Method and device for acquiring and processing vrs plate detection data

Abstract

The application provides a VRS plate inspection data acquisition and processing method and device, the method comprises the following steps: acquiring initial data generated by AOI, wherein the initial data comprises defect point data; generating an editable defect list based on the initial data, wherein the editable defect list comprises defect type, quantity, defect position information and associated production information; generating verified data according to re-inspection results based on the editable defect list; and arranging the verified data based on a preset rule to generate general format data. The application optimizes the output and storage mode of VRS plate inspection data, so that the data can be directly read by a general text editor or analysis tool, meets the demand of users for quickly acquiring and calling data, and provides basic data support for production quality analysis. Meanwhile, by establishing a structured storage system, the data query and traceability efficiency is greatly improved, and the intelligent level of overall production management is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of data processing, and in particular to a VRS plate inspection data acquisition and processing method and device. BACKGROUND

[0002] In the PCB production and manufacturing process, the VRS re-inspection process as a key link after AOI automatic optical inspection undertakes the important responsibility of manually rechecking and rejudging the defect results output by AOI, and is an important barrier to guarantee the quality of PCB products. The operating personnel will further confirm or correct the defect types identified by AOI in the VRS process, and finally form more accurate plate inspection data.

[0003] However, the current VRS process has the following defects in plate inspection data management:

[0004] The storage and calling mode of the plate inspection data is difficult to meet the efficient management needs. Specifically, in the existing mode, the VRS plate inspection data is either in a special data format and can only be queried in the form of a chart within the plate inspection software, and cannot be directly exported for external statistical analysis, or the exported data lacks a standardized storage structure and unified format standard, resulting in scattered and chaotic data, which is not convenient for quickly retrieving PCB plate inspection information of a specific batch or specific material number, and it is also difficult to systematically analyze the data to find problems in the production process, thereby affecting the timely tracing of PCB production process defects and process optimization, and failing to fully play the role of VRS re-inspection data in improving production quality and efficiency. SUMMARY

[0005] In view of the deficiencies of the prior art, the present application provides a VRS plate inspection data acquisition and processing method, which comprises:

[0006] Acquiring initial data generated by AOI, the initial data comprising defect point data;

[0007] Based on the initial data, generating an editable defect list, the editable defect list comprising defect type, quantity, defect position information and associated production information;

[0008] Based on the editable defect list, generating verified data according to the re-inspection results;

[0009] Based on a preset rule, the verified data is sorted to generate general format data.

[0010] In one embodiment, the above-mentioned sorting of the verified data based on a preset rule to generate general format data comprises:

[0011] When each PCB surface layer is re-inspected, a TXT file is created under a first file directory according to a first naming rule, the first naming rule including a batch number, a serial number and a surface layer;

[0012] According to a preset order, the PCB basic information and the verified data are written into the TXT file corresponding to the PCB surface layer.

[0013] In one embodiment, the step of writing the PCB basic information and the verified data into the TXT file corresponding to the PCB surface layer according to the preset order comprises:

[0014] The operation record data of the OEW is read to determine the PCB basic information, the PCB basic information including an operator, a VRS device number, an AOI device number, an engineering material number, a work order batch number, a layer type, a production serial number, an inspection board start time and an inspection board end time;

[0015] At the end of the OEW inspection board, the SET total number, the Piece total number, the defect point type and the corresponding defect point type total number are determined according to the ODB++ engineering data of the PCB and the verified data;

[0016] According to the PCB unit number, the SET unit position distribution, the Piece unit position distribution in the ODB++ engineering data and the verified data, the ID state information of each SET unit and Piece unit is determined and stored according to a preset data format;

[0017] According to the ID state information of each SET unit and Piece unit, the number of defective SETs and the number of defective Pieces are determined and counted;

[0018] According to a preset order, the PCB basic information, the SET total number, the number of defective SETs, the ID state information of the SET unit, the Piece total number, the number of defective Pieces, the ID state information of the Piece unit, the defect point type, and the corresponding defect point type total number are written into the TXT file corresponding to the PCB surface layer.

[0019] In one embodiment, the step of arranging the verified data based on a preset rule to generate general format data comprises:

[0020] When each PCB surface layer is re-inspected, the verified data and the defect codes are classified and counted to generate target inspection board data corresponding to the surface layer;

[0021] Four folders named with PCB level units, i.e. PCB, Panel, Set and Piece, are created under a second file directory;

[0022] According to the second naming rule, the target inspection plate data is created in CSV format and placed in the folder of the corresponding level unit. The second naming rule includes AOI number, part number, layer, batch number and date.

[0023] In one embodiment, after each PCB surface layer has been re-inspected, the verified data is statistically analyzed, defect codes are classified and counted, and target inspection board data for the corresponding surface layer is generated, including:

[0024] The system collects and analyzes verified data, classifies and counts defects based on defect type codes, and generates statistical results of defects in the inspected surfaces of the current PCB.

