A direct-current voltage ratio self-calibration method and device based on feature registration

Abstract

The application relates to the technical field of direct-current voltage, and relates to a direct-current voltage ratio self-calibration method and device based on feature registration, which comprises the following steps: receiving a ratio self-calibration instruction and initial calibration parameters, starting a temperature detection unit, detecting an initial ambient temperature, obtaining an internal feature generator, generating an analog signal, inputting the analog signal into a reference channel and a test channel respectively, obtaining a reference channel data sequence and a test channel data sequence, performing feature extraction, obtaining a reference channel feature vector and a test channel feature vector, constructing a feature error function according to the reference channel feature vector, the test channel feature vector and the initial calibration parameters, and calculating a correction amount according to the feature error function, and completing the self-calibration of the direct-current voltage ratio according to the correction amount. The application can improve the accuracy of the direct-current voltage ratio self-calibration.

Description

Technical Field

[0001] This invention relates to the field of DC voltage technology, and in particular to a DC voltage ratio self-calibration method and apparatus based on feature registration. Background Technology

[0002] With the continuous advancement of industrial automation and intelligent measurement and control, DC voltage ratio self-calibration has become an indispensable component of high-precision electrical measurement equipment and sensing systems. By self-calibrating the voltage ratio between the reference channel and the test channel, it can ensure that key components in the system maintain high-precision measurement capabilities under different working environments or operating conditions. Furthermore, DC voltage ratio self-calibration significantly reduces manual intervention.

[0003] Traditional DC voltage ratio calibration methods typically rely on manual calibration and external standard sources, which are complex to operate and have long calibration cycles. Furthermore, manual recalibration is often required after changes in ambient temperature, device aging, or firmware updates, failing to meet the needs of online self-calibration. In addition, fixed calibration parameters are difficult to adapt to dynamic operating conditions, leading to accumulated measurement errors that affect subsequent data analysis and system control accuracy. Therefore, improving the accuracy of DC voltage ratio self-calibration is a crucial problem that urgently needs to be solved. Summary of the Invention

[0004] This invention provides a DC voltage ratio self-calibration method and apparatus based on feature registration, the main purpose of which is to improve the accuracy of DC voltage ratio self-calibration.

[0005] To achieve the above objectives, the present invention provides a DC voltage ratio self-calibration method based on feature registration, comprising:

[0006] The system receives a ratio self-calibration command and initial calibration parameters, and starts a pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters, and phase parameters.

[0007] The initial ambient temperature is obtained by using the temperature detection unit.

[0008] An internal feature generator is obtained, wherein the internal feature generator consists of control firmware, a digital-to-analog converter, and a buffer amplifier;

[0009] An analog signal is generated using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier.

[0010] The analog signals are input into a pre-constructed reference channel and a pre-constructed test channel, respectively, to obtain a reference channel data sequence and a test channel data sequence.

[0011] Feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector;

[0012] A feature error function is constructed based on the reference channel feature vector, the test channel feature vector, and the initial calibration parameters. The correction amount is calculated based on the feature error function, and the self-calibration of the DC voltage ratio is completed based on the correction amount.

[0013] Optionally, the step of generating an analog signal using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier includes:

[0014] Based on the control firmware, waveform parameters and waveform types are automatically generated. The waveform parameters include: primary amplitude, secondary amplitude, fundamental frequency, secondary frequency, slope, phase, rise time, hold time, sampling rate, and number of sample points. The waveform types include: step waveform, ramp waveform, and dual-frequency waveform.

[0015] The primary amplitude and secondary amplitude are corrected by the digital-to-analog converter to obtain the adjusted primary amplitude and adjusted secondary amplitude;

[0016] The required bandwidth is calculated using the waveform type, and the sampling rate is adjusted according to the required bandwidth, slope, rise time, fundamental frequency, secondary frequency and initial ambient temperature to obtain the adjusted sampling rate. The required bandwidth includes: the bandwidth required for step, the bandwidth required for ramp and the bandwidth required for dual frequency.

[0017] The analog signal is generated by adjusting the primary amplitude, secondary amplitude, number of sample points, sampling rate, fundamental frequency, secondary frequency, phase, and buffer amplifier.

[0018] Optionally, the step of calculating the required bandwidth using the waveform type and adjusting the sampling rate based on the required bandwidth, slope, rise time, fundamental frequency, secondary frequency, and initial ambient temperature to obtain an adjusted sampling rate includes:

[0019] The waveform type is identified to obtain the identified waveform;

[0020] When the waveform is identified as a step waveform, the bandwidth required for the step is calculated based on the rise time:

[0021]

[0022] in, The bandwidth required for a step jump. Refers to the rise time;

[0023] When the waveform is identified as a ramp waveform, the voltage change is obtained, and the required bandwidth of the ramp is calculated based on the slope and the holding time.

[0024]

[0025] in, This refers to the bandwidth required for the slope. Refers to the change in voltage. Slope;

[0026] When the identified waveform is a dual-frequency waveform, the required bandwidth for the dual frequencies is calculated based on the fundamental frequency and the secondary frequency:

[0027]

[0028] in, This refers to the bandwidth required for dual-band operation. Refers to the preset maximum value function. Refers to the fundamental frequency. Second frequency;

[0029] The sampling rate is adjusted based on the initial ambient temperature, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency, to obtain the adjusted sampling rate.

[0030] Optionally, adjusting the sampling rate based on the initial ambient temperature, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual-frequency circuitry to obtain an adjusted sampling rate includes:

[0031] Compare the initial ambient temperature with the preset first temperature threshold;

[0032] If the initial ambient temperature is greater than the first temperature threshold, the first margin parameter is confirmed, and the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted according to the first margin parameter to obtain the first bandwidth for the step, the first bandwidth for the ramp, and the first bandwidth for the dual frequency.

[0033] If the initial ambient temperature is less than or equal to the first temperature threshold, then compare the initial ambient temperature with the preset second temperature threshold.

[0034] If the initial ambient temperature is less than the second temperature threshold, the second margin parameter is confirmed, and the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted according to the second margin parameter to obtain the second bandwidth for the step, the second bandwidth for the ramp, and the second bandwidth for the dual frequency.

[0035] If the initial ambient temperature is greater than or equal to the second temperature threshold, then the third margin parameter is confirmed. Based on the third margin parameter, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted to obtain the third bandwidth for the step, the third bandwidth for the ramp, and the third bandwidth for the dual frequency.

[0036] By comparing the step first bandwidth, the ramp first bandwidth, and the dual-frequency first bandwidth, the maximum first bandwidth is obtained, wherein the maximum first bandwidth is the bandwidth with the largest value among the step first bandwidth, the ramp first bandwidth, and the dual-frequency first bandwidth.

[0037] The maximum second bandwidth is obtained based on the step second bandwidth, the ramp second bandwidth, and the dual-frequency second bandwidth. The maximum third bandwidth is obtained based on the step third bandwidth, the ramp third bandwidth, and the dual-frequency third bandwidth. The maximum second bandwidth is the bandwidth with the largest value among the step second bandwidth, the ramp second bandwidth, and the dual-frequency second bandwidth. The maximum third bandwidth is the bandwidth with the largest value among the step third bandwidth, the ramp third bandwidth, and the dual-frequency third bandwidth.

