Solar cell stability test system and method

Abstract

The invention provides a solar cell stability test system and method, and belongs to the technical field of solar power generation. The system comprises a test box body; the cooling heat dissipation system and the semiconductor light source system are arranged in the test box body and are connected with the test box body; the tool platform is fixedly connected to the first outer surface of the test box body; the solar cell is placed in a top groove of the tool platform, and the light source system irradiates the solar cell through a through hole formed in the tool platform and the test box body; the temperature control system is located above the solar cell and embedded in a groove in the top of the tool platform; and the microcontroller is electrically connected with the cooling heat dissipation system, the light source system and the temperature control system respectively. According to the scheme, the solar cell stability test with wider light source coverage and high-precision temperature control can be realized, the energy utilization efficiency in the test is improved by using the semiconductor material to emit light, and the energy loss is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of solar power generation, in particular to a solar cell stability test system and method. BACKGROUND

[0002] The new energy perovskite photovoltaic cell has various good performance characteristics. In terms of photoelectric conversion efficiency, the perovskite photovoltaic cell is at the top of photovoltaic cells. In order to accelerate the commercialization of the perovskite photovoltaic cell, the stability of the perovskite cell assembly needs to be tested after the perovskite photovoltaic cell is completed, so as to ensure that the perovskite cell can maintain the stability of the power generation efficiency under different light and temperature. The current market solar test device cannot realize precise regulation and control of the light and temperature test environment, the testable spectral range is relatively narrow, the energy utilization efficiency is also low, so that more time is spent for testing, and the test effect that can be achieved is not ideal. SUMMARY

[0003] The present application provides a solar cell stability test system and method, which solves the problems that the test process is difficult to simulate different light and temperature under natural conditions, the test environment cannot be precisely regulated and controlled, and the energy is wasted seriously during the test process.

[0004] To solve the above technical problems, the technical scheme of the present application is as follows: The present application provides a solar cell stability test system, comprising: A test box body; A cooling and heat dissipation system and a semiconductor light source system arranged in the test box body and connected with the test box body; A tool platform fixedly connected to the first outer surface of the test box body; a solar cell is placed in the top groove of the tool platform, and the light source system irradiates the solar cell through the through hole of the test box body and the tool platform; A temperature control system located above the solar cell and embedded in the top groove of the tool platform; A microcontroller electrically connected with the cooling and heat dissipation system, the light source system and the temperature control system, respectively, the microcontroller controls the cooling and heat dissipation system to start and sends a temperature control signal to the temperature control system, the actual temperature detected by the temperature control system is consistent with the temperature of the sent temperature control signal, the microcontroller controls the light source system to work, and after reaching the set working time, the microcontroller controls the light source system, the temperature control system and the cooling and heat dissipation system to be closed in turn.

[0005] Optionally, the test box body comprises: A box body enclosed by a plurality of panels, and the inner surface of the box body is a mirror surface; Heat dissipation holes are provided on the first panel of the main body of the box; A cooling fan installed on the first panel of the main body of the enclosure; A partition plate installed longitudinally inside the main body of the box and connecting the second panel and the third panel of the main body of the box.

[0006] Optionally, the cooling and heat dissipation system includes: a compressor, a condenser, a throttle valve, and an evaporator; The compressor draws in and compresses the refrigerant to obtain vapor; the vapor enters the condenser to obtain a first liquid; the first liquid flows through the throttling valve to obtain a second liquid; the second liquid flows through the evaporator to obtain the refrigerant. The microcontroller controls the operation of the cooling and heat dissipation system. The cooling and heat dissipation system draws in the refrigerant and passes it through the compressor, the condenser, and the throttling valve to obtain a second liquid. The second liquid flows through the evaporator and vaporizes into refrigerant to absorb heat.

[0007] Optionally, the light source system includes: The reflector is threadedly connected to the test chamber. A heat dissipation plate positioned below the reflector and threadedly connected to the reflector; A substrate mounted above and threadedly connected to the reflector; An array of light sources welded onto the substrate; Thermally conductive silicone connects the heat sink and the substrate through the through area of ​​the reflector. The microcontroller controls the array of light sources in the light source system.