[0025] Based on the defect point coordinate data, the defect points distributed in each Piece and Set unit are counted again to obtain the number and type of defect points in each Piece and Set unit, and the target inspection data of this layer based on each level unit is generated.

[0026] In one embodiment, the defect point data includes defect point number, defect type code, defect coordinates, and confidence gradient. After organizing the verified data based on preset rules to generate general format data, the method further includes:

[0027] Based on the general format data and the initial data, determine the true and false information of each defect point data;

[0028] Based on the information about true and false points, determine the defect type code and defect coordinates of the false point defect;

[0029] Based on the defect coordinates, quantity, and distribution status of false point defects of the same defect type, reset the confidence gradient of the corresponding PCB part number so that the gradient value of the confidence gradient corresponds to the distribution status.

[0030] AOI operations for the corresponding PCB part number are performed based on the reset confidence gradient.

[0031] In one embodiment, after organizing the verified data based on preset rules to generate general format data, the method further includes:

[0032] Parse common format data to extract key information;

[0033] Based on key information, identify associated testing equipment, associated production processes, and testing procedures;

[0034] Based on associated testing equipment, associated production processes, and testing links, process defects or equipment parameter defects can be traced back.

[0035] The present invention also provides a device for acquiring and processing VRS inspection data, comprising:

[0036] The acquisition module is used to acquire the initial data generated by AOI, the initial data including defect point data;

[0037] The first generation module is used to generate an editable defect list based on the initial data. The editable defect list includes defect type, quantity, defect location information and associated production information.

[0038] The second generation module is used to generate verified data based on the editable defect list and the re-inspection results.

[0039] The third generation module is used to organize the verified data based on preset rules and generate data in a general format.

[0040] The present invention also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the above-described method for acquiring and processing VRS inspection data.

[0041] The present invention also provides a computer storage medium storing a computer program thereon, which, when executed by a processor, implements the above-described method for acquiring and processing VRS inspection board data.

[0042] This invention, through its embodiments, acquires initial data generated by AOI, including defect point data; based on this initial data, generates an editable defect list, including defect type, quantity, defect location information, and associated production information; based on the editable defect list, generates verified data according to the re-inspection results; and organizes the verified data according to preset rules to generate general-format data. This optimizes the output and storage method of VRS inspection data, breaking through the limitation that data could only be queried within the software. It exports and stores accurate VRS re-inspection data in a general format (such as CSV or TXT), allowing the data to be directly read by general text editors or analysis tools, meeting users' needs for rapid data acquisition and retrieval, and providing basic data support for production quality analysis. Simultaneously, by establishing a structured storage system, it significantly improves data query and traceability efficiency. The standardized export format (such as CSV or TXT) supports seamless data transmission to other devices, systems, or applications, facilitating the construction of a cross-platform production data management system, laying the foundation for subsequent information management of the entire PCB production process, and improving the overall intelligence level of production management. Attached Figure Description

[0043] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0044] Figure 1 This is a flowchart of the VRS inspection board data acquisition and processing method according to Embodiment 1 of the present invention;

[0045] Figure 2 This is a detailed flowchart of S104 in Embodiment 1 of the present invention;

[0046] Figure 3 This is a detailed flowchart of S1042 in Embodiment 1 of the present invention;

[0047] Figure 4 This is a detailed flowchart of S204 in Embodiment 2 of the present invention;

[0048] Figure 5 This is a detailed flowchart of the core steps of Embodiment 3 of the present invention;

[0049] Figure 6 A detailed flowchart of the core steps of Embodiment 4 of the present invention.

[0050] Figure 7 This is a structural block diagram of the VRS inspection board data acquisition and processing device according to Embodiment 5 of the present invention;

[0051] Figure 8 This is a schematic diagram of the internal structure of a computer according to another embodiment of the present invention. Detailed Implementation

[0052] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Well-known modules, units, and their connections, links, communications, or operations are not shown or described in detail. Furthermore, the described features, architectures, or functions can be combined in any way in one or more embodiments. Those skilled in the art should understand that the various embodiments described below are for illustrative purposes only and are not intended to limit the scope of protection of the present invention. It is also readily understood that the modules, units, or processing methods in the various embodiments described herein and shown in the accompanying drawings can be combined and designed in various different configurations. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0053] Example 1:

[0054] Please refer to Figures 1 to 3 As shown, this embodiment discloses a method for acquiring and processing VRS inspection board data, including S101-S104, wherein:

[0055] S101, Obtain the initial data generated by AOI, the initial data including defect point data.

[0056] In this embodiment, after the AOI (Automatic Optical Inspection) scans the PCB, it automatically generates initial data containing information such as defect point number, defect type code (e.g., "short circuit", "open circuit", "hole offset", "solder mask bubble" or "copper thickness abnormality"), and defect coordinates (X / Y axis position). This data is then transmitted to the VRS (Visual Review Station) system via a local area network or local interface.

