Method and device for detecting fault of household appliance, and household appliance

Abstract

The invention relates to the technical field of household appliance detection, and discloses a method for detecting faults of electronic components of a household appliance, the household appliance is provided with an electronic component matrix and a microcontroller MCU, and the MCU is provided with CS pins respectively corresponding to the electronic components in the electronic component matrix; one end of each electronic component is connected with a corresponding CS pin in the microcontroller MCU; the method comprises the following steps: acquiring the instantaneous voltage of each CS pin; the instantaneous voltage of each CS pin is compared with a preset threshold voltage, a comparison result corresponding to each CS pin is obtained, and the comparison result is used for representing whether an electronic element corresponding to each CS pin is short-circuited or open-circuited; and the comparison result is stored in a register. According to the application, the MCU of the household appliance can conveniently obtain the comparison result, so that the household appliance can detect the fault condition of the lamp beads in the electronic element matrix by himself / herself. The invention also discloses a device for detecting the fault of the electronic component of the household appliance and the household appliance.

Description

Technical Field

[0001] This application relates to the field of home appliance testing technology, and in particular to a method and apparatus for detecting faults in home appliances, and home appliances. Background Technology

[0002] Existing home appliances may contain electronic component matrices, and these components may malfunction, such as short circuits or open circuits. A malfunction can affect not only the display quality of the electronic component matrix but also the overall performance of the appliance. Therefore, fault detection of the LEDs within the electronic component matrix is ​​crucial.

[0003] It should be noted that the information disclosed in the background section above is only used to enhance the understanding of the background of this application, and therefore may include information that does not constitute prior art known to those skilled in the art. Summary of the Invention

[0004] To provide a basic understanding of some aspects of the disclosed embodiments, a brief summary is given below. This summary is not intended as a general commentary, nor is it intended to identify key / important components or describe the scope of protection of these embodiments, but rather as a prelude to the detailed description that follows.

[0005] This disclosure provides a method and apparatus for detecting faults in home appliances, and home appliances that can perform fault detection on the electronic component matrix of the home appliances.

[0006] In some embodiments, a method for detecting faults in home appliances includes an electronic component matrix and a microcontroller unit (MCU). The MCU has CS pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the MCU. The method includes: acquiring the instantaneous voltage of each CS pin; comparing the instantaneous voltage of each CS pin with a preset threshold voltage to obtain a comparison result corresponding to each CS pin, wherein the comparison result is used to characterize whether the electronic component corresponding to the CS pin is short-circuited or open-circuited; and storing the comparison result in a register.

[0007] Further, the preset threshold voltage is an open-circuit detection threshold voltage; the instantaneous voltage of the CS pin is compared with the preset threshold voltage to obtain the comparison result corresponding to the CS pin, including:

[0008] If the instantaneous voltage of the CS pin is higher than the open circuit detection threshold voltage, a first comparison result is obtained, which indicates that the electronic component corresponding to the CS pin whose instantaneous voltage is higher than the open circuit detection threshold voltage is open; otherwise, a second comparison result is obtained, which indicates that the electronic component corresponding to the CS pin whose instantaneous voltage is not higher than the open circuit detection threshold voltage is not open.

[0009] Further, the preset threshold voltage is a short-circuit detection threshold voltage; comparing the instantaneous voltage of the CS pin with the preset threshold voltage to obtain the comparison result corresponding to the CS pin includes:

[0010] If the instantaneous voltage of the CS pin is lower than the short-circuit detection threshold voltage, a third comparison result is obtained, which indicates that the electronic component corresponding to the CS pin with the instantaneous voltage lower than the short-circuit detection threshold voltage is short-circuited; otherwise, a fourth comparison result is obtained, which indicates that the electronic component corresponding to the CS pin with the instantaneous voltage not lower than the short-circuit detection threshold voltage is not short-circuited.

