Component performance test method and system

Abstract

The application discloses a component performance test method and system, and relates to the technical field of automatic test. Theoretical parameter intervals of target test components are predicted according to target output voltage intervals and other related parameters. If actual parameters of the target test components exceed the theoretical parameter intervals during the test, it is determined that the performance of the target test components is poor. Therefore, the cause of substandard test data can be quickly determined, time wasted in repeated parameter adjustment and retest is saved, and test efficiency is improved.

Description

Technical Field

[0001] This application relates to the field of automated testing technology, and in particular to a method and system for testing component performance. Background Technology

[0002] The motherboard power supply is a very important part of the server. When testing the stability of the motherboard power supply, it is necessary to ensure that the combination of components such as voltage regulator (VR), inductor, and capacitor in the bill of materials (BOM) of the server board can meet the power supply requirements. In this process, the test data corresponding to the bill of materials (BOM) can be adjusted by debugging the VR chip firmware to make the test data reach the expected requirements.

[0003] Due to the inherent differences in materials, the actual measured values ​​of the materials used in the PCB assembly may differ from the nominal values ​​in the specification sheet. If test data fails to meet the standards during testing, it cannot be determined whether the cause is an abnormality in the performance of the inductors, capacitors, or other materials, or a mismatch in the VR chip firmware parameters. Staff usually need to repeatedly debug the VR chip firmware. Generally, only when the test data still fails to meet the standards after a long period of debugging will the PCB be disassembled and the inductors or capacitors replaced for verification to check whether the problem is with the materials.

[0004] Therefore, in the current testing process, it is impossible to determine in a timely manner why the test data does not meet the standards, resulting in low testing efficiency. Summary of the Invention

[0005] This application provides a component performance testing method and system to at least solve the problem of low testing efficiency in related technologies.

[0006] This application provides a method for testing the performance of components, including:

[0007] Based on the target output voltage range of the motherboard under test and the attribute data of the voltage regulator on the motherboard under test, the theoretical parameter range of the target test element in the voltage regulator is calculated. The target test element includes at least one of inductor and capacitor.

[0008] The motherboard under test is tested based on at least one test case to obtain the actual parameters of the target test component during the test process;

[0009] If the actual parameters exceed the theoretical parameter range, then the performance of the target test element is determined to be abnormal.

[0010] This application also provides a component performance testing system, including:

[0011] The host computer includes a memory for storing computer programs;

[0012] The host computer also includes a processor, used to implement the steps of the component performance testing method described above when executing the computer program;

[0013] At least one motherboard under test, the motherboard under test including a voltage regulator;

[0014] Each of the motherboards under test has a corresponding test fixture. The motherboard under test and the test fixture are connected by a connector. The test fixture is used to simulate the working environment of the motherboard under test based on the instructions of the host computer.

[0015] A data acquisition device is used to acquire current data and / or voltage data corresponding to the voltage regulator and transmit them to the host computer.

[0016] This application first predicts the theoretical parameter range of the target test element based on the target output voltage range and other relevant parameters. If the actual parameters of the target test element exceed the theoretical parameter range during the test, the performance of the target test element is determined to be poor. This allows for the rapid identification of the cause of substandard test data, saving the time wasted on repeated parameter adjustments and retesting, and improving test efficiency. Attached Figure Description

[0017] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a flowchart of a component performance testing method provided in an embodiment of this application;

[0019] Figure 2 This is a schematic diagram of a component performance testing system provided in an embodiment of this application;

[0020] Figure 3 This is a schematic diagram of a component performance testing system provided in another embodiment of this application;

[0021] Figure 4 This is a schematic diagram of the structure of the host computer provided in an embodiment of this application. Detailed Implementation

[0022] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0023] It should be noted that, in the description of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. The terms "first," "second," etc., in this application are used to distinguish similar objects and are not used to describe a specific order or sequence.