[0057] Preferably, the initial data in this embodiment also includes PCB engineering graphics. The PCB engineering graphics in the initial data contain complete structural information such as circuit layout, component pad positions, and wiring routing. This allows for precise correspondence between defect coordinates in the initial data and the actual circuit graphics, clearly identifying whether the defect is located "on the edge of a conductor," "near a pad," or in a "no-circuit area," avoiding ambiguity caused by relying solely on coordinate values ​​and providing an intuitive reference for inspectors to locate defects. Simultaneously, the initial data includes engineering graphics, which can directly parse the division rules of each level of unit (e.g., which PCB units are included in a Set), ensuring accurate association between defect points and their respective Sets / Pieces, providing a structural foundation for subsequent data classification and storage (e.g., the "Set" field in CSV / TXT files). Finally, the provision of PCB engineering graphics facilitates the area division (e.g., edge area, center area) of the PCB part number based on the confidence gradient reset in Embodiment 3 below. The PCB engineering graphics can define the boundaries of these areas (e.g., 5mm from the board edge), enabling gradient adjustments in high-NG areas to accurately correspond to specific circuit areas (e.g., "dense conductor areas in the edge area"), ensuring the targeting, accuracy, and effectiveness of gradient reset.

[0058] For example, the initial data transmission frequency is synchronized with the AOI scanning rhythm (e.g., pushed immediately after each surface scan of a PCB is completed), and the data format is JSON or XML, ensuring that VRS can be directly parsed, so as to provide original defect information for subsequent re-inspection and generate an editable defect list.

[0059] S102, Based on the initial data, an editable defect list is generated, which includes defect type, quantity, defect location information and associated production information.

[0060] After the VRS inspection software OEW parses the initial data, it generates an editable list in tabular form on the interface. The list includes: defect point number (auto-incrementing, such as "D001", "D002"), defect type (can be selected and modified from a dropdown menu, such as "open circuit → scratch"), coordinate values ​​(accurate to 0.01mm), number of defects, inspection status ("uninspected", "inspected"), and associated production information (part number, batch number, production sequence number, or layer). For example, the operator can click on the "Defect Type" cell in the list to modify defects misjudged by AOI (e.g., changing an AOI-judged "open circuit" to "scratch"), or directly mark a "false point" (meaning there is no actual defect).

[0061] S103, Based on the editable defect list, generate verified data according to the re-inspection results.

[0062] During manual re-inspection, each defect point is subjected to an "confirm," "reclassify," or "mark as false point" operation, among which:

[0063] Confirmation: Retain the original AOI judgment, and update the inspection status to "Inspected (True Point)";

[0064] Reassessment: After modifying the defect type and saving, the new data overwrites the original data, and the status is updated to "Inspected".

[0065] Mark false points: If the "false point" option is checked, the defect will not be included in the final statistics, and the status will be updated to "detected (false point)".

[0066] This step S103 corrects AOI misjudgments through manual intervention, generating more accurate defect data and providing a reliable basis for subsequent storage and analysis.

[0067] S104: Based on preset rules, the verified data is organized to generate data in a general format.

[0068] In this embodiment, the preset rules can correspond to different general format data, that is, the corresponding general format data is generated using the corresponding preset rules. For example, please refer to Figure 2 As shown, the general format data can be TXT format. S104 specifically includes S1041-S1042, where:

[0069] S1041, after each PCB surface layer has been inspected, a TXT file is created in the first file directory according to the first naming rule, which includes the batch number, serial number, and surface layer.

[0070] In this embodiment, a PCB is usually inspected in two steps (two sides). Therefore, the inspection data of the same PCB is also usually output in two layers (two sides) separately, distinguished by the layer name. That is, the verified data of the two layers are summarized and output to the corresponding text of the A or B side for storage.

[0071] For example, the first file directory is the local "Data" folder (path example: D: / VRS / Data / ); the "first naming rule" format is "batch number + serial number + surface layer" (e.g., "B20230501#0012#A", where "B20230501" is the batch number, "0012" is the production serial number, and "A" is the surface layer). When all defect points of a certain surface layer (e.g., surface A) are marked as "inspected", file creation is automatically triggered.

[0072] This step S1041 enables data to be stored by PCB individual and surface layer classification, which facilitates subsequent batch traceability.

[0073] S1042, according to the preset order, write the PCB basic information and verified data into the TXT file corresponding to the PCB surface layer.

[0074] In this embodiment, please refer to Figure 3 As shown, step S1042 is further divided into S1042a-S1042e, where:

[0075] S1042a reads the OEW operation log data to determine the basic PCB information.

[0076] As a specific solution rather than a limitation, the basic information for this step includes: operator (e.g., “OP003”), VRS equipment number (e.g., “VRS-05”), AOI equipment number (e.g., “AOI-02”), engineering part number (e.g., “PCB-2023-005”), work order batch number (same as the batch number in the file name), layer (e.g., “A side”), production sequence number (same as the sequence number in the file name), inspection start time (e.g., “2023-05-01 09:15:30”) and inspection end time (e.g., “2023-05-01 09:18:25”).

