Radio frequency device network parameter test method and system based on switch matrix

Abstract

The invention provides a radio frequency device network parameter testing method and system based on a switch matrix, relates to the field of radio frequency devices and automatic testing, and solves the problem that when the performance indexes of batch radio frequency devices such as amplifiers and radio frequency switches are tested, the cable connection relation needs to be manually and frequently changed, so that the performance test is extremely time-consuming. According to the invention, a specially designed integrated switch matrix is used, according to different device test types and test indexes, a control computer is used to send a control instruction to change the input and output relation of the switch matrix, the change of the connection relation of a test instrument and a cable and the change of the signal flow direction are realized, and automatic test software based on a TCP / IP protocol is used. Automatic testing and data processing of different radio frequency devices and different performance indexes are completed, and time and testing cost of batch device performance index testing are effectively reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of radio frequency devices, in particular to a radio frequency device network parameter test method and system based on a switch matrix. BACKGROUND

[0002] With the development of radio frequency device design tools, the improvement of micro-assembly processes, and the advancement of semiconductor manufacturing technology, the cycle from design to production of radio frequency devices has been significantly shortened, enabling low-cost mass production of radio frequency devices. In order to ensure the performance indicators of the devices, low-cost test systems are also needed to test the indicators of the produced devices.

[0003] To reduce the cost of testing batches of devices, an important approach is to use an automatic test system to test the devices. This test system needs to be able to generate test signals in response to control instructions and detect device output signals, completing the test in the process while minimizing human involvement. However, in the existing automatic test systems for radio frequency devices, in addition to the testing of device indicators being completed by test instruments controlled by the automatic control system, the connection method of the instruments and devices, as well as the types and combinations of test instruments, are mostly changed manually, which brings additional labor costs and increases the instability of the test system.

[0004] Patent document CN113358947A (application number: 202010133907.0) discloses a one-stop full-automatic radio frequency device test system. By using a radio frequency device test system including a signal switching unit that can automatically run, multiple test items are highly integrated, greatly reducing test costs, without the need for intermediate handling and frequent plugging of cables, while greatly saving test site space. The test process is fully automated, greatly improving test consistency and shortening test time.

[0005] The present application proposes a radio frequency device network parameter test method and system based on a switch matrix, which changes the connection relationship between test instruments and devices under test using a switch matrix, and controls the signal flow direction according to the current test indicators, thereby reducing the labor cost of testing large batches of devices. SUMMARY

[0006] In view of the defects in the prior art, the purpose of the present application is to provide a radio frequency device network parameter test method and system based on a switch matrix.

[0007] According to the radio frequency device network parameter test method based on a switch matrix provided by the present application, the method comprises the following steps:

[0008] Step S1: Setting a switch matrix according to the number of test instruments needed for batch testing tasks and the number of device ports;

[0009] Step S2: sending a control command to the switch matrix through the control computer for selecting a certain port of the instrument end and a certain port of the device under test, connecting the output and input ports of the network analyzer to the selected instrument port and the device under test port respectively, testing and recording the network parameters of the current port combination, repeating the triggering step S2 until the network parameters of all port combinations are tested and recorded to form a network parameter matrix of the switch matrix, and completing the network parameter self-calibration of the switch matrix; wherein the network parameters include: insertion loss and non-folded phase;

[0010] Step S3: selecting the test instruments needed for index testing according to the test indexes of the device under test in the current batch test task, and connecting the input and output ports of the test instruments to the instrument end of the switch matrix, and connecting the input and output ports of the device under test to the device under test end of the switch matrix;

[0011] Step S4: connecting the test instruments used in the test task and the switch matrix to the control computer respectively, selecting different ports of the instrument end and the device under test end of the switch matrix through the control computer according to different index test types, ensuring that the input and output ports of the test instruments correspond one-to-one to the input and output ports of the device under test, and controlling the signal output and shutdown of the test instruments according to the test methods of different indexes in a time sequence relationship, and at the same time, sending a data reading instruction to the test instruments through the control computer to save the test data locally;

[0012] Step S5: calculating the performance index parameters of the device under test based on the local test data of the control computer and the network parameter matrix of the switch matrix, and completing the current measurement task.

