A test system and test method for high-power product anti-impact current performance

Abstract

The application discloses a kind of high-power product impact current performance test system and test method, it is related to industrial test technical field.The system includes control host, signal generator, adjustable impedance matching network and adjustable cable;Control host is connected with signal generator, signal generator is connected with adjustable impedance matching network, adjustable impedance matching network is connected with the product to be measured by adjustable cable;Adjustable impedance matching network is configured with multiple gear paths, and each gear path is integrated with adjustable inductance, adjustable capacitor and adjustable resistance.The application has impact current performance test function, and test adjustment is convenient, and test precision is high.The length of adjustable cable is used to accurately fine-tune the impedance of the product to be tested.

Description

Technical Field

[0001] This invention relates to the field of industrial testing technology, and in particular to a testing system and method for testing the surge current resistance of high-power products. Background Technology

[0002] With the rapid development of new energy equipment (such as charging piles and energy storage systems), the demand for surge current resistance testing has increased significantly. However, existing technologies mainly target small component products, and there is no unified consensus in the industry on surge current resistance testing methods for high-power equipment. Due to the significant differences in cable length and layout of high-power equipment, the distributed capacitance and inductance are complex, making it difficult for traditional testing methods to guarantee the authenticity of the surge current waveform. The test results may be biased, thus affecting the product pass rate. Impedance matching, as a key parameter in the testing process, directly affects the accuracy of the surge current waveform and the reliability of the test results. Research and application of impedance matching for high-power equipment in the industry are still insufficient, and in-depth research in this area is urgently needed to meet the growing testing needs and provide technical support for the high-quality development of new energy equipment.

[0003] Existing testing methods, such as the Chinese invention patent entitled "Input Inrush Current Test Circuit and Method for AC Charging Piles" (application publication number: CN114325190A), disclose an input inrush current test circuit and method for AC charging piles. This method utilizes the switching of the RLC load terminal to generate an AC inrush current at a specified phase angle from the AC input current, and employs a phase-locked loop circuit between the power grid and the AC charging pile. This satisfies the need for inrush testing at multiple test points of the charging pile under test, improving test accuracy and ensuring the consistency of interference waveforms during batch testing of AC charging piles. However, it has a single coupling test port and cannot quickly and effectively adjust and match the impedance of the test object with different impedance characteristics to ensure that the final waveform meets standard requirements.

[0004] Existing testing methods, such as the Chinese invention patent entitled "Impulse Current Testing Method" (application publication number: CN102890182A), disclose an impulse current testing method that can simultaneously perform impulse current tests on multiple components by setting the number of tests and time intervals, thereby improving production efficiency. However, it cannot effectively adjust and match the impedance of the test objects with different impedance characteristics, and cannot ensure that the test waveform meets the standard requirements.

[0005] Therefore, for the inrush current performance testing of high-power products, there is an urgent need for an effective new adjustable impedance matching technology to solve the technical problems mentioned above in the existing technology that cannot meet the standard requirements for the final waveform. Summary of the Invention

[0006] The purpose of this invention is to provide a testing system and method for testing the surge current resistance of high-power products, thereby solving the technical problem in the prior art of being unable to quickly and effectively adjust and match the impedance of test objects with different impedance characteristics. The various technical effects of the preferred solutions among the many technical solutions provided by this invention are detailed below.

[0007] To achieve the above objectives, the present invention provides the following technical solution:

[0008] This invention provides a testing system for the surge current resistance performance of high-power products, comprising a control host, a signal generator, an adjustable impedance matching network, and an adjustable cable. The control host is connected to the signal generator, the signal generator is connected to the adjustable impedance matching network, and the adjustable impedance matching network is connected to the product under test (DUT) via the adjustable cable. The adjustable impedance matching network is configured with multiple range paths, each range path integrating an adjustable inductor, an adjustable capacitor, and an adjustable resistor. The control host sets the parameters of the signal generator to generate an interference signal required for testing the DUT. The waveform of the interference signal is coarsely adjusted using the adjustable inductor corresponding to each range path, and finely adjusted using the length of the adjustable cable, the adjustable capacitor, and the adjustable resistor corresponding to each range path, so that the interference signal reaches a standard waveform.