[0011] Furthermore, the MCU also has SW pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the microcontroller MCU through a series resistor, and the other end of each electronic component is connected to the corresponding SW pin in the MCU. After obtaining the fourth comparison result, the MCU also includes: obtaining the power supply voltage, obtaining the voltage drop on each SW pin, obtaining the forward voltage of each electronic component, and obtaining the voltage of each series resistor. Based on the power supply voltage, the voltage drop on each SW pin, the forward voltage of each electronic component, and the voltage of each series resistor, the MCU determines whether each electronic component is short-circuited.

[0012] Furthermore, the instantaneous voltage of each CS pin is obtained, including: obtaining the instantaneous voltage of each CS pin when receiving an instruction sent by the MCU; or obtaining the instantaneous voltage of each CS pin at preset time intervals.

[0013] Furthermore, after storing the comparison result in the register, the method further includes: triggering the register to send the comparison result to the MCU.

[0014] Furthermore, after the trigger register sends the comparison result to the MCU, the process also includes: the MCU determining whether the electronic component matrix is ​​faulty based on the received comparison result, and sending the fault status of the electronic component matrix to the server.

[0015] Furthermore, the electronic component matrix is ​​an LED matrix, and the electronic components are LED beads. After the trigger register sends the comparison result to the MCU, it also includes: the MCU determines whether the LED matrix is ​​faulty based on the received comparison result, and if the LED matrix is ​​not faulty, triggers the LED matrix to display a preset pattern.

[0016] In some embodiments, an apparatus for detecting faults in home appliances includes an electronic component matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the MCU. The apparatus includes: an acquisition module configured to acquire the instantaneous voltage of each CS pin; a comparison module configured to compare the instantaneous voltage of each CS pin with a preset threshold voltage to obtain a comparison result corresponding to each CS pin, the comparison result being used to characterize whether the electronic component corresponding to the CS pin is short-circuited or open-circuited; and a storage module configured to store the comparison result in a register.

[0017] In some embodiments, a home appliance is provided with an electronic component matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the microcontroller (MCU). The home appliance is also provided with the aforementioned device for detecting faults in the home appliance.

[0018] The method, apparatus, and household appliance for detecting faults provided in this disclosure can achieve the following technical effects:

[0019] By acquiring the instantaneous voltage of each CS pin and comparing it with a preset threshold voltage, a comparison result can be obtained to characterize whether the LED corresponding to the CS pin is short-circuited or open-circuited. After storing the comparison result in a register, the MCU of the home appliance can easily obtain the comparison result, so that the home appliance can detect the LED fault status in the electronic component matrix itself.

[0020] The above general description and the description below are exemplary and illustrative only and are not intended to limit this application. Attached Figure Description

[0021] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations and drawings do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are shown as similar elements. The drawings are not to be scaled. And wherein:

[0022] Figure 1 This is a schematic diagram of an LED matrix provided in an embodiment of this disclosure;

[0023] Figure 2 This is a schematic diagram illustrating the connection principle of an LED lamp bead provided in an embodiment of this disclosure;

[0024] Figure 3 This is a schematic diagram of a method for detecting LED faults in a refrigerator provided in an embodiment of this disclosure;

[0025] Figure 4 This is a schematic diagram of another method for detecting LED faults in a refrigerator provided in an embodiment of this disclosure;

[0026] Figure 5 This is a schematic diagram of another method for detecting LED faults in a refrigerator provided in an embodiment of this disclosure;

[0027] Figure 6 This is a schematic diagram of a device for detecting LED faults in a refrigerator, provided in an embodiment of this disclosure. Detailed Implementation

[0028] To provide a more detailed understanding of the features and technical content of the embodiments of this disclosure, the implementation of the embodiments of this disclosure will be described in detail below with reference to the accompanying drawings. The accompanying drawings are for illustrative purposes only and are not intended to limit the embodiments of this disclosure. In the following technical description, for ease of explanation, several details are used to provide a full understanding of the disclosed embodiments. However, one or more embodiments may still be implemented without these details. In other cases, well-known structures and devices may be simplified in their depiction to simplify the drawings.

[0029] The terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this disclosure are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this disclosure described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion.

[0030] Unless otherwise stated, the term "multiple" means two or more.