[0013] Preferably, the step S1 comprises:

[0014] The switch matrix N x M includes instrument end ports and device under test end ports; wherein N represents the total number of instrument end ports, representing the total number of instrument input and output ports needed to be connected simultaneously in the test task for batch testing; M represents the number of single-row ports of the device under test end, representing the number of ports of each row of the device under test end of the switch matrix, which is not less than the maximum value of the input port number m 输入 or the output port number m 输出 , that is, M≥max{m 输入 ,m 输出}.

[0015] The instrument end ports enter the switch matrix and are connected to N 1-to-N switches, the N 1-to-N switches are connected to N N-to-1 switches, and then the N N-to-1 switches are connected to N switch groups; wherein the switch group internally integrates i layers of single-throw j throw switches, so as to realize the connection between the single-end port of the switch group and M=j iAny conduction of the ports, the switch matrix is integrated with N switch groups inside, so the switch matrix has NXM ports in common with the ports of the DUT.

[0016] Preferably, the step S2 comprises:

[0017] Step S2.1: connecting the output and input ports of the network analyzer through the radio frequency connectors to a certain instrument end port of the switch matrix and a certain port of the DUT, respectively;

[0018] Step S2.2: setting the start frequency and the stop frequency of the network analyzer according to the working frequency band of the switch matrix, and setting the measurement type as S 21 , and the data format is logarithmic amplitude and non-folded phase;

[0019] Step S2.2: sending a control signal to the switch matrix through the control computer to turn on the two ports connected to the network analyzer, sending a data reading command to the network analyzer through the control computer, and storing the read data in the local control computer;

[0020] Step S2.4: changing the interface connection relationship between the network analyzer and the switch matrix, and correspondingly changing the control command sent by the control computer to the switch matrix, ensuring that the two interfaces connected by the network analyzer are in the on state, and repeating step S2.3 until all port combinations of the instrument end and the DUT end of the switch matrix have been tested;

[0021] Step S2.5: reconstructing all network port combination test data stored in the local control computer into a transmission network matrix, and the specific form of the matrix is as follows:

[0022]

[0023] The network parameter matrix is N 2 rows and M columns, and the elements in the matrix represent the insertion loss and non-folded phase of the Nth port of the instrument end and the Nth row and Mth port of the DUT end in the on state.

[0024] Preferably, the step S3 comprises: the test instrument has N input and output ports, which are connected to the instrument end ports of the switch matrix one by one; the radio frequency signal input ports of the DUT are connected to a certain row of ports of the DUT end of the switch matrix, ensuring that the input ports of the DUT are in the same switch group; the output ports of the DUT are connected to another row of the DUT end of the switch matrix, ensuring that the output ports and the input ports of the DUT are not in the same switch group at the same time, and the output ports are in the same switch group.

[0025] Preferably, the step S4 comprises:

[0026] Step S4.1: sending a control instruction to the switch matrix according to the current test index by the control computer, so that the port for test signal input on the instrument side of the switch matrix and the port for signal output on the device side are in an on state, and the port for receiving the output signal of the device under test on the device side of the switch matrix and the port for outputting the signal on the instrument side are in an on state;

[0027] Step S4.2: sending a control instruction to the device under test by the control computer, so that the output port of the device under test is in an on state;

[0028] Step S4.3: sending a control instruction to the test instrument generating the test signal by the control computer, so that the test instrument outputs the test signal, the test signal enters the test instrument via the switch matrix and the device under test, and the control computer sends a data reading instruction to the test instrument, so that the test data of the network analyzer and the spectrum analyzer are saved locally; repeating steps S4.2 to S4.3 until the test of all ports of the device under test is completed.

[0029] Preferably, the step S5 comprises:

[0030] Using the test data and the network parameter matrix to obtain the gain G and the insertion loss L of the device under test;

[0031] The insertion loss in the test data of the network analyzer on the control computer is the sum of the insertion loss of the device under test and the switch matrix; the insertion loss L or the gain G of each channel of the device under test is obtained by subtracting the insertion loss of the corresponding port network parameter of the switch matrix from the test data; for a device under test with multiple channels, the amplitude consistency index between each channel of the device under test is obtained by subtracting the insertion loss L or the gain G of the remaining channels of the device under test from that of a certain channel of the device under test;