[0077] S1042b, at the end of the OEW board inspection, based on the PCB's ODB++ engineering data and the verified data, determines the total number of SETs, the total number of Pieces, the defect type, and the total number of corresponding defect types.

[0078] OEW, combined with the PCB's ODB++ (Open Database, a standard PCB engineering data format) engineering data statistics, yields: the total number of SETs (e.g., 1 Panel contains 6 Sets), the total number of Pieces (e.g., 1 Set contains 4 Pieces); the defect type (e.g., "short circuit" or "scratch") and the total number of corresponding defect types (e.g., 3 short circuits and 5 scratches).

[0079] S1042c: Based on the PCB unit number, SET unit location distribution, Piece unit location distribution and the verified data in the ODB++ project data, determine the ID status information of each SET unit and Piece unit, and store it according to the preset data format.

[0080] Based on the location distribution (number of rows and columns) of SET / Piece in the ODB++ data and the defect coordinates in the verified data, mark the status of each SET / Piece. For example, the format can be "true / false point|number of rows|number of columns|ID|parent ID" (such as "1|2|3|S002|P001", which means that Set S002 contains a true defect, located in the 2nd row and 3rd column, and its parent is Panel P001).

[0081] S1042d: Based on the ID status information of each SET unit and Piece unit, determine the number of defective SETs and defective Pieces.

[0082] If a set / piece contains at least one true defect, it is judged as "defective". The number of defective sets (e.g., 2 defects out of 6 sets) and the number of defective pieces (e.g., 5 defects out of 24 pieces) are calculated.

[0083] S1042e, writes TXT files in a preset order:

[0084] As a specific solution rather than a limitation, the writing order of this step S1042e can be: PCB basic information (operator, equipment number, etc.); total number of SETs, number of defective SETs, status information of each SET-ID; total number of Pieces, number of defective Pieces, status information of each Piece-ID; defect type and corresponding quantity.

[0085] Example snippet:

[0086] Operator: OP003; VRS Number: VRS-05; Start Time: 2023-05-01 09:15:30

[0087] Total number of sets: 6; Number of defective sets: 2

[0088] SET states: 0|1|1|S001|P001; 1|2|3|S002|P001; ...

[0089] Defect types: Short circuit: 3; Scratches: 5; False points: 2.

[0090] The above steps S1042a-S1042e determine the basic PCB information by reading the OEW operation record, and clarify the total number, defect type and corresponding quantity of SET and Piece by combining ODB++ engineering data and verified data. They also determine the ID status information of each unit and count the number of defects. Finally, the data is written to a TXT file in a preset order. The beneficial effects are: it realizes the structured integration and standardized storage of PCB inspection data, ensuring the complete correlation between basic information, defect distribution and unit status. This facilitates the rapid tracing of inspection details of specific batches and layers, providing a reliable basis for the verification of re-inspection results. It also accurately supports the statistical analysis of defect status of SET, Piece and other units, laying a data foundation for subsequent production quality analysis and equipment evaluation, and improving the usability and management efficiency of VRS inspection data.

[0091] This invention, through its embodiments, acquires initial data generated by AOI, including defect point data; based on this initial data, generates an editable defect list, including defect type, quantity, defect location information, and associated production information; based on the editable defect list, generates verified data according to the re-inspection results; and organizes the verified data according to preset rules to generate general-format data. This optimizes the output and storage method of VRS inspection data, breaking through the limitation that data could only be queried within the software. It exports and stores accurate VRS re-inspection data in a general format (such as CSV or TXT), allowing the data to be directly read by general text editors or analysis tools, meeting users' needs for rapid data acquisition and retrieval, and providing basic data support for production quality analysis. Simultaneously, by establishing a structured storage system, it significantly improves data query and traceability efficiency. The standardized export format (such as CSV or TXT) supports seamless data transmission to other devices, systems, or applications, facilitating the construction of a cross-platform production data management system, laying the foundation for subsequent information management of the entire PCB production process, and improving the overall intelligence level of production management.

[0092] Example 2:

[0093] This embodiment discloses another method for acquiring and processing VRS inspection board data. Steps S201-S203 are the same as S101-S103 in Embodiment 1. The core difference lies in step S204, which is used to generate CSV format data, as detailed below:

[0094] S204: Based on preset rules, the verified data is organized to generate data in a general format.

[0095] Please refer to Figure 4 As shown, this step includes S2041-S2043:

[0096] S2041, Statistically analyze the verified data and generate the target inspection data for the corresponding surface layer.

[0097] In step S2041, the defect type codes are classified and counted to generate the defect statistics results of the current surface layer (e.g., "short circuit: 3, open circuit: 2"); based on the defect point coordinates, the number and type of defects in each Piece and Set are counted (e.g., Piece001 contains 1 short circuit, Set003 contains 2 scratches), and target data for four levels of units: PCB, Panel, Set, and Piece are generated.