[0009] In one or more embodiments, the waveform of the interference signal is coarsely adjusted by the adjustable step size of the adjustable inductor corresponding to the gear path, and the waveform of the coarsely adjusted interference signal is finely adjusted by the adjustable step size of the adjustable capacitor and the adjustable resistor corresponding to the gear path.

[0010] In one or more embodiments, the size of the adjustable inductor can be adjusted by adjusting the adjustable step size of the adjustable cable, thereby fine-tuning the waveform of the interference signal after coarse adjustment.

[0011] In one or more embodiments, the approximate relationship between the adjustable step size of the adjustable inductor and the adjustable step size of the adjustable cable is determined by the following formula:

[0012] L=l×μ0 / (2π)[ln(2×l / r)-0.75];

[0013] Where L is the magnitude of the adjustable inductor, l is the adjustable step size of the adjustable cable, r is the radius of the adjustable cable, and μ0 is the vacuum permeability.

[0014] In one or more embodiments, the test system for the surge current resistance performance of a high-power product further includes a programmable DC and AC power supply and a coupling / decoupling network, wherein the programmable DC and AC power supply is connected to the product under test through the coupling / decoupling network.

[0015] According to another aspect of the present invention, a method for testing the surge current resistance performance of a high-power product is also provided. The method involves connecting the aforementioned test system for the surge current resistance performance of a high-power product to the product under test, powering on and configuring the product under test to operate normally, and generating an interference signal required for testing the product under test through the test system. The steps performed include:

[0016] Measure the initial values ​​of the interference signal at the first and second times, and calculate the ratio of the second time to the first time;

[0017] The calculated ratio is compared with a first set value; if it is less than the first set value, the adjustable inductor is reduced by the adjustable step size until the ratio measured and calculated again falls within the set range; if it is greater than the first set value, the adjustable inductor is increased by the adjustable step size until the ratio measured and calculated again falls within the set range.

[0018] If the difference between the first time and 8us is less than the second set value, then the adjustable resistor is finely adjusted to control the second time to reach 20us; otherwise, the adjustable inductor is finely adjusted so that the difference between the first time and 8us is less than the second set value, and then the adjustable resistor is finely adjusted to control the second time to reach 20us.

[0019] In one or more embodiments, the adjustable inductor is finely adjusted according to the following formula so that the difference between the first time and 8µs is less than a second set value:

[0020] Lnew = Lcurrent(8 / T1measured) 2 ;

[0021] Wherein, Lnew is the finely adjusted adjustable inductance, Lcurrent is the current adjustable inductance, and T1measured is the measured first time; Lcurrent is determined through the adjustable cable.

[0022] In one or more embodiments, after fine-tuning the adjustable resistor to control the second time to reach 20µs, the method further includes detecting whether the interference signal waveform oscillates or overshoots. When oscillations or overshoots are present, the adjustable capacitor is fine-tuned to suppress the oscillations of the interference signal. When the detected interference signal waveform does not oscillate or overshoot, or when the oscillations of the interference signal are suppressed by fine-tuning, the standard waveform of the adjusted interference signal is output.

[0023] In one or more embodiments, the damping coefficient of the RLC circuit integrated in the gear path is used to detect whether the interference signal waveform oscillates or overshoots; if the damping coefficient of the RLC circuit is less than a third set value, then the interference signal waveform oscillates or overshoots.

[0024] In one or more embodiments, a method for testing the surge current resistance performance of a high-power product further includes, after obtaining the interference signal with a quasi-waveform, using the test system to test the anti-interference capability of the product under test under the interference signal with a standard waveform.