[0024] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0025] Figure 1 This is a flowchart illustrating a component performance testing method provided in an embodiment of this application. This method can be applied to... Figure 2 The host computer in the component performance testing system shown. For example... Figure 2 As shown, the component performance testing system includes a host computer 21, a Gen5 test fixture 22, a motherboard under test 23, a voltage acquisition device 24, and a current acquisition device 25. The Gen5 test fixture 22 is connected to the motherboard under test 23 via a connector. The host computer 21 is communicatively connected to the Gen5 test fixture 22, the voltage acquisition device 24, and the current acquisition device 25, respectively, for sending test parameters and test commands to the Gen5 test fixture 22 and acquiring data collected by the voltage acquisition device 24 and the current acquisition device 25. The voltage acquisition device 24 is used to acquire the voltage across the inductor of the voltage regulator on the motherboard under test 23, and the current acquisition device 25 is used to acquire the current of the voltage regulator.

[0026] The following is combined with Figure 2 The component performance testing system shown is for... Figure 1 The component performance testing method shown is described below, and the specific steps of the method are as follows:

[0027] S101. Based on the target output voltage range of the motherboard under test and the attribute data of the voltage regulator on the motherboard under test, calculate the theoretical parameter range of the target test element in the voltage regulator.

[0028] The target test element includes at least one of inductors and capacitors.

[0029] The target output voltage range of the motherboard under test refers to the required output voltage range that the motherboard under test must meet. During the test, if the actual output voltage of the motherboard under test can be stabilized within the target output voltage range, then the motherboard under test can be determined to meet the test requirements. If the actual output voltage of the motherboard under test cannot be stabilized within the target output voltage range, then the motherboard under test can be determined to not meet the test requirements. This may be due to inappropriate VR chip firmware parameters on the motherboard or poor performance of the target test component.

[0030] The attribute data of the voltage regulator refers to the inherent electrical parameters of the VR chip, including but not limited to the maximum load current, pulse width modulation frequency, etc.

[0031] The theoretical parameter range of the target test component refers to the allowable parameter fluctuation range of the inductor and capacitor while ensuring that the output voltage of the motherboard under test is within the target output voltage range.

[0032] S102. Test the motherboard under test based on at least one test case to obtain the actual parameters of the target test component during the test.

[0033] At least one test case is used to simulate the actual working scenario of the motherboard under test. Optionally, the motherboard under test is tested based on at least one test case, including simulating small signal stimuli such as minute load transitions, to obtain the output voltage response of the current VR chip and the target test component in the actual working scenario.

[0034] During the testing process, the actual parameters of the target test element refer to the real operating parameters of the inductor and capacitor under dynamic load. These actual parameters may differ from the nominal values ​​in the datasheet of the target test element.

[0035] The host computer controls the test fixture to simulate at least one actual working scenario based on at least one test case, and further obtains the actual parameters of inductance and / or voltage during the test through voltage acquisition device and current acquisition device.

[0036] S103. If the actual parameters exceed the theoretical parameter range, then the performance of the target test element is determined to be abnormal.

[0037] During the testing process, if the motherboard under test is found to be non-compliant with the test requirements, the actual parameters are compared with the theoretical parameter range. If the actual parameters exceed the theoretical parameter range, it means that the actual operating state of the target test component does not conform to the state predicted based on the target output voltage range and VR chip attribute data. It is determined that the performance of the target test component is abnormal and the component needs to be replaced before testing.

[0038] Alternatively, if the actual parameters do not exceed the theoretical parameter range, it means that the actual operating state of the target test component basically meets the expected state, and it is preliminarily determined that the performance of the target test component is normal. The firmware parameters of the VR chip need to be adjusted before testing.

[0039] This application embodiment first predicts the theoretical parameter range of the target test element based on the target output voltage range and other relevant parameters. If the actual parameters of the target test element exceed the theoretical parameter range during the test, the performance of the target test element is determined to be poor. This can quickly determine the cause of the test data not meeting the standard, save the time wasted by repeatedly adjusting parameters and retesting, and improve test efficiency.