[0031] In this embodiment of the disclosure, the character " / " indicates that the objects before and after it are in an "or" relationship. For example, A / B means: A or B.

[0032] The term "and / or" describes an association between objects, indicating that three relationships can exist. For example, A and / or B means: A or B, or A and B.

[0033] The term "correspondence" can refer to an association or binding relationship. The correspondence between A and B means that there is an association or binding relationship between A and B.

[0034] This application discloses a method for detecting faults in home appliances. The home appliances are equipped with an electronic component matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the MCU. The method includes: acquiring the instantaneous voltage of each CS pin; comparing the instantaneous voltage of each CS pin with a preset threshold voltage to obtain a comparison result for each CS pin, the comparison result being used to characterize whether the electronic component corresponding to the CS pin is short-circuited or open-circuited; and storing the comparison result in a register. In this application, the electronic components include LED beads, resistors, capacitors, inductors, transistors, etc., and the corresponding electronic components include LED matrices, resistor matrices, capacitor matrices, inductor matrices, and transistor matrices. Home appliances include refrigerators, air conditioners, washing machines, televisions, etc.

[0035] With the continuous development of technology, home appliances are gradually moving towards intelligence and user-friendliness. Refrigerators, as an important household appliance, are also constantly innovating in both function and design. In recent years, more and more refrigerators have begun to incorporate LED matrices, which not only enhance their appearance but also provide users with more information display and interactive functions.

[0036] An LED matrix is ​​a display module composed of multiple LED beads, offering advantages such as high brightness, rich colors, and low power consumption. Installing an LED matrix on a refrigerator can achieve various functions, such as temperature display, food preservation reminders, and energy-saving mode prompts. Furthermore, LED matrices can be programmed to create personalized display effects, such as dynamic patterns and holiday greetings, providing users with a more enjoyable experience.

[0037] While LED matrices offer numerous advantages, the individual LED chips can still malfunction, such as short circuits or open circuits. These malfunctions not only affect the display quality of the LED matrix but can also impact the overall performance of the refrigerator. Therefore, fault detection of the LED chips within the LED matrix is ​​crucial.

[0038] In this embodiment, the refrigerator includes an LED matrix, a microcontroller (MCU), and a detection chip. The MCU has CS pins corresponding to each LED in the LED matrix; one end of each LED is connected to the corresponding CS pin in the MCU. The detection chip is connected to each CS pin to obtain the instantaneous voltage of each CS pin. Figure 1 and Figure 2As shown, the LED matrix consists of m rows and n columns of LED beads 1, where m and n are positive integers. One end of each LED bead 1 is connected to the CS pin of MCU3 via a series resistor 2, and the other end is connected to the SW pin of MCU3. The first input of the first comparator 4 is connected to the power supply voltage, and the second input of the first comparator 4 is connected between the CS pin of the MCU and the series resistor 2. It is important to note that there is a corresponding first comparator 4 for each LED bead. The first input of the second comparator 5 is grounded, and the second input of the second comparator 5 is connected between the SW pin of the MCU and the LED bead. It is important to note that there is a corresponding second comparator 5 for each LED bead. The first comparator 4 and the second comparator 5 are respectively connected to the detection chip 6. The detection chip 6 stores the comparator output results into its internal register. The MCU is connected to the detection chip 6. The MCU reads the data stored in the register via the I2C interface. The register can also automatically send data to the MCU. It is important to note that there is a corresponding detection chip for each LED bead. It's important to note that the number of rows of LEDs corresponds to the number of CS pins on the MCU, and the number of columns of LEDs corresponds to the number of SW pins on the MCU.

[0039] like Figure 3 As shown, in some embodiments, a method for detecting LED faults in a refrigerator is provided. The refrigerator is equipped with an LED matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each LED in the LED matrix. One end of each LED is connected to the corresponding CS pin in the MCU. The method for detecting LED faults in a refrigerator includes:

[0040] Step S101: The detection chip acquires the instantaneous voltage of each CS pin;

[0041] Step S102: The detection chip compares the instantaneous voltage of each CS pin with the preset threshold voltage to obtain the comparison result corresponding to each CS pin. The comparison result is used to characterize whether the LED corresponding to the CS pin is short-circuited or open-circuited.