[0038] The sampling rate is adjusted using the maximum first bandwidth, the maximum second bandwidth, and the maximum third bandwidth to obtain the adjusted sampling rate.

[0039] Optionally, adjusting the sampling rate using the maximum first bandwidth, the maximum second bandwidth, and the maximum third bandwidth to obtain an adjusted sampling rate includes:

[0040] The first margin lower limit and the first safety lower limit are calculated based on the first margin parameter and the maximum first bandwidth, wherein the calculation formula for the first margin lower limit is as follows:

[0041]

[0042] in, This refers to the lower limit of the first margin. Refers to the maximum first bandwidth;

[0043] The formula for calculating the first safety lower limit is as follows:

[0044]

[0045] in, This refers to the first safety lower limit. Refers to the first margin parameter;

[0046] The first sampling rate is calculated based on the first margin lower limit and the first safety lower limit, wherein the formula for calculating the first sampling rate is as follows:

[0047]

[0048] in, Refers to the first sampling rate;

[0049] Calculate the second margin lower limit and the second safety lower limit using the second margin parameter and the maximum second bandwidth;

[0050] The second sampling rate is calculated based on the second margin lower limit and the second safety lower limit, wherein the formula for calculating the second sampling rate is as follows:

[0051] in, Refers to the second sampling rate. This refers to the lower limit of the second margin. This refers to the second safety lower limit;

[0052] The third margin parameter and the maximum third bandwidth are used to calculate the third margin lower limit and the third safety lower limit;

[0053] The third sampling rate is calculated based on the third margin lower limit and the third safety lower limit, wherein the formula for calculating the third sampling rate is as follows:

[0054] in, Refers to the third sampling rate. This refers to the lower limit of the third residual. This refers to the third safety lower bound;

[0055] The first sampling rate, the second sampling rate, and the third sampling rate are identified as the adjusted sampling rates.

[0056] Optionally, the step of extracting features from the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector includes:

[0057] The reference step response characteristics, reference ramp response characteristics, and reference dual-frequency response characteristics are obtained based on the reference channel data sequence. The reference step response characteristics include: base voltage, stable voltage, step time, step slope, and step overshoot rate. The reference ramp response characteristics include: ramp slope and ramp residual. The reference dual-frequency response characteristics include: amplitude and phase.

[0058] The test step response characteristics, test ramp response characteristics, and test dual-frequency response characteristics are obtained based on the test channel data sequence.

[0059] A reference channel feature vector is constructed using the base voltage, stable voltage, step time, step slope, step overshoot rate, ramp slope, ramp residual, amplitude, and phase.

[0060] The test channel feature vector is constructed using the test step response characteristics, test ramp response characteristics, and test dual-frequency response characteristics.

[0061] Optionally, obtaining the reference step response characteristics, reference ramp response characteristics, and reference dual-frequency response characteristics based on the reference channel data sequence includes:

[0062] Obtain the initial step index, and calculate the base voltage based on the initial step index. The formula for calculating the base voltage is as follows:

[0063]

[0064] in, Refers to base voltage. Refers to the initial step index. Refers to the preset reference sequence index. This refers to the preset number of baseline points. The reference sequence index is Reference channel data at that time;

[0065] Obtain the step end index, and calculate the stable voltage based on the step end index. The formula for calculating the stable voltage is as follows:

[0066]

[0067] in, Refers to stable voltage. The index indicating the end of the step jump;

[0068] The step time is calculated based on the base voltage and the stable voltage, and the reference channel data within the step time is fitted to obtain the step slope.

[0069] The reference channel data sequence is retrieved based on the step end index and the preset overshoot search window to obtain the maximum peak value in the interval.

[0070] Calculate the step overshoot rate based on the maximum peak value, base voltage, and stable voltage of the aforementioned interval;

[0071] The base voltage, steady voltage, step time, step slope, and step overshoot rate are identified as reference step response characteristics.

[0072] The reference ramp response characteristics and reference dual-frequency response characteristics are obtained based on the reference channel data sequence.

[0073] Optionally, obtaining the reference ramp response characteristics and reference dual-frequency response characteristics based on the reference channel data sequence includes:

[0074] Obtain the slope start point and slope end point from the reference channel data sequence, and obtain the slope point set based on the slope start point and slope end point;

[0075] Linear fitting is performed on the slope point set to obtain the slope slope, and the slope residual is calculated. The slope slope and slope residual are then identified as the reference slope response characteristics.

[0076] Dual-frequency waveform data is obtained from the reference channel data sequence. Frequency domain features are extracted from the dual-frequency waveform data to obtain amplitude and phase. The amplitude and phase are then identified as the reference dual-frequency response features.

[0077] Optionally, the reference channel feature vector is as follows:

[0078]

[0079] in, Refers to the reference channel feature vector. Refers to base voltage. Refers to stable voltage. Refers to step time. The slope of the step jump. The step overshoot rate, The slope of the incline. Refers to the slope residual. Amplitude Phase.

[0080] To achieve the above objectives, the present invention also provides a DC voltage ratio self-calibration device based on feature registration, comprising:

[0081] The calibration start-up module is used to receive the ratio self-calibration command and initial calibration parameters, and start the pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters and phase parameters.

[0082] The signal generation module is used to detect the initial ambient temperature using the temperature detection unit.

[0083] An internal feature generator is obtained, wherein the internal feature generator consists of control firmware, a digital-to-analog converter, and a buffer amplifier;

[0084] An analog signal is generated using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier.

[0085] The feature extraction module is used to input the analog signal into a pre-constructed reference channel and a pre-constructed test channel respectively to obtain the reference channel data sequence and the test channel data sequence;

[0086] Feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector;

[0087] The correction calibration module is used to construct a feature error function based on the reference channel feature vector, the test channel feature vector and the initial calibration parameters, calculate the correction amount based on the feature error function, and complete the self-calibration of the DC voltage ratio based on the correction amount.

[0088] To address the above problems, the present invention also provides an electronic device, the electronic device comprising:

[0089] Memory, storing at least one instruction;

[0090] The processor executes the instructions stored in the memory to implement the feature registration-based DC voltage ratio self-calibration method described above.

[0091] To address the aforementioned problems, the present invention also provides a computer-readable storage medium storing at least one instruction, which is executed by a processor in an electronic device to implement the aforementioned feature-registration-based DC voltage ratio self-calibration method.

[0092] To address the problems described in the background art, this invention first receives a ratio self-calibration command and initial calibration parameters. Based on the received ratio self-calibration command, a temperature detection unit is activated to ensure the self-calibration process is accurately triggered by the ratio self-calibration command, which carries gain, offset, and phase parameters. By immediately activating the temperature detection unit, the initial ambient temperature can be acquired at the start of the self-calibration process, achieving environmentally dependent compensation preparation and avoiding subsequent errors caused by temperature changes. Second, an internal feature generator is acquired, consisting of control firmware, a digital-to-analog converter, and a buffer amplifier. This control firmware, digital-to-analog converter, and buffer amplifier are combined into a repeatable and programmable signal generation subsystem, providing the equipment foundation for subsequent analog signal generation. Then, the control firmware and digital-to-analog converter are used to generate the signal. The converter and buffer amplifier generate analog signals. Based on the control firmware, the digital-to-analog converter and buffer amplifier produce precisely controllable step waveforms, ramp waveforms, and dual-frequency waveforms, ensuring that the analog signal parameters meet design requirements and improving the quality of the analog signal. Furthermore, the analog signals are input to the reference channel and test channel respectively, ensuring that the analog signals are input simultaneously, with the same amplitude and phase in both channels, eliminating injection inconsistencies at the source and providing reliable data for subsequent feature comparison. Then, feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector, providing a foundation for the construction of the subsequent feature error function. Finally, the feature error function is constructed and the correction amount is calculated, making the self-calibration results more reliable and accurate. Therefore, this invention can improve the accuracy of DC voltage ratio self-calibration. Attached Figure Description

[0093] Figure 1 This is a flowchart illustrating a DC voltage ratio self-calibration method based on feature registration provided in an embodiment of the present invention.

