Device for measuring current-carrying characteristic of superconducting tape at any magnetic field incident angle

Abstract

The invention provides a device for measuring the current-carrying characteristic of a superconducting tape at any magnetic field incident angle, and relates to the field of superconducting testing, and the device comprises a testing housing which is internally provided with a testing cavity; the sample mounting table is located in the test cavity and used for mounting a superconducting tape sample, and the sample mounting table is provided with a detection structure used for obtaining the electric field sizes of the two ends of the superconducting tape; at least part of the current lead is located in the test cavity and can provide electric energy for the superconducting strip sample; the flexible connecting piece is positioned in the testing cavity, is connected with the superconducting tape sample and the current lead and is used for supplying power to the superconducting tape sample; the insulating separator is positioned in the test cavity and is used for isolating the superconducting strip sample from the current lead; wherein the testing shell extends in the first direction, and the sample mounting table can enable the included angle between the thickness direction of the superconducting strip sample and the first direction to be adjustable. The measuring device can conveniently adjust the incident angle of the magnetic field.

Description

Technical Field

[0001] This invention relates to the field of superconductivity testing, and more particularly to a device for measuring the current-carrying characteristics of superconducting tapes at arbitrary magnetic field incident angles. Background Technology

[0002] Current-carrying characteristics are a crucial indicator for evaluating the properties of superconducting materials. Because high-temperature superconducting materials consist of superconducting, normally conducting, and non-conducting layers stacked together, the coherence length and penetration depth vary significantly in different directions, resulting in substantial anisotropy. The current-carrying characteristics (critical current, n-value, critical temperature, AC loss, etc.) of high-temperature superconducting tapes differ greatly under different incident angles and magnetic fields of varying amplitudes. The magnetic field angle dependence data of the current-carrying characteristics of high-temperature superconducting tapes, especially parameters such as the critical current, are key input parameters for electromagnetic design. Their accuracy directly affects the reliability of the device operation and the utilization rate of the superconducting material. Adjusting the magnetic field incident angle of the superconducting tape in the relevant current-carrying characteristic measurement device is inconvenient. Summary of the Invention

[0003] This invention provides a measuring device for the current-carrying characteristics of superconducting tapes at arbitrary magnetic field incident angles, which solves the technical problem of how to improve the ease of adjusting the magnetic field incident angle of superconducting tapes.

[0004] This invention provides a measuring device for measuring the current-carrying characteristics of a superconducting tape at an arbitrary magnetic field incident angle. The measuring device includes: a test housing with a test cavity inside; a sample mounting stage located within the test cavity and used to mount a superconducting tape sample, the sample mounting stage having a detection structure for acquiring the magnitude of the electric field at both ends of the superconducting tape; a current lead, at least a portion of which is located within the test cavity and capable of providing electrical energy to the superconducting tape sample; a flexible connector located within the test cavity and connecting the superconducting tape sample and the current lead, used to supply power to the superconducting tape sample; and an insulating isolator located within the test cavity and used to isolate the superconducting tape sample and the current lead. The test housing extends along a first direction, and the sample mounting stage allows the angle between the thickness direction of the superconducting tape sample and the first direction to be adjustable.

[0005] In some embodiments, the sample mounting stage is detachably connected to allow adjustment of the angle between the thickness direction of the superconducting tape sample and the first direction.

[0006] In some embodiments, there are two current leads, each located within the test chamber and extending along a first direction, with the ends of the two current leads in the first direction forming a first mounting position; one current lead includes two parts spaced apart in the first direction to form a second mounting position; wherein, when the sample mounting stage is in the first mounting position, the thickness direction of the superconducting tape sample is parallel to the first direction, and the two parts of the current lead are connected; when the sample mounting stage is in the second mounting position, the thickness direction of the superconducting tape sample is perpendicular to the first direction, the two parts of the current lead are connected, and the ends of the two current leads in the first direction are connected by a conductive structure.