[0040] The following describes how to calculate the theoretical parameter range of the target test element in the voltage regulator based on the target output voltage range of the motherboard under test and the attribute data of the voltage regulator on the motherboard under test.

[0041] When the target test element includes an inductor, the theoretical parameter range of the target test element includes the theoretical minimum inductance value and the theoretical maximum inductance value.

[0042] The theoretical minimum inductance value is calculated as follows:

[0043] .

[0044] in, This is the theoretical minimum inductance value. The power supply input voltage for the voltage regulator. The preset standard voltage value for the target output voltage range. This is the reciprocal of the pulse width modulation frequency of the voltage regulator. The maximum allowable fluctuation value of the inductor current is preset. When the fluctuation value of the inductor current is less than the maximum allowable fluctuation value, the output voltage of the motherboard under test is within the target output voltage range, and the ripple coefficient of the output voltage meets the preset coefficient requirements.

[0045] The theoretical maximum inductance value is calculated as follows:

[0046] .

[0047] in, This is the theoretical maximum inductance value. The maximum permissible transient voltage fluctuation within the target output voltage range. The preset voltage recovery time is the maximum allowable time for the output voltage of the tested motherboard to return to the target output voltage range after a load change. This represents the maximum load current jump value of the motherboard under test.

[0048] When the target test element includes a capacitor, the theoretical parameter range of the target test element includes the theoretical minimum capacitance value and the theoretical maximum capacitance value.

[0049] The theoretical minimum capacitance value is calculated as follows:

[0050] .

[0051] in, This is the theoretical minimum capacitance value. This is the load current; This is the reciprocal of the pulse width modulation frequency of the voltage regulator. The difference between the maximum value of the target output voltage range and the preset standard voltage value.

[0052] The theoretical maximum capacitance value is calculated as follows:

[0053] .

[0054] in, This is the theoretical maximum capacitance value. This is the load current; This is the reciprocal of the pulse width modulation frequency of the voltage regulator. This is the difference between the preset standard voltage value and the minimum value of the target output voltage range.

[0055] This embodiment provides a specific calculation method for the theoretical parameter range of the target test element, providing an accurate theoretical basis for comparing with the actual parameters of the target test element during the testing process, and improving the accuracy of component performance testing.

[0056] In some embodiments, when the target test element includes an inductor, the actual parameters include the actual inductance value of the inductor. The test is performed on the motherboard under test based on at least one test case to obtain the actual parameters of the target test element during the test, including: during the test, obtaining the first voltage change value of the voltage across the inductor and the current change value flowing through the inductor within a first unit time; and calculating the actual inductance value of the inductor within a first unit time based on the first voltage change value and the current change value.

[0057] In other embodiments, when the target test element includes a capacitor, the actual parameters include the actual capacitance value of the capacitor. The motherboard under test is tested based on at least one test case to obtain the actual parameters of the target test element during the test, including: during the test, obtaining the current value flowing through the capacitor in a second unit time and the second voltage change value of the voltage across the capacitor; and calculating the actual capacitance value of the capacitor in the second unit time based on the current value and the second voltage change value.

[0058] The first unit time and the second unit time refer to any unit of sampling time during the testing process.

[0059] Optional. The first unit time refers to the duration of the change in inductor current during the test.

[0060] The first voltage change is the voltage difference across the inductor during that time period, and the current change is the current difference flowing through the inductor during that time period. Specifically, the actual inductance value of the inductor within the first unit time is obtained by calculating the ratio of the product of the first voltage change and the length of the first unit time to the current change.

[0061] Optionally, the second unit time refers to the effective charging and discharging time of the capacitor during the test.

[0062] The second voltage change value is the voltage difference across the capacitor during that time period. Specifically, the actual capacitance value of the capacitor within the second unit time is obtained by calculating the ratio of the product of the current value and the length of the second unit time to the second voltage change value.

[0063] It is understandable that the first unit of time and the second unit of time can refer to the same time period.