[0094] Figure 2A functional block diagram of a DC voltage ratio self-calibration device based on feature registration provided in an embodiment of the present invention;

[0095] Figure 3 This is a schematic diagram of an electronic device that implements the feature-registration-based DC voltage ratio self-calibration method according to an embodiment of the present invention.

[0096] Explanation of reference numerals in the attached figures:

[0097] 10. Electronic device; 11. Processor; 12. Memory; 13. Bus.

[0098] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0099] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0100] This application provides a DC voltage ratio self-calibration method based on feature registration. The execution entity of the feature registration-based DC voltage ratio self-calibration method includes, but is not limited to, at least one of the following electronic devices that can be configured to execute the method provided in this application: a server, a terminal, etc. In other words, the feature registration-based DC voltage ratio self-calibration method can be executed by software or hardware installed on a terminal device or a server device, and the software can be a blockchain platform. The server includes, but is not limited to, a single server, a server cluster, a cloud server, or a cloud server cluster.

[0101] Reference Figure 1 The diagram shown is a flowchart illustrating a DC voltage ratio self-calibration method based on feature registration according to an embodiment of the present invention. In this embodiment, the DC voltage ratio self-calibration method based on feature registration includes:

[0102] S1. Receive the ratio self-calibration command and initial calibration parameters, and start the pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters and phase parameters.

[0103] Explainable, the ratio self-calibration command refers to a manually issued command used to self-calibrate the DC voltage ratio. For example, Xiao Zhang, a company employee, needs to perform DC voltage ratio self-calibration one day. Therefore, Xiao Zhang issues a ratio self-calibration command, which activates the compensation unit. Initial calibration parameters include gain, offset, and phase parameters. Optional parameters include a gain of 1.0000, an offset of 0.00023V, and a phase of 0.003°. The temperature detection unit refers to the unit used to detect the initial ambient temperature, which is the air temperature.

[0104] S2. The initial ambient temperature is obtained by using the temperature detection unit.

[0105] S3. Obtain the internal feature generator, wherein the internal feature generator consists of control firmware, a digital-to-analog converter and a buffer amplifier.

[0106] Explainable, the internal characteristic generator refers to a device composed of control firmware, a digital-to-analog converter, a buffer amplifier, and control logic, used to simulate test voltage. The test voltage refers to the voltage used for DC voltage ratio self-calibration. The control firmware refers to the MCU, or microcontroller unit, which is used to send waveform parameters and waveform types downwards. Waveform parameters include: primary amplitude, secondary amplitude, fundamental frequency, secondary frequency, slope, phase, rise time, hold time, sampling rate, and number of sample points. Waveform types include: step waveform, ramp waveform, and dual-frequency waveform. The digital-to-analog converter is the DAC. Primary amplitude and secondary amplitude refer to the amplitude of the waveform in the dual-frequency waveform. A step waveform refers to a waveform formed when the voltage changes abruptly from the initial voltage value to the target voltage value within a change time and is held at the target voltage value for a period of time. The initial voltage value refers to 10% of the target voltage value. The target voltage value refers to the manually set voltage value. The change time refers to the time taken for the voltage in the step waveform to change from the initial voltage value to the target voltage value. The rise time refers to the change time in the step waveform. A ramp waveform refers to a waveform in which the voltage changes linearly at a constant rate, gradually rising or falling from an initial voltage value to a target voltage value. The slope refers to the gradient of the ramp waveform, and the hold time refers to the time it takes for the ramp waveform to change from the initial voltage value to the target voltage value. A dual-frequency waveform is a composite sine wave formed by superimposing two sinusoidal signals of different frequencies. The fundamental frequency and the secondary frequency are the frequencies in the dual-frequency waveform. The phase refers to the phase difference between the two sinusoidal signals of different frequencies in the dual-frequency waveform. The sampling rate is a manually set frequency at which the voltage is sampled. The number of sample points refers to the number of sample points during the rise time and hold time; the number of sample points is determined by the sampling rate, rise time, and hold time.

[0107] S4. Use the initial ambient temperature, control firmware, digital-to-analog converter and buffer amplifier to generate an analog signal.

[0108] Specifically, the generation of analog signals using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier includes:

[0109] Based on the control firmware, waveform parameters and waveform types are automatically generated. The waveform parameters include: primary amplitude, secondary amplitude, fundamental frequency, secondary frequency, slope, phase, rise time, hold time, sampling rate, and number of sample points. The waveform types include: step waveform, ramp waveform, and dual-frequency waveform.

[0110] The primary amplitude and secondary amplitude are corrected by the digital-to-analog converter to obtain the adjusted primary amplitude and adjusted secondary amplitude;

[0111] The required bandwidth is calculated using the waveform type, and the sampling rate is adjusted according to the required bandwidth, slope, rise time, fundamental frequency, secondary frequency and initial ambient temperature to obtain the adjusted sampling rate. The required bandwidth includes: the bandwidth required for step, the bandwidth required for ramp and the bandwidth required for dual frequency.

[0112] The analog signal is generated by adjusting the primary amplitude, secondary amplitude, number of sample points, sampling rate, fundamental frequency, secondary frequency, phase, and buffer amplifier.

[0113] The amplitude obtained by adjusting the primary amplitude using the primary amplitude exponential converter (PAC) and the amplitude obtained by adjusting the secondary amplitude using the secondary amplitude exponential converter (DAC) are explained as follows: The process involves determining whether the primary and secondary amplitudes exceed the range set by the ADC. If the primary or secondary amplitude exceeds the range set by the ADC, it is adjusted to the maximum range set by the ADC. If the primary or secondary amplitude is less than the range set by the ADC, it is adjusted to the minimum range set by the ADC. The required bandwidth refers to the minimum frequency that needs to be covered to accurately generate the waveform of the indicated type. The adjusted sampling rate refers to the sampling rate obtained after adjusting the sampling rate according to the required bandwidth, slope, rise time, fundamental frequency, and secondary frequency. The required bandwidth for a step waveform refers to the minimum frequency required for a step waveform, the required bandwidth for a ramp waveform, and the required bandwidth for a dual-frequency waveform. The analog signal refers to the voltage signal generated by the control firmware, the ADC, and the buffer amplifier. Generating analog signals is existing technology and will not be elaborated further here.

[0114] In detail, the step of calculating the required bandwidth using the waveform type and adjusting the sampling rate based on the required bandwidth, slope, rise time, fundamental frequency, second frequency, and initial ambient temperature to obtain an adjusted sampling rate includes:

[0115] The waveform type is identified to obtain the identified waveform;

[0116] When the waveform is identified as a step waveform, the bandwidth required for the step is calculated based on the rise time:

[0117]

[0118] in, The bandwidth required for a step jump. Refers to the rise time;

[0119] When the waveform is identified as a ramp waveform, the voltage change is obtained, and the required bandwidth of the ramp is calculated based on the slope and the holding time.