[0008] Optionally, the light source system uses thermally conductive silicone to conduct the heat generated by the array light source to the heat sink; the cooling system is connected to the heat sink via water pipes, and the heat sink conducts heat to the cooling system via the water pipes.

[0009] Optionally, the array light source includes multiple integrated LED beads arranged in an equally spaced array, the integrated LED beads comprising: The LED bead units are arranged side by side, and each row of LED bead units has multiple independent LED beads; the LED bead units in each row are connected by a parallel circuit, and each independent LED bead in the same row is connected by a series circuit. The positive and negative terminals for supplying power to the integrated LED beads.

[0010] Optionally, the microcontroller includes: A spectrum controller corresponding to each of the integrated LED beads; A timer for setting working hours; A driving circuit that connects the spectral controller to the array light source; The microcontroller sends the set spectral band parameters to the spectral controller and starts the timer. The spectral controller controls the array light source to work through the drive circuit. When the timer reaches the set working time, it sends a feedback signal to the microcontroller to control the array light source to stop working.

[0011] Optionally, the temperature control system includes: Cooling element; the cooling element is a cooling and heating terminal; A temperature control module for regulating the temperature of the cooling chip; Temperature sensor for monitoring the actual temperature of the system; A DC power supply for powering the temperature control module; The microcontroller sends a temperature control signal to the temperature control module, which drives the cooling chip to work according to the temperature control signal. The microcontroller monitors the actual system temperature in real time through the temperature sensor and adjusts the sent temperature control signal according to the actual system temperature. The temperature control module adjusts and controls the cooling chip according to the temperature control signal.

[0012] This invention also provides a method for testing the stability of solar cells, comprising: Generate control signals; According to the control signal, the cooling and heat dissipation system, the light source system and the temperature control system are started and the solar cell is subjected to a stability test.

[0013] Optionally, a stability test is performed on the solar cell, including: The solar cell feed; The microcontroller sets temperature and spectral parameters and sends them to the spectral controller and the temperature control module; The microcontroller sequentially controls the cooling system and the temperature control system to turn on, and adjusts the temperature through the temperature control module; When the temperature control module detects that the actual system temperature is consistent with the temperature parameter, the microcontroller turns on the light source system and starts the timer. When the microcontroller detects that the timer has reached the set working time, the microcontroller sequentially controls the light source system, the temperature control system and the cooling system to stop working. The solar cell is being discharged.

[0014] The technical solution of the present invention has at least the following effects: The above-described solution of the present invention includes: a test chamber; a cooling and heat dissipation system and a semiconductor light source system placed inside and connected to the test chamber; a tooling platform fixedly connected to the first outer surface of the test chamber; a solar cell placed in a groove at the top of the tooling platform, with the light source system illuminating the solar cell through a through-hole between the tooling platform and the test chamber; a temperature control system located above the solar cell and embedded in the groove at the top of the tooling platform; and a microcontroller electrically connected to the cooling and heat dissipation system, the light source system, and the temperature control system, respectively. The microcontroller controls the cooling and heat dissipation system to start and sends a temperature control signal to the temperature control system. The actual system temperature detected by the temperature control system is consistent with the temperature of the sent temperature control signal. The microcontroller controls the light source system to work. After a set working time is reached, the microcontroller sequentially controls the light source system, the temperature control system, and the cooling and heat dissipation system to shut down. This allows for multi-spectral adjustment and high-precision temperature control testing with a wider light source coverage. It can simulate different light and temperature environments under natural conditions and improves energy utilization efficiency through the light emission of semiconductor materials, making the testing process more energy-efficient and environmentally friendly. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of the solar cell stability testing system provided in an embodiment of the present invention; Figure 2 This is a schematic diagram of the light source system structure of the solar cell stability testing system provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the array light source of the solar cell stability testing system provided in an embodiment of the present invention; Figure 4 This is a schematic diagram of the integrated LED circuit of the solar cell stability testing system provided in this embodiment of the invention; Figure 5 This is a schematic diagram of the cooling and heat dissipation system of the solar cell stability testing system provided in this embodiment of the invention; Figure 6 This is a schematic diagram of the temperature control system adjustment principle of the solar cell stability testing system provided in this embodiment of the invention; Figure 7 This is a schematic diagram of the temperature control system control principle of the solar cell stability testing system provided in this embodiment of the invention; Figure 8 This is a schematic diagram of the integrated LED control principle of the solar cell stability testing system provided in this embodiment of the invention; Figure 9 This is a schematic diagram of the control flow of the solar cell stability testing method provided in the embodiments of the present invention.

