Batch automated testing method, apparatus, and computer device

Abstract

The application provides a batch automatic test method, device and computer equipment. The application obtains a target binary file in a target format by performing format processing on an original file, and then processes the target binary file based on a preset tool program to obtain a target file recognizable by a burn-in device. Finally, the target file is directly imported into a preset burn-in device, a burn-in test level signal set is directly generated, a burn-in test level signal set is automatically generated, the burn-in test level signal set is imported into a digital waveform field entry type burn-in test platform, and automatic test is performed, so that batch automatic test is realized. The application can directly import a preset burn-in device based on a generated target file, automatically generate a burn-in test level signal set, and realize batch automatic test, thereby greatly saving manpower and time.

Description

Technical Field

[0001] This invention relates to the field of chip aging and testing technology, and in particular to a batch automated testing method, apparatus and computer equipment. Background Technology

[0002] With the rise of artificial intelligence, processors (NPUs) specifically designed to accelerate neural networks and deep learning tasks have emerged. These highly parallel computing units need to process massive amounts of data, which also poses challenges to chip testing. Testing requires feeding the chip a large amount of data for simulation testing, which places higher demands on chip testing systems.

[0003] Traditional methods provide chips with repetitive square wave signals, which can be quickly generated manually. However, the data used in NPU chip testing is non-repetitive and has a large depth, causing the time required for manual editing and the error rate to increase rapidly. For example, with a vector depth of 10K, a person can edit 30 vectors per minute (one every 2 seconds), and editing all vectors would take nearly 6 hours. As the manual editing time increases, the error rate also increases exponentially. If 32 vectors need to be edited and the vector depth increases to 1M, the corresponding editing time needs to be multiplied by 32 and then by 100, making the error risk unacceptable.

[0004] Therefore, there is an urgent need to provide a method for batch and automated testing to solve the technical problems in the existing NPU chip testing process, such as the non-repetitive nature and large depth of the data, which leads to a rapid increase in the time required for manual editing and the error rate. Summary of the Invention

[0005] To address the shortcomings of existing technologies, this invention provides a batch automated testing method, apparatus, and computer equipment, which solves the problem that existing technologies require manual editing of each vector waveform, necessitating repeated settings on each device when performing large-scale chip testing, making chip aging testing extremely time-consuming and labor-intensive.

[0006] According to an embodiment of the present invention, a batch automated testing method is based on a digital waveform on-site input aging test platform, the digital waveform on-site input aging test platform including several aging devices. The method includes: processing the original file to obtain a target binary file of a target format; processing the target binary file based on a preset tool program to obtain a target file recognizable by the aging devices; wherein the preset tool program is established based on the aging test requirements input by the user; importing the target file into the preset aging devices to generate an aging test level signal set; and importing the aging test level signal set into the digital waveform on-site input aging test platform for automated testing.

[0007] In one optional approach, the original file is in text format; the step of processing the original file to obtain a binary file of the target format further includes: importing the original file into preset software to obtain a hexadecimal file that is converted from text format to digital signal format; performing a base conversion on the hexadecimal file within the preset software to obtain an initial binary file; and modifying the number of bytes per line of the initial binary file based on the preset software to obtain a target binary file of the target format.

[0008] In one alternative approach, before the step of processing the target binary file based on a preset tool program to obtain a target file recognizable by the aging equipment, the method further includes: responding to the aging test requirement input by the user, compiling the aging test requirement using a preset language to obtain a requirement program file; storing the requirement program file in the header folder of the installation path corresponding to the preset language to obtain a target requirement program file; creating a preset tool file in the preset language environment, and referencing the target requirement program file in the preset tool file to compile a preset tool program.

[0009] In an optional approach, the step of processing the target binary file based on a preset tool program to obtain a target file recognizable by the aging equipment further includes: using a preset tool program to read each binary data in the target binary file to obtain a target array; and performing waveform editing on the target array based on preset editing rules to obtain a target file recognizable by the aging equipment.

[0010] In one alternative approach, after the step of using a preset tool program to read each binary data in the target binary file to obtain the target array, the method further includes: returning the total length of the read target array, and the values ​​corresponding to the high and low bits of each binary data in the target array.

[0011] In one optional approach, the step of performing waveform editing on the target array based on preset editing rules to obtain a target file recognizable by the aging equipment further includes: sequentially reading the values ​​corresponding to the high and low bits of each binary data in the target array to obtain a high bit value group and a low bit value group; based on the preset editing rules and the high bit value group, setting the TMS pin high or low accordingly to obtain a waveform file of the TMS pin; based on the preset editing rules and the low bit value group, setting the TDI pin high or low accordingly to obtain a waveform file of the TDI pin; and obtaining a target file recognizable by the aging equipment based on the waveform files of the TMS pin and the TDI pin.