[0042] In step S103, the detection chip stores the comparison result in a register.

[0043] By acquiring the instantaneous voltage of each CS pin and comparing it with a preset threshold voltage, a comparison result can be obtained to characterize whether the LED corresponding to the CS pin is short-circuited or open-circuited. After storing the comparison result in a register, the refrigerator's MCU can easily obtain the comparison result, so that the refrigerator can detect the fault status of the LEDs in the LED matrix.

[0044] Further, the preset threshold voltage is an open-circuit detection threshold voltage; the instantaneous voltage of the CS pin is compared with the preset threshold voltage to obtain the comparison result corresponding to the CS pin, including:

[0045] If the instantaneous voltage of the CS pin is higher than the open circuit detection threshold voltage, a first comparison result is obtained, which indicates that the LED corresponding to the CS pin with the instantaneous voltage higher than the open circuit detection threshold voltage is open; otherwise, a second comparison result is obtained, which indicates that the LED corresponding to the CS pin with the instantaneous voltage not higher than the open circuit detection threshold voltage is not open.

[0046] The above method enables the detection of whether an LED bead in an LED matrix is ​​open-circuited.

[0047] In some embodiments, the open-circuit detection threshold voltage is the supply voltage PVCC - 0.4V, used to detect open-circuit faults in the LED. If the voltage at the CS pin corresponding to the LED is higher than the open-circuit detection threshold voltage (PVCC - 0.4V), the corresponding output open-circuit detection bit is set to "1" to indicate that the LED is open; that is, the amplifier outputs "1" to the register. Otherwise, the output of this bit is "0," meaning the amplifier outputs "0" to the register, which also indicates that the LED is not open-circuited.

[0048] Further, the preset threshold voltage is a short-circuit detection threshold voltage; comparing the instantaneous voltage of the CS pin with the preset threshold voltage to obtain the comparison result corresponding to the CS pin includes:

[0049] If the instantaneous voltage of the CS pin is lower than the short-circuit detection threshold voltage, a third comparison result is obtained, which indicates that the LED corresponding to the CS pin with the instantaneous voltage lower than the short-circuit detection threshold voltage is short-circuited; otherwise, a fourth comparison result is obtained, which indicates that the LED corresponding to the CS pin with the instantaneous voltage not lower than the short-circuit detection threshold voltage is not short-circuited.

[0050] The above scheme enables the detection of short circuits in LEDs within an LED matrix. In some embodiments, the short circuit detection threshold voltage is preset to 1V to detect short circuit faults in the LEDs. If the voltage at the CS pin corresponding to the LED is lower than the short circuit detection threshold voltage (1V), the corresponding output short circuit detection bit is set to "1" to indicate a short circuit in the LED; that is, the amplifier outputs "1" to the register. Otherwise, the output of this bit is "0," meaning the amplifier outputs "0" to the register, which also indicates that the LED is not short-circuited.

[0051] Furthermore, the MCU also has SW pins corresponding to each LED in the LED matrix. One end of each LED is connected to the corresponding CS pin in the MCU via a series resistor, and the other end of each LED is connected to the corresponding SW pin in the MCU. After obtaining the fourth comparison result, the following is also included:

[0052] Obtain the power supply voltage, the voltage drop across each SW pin, the forward voltage of each LED, and the voltage across each series resistor; determine whether each LED is short-circuited based on the power supply voltage, the voltage drop across each SW pin, the forward voltage of each LED, and the voltage across each series resistor.

[0053] During some testing processes, abnormal phenomena may occur: the LED may be normally short-circuited, but the test result is '0' (no short circuit). When VCC is too low and the current is small, VCS may be too low. When VCS < 1V, the test result may show a short circuit. VCS is the instantaneous voltage of the CS pin. Therefore, for accurate detection, the key is to set appropriate register values, set sufficient VCC, and set appropriate PWM register values. VCC should be sufficient; preferably, in some embodiments, VCS is kept greater than 0.5V.