[0025] Implementing one of the above-described technical solutions of the present invention has the following advantages or beneficial effects:

[0026] This invention features an impulse current resistance performance test function, employs a dynamic impedance matching network instead of a conventional fixed impedance network, making test adjustment convenient and achieving high test accuracy. By utilizing the impedance matching network design with different ranges and the adjustable connection cable length design, impedance matching tests can be performed on products under test with different impedances. Furthermore, the adjustable cable length design allows for precise fine-tuning of the impedance of the products under test. Attached Figure Description

[0027] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. In the drawings:

[0028] Figure 1 This is a schematic diagram of a test system for the surge current resistance performance of a high-power product according to an embodiment of the present invention;

[0029] Figure 2 This is a flowchart of a test method for the surge current resistance performance of a high-power product according to an embodiment of the present invention;

[0030] Figure 3 This is a diagram of the standard 8 / 20μs waveform in an embodiment of the present invention. Detailed Implementation

[0031] To make the objectives, technical solutions, and advantages of the present invention clearer, various exemplary embodiments described below will be referenced to the accompanying drawings, which form part of the exemplary embodiments, illustrating various exemplary embodiments that may be used to implement the present invention. Unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. It should be understood that they are merely examples of processes, methods, and apparatuses consistent with some aspects of the present invention disclosed as detailed in the appended claims, and other embodiments may be used, or structural and functional modifications may be made to the embodiments listed herein without departing from the scope and spirit of the present invention.

[0032] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," etc., indicate the orientation or positional relationship based on the accompanying drawings, and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the referred element must have a specific orientation, or be constructed and operated in a specific orientation. The terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. The term "multiple" means two or more. The terms "connected" and "linked" should be interpreted broadly, for example, they can be fixed connections, detachable connections, integral connections, mechanical connections, electrical connections, communication connections, direct connections, indirect connections through an intermediate medium, and can be the internal connection of two elements or the interaction relationship between two elements. The term "and / or" includes any and all combinations of one or more of the related listed items. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0033] To illustrate the technical solution described in this invention, specific embodiments are described below, showing only the parts related to the embodiments of this invention.

[0034] Example 1:

[0035] like Figure 1 As shown, the present invention provides a test system for the surge current resistance performance of high-power products, including a control host, a signal generator, an adjustable impedance matching network, and an adjustable cable; the control host is connected to the signal generator, the signal generator is connected to the adjustable impedance matching network, and the adjustable impedance matching network is connected to the product under test through the adjustable cable.

[0036] Based on the above embodiment, the host computer sets the parameters of the signal generator, enabling it to generate the interference signal required for testing the product under test. The waveform of the interference signal is coarsely adjusted using an adjustable inductor corresponding to the range path, and finely adjusted using the length of the adjustable cable, the adjustable capacitor corresponding to the range path, and the adjustable resistor, until the interference signal reaches a standard waveform. Once the interference signal reaches the standard waveform, the surge current resistance performance of the product under test can be tested.

[0037] It should be noted that the standard waveform is an 8 / 20μs waveform. The signal generator is used to generate inrush current.

[0038] Furthermore, the adjustable impedance matching network is configured with multiple range paths, each integrating an adjustable inductor, adjustable capacitor, and adjustable resistor to achieve comprehensive adjustment of the standard waveform of the interference signal. The adjustable inductor L, adjustable capacitor C, and adjustable resistor R can be connected in series to form an RLC circuit.

[0039] This embodiment achieves preliminary matching and precise fine-tuning of products under test with different impedance characteristics by coordinating the adjustment of three parameters: adjustable inductor L, adjustable capacitor C, and adjustable resistor R. It also has the ability to quickly adjust and adapt when the impedance of the test object is unknown.

[0040] It is understood that high-power products, based on current standards, refer to electrical appliances or equipment with a rated power exceeding 1200 watts (1500 watts and above in some standards), and can be widely used in homes, industry, energy, and technology sectors. In this embodiment, this includes, but is not limited to, charging piles and energy storage systems.

[0041] In one or more embodiments, the waveform of the interference signal is coarsely adjusted by the adjustable step size of the adjustable inductor corresponding to the gear path; and the waveform of the coarsely adjusted interference signal is finely adjusted by the adjustable step size of the adjustable capacitor and the adjustable resistor corresponding to the gear path.

[0042] In a specific embodiment, the adjustable step size of the adjustable inductor is no greater than 10μH, the adjustable step size of the adjustable capacitor is no greater than 4μF, and the adjustable step size of the adjustable resistor is no greater than 0.1Ω.