[0007] In some embodiments, the insulating isolator includes: an isolation portion located within the test chamber; and a mounting portion detachably connected to the isolation portion, wherein the end of the mounting portion away from the isolation portion forms a mounting surface for detachable connection with the sample mounting stage; wherein the insulating isolator extends along a first direction, the mounting surface is located at the end of the mounting portion in the first direction, and the mounting portion has various different models, each model having a different included angle between the mounting surface and the first direction.

[0008] In some embodiments, the sample mounting stage is rotated to adjust the angle between the thickness direction of the superconducting tape sample and the first direction.

[0009] In some embodiments, the current lead includes: a fixed portion; a rotating portion, one end of which is rotatably connected to the sample mounting stage; wherein the flexible connector is used to connect the rotating portion and the sample mounting stage.

[0010] In some embodiments, the sample mounting stage further includes: a mounting stage body for mounting the superconducting tape sample, wherein the superconducting tape sample is located between the mounting stage body and the insulating isolator; and an adjustment structure for adjusting the distance between the mounting stage body and the insulating isolator.

[0011] In some embodiments, the measuring device further includes: a first cooling medium inlet, communicating with the test chamber and used to introduce the first cooling medium into the test chamber; a first cooling medium outlet, communicating with the test chamber and used to discharge the first cooling medium out of the test chamber; and a gas guide tube extending from the first cooling medium inlet to a position close to the sample mounting stage.

[0012] In some embodiments, the measuring device further includes: a lead housing detachably connected to the test housing, and in the first direction, the lead housing is fixed to the end of the test housing away from the sample mounting stage, the lead housing having a lead cavity; a second cooling medium inlet communicating with the lead cavity and used to introduce a second cooling medium into the lead cavity; a second cooling medium outlet communicating with the lead cavity and used to discharge the second cooling medium from the lead cavity, the specific heat capacity of the second cooling medium being less than that of the first cooling medium; wherein a portion of the current lead is located within the test cavity and another portion of the current lead is located within the lead cavity.

[0013] In some embodiments, the sample mounting stage has a flexible portion for causing bending deformation of the sample mounting stage and the superconducting tape sample; or, the sample mounting stage has multiple models, and the portion of the sample mounting stage for mounting the superconducting tape sample of each model has a different shape for causing the superconducting tape sample to bend with different radii.

[0014] This invention provides a measuring device for the current-carrying characteristics of a superconducting tape at an arbitrary magnetic field incident angle. The measuring device includes a test housing with an internal test cavity, a sample mounting stage for mounting a superconducting tape sample, a current lead for supplying electrical energy to the superconducting tape sample, and a flexible connector connecting the current lead and the superconducting tape sample. The current lead, flexible connector, and superconducting tape sample form a current loop, allowing current to flow through the superconducting tape sample. The sample mounting stage has a detection structure for acquiring the electric field magnitude at both ends of the superconducting tape sample, and an insulating isolator for isolating the current lead and the superconducting tape sample. The test housing is fixed to the sample mounting stage. The superconducting tape sample is inserted into the magnetic field generated by the magnetic field generating device, enabling the measurement of the current-carrying characteristics of the superconducting tape sample. The test shell extends along the first direction to form a straight-line structure, which facilitates the insertion of the test shell into the magnetic field generated by the magnetic field acoustic field device. Moreover, the sample mounting stage allows the angle between the thickness direction of the superconducting tape sample and the first direction to be adjustable, and the angle between the direction of the current flowing through the superconducting tape sample and the direction of the magnetic field to be adjustable. This enables the measurement of the current-carrying characteristics of the superconducting tape at any magnetic field incident angle, and the sample mounting stage improves the convenience of adjusting the magnetic field incident angle of the superconducting tape sample. Attached Figure Description