[0016] The components include: 1. Test chamber; 11. Chamber body; 12. Heat dissipation holes; 13. Cooling fan; 14. Partition; 2. Cooling and heat dissipation system; 21. Compressor; 22. Condenser; 23. Throttling valve; 24. Evaporator; 3. Light source system; 31. Heat sink; 32. Reflector; 33. Substrate; 34. Array light source; 341. Integrated LED; 3411. LED unit; 34111. Independent LED; 3412. Positive terminal connector; 3413. Negative terminal connector; 4. Tooling platform; 5. Temperature control system; 51. Temperature control module; 52. Temperature sensor; 53. DC power supply; 54. Cooling chip; 6. Microcontroller; 61. Spectrum controller; 62. Timer; 63. Drive circuit; 7. Solar cell. Detailed Implementation

[0017] Exemplary embodiments of the invention will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0018] like Figure 1 As shown, an embodiment of the present invention provides a solar cell stability testing system, comprising: Test chamber 1; A cooling and heat dissipation system 2 and a semiconductor light source system 3 are placed inside and connected to the test chamber 1; A fixture platform 4 is fixedly connected to the first outer surface of the test chamber 1; the solar cell 7 is placed in the top groove of the fixture platform 4, and the light source system 3 illuminates the solar cell 7 through the through holes opened in the fixture platform 4 and the test chamber 1. The temperature control system 5 is located above the solar cell 7 and embedded in the groove at the top of the tooling platform 4; A microcontroller 6 is electrically connected to the cooling and heat dissipation system 2, the light source system 3, and the temperature control system 5 respectively. The microcontroller 6 controls the cooling and heat dissipation system 2 to start and sends a temperature control signal to the temperature control system 5. The actual system temperature detected by the temperature control system 5 is consistent with the temperature of the temperature control signal sent. The microcontroller 6 controls the light source system 3 to work. After the set working time is reached, the microcontroller 6 sequentially controls the light source system 3, the temperature control system 5, and the cooling and heat dissipation system 2 to shut down.

[0019] In this embodiment, the test chamber 1 mainly integrates system components that are not suitable for external exposure, such as the cooling and heat dissipation system 2, the light source system 3, and the microcontroller 6, so that the system components are integrated in the same space. The light source system 3 provides simulated illumination for the test environment of the solar cell 7. It mainly adopts grouped spectral adjustment technology based on integrated light-emitting diode (LED) lamp sources. By adjusting multiple groups of LED beads with different wavelengths and controlling the brightness and color temperature of multiple groups of different integrated LED beads, different wavelength spectra are simulated. The system can cover a spectral range from 315nm ultraviolet light to 1600nm infrared light, thereby realizing multi-spectral adjustment of the light source and making the spectral coverage wider. During the operation of the light source system 3, some energy is converted into heat. The cooling and heat dissipation system 2 helps the light source system 3 dissipate heat. The cooling and heat dissipation system 2 mainly adopts a micro vapor compression cycle heat dissipation system, which has higher cooling and heat dissipation efficiency and lower noise during operation compared with traditional air cooling.

[0020] The fixture platform 4, the solar cell 7, and the temperature control system 5 are located outside the test chamber 1. The fixture platform 4 is situated on the first outer surface of the test chamber 1, which is the upper surface of the top panel of the test chamber 1. Multiple grooves are formed on the upper surface of the fixture platform 4, and the solar cell 7 is placed in these grooves for stability testing. The temperature control system 5 is an independent component and needs to be placed on top of the solar cell 7 and embedded in the grooves of the fixture platform 4 before the test begins. The temperature control system 5 employs a closed-loop proportional control based on a thermoelectric cooler (TEC). integral Differential (Proportional) Integral Derivative (PID) control enables temperature control accuracy to reach [percentage missing]. With a temperature control accuracy of 0.1℃, it offers higher precision compared to traditional heating element systems. Furthermore, in addition to adjusting the light source system 3 via the microcontroller 6, a control panel is also provided on one side of the tooling platform 4. This control panel allows manual adjustment of the rotating resistor, thereby controlling the power supply's output voltage and further regulating the light emission effect of the light source system 3.