[0064] Based on any of the above embodiments, after testing the motherboard under test based on at least one test case and obtaining the actual parameters of the target test element during the test, if the actual parameters do not exceed the theoretical parameter range, a response equation is constructed based on the correspondence between the input voltage of the motherboard under test and the actual parameters during the test. The response equation is used to represent the relationship between the actual parameters and the input voltage. The theoretical parameter range is mapped to the coordinate system where the response equation is located to obtain the theoretical parameter region. Based on the position of the response equation in the theoretical parameter region, the performance evaluation value of the target test element is determined.

[0065] During the test, the input voltage will fluctuate, and the actual parameters of the target test component need to change stably with the input voltage to ensure that the output voltage is stable.

[0066] Based on multiple actual parameters collected during the test and the corresponding input voltage for each actual parameter, a response equation for the actual parameter as a function of the input voltage is constructed.

[0067] Specifically, the theoretical parameter range includes the theoretical maximum value and the theoretical minimum value. Based on the position of the response equation within the theoretical parameter range, the performance evaluation value of the target test element is determined, including: calculating the area of ​​the first region formed by the curve corresponding to the response equation and the boundary of the theoretical parameter range corresponding to the theoretical maximum value; calculating the area of ​​the second region formed by the curve corresponding to the response equation and the boundary of the theoretical parameter range corresponding to the theoretical minimum value; and determining the performance evaluation value of the target test element based on the area difference between the areas of the first and second regions, wherein the performance evaluation value is negatively correlated with the area difference.

[0068] The theoretical parameter range is calculated before the test and does not change with the input voltage during the test. The corresponding theoretical parameter region is the area enclosed by the boundary of the input voltage value and the boundary corresponding to the theoretical maximum and theoretical minimum values. The response equation divides the theoretical parameter region into two parts: the first region between the boundary corresponding to the theoretical maximum value and the response equation, and the second region between the response equation and the boundary corresponding to the theoretical minimum value.

[0069] The smaller the area difference between the first and second regions, the closer the response equation is to the middle of the theoretical parameter region. The less likely the actual parameters of the target test element corresponding to the response equation are to exceed the theoretical parameter range, the better the performance of the target test element, and the higher the performance evaluation value.

[0070] The larger the area difference between the first region and the second region, the closer the position of the response equation is to the boundary in the theoretical parameter region. The greater the possibility that the actual parameters of the target test element corresponding to the response equation exceed the theoretical parameter range, the less likely it may be able to adapt to occasional large fluctuations in input voltage during actual use. Consequently, the performance of the target test element will be worse, and the performance evaluation value will be lower.

[0071] This application embodiment constructs a response equation, combines it with the theoretical parameter region corresponding to the theoretical parameter range, and performs a quantitative evaluation of the performance of the target test element whose actual parameters do not exceed the theoretical parameter range based on the relative position of the response equation in the theoretical parameter region. This provides an accurate basis for subsequent component selection and improves the accuracy of component performance testing methods.

[0072] In other embodiments, before constructing the response equation based on the correspondence between the input voltage of the motherboard under test and the actual parameters during the test, the method further includes: obtaining the actual maximum value and the actual minimum value in the actual parameters; if the difference between the actual maximum value and the actual minimum value is greater than a preset fluctuation threshold, then the performance of the target test element is determined to be abnormal.

[0073] The actual maximum and minimum values ​​reflect the stability of the target test element under different input voltages. If the difference between the actual maximum and minimum values ​​is greater than a preset fluctuation threshold, it indicates that the actual parameters of the target test element under certain input voltage conditions are close to the boundary of the theoretical parameter range, and its corresponding response equation shows a large trend of change. However, based on the area difference between the first region and the second region, it may be determined that it has a higher performance evaluation value. Therefore, before constructing the response equation, target test elements with unstable performance corresponding to the difference between the actual maximum and minimum values ​​being greater than the preset fluctuation threshold should be excluded.

[0074] This application embodiment eliminates unstable target test elements by first determining the difference between the actual maximum and minimum values ​​of the actual parameters of the target test element before constructing the response equation. This ensures the reliability of subsequent performance evaluation values, further improves the accuracy of performance testing, and reduces the computational load of constructing the response equation and obtaining performance evaluation values, thereby improving testing efficiency.