[0015] Figure 1 A schematic diagram of a device for measuring the current-carrying characteristics of a superconducting tape at an arbitrary magnetic field incident angle, provided in an embodiment of the present invention; Figure 2This is a schematic diagram of the first type of structure in the measuring device for measuring the current-carrying characteristics of superconducting tape at arbitrary magnetic field incident angles provided in this embodiment of the invention, which enables the angle between the thickness direction of the superconducting tape sample and the magnetic field direction to be adjustable. Figure 3 This is a schematic diagram of the second type of structure in the measuring device for measuring the current-carrying characteristics of superconducting tape at arbitrary magnetic field incident angles provided in this embodiment of the invention, which enables the angle between the thickness direction of the superconducting tape sample and the magnetic field direction to be adjustable. Figure 4 This is a schematic diagram of the third type of structure in the device for measuring the current-carrying characteristics of superconducting tape at arbitrary magnetic field incident angles provided in this embodiment of the invention, which enables the angle between the thickness direction of the superconducting tape sample and the magnetic field direction to be adjustable. Figure 5 This is a schematic diagram of the assembly of the sample mounting stage, insulating isolation component, and superconducting tape sample in the measurement device for the current-carrying characteristics of superconducting tape at arbitrary magnetic field incident angle provided in an embodiment of the present invention.

[0016] Explanation of reference numerals in the attached figures 10. Test housing; 11. Test chamber; 20. Sample mounting stage; 21. Detection lead mounting head; 22. Mounting stage body; 23. Adjustment structure; 24. Stress sensor; 30. Current lead; 31. Fixed part; 32. Rotating part; 40. Flexible connector; 50. Insulating isolation part; 61. First cooling medium inlet; 62. First cooling medium outlet; 63. Air guide pipe; 70. Lead housing; 71. Second cooling medium inlet; 72. Second cooling medium outlet; 73. Lead cavity; 74. Heating element; 75. Magnetic field strength sensor; 76. Measurement signal line connector. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0018] The specific technical features described in the various embodiments in the detailed implementation can be combined in various ways without contradiction. For example, different implementation methods can be formed by combining different specific technical features. In order to avoid unnecessary repetition, the various possible combinations of the specific technical features in this invention will not be described separately.

[0019] It should also be noted that, in order to avoid obscuring the invention with unnecessary details, only the structures and / or processing steps closely related to the present invention are shown in the accompanying drawings, while other details that are not closely related to the present invention are omitted.

[0020] Additionally, it should be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. In the following description, the terms "first," "second," etc., are used merely to distinguish different objects and do not indicate any similarity or connection between them. It should be understood that the directional descriptions such as "above," "below," "inside," and "outside" refer to the orientation under normal use conditions.

[0021] In the following specific embodiments, the measuring device is used to measure the current-carrying characteristics of superconducting tape. Since superconducting tape has anisotropy, it is necessary to adjust the angle at which the superconducting tape enters the magnetic field, so as to measure the current-carrying characteristics of superconducting tape under different angles between the current direction and the magnetic field direction. The structure and function of the measuring device for the current-carrying characteristics of superconducting tape at arbitrary magnetic field incident angle are illustrated below with examples.

[0022] In some embodiments, such as Figure 1As shown, the measuring device for the current-carrying characteristics of superconducting tape at arbitrary magnetic field incident angles includes: a test housing 10, a sample mounting stage 20, a current lead 30, a flexible connector 40, and an insulating isolator 50. The test housing 10 has a test cavity 11 inside, which provides a testing environment for the sample. Specifically, the test cavity 11 is used to provide a low-temperature environment for the superconducting tape to enable it to be in a superconducting state. Simultaneously, the test cavity 11 is also used to isolate the superconducting tape from external contaminants, thereby preventing contamination of the superconducting tape by external contaminants. The sample mounting stage 20 is located inside the test cavity 11 and is used to mount the superconducting tape sample 1. The superconducting tape sample 1 can be fixedly connected to the sample mounting stage 20 in any way. For example, the sample mounting stage 20 includes a mounting stage body and a snap-fit ​​structure. The snap-fit ​​structure clamps the superconducting tape sample 1 between the mounting stage body and the snap-fit ​​structure. For example, the sample mounting stage 20 includes clamping claws, which clamp the sample 1 to the sample 1 through a clamping action. The superconducting tape sample 1 is fixedly connected. Simultaneously, the sample mounting stage 20 also includes a detection structure for acquiring the current magnitude at both ends of the superconducting tape sample 1. Specifically, the sample mounting stage 20 has two spaced-apart detection lead mounting heads 21. With the superconducting tape sample 1 fixed to the sample mounting stage 20, the two detection lead mounting heads 21 are respectively connected to both ends of the superconducting tape sample 1. By connecting the detection leads to the two detection lead mounting heads 21 respectively, the electric field magnitude at both ends of the superconducting tape sample 1 can be measured. The critical current of the superconducting tape sample 1 can be determined through this potential difference. For example, when the electric field magnitude formed at both ends of the superconducting tape sample 1 is greater than 1 microvolt per centimeter, the current magnitude passing through the superconducting tape sample 1 at this time is determined to be the critical current.