[0032] The non-folded phase of each channel of the device under test is obtained by subtracting the non-folded phase of the corresponding port network parameter of the switch matrix from the test data; for a device under test with multiple channels, the phase consistency index between each channel of the device under test is obtained by subtracting the non-folded phase of the remaining channels of the device under test from that of a certain channel of the device under test;

[0033] The output power value of the device under test is obtained by subtracting the insertion loss value of the corresponding port network parameter of the switch matrix from the test data of the spectrum analyzer on the control computer; in the case that a certain channel of a multi-channel device is fixed in an on state, the power of each channel of the device is measured, and the isolation of the remaining channels of the device under test relative to the channel is obtained by subtracting the power of the unselected channel from the power of the selected channel; the power values of the channels of the device under test are measured again by changing the on channel of the device under test, and the isolation index between each channel of the device under test is obtained by subtracting the network parameter matrix of the switch matrix.

[0034] According to the application, a network parameter test system of a switch matrix based radio frequency device is provided, comprising:

[0035] Module M1: setting the switch matrix according to the number of test instruments required by the batch test task and the number of ports of the device under test;

[0036] Module M2: sending a control command to the switch matrix through the control computer to select a port of the instrument end and a port of the device under test, connecting the output and input ports of the network analyzer to the selected instrument port and the device under test port respectively, testing and recording the network parameters of the current port combination, repeating the triggering of module M2 until the network parameters of all port combinations are tested and recorded, forming a network parameter matrix of the switch matrix itself, and completing the network parameter self-calibration of the switch matrix; wherein the network parameters include insertion loss and non-folded phase;

[0037] Module M3: selecting the test instruments required for index testing according to the test indicators of the device under test in the current batch test task, and connecting the input and output ports of the test instruments to the instrument end of the switch matrix, and connecting the input and output ports of the device under test to the device under test end of the switch matrix;

[0038] Module M4: connecting the test instruments used in the test task and the switch matrix to the control computer respectively, selecting different ports of the instrument end and the device under test end of the switch matrix through the control computer according to different index test types, ensuring that the input and output ports of the test instruments correspond one-to-one with the input and output ports of the device under test, and controlling the signal output and shutdown of the test instruments according to the test methods of different indicators in a time sequence relationship, and at the same time, sending a data reading instruction to the test instruments through the control computer to save the test data locally;

[0039] Module M5: calculating the performance index parameters of the device under test based on the local test data of the control computer and the network parameter matrix of the switch matrix, and completing the current measurement task.

[0040] Preferably, the module M1 comprises:

[0041] The switch matrix N x M comprises instrument end ports and device under test end ports; wherein N represents the total number of instrument end ports, representing the total number of instrument input and output ports required to be connected simultaneously in the switch matrix for batch testing; M represents the number of single row ports of the device under test end, representing the number of ports of each row of the device under test end of the switch matrix, which is not less than the maximum value of the input port number m or the output port number m, i.e. M≥max{m,m}; 输入 输出 输入 输出 ​​​​

[0042] The instrument end port enters the switch matrix inside and is connected with N 1-to-N switches, the N 1-to-N switches are connected with N N-to-1 switches, then, the N N-to-1 switches are connected with N switch groups; wherein, the switch group is internally integrated with i-layer single-rod j-pole switches, so as to realize the arbitrary conduction of the single-end port of the switch group and M = j i The switch matrix is internally integrated with N switch groups, so the switch matrix has N x M ports in total on the port of the measured member;

[0043] The module M2 comprises:

[0044] Module M2.1: the output and input ports of the network analyzer are respectively connected with a certain instrument end port of the switch matrix and a certain port of the measured member through radio frequency connectors;

[0045] Module M2.2: the start frequency and the stop frequency of the network analyzer are set according to the working frequency band of the switch matrix, the measurement type is set to S 21 , the data format is logarithmic amplitude and non-folded phase;

[0046] Module M2.2: the control computer sends a control signal to the switch matrix to conduct the two ports connected with the network analyzer, the control computer sends a data reading command to the network analyzer, and the read data is stored in the local control computer;

[0047] Module M2.4: change the interface connection relationship between the network analyzer and the switch matrix, and correspondingly change the control command sent by the control computer to the switch matrix, ensure that the two interfaces connected with the network analyzer are in the conduction state, repeat the triggering of module M2.3, until all the port combinations of the instrument end and the measured member end of the switch matrix are tested;

[0048] Module M2.5: the test data of all the network port combinations stored in the local control computer are reconstructed into a transmission network matrix, and the specific form of the matrix is as follows:

[0049]

[0050] The network parameter matrix is N 2 row M column, the element in the matrix represents the insertion loss and non-folded phase of the Nth port of the instrument end and the Nth row Mth column port of the measured member in the conduction case.