[0021] The overall workflow of the system is mainly controlled by the microcontroller 6. The microcontroller 6 controls the cooling and heat dissipation system 2 to start and sends a temperature control signal to the temperature control system 5. The actual system temperature detected by the temperature control system 5 is consistent with the temperature of the temperature control signal sent. The microcontroller 6 controls the light source system 3 to work. After the set working time is reached, the microcontroller 6 sequentially controls the light source system 3, the temperature control system 5 and the cooling and heat dissipation system 2 to shut down, thus completing the stable testing process of the solar cell.

[0022] like Figure 1 As shown, in an optional embodiment of the present invention, the test chamber 1 includes: The main body 11 of the box is enclosed by multiple panels, and the inner surface of the main body 11 is mirrored; Heat dissipation holes 12 are provided on the first panel of the main body 11 of the box; A cooling fan 13 is installed on the first panel of the main body 11 of the enclosure; A partition 14 is installed longitudinally inside the box body 11 and connects the second panel and the third panel of the box body 11.

[0023] In this embodiment, the main body 11 of the test chamber 1 is enclosed by multiple panels. To achieve a high visible spectrum reflectance, the corresponding panel surfaces inside the main body 11 are all made of mirror material, thereby achieving a reflectance of up to 99% of the visible spectrum and reducing light loss. The main body 11 is equipped with heat dissipation holes 12 and a cooling fan 13, primarily to improve the heat dissipation level inside the chamber and facilitate gas exchange between the hot air inside and the cold air outside. The main body 11 also has a partition. One side of the partition houses the core components of the system, such as the cooling system 2, the light source system 3, and the microcontroller 6, while the other side mainly houses peripheral components such as the light source power controller. This allows for the separation of hot and cold components during maintenance, facilitating component retrieval during repair.

[0024] like Figure 2 As shown, in an optional embodiment of the present invention, the light source system 3 includes: The reflector 32 is threadedly connected to the test chamber 1; A heat sink 31 is placed below the reflector 32 and threadedly connected to the reflector 32; A substrate 33 is installed above and threadedly connected to the reflector 32; An array of light sources 34 is welded onto the substrate 33; Thermally conductive silicone connects the heat sink 31 and the substrate 33 through the through area of ​​the reflector 32. The microcontroller 6 controls the array light source 34 in the light source system 3 to operate; The light source system 3 conducts the heat generated by the array light source 34 to the heat sink 31 through thermally conductive silicone; the cooling system 2 is connected to the heat sink 31 through water pipes, and the heat sink 31 conducts the heat to the cooling system 2 through the water pipes.

[0025] In this embodiment, the light source system 3 can be divided into four layers from top to bottom. The top layer is an array light source 34, which is an integrated LED light source. LEDs use current to drive semiconductor materials to emit light, rather than emitting light through heat. Therefore, less energy is wasted on generating heat, resulting in higher energy utilization efficiency and greater energy savings. The second layer is a substrate 33, which is a printed circuit board (PCB) substrate and is mainly used to support the array light source 34 soldered on top. The third layer is a reflector 32, which is a ring-shaped structure with a central through-hole, and the ring structure is filled with thermally conductive silicone. The fourth layer is a heat sink 31. The substrate 33, the reflector 32, and the heat sink 31 are all fixedly connected by bolts. The heat generated by the array light source 34 is transferred to the thermally conductive silicone through the substrate 33, and the thermally conductive silicone then transfers the heat to the water pipe connected to the cooling system 2 through the heat sink 31, where the heat is removed by water cooling.

[0026] like Figure 3 and Figure 4 As shown, in an optional embodiment of the present invention, the array light source 34 includes a plurality of integrated LED beads 341 arranged in an equally spaced array, the integrated LED beads 341 comprising: Multiple rows of LED bead units 3411 are arranged side by side, each row of LED bead units 3411 having multiple independent LED beads 34111; each row of LED bead units 3411 is connected in parallel circuit, and each independent LED bead 34111 in the same row is connected in series circuit. Positive terminal 3412 and negative terminal 3413 supply power to the integrated LED bead 341.