[0012] In one alternative approach, the step of setting the TMS pin high or low based on preset editing rules and the high-order value group to obtain the waveform file of the TMS pin further includes: sequentially reading the values ​​in the high-order value group; if the value corresponding to the high-order value is 1, then setting the TMS pin high; if the value corresponding to the high-order value is 0, then setting the TMS pin low, so as to obtain the waveform file of the TMS pin.

[0013] In one optional approach, the step of setting the TDI pin high or low based on preset editing rules and the low-order value group to obtain the waveform file of the TDI pin further includes: sequentially reading the values ​​in the high-order value group; if the value corresponding to the low-order value is 1, then setting the TDI pin high; if the value corresponding to the low-order value is 0, then setting the TDI pin low, so as to obtain the waveform file of the TDI pin.

[0014] On the other hand, according to an embodiment of the present invention, a batch automated testing device is also provided. The device includes: a format processing module for processing the format of an original file to obtain a target binary file of a target format; wherein the original file is a waveform signal file; a file processing module for processing the target binary file based on a preset tool program to obtain a target file recognizable by an aging equipment; wherein the preset tool program is established based on the aging test requirements input by a user; a signal set generation module for importing the target file into a preset aging equipment to generate an aging test level signal set; and an automated testing module for importing the aging test level signal set into the digital waveform field input aging test platform for automated testing.

[0015] According to another aspect of the present invention, a computer device is provided, comprising: a controller; and a memory for storing one or more programs, wherein when the one or more programs are executed by the controller, the controller causes the controller to implement the batch automated testing method described in any of the preceding embodiments.

[0016] The technical principle of this invention is as follows: by processing the original file to obtain a target binary file of the target format, and then processing the target binary file based on a preset tool program to obtain a target file that can be recognized by the aging equipment, and finally importing the target file directly into the preset aging equipment, the aging test level signal set can be directly generated, thereby realizing the automatic generation of the aging test level signal set.

[0017] Compared with existing technologies, this invention has the following advantages: By processing the original file to obtain a target binary file in the target format, and then processing the target binary file based on a preset tool program, a target file recognizable by the aging equipment is obtained. Finally, the target file is directly imported into the preset aging equipment, which can directly generate an aging test level signal set, thereby realizing the automatic generation of the aging test level signal set. Compared with the existing technology, which requires manual editing of the vector waveforms of relevant level signals on the aging test equipment, this invention solves the technical problem that the existing technology requires manual editing of each vector waveform, and when large-scale chip testing is carried out, each device needs to be set up again. This method is very time-consuming and labor-intensive for chip aging testing. This invention eliminates the need for manual processing and can directly import the generated target file into the preset aging equipment to automatically generate the aging test level signal set, greatly saving manpower and time.

[0018] Meanwhile, since some vector waveforms do not exhibit regular fluctuations but are set according to a specific level sequence, the difficulty of manual setting will gradually increase with the depth of the vector, and the accuracy will also decrease rapidly. However, in the embodiments of the present invention, the target file is directly imported into the preset aging equipment, and the aging test level signal set is directly generated in the aging equipment without manual setting. Moreover, since no manual operation is required, the accuracy of chip aging vector setting is greatly improved, and errors caused by manual setting are reduced.

[0019] Furthermore, since the entire process is executed by computer equipment, the depth of vector settings can be deepened in both the original files and the aging test requirements input by the user. There is no need to consider the possibility that manual processing is too complicated and prone to errors, thereby increasing the depth of chip aging vector settings and meeting the aging requirements of complex chips. Attached Figure Description

[0020] Figure 1 This is a flowchart of a batch automated testing method in an embodiment of the present invention.

[0021] Figure 2 This is a screenshot of the interface before waveform input in the digital waveform field input aging test platform in this embodiment of the invention.

[0022] Figure 3This is a diagram of the interface after waveform input in the digital waveform field input aging test platform in an embodiment of the present invention.

[0023] Figure 4 This is a flowchart of a batch automated testing method according to another embodiment of the present invention.

[0024] Figure 5 This is a flowchart of a batch automated testing method in another embodiment of the present invention.

[0025] Figure 6 This is a flowchart of a batch automated testing method in another embodiment of the present invention.

[0026] Figure 7 This is a flowchart of a batch automated testing method according to another embodiment of the present invention.

[0027] Figure 8 This is a structural block diagram of a batch automated testing device according to an embodiment of the present invention.

[0028] Figure 9 This is a schematic diagram of the structure of a computer device according to an embodiment of the present invention. Detailed Implementation

[0029] The technical solutions of the present invention will be further described below with reference to the accompanying drawings and embodiments.

[0030] Traditional chip testing includes electrical performance testing and aging testing. Electrical performance testing has vector conversion tools provided by mainstream ATE manufacturers that correspond to their testing platforms, but the professional barriers are relatively high. The current situation of aging testing is that there are many platform brands and their designs are quite similar. Moreover, aging test vectors are mostly periodic signals that are generally generated manually, which has a low degree of automation. In the testing of AI chips, this will become a bottleneck for the entire project. Therefore, it is necessary and urgent to launch a vector conversion tool for aging testing.