[0075] Based on any of the above embodiments, the motherboard under test includes a first motherboard and a second motherboard, the target test element includes a first element in the first motherboard and a second element in the second motherboard, the performance evaluation value of the target test element includes a first evaluation value of the first element and a second evaluation value of the second element, and the method further includes: if the difference between the first evaluation value and the second evaluation value is greater than a preset difference, then the performance of the first element and the second element is determined to be abnormal.

[0076] Correspondingly, Figure 3 This is a schematic diagram of a component performance testing system provided in another embodiment of this application. Figure 3 As shown, the component performance testing system includes a first host computer 31, a second host computer 32, a first Gen5 test fixture 33, a second Gen5 test fixture 34, a first motherboard 35, a second motherboard 36, a voltage acquisition device 37, and a current acquisition device 38. The first Gen5 test fixture 33 is connected to the first motherboard 35 via a connector, and the second Gen5 test fixture 34 is connected to the second motherboard 36 via a connector.

[0077] The first host computer 31 is communicatively connected to the first Gen5 test fixture 33, the voltage acquisition device 37, and the current acquisition device 38, respectively. It is used to send test parameters and test commands to the first Gen5 test fixture 33 and to acquire data collected by the voltage acquisition device 37 and the current acquisition device 38. The voltage acquisition device 37 is used to acquire the voltage across the inductor of the voltage regulator on the first motherboard 35, and the current acquisition device 38 is used to acquire the current of the voltage regulator on the first motherboard 35. The voltage acquisition device 37 is also used to acquire the voltage across the inductor of the voltage regulator on the second motherboard 36, and the current acquisition device 38 is also used to acquire the current of the voltage regulator on the second motherboard 36.

[0078] The second host computer 32 is communicatively connected to the second Gen5 test fixture 34 and is used to send test parameters and test commands to the second Gen5 test fixture 34. Optionally, the second host computer 32 sends test parameters and test commands to the second Gen5 test fixture 34 according to the instructions of the first host computer 31.

[0079] Based on such Figure 3The component performance testing system shown can simultaneously test two motherboards (first motherboard and second motherboard) and calculate the first evaluation value of the first component and the second evaluation value of the second component based on the collected voltage and current data.

[0080] For example, the bill of materials for the first motherboard could be a voltage regulator chip from Company A1 paired with an inductor from Company B1 and a capacitor from Company C1, while the bill of materials for the second motherboard could be a voltage regulator chip from Company A1 paired with an inductor from Company B2 and a capacitor from Company C2. The first evaluation value of the first component and the second evaluation value of the second component reflect the performance of different inductors and capacitors under the same voltage regulator chip driving circuit. At the same time, by comparing the first evaluation value and the second evaluation value, the performance of different components can be evaluated.

[0081] When the difference between the first and second evaluation values ​​is greater than the preset difference, since the first and second components have been preliminarily determined to meet the requirements based on the theoretical parameter range, the difference between their evaluation values ​​only comes from the difference in performance. Furthermore, the response equation of one component (the component with the higher performance evaluation value) must be located in the relatively middle position of the theoretical parameter region, while the response equation of the other component (the component with the lower performance evaluation value) must be located near the boundary of the theoretical parameter region. At this time, it can be quickly determined that the component with the lower performance evaluation value has poor performance. When the performance requirements of the components are strict, it can be judged as a component with abnormal performance.

[0082] In this embodiment of the application, when testing multiple motherboards under test, the difference between their performance evaluation values ​​can be used to quickly determine whether there are any potentially abnormal components, thereby further improving testing efficiency and accuracy.

[0083] Based on any of the above embodiments, if the performance of the target test element is normal, the batch number of the target test element is obtained; the preset firmware corresponding to the batch number is searched in the preset firmware library; and the control parameters of the voltage regulator are adjusted based on the preset firmware.