[0051] Preferably, the module M3 includes: a test instrument having N input / output ports, each connected to a port on the switch matrix instrument side; the radio frequency signal input port of the device under test (DUT) is connected to a row of ports on the DUT side of the switch matrix, ensuring that all input ports of the DUT are within the same switch group; the output port of the DUT is connected to another row on the DUT side of the switch matrix, ensuring that the output port and input port of the DUT are not simultaneously within the same switch group, and that all output ports are within the same switch group.

[0052] The module M4 includes:

[0053] Module M4.1: The control computer sends control commands to the switch matrix according to the current test parameters, so that the port on the instrument side of the switch matrix used for test signal input and the port on the device under test (DUT) side used for signal output are in a conducting state, and the port on the DUT side of the switch matrix used for receiving the output signal of the DUT and the port on the instrument side used for output signal are in a conducting state.

[0054] Module M4.2: Sends control commands to the device under test (DUT) via the control computer, making the output port of the DUT active.

[0055] Module M4.3: The control computer sends control commands to the test instrument that generates the test signal, causing the test instrument to output the test signal. The test signal enters the test instrument after passing through the switch matrix and the device under test. The control computer sends data reading commands to the test instrument to save the test data of the network analyzer and spectrum analyzer locally. Modules M4.2 to M4.3 are triggered repeatedly until all ports of the device under test are tested.

[0056] Preferably, the module M5 includes:

[0057] The gain G and insertion loss L of the device under test are obtained using test data and network parameter matrix;

[0058] The insertion loss in the test data of the local network analyzer of the control computer is the sum of the insertion loss of the device under test and the switching matrix. The insertion loss L or gain G of each channel of the device under test is obtained by subtracting the insertion loss of the test data from the insertion loss of the corresponding port network parameters of the switching matrix. For a device under test with multiple channels, the amplitude consistency index between the channels of the device under test is obtained by subtracting the insertion loss L or gain G of the other channels of the device under test from that channel, using a certain channel of the device under test as a reference.

[0059] The non-folded phase of each channel of the device under test is obtained by subtracting the test data from the non-folded phase of the corresponding port network parameters of the switch matrix; for a device under test with multiple channels, the non-folded phase of the other channels of the device under test is subtracted from that channel to obtain the phase consistency index between the channels of the device under test.

[0060] The power value is obtained by subtracting the insertion loss value of the corresponding port network parameters of the switch matrix from the test data of the local spectrum analyzer on the control computer. When a certain channel of the multi-channel device is fixed in the conducting state, the power of each channel of the device is measured. The power of the unselected channel is subtracted from the power of the selected channel to obtain the isolation of the other channels of the device relative to that channel. The channel of the device under test is changed to be conducting, and the power value of each channel is measured again until all channels of the device under test are conducting. The isolation index between the channels of the device under test is obtained by subtracting the power of the switch matrix network parameters.

[0061] Compared with the prior art, the present invention has the following beneficial effects:

[0062] 1. This invention utilizes a switch matrix to achieve automated testing of batch devices, reducing manual involvement in batch device production testing and lowering costs;

[0063] 2. This invention uses a switch matrix to change the input-output relationship of the switch matrix by sending control commands from a control computer according to different device test types and test indicators. This enables changes in the test instrument, cable connection relationship, and signal flow direction, completing automatic testing and data processing for different RF devices and different performance indicators, effectively reducing the time and cost of batch device performance indicator testing. Attached Figure Description

[0064] Other features, objects, and advantages of the present invention will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0065] Figure 1 This is a schematic diagram of the switch matrix design described in this invention.

[0066] Figure 2 This is a schematic diagram of the internal switch group design of the switch matrix described in this invention.