[0098] S2042, create four folders named PCB, Panel, Set, and Piece in the second file directory, using the PCB level unit as the name.

[0099] In the PCB manufacturing process, to facilitate mass production, PCBs are usually divided into multiple levels (PCB, Panel, Set, and Piece). Multiple first-level units (Piece) are combined to form a second-level unit (Set), and multiple second-level units are combined to form a panel, and so on.

[0100] For example, the "second file directory" is the local "Report" folder (path example: D: / VRS / Report / ), which contains four-level folders named according to PCB level units: / PCB (stores summary data of the entire PCB); / Panel (stores detailed data of each Panel); / Set (stores detailed data of each Set); / Piece (stores detailed data of each Piece).

[0101] S2043, according to the second naming rule, create the target inspection plate data in CSV format to the folder of the corresponding level unit. The second naming rule includes AOI number, part number, layer, batch number and date.

[0102] For example, the naming rule for this step S2043 can be "AOI number + part number + layer + batch number + date" (such as "AOI-02#PCB-2023-005#A#B20230501#20230501.csv").

[0103] The CSV file contains columns for "Serial Number | Defect Type | Coordinates | Set | Piece | Inspection Status", as shown in the example below:

[0104] 1. Short circuit, (X:12.34, Y:56.78), Set002, Piece003, Detected;

[0105] 2. Scratches, (X:90.12, Y:34.56), Set005, Piece011, Inspected.

[0106] This step saves files with the same name into the corresponding folder and sorts them in ascending order of production serial number (e.g., the data for PCB No. 0012 is placed before No. 0013).

[0107] This embodiment generates target inspection board data by classifying and counting defects according to their type codes after each PCB surface layer has been inspected. Four-level folders (PCB, Panel, Set, Piece) are created in the second file directory, and the data is stored in CSV format in the corresponding folders according to a second naming rule that includes information such as AOI number and part number. This achieves refined and hierarchical storage of VRS inspection board data by PCB level unit. The standardized CSV format and clear folder structure facilitate quick location of defect data at different level units (such as specific Sets and Pieces), meeting the quality traceability requirements of subdivided units. Furthermore, the classified defect type and quantity information provides structured data support for subsequent hierarchical defect rate statistics and defect distribution pattern analysis, improving the efficiency of data query, statistics, and cross-platform transmission, and ensuring the accuracy of production quality and equipment status assessment.

[0108] Example 3:

[0109] This embodiment discloses a method for acquiring and processing VRS test board data. Its preliminary steps (acquiring initial data and generating general format data) are consistent with Embodiment 1 and / or Embodiment 2. The general format can be at least one of TXT or CSV format. The core steps are S301-S304 (resetting the confidence gradient based on the general format data), please refer to... Figure 5 As shown:

[0110] S301, based on the general format data and the initial data, determine the true and false information of each defect point data.

[0111] Specifically, step S31 can establish a mapping relationship by comparing the general format data (including the true / false point markings after re-inspection) with the AOI initial data: where a true point is a defect point in the initial data that has been confirmed as a real defect after re-inspection; a false point is a defect point in the initial data that has been marked as a "false point" (without an actual defect) after re-inspection.

[0112] S302, based on the true and false point information, determine the defect type code and defect coordinates of the false point defect.

[0113] This step generates a list of false points by extracting the defect type code, such as "SC" (short circuit), and coordinate information, such as "(X:25.68,Y:42.15)", from the general format data.

[0114] S303, based on the defect coordinates, quantity, and distribution status of false point defects of the same defect type, reset the confidence gradient of the corresponding PCB part number so that the gradient value of the confidence gradient corresponds to the distribution status.

[0115] In this embodiment, the confidence gradient refers to the initial confidence level (range 0-100, with higher values ​​indicating more reliable judgment) of the AOI equipment for a certain type of defect. It can be set by improving and optimizing the AOI algorithm (e.g., the initial confidence gradient for a short-circuit defect is 95). It should be noted that in this embodiment, the confidence gradient is used to quantify the gradient values ​​of different partitions within the same PCB part number range. The PCB range with the same gradient value can be a closed area such as a dot or a ring.

[0116] If, in the same part number of PCBs, the number of false points of a certain type of defect accounts for more than 30% of the total number of defects of that type, and the coordinates are concentrated in a specific area (such as within 10mm of the PCB edge), then the confidence gradient of that type of defect in the corresponding area is reduced (such as from 95 to 90).

[0117] The gradient value is positively correlated with the distribution of false positives: the more concentrated the distribution and the greater the number of false positives, the greater the downward adjustment of the gradient value. For areas with a high concentration of false positives (such as the edge area), the confidence gradient is lowered from the initial value (such as 95) to a low gradient value (such as 90); for areas with a low concentration of false positives (such as the central area), the gradient value is maintained or increased (such as 98), so that the gradient value is directly related to the regional risk (the lower the gradient value, the higher the priority of re-examination).