[0043] Furthermore, by adjusting the adjustable step size of the adjustable cable, the size of the adjustable inductor can be adjusted, thereby fine-tuning the waveform of the interference signal.

[0044] In specific implementations, the adjustable cable should be selected appropriately, with a typical length of 1 meter. Different cable lengths can be selected according to the usage scenario, and the adjustable step of the cable length should not exceed 1 meter to achieve precise fine-tuning of the impedance of the product under test.

[0045] Furthermore, the relationship between the adjustable inductance and the adjustable step size of the adjustable cable is determined by the following formula:

[0046] L=l×μ0 / (2π)[ln(2×l / r)-0.75] (1);

[0047] Where L is the magnitude of the adjustable inductance (m), l is the adjustable step size of the adjustable cable (m), r is the radius of the adjustable cable (m), and μ0 is the permeability of vacuum, μ0=4π10-7 (H / m).

[0048] In one or more embodiments, the test system may have two or more signal paths with adjustable impedance matching network settings, thereby enabling testing of AC ports and DC ports.

[0049] Furthermore, it also includes programmable DC and AC power supplies and a coupling / decoupling network, with the programmable DC and AC power supplies connected to the product under test via the coupling / decoupling network.

[0050] In summary, the test system of this embodiment has the function of resisting surge current performance testing. It adopts a dynamic impedance matching network instead of a conventional fixed impedance network, which makes the test adjustment convenient and the test accuracy high. By utilizing the impedance matching network design with different ranges and the adjustable connection cable length design, impedance matching tests can be performed on the product under test with different impedances.

[0051] Example 2:

[0052] like Figure 2 As shown in the figure, this embodiment provides a test method for the surge current resistance performance of high-power products. Before performing this method, the product under test is placed in an explosion-proof box to prevent damage and explosion of the tested part during the test.

[0053] Furthermore, the test system for the surge current resistance of high-power products described in section one will be connected to the product under test. Specifically, a programmable AC and DC power supply will be electrically connected to the product under test via a coupling-decoupling network, and the device will be powered on and configured to operate normally. Depending on the requirements, an appropriate impedance matching range will be selected on the adjustable impedance matching network, and the system will be connected to the test port of the product under test via an adjustable cable.

[0054] By setting the parameters of the control host signal generator, the inrush current signal generator is instructed to emit the required interference signal. After the testing system generates the interference signal needed to test the product under test, the following steps are performed:

[0055] S100, Measure the initial values ​​of the first and second times of the interference signal, and calculate the ratio of the second time to the first time.

[0056] like Figure 3The image shows a standard waveform of 8 / 20 μs.

[0057] First time T1 (wavefront time): the time required for the current amplitude to rise from 10% to 90%, with a standard value of 8μs (allowable error ±20%).

[0058] Second time T2 (half-peak time): the time required for the amplitude to drop from the peak to 50%, with a standard value of 20μs (allowing ±20% error).

[0059] The aforementioned time parameter ratio T2 / T1 ≈ 20 / 8 = 2.5. This ratio has a direct and deterministic relationship with the damping coefficient ζ of the RLC circuit. For an underdamped RLC series discharge circuit, the time t_peak for the peak current and the rate of waveform decay are both determined by ζ. The ratio of T2 / T1 is a monotonic function of ζ. When ζ decreases, the circuit becomes more oscillatory, T1 becomes shorter, T2 becomes longer, and the T2 / T1 ratio increases; when ζ increases, the circuit is more damped, T1 becomes longer, T2 becomes shorter, and the T2 / T1 ratio decreases.

[0060] In this embodiment, if the measured T2 / T1 > 2.5, it indicates that the damping is too small, and the solution is to increase the adjustable inductance L. Typically, the adjustable inductance L is adjusted first, as it affects both the wavefront and damping. If the measured T2 / T1 < 2.5, it indicates that the damping is too large, and the solution is to decrease the adjustable inductance.

[0061] S200: Compare the calculated ratio with a first set value; if it is less than the first set value, decrease the adjustable inductor by adjusting the adjustable step size until the ratio measured and calculated again falls within the set range; if it is greater than the first set value, increase the adjustable inductor by adjusting the adjustable step size until the ratio measured and calculated again falls within the set range.