[0031] It should be noted that the subject of this invention is a computer device.

[0032] like Figure 1As shown, this embodiment of the invention provides a batch automated testing method based on a digital waveform on-site input aging test platform. The digital waveform on-site input aging test platform includes several aging devices, all of which are identical and independently connected to the aging test platform. However, each aging device can test different types of chips. Since chip aging testing involves not only data testing but also environmental simulation including temperature, humidity, and pressure, and individual aging devices cannot provide environmental simulation, the aging devices are all housed within an environmental simulation chamber within the aging test platform. By setting environmental parameters for the aging test platform, the environment within the chamber is made to meet predicted requirements, thereby achieving environmental simulation of the chips being tested within the aging devices. The specific method includes:

[0033] Step S11: Perform format processing on the original file to obtain the target binary file in the target format.

[0034] The original file is in text format.

[0035] Specifically, the original file is a text file in txt format. WinHex.exe software is used to open the original file, and a hexadecimal file in digital signal format is obtained in WinHex.exe software. Then, the hexadecimal file is converted into a binary file. The binary file is modified byte by byte in WinHex.exe software to obtain the target binary file in the target format.

[0036] Step S12: Process the target binary file based on the preset tool program to obtain a target file that can be recognized by the aging equipment.

[0037] The preset tool program is established based on the user's input of the aging test requirements.

[0038] Specifically, the default tool program is the Convert tool. The Convert tool is created by the execution host computer device based on the user's input of the aging test requirements. Therefore, the default tool program can be changed according to different user needs.

[0039] Step S13: Import the target file into the preset aging equipment to generate an aging test level signal set.

[0040] Specifically, a new device is created on the aging equipment, the signal depth is configured, and the file is saved. Then, the target file is imported into the aging equipment and opened. Based on the edited digital waveforms on the aging equipment, a set of aging test level signals can be generated. In the prior art, when performing large-scale testing on chips, each device needs to be set up repeatedly. However, in this embodiment of the invention, only the target file needs to be imported into each aging equipment to generate the corresponding set of aging test level signals, eliminating the need for manual repetition for each device as in the prior art. This greatly reduces processing complexity, saves labor costs, and improves efficiency. Furthermore, since some vector waveforms do not exhibit regular fluctuations but are set according to a specific level sequence, the difficulty of manual setting increases gradually with the depth of the vector, and the accuracy decreases rapidly. In this embodiment of the invention, the target file is directly imported into a preset aging equipment, and the set of aging test level signals is directly generated in the aging equipment without manual setting. This improves the accuracy of chip aging vector setting, reduces errors caused by manual setting, and, due to automatic generation, increases the depth of chip aging vector setting, meeting the aging requirements of complex chips.

[0041] Step S14: Import the aging test level signal set into the digital waveform field recording aging test platform for automated testing.

[0042] Specifically, by importing the set of aging test level signals into the digital waveform field input aging test platform, automated testing can be achieved based on this digital waveform field input aging test platform.

[0043] like Figure 2 and Figure 3 As shown, the interface before and after waveform input is displayed in the digital waveform field input aging test platform.

[0044] Working Principle: Currently, the underlying logic of most digital waveform field input aging test platforms involves storing edited signal data in SRAM. During use, the SRAM outputs the required digital signal waveform through hardware frequency division using a set address signal. Therefore, this method can be used to achieve batch automated testing. SRAM, or Static Random-Access Memory, is a type of memory that does not require periodic refreshing and has extremely fast read / write speeds, primarily used for CPU caching.

[0045] Experiments have shown that the method described in this embodiment can generate a level vector file (i.e., a set of level signals) within 30 minutes. After being called by the old refining box, the relevant levels can be output according to the file requirements, which can save a lot of time, manpower and equipment costs.

[0046] Beneficial Effects: This invention processes the original file to obtain a target binary file in the target format. Then, it processes the target binary file using a preset tool program to obtain a target file recognizable by the aging equipment. Finally, the target file is directly imported into the preset aging equipment to directly generate an aging test level signal set, thus achieving automatic generation of the aging test level signal set. This aging test level signal set is then imported into the digital waveform field-entry aging test platform for automated testing, thereby achieving batch automated testing. Compared with the prior art, which requires manual editing of the vector waveforms of relevant level signals on the aging test equipment, this invention solves the technical problems of non-repetitive and deep data used in NPU chip testing, which leads to a rapid increase in time and error rate during manual editing. This invention eliminates the need for manual intervention, directly importing the generated target file into the preset aging equipment to automatically generate the aging test level signal set, greatly saving manpower and time. Meanwhile, since some vector waveforms do not exhibit regular fluctuations but are set according to a specific level sequence, the difficulty of manual setting increases gradually with the depth of the vector, and the accuracy decreases rapidly. However, in this embodiment of the invention, the target file is directly imported into a preset aging equipment, and the aging test level signal set is directly generated in the aging equipment, eliminating the need for manual setting. Furthermore, because no manual intervention is required, the accuracy of chip aging vector setting is greatly improved, reducing errors caused by manual settings. Moreover, since the entire process is executed by computer equipment, the depth of vector setting can be deepened in both the original file and the user-input aging test requirements, without considering the complexity and error-prone nature of manual settings. This further increases the depth of chip aging vector setting, meeting the aging requirements of complex chips.

