergency shutdown program to cut off the load excitation signal of the processor, and at the same time start forced cooling measures.

[0056] The frequency of the red fast flashing mode is usually set to flash 3 times per second, which has been tested and verified to be the most effective in attracting the attention of the operator. The over-temperature warning interface displays the specific over-temperature value, over-temperature duration and recommended handling measures, helping the operator to quickly locate the problem cause and take appropriate solutions.

[0057] It also includes a data storage module for storing temperature data, power consumption data and grading results to a local storage device and / or a cloud server.

[0058] The detection device usually also includes a data storage module, which uses a dual storage architecture to ensure the safety and traceability of test data. The local storage device uses an industrial-grade SD card, which has high reliability and anti-vibration capability.

[0059] The cloud server storage uses an encrypted transmission protocol to ensure the safety of data during network transmission, and the server side is also equipped with an automatic backup function to prevent data loss. The stored data format uses standard CSV or JSON format, which is convenient for data exchange and analysis with other systems. The data storage module also supports data compression function, which can effectively reduce the storage space occupation and network transmission time.

[0060] From the above technical solutions, it can be seen that the embodiment has the following beneficial effects:

[0061] The embodiment of the application provides a detection device for a Feiteng S5000C processor, which comprises an integrated processor clamp, a voltage and current detection module, a temperature monitoring module, an MCU control module and a man-machine interaction module to build a complete intelligent detection system. Real-time data acquisition, multi-dimensional performance evaluation and intelligent grading judgment algorithm are adopted to realize accurate testing and automatic grading of the power consumption characteristics and temperature resistance of the Feiteng S5000C processor. The detection device provides an intuitive man-machine interaction interface, which breaks through the limitations of traditional detection schemes relying on PC control, lacking real-time display on site and being prone to errors in manual recording.

[0062] As shown in Figure 2 , it is a specific embodiment of a detection method for a Feiteng S5000C processor. The method in the embodiment is applied to Figure 1 a detection device for a Feiteng S5000C processor.

[0063] In the embodiment, a detection method for a Feiteng S5000C processor comprises the following steps:

[0064] Step 201, determining the power consumption threshold and the normal temperature range corresponding to the target processor.

[0065] The target processor is a Feiteng S5000C processor. Before starting the detection work, the system needs to determine the corresponding evaluation criteria according to the technical specifications and application requirements of the Feiteng S5000C processor. The setting of the power consumption threshold usually needs to refer to the standard power consumption index of the processor and the power consumption requirement of the target application scenario.

[0066] For the Feiteng S5000C processor, its typical power consumption range is between 15W and 45W. The system can set a suitable power consumption threshold according to the specific application requirements and market positioning. For example, if the batch of processors are mainly used for mobile devices or low-power servers, the power consumption threshold may be set to 25W; if used for high-performance computing scenarios, it may be relaxed to 35W.

[0067] The working temperature range of a standard commercial-grade processor is usually 0℃ to 70℃, while the industrial-grade application requires a wide temperature range of-40℃ to 85℃. The system stores these parameters in a non-volatile memory to ensure that the set values are maintained after power failure and restart. In addition, the system also supports batch management function, allowing different evaluation criteria to be set for different batches of processors.

[0068] Step 202, obtaining the working voltage and working current of the target processor through the voltage and current detection module.

[0069] The voltage and current detection module starts real-time monitoring of the multi-channel power supply of the target processor immediately after receiving the test start instruction. The Feiteng S5000C processor usually has multiple independent power supply domains, including core voltage, IO voltage, and auxiliary voltage, etc. Each channel of power supply needs to be monitored independently to obtain complete power consumption characteristics.

[0070] The voltage and current detection module uses high-speed synchronous sampling technology to ensure that the voltage and current data strictly correspond in time, avoiding power consumption calculation errors caused by phase difference. During the detection process, the system continuously monitors the working state of the processor, including the electrical parameters in different working modes such as no load, light load, standard load, and full load.

[0071] In order to obtain more accurate measurement results, the voltage and current detection module also compensates for environmental factors, such as changes in environmental temperature that may affect circuit resistance values, thereby affecting the measurement accuracy of voltage and current. The detection module also has an automatic calibration function, which can periodically calibrate the measurement circuit to ensure the stability of the measurement accuracy during long-term use. When abnormal voltage or current fluctuations are detected, the system automatically increases the sampling frequency and extends the sampling time to obtain more stable and reliable measurement data.