[0062] In this step, the adjustment step of the adjustable inductor is no greater than 10μH. The first setting value is 2.5 as mentioned above. The above setting range can be 2.5±20%.

[0063] It is understood that setting a range allows this embodiment to effectively transition between coarse and fine adjustments of the interference signal required for testing the product under test. The number of times the measurement and calculation are repeated can be one or more.

[0064] S300: Is the difference between the first time and 8µs less than the second set value? If so, fine-tune the adjustable resistor to control the second time to reach 20µs; otherwise, fine-tune the adjustable inductor to make the difference between the first time and 8µs less than the second set value (e.g., 2.5µs). (10% = 0.25), then fine-tune the adjustable resistor to control the second time to reach 20us.

[0065] In this step, the adjustable inductor is finely adjusted according to the following formula so that the difference between the first time and 8µs is less than the second set value:

[0066] Lnew = Lcurrent(8 / T1measured) 2 (2);

[0067] Where Lnew is the fine-tuned adjustable inductance, Lcurrent is the current adjustable inductance, and T1measured is the first measured time. Lcurrent is determined by the adjustable cable, as detailed in formula (1).

[0068] Furthermore, when fine-tuning the adjustable resistor, the adjustment step of the adjustable resistor shall not exceed 0.1Ω.

[0069] Based on the above embodiments, the ratio of T2 / T1 may change slightly after each adjustment of the adjustable inductor L, and it may be necessary to perform one or two iterations to simultaneously meet the requirements of T1 and T2.

[0070] It is understandable that the second setting value mentioned above is a pre-set minimum value, meaning that it is close to 8us at the first moment.

[0071] In this embodiment, after the second time is controlled by fine-tuning the adjustable resistor to reach 20us, the method further includes detecting whether there is oscillation or overshoot in the interference signal waveform. When there is oscillation or overshoot, the adjustable capacitor is fine-tuned to suppress the oscillation of the interference signal.

[0072] When fine-tuning the adjustable capacitor, the adjustment step size of the adjustable capacitor should not exceed 4μF.

[0073] When the detected interference signal waveform does not oscillate or overshoot, or when the oscillation of the interference signal is suppressed by fine-tuning, the standard waveform of the interference signal obtained by adjustment is output.

[0074] Furthermore, the damping coefficient of the RLC circuit integrated in the gear shift path is used to detect whether the interference signal waveform oscillates or overshoots. Specifically, if the damping coefficient of the RLC circuit is less than a third set value, the interference signal waveform oscillates or overshoots.

[0075] In a specific embodiment, the third set value can be 1.

[0076] In this embodiment, after obtaining the interference signal with a quasi-waveform, the test system is used to test the anti-interference capability of the product under test under the interference signal with a standard waveform.

[0077] In summary, the test method of this embodiment has the function of testing the resistance to surge current. It adopts a dynamic impedance matching network instead of a conventional fixed impedance network, which makes the test adjustment convenient and the test accuracy high. By using the impedance matching network design with different levels and the adjustable connection cable length design, impedance matching tests can be performed on the product under test with different impedances. Moreover, the adjustable connection cable length design allows for precise fine-tuning of the impedance of the product under test.

[0078] It should be understood that the above embodiments are only special cases and do not indicate that the present invention is implemented in such a way.

[0079] It should be understood that although the steps in the flowcharts of the above embodiments are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the above embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0080] The above description is merely a preferred embodiment of the present invention. Those skilled in the art will understand that various changes or equivalent substitutions can be made to these features and embodiments without departing from the spirit and scope of the present invention. Furthermore, under the teachings of the present invention, these features and embodiments can be modified to adapt to specific situations and materials without departing from the spirit and scope of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of this application are within the protection scope of the present invention.