[0047] In some embodiments, a batch automated testing method is provided, such as Figure 4 As shown, step S11 further includes:

[0048] Step S111: Import the original file into the preset software to obtain a hexadecimal file that is converted from text format to digital signal format.

[0049] Specifically, the default software is WinHex.exe, a powerful hexadecimal editor and professional-grade data recovery tool primarily used for file analysis, disk editing, data recovery, and computer forensics. When the original file is imported into WinHex.exe and opened, it is converted from text format to a hexadecimal file in digital signal format. The original file can be in various bit-counting systems, such as binary, ternary, decimal, etc. The bit-counting system of the original file is equal to the number of pins connected between the chip to be aged and the aging equipment.

[0050] Step S112: Convert the hexadecimal file to binary format within the preset software to obtain the initial binary file.

[0051] Specifically, the hexadecimal file is converted to binary format in the WinHex.exe software to obtain the initial binary file.

[0052] Step S113: Based on the preset software, modify the number of bytes per line of the initial binary file to obtain the target binary file in the target format.

[0053] Specifically, in the WinHex.exe software, setting each line of the initial binary file to 1 byte results in the target binary file in the target format. In some embodiments, due to the different number of pins connected between different chips and aging equipment, the number system of the level signal set file that the corresponding chip can implement for testing may differ, such as binary, ternary, decimal, etc. However, regardless of the number system, the final underlying representation is always a binary file; therefore, the target format here is a binary file.

[0054] Beneficial effects: This invention uses preset software to convert the format of the original file, quickly obtaining the target binary file in the target format. Compared with manual processing, it greatly improves the processing speed and accuracy of the original file.

[0055] In some embodiments, a batch automated testing method is provided, such as Figure 5 As shown, before step S12, the method further includes:

[0056] Step S21: In response to the user's input of the old-process test requirement, compile the old-process test requirement using a preset language to obtain the requirement program file.

[0057] The default language is the programming language, with Go being the preferred choice. Other languages, such as Python, can also be used, but Go is preferred as the default language because it has stronger data processing capabilities.

[0058] Specifically, users can input their aging test requirements based on their actual needs. The executing computer device responds to these requirements by directly compiling them using a preset language, resulting in a compiled requirement program file. If Go is used, the compiled requirement program file will be in the spic.go format.

[0059] Step S22: Store the required program file in the header folder of the installation path corresponding to the preset language to obtain the target required program file.

[0060] Specifically, the required program file is placed in the header folder of the installation path corresponding to the preset language to obtain the target required program file.

[0061] Step S23: Create a preset tool file in the preset language environment, and reference the target requirement program file in the preset tool file to compile the preset tool program.

[0062] Specifically, a default tool file is created in the default language environment. If the default language is Go, the default tool file is "Convert tool.go" and references the required program file, namely "spic.go". After compilation based on "Go", the executable file "Convert tool.exe" is generated.

[0063] Beneficial Effects: This invention, in response to user-inputted aging test requirements, compiles these requirements using a preset language to obtain a requirement program file. This requirement program file is then stored in the header folder of the installation path corresponding to the preset language to obtain the target requirement program file. A preset tool file is created within the preset language environment and references the target requirement program file within it, compiling to obtain a preset tool program. This achieves the processing of user-inputted aging test requirements and the generation of a preset tool program using a preset language for subsequent processing of the target binary file.

[0064] In some embodiments, a batch automated testing method is provided, such as Figure 6 As shown, step S12 further includes:

[0065] Step S121: Use a preset tool program to read each binary data in the target binary file to obtain the target array.

[0066] The preset tool program is the program compiled based on the user's input of the aging test requirements and the preset language in the above embodiments.

[0067] Specifically, by using a corrupted tool program to read each binary data in the target binary file sequentially, multiple binary arrays can be obtained, forming the target array.

[0068] Step S122: Based on preset editing rules, perform waveform editing on the target array to obtain a target file that can be recognized by the aging equipment.

[0069] The default editing rules are as follows: if the value of the least significant bit (rightmost bit) of the binary data is 1, then the TDI pin is set high; if the value of the least significant bit (rightmost bit) of the binary data is 0, then the TDI pin is set low; and if the value of the most significant bit (leftmost bit) of the binary data is 1, then the TMS pin is set high; if the value of the most significant bit (leftmost bit) of the binary data is 0, then the TMS pin is set low.