[0054] In some embodiments, VCS is calculated as VCC - VSW - VF_LED - VRCS, where VCS is the instantaneous voltage at the CS pin, VSW is the voltage drop across the SW pin, VF_LED is the forward voltage of the LED, and VRCS is the voltage across the series resistor. When VCS is less than 1V, the detection result is a short circuit. Optionally, VF_LED ranges from 1.6V to 3.6V. This method of further short-circuit detection ensures detection accuracy and allows for a more precise determination of the LED matrix's fault condition.

[0055] In some embodiments, when the series resistance RCS = 0Ω, the register sets a global current minimum value, IOUT(PEAK) is approximately 35mA, the total current of SW is 35x8 (8 channels SW) = 280mA, VSW is approximately 1Ωx280mA = 0.28V, and VCS = VCC - 0.28V, which can detect LED short circuits.

[0056] Furthermore, the instantaneous voltage of each CS pin is obtained, including:

[0057] Upon receiving a command from the MCU, acquire the instantaneous voltage of each CS pin; or, acquire the instantaneous voltage of each CS pin at preset time intervals.

[0058] Furthermore, after storing the comparison result in the register, the method further includes: triggering the register to send the comparison result to the MCU.

[0059] By sending the comparison results to the MCU, the refrigerator can understand the fault status of the LED matrix, making it easier to troubleshoot.

[0060] Furthermore, after the trigger register sends the comparison result to the MCU, the process also includes: the MCU determining whether the LED matrix is ​​faulty based on the received comparison result, and sending the fault status of the LED matrix to the server.

[0061] By using the refrigerator's MCU to send the comparison results to the server, the server can understand the fault status of the refrigerator's LED matrix, which facilitates centralized troubleshooting and helps to improve the design of the LED matrix in the future.

[0062] Furthermore, after the trigger register sends the comparison result to the MCU, it also includes:

[0063] The MCU determines whether the LED matrix is ​​faulty based on the received comparison result, and triggers the LED matrix to display a preset pattern if the LED matrix is ​​not faulty.

[0064] The refrigerator's MCU performs LED matrix fault self-checks, and then displays preset patterns when there are no faults, ensuring the normal and complete display of preset patterns.

[0065] like Figure 4 As shown, in some embodiments, a method for detecting LED malfunctions in a refrigerator is applied to the refrigerator's MCU. The method includes:

[0066] Step S201: Determine whether the preset time interval has been reached; if the preset time interval has been reached, proceed to step S202; otherwise, continue to proceed to step S201.

[0067] Step S202: Determine if the LED matrix is ​​faulty. If the LED matrix is ​​faulty, proceed to step S203; otherwise, proceed to step S204. The method for determining LED matrix faults is the same as the method described above for detecting LED chip faults in the LED matrix.

[0068] Step S203: Report the fault information of the faulty LED to the server. This fault information includes the location of the faulty LED and its fault code. Then, proceed to step S205. Since the LED matrix is ​​a matrix containing m rows and n columns of LEDs, the location of the faulty LED is determined by its row and column.

[0069] Step S204: Display the pattern according to the communication protocol. Then proceed to step S206.

[0070] Step S205: Determine the fault risk level of the LED matrix. If the fault risk level meets the preset conditions, send it to the preset user terminal and then end.

[0071] Step S206: Determine whether the pattern has been fully displayed. If yes, proceed to step S207; otherwise, end the process.

[0072] Step S207: Trigger the LED matrix to display the preset pattern.

[0073] The above solution can be applied to the usage scenarios after customers purchase the refrigerator. It can upload information to the server and notify users when the LED matrix fails, so that users can understand the LED failure status and risk level of the refrigerator. It can also perform LED matrix failure self-checks before displaying the pattern to ensure that the refrigerator's LED matrix can display normally.