[0023] The current lead 30 is at least partially located within the test chamber 11 and is capable of providing electrical energy to the superconducting tape sample 1. Specifically, one end of the current lead 30 is connected to an external functional device, and the other end of the current lead 30 extends to a position close to the superconducting tape sample 1. Meanwhile, the flexible connector 40 is used to connect the current lead 30 to the superconducting tape sample 1, so that the current lead 30, the flexible connector 40, and the superconducting tape sample 1 form a current loop, thereby allowing current to flow through the superconducting tape sample 1. It should be noted that since the current lead 30 needs to provide a high voltage current, it is required to have a large current carrying capacity, which is why the current lead 30 is made of a rigid conductive material. For example, the current lead 30 is a rigid copper busbar. At the same time, in order for the current lead 30 made of this rigid material to be smoothly connected to the superconducting tape sample 1, especially after adjusting the angle of the superconducting tape sample 1, the flexible connector 40 can deform itself to ensure that the superconducting tape sample 1 can still be connected to the current lead 30.

[0024] The insulating isolator 50 is located inside the test chamber 11 and is used to isolate the superconducting tape sample 1 from the current lead 30. It is used to isolate the superconducting tape sample from the induced magnetic field generated by the current lead 30 when it is energized, so that the superconducting tape sample 1 is only affected by the external magnetic field of a specific direction and intensity. Specifically, during the test, the test housing 10 is extended into the magnetic field generating device so that the sample mounting stage 20 on which the superconducting tape sample is mounted is extended into the magnetic field generating device, so that the superconducting tape sample 1 can be located in a magnetic field of a specific direction and intensity.

[0025] The test housing 10 extends along the first direction, forming a straight structure, which facilitates inserting the test housing 10 into the magnetic field generating device. Furthermore, the sample mounting stage 20 allows for adjustable angles between the thickness direction of the superconducting tape sample 1 and the first direction. Current leads 30 are connected to the superconducting tape sample 1 at both ends perpendicular to its thickness direction, allowing current to flow through the superconducting tape sample 1 perpendicular to its thickness direction. While maintaining the direction of the magnetic field provided by the magnetic field generating device, adjusting the angle between the thickness direction of the superconducting tape sample 1 and the first direction changes the angle between the direction of the current flowing through the superconducting tape sample 1 and the direction of the external magnetic field. This enables the measurement of the current-carrying characteristics of the superconducting tape sample at any magnetic field incident angle and improves the ease of adjusting the angle of the superconducting tape sample.

[0026] It should be noted that the sample mounting stage 20 can achieve angle adjustment of the superconducting tape sample 1 in any way. For example, the sample mounting stage 20 can be detachably connected to change its mounting position or angle to achieve angle adjustment of the superconducting tape sample. For example, the sample mounting stage 20 can also be rotatably connected to allow direct angle adjustment of the superconducting tape sample by rotation without disassembly. The following will illustrate this further. Figures 2 to 4 The structure and adjustment method of the sample mounting stage 20 for adjusting the angle of the superconducting tape sample are described by way of example. Those skilled in the art should understand that the structure of the sample mounting stage 20 capable of adjusting the superconducting tape sample can also be other than... Figures 2 to 4 Other structures besides those mentioned above.