[0070] Specifically, the TMS pin is for Test Mode Select, and the TDI pin is for Test Data In. TMS determines the current operation type (such as loading instructions or transferring data) through a state machine, while TDI completes data input in a specific state. Based on preset editing rules and the values ​​of each high and low byte in the target array, waveform editing is performed to obtain a waveform file, which is the target file that the aging equipment can recognize. In practical applications, the target file is a file ending in .sg.

[0071] Beneficial Effects: This invention further refines the steps of processing a target binary file using a preset tool program to obtain a target file recognizable by aging equipment. By using a preset tool program to read each binary data point in the target binary file to obtain a target array, and then performing waveform editing on the target array based on preset editing rules, a target file recognizable by aging equipment is obtained. This achieves the technical effect of using a preset tool program to perform waveform editing on the target binary file to obtain a target file recognizable by aging equipment. Therefore, this invention further refines and enriches the solution. By employing a destructive tool program, compared to manual operation in the prior art, the accuracy and efficiency of file conversion are greatly improved.

[0072] In some embodiments, a batch automated testing method is provided. After step S121, the method further includes: returning the total length of the read target array, and the values ​​corresponding to the high and low bits of each binary data in the target array.

[0073] Specifically, the target array consists of multiple arrays. After reading, the total length of the target array needs to be determined to prepare for subsequent waveform editing based on the values ​​in each array. Simultaneously, the values ​​corresponding to the high and low bits of each binary data in the target array need to be obtained to further determine whether the TMS and TDI pins should be set high or low based on preset editing rules.

[0074] Beneficial Effects: This embodiment of the invention further refines the steps of processing the target binary file based on a preset tool program to obtain a target file recognizable by the aging equipment. By returning the total length of the read target array and the values ​​corresponding to the high and low bits of each binary data in the target array, preparation is made for the subsequent step of performing waveform editing on the target array based on preset editing rules to obtain a target file recognizable by the aging equipment. This further refines and enriches the solution of this invention.

[0075] In some embodiments, a batch automated testing method is provided, such as Figure 7 As shown, step S122 further includes:

[0076] Step S31: Read the values ​​corresponding to the high and low bits of each binary data in the target array in sequence to obtain the high bit value group and the low bit value group.

[0077] Specifically, since the high and low bits correspond to different pins, it is necessary to separate the high and low bits in the target array. Reading them in order will yield the high bit value group corresponding to each high bit and the low bit value group corresponding to each low bit in the target array.

[0078] Step S32: Based on the preset editing rules and high-order value groups, set the TMS pins high or low accordingly to obtain the waveform file of the TMS pins.

[0079] The default editing rule is as follows: if the value of the leftmost bit (highest bit) of the binary data is 1, then the TMS pin is set high; if the value of the leftmost bit (highest bit) of the binary data is 0, then the TMS pin is set low. The TMS pin definition was mentioned in the previous embodiments and will not be repeated here.

[0080] Specifically, based on the specific high-order value group of the preset editing rules, the TMS pins can be set high or low sequentially according to the numerical order of the high-order value group, thereby obtaining the waveform file corresponding to the TMS pin.

[0081] Step S33: Based on the preset editing rules and low-order value groups, set the TDI pins high or low accordingly to obtain the waveform file of the TDI pins.

[0082] The default editing rule is as follows: if the value of the least significant bit (rightmost bit) of the binary data is 1, then the TDI pin is set high; if the value of the least significant bit (rightmost bit) of the binary data is 0, then the TDI pin is set low. The TDI pin definition was mentioned in the previous embodiments and will not be repeated here.

[0083] Specifically, based on the preset editing rules and the low-order value group, it can be determined that the TDI pins are set high or low in sequence according to the numerical order of the low-order value group, thereby obtaining the waveform file corresponding to the TDI pin.

[0084] Step S34: Based on the waveform files of the TMS pins and the TDI pins, obtain the target file that the aging equipment can recognize.

[0085] Specifically, the waveform files of the TMS pins and the TDI pins are merged into one file, and the resulting file is the target file that the aging equipment can recognize.

[0086] Beneficial Effects: This embodiment of the invention further refines the steps of waveform editing of a target array based on preset editing rules to obtain a target file recognizable by aging equipment. By reading the corresponding values ​​of the high and low bits in the target array to obtain high-bit value groups and low-bit value groups, and then, based on the preset editing rules and these high-bit and low-bit value groups, setting the TMS pin and TDI pin high or low respectively to obtain waveform files for the TMS pin and TDI pin, respectively, and then merging them to obtain the target file, this technical means achieves the technical effect of waveform editing of a target array based on preset editing rules to obtain a target file. This further refines and enriches the solution of this invention.