[0027] In this embodiment, the array light source 34 includes multiple integrated LED beads 341 arranged in an equally spaced array. Each integrated LED bead 341 includes a positive terminal 3412 and a negative terminal 3413 for energizing, as well as multiple rows of LED bead units 3411 arranged side by side. The multiple rows of LED bead units 3411 are connected in parallel. Each row of LED bead units 3411 has multiple independent LED beads 34111 connected in series. For example, the array light source 34 can be configured with 9 integrated LED beads 341, each integrated LED bead 341 having 6 rows of LED bead units 3411, and each row of LED bead units 3411 having 12 independent LED beads 34111, thus forming an array light source 34 with a total of 12*6*9 independent LED beads 34111.

[0028] like Figure 5 As shown, in an optional embodiment of the present invention, the cooling and heat dissipation system 2 includes: a compressor 21, a condenser 22, a throttle valve 23, and an evaporator 24; The compressor 21 draws in and compresses the refrigerant to obtain vapor; the vapor enters the condenser 22 to obtain a first liquid; the first liquid flows through the throttle valve 23 to obtain a second liquid; the second liquid flows through the evaporator 24 to obtain the refrigerant. The microcontroller 6 controls the operation of the cooling and heat dissipation system 2. The cooling and heat dissipation system 2 draws in the refrigerant and passes through the compressor 21, the condenser 22 and the throttle valve 23 to obtain a second liquid. The second liquid flows through the evaporator 24 and vaporizes into refrigerant to absorb heat.

[0029] In this embodiment, the cooling and heat dissipation system 2 uses a micro vapor compression cycle to achieve cooling and heat dissipation, which has higher cooling efficiency and lower noise during operation compared to the traditional air-cooling mode. The working principle of the cooling and heat dissipation system 2 is as follows: the compressor 21 draws in and compresses low-temperature, low-pressure gaseous refrigerant to obtain high-temperature, high-pressure vapor; the high-temperature, high-pressure vapor enters the condenser 22 and condenses, releasing heat into the air to obtain a high-pressure first liquid; the high-pressure first liquid flows through the throttling valve 23, reducing the refrigerant pressure and temperature, and expands into a low-temperature, low-pressure second liquid; the low-temperature, low-pressure second liquid flows through the evaporator 24 to obtain the low-temperature, low-pressure gaseous refrigerant, carrying away heat in the process; the low-temperature, low-pressure gaseous refrigerant can re-enter the compressor 21 for the next cycle.

[0030] like Figure 6 and Figure 7 As shown, in an optional embodiment of the present invention, the temperature control system 5 includes: Cooling element 54; the cooling element 54 is a cooling and heating terminal; Temperature control module 51 for regulating the temperature of the cooling chip 54; Temperature sensor 52 for monitoring the actual temperature of the system; DC power supply 53 that supplies power to the temperature control module 51; The microcontroller 6 sends a temperature control signal to the temperature control module 51. The temperature control module 51 drives the cooling chip 54 to work according to the temperature control signal. The microcontroller 6 monitors the actual system temperature in real time through the temperature sensor 52 and adjusts the sent temperature control signal according to the actual system temperature. The temperature control module 51 adjusts and controls the cooling chip 54 according to the temperature control signal.

[0031] In this embodiment, the cooling chip 54 is a TEC cooling chip. The smallest unit of the cooling chip 54 consists of a pair of N-type and P-type semiconductors. An external electric field forces charge carriers to move in the circuit, thereby generating a heat absorption effect at one end. Simultaneously, the hot and cold ends can be switched by changing the direction of the current, thus achieving a cooling or heating effect. The temperature control system 5 employs closed-loop PID control based on the semiconductor TEC cooling chip, achieving high temperature control accuracy. The microcontroller 6 is based on Upon receiving a temperature control signal, the temperature control module 51 drives the cooling element 54 to cool or heat according to the temperature control signal until the actual system temperature monitored in real time by the temperature sensor 52 is equal to the temperature transmitted in the temperature control signal, where μ(t) is the temperature adjusted by the microprocessor; e(t) is the difference between the preset temperature and the actual system temperature; μ0 is the actual system temperature monitored in real time by the temperature sensor 52; K P This is a proportional adjustment parameter, mainly used to quickly respond to deviations and improve the dynamic performance of the system; T I The integral adjustment parameter is mainly used to eliminate steady-state error and bring the system to a stable state; T D This is a differential adjustment parameter, mainly used to improve system stability and reduce overshoot and oscillation.