[0027] First, an example is given of adjusting the angle of a superconducting tape sample through disassembly and assembly, such as... Figure 2As shown, there are two current leads 30, both extending along a first direction. The ends of the two current leads 30 in the first direction form a first mounting position A. One of the two current leads 30 includes two parts spaced apart in the first direction, forming a second mounting position B between the two parts. The sample mounting stage 20 can be detachably fixed to the first mounting position A and / or the second mounting position B. When the sample mounting stage 20 is fixed to the first mounting position A, the ends of the two current leads 30 in the first direction are connected by the superconducting tape sample 1, and the opening at the second mounting position B is connected through a conductive structure, allowing the two current leads 30 and the superconducting tape sample 1 to... A circuit is formed. In this state, the thickness direction of the superconducting tape sample 1 is parallel to the first direction. With the sample mounting stage 20 fixed at the second mounting position B, the two parts of the current leads 30 are connected by the superconducting tape sample 1, and the two ends of the two current leads 30 in the first direction are connected by a conductive structure, so that the two current leads 30 and the superconducting tape sample 1 can form a circuit. In this state, the thickness direction of the superconducting tape sample 1 is perpendicular to the first direction. It can be understood that by fixing the sample mounting stage 20 to the first mounting position or the second mounting position respectively, the superconducting tape sample 1 can be deflected by 90 degrees, thereby changing the angle between the current direction flowing through the superconducting tape sample 1 and the magnetic field direction by 90 degrees. Optionally, such as Figure 2 As shown, there are two sample mounting stages 20. The two sample mounting stages 20 are fixed at the first mounting position A and the second mounting position B at the same time, so that there is no need to connect the disconnected position in the conductive circuit through the conductive structure, and the current carrying characteristics of the superconducting tape sample 1 with two incident magnetic fields at two angles can be detected at the same time.

[0028] like Figure 3 As shown, the insulating isolator 50 includes an isolating portion 51 and a mounting portion 52. Both the isolating portion 51 and the mounting portion 52 are located inside the test chamber 11. The mounting portion 52 is detachably connected to the isolating portion 51. The end of the mounting portion 52 away from the isolating portion 51 in a first direction forms a mounting surface 521. The mounting surface 521 is used for detachable connection with the sample mounting stage 20. The mounting portions 52 have different models, and the mounting surface of each model of the mounting portion 52 has a different included angle with the first direction. By installing different models of the mounting portions 52 on the isolating portion 51, the included angle between the mounting surface 521 and the first direction can be adjusted. Fixing the sample mounting stage 20 to the mounting surface 521 at different angles can make the thickness direction of the superconducting tape sample 1 fixed to the sample mounting stage 20 form different angles with the first direction.

[0029] The following is an example illustrating how the angle between the thickness direction and the first direction of the superconducting tape sample can be adjusted via the rotational connection of the sample mounting stage 20. Figure 4 As shown, the current lead 30 includes a fixed portion 31 and a rotating portion 32. One end of the rotating portion 32 is rotatably connected to the fixed portion 31. The rotation of the rotating portion 32 allows the sample mounting stage 20 to rotate relative to the fixed portion 31, thereby adjusting the angle between the thickness direction of the superconducting tape sample and the first direction. Simultaneously, to improve the reliability of electrical conduction between the rotating portion and the sample mounting stage 20, the rotating connection position between the rotating portion 32 and the sample mounting stage 20 is not set as the energized position. Instead, a flexible connector 40 fixes the rotating portion 32 to the sample mounting stage 20, thus making the connection position of the flexible connector 40 fixed. Through the flexible deformation of the flexible connector 40, electrical energy is reliably conducted to the sample mounting stage 20 during its deflection. Optionally, as... Figure 4 As shown, there are two current leads, and each current lead includes a fixed part 31 and a rotating part 32. The two rotating parts 32 are rotatably connected to the two fixed parts 31 respectively. The other end of the two rotating parts 32 is connected to both ends of the sample mounting stage 20 respectively, thereby improving the connection reliability between the rotating parts 32 and the sample mounting stage 20. Optionally, the extension directions of the two rotating parts 32 are parallel, or the two rotating parts 32 are arranged in a cross pattern.