[0074] like Figure 5 As shown, in some embodiments, a method for detecting LED malfunctions in a refrigerator is applied to the refrigerator's MCU. The method includes:

[0075] Step S301: A detection drive command is sent to the detection chip, triggering the chip to determine whether the LED matrix is ​​faulty. If the LED matrix is ​​faulty, step S302 is executed; if the LED matrix is ​​not faulty, step S303 is executed. The method for determining LED matrix faults uses the method described above for detecting LED chip faults.

[0076] Step S302: Report the fault information of the faulty LED to the server. This fault information includes the location of the faulty LED and its fault code; then the process ends. Since the LED matrix is ​​a matrix containing m rows and n columns of LEDs, the location of the faulty LED is determined by its row and column position.

[0077] Step S303: Report the information indicating that the LED matrix is ​​fault-free according to the communication protocol, and then complete the process.

[0078] The above solution can be applied to the detection scenario when generating refrigerators. It can upload the fault information when the LED matrix fails, which makes it easier to rework refrigerators with LED matrix failures. It can also report information indicating that the LED matrix is ​​fault-free when there is no fault, which facilitates the detection of the refrigerator and determines whether the refrigerator can be safely taken off the production line.

[0079] Combination Figure 6As shown, this embodiment of the present disclosure provides a device 600 for detecting LED faults in a refrigerator. The refrigerator is equipped with an LED matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each LED in the LED matrix; one end of each LED is connected to the corresponding CS pin in the MCU. The device 600 for detecting LED faults in a refrigerator includes an acquisition module 601, a comparison module 602, and a storage module 603. The acquisition module 601 is configured to acquire the instantaneous voltage of each CS pin; the comparison module 602 is configured to compare the instantaneous voltage of each CS pin with a preset threshold voltage to obtain a comparison result corresponding to each CS pin. The comparison result is used to characterize whether the LED corresponding to the CS pin is short-circuited or open-circuited; the storage module 603 is configured to store the comparison result in a register.

[0080] By acquiring the instantaneous voltage of each CS pin and comparing it with a preset threshold voltage, a comparison result can be obtained to characterize whether the LED corresponding to the CS pin is short-circuited or open-circuited. After storing the comparison result in a register, the refrigerator's MCU can easily obtain the comparison result, so that the refrigerator can detect the fault status of the LEDs in the LED matrix.

[0081] Furthermore, the preset threshold voltage is the open-circuit detection threshold voltage; the comparison module 602 compares the instantaneous voltage of the CS pin with the preset threshold voltage in the following way to obtain the comparison result corresponding to the CS pin:

[0082] If the instantaneous voltage of the CS pin is higher than the open circuit detection threshold voltage, a first comparison result is obtained, which indicates that the LED corresponding to the CS pin with an instantaneous voltage higher than the open circuit detection threshold voltage is open; otherwise, a second comparison result is obtained, which indicates that the LED corresponding to the CS pin with an instantaneous voltage not higher than the open circuit detection threshold voltage is not open.

[0083] Furthermore, the preset threshold voltage is the short-circuit detection threshold voltage; the comparison module 602 compares the instantaneous voltage of the CS pin with the preset threshold voltage in the following way to obtain the comparison result corresponding to the CS pin:

[0084] If the instantaneous voltage of the CS pin is lower than the short-circuit detection threshold voltage, a third comparison result is obtained, which indicates that the LED corresponding to the CS pin with an instantaneous voltage lower than the short-circuit detection threshold voltage is short-circuited; otherwise, a fourth comparison result is obtained, which indicates that the LED corresponding to the CS pin with an instantaneous voltage not lower than the short-circuit detection threshold voltage is not short-circuited.

[0085] Furthermore, the MCU also has SW pins corresponding to each LED in the LED matrix. One end of each LED is connected to the corresponding CS pin in the MCU via a series resistor, and the other end of each LED is connected to the corresponding SW pin in the MCU. The device 600 for detecting refrigerator LED faults also includes a short-circuit detection module. After the comparison module obtains the fourth comparison result, the short-circuit detection module performs the following operations:

[0086] Obtain the power supply voltage, obtain the voltage drop on each SW pin, obtain the forward voltage of each LED, and obtain the voltage of each series resistor;

[0087] Determine whether each LED is short-circuited based on the power supply voltage, the voltage drop on each SW pin, the forward voltage of each LED, and the voltage of each series resistor.