[0032] like Figure 8 As shown, in an optional embodiment of the present invention, the microcontroller 6 includes: A spectrum controller 61 corresponding to each of the integrated LED beads 341; Timer 62 is used to set the working time; A drive circuit 63 connecting the spectral controller 61 to the array light source 34; The microcontroller 6 sends the set spectral band parameters to the spectral controller 61 and starts the timer 62. The spectral controller 61 controls the array light source 34 to work through the drive circuit 63. When the timer 62 reaches the set working time, it sends a feedback signal to the microcontroller 6 to control the array light source 34 to stop working.

[0033] In this embodiment, the spectral controller 61 and the timer 62 are both integrated inside the microcontroller 6. The microcontroller 6 mainly controls the light source system 3 and the temperature control system 5 by controlling the spectral controller 61 and the temperature control module 51. For the light source system 3, multiple spectral process parameters can be input into the microcontroller 6. For example, the spectral process parameters can be divided into 300-350nm, 350-420nm, 420-720nm, 720-850nm, 850-1100nm, 1100-1300nm, etc. The microcontroller 6 sends the set spectral band parameters to the spectral controller 61. The drive circuit 63 receives the signal sent by the spectral controller 61 and drives the array light source 34 to work. At the same time as the microcontroller 6 sends the spectral band parameters, the timer 62 is started. When the timer 62 reaches the set working time, it sends a signal back to the microcontroller 6, and the microcontroller 6 sends a stop signal. For the temperature control system 5, the microcontroller 6 directly sends the preset temperature to the temperature control module 51, and the temperature control module 51 controls the operation of the cooling chip 54 so that the actual system temperature is consistent with the preset temperature.

[0034] like Figure 9 As shown, this embodiment of the invention also provides a method for testing the stability of solar cells, including: Generate control signals; According to the control signal, the cooling and heat dissipation system 2, the light source system 3 and the temperature control system 5 are activated to perform a stability test on the solar cell 7.

[0035] In this embodiment, the microcontroller 6 generates a control signal, which controls the cooling and heat dissipation system 2, the light source system 3, and the temperature control system 5 to perform a stability test on the solar cell 7.

[0036] like Figure 9 As shown, in an optional embodiment of the present invention, a stability test is performed on the solar cell 7, including: The solar cell 7 is fed; The microcontroller 6 sets temperature and spectral parameters and sends them to the spectral controller 61 and the temperature control module 51; The microcontroller 6 sequentially controls the cooling system 2 and the temperature control system 5 to turn on, and adjusts the temperature through the temperature control module 51. When the temperature control module 51 detects that the actual system temperature is consistent with the temperature parameter, the microcontroller 6 turns on the light source system 3 and starts the timer 62. When the microcontroller 6 detects that the timer 62 has reached the set working time, the microcontroller 6 sequentially controls the light source system 3, the temperature control system 5 and the cooling system 2 to stop working. The solar cell 7 is discharging material.

[0037] In this embodiment, after the perovskite solar cell 7 to be tested is fed, spectral and temperature parameters are set on the microcontroller 6. The spectral and temperature parameters are respectively sent to the spectral controller 61 and the temperature control module 51. The microcontroller 6 starts the cooling system 2. After the cooling system 2 is started, the microcontroller 6 sends a working command to the temperature control module 51. The temperature control module 51 detects through the temperature sensor 52 that the actual temperature of the workbench is consistent with the set temperature sent by the microcontroller 6. Then, the microcontroller 6 sends a working command to the spectral controller 61 and starts the timer 62. After the microcontroller 6 detects that the timer 62 has reached the set working time, it sends commands to the spectral controller 61, the temperature control module 51 and the cooling system 2 in sequence to stop working. The perovskite solar cell 7 completes the specified stability test and is discharged to start the next cycle.