[0030] This invention provides a measuring device for the current-carrying characteristics of a superconducting tape at an arbitrary magnetic field incident angle. The measuring device includes a test housing with an internal test cavity, a sample mounting stage for mounting a superconducting tape sample, a current lead for supplying electrical energy to the superconducting tape sample, and a flexible connector connecting the current lead and the superconducting tape sample. The current lead, flexible connector, and superconducting tape sample form a current loop, allowing current to flow through the superconducting tape sample. The sample mounting stage has a detection structure for acquiring the electric field magnitude at both ends of the superconducting tape sample, and an insulating isolator for isolating the current lead and the superconducting tape sample. The test housing is fixed to the sample mounting stage. The superconducting tape sample is inserted into the magnetic field generated by the magnetic field generating device, enabling the measurement of the current-carrying characteristics of the superconducting tape sample. The test shell extends along the first direction to form a straight-line structure, which facilitates the insertion of the test shell into the magnetic field generated by the magnetic field acoustic field device. Moreover, the sample mounting stage allows the angle between the thickness direction of the superconducting tape sample and the first direction to be adjustable, and the angle between the direction of the current flowing through the superconducting tape sample and the direction of the magnetic field to be adjustable. This enables the measurement of the current-carrying characteristics of the superconducting tape at any magnetic field incident angle, and the sample mounting stage improves the convenience of adjusting the magnetic field incident angle of the superconducting tape sample.

[0031] In some embodiments, such as Figure 5As shown, the sample mounting stage 20 also includes a mounting stage body 22 and an adjustment structure 23. The mounting stage body 22 is used to mount the superconducting tape sample 1, and the superconducting tape sample 1 is located between the mounting stage body 22 and the insulating isolator 50. The adjustment structure 23 is used to adjust the distance between the mounting stage body 22 and the insulating isolator 50. The mounting stage body 22 can press the superconducting tape sample 1 against the insulating isolator 50 to apply a static pressure load to the superconducting tape sample 1. Moreover, the magnitude of the static pressure load can be adjusted by the adjustment structure 23, thereby realizing the measurement of the current-carrying characteristics of the superconducting tape under different static pressure loads and different magnetic field incident angle coupling states. The adjustment structure 23 can be any structure that can adjust the distance between the mounting stage body 22 and the insulating isolator 50. For example, the adjustment structure 23 is an adjusting bolt or a telescopic rod.

[0032] Optional, such as Figure 5 As shown, the mounting platform body 22 is also equipped with a stress sensor 24. One part of the stress sensor 24 is fixedly connected to the mounting platform body 22, and the other part of the stress sensor 24 is fixedly connected to the test housing 10. When the mounting platform body 22 presses against the superconducting tape sample, relative movement occurs between the mounting platform body 22 and the test housing 10, so that the stress sensor 24 can measure the magnitude of the static pressure load through its own deformation. For example, the stress sensor 24 is a low-temperature resistance strain gauge.

[0033] In some embodiments, such as Figure 1 As shown, the measuring device also includes a first cooling medium inlet 61 and a first cooling medium outlet 62. The first cooling medium inlet 61 is used to introduce the first cooling medium into the test chamber 11, and the first cooling medium outlet 62 is used to discharge the heated first cooling medium from the test chamber 11 after heat exchange, thereby carrying the heat away from the test chamber 11. The first cooling medium enables the temperature inside the test chamber 11 to reach the superconducting state of the superconducting tape sample. Simultaneously, by adjusting the flow rate of the first cooling medium into and out of the test chamber 11, the temperature inside the test chamber 11 can be adjusted, thereby enabling the measurement of the current-carrying characteristics of the superconducting tape sample under the coupling of multiple physical factors such as different temperatures, different magnetic field incident angles, and different static pressure loads. The measuring device also includes a gas guide pipe 63, which extends from the first cooling medium inlet 61 to a position close to the sample mounting stage 20, allowing the first cooling medium to directly act on the superconducting tape sample, thus cooling the superconducting tape sample more efficiently.