[0118] S304, perform subsequent AOI operations for the corresponding PCB part number based on the reset confidence gradient.

[0119] This step S304 introduces a feedback mechanism to dynamically adjust the confidence gradient, reduce the initial judgment weight of AOI on defects with high risk of false positives, reduce false point outputs, and improve the accuracy of initial data.

[0120] Low confidence gradient regions (high NG concentration areas) are often "risk areas" where AOI misjudgments or real defects are frequent (e.g., high false AOI point rate due to light reflection in PCB corners). This embodiment determines true and false point information by comparing general format data with initial data, extracts the defect type code and coordinates of false points, and then resets the corresponding confidence gradient based on the coordinates, quantity, and distribution of false points of the same defect type in the same part number PCB. Finally, subsequent AOI operations are performed based on the reset confidence gradient. This allows the confidence gradient to dynamically match the actual defect distribution. Reducing the gradient value in high false point concentration areas can reduce the AOI's misjudgment weight for that area and reduce invalid false point outputs. The regional differences in the confidence gradient are fed back to the AOI device, so that if a certain area maintains a low gradient value for a long time (high NG / false point), it indicates that the AOI's detection parameters (such as exposure intensity, algorithm threshold) for that area are unreasonable. Based on the gradient value data, the AOI's regional detection parameters can be adjusted in a targeted manner (such as enhancing the image contrast of edge areas), reducing false point outputs from the source, further reducing the re-inspection pressure, and forming a closed loop of "AOI parameter optimization → gradient value improvement → re-inspection efficiency improvement". On the other hand, the confidence gradient can also serve as an important reference for the subsequent CSV re-inspection process. Re-inspectors can directly focus on low gradient areas, reduce repeated inspections of high gradient areas (such as only randomly sampling 10%), reduce unnecessary manpower input, and improve the re-inspection efficiency of a single PCB (which can be improved by 30%-50%).

[0121] Example 4:

[0122] This embodiment discloses a method for acquiring and processing VRS inspection data. Its preliminary steps (acquiring initial data and generating general-format data) are consistent with Embodiment 1 and / or Embodiment 2. The general-format can be at least one of TXT or CSV format. The core steps are S401-S403 (backtracking defects based on general-format data). Please refer to... Figure 6 As shown:

[0123] S401 parses common format data to obtain key information.

[0124] In this step, key information is extracted from general data in CSV and / or TXT formats. This key information includes defect type (such as "short circuit", "hole misalignment" or "uneven etching"), defect quantity and percentage (such as short circuit defects accounting for 35% in a certain batch), defect coordinate distribution (such as concentrated at the PCB edge or in a specific area), associated equipment number (AOI number "AOI-05", VRS number "VRS-02", etc.), production information (batch number "B20240701", layer "top", inspection start time (such as "2023-05-01 09:15:30") and inspection end time (such as "2023-05-01 09:18:25"), etc.).

[0125] S402, based on key information, determine the associated testing equipment, associated production processes, and testing links.

[0126] As a specific solution rather than a limitation, the association logic of this step S402 can be: Associate detection equipment: locate the specific AOI equipment (such as AOI-03) by the "AOI number" and locate the specific VRS equipment (such as VRS-08) by the "VRS number";

[0127] Associated production processes: Match the corresponding production process based on the defect type code (e.g., "SC" (short circuit) is associated with the etching process, "DR" (hole deviation) is associated with the drilling process);

[0128] Related detection steps: True defects correspond to the "AOI detection step" (initial judgment is correct), and false defects correspond to the "AOI misjudgment step".

[0129] S403, based on associated testing equipment, associated production processes and testing links, traces back process defects or equipment parameter defects.

[0130] As a specific solution rather than a limitation, the backtracking logic of this step S402 can be: if the false spot rate of the AOI-03 equipment for the "SC" defect exceeds 40% for three consecutive batches, and the coordinates of the false spots are concentrated in the center area of ​​the PCB, it is determined that the AOI equipment parameters are abnormal (such as lens focal length shift), and the optical system needs to be calibrated.

[0131] If the "SC" defects associated with the etching process account for more than 50% of a certain batch and are distributed irregularly, it is determined to be a production process defect (such as fluctuations in the concentration of the etching solution), and the etching process parameters need to be adjusted.

[0132] In this embodiment, after the aforementioned process defects or equipment parameter defects are confirmed, they can be sent to the corresponding management personnel via mobile terminals such as mobile phones, tablets, and laptops, or fixed terminals such as desktop computers and servers, in order to improve the efficiency of defect detection and troubleshooting.

[0133] This embodiment extracts key information by parsing general-format data, accurately linking inspection equipment, production processes, and inspection stages. It traces the root cause of defects for different linked objects. For linked inspection equipment, it can pinpoint issues such as lens contamination and abnormal parameters; for linked production processes, it can locate process defects such as uneven etching and drilling deviations; for inspection stages, it can distinguish between AOI missed or misjudged issues, achieving precise traceability from inspection data to the source of defects. This provides clear direction for equipment maintenance (such as AOI parameter calibration) and process optimization (such as adjusting etching solution concentration), effectively reducing the probability of similar defects recurring and improving the closed-loop management capability of PCB production quality and inspection efficiency.