[0120]

[0121] in, This refers to the bandwidth required for the slope. Refers to the change in voltage. Slope;

[0122] When the identified waveform is a dual-frequency waveform, the required bandwidth for the dual frequencies is calculated based on the fundamental frequency and the secondary frequency:

[0123]

[0124] in, This refers to the bandwidth required for dual-band operation. Refers to the preset maximum value function. Refers to the fundamental frequency. Second frequency;

[0125] The sampling rate is adjusted based on the initial ambient temperature, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency, to obtain the adjusted sampling rate.

[0126] Explainable terms include: waveform identification (the type of waveform obtained after identifying the waveform type), voltage change (the amount of change from the initial voltage value to the target voltage value), and maximum value function (the function that takes the maximum value). =4.

[0127] Specifically, adjusting the sampling rate based on the initial ambient temperature, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual-frequency circuitry to obtain the adjusted sampling rate includes:

[0128] Compare the initial ambient temperature with the preset first temperature threshold;

[0129] If the initial ambient temperature is greater than the first temperature threshold, the first margin parameter is confirmed, and the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted according to the first margin parameter to obtain the first bandwidth for the step, the first bandwidth for the ramp, and the first bandwidth for the dual frequency.

[0130] If the initial ambient temperature is less than or equal to the first temperature threshold, then compare the initial ambient temperature with the preset second temperature threshold.

[0131] If the initial ambient temperature is less than the second temperature threshold, the second margin parameter is confirmed, and the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted according to the second margin parameter to obtain the second bandwidth for the step, the second bandwidth for the ramp, and the second bandwidth for the dual frequency.

[0132] If the initial ambient temperature is greater than or equal to the second temperature threshold, then the third margin parameter is confirmed. Based on the third margin parameter, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted to obtain the third bandwidth for the step, the third bandwidth for the ramp, and the third bandwidth for the dual frequency.

[0133] By comparing the step first bandwidth, the ramp first bandwidth, and the dual-frequency first bandwidth, the maximum first bandwidth is obtained, wherein the maximum first bandwidth is the bandwidth with the largest value among the step first bandwidth, the ramp first bandwidth, and the dual-frequency first bandwidth.

[0134] The maximum second bandwidth is obtained based on the step second bandwidth, the ramp second bandwidth, and the dual-frequency second bandwidth. The maximum third bandwidth is obtained based on the step third bandwidth, the ramp third bandwidth, and the dual-frequency third bandwidth. The maximum second bandwidth is the bandwidth with the largest value among the step second bandwidth, the ramp second bandwidth, and the dual-frequency second bandwidth. The maximum third bandwidth is the bandwidth with the largest value among the step third bandwidth, the ramp third bandwidth, and the dual-frequency third bandwidth.

[0135] The sampling rate is adjusted using the maximum first bandwidth, the maximum second bandwidth, and the maximum third bandwidth to obtain the adjusted sampling rate.

[0136] Explained, the first temperature threshold refers to a manually set threshold used to determine the initial ambient temperature; optionally, the first temperature threshold is 50℃. The first margin parameter refers to the parameter corresponding to the first temperature threshold, used to calculate the first step bandwidth, the first ramp bandwidth, and the first dual-frequency bandwidth; optionally, the first margin parameter is 15. The first step bandwidth refers to the bandwidth obtained by multiplying the first margin parameter by the required step bandwidth; the first ramp bandwidth refers to the bandwidth obtained by multiplying the first margin parameter by the required ramp bandwidth; the first dual-frequency bandwidth refers to the bandwidth obtained by multiplying the first margin parameter by the required dual-frequency bandwidth. The second temperature threshold refers to a manually set threshold used to determine the initial ambient temperature when it is less than or equal to the first temperature threshold; optionally, the second temperature threshold is 10℃. The second margin parameter refers to the parameter corresponding to the second temperature threshold, used to calculate the second step bandwidth, the second ramp bandwidth, and the second dual-frequency bandwidth. The second bandwidth of a step jump refers to the bandwidth obtained by multiplying the second margin parameter by the bandwidth required for the step jump. The second bandwidth of a ramp jump refers to the bandwidth obtained by multiplying the second margin parameter by the bandwidth required for the ramp jump. The second bandwidth of a dual-frequency jump refers to the bandwidth obtained by multiplying the second margin parameter by the bandwidth required for the dual-frequency jump. The third margin parameter refers to the parameter used to calculate the third bandwidth of the step jump, the third bandwidth of the ramp jump, and the third bandwidth of the dual-frequency jump.

[0137] In detail, adjusting the sampling rate using the maximum first bandwidth, the maximum second bandwidth, and the maximum third bandwidth to obtain an adjusted sampling rate includes:

[0138] The first margin lower limit and the first safety lower limit are calculated based on the first margin parameter and the maximum first bandwidth, wherein the calculation formula for the first margin lower limit is as follows:

[0139]

[0140] in, This refers to the lower limit of the first margin. Refers to the maximum first bandwidth;

[0141] The formula for calculating the first safety lower limit is as follows:

[0142]

[0143] in, This refers to the first safety lower limit. Refers to the first margin parameter;

[0144] The first sampling rate is calculated based on the first margin lower limit and the first safety lower limit, wherein the formula for calculating the first sampling rate is as follows:

[0145]

[0146] in, Refers to the first sampling rate;

[0147] Calculate the second margin lower limit and the second safety lower limit using the second margin parameter and the maximum second bandwidth;

[0148] The second sampling rate is calculated based on the second margin lower limit and the second safety lower limit, wherein the formula for calculating the second sampling rate is as follows:

[0149] in, Refers to the second sampling rate. This refers to the lower limit of the second margin. This refers to the second safety lower limit;

[0150] The third margin parameter and the maximum third bandwidth are used to calculate the third margin lower limit and the third safety lower limit;

[0151] The third sampling rate is calculated based on the third margin lower limit and the third safety lower limit, wherein the formula for calculating the third sampling rate is as follows:

[0152] in, Refers to the third sampling rate. This refers to the lower limit of the third residual. This refers to the third safety lower bound;

[0153] The first sampling rate, the second sampling rate, and the third sampling rate are identified as the adjusted sampling rates.

[0154] Explained, the first margin lower limit refers to twice the maximum first bandwidth, the first safety lower limit refers to the product of the maximum first bandwidth and the first margin parameter, the first sampling rate refers to the larger of the first margin lower limit and the first safety lower limit, the second margin lower limit refers to twice the maximum second bandwidth, the second safety lower limit refers to the product of the maximum second bandwidth and the second margin parameter, the second sampling rate refers to the larger of the second margin lower limit and the second safety lower limit, the third margin lower limit refers to twice the maximum third bandwidth, the third safety lower limit refers to the product of the maximum third bandwidth and the third margin parameter, and the third sampling rate refers to the larger of the third margin lower limit and the third safety lower limit.

[0155] S5. Input the analog signal into the pre-constructed reference channel and the pre-constructed test channel respectively to obtain the reference channel data sequence and the test channel data sequence.