[0084] Alternatively, if there is no preset firmware corresponding to the batch number in the preset firmware library, then obtain the material parameters corresponding to at least one candidate firmware in the preset firmware library; determine the candidate firmware with the highest similarity between the material parameters and the actual parameters as the preset firmware.

[0085] If the target test component is functioning normally, further debugging of the voltage regulator's firmware parameters is required to ensure that the test data of the motherboard under test meets the expected requirements.

[0086] Optionally, firmware parameters include those of the proportional-integral-derivative (PID) controller, which directly determines the dynamic response quality of the voltage regulator, such as overshoot, undershoot, and recovery time.

[0087] The preset firmware library stores multiple candidate firmwares and their corresponding component batch numbers. The candidate firmwares are those optimized for a specific component during historical debugging. For the voltage regulator currently being debugged, since the actual parameters of components in the same batch are likely to be the same or similar, using the candidate firmware corresponding to the components in the same batch as the basis for firmware parameter debugging has a high probability of quickly debugging parameters that match the current target test component.

[0088] The preset firmware library also stores the bill of materials (BOM) for each candidate firmware, as well as the actual parameters of the components in the BOM, referred to as material parameters. When a preset firmware corresponding to the same batch number cannot be found, the corresponding preset firmware is determined based on the similarity between the actual parameters and material parameters of similar components. This allows for the rapid acquisition of candidate firmware corresponding to components with characteristics similar to the current target test component. Using this candidate firmware as the basis for firmware parameter debugging, there is a high probability that parameters matching the current target test component can be quickly debugged.

[0089] In this embodiment, during firmware debugging, a candidate firmware that has already been debugged and corresponds to a similar component is searched in a preset firmware library based on the batch number or actual parameters of the target test component as the basis for current debugging. This approach has a high probability of quickly debugging parameters that match the current target test component, thus improving the efficiency of parameter debugging.

[0090] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method.

[0091] An embodiment of this application also provides a host computer. Figure 4 This is a schematic diagram of the host computer structure provided in an embodiment of this application. Figure 4As shown, the host computer 40 includes a calculation module 41, a testing module 42, and a first determination module 43. The calculation module 41 is used to calculate the theoretical parameter range of the target test element in the voltage regulator based on the target output voltage range of the motherboard under test and the attribute data of the voltage regulator on the motherboard under test. The target test element includes at least one of inductor and capacitor. The testing module 42 is used to test the motherboard under test based on at least one test case to obtain the actual parameters of the target test element during the test. The first determination module 43 is used to determine that the performance of the target test element is abnormal if the actual parameters exceed the theoretical parameter range.

[0092] Optionally, the test module 42 includes a first test unit, used to acquire, during the test process, a first voltage change value across the inductor and a current change value flowing through the inductor within a first unit time when the target test element includes an inductor; and to calculate the actual inductance value of the inductor within the first unit time based on the first voltage change value and the current change value.

[0093] Optionally, the test module 42 includes a second test unit, used to acquire the current value flowing through the capacitor and the second voltage change value of the voltage across the capacitor during the test process when the target test element includes a capacitor; and to calculate the actual capacitance value of the capacitor during the second unit time based on the current value and the second voltage change value.

[0094] Optionally, the host computer 40 also includes an evaluation module, which includes a construction unit, a mapping unit, and a first determination unit. The construction unit is used to construct a response equation based on the correspondence between the input voltage of the motherboard under test and the actual parameters during the test if the actual parameters do not exceed the theoretical parameter range. The response equation is used to represent the relationship between the actual parameters and the input voltage. The mapping unit is used to map the theoretical parameter range to the coordinate system where the response equation is located to obtain the theoretical parameter region. The first determination unit is used to determine the performance evaluation value of the target test element based on the position of the response equation in the theoretical parameter region.