[0134] Example 5:

[0135] Please refer to Figure 7 As shown, the present invention also provides a device for acquiring and processing VRS inspection board data, comprising:

[0136] The acquisition module 110 is used to acquire the initial data generated by AOI, the initial data including defect point data;

[0137] The first generation module 120 is used to generate an editable defect list based on the initial data. The editable defect list includes defect type, quantity, defect location information and associated production information.

[0138] The second generation module 130 is used to generate verified data based on the editable defect list and the re-inspection results.

[0139] The third generation module 140 is used to organize the verified data based on preset rules and generate general format data.

[0140] The modules in this embodiment are the same as the corresponding steps in the first embodiment described above, and will not be repeated here.

[0141] This invention, through its embodiments, acquires initial data generated by AOI, including defect point data; based on this initial data, generates an editable defect list, including defect type, quantity, defect location information, and associated production information; based on the editable defect list, generates verified data according to the re-inspection results; and organizes the verified data according to preset rules to generate general-format data. This optimizes the output and storage method of VRS inspection data, breaking through the limitation that data could only be queried within the software. It exports and stores accurate VRS re-inspection data in a general format (such as CSV or TXT), allowing the data to be directly read by general text editors or analysis tools, meeting users' needs for rapid data acquisition and retrieval, and providing basic data support for production quality analysis. Simultaneously, by establishing a structured storage system, it significantly improves data query and traceability efficiency. The standardized export format (such as CSV or TXT) supports seamless data transmission to other devices, systems, or applications, facilitating the construction of a cross-platform production data management system, laying the foundation for subsequent information management of the entire PCB production process, and improving the overall intelligence level of production management.

[0142] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional modules is used as an example. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device, and unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0143] This invention also provides a computer storage medium storing a computer program that, when executed by a processor, implements the VRS inspection data acquisition and processing methods as described in the above embodiments.

[0144] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments of the VRS board data acquisition and processing methods described above. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0145] Alternatively, if the integrated units of this invention are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of this invention, or the parts that contribute to related technologies, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, terminal, or network device, etc.) to execute all or part of the methods of the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, RAM, ROM, magnetic disks, or optical disks.

[0146] Corresponding to the computer storage medium described above, one embodiment also provides a computer device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the VRS inspection data acquisition and processing method as described in the above embodiments.

[0147] This computer device can be a terminal, and its internal structure diagram can be as follows: Figure 8 As shown, the computer device includes a processor, memory, network interface, display screen, and input devices connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The network interface is used to communicate with external terminals via a network connection. When the computer program is executed by the processor, it implements a method for acquiring and processing VRS board inspection data. The display screen can be an LCD screen or an e-ink display screen. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad mounted on the computer device casing, or an external keyboard, touchpad, or mouse.

[0148] This invention, through its embodiments, acquires initial data generated by AOI, including defect point data; based on this initial data, generates an editable defect list, including defect type, quantity, defect location information, and associated production information; based on the editable defect list, generates verified data according to the re-inspection results; and organizes the verified data according to preset rules to generate general-format data. This optimizes the output and storage method of VRS inspection data, breaking through the limitation that data could only be queried within the software. It exports and stores accurate VRS re-inspection data in a general format (such as CSV or TXT), allowing the data to be directly read by general text editors or analysis tools, meeting users' needs for rapid data acquisition and retrieval, and providing basic data support for production quality analysis. Simultaneously, by establishing a structured storage system, it significantly improves data query and traceability efficiency. The standardized export format (such as CSV or TXT) supports seamless data transmission to other devices, systems, or applications, facilitating the construction of a cross-platform production data management system, laying the foundation for subsequent information management of the entire PCB production process, and improving the overall intelligence level of production management.

[0149] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0150] The above embodiments merely illustrate several implementation methods of the present invention, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention patent should be determined by the appended claims.

Claims

1. A method for acquiring and processing VRS inspection board data, characterized in that, include: Obtain the initial data generated by AOI, the initial data including defect point data; Based on the initial data, an editable defect list is generated, which includes defect type, quantity, defect location information, and associated production information; Based on the editable defect list, verified data is generated according to the re-inspection results; Based on preset rules, the verified data is organized to generate data in a general format; The step of organizing the verified data based on preset rules to generate general format data includes: After each PCB surface layer has been re-inspected, a TXT file is created in the first file directory according to the first naming rule. The first naming rule includes the batch number, serial number, and surface layer. According to the preset order, the basic PCB information and verified data are written into the TXT file corresponding to the PCB surface layer; The step of writing the PCB basic information and verified data into the TXT file corresponding to the PCB surface layer according to a preset order includes: Read the OEW operation record data to determine the basic PCB information, which includes the operator, VRS equipment number, AOI equipment number, engineering part number, work order batch number, layer, production sequence number, inspection start time and inspection end time. At the end of the OEW board inspection, based on the PCB's ODB++ engineering data and the verified data, determine the total number of SETs, the total number of Pieces, the defect type, and the total number of corresponding defect types. Based on the PCB unit number, SET unit location distribution, Piece unit location distribution and the verified data in the ODB++ project data, determine the ID status information of each SET unit and Piece unit, and store it according to the preset data format; Based on the ID status information of each SET unit and Piece unit, the number of defective SETs and defective Pieces are determined. According to the preset order, the PCB basic information, as well as the total number of SETs, the number of defective SETs, the ID status information of the SET unit, the total number of Pieces, the number of defective Pieces, the ID status information of the Piece unit, the defect type, and the total number of corresponding defect types are written into the TXT file corresponding to the PCB surface layer.