Claims

1. A testing system for the surge current resistance performance of high-power products, characterized in that, It includes a control host, a signal generator, an adjustable impedance matching network, and an adjustable cable; the control host is connected to the signal generator, the signal generator is connected to the adjustable impedance matching network, and the adjustable impedance matching network is connected to the product under test through the adjustable cable. The adjustable impedance matching network is configured with multiple range paths, each of which integrates an adjustable inductor, an adjustable capacitor, and an adjustable resistor. The control host sets the parameters of the signal generator, so that the signal generator generates the interference signal required for testing the product under test. The waveform of the interference signal is coarsely adjusted by the adjustable inductor corresponding to the gear path. The waveform of the coarsely adjusted interference signal is finely adjusted by the length of the adjustable cable, the adjustable capacitor and the adjustable resistor corresponding to the gear path, so that the interference signal reaches the standard waveform. The adjustable inductance can be adjusted by adjusting the adjustable step size of the adjustable cable, thereby fine-tuning the waveform of the interference signal after coarse adjustment.

2. The test system for the impulse current resistance performance of high-power products according to claim 1, characterized in that, The waveform of the interference signal is coarsely adjusted by the adjustable step size of the adjustable inductor corresponding to the gear path, and the waveform of the coarsely adjusted interference signal is finely adjusted by the adjustable step size of the adjustable capacitor and the adjustable resistor corresponding to the gear path.

3. The test system for the impulse current resistance performance of high-power products according to claim 1, characterized in that, The relationship between the adjustable inductance and the adjustable step size of the adjustable cable is determined by the following formula: L=l×μ0 / (2π)[ln(2×l / r)-0.75]; Where L is the magnitude of the adjustable inductance, l is the adjustable step size of the adjustable cable, r is the radius of the adjustable cable, and μ0 is the vacuum permeability.

4. The test system for the impulse current resistance performance of high-power products according to claim 1, characterized in that, It also includes programmable DC and AC power supplies and a coupling / decoupling network, wherein the programmable DC and AC power supplies are connected to the product under test through the coupling / decoupling network.

5. A test method for the impulse current resistance performance of high-power products, characterized in that, The steps of connecting the test system for the surge current resistance performance of a high-power product as described in any one of claims 1-4 to the product under test, powering on and configuring the product under test to operate normally, and generating the interference signal required for testing the product under test through the test system, include: Measure the initial values ​​of the interference signal at the first and second times, and calculate the ratio of the second time to the first time; The calculated ratio is compared with a first set value; if it is less than the first set value, the adjustable inductor is reduced by the adjustable step size until the ratio measured and calculated again falls within the set range; if it is greater than the first set value, the adjustable inductor is increased by the adjustable step size until the ratio measured and calculated again falls within the set range. If the difference between the first time and 8us is less than the second set value, then the adjustable resistor is finely adjusted to control the second time to reach 20us; otherwise, the adjustable inductor is finely adjusted so that the difference between the first time and 8us is less than the second set value, and then the adjustable resistor is finely adjusted to control the second time to reach 20us.

6. The test method for the surge current resistance of a high-power product according to claim 5, characterized in that, The adjustable inductor is finely adjusted according to the following formula so that the difference between the first time and 8µs is less than the second set value: Lnew=Lcurrent(8 / T1measured) 2 ; Where Lnew is the fine-tuned adjustable inductance, Lcurrent is the current adjustable inductance, and T1measured is the measured first time; The Lcurrent is determined by the adjustable cable.

7. The test method for the impulse current resistance of a high-power product according to claim 5, characterized in that, After fine-tuning the adjustable resistor to control the second time to reach 20µs, the method further includes detecting whether the interference signal waveform oscillates or overshoots. When oscillations or overshoots are present, the adjustable capacitor is fine-tuned to suppress the oscillations of the interference signal. When the detected interference signal waveform does not exhibit oscillation or overshoot, or when the oscillation of the interference signal is suppressed by fine-tuning, the standard waveform of the adjusted interference signal is output.

8. The test method for the impulse current resistance of a high-power product according to claim 7, characterized in that, The damping coefficient of the RLC circuit integrated in the gear path is used to detect whether the interference signal waveform has oscillation or overshoot. If the damping coefficient of the RLC circuit is less than the third set value, the interference signal waveform will oscillate or overshoot.

9. The test method for the impulse current resistance performance of a high-power product according to claim 5, characterized in that, It also includes, after obtaining the interference signal with a quasi-waveform, using the test system to test the anti-interference capability of the product under test under the interference signal with a standard waveform.

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