[0088] Furthermore, the acquisition module 601 acquires the instantaneous voltage of each CS pin in the following manner:

[0089] Upon receiving a command from the MCU, acquire the instantaneous voltage of each CS pin; or, acquire the instantaneous voltage of each CS pin at preset time intervals.

[0090] Furthermore, the device 600 for detecting refrigerator LED faults also includes a transmission control module. After the storage module stores the comparison result into the register, the transmission control module performs the following operation: triggering the register to send the comparison result to the MCU.

[0091] Furthermore, after the control module triggers the register to send the comparison result to the MCU, the MCU determines whether the LED matrix is ​​faulty based on the received comparison result and sends the fault status of the LED matrix to the server.

[0092] Furthermore, after the control module triggers the register to send the comparison result to the MCU, the MCU determines whether the LED matrix is ​​faulty based on the received comparison result, and if the LED matrix is ​​not faulty, it triggers the LED matrix to display a preset pattern.

[0093] This disclosure provides a refrigerator equipped with an LED matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each LED in the LED matrix. One end of each LED is connected to the corresponding CS pin in the MCU, and the other end is connected to the SW pin of the MCU. The refrigerator also includes the aforementioned device for detecting LED faults in the refrigerator, to implement the aforementioned method for detecting LED faults in the refrigerator.

[0094] By acquiring the instantaneous voltage of each CS pin and comparing it with a preset threshold voltage, a comparison result can be obtained to characterize whether the LED corresponding to the CS pin is short-circuited or open-circuited. After storing the comparison result in a register, the refrigerator's MCU can easily obtain the comparison result, so that the refrigerator can detect the fault status of the LEDs in the LED matrix.

[0095] The foregoing description and accompanying drawings fully illustrate embodiments of this disclosure to enable those skilled in the art to practice them. Other embodiments may include structural, logical, electrical, procedural, and other changes. The embodiments represent only possible variations. Individual components and functions are optional unless explicitly required, and the order of operation may vary. Parts and features of some embodiments may be included in or replace parts and features of other embodiments. Moreover, the terminology used in this application is for describing embodiments only and is not intended to limit the claims. As used in the description of embodiments and claims, the singular forms “a,” “an,” and “the” are intended to equally include the plural forms unless the context clearly indicates otherwise. Similarly, the term “and / or” as used in this application means including one or more of the associated listed items and all possible combinations thereof. Additionally, when used in this application, the term "comprise" and its variations "comprises" and / or "comprising" refer to the presence of stated features, integrals, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components, and / or groups thereof. Without further limitations, an element defined by the phrase "comprises a..." does not exclude the presence of other identical elements in the process, method, or apparatus that includes said element. In this document, each embodiment may focus on the differences from other embodiments, and similar or identical parts between embodiments can be referred to mutually. For methods, products, etc., disclosed in the embodiments, if they correspond to the method section disclosed in the embodiments, the relevant parts can be referred to the description of the method section.

[0096] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the embodiments of this disclosure. Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0097] The methods and products (including but not limited to devices and equipment) disclosed in the embodiments herein can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For instance, the division of units may be merely a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the shown or discussed units may be through some interfaces, and the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the units may be selected to implement this embodiment according to actual needs. Furthermore, the functional units in the embodiments of this disclosure may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0098] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to embodiments of this disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. In some alternative implementations, the functions marked in the blocks may occur in a different order than that shown in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. In the descriptions corresponding to the flowcharts and block diagrams in the accompanying drawings, the operations or steps corresponding to different blocks may also occur in a different order than disclosed in the description, and sometimes there is no specific order between different operations or steps. For example, two consecutive operations or steps may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. Each block in a block diagram and / or flowchart, and combinations of blocks in a block diagram and / or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions.