2. The method as described in claim 1, characterized in that, The step of organizing the verified data based on preset rules to generate general format data includes: After each PCB surface layer has been re-inspected, the verified data is counted, the defect codes are classified and counted, and the target inspection board data for the corresponding surface layer is generated. Create four folders named PCB, Panel, Set, and Piece in the second file directory, each named after a PCB level unit; According to the second naming rule, the target inspection plate data is created in CSV format and placed in the folder of the corresponding level unit. The second naming rule includes AOI number, part number, layer, batch number and date.

3. The method as described in claim 2, characterized in that, After each PCB surface layer has been re-inspected, the verified data is statistically analyzed, defect codes are classified and counted, and target inspection board data for the corresponding surface layer is generated, including: The system collects and analyzes verified data, classifies and counts defects based on defect type codes, and generates statistical results of defects in the inspected surfaces of the current PCB. Based on the defect point coordinate data, the defect points distributed in each Piece and Set unit are counted again to obtain the number and type of defect points in each Piece and Set unit, and the target inspection data of this layer based on each level unit is generated.

4. The method according to any one of claims 1 to 3, characterized in that, The defect point data includes defect point number, defect type code, defect coordinates, and confidence gradient. After organizing the verified data according to preset rules to generate general format data, the process also includes: Based on the general format data and the initial data, determine the true and false information of each defect point data; Based on the information about true and false points, determine the defect type code and defect coordinates of the false point defect; Based on the defect coordinates, quantity, and distribution status of false point defects of the same defect type, reset the confidence gradient of the corresponding PCB part number so that the gradient value of the confidence gradient corresponds to the distribution status. AOI operations for the corresponding PCB part number are performed based on the reset confidence gradient.

5. The method according to any one of claims 1 to 3, characterized in that, After organizing the verified data based on preset rules to generate general format data, the process also includes: Parse common format data to extract key information; Based on key information, identify associated testing equipment, associated production processes, and testing procedures; Based on associated testing equipment, associated production processes, and testing links, process defects or equipment parameter defects can be traced back.

6. A device for acquiring and processing VRS inspection board data, characterized in that, include: The acquisition module is used to acquire the initial data generated by AOI, the initial data including defect point data; The first generation module is used to generate an editable defect list based on the initial data. The editable defect list includes defect type, quantity, defect location information and associated production information. The second generation module is used to generate verified data based on the editable defect list and the re-inspection results. The third generation module is used to organize the verified data based on preset rules and generate data in a general format. The third generation module is specifically used for: After each PCB surface layer has been re-inspected, a TXT file is created in the first file directory according to the first naming rule. The first naming rule includes the batch number, serial number, and surface layer. According to the preset order, the basic PCB information and verified data are written into the TXT file corresponding to the PCB surface layer; The step of writing the PCB basic information and verified data into the TXT file corresponding to the PCB surface layer according to a preset order includes: Read the OEW operation record data to determine the basic PCB information, which includes the operator, VRS equipment number, AOI equipment number, engineering part number, work order batch number, layer, production sequence number, inspection start time and inspection end time. At the end of the OEW board inspection, based on the PCB's ODB++ engineering data and the verified data, determine the total number of SETs, the total number of Pieces, the defect type, and the total number of corresponding defect types. Based on the PCB unit number, SET unit location distribution, Piece unit location distribution and the verified data in the ODB++ project data, determine the ID status information of each SET unit and Piece unit, and store it according to the preset data format; Based on the ID status information of each SET unit and Piece unit, the number of defective SETs and defective Pieces are determined. According to the preset order, the PCB basic information, as well as the total number of SETs, the number of defective SETs, the ID status information of the SET unit, the total number of Pieces, the number of defective Pieces, the ID status information of the Piece unit, the defect type, and the total number of corresponding defect types are written into the TXT file corresponding to the PCB surface layer.

7. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the VRS inspection data acquisition and processing method as described in any one of claims 1 to 5.

8. A computer storage medium having a computer program stored thereon, characterized in that, When executed by the processor, the program implements the method for acquiring and processing VRS inspection data as described in any one of claims 1 to 5.

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