[0072] Step 203, collect temperature data of the target processor through the temperature monitoring module.

[0073] The temperature monitoring module continuously collects temperature information of each key part of the processor, including chip surface temperature, packaging bottom temperature, and peripheral environment temperature, etc. Since the Feiteng S5000C processor generates different amounts of heat under different load conditions, the temperature monitoring module needs to have fast response capability to capture the dynamic change process of temperature.

[0074] The temperature monitoring module uses a combination of multiple temperature sensing technologies, with thermistors for accurate contact point temperature measurement, infrared sensors for non-contact surface temperature measurement, and thermocouples for internal temperature gradient monitoring.

[0075] During temperature data collection, the temperature monitoring module analyzes the data of each temperature measurement point in real time to identify temperature change trends and abnormal hot spots. In order to ensure the accuracy of the temperature data, the temperature monitoring module also performs environmental temperature compensation and sensor drift correction. When the processor switches from low load state to high load state, the temperature monitoring module can track the temperature rise process in real time, record the time required to reach thermal equilibrium, and the final stable temperature.

[0076] Step 204, calculate the product of working voltage and working current through the MCU control module to determine the corresponding power consumption data of the target processor.

[0077] After the MCU control module receives the working voltage and working current from the voltage and current detection module, it starts to execute the power consumption calculation algorithm. The MCU control module multiplies the collected working voltage and working current values to obtain the instantaneous power consumption, and then uses the sliding average algorithm to smooth the continuous instantaneous power consumption data, eliminating the influence of high-frequency noise and occasional spikes.

[0078] Considering the possibility of multiple power supply for the Feiteng S5000C processor, the system can simultaneously calculate the power consumption of each power supply and accumulate it to obtain the total power consumption of the processor. In order to improve the calculation accuracy, the system can also introduce a temperature compensation algorithm to correct the power consumption calculation results based on real-time temperature data, because the circuit resistance will drift with temperature changes.

[0079] Step 205: According to the power consumption threshold, the normal temperature interval, the temperature data and the power consumption data, the target processor is classified and determined to determine the classification result corresponding to the target processor.

[0080] If the power consumption data does not exceed the power consumption threshold, and the temperature data is in the normal temperature interval, the classification result is determined as the high-quality level; if the power consumption data does not exceed the power consumption threshold, and the temperature data is not in the normal temperature interval, the classification result is determined as the low-power consumption level; if the power consumption data exceeds the power consumption threshold, and the temperature data is in the normal temperature interval, the classification result is determined as the wide-temperature level; if the power consumption data exceeds the power consumption threshold, and the temperature data is not in the normal temperature interval, the classification result is determined as the elimination level.

[0081] The MCU control module needs to comprehensively consider the power consumption data and temperature data, and combine the preset power consumption threshold and normal temperature interval for intelligent classification. The determination process uses a multi-dimensional evaluation matrix, which is not a simple threshold comparison, but an intelligent determination algorithm based on fuzzy logic.

[0082] When the power consumption data and temperature data both meet the standard requirements, the system determines the processor as the high-quality level, which has ideal power consumption control ability and standard temperature adaptability, and is suitable for most application scenarios.

[0083] For processors with power consumption meeting the requirements but limited temperature adaptability, the system determines them as the low-power consumption level. Although these processors perform well in energy consumption control, they may not be suitable for extreme temperature environments and are more suitable for use in data centers or office environments with good temperature control conditions.

[0084] The wide-temperature level processor has slightly higher power consumption than the standard requirement, but has excellent temperature adaptability and can work stably in harsh environmental conditions, especially suitable for industrial control, vehicle-mounted electronics and outdoor equipment application fields.

[0085] For the processor that neither meets the power consumption requirement nor meets the temperature requirement, the system will determine it as the elimination level, and such processor has design defects or manufacturing problems, and is not suitable for market use. The determination result will be attached with a detailed data report, including specific power consumption value, temperature range, deviation degree and other information, to provide data support for quality control and process improvement. The whole determination process will be recorded in detail to form a complete quality traceability chain, ensuring that the quality status of each processor is traceable.