Claims

1. A method for detecting faults in household appliances, characterized in that, The home appliance is equipped with an electronic component matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the MCU. The method includes: Obtain the instantaneous voltage of each CS pin; The instantaneous voltage of each CS pin is compared with a preset threshold voltage to obtain the comparison result corresponding to each CS pin. The comparison result is used to characterize whether the electronic component corresponding to the CS pin is short-circuited or open-circuited. The comparison result is stored in a register.

2. The method according to claim 1, characterized in that, The preset threshold voltage is an open-circuit detection threshold voltage; the instantaneous voltage of the CS pin is compared with the preset threshold voltage to obtain the comparison result corresponding to the CS pin, including: If the instantaneous voltage of the CS pin is higher than the open circuit detection threshold voltage, a first comparison result is obtained, which indicates that the electronic component corresponding to the CS pin whose instantaneous voltage is higher than the open circuit detection threshold voltage is open; otherwise, a second comparison result is obtained, which indicates that the electronic component corresponding to the CS pin whose instantaneous voltage is not higher than the open circuit detection threshold voltage is not open.

3. The method according to claim 1, characterized in that, The preset threshold voltage is a short-circuit detection threshold voltage; the instantaneous voltage of the CS pin is compared with the preset threshold voltage to obtain the comparison result corresponding to the CS pin, including: If the instantaneous voltage of the CS pin is lower than the short-circuit detection threshold voltage, a third comparison result is obtained, which indicates that the electronic component corresponding to the CS pin with the instantaneous voltage lower than the short-circuit detection threshold voltage is short-circuited; otherwise, a fourth comparison result is obtained, which indicates that the electronic component corresponding to the CS pin with the instantaneous voltage not lower than the short-circuit detection threshold voltage is not short-circuited.

4. The method according to claim 3, characterized in that, The MCU also has SW pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the microcontroller MCU through a series resistor, and the other end of each electronic component is connected to the corresponding SW pin in the MCU. After obtaining the fourth comparison result, it also includes: Obtain the power supply voltage, obtain the voltage drop on each SW pin, obtain the forward voltage of each electronic component, and obtain the voltage of each series resistor; Determine whether a short circuit has occurred in any electronic component based on the power supply voltage, the voltage drop across each SW pin, the forward voltage of each electronic component, and the voltage across each series resistor.

5. The method according to claim 3, characterized in that, Obtain the instantaneous voltage of each CS pin, including: Upon receiving a command from the MCU, acquire the instantaneous voltage of each CS pin; or, acquire the instantaneous voltage of each CS pin at preset time intervals.

6. The method according to claim 1, characterized in that, After storing the comparison result in the register, the process also includes: The trigger register sends the comparison result to the MCU.

7. The method according to claim 6, characterized in that, After the trigger register sends the comparison result to the MCU, it also includes: The MCU determines whether the electronic component matrix is ​​faulty based on the received comparison results and sends the fault information of the electronic component matrix to the server.

8. The method according to claim 6, characterized in that, The electronic component matrix is ​​an LED matrix, and the electronic components are LED beads. After the trigger register sends the comparison result to the MCU, it also includes: The MCU determines whether the LED matrix is ​​faulty based on the received comparison result, and triggers the LED matrix to display a preset pattern if the LED matrix is ​​not faulty.

9. A device for detecting malfunctions in household appliances, characterized in that, The home appliance is equipped with an electronic component matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the microcontroller (MCU). The device includes: The acquisition module is configured to acquire the instantaneous voltage of each CS pin; The comparison module is configured to compare the instantaneous voltage of each CS pin with a preset threshold voltage to obtain the comparison result corresponding to each CS pin. The comparison result is used to characterize whether the electronic component corresponding to the CS pin is short-circuited or open-circuited. The storage module is configured to store the comparison result into a register.

10. A household appliance, characterized in that, The home appliance is equipped with an electronic component matrix and a microcontroller (MCU). The MCU has CS pins corresponding to each electronic component in the electronic component matrix. One end of each electronic component is connected to the corresponding CS pin in the microcontroller (MCU). The home appliance is also equipped with a device for detecting faults in the home appliance as described in claim 9.

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