[0087] In some embodiments, a batch automated testing method is provided, wherein step S32 further includes: sequentially reading the values ​​in the high-order value group; if the value corresponding to the high-order value is 1, then setting the TMS pin high; if the value corresponding to the high-order value is 0, then setting the TMS pin low, so as to obtain the waveform file of the TMS pin.

[0088] Specifically, the preset editing rule for the TMS pin is: if the value of the leftmost bit (highest bit) of the binary data is 1, the TMS pin is set high; if the value of the leftmost bit (highest bit) of the binary data is 0, the TMS pin is set low. Therefore, step S32 involves sequentially reading the values ​​in the high-order bit group. If the value corresponding to the high-order bit is 1, the TMS pin is set high; if the value corresponding to the high-order bit is 0, the TMS pin is set low, thus obtaining the waveform file of the TMS pin. Before waveform editing, the depth of the waveform vector needs to be set to determine the height difference between setting the pin high and low in the waveform file.

[0089] Beneficial effects: The embodiments of the present invention further refine the steps of setting the TMS pins high or low based on preset editing rules and high-order value groups to obtain the waveform file of the TMS pins. This further refines and enriches the solution of the present invention.

[0090] In some embodiments, a batch automated testing method is provided, wherein step S33 further includes: sequentially reading the values ​​in the high-order value group; if the value corresponding to the low-order value is 1, then setting the TDI pin high; if the value corresponding to the low-order value is 0, then setting the TDI pin low, so as to obtain the waveform file of the TDI pin.

[0091] Specifically, the preset editing rule for the TDI pin is: if the value of the rightmost bit (lowest bit) of the binary data is 1, the TDI pin is set high; if the value of the rightmost bit (lowest bit) of the binary data is 0, the TDI pin is set low. Therefore, step S33 involves sequentially reading the values ​​in the high-order bit group. If the value corresponding to the low-order bit is 1, the TDI pin is set high; if the value corresponding to the low-order bit is 0, the TDI pin is set low, thus obtaining the waveform file of the TDI pin. Before waveform editing, the depth of the waveform vector must also be set to determine the height difference between setting the pin high and low in the waveform file.

[0092] Beneficial effects: The embodiments of the present invention further refine the steps of setting the TDI pin high or low based on preset editing rules and low-order value groups to obtain the waveform file of the TDI pin. This further refines and enriches the solution of the present invention.

[0093] In some embodiments, after step S13, the method further includes: determining multiple preset positions in the original file and obtaining the corresponding level value at each preset position; determining the level signal corresponding to each preset position in the aging test level signal set based on the correspondence between the original file and the aging test level signal set; detecting whether the level value and level signal corresponding to each preset position match; and determining whether the aging test level signal set is accurate based on the detection result.

[0094] The correspondence between the original file and the old test level signal set is a positional correspondence.

[0095] Specifically, the method provided by this invention is based on a format conversion tool. Unlike manual input, which may encounter errors at certain points, errors in the format conversion tool are generally due to batch offset issues. Therefore, by selecting the level values ​​at different positions in the original file and comparing them on the LaoLian platform, the correctness of the conversion result can be confirmed. Here, "matching" refers to the format of the generated level signal after the original file's format is converted to the target binary. If there is a match, the value before format conversion corresponds to the final generated level signal; otherwise, there is a mismatch. If the level value and level signal at any preset position do not match, the LaoLian test level signal set is determined to be inaccurate, indicating an abnormal conversion. If the level value and level signal at any preset position match, the LaoLian test level signal set is determined to be accurate, indicating that the format conversion is correct, thus ensuring the accuracy of the generated LaoLian test level signal set.

[0096] Beneficial effects: By selecting multiple preset positions and the correspondence between the original file and the set of aging test level signals, the system can detect whether the level value and level signal at the preset position match. Finally, based on the detection results, the accuracy of the generated set of aging test level signals can be quickly determined.

[0097] In some embodiments, this batch automated testing method can also be applied across platforms. Specifically, if cross-platform application is required, a format callable by another platform can be generated as described in the above embodiments. This only requires setting up the relevant development environment, including a 64-bit WIN10 operating system, installing the open-source LiteIDE compilation software and the free version of the Winhex hexadecimal editor, generating the corresponding executable file, and running the executable file to import the original file to generate a file callable by that platform.

[0098] like Figure 8 As shown in the figure, an embodiment of the present invention proposes a batch automated testing device 400, the device comprising:

[0099] The format processing module 410 is used to process the original file to obtain a target binary file in the target format; wherein, the original file is a waveform signal file;

[0100] The file processing module 420 is used to process the target binary file based on a preset tool program to obtain a target file that can be recognized by the aging equipment; wherein, the preset tool program is established based on the aging test requirements input by the user;

[0101] The signal set generation module 430 is used to import the target file into the preset aging equipment and generate an aging test level signal set.