[0156] Explained, the reference channel and the test channel are two completely independent paths used to receive analog signals and output corresponding data sequences. The reference channel data sequence refers to the sequence output after the analog signal is continuously sampled by the analog-to-digital converter in the reference channel. The test channel data sequence refers to the sequence output after the analog signal is continuously sampled by the analog-to-digital converter in the test channel. Each data point in the data sequence is a digital value corresponding to the voltage of the reference channel or test channel at that data sampling moment. Both the reference channel data sequence and the test channel data sequence include step waveform data, ramp waveform data, and dual-frequency waveform data. Step waveform data refers to the data corresponding to the step waveform, ramp waveform data refers to the data corresponding to the ramp waveform, and dual-frequency waveform data refers to the data corresponding to the dual-frequency waveform.

[0157] S6. Perform feature extraction on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector.

[0158] Specifically, the step of extracting features from the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector includes:

[0159] The reference step response characteristics, reference ramp response characteristics, and reference dual-frequency response characteristics are obtained based on the reference channel data sequence. The reference step response characteristics include: base voltage, stable voltage, step time, step slope, and step overshoot rate. The reference ramp response characteristics include: ramp slope and ramp residual. The reference dual-frequency response characteristics include: amplitude and phase.

[0160] The test step response characteristics, test ramp response characteristics, and test dual-frequency response characteristics are obtained based on the test channel data sequence.

[0161] A reference channel feature vector is constructed using the base voltage, stable voltage, step time, step slope, step overshoot rate, ramp slope, ramp residual, amplitude, and phase.

[0162] The test channel feature vector is constructed using the test step response characteristics, test ramp response characteristics, and test dual-frequency response characteristics.

[0163] Explainable terms: Reference channel feature vector refers to the vector obtained after performing time-domain feature extraction and frequency-domain feature extraction on the reference channel data sequence; test channel feature vector refers to the vector obtained after performing time-domain feature extraction and frequency-domain feature extraction on the test channel data sequence. Reference step response feature refers to the data obtained after performing time-domain feature extraction on the step waveform data in the reference channel data sequence; reference ramp response feature refers to the data obtained after performing time-domain feature extraction on the ramp waveform data in the reference channel data sequence; reference dual-frequency response feature refers to the data obtained after performing frequency-domain feature extraction on the dual-frequency waveform data in the reference channel data sequence. Test step response feature refers to the data obtained after performing time-domain feature extraction on the step waveform data in the test channel data sequence; test ramp response feature refers to the data obtained after performing time-domain feature extraction on the test waveform data in the test channel data sequence; test dual-frequency response feature refers to the data obtained after performing frequency-domain feature extraction on the dual-frequency waveform data in the test channel data sequence.

[0164] Specifically, obtaining the reference step response characteristics, reference ramp response characteristics, and reference dual-frequency response characteristics based on the reference channel data sequence includes:

[0165] Obtain the initial step index, and calculate the base voltage based on the initial step index. The formula for calculating the base voltage is as follows:

[0166]

[0167] in, Refers to base voltage. Refers to the initial step index. Refers to the preset reference sequence index. This refers to the preset number of baseline points. The reference sequence index is Reference channel data at that time;

[0168] Obtain the step end index, and calculate the stable voltage based on the step end index. The formula for calculating the stable voltage is as follows:

[0169]

[0170] in, Refers to stable voltage. The index indicating the end of the step jump;

[0171] The step time is calculated based on the base voltage and the stable voltage, and the reference channel data within the step time is fitted to obtain the step slope.

[0172] The reference channel data sequence is retrieved based on the step end index and the preset overshoot search window to obtain the maximum peak value in the interval.

[0173] Calculate the step overshoot rate based on the maximum peak value, base voltage, and stable voltage of the aforementioned interval;

[0174] The base voltage, steady voltage, step time, step slope, and step overshoot rate are identified as reference step response characteristics.

[0175] The reference ramp response characteristics and reference dual-frequency response characteristics are obtained based on the reference channel data sequence.

[0176] Explainable, the initial step index refers to the index of the data point in the step waveform data of the reference channel data sequence when the voltage begins to change. The voltage begins to change when the difference between two adjacent voltages exceeds the change threshold. The change threshold is a manually set voltage value. The base voltage refers to the voltage calculated based on the initial step index and the reference channel data. The base voltage reflects the average voltage in the step waveform data when it has not yet started to change. The reference sequence index refers to the index used to traverse the reference channel data in the reference channel data sequence. The number of baseline points refers to a manually set parameter used to represent the number of reference channel data in the reference channel data sequence. Optionally, the number of baseline points is 50. The step end index refers to the index of the data point in the step waveform data of the reference channel data sequence when the voltage is stable. Voltage stability means that the difference between two adjacent voltages is less than or equal to the change threshold. Stable voltage refers to the voltage calculated based on the step end index and the reference channel data. Step time refers to the time between the initial step index and the step end index. Step slope refers to the slope obtained after linear fitting of the reference channel data within the step time. Linear fitting is an existing technology and will not be elaborated here. Overshoot search window refers to a manually set time window used to calculate the step overshoot rate. Maximum peak value in the interval refers to the maximum voltage within the overshoot search window starting from the step end index. Step overshoot rate refers to the ratio calculated based on the maximum peak value in the interval, the base voltage, and the stable voltage.

[0177] Specifically, obtaining the reference ramp response characteristics and reference dual-frequency response characteristics based on the reference channel data sequence includes:

[0178] Obtain the slope start point and slope end point from the reference channel data sequence, and obtain the slope point set based on the slope start point and slope end point;

[0179] Linear fitting is performed on the slope point set to obtain the slope slope, and the slope residual is calculated. The slope slope and slope residual are then identified as the reference slope response characteristics.

[0180] Dual-frequency waveform data is obtained from the reference channel data sequence, and frequency domain features are extracted from the dual-frequency waveform data to obtain amplitude and phase. The amplitude and phase are then confirmed as reference dual-frequency response features.

[0181] Explained terms: The ramp start point refers to the data point in the ramp waveform data of the reference channel data sequence where the voltage begins to change; the ramp end point refers to the data point in the ramp waveform data of the reference channel data sequence where the voltage stabilizes; the ramp point set refers to the set of ramp points; the ramp point count refers to the data points between the ramp start point and the ramp end point; linear fitting of the ramp point set yields the ramp slope by performing a least-squares linear fit on all data points in the ramp point set; the ramp residual refers to the root mean square residual of the least-squares linear fit; amplitude refers to the amplitude of the dual-frequency waveform data; and phase refers to the phase of the dual-frequency waveform data.

[0182] In detail, the reference channel feature vector is as follows:

[0183]

[0184] in, Refers to the reference channel feature vector. Refers to base voltage. Refers to stable voltage. Refers to step time. The slope of the step jump. The step overshoot rate, The slope of the incline. Refers to the slope residual. Amplitude Phase.

[0185] The method for constructing the feature vector of the test channel is the same as that for constructing the feature vector of the reference channel, and will not be repeated here.

[0186] S7. Construct a feature error function based on the reference channel feature vector, the test channel feature vector, and the initial calibration parameters, calculate the correction amount based on the feature error function, and complete the self-calibration of the DC voltage ratio based on the correction amount.