[0095] Optionally, the first determining unit is specifically used to calculate the area of ​​the first region formed by the boundary between the curve corresponding to the response equation and the theoretical parameter region corresponding to the theoretical maximum value; calculate the area of ​​the second region formed by the boundary between the curve corresponding to the response equation and the theoretical parameter region corresponding to the theoretical minimum value; and determine the performance evaluation value of the target test element based on the area difference between the area of ​​the first region and the area of ​​the second region, wherein the performance evaluation value is negatively correlated with the area difference.

[0096] Optionally, the evaluation module also includes a second determining unit, used to obtain the actual maximum and actual minimum values ​​in the actual parameters before constructing the response equation based on the correspondence between the input voltage of the motherboard under test and the actual parameters during the test; if the difference between the actual maximum and actual minimum values ​​is greater than a preset fluctuation threshold, then the performance of the target test element is determined to be abnormal.

[0097] Optionally, the motherboard under test includes a first motherboard and a second motherboard, the target test element includes a first element in the first motherboard and a second element in the second motherboard, the performance evaluation value of the target test element includes a first evaluation value of the first element and a second evaluation value of the second element, and the evaluation module further includes a third determining unit, used to determine the performance anomaly with the smallest performance evaluation value in the first element or the second element if the difference between the first evaluation value and the second evaluation value is greater than a preset difference.

[0098] Optionally, the host computer 40 also includes a debugging module, which includes an acquisition unit, a search unit, and a debugging unit. The acquisition unit is used to acquire the batch number of the target test component if the performance of the target test component is normal. The search unit is used to search for the preset firmware corresponding to the batch number from the preset firmware library. The debugging unit is used to debug the control parameters of the voltage regulator based on the preset firmware.

[0099] Optionally, the search unit is also used to obtain the material parameters corresponding to at least one candidate firmware in the preset firmware library if there is no preset firmware corresponding to the batch number in the preset firmware library; and determine the candidate firmware with the highest similarity between the material parameters and the actual parameters as the preset firmware.

[0100] For a description of the features in the embodiment corresponding to the host computer, please refer to the relevant description of the embodiment corresponding to the component performance testing method, which will not be repeated here.

[0101] Embodiments of this application also provide a component performance testing system, including: a host computer, which includes a memory for storing computer programs; the host computer also includes a processor for executing the computer programs to implement the steps of the above-described component performance testing method; the component performance testing system includes at least one motherboard under test, the motherboard under test including a voltage regulator; the component performance testing system also includes a test fixture corresponding to each motherboard under test, the motherboard under test and the test fixture are connected through a connector, the test fixture is used to simulate the working environment of the motherboard under test based on instructions from the host computer; the component performance testing system also includes a data acquisition device for acquiring current data and / or voltage data corresponding to the voltage regulator and transmitting it to the host computer.

[0102] Embodiments of this application also provide a computer-readable storage medium storing a computer program, wherein the computer program is configured to execute the steps in any of the above-described component performance testing method embodiments when run.

[0103] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.

[0104] The embodiments of this application also provide a computer program product, which includes a computer program that, when executed by a processor, implements the steps in any of the above-described component performance testing method embodiments.

[0105] Embodiments of this application also provide another computer program product, including a non-volatile computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps in any of the above-described component performance testing method embodiments.

[0106] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0107] The present application provides a detailed description of a component performance testing method and system. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of these embodiments are only intended to aid in understanding the method and its core concepts. It should be noted that those skilled in the art can make various improvements and modifications to this application without departing from its principles, and these improvements and modifications also fall within the scope of protection of the claims.