[0038] This technical solution enables stability testing of solar cells under the influence of multiple environmental factors. It can simultaneously simulate light and temperature test environments, and has a wider test coverage and more precise and controllable test conditions, thereby improving energy utilization efficiency during the test process and further shortening the stability test time of solar cells.

[0039] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0040] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0041] In the embodiments provided by this invention, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0042] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0043] In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0044] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, ROM, RAM, magnetic disks, or optical disks.

[0045] Furthermore, it should be noted that in the apparatus and method of the present invention, it is obvious that the components or steps can be decomposed and / or recombined. These decompositions and / or recombinations should be considered equivalent solutions of the present invention. Moreover, the steps performing the above series of processes can naturally be executed in the order described, but are not necessarily required to be executed in chronological order; some steps can be executed in parallel or independently of each other. Those skilled in the art will understand that all or any step or component of the method and apparatus of the present invention can be implemented in any computing device (including processors, storage media, etc.) or network of computing devices, in hardware, firmware, software, or a combination thereof. This is something that those skilled in the art can achieve by using their basic programming skills after reading the description of the present invention.

[0046] Therefore, the object of the present invention can also be achieved by running a program or a set of programs on any computing device. The computing device can be a known general-purpose device. Therefore, the object of the present invention can also be achieved simply by providing a program product containing program code for implementing the method or apparatus. That is, such a program product also constitutes the present invention, and the storage medium storing such a program product also constitutes the present invention. Obviously, the storage medium can be any known storage medium or any storage medium developed in the future. It should also be noted that in the apparatus and method of the present invention, it is obvious that the components or steps can be decomposed and / or recombined. These decompositions and / or recombinations should be considered equivalent to the present invention. Furthermore, the steps for performing the above series of processes can naturally be performed in the order described, but are not necessarily required to be performed in chronological order. Some steps can be performed in parallel or independently of each other.

[0047] The above are preferred embodiments of the present invention. It should be noted that, for those skilled in the art, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A solar cell stability testing system, characterized in that, include: Test chamber (1); A cooling and heat dissipation system (2) and a semiconductor light source system (3) are placed inside the test chamber (1) and connected to the test chamber (1). A fixture platform (4) is fixedly connected to the first outer surface of the test chamber (1); a solar cell (7) is placed in the top groove of the fixture platform (4), and the light source system (3) illuminates the solar cell (7) through the through hole opened between the fixture platform (4) and the test chamber (1). A temperature control system (5) located above the solar cell (7) and embedded in the top groove of the tooling platform (4); A microcontroller (6) is electrically connected to the cooling and heat dissipation system (2), the light source system (3), and the temperature control system (5) respectively. The microcontroller (6) controls the cooling and heat dissipation system (2) to start and sends a temperature control signal to the temperature control system (5). The actual system temperature detected by the temperature control system (5) is consistent with the temperature of the temperature control signal sent. The microcontroller (6) controls the light source system (3) to work. After the set working time is reached, the microcontroller (6) sequentially controls the light source system (3), the temperature control system (5), and the cooling and heat dissipation system (2) to shut down.

2. The solar cell stability testing system according to claim 1, characterized in that, The test chamber (1) includes: The main body of the box (11) is enclosed by multiple panels, and the inner surface of the main body of the box (11) is a mirror. Heat dissipation holes (12) are opened on the first panel of the main body (11); A cooling fan (13) is installed on the first panel of the main body (11) of the box. A partition (14) is installed longitudinally inside the box body (11) and connects the second panel and the third panel of the box body (11).

3. The solar cell stability testing system according to claim 1, characterized in that, The cooling and heat dissipation system (2) includes: a compressor (21), a condenser (22), a throttle valve (23) and an evaporator (24). The compressor (21) draws in and compresses the refrigerant to obtain vapor; the vapor enters the condenser (22) to obtain a first liquid; the first liquid flows through the throttle valve (23) to obtain a second liquid; the second liquid flows through the evaporator (24) to obtain the refrigerant; The microcontroller (6) controls the operation of the cooling and heat dissipation system (2). The cooling and heat dissipation system (2) draws in the refrigerant and passes through the compressor (21), the condenser (22) and the throttle valve (23) to obtain a second liquid. The second liquid flows through the evaporator (24) and vaporizes into refrigerant to absorb heat.