[0102] The automated testing module 440 is used to import the aging test level signal set into the digital waveform field input aging test platform for automated testing.

[0103] Beneficial Effects: This invention processes the original file to obtain a target binary file in the target format. Then, it processes the target binary file using a preset tool program to obtain a target file recognizable by the aging equipment. Finally, the target file is directly imported into the preset aging equipment to directly generate an aging test level signal set, thus achieving automatic generation of the aging test level signal set. This aging test level signal set is then imported into the digital waveform field-entry aging test platform for automated testing, thereby achieving batch automated testing. Compared with the prior art, which requires manual editing of the vector waveforms of relevant level signals on the aging test equipment, this invention solves the technical problems of non-repetitive and deep data used in NPU chip testing, which leads to a rapid increase in time and error rate during manual editing. This invention eliminates the need for manual intervention, directly importing the generated target file into the preset aging equipment to automatically generate the aging test level signal set, greatly saving manpower and time. Meanwhile, since some vector waveforms do not exhibit regular fluctuations but are set according to a specific level sequence, the difficulty of manual setting increases gradually with the depth of the vector, and the accuracy decreases rapidly. However, in this embodiment of the invention, the target file is directly imported into a preset aging equipment, and the aging test level signal set is directly generated in the aging equipment, eliminating the need for manual setting. Furthermore, because no manual intervention is required, the accuracy of chip aging vector setting is greatly improved, reducing errors caused by manual settings. Moreover, since the entire process is executed by computer equipment, the depth of vector setting can be deepened in both the original file and the user-input aging test requirements, without considering the complexity and error-prone nature of manual settings. This further increases the depth of chip aging vector setting, meeting the aging requirements of complex chips.

[0104] Figure 9 The diagram illustrates a structural schematic of an embodiment of the computer device of the present invention, which shows a structural schematic of a computer system suitable for implementing the computer device of the present invention. The specific embodiments of the present invention do not limit the specific implementation of the computer device.

[0105] Please see Figure 9 As shown, the computer device includes: a controller; and a memory for storing one or more programs, which, when executed by the controller, perform the batch automated testing method described above.

[0106] Please continue reading. Figure 9As shown, the computer system 500 of this computer device includes a Central Processing Unit (CPU) 501, which can perform various appropriate actions and processes, such as executing the methods described in the above embodiments, based on programs stored in Read-Only Memory (ROM) 502 or programs loaded from storage portion 508 into Random Access Memory (RAM) 503. The RAM 503 also stores various programs and data required for system operation. The CPU 501, ROM 502, and RAM 503 are interconnected via a bus 504. An input / output (I / O) interface 505 is also connected to the bus 504.

[0107] The following components are connected to I / O interface 505: an input section 506 including a keyboard, mouse, etc.; an output section 507 including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and speakers, etc.; a storage section 508 including a hard disk, etc.; and a communication section 509 including a network interface card such as a LAN (Local Area Network) card, modem, etc. The communication section 509 performs communication processing via a network such as the Internet. A drive 510 is also connected to I / O interface 505 as needed. Removable media 511, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., are installed on drive 510 as needed so that computer programs read from them can be installed into storage section 508 as needed.

[0108] In particular, according to embodiments of the present invention, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of the present invention include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing computer programs for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via communication section 509, and / or installed from removable medium 511. When the computer program is executed by central processing unit (CPU) 501, it performs various functions defined in the system of the present invention.

[0109] Another aspect of the present invention provides a computer-readable storage medium storing at least one executable instruction that, when executed on a computer device / equipment, causes the computer device / equipment to perform the batch automated testing method as described in any of the above embodiments.

[0110] Beneficial Effects: This invention processes the original file to obtain a target binary file in the target format. Then, it processes the target binary file using a preset tool program to obtain a target file recognizable by the aging equipment. Finally, the target file is directly imported into the preset aging equipment to directly generate an aging test level signal set, thus achieving automatic generation of the aging test level signal set. This aging test level signal set is then imported into the digital waveform field-entry aging test platform for automated testing, thereby achieving batch automated testing. Compared with the prior art, which requires manual editing of the vector waveforms of relevant level signals on the aging test equipment, this invention solves the technical problems of non-repetitive and deep data used in NPU chip testing, which leads to a rapid increase in time and error rate during manual editing. This invention eliminates the need for manual intervention, directly importing the generated target file into the preset aging equipment to automatically generate the aging test level signal set, greatly saving manpower and time. Meanwhile, since some vector waveforms do not exhibit regular fluctuations but are set according to a specific level sequence, the difficulty of manual setting increases gradually with the depth of the vector, and the accuracy decreases rapidly. However, in this embodiment of the invention, the target file is directly imported into a preset aging equipment, and the aging test level signal set is directly generated in the aging equipment, eliminating the need for manual setting. Furthermore, because no manual intervention is required, the accuracy of chip aging vector setting is greatly improved, reducing errors caused by manual settings. Moreover, since the entire process is executed by computer equipment, the depth of vector setting can be deepened in both the original file and the user-input aging test requirements, without considering the complexity and error-prone nature of manual settings. This further increases the depth of chip aging vector setting, meeting the aging requirements of complex chips.