[0187] The explanation is that the feature error function constructed based on the reference channel feature vector, the test channel feature vector, and the initial calibration parameters specifically involves: correcting the test channel feature vector according to the initial calibration parameters to obtain a corrected test feature vector. For example, correcting the channel voltage in the test channel feature vector to obtain a corrected channel voltage, wherein the corrected channel voltage is as follows:

[0188]

[0189] in, Refers to correcting the channel voltage. Channel voltage, Refers to the offset parameter. This refers to the gain parameter.

[0190] The channel phase in the test channel feature vector is corrected to obtain the corrected channel phase, as shown below:

[0191]

[0192] in, Refers to correcting the channel phase. Refers to channel phase, Refers to the phase parameter.

[0193] Interpretable, channel voltage refers to the voltage corresponding to the base voltage in the test channel characteristic vector, and channel phase refers to the value corresponding to the phase in the test channel characteristic vector. Subtracting the corrected test characteristic vector from the reference channel characteristic vector yields the error vector. A characteristic error function is then constructed based on this error vector, as shown below:

[0194]

[0195] in, The characteristic error function, The weight matrix. This refers to correcting the test feature vector. The second norm of a pointer.

[0196] Explainable refer to , The transpose symbol is used. The weight matrix is ​​a diagonal matrix constructed based on the weights of each corrected test feature in the corrected test feature vector. The weights of each corrected test feature are manually set. The correction amount is solved by weighted least squares on the feature error function. The correction amount includes: gain correction value, offset correction value, and phase error value. The gain correction value is the value obtained after correcting the gain parameter, the offset correction value is the value obtained after correcting the offset parameter, and the phase error value is the value obtained after correcting the phase parameter. Finally, the self-calibration of the DC voltage ratio is completed based on the correction amount.

[0197] To address the problems described in the background art, this invention first receives a ratio self-calibration command and initial calibration parameters. Based on the received ratio self-calibration command, a temperature detection unit is activated to ensure the self-calibration process is accurately triggered by the ratio self-calibration command, which carries gain, offset, and phase parameters. By immediately activating the temperature detection unit, the initial ambient temperature can be acquired at the start of the self-calibration process, achieving environmentally dependent compensation preparation and avoiding subsequent errors caused by temperature changes. Second, an internal feature generator is acquired, consisting of control firmware, a digital-to-analog converter, and a buffer amplifier. This control firmware, digital-to-analog converter, and buffer amplifier are combined into a repeatable and programmable signal generation subsystem, providing the equipment foundation for subsequent analog signal generation. Then, the control firmware and digital-to-analog converter are used to generate the signal. The converter and buffer amplifier generate analog signals. Based on the control firmware, the digital-to-analog converter and buffer amplifier produce precisely controllable step waveforms, ramp waveforms, and dual-frequency waveforms, ensuring that the analog signal parameters meet design requirements and improving the quality of the analog signal. Furthermore, the analog signals are input to the reference channel and test channel respectively, ensuring that the analog signals are input simultaneously, with the same amplitude and phase in both channels, eliminating injection inconsistencies at the source and providing reliable data for subsequent feature comparison. Then, feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector, providing a foundation for the construction of the subsequent feature error function. Finally, the feature error function is constructed and the correction amount is calculated, making the self-calibration results more reliable and accurate. Therefore, this invention can improve the accuracy of DC voltage ratio self-calibration.

[0198] like Figure 2 The diagram shown is a functional block diagram of a DC voltage ratio self-calibration device based on feature registration provided in an embodiment of the present invention.

[0199] The feature-registration-based DC voltage ratio self-calibration device 100 of the present invention can be installed in an electronic device. Depending on the functions implemented, the feature-registration-based DC voltage ratio self-calibration device 100 may include a calibration initiation module 101, a signal generation module 102, a feature extraction module 103, and a correction calibration module 104. The module described in this invention can also be referred to as a unit, which refers to a series of computer program segments that can be executed by the processor of an electronic device and can perform a fixed function, and are stored in the memory of the electronic device.

[0200] The calibration start module 101 is used to receive a ratio self-calibration command and initial calibration parameters, and start a pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters and phase parameters.

[0201] The signal generation module 102 is used to detect the initial ambient temperature using the temperature detection unit.

[0202] An internal feature generator is obtained, wherein the internal feature generator consists of control firmware, a digital-to-analog converter, and a buffer amplifier;

[0203] An analog signal is generated using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier.

[0204] The feature extraction module 103 is used to input the analog signal into a pre-constructed reference channel and a pre-constructed test channel respectively to obtain a reference channel data sequence and a test channel data sequence.

[0205] Feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector;

[0206] The correction calibration module 104 is used to construct a feature error function based on the reference channel feature vector, the test channel feature vector and the initial calibration parameters, calculate the correction amount based on the feature error function, and complete the self-calibration of the DC voltage ratio based on the correction amount.

[0207] In detail, the modules in the feature-registration-based DC voltage ratio self-calibration device 100 described in this embodiment of the invention employ the same methods as described above during use. Figure 1 The method uses the same technique as the feature registration-based DC voltage ratio self-calibration method described above and can produce the same technical effect, so it will not be repeated here.

[0208] like Figure 3 The diagram shown is a schematic representation of an electronic device that implements a feature-registration-based DC voltage ratio self-calibration method according to an embodiment of the present invention.

[0209] The electronic device 1 may include a processor 10, a memory 11 and a bus 12, and may also include a computer program stored in the memory 11 and executable on the processor 10, such as a DC voltage ratio self-calibration method program based on feature registration.

[0210] The memory 11 includes at least one type of readable storage medium, such as flash memory, portable hard drive, multimedia card, card-type memory (e.g., SD or DX memory), magnetic memory, magnetic disk, optical disk, etc. In some embodiments, the memory 11 can be an internal storage unit of the electronic device 1, such as a portable hard drive. In other embodiments, the memory 11 can be an external storage device of the electronic device 1, such as a plug-in portable hard drive, smart media card (SMC), secure digital card (SD), flash card, etc., equipped on the electronic device 1. Furthermore, the memory 11 includes both internal storage units and external storage devices of the electronic device 1. The memory 11 can be used not only to store application software and various types of data installed on the electronic device 1, such as the code of a DC voltage ratio self-calibration method program based on feature registration, but also to temporarily store data that has been output or will be output.

[0211] In some embodiments, the processor 10 may be composed of integrated circuits, such as a single packaged integrated circuit or multiple integrated circuits with the same or different functions, including combinations of one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and various control chips. The processor 10 is the control unit of the electronic device, connecting various components of the entire electronic device via various interfaces and lines. It executes programs or modules stored in the memory 11 (e.g., a DC voltage ratio self-calibration method program based on feature registration) and calls data stored in the memory 11 to perform various functions of the electronic device 1 and process data.

[0212] The bus 12 can be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The bus 12 can be divided into an address bus, a data bus, a control bus, etc. The bus 12 is configured to realize the connection and communication between the memory 11 and at least one processor 10, etc.

[0213] Figure 3 Only electronic devices with components are shown; it will be understood by those skilled in the art that... Figure 3The structure shown does not constitute a limitation on the electronic device 1, and may include fewer or more components than shown, or combine certain components, or have different component arrangements.