[0034] In some embodiments, such as Figure 1As shown, the measuring device also includes a lead housing 70, a second cooling medium inlet 71, and a second cooling medium outlet 72. The lead housing 70 is detachably connected to the test housing 10, and the lead housing 70 is fixed to the end of the principle sample mounting stage 20 of the test housing 10 in the first direction. A lead cavity 73 is formed inside the lead housing 70. Part of the current lead 30 is located in the test cavity 11, and another part is located in the lead cavity 73. At the same time, the second cooling medium inlet 71 and the second cooling medium outlet 72 are used to respectively introduce and discharge the second cooling medium into and out of the lead cavity 73. It should be noted that the current lead 30 has a sealing structure at the position where it passes through the lead housing 70 and the test housing 10 to prevent leakage of the first and second cooling media and to prevent cross-contamination of the cooling media in the two cavities. The specific heat capacity of the second cooling medium is less than that of the first cooling medium, meaning that the cooling capacity of the second cooling medium is lower than that of the first cooling medium. This can be understood as the cooling requirements in the test chamber 11 being higher, thus requiring the first cooling medium, which has a stronger cooling capacity but a relatively higher cost, to cool the test chamber 11. The cooling requirements in the lead cavity 73 are lower, so the second cooling medium, which has a lower cooling capacity and a relatively lower cost, can be used to cool the lead cavity 73. Moreover, by setting up the lead cavity 73 and introducing the second cooling medium into the lead cavity 73, the temperature in the test chamber 11 can be adjusted within a wider temperature range through heat exchange between the two cavities. For example, the second cooling medium is liquid nitrogen, and the first cooling medium is cold helium, thereby allowing the temperature in the test chamber 11 to be adjusted within the temperature range of 25 K to 77 K.

[0035] Optional, such as Figure 1 As shown, the measuring device also includes a heating element 74, which is located near the sample mounting stage 20. By locally heating the sample mounting stage 20, a temperature difference is formed in the test chamber 11. This temperature difference forces the first cooling medium to accelerate convection within the test chamber 11, thereby further improving the cooling capacity of the first cooling medium for the superconducting tape sample. Optionally, a temperature sensor is provided near the superconducting tape sample to detect the temperature of the superconducting tape sample, so as to facilitate feedback control of the temperature within the test chamber 11.

[0036] Optional, such as Figure 5 As shown, the measuring device also includes a magnetic field strength sensor 75 for detecting the magnetic field strength, thereby facilitating feedback control of the magnetic field strength of the magnetic field generating device. Optionally, the magnetic field strength sensor 75 is integrated with the temperature sensor.

[0037] Optional, such as Figure 1As shown, the measuring device also includes a measuring signal line connector 76, which is fixed to the lead housing and extends out of the lead cavity 73. The measuring signal line connector 76 enables low-voltage sampling of the current lead 30, thereby enabling the monitoring of the current and voltage of the current lead 30.

[0038] In some embodiments, such as Figure 1 As shown, the sample mounting stage 20 can also bend the superconducting tape sample 1 to different angles or radii, thereby enabling the measurement of the current-carrying characteristics of the superconducting tape sample 1 under multiple physical factors coupled under different bending radii, temperatures, static pressure loads, and magnetic field incident angles. The sample mounting stage 20 can bend the superconducting tape sample 1 in any way. For example, the sample mounting stage 20 includes a flexible structure, and bending of this flexible structure can cause the sample mounting stage 20 to deform, thereby causing the superconducting tape sample 1 to bend to different radii or angles. For example, the sample mounting stage 20 has various models, and the parts of the sample mounting stage used to mount the superconducting tape sample have different shapes. By fixing the superconducting tape sample to the mounting parts of different shapes, the superconducting tape can be bent to different radii or angles.

[0039] Optionally, the measuring device also includes a vacuum pump connected to the test chamber. After the superconducting tape sample to be tested is replaced, the vacuum pump can return the test chamber to a vacuum state, thereby enabling the measuring device to measure different superconducting tape samples.

[0040] The above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention.