4. The solar cell stability testing system according to claim 1, characterized in that, The light source system (3) includes: A reflector (32) is threadedly connected to the test chamber (1); A heat sink (31) is placed below the reflector (32) and threadedly connected to the reflector (32). A substrate (33) is installed above the reflector (32) and threadedly connected to the reflector (32); An array of light sources (34) is welded onto the substrate (33); Thermally conductive silicone connects the heat sink (31) and the substrate (33) through the through area of ​​the reflector (32); The microcontroller (6) controls the array light source (34) in the light source system (3) to work.

5. The solar cell stability testing system according to claim 4, characterized in that, The light source system (3) conducts the heat generated by the array light source (34) to the heat sink (31) through thermally conductive silicone; the cooling system (2) is connected to the heat sink (31) through a water pipe, and the heat sink (31) conducts the heat to the cooling system (2) through the water pipe.

6. The solar cell stability testing system according to claim 4, characterized in that, The array light source (34) includes multiple integrated LED beads (341) arranged in an equally spaced array, wherein the integrated LED beads (341) include: Multiple rows of LED bead units (3411) are arranged side by side, each row of LED bead units (3411) has multiple independent LED beads (34111); the LED bead units (3411) in each row are connected in parallel circuit, and each independent LED bead (34111) in the same row is connected in series circuit. Positive terminal (3412) and negative terminal (3413) for supplying power to the integrated lamp bead (341).

7. The solar cell stability testing system according to claim 6, characterized in that, The microcontroller (6) includes: A spectrum controller (61) corresponding to each of the integrated LED beads (341); Timer (62) for setting working time; A drive circuit (63) connecting the spectral controller (61) and the array light source (34); The microcontroller (6) sends the set spectral band parameters to the spectral controller (61) and starts the timer (62). The spectral controller (61) controls the array light source (34) to work through the drive circuit (63). When the timer (62) reaches the set working time, it feeds back a signal to the microcontroller (6) and controls the array light source (34) to stop working.

8. The solar cell stability testing system according to claim 1, characterized in that, The temperature control system (5) includes: Cooling element (54); the cooling element (54) is a cooling and heating terminal; Temperature control module (51) for regulating the temperature of the cooling chip (54); Temperature sensor (52) for monitoring the actual temperature of the system; DC power supply (53) for supplying power to the temperature control module (51); The microcontroller (6) sends a temperature control signal to the temperature control module (51), and the temperature control module (51) drives the cooling chip (54) to work according to the temperature control signal. The microcontroller (6) monitors the actual system temperature in real time through the temperature sensor (52) and adjusts the sent temperature control signal according to the actual system temperature. The temperature control module (51) adjusts and controls the cooling chip (54) according to the temperature control signal.

9. A method for testing the stability of solar cells, characterized in that, Applied to the system as described in any one of claims 1 to 8, the method comprises: Generate control signals; According to the control signal, the cooling and heat dissipation system (2), the light source system (3) and the temperature control system (5) are started and the solar cell (7) is subjected to a stability test.

10. The solar cell stability testing method according to claim 9, characterized in that, The solar cell (7) was subjected to a stability test, including: The solar cell (7) is fed; The microcontroller (6) sets the temperature parameters and spectral parameters and sends them to the spectral controller (61) and the temperature control module (51). The microcontroller (6) sequentially controls the cooling and heat dissipation system (2) and the temperature control system (5) to turn on, and adjusts the temperature through the temperature control module (51); The temperature control module (51) detects that the actual system temperature is consistent with the temperature parameter, and the microcontroller (6) turns on the light source system (3) and starts the timer (62). When the microcontroller (6) detects that the timer (62) has reached the set working time, the microcontroller (6) sequentially controls the light source system (3), the temperature control system (5) and the cooling and heat dissipation system (2) to stop working. The solar cell (7) is discharged.

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