[0214] For example, although not shown, the electronic device 1 may also include a power supply (such as a battery) to power the various components. Preferably, the power supply can be logically connected to the at least one processor 10 through a power management device, thereby enabling functions such as charging management, discharging management, and power consumption management. The power supply may also include one or more DC or AC power supplies, recharging devices, power fault detection circuits, power converters or inverters, power status indicators, and other arbitrary components. The electronic device 1 may also include various sensors, Bluetooth modules, Wi-Fi modules, etc., which will not be described in detail here.

[0215] Furthermore, the electronic device 1 may also include a network interface. Optionally, the network interface may include a wired interface and / or a wireless interface (such as a Wi-Fi interface, a Bluetooth interface, etc.), which is typically used to establish communication connections between the electronic device 1 and other electronic devices.

[0216] Optionally, the electronic device 1 may further include a user interface, which may be a display, an input unit (such as a keyboard), and optionally, a standard wired interface or a wireless interface. Optionally, in some embodiments, the display may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, or an OLED (Organic Light-Emitting Diode) touchscreen, etc. The display may also be appropriately referred to as a screen or display unit, used to display information processed in the electronic device 1 and to display a visual user interface.

[0217] The DC voltage ratio self-calibration method program based on feature registration stored in the memory 11 of the electronic device 1 is a combination of multiple instructions, which, when run in the processor 10, can achieve the following:

[0218] The system receives a ratio self-calibration command and initial calibration parameters, and starts a pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters, and phase parameters.

[0219] The initial ambient temperature is obtained by using the temperature detection unit.

[0220] An internal feature generator is obtained, wherein the internal feature generator consists of control firmware, a digital-to-analog converter, and a buffer amplifier;

[0221] An analog signal is generated using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier.

[0222] The analog signals are input into a pre-constructed reference channel and a pre-constructed test channel, respectively, to obtain a reference channel data sequence and a test channel data sequence.

[0223] Feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector;

[0224] A feature error function is constructed based on the reference channel feature vector, the test channel feature vector, and the initial calibration parameters. The correction amount is calculated based on the feature error function, and the self-calibration of the DC voltage ratio is completed based on the correction amount.

[0225] Specifically, the processor 10's implementation method for the above instructions can be found in [reference needed]. Figures 1 to 3 The descriptions of the relevant steps in the corresponding embodiments are not repeated here.

[0226] Furthermore, if the modules / units integrated in the electronic device 1 are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. The computer-readable storage medium can be volatile or non-volatile. For example, the computer-readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, or a read-only memory (ROM).

[0227] The present invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor of an electronic device, can perform the following:

[0228] The system receives a ratio self-calibration command and initial calibration parameters, and starts a pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters, and phase parameters.

[0229] The initial ambient temperature is obtained by using the temperature detection unit.

[0230] An internal feature generator is obtained, wherein the internal feature generator consists of control firmware, a digital-to-analog converter, and a buffer amplifier;

[0231] An analog signal is generated using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier.

[0232] The analog signals are input into a pre-constructed reference channel and a pre-constructed test channel, respectively, to obtain a reference channel data sequence and a test channel data sequence.

[0233] Feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector;

[0234] A feature error function is constructed based on the reference channel feature vector, the test channel feature vector, and the initial calibration parameters. The correction amount is calculated based on the feature error function, and the self-calibration of the DC voltage ratio is completed based on the correction amount.

[0235] In the several embodiments provided by this invention, it should be understood that the disclosed devices, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative, and actual implementations may have other classification methods.

[0236] The modules described as separate components may or may not be physically separate. The components shown as modules may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0237] Furthermore, the functional modules in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or in the form of hardware plus software functional modules.

[0238] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention.

[0239] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention.

Claims

1. A DC voltage ratio self-calibration method based on feature registration, characterized in that, The method includes: The system receives a ratio self-calibration command and initial calibration parameters, and starts a pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters, and phase parameters. The initial ambient temperature is obtained by using the temperature detection unit. An internal feature generator is obtained, wherein the internal feature generator consists of control firmware, a digital-to-analog converter, and a buffer amplifier; An analog signal is generated using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier. The analog signals are input into a pre-constructed reference channel and a pre-constructed test channel, respectively, to obtain a reference channel data sequence and a test channel data sequence. Feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector; A feature error function is constructed based on the reference channel feature vector, the test channel feature vector, and the initial calibration parameters. The correction amount is calculated based on the feature error function, and the self-calibration of the DC voltage ratio is completed based on the correction amount.

2. The DC voltage ratio self-calibration method based on feature registration as described in claim 1, characterized in that, The process of generating an analog signal using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier includes: Based on the control firmware, waveform parameters and waveform types are automatically generated. The waveform parameters include: primary amplitude, secondary amplitude, fundamental frequency, secondary frequency, slope, phase, rise time, hold time, sampling rate, and number of sample points. The waveform types include: step waveform, ramp waveform, and dual-frequency waveform. The primary amplitude and secondary amplitude are corrected by the digital-to-analog converter to obtain the adjusted primary amplitude and adjusted secondary amplitude; The required bandwidth is calculated using the waveform type, and the sampling rate is adjusted according to the required bandwidth, slope, rise time, fundamental frequency, secondary frequency and initial ambient temperature to obtain the adjusted sampling rate. The required bandwidth includes: the bandwidth required for step, the bandwidth required for ramp and the bandwidth required for dual frequency. The analog signal is generated by adjusting the primary amplitude, secondary amplitude, number of sample points, sampling rate, fundamental frequency, secondary frequency, phase, and buffer amplifier.

3. The DC voltage ratio self-calibration method based on feature registration as described in claim 2, characterized in that, The process of calculating the required bandwidth using the waveform type and adjusting the sampling rate based on the required bandwidth, slope, rise time, fundamental frequency, secondary frequency, and initial ambient temperature to obtain an adjusted sampling rate includes: The waveform type is identified to obtain the identified waveform; When the waveform is identified as a step waveform, the bandwidth required for the step is calculated based on the rise time: ； in, The bandwidth required for a step jump. Refers to the rise time; When the waveform is identified as a ramp waveform, the voltage change is obtained, and the required bandwidth of the ramp is calculated based on the slope and the holding time. ； in, This refers to the bandwidth required for the slope. Refers to the change in voltage. Slope; When the identified waveform is a dual-frequency waveform, the required bandwidth for the dual frequencies is calculated based on the fundamental frequency and the secondary frequency: ； in, This refers to the bandwidth required for dual-band operation. Refers to the preset maximum value function. Refers to the fundamental frequency. Second frequency; The sampling rate is adjusted based on the initial ambient temperature, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency, to obtain the adjusted sampling rate.