[0086] Through the above technical solutions, the beneficial effects of the embodiment are: the working voltage and working current of the target processor are obtained through the voltage and current detection module; the temperature data of the target processor are collected through the temperature monitoring module; the product value of the working voltage and working current is calculated through the MCU control module to determine the power consumption data corresponding to the target processor; and the target processor is classified and determined according to the power consumption threshold, the normal temperature interval, the temperature data and the power consumption data, to determine the classification result corresponding to the target processor. The intelligent classification screening and batch automatic detection of the Feiteng S5000C processor are realized, the traditional binary qualification determination is upgraded to multi-dimensional performance evaluation, and the chip utilization rate and test efficiency are significantly improved.

[0087] As shown in Figure 3 , it is another specific embodiment of the detection method for the Feiteng S5000C processor according to the present application. The embodiment is further described on the basis of the foregoing embodiment.

[0088] In the embodiment, a detection method for a Feiteng S5000C processor includes the following steps:

[0089] Step 301, determining the power consumption threshold and the normal temperature interval corresponding to the target processor.

[0090] Step 302, obtaining the working voltage and working current of the target processor through the voltage and current detection module.

[0091] Step 303, collecting the temperature data of the target processor through the temperature monitoring module.

[0092] Step 304, calculating the product value of the working voltage and working current through the MCU control module to determine the power consumption data corresponding to the target processor.

[0093] Step 305, classifying and determining the target processor according to the power consumption threshold, the normal temperature interval, the temperature data and the power consumption data, to determine the classification result corresponding to the target processor.

[0094] Step 306, determining the safety temperature threshold corresponding to the target processor.

[0095] The absolute maximum operating temperature of the Feiteng S5000C processor is usually 110℃, but considering long-term reliability and safety margin, the system usually sets the safety temperature threshold between 95℃ and 105℃. The setting of this threshold needs to consider multiple factors, including the thermal design power of the processor, the package form, the expected service life, and the heat dissipation conditions of the test environment. In actual setting, the system will refer to the temperature-time curve provided by the processor manufacturer to ensure that even if the safety temperature threshold is reached for a short time, the processor will not be permanently damaged.

[0096] Step 307, when the temperature data exceeds the safety temperature threshold, the MCU control module stops the test.

[0097] When the temperature monitoring module detects that the temperature data of any temperature measurement point exceeds the preset safety temperature threshold, the MCU control module will immediately start a multi-level safety protection mechanism to ensure the safety of the system and the processor under test.

[0098] The MCU control module will interrupt all current test processes with the highest priority, immediately cut off the load excitation signal to the processor, and make the processor quickly transition from a high-load state to a low-power standby mode, thereby rapidly reducing heat generation. At the same time, the system will activate all available heat dissipation measures, including increasing the speed of the cooling fan, turning on auxiliary cooling devices, etc., to maximize the speed of heat dissipation.

[0099] During the execution of the shutdown procedure, the MCU control module will record the complete information of the over-temperature event, including the exact time of over-temperature occurrence, the over-temperature duration, the maximum temperature value, the working load state at the time of over-temperature, and the temperature distribution of each temperature measurement point. These data not only serve for post-analysis, but also provide important basis for judging whether the processor is damaged by heat. The system will also automatically save all test data within a certain period of time before and after the over-temperature occurs, forming a complete event record file.

[0100] As can be seen from the above technical solutions, the beneficial effects of the present embodiment are that through the established safety temperature protection mechanism, the Feiteng S5000C processor can be effectively prevented from being permanently damaged due to overheating during the test process, significantly improving the safety and reliability of the test process. This protection mechanism not only avoids the loss of processor samples and reduces test costs, but also ensures the effectiveness and accuracy of test data, because only test results obtained within the safety temperature range can truly reflect the actual performance characteristics of the processor.

[0101] Those skilled in the art should understand that the embodiments of the present application can be provided as a method or a computer program product. Therefore, the present application can be in the form of a complete hardware embodiment, a complete software embodiment, or a combination of software and hardware.

[0102] The various embodiments in this application are described in a progressive manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, the apparatus embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions of the method embodiments.