Claims

1. A device for measuring the current-carrying characteristics of superconducting tapes at arbitrary magnetic field incident angles, characterized in that, The measuring device comprises: a test housing having a test cavity inside; a sample mounting table located in the test cavity and used for mounting a superconducting tape sample, and the sample mounting table has a detection structure for obtaining the electric field magnitude of two ends of the superconducting tape; current leads, at least part of the current leads are located in the test cavity and capable of providing electric energy to the superconducting tape sample; a flexible connecting member located in the test cavity and connecting the superconducting tape sample and the current leads and used for supplying electric energy to the superconducting tape sample; an insulating spacer located in the test cavity and used for isolating the superconducting tape sample and the current leads; wherein the test housing extends along a first direction, and the sample mounting table is capable of adjusting the included angle between the thickness direction of the superconducting tape sample and the first direction.

2. The measuring device of claim 1, wherein, The sample mounting table achieves the adjustment of the included angle between the thickness direction of the superconducting tape sample and the first direction through detachable connection.

3. The measuring device of claim 2, wherein, The current leads have two, each of the current leads is located in the test cavity and extends along the first direction, and the ends of the two current leads in the first direction form a first mounting position; one of the current leads comprises two parts which are spaced apart in the first direction to form a second mounting position; wherein, in the state that the sample mounting table is located at the first mounting position, the thickness direction of the superconducting tape sample is parallel to the first direction, and the two parts of the current lead are connected through a conductive structure; in the state that the sample mounting table is located at the second mounting position, the thickness direction of the superconducting tape sample is perpendicular to the first direction, the two parts of the current lead are connected through a conductive structure, and the ends of the two current leads in the first direction are connected through a conductive structure.

4. The measuring device of claim 2, wherein, The insulating spacer comprises: a spacer part located in the test cavity; a mounting part detachably connected with the spacer part, the end of the mounting part away from the spacer part forms a mounting surface, and the mounting surface is used for detachable connection with the sample mounting table; wherein, the insulating spacer extends along a first direction, the mounting surface is located at the end of the mounting part in the first direction, and the mounting part has multiple different models, and the mounting surface of each model of the mounting part has a different included angle with the first direction.

5. The measuring device of claim 1, wherein, The sample mounting table achieves the adjustment of the included angle between the thickness direction of the superconducting tape sample and the first direction through rotary connection.

6. The measuring device of claim 5, wherein, The current lead comprises: a fixed part; a rotating part, one end of the rotating part is rotatably connected with the sample mounting table; wherein, the flexible connecting member is used for connecting the rotating part and the sample mounting table.

7. The measuring device according to any one of claims 1 to 6, characterized in that The sample mounting table further comprises: a mounting table body used for mounting the superconducting tape sample, and the superconducting tape sample is located between the mounting table body and the insulating spacer; an adjusting structure used for adjusting the distance between the mounting table body and the insulating spacer.

8. The measuring device according to any one of claims 1 to 6, characterized in that The measuring device further comprises: a first cooling medium inlet in communication with the test cavity and used for introducing a first cooling medium into the test cavity; a first cooling medium outlet in communication with the test chamber and configured to discharge the first cooling medium from the test chamber; a gas guide tube extending from the first cooling medium inlet to a position proximate to the sample mounting table.

9. The measuring device of claim 8, wherein, The measurement device further comprises: a lead shell detachably connected to the test shell and fixed to an end of the test shell distal to the sample mounting table in the first direction, the lead shell having a lead cavity therein; a second cooling medium inlet in communication with the lead cavity and configured to introduce a second cooling medium into the lead cavity; a second cooling medium outlet in communication with the lead cavity and configured to discharge the second cooling medium from the lead cavity, the second cooling medium having a specific heat capacity less than that of the first cooling medium; wherein a portion of the current lead is located in the test chamber and another portion of the current lead is located in the lead cavity.

10. The measuring device according to any one of claims 1 to 6, characterized in that, The sample mounting table has a flexible portion configured to cause the sample mounting table and the superconducting tape sample to undergo a bending deformation, or, The sample mounting table has a plurality of models, each model of the sample mounting table having a portion configured to mount the superconducting tape sample having a different shape configured to cause the superconducting tape sample to undergo a bending deformation at a different radius.

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