Claims

1. A method for testing the performance of a component, characterized in that, The method includes: Based on the target output voltage range of the motherboard under test and the attribute data of the voltage regulator on the motherboard under test, the theoretical parameter range of the target test element in the voltage regulator is calculated. The target test element includes at least one of inductor and capacitor. The motherboard under test is tested based on at least one test case to obtain the actual parameters of the target test component during the test. If the actual parameters exceed the theoretical parameter range, then the performance of the target test element is determined to be abnormal. If the actual parameters do not exceed the theoretical parameter range, it is preliminarily determined that the performance of the target test element is normal, and the motherboard under test is tested again after adjusting the attribute data of the voltage regulator. The process further includes, after initially determining that the performance of the target test element is normal if the actual parameters do not exceed the theoretical parameter range, the steps further include: constructing a response equation based on the correspondence between the input voltage of the motherboard under test and the actual parameters during the test, wherein the response equation represents the relationship between the actual parameters and the input voltage; mapping the theoretical parameter range to the coordinate system where the response equation is located to obtain the theoretical parameter region; and determining the performance evaluation value of the target test element based on the position of the response equation in the theoretical parameter region. The theoretical parameter range includes a theoretical maximum value and a theoretical minimum value. Based on the position of the response equation within the theoretical parameter range, the performance evaluation value of the target test element is determined, including: calculating the area of ​​a first region formed by the boundary between the curve corresponding to the response equation and the theoretical parameter range corresponding to the theoretical maximum value; calculating the area of ​​a second region formed by the boundary between the curve corresponding to the response equation and the theoretical parameter range corresponding to the theoretical minimum value; and determining the performance evaluation value of the target test element based on the area difference between the areas of the first and second regions, wherein the performance evaluation value is negatively correlated with the area difference.

2. The method according to claim 1, characterized in that, When the target test component includes an inductor, the actual parameters include the actual inductance value of the inductor. The process of testing the motherboard under test based on at least one test case to obtain the actual parameters of the target test component during the testing process includes: During the test, the first voltage change value across the inductor and the current change value flowing through the inductor are obtained within a first unit time. The actual inductance value of the inductor per unit time is calculated based on the first voltage change value and the current change value.

3. The method according to claim 1, characterized in that, When the target test element includes a capacitor, the actual parameters include the actual capacitance value of the capacitor. The process of testing the motherboard under test based on at least one test case to obtain the actual parameters of the target test element during the testing process includes: During the test, the current flowing through the capacitor and the second voltage change value across the capacitor are obtained within a second unit time. The actual capacitance value of the capacitor per unit time is calculated based on the current value and the second voltage change value.

4. The method according to claim 1, characterized in that, Before constructing the response equation based on the correspondence between the input voltage of the motherboard under test and the actual parameters during the test, the method further includes: Obtain the actual maximum and actual minimum values ​​from the actual parameters; If the difference between the actual maximum value and the actual minimum value is greater than a preset fluctuation threshold, then the performance of the target test element is determined to be abnormal.

5. The method according to claim 4, characterized in that, The motherboard under test includes a first motherboard and a second motherboard; the target test component includes a first component in the first motherboard and a second component in the second motherboard; the performance evaluation value of the target test component includes a first evaluation value of the first component and a second evaluation value of the second component; the method further includes: If the difference between the first evaluation value and the second evaluation value is greater than a preset difference, then the performance anomaly with the smallest performance evaluation value among the first component and the second component is determined.

6. The method according to claim 1, characterized in that, The method further includes: If the performance of the target test element is normal, then obtain the batch number of the target test element; Search the preset firmware corresponding to the batch number in the preset firmware library; The control parameters of the voltage regulator are adjusted based on the preset firmware.

7. The method according to claim 6, characterized in that, After obtaining the batch number of the target test element, the method further includes: If the preset firmware corresponding to the batch number does not exist in the preset firmware library, then obtain the material parameters corresponding to at least one candidate firmware in the preset firmware library. The candidate firmware with the highest similarity between the material parameters and the actual parameters is determined as the preset firmware.

8. A component performance testing system, characterized in that, include: The host computer includes a memory for storing computer programs; The host computer further includes a processor, used to implement the steps of the component performance testing method as described in any one of claims 1 to 7 when executing the computer program; At least one motherboard under test, the motherboard under test including a voltage regulator; Each of the motherboards under test has a corresponding test fixture. The motherboard under test and the test fixture are connected by a connector. The test fixture is used to simulate the working environment of the motherboard under test based on the instructions of the host computer. A data acquisition device is used to acquire current data and / or voltage data corresponding to the voltage regulator and transmit them to the host computer.

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