[0111] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. A method of batch automated testing, characterized by, The method is based on a digital waveform field entry type burn-in test platform, the digital waveform field entry type burn-in test platform comprises a plurality of burn-in devices, and the method comprises the following steps: The original file is format-processed to obtain a target binary file in a target format; wherein the number of bytes in each line of the target binary file is 1; According to the depth of the preset waveform vector, the target binary file is processed based on a preset tool program to obtain a target file recognizable by the burn-in device; wherein the preset tool program is established based on a burn-in test requirement input by a user; The target file is imported into the burn-in device to generate a burn-in test level signal set; The burn-in test level signal set is imported into the digital waveform field entry type burn-in test platform for automatic testing.

2. The method of claim 1, wherein, The original file is in a text format; the step of format-processing the original file to obtain a target binary file in a target format further comprises the following steps: The original file is imported into a preset software to obtain a hexadecimal file in which a text format is converted into a digital signal format; The hexadecimal file is converted in the preset software to obtain an initial binary file; The number of bytes in each line of the initial binary file is modified based on the preset software to obtain a target binary file in a target format.

3. The method of claim 1, wherein, Before the step of processing the target binary file based on the preset tool program to obtain a target file recognizable by the burn-in device, the following steps are further included: In response to the burn-in test requirement input by the user, the burn-in test requirement is compiled using a preset language to obtain a requirement program file; The requirement program file is stored in a head folder of an installation path corresponding to the preset language to obtain a target requirement program file; A preset tool file is created in the preset language environment, and the target requirement program file is referenced in the preset tool file to compile a preset tool program.

4. The method according to claim 1 or 3, characterized in that, The step of processing the target binary file based on the preset tool program to obtain a target file recognizable by the burn-in device further comprises the following steps: Each binary data in the target binary file is read using the preset tool program to obtain a target array; The target array is waveform-edited based on a preset editing rule to obtain a target file recognizable by the burn-in device.

5. The method of claim 4, wherein, After the step of reading each binary data in the target binary file using the preset tool program to obtain a target array, the following steps are further included: The total length of the target array read and the values corresponding to the high bits and low bits in each binary data in the target array are returned.

6. The method of claim 5, wherein, The step of waveform-editing the target array based on a preset editing rule to obtain a target file recognizable by the burn-in device further comprises the following steps: The values corresponding to the high bits and low bits in each binary data in the target array are read in sequence to obtain a high bit value group and a low bit value group; Based on the preset editing rule and the high bit value group, the TMS pin is set high or low to obtain a waveform file of the TMS pin; and The method is based on a digital waveform field entry type burn-in test platform, the digital waveform field entry type burn-in test platform comprises a plurality of burn-in devices, and the method comprises the following steps: The waveform file of the TDI pin is obtained based on the preset editing rule and the low-bit numerical group, and the TDI pin is set high or low. The target file recognizable by the burn-in device is obtained according to the waveform file of the TMS pin and the waveform file of the TDI pin.

7. The method of claim 6, wherein, The step of obtaining the waveform file of the TMS pin based on the preset editing rule and the high-bit numerical group further comprises: The values in the high-bit numerical group are read in sequence, if the value corresponding to the high bit is 1, the TMS pin is set high, if the value corresponding to the high bit is 0, the TMS pin is set low, so as to obtain the waveform file of the TMS pin.

8. The method according to claim 6, characterized in that, The step of obtaining the waveform file of the TDI pin based on the preset editing rule and the low-bit numerical group further comprises: The values in the high-bit numerical group are read in sequence, if the value corresponding to the low bit is 1, the TDI pin is set high, if the value corresponding to the low bit is 0, the TDI pin is set low, so as to obtain the waveform file of the TDI pin.

9. A batch automated test device, characterized by, The device comprises: A format processing module is configured to perform format processing on an original file to obtain a target binary file in a target format, wherein each line of the target binary file has one byte; A file processing module is configured to process the target binary file based on a preset tool program according to a depth of a preset waveform vector to obtain a target file recognizable by a burn-in device, wherein the preset tool program is established based on a burn-in test requirement input by a user; A signal set generation module is configured to import the target file into the burn-in device to generate a burn-in test level signal set; An automatic test module is configured to import the burn-in test level signal set into a digital waveform field entry type burn-in test platform to perform automatic test.

10. A computer device, comprising: It comprises: A controller; A memory is configured to store one or more programs, when the one or more programs are executed by the controller, the controller is caused to implement the batch automatic test method in any one of claims 1 to 8.

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