[0103] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0104] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A detection device for the Phytium S5000C processor, characterized in that, include: Processor fixture, voltage and current detection module, temperature monitoring module, MCU control module, and human-machine interface module; The processor fixture is used to fix the target processor; The voltage and current detection module is used to detect the operating voltage and operating current of the target processor in real time; The temperature monitoring module is used to monitor the temperature data of the target processor in real time; The MCU control module is connected to the voltage and current detection module and the temperature monitoring module, and is used to calculate the power consumption data of the target processor based on the operating voltage and the operating current; and to classify the target processor based on the power consumption data and the temperature data. The human-computer interaction module is used to display the temperature data, power consumption data and grading results corresponding to the target processor and the grading determination.

2. The detection device according to claim 1, characterized in that, The calculation of the power consumption data of the target processor based on the operating voltage and the operating current includes: Calculate the product of the operating voltage and the operating current; The power consumption data is determined based on the product value.

3. The detection device according to claim 2, characterized in that, The step of classifying the target processor based on the power consumption data and the temperature data includes: Determine the power consumption threshold and normal temperature range corresponding to the target processor; If the power consumption data does not exceed the power consumption threshold and the temperature data is within the normal temperature range, the target processor is determined to be of high quality. If the power consumption data does not exceed the power consumption threshold and the temperature data is not within the normal temperature range, the target processor is determined to be of low power consumption level. If the power consumption data exceeds the power consumption threshold and the temperature data is within the normal temperature range, the target processor is determined to be a wide temperature class. If the power consumption data exceeds the power consumption threshold and the temperature data is not within the normal temperature range, the target processor is determined to be at the elimination level.

4. The detection device according to claim 3, characterized in that, The human-computer interaction module includes: Display, key array, and status indicator lights; The display is used to display the temperature data, the power consumption data, and the grading results in real time; The button array is used to control the power on / off, test start / stop, and parameter settings of the human-computer interaction module; The status indicator is an RGB LED indicator used to indicate the grading result.

5. The detection device according to claim 4, characterized in that, The means for indicating the grading result includes: When the grading result is the excellent grade, the status indicator light is green; When the classification result is the low power consumption level or the wide temperature level, the status indicator light is yellow; When the grading result is the elimination level, the status indicator light will turn red.

6. The detection device according to claim 5, characterized in that, Also includes: Determine the safe temperature threshold corresponding to the target processor; When the temperature data exceeds the safe temperature threshold, the MCU control module stops the test; The status indicator light switches to a red flashing mode; The display shows an over-temperature alarm screen.

7. The detection device according to any one of claims 1-6, characterized in that, Also includes: The data storage module is used to store the temperature data, the power consumption data, and the grading results to a local storage device and / or a cloud server.

8. A detection method for the Phytium S5000C processor, characterized in that, The method is applied to the detection device according to any one of claims 1-7, comprising: Determine the power consumption threshold and typical temperature range corresponding to the target processor; The operating voltage and operating current of the target processor are obtained through a voltage and current detection module. Temperature data of the target processor is collected via a temperature monitoring module; The MCU control module calculates the product of the operating voltage and the operating current to determine the power consumption data corresponding to the target processor. The target processor is classified based on the power consumption threshold, the normal temperature range, the temperature data, and the power consumption data to determine the classification result corresponding to the target processor.

9. The method according to claim 8, characterized in that, The target processor is classified based on the power consumption threshold, the normal temperature range, the temperature data, and the power consumption data to determine the classification result corresponding to the target processor, including: If the power consumption data does not exceed the power consumption threshold and the temperature data is within the normal temperature range, the grading result is determined to be of excellent quality. If the power consumption data does not exceed the power consumption threshold and the temperature data is not within the normal temperature range, the classification result is determined to be a low power consumption level. If the power consumption data exceeds the power consumption threshold and the temperature data is within the normal temperature range, the grading result is determined to be a wide temperature level. If the power consumption data exceeds the power consumption threshold and the temperature data is not within the normal temperature range, the grading result is determined to be an elimination level.

10. The method according to claim 9, characterized in that, Also includes: Determine the safe temperature threshold corresponding to the target processor; When the temperature data exceeds the safe temperature threshold, the MCU control module stops the test.

Images