4. The DC voltage ratio self-calibration method based on feature registration as described in claim 3, characterized in that, The step of adjusting the sampling rate based on the initial ambient temperature, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual-frequency circuitry to obtain the adjusted sampling rate includes: Compare the initial ambient temperature with the preset first temperature threshold; If the initial ambient temperature is greater than the first temperature threshold, the first margin parameter is confirmed, and the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted according to the first margin parameter to obtain the first bandwidth for the step, the first bandwidth for the ramp, and the first bandwidth for the dual frequency. If the initial ambient temperature is less than or equal to the first temperature threshold, then compare the initial ambient temperature with the preset second temperature threshold. If the initial ambient temperature is less than the second temperature threshold, the second margin parameter is confirmed, and the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted according to the second margin parameter to obtain the second bandwidth for the step, the second bandwidth for the ramp, and the second bandwidth for the dual frequency. If the initial ambient temperature is greater than or equal to the second temperature threshold, then the third margin parameter is confirmed. Based on the third margin parameter, the bandwidth required for the step, the bandwidth required for the ramp, and the bandwidth required for the dual frequency are adjusted to obtain the third bandwidth for the step, the third bandwidth for the ramp, and the third bandwidth for the dual frequency. By comparing the step first bandwidth, the ramp first bandwidth, and the dual-frequency first bandwidth, the maximum first bandwidth is obtained, wherein the maximum first bandwidth is the bandwidth with the largest value among the step first bandwidth, the ramp first bandwidth, and the dual-frequency first bandwidth. The maximum second bandwidth is obtained based on the step second bandwidth, the ramp second bandwidth, and the dual-frequency second bandwidth. The maximum third bandwidth is obtained based on the step third bandwidth, the ramp third bandwidth, and the dual-frequency third bandwidth. The maximum second bandwidth is the bandwidth with the largest value among the step second bandwidth, the ramp second bandwidth, and the dual-frequency second bandwidth. The maximum third bandwidth is the bandwidth with the largest value among the step third bandwidth, the ramp third bandwidth, and the dual-frequency third bandwidth. The sampling rate is adjusted using the maximum first bandwidth, the maximum second bandwidth, and the maximum third bandwidth to obtain the adjusted sampling rate.

5. The DC voltage ratio self-calibration method based on feature registration as described in claim 4, characterized in that, The step of adjusting the sampling rate using the maximum first bandwidth, the maximum second bandwidth, and the maximum third bandwidth to obtain an adjusted sampling rate includes: The first margin lower limit and the first safety lower limit are calculated based on the first margin parameter and the maximum first bandwidth, wherein the calculation formula for the first margin lower limit is as follows: ； in, This refers to the lower limit of the first margin. Refers to the maximum first bandwidth; The formula for calculating the first safety lower limit is as follows: ； in, This refers to the first safety lower limit. Refers to the first margin parameter; The first sampling rate is calculated based on the first margin lower limit and the first safety lower limit, wherein the formula for calculating the first sampling rate is as follows: ； in, Refers to the first sampling rate; Calculate the second margin lower limit and the second safety lower limit using the second margin parameter and the maximum second bandwidth; The second sampling rate is calculated based on the second margin lower limit and the second safety lower limit, wherein the formula for calculating the second sampling rate is as follows: ; in, Refers to the second sampling rate. This refers to the lower limit of the second margin. This refers to the second safety lower limit; The third margin parameter and the maximum third bandwidth are used to calculate the third margin lower limit and the third safety lower limit; The third sampling rate is calculated based on the third margin lower limit and the third safety lower limit, wherein the formula for calculating the third sampling rate is as follows: ; in, Refers to the third sampling rate. This refers to the lower limit of the third residual. This refers to the third safety lower bound; The first sampling rate, the second sampling rate, and the third sampling rate are identified as the adjusted sampling rates.

6. The DC voltage ratio self-calibration method based on feature registration as described in claim 5, characterized in that, The step of extracting features from the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector includes: The reference step response characteristics, reference ramp response characteristics, and reference dual-frequency response characteristics are obtained based on the reference channel data sequence. The reference step response characteristics include: base voltage, stable voltage, step time, step slope, and step overshoot rate. The reference ramp response characteristics include: ramp slope and ramp residual. The reference dual-frequency response characteristics include: amplitude and phase. The test step response characteristics, test ramp response characteristics, and test dual-frequency response characteristics are obtained based on the test channel data sequence. A reference channel feature vector is constructed using the base voltage, stable voltage, step time, step slope, step overshoot rate, ramp slope, ramp residual, amplitude, and phase. The test channel feature vector is constructed using the test step response characteristics, test ramp response characteristics, and test dual-frequency response characteristics.

7. The DC voltage ratio self-calibration method based on feature registration as described in claim 6, characterized in that, The step of obtaining the reference step response characteristics, reference ramp response characteristics, and reference dual-frequency response characteristics based on the reference channel data sequence includes: Obtain the initial step index, and calculate the base voltage based on the initial step index. The formula for calculating the base voltage is as follows: ； in, Refers to base voltage. Refers to the initial step index. Refers to the preset reference sequence index. This refers to the preset number of baseline points. The reference sequence index is Reference channel data at that time; Obtain the step end index, and calculate the stable voltage based on the step end index. The formula for calculating the stable voltage is as follows: ； in, Refers to stable voltage. The index indicating the end of the step jump; The step time is calculated based on the base voltage and the stable voltage, and the reference channel data within the step time is fitted to obtain the step slope. The reference channel data sequence is retrieved based on the step end index and the preset overshoot search window to obtain the maximum peak value in the interval. Calculate the step overshoot rate based on the maximum peak value, base voltage, and stable voltage of the aforementioned interval; The base voltage, steady voltage, step time, step slope, and step overshoot rate are identified as reference step response characteristics. The reference ramp response characteristics and reference dual-frequency response characteristics are obtained based on the reference channel data sequence.

8. The DC voltage ratio self-calibration method based on feature registration as described in claim 7, characterized in that, The step of obtaining the reference ramp response characteristics and reference dual-frequency response characteristics based on the reference channel data sequence includes: Obtain the slope start point and slope end point from the reference channel data sequence, and obtain the slope point set based on the slope start point and slope end point; Linear fitting is performed on the slope point set to obtain the slope slope, and the slope residual is calculated. The slope slope and slope residual are then identified as the reference slope response characteristics. Dual-frequency waveform data is obtained from the reference channel data sequence, and frequency domain features are extracted from the dual-frequency waveform data to obtain amplitude and phase. The amplitude and phase are then confirmed as reference dual-frequency response features.

9. The DC voltage ratio self-calibration method based on feature registration as described in claim 8, characterized in that, The reference channel feature vector is shown below: ； in, Refers to the reference channel feature vector. Refers to base voltage. Refers to stable voltage. Refers to step time. The slope of the step jump. The step overshoot rate, The slope of the incline. Refers to the slope residual. Amplitude Phase.

10. A DC voltage ratio self-calibration device based on feature registration, characterized in that, The device includes: The calibration start-up module is used to receive the ratio self-calibration command and initial calibration parameters, and start the pre-built temperature detection unit according to the received ratio self-calibration command. The initial calibration parameters include: gain parameters, offset parameters and phase parameters. The signal generation module is used to detect the initial ambient temperature using the temperature detection unit. An internal feature generator is obtained, wherein the internal feature generator consists of control firmware, a digital-to-analog converter, and a buffer amplifier; An analog signal is generated using the initial ambient temperature, control firmware, digital-to-analog converter, and buffer amplifier. The feature extraction module is used to input the analog signal into a pre-constructed reference channel and a pre-constructed test channel respectively to obtain the reference channel data sequence and the test channel data sequence; Feature extraction is performed on the reference channel data sequence and the test channel data sequence to obtain the reference channel feature vector and the test channel feature vector; The correction calibration module is used to construct a feature error function based on the reference channel feature vector, the test channel feature vector and the initial calibration parameters, calculate the correction amount based on the feature error function, and complete the self-calibration of the DC voltage ratio based on the correction amount.

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