[0067] Figure 3 This is a schematic diagram of the RF device network parameter testing system based on a switch matrix described in this invention. Detailed Implementation

[0068] The present invention will now be described in detail with reference to specific embodiments. These embodiments will help those skilled in the art to further understand the present invention, but do not limit the invention in any way. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all fall within the protection scope of the present invention.

[0069] Example 1

[0070] According to the present invention, a method for testing the network parameters of radio frequency devices based on a switch matrix is ​​provided, the method comprising the following steps:

[0071] Step 1: Design the switch matrix based on the number of instruments required for the batch testing task and the number of ports of the device under test;

[0072] The switching matrix includes:

[0073] The total number of ports N on the instrument side represents the switch matrix used for batch testing, which is the total number of all input and output ports of the instruments that need to be connected simultaneously in the testing task.

[0074] The number of ports M in a single row at the device under test (DUT) represents the number of ports in each row of the DUT at the switch matrix, and its value is not less than the number of input ports m of the DUT. 输入 Or the number of output ports m 输出 The maximum value, i.e., M≥max{m 输入 ,m 输出};

[0075] Based on the above indicators, in accordance with Figure 1 Complete the design of the switch matrix; first, the instrument's ports enter the switch matrix and connect to N 1-to-N switches. These N 1-to-N switches are then connected to N N-to-1 switches. This design allows for arbitrary selection between the N ports on the instrument and the N switch groups within the switch matrix. Next, the N N-to-1 switches are connected to the N switch groups, according to... Figure 2 The design of the switch group is complete. The switch group integrates an i-layer single-pole j-throw switch. According to the control command, the single-end port of the switch group can be connected to M=j i The switch matrix integrates N switch groups, allowing any port to be turned on. Therefore, the switch matrix has a total of N×M ports for the device under test.

[0076] Step 2: Connect the control computer, switch matrix, and network analyzer to the switch via network cables. Send control commands to the switch matrix to select a specific port on the instrument side of the switch matrix and a specific port on the device under test (DUT). Connect the output and input ports of the network analyzer to the selected instrument port and the DUT port, respectively. Test and record the network parameters of the port combination, including but not limited to insertion loss and non-folded phase. Test and record the network parameters of all port combinations to form the network parameter matrix of the switch matrix itself. Use this step to complete the self-calibration of the network parameters of the switch matrix.

[0077] Specifically, step 2 includes:

[0078] Step 2.1: Connect the output and input ports of the calibrated network analyzer to one of the instrument ports and one of the ports of the device under test of the switch matrix via RF connectors;

[0079] Step 2.2: Set the start and stop frequencies of the network analyzer according to the operating frequency band of the switch matrix, and set the measurement type to S. 21 The data format is logarithmic amplitude and non-folded phase;

[0080] Step 2.3: Use the control computer to send a control signal to the switch matrix to turn on the two ports connected to the network analyzer, and use the control computer to send a data read command to the network analyzer to store the read data locally on the control computer.

[0081] Step 2.4: Change the interface connection between the network analyzer and the switch matrix, and change the control commands sent from the control computer to the switch matrix accordingly to ensure that the two interfaces connected to the network analyzer are in the conducting state. Repeat step 2.3 until all port combinations of the switch matrix instrument end and the device under test end have been tested.

[0082] Step 2.5: Reconstruct the test data of all network port combinations stored locally on the control computer into a transmission network matrix. The specific form of the matrix is ​​as follows:

[0083]

[0084] The network parameter matrix is ​​N. 2 The matrix has M rows and M columns, and the elements in the matrix are... The meaning is the insertion loss and non-folded phase of the Nth port of the instrument and the Nth row and Mth column port of the device under test when they are in conduction.

[0085] Wherein, insertion loss L refers to the ratio of the power received by the load connected to the output of a transmission network before and after the switching matrix is ​​inserted, and the unit is dB.

[0086] Non-folded phase This refers to the change in signal phase before and after a switch matrix is ​​inserted into a transmission network.

[0087] Step 3: Based on the test specifications of the device under test for this batch test task, select the test instruments required for the specification test, and use RF connectors, including but not limited to RF cables, RF coaxial connectors, waveguides, etc., to connect the input and output ports of the test instruments to the instrument end of the switch matrix, and connect the input and output ports of the device under test to the device under test end.

[0088] Specifically, step 3 includes:

[0089] Based on the test specifications of the device under test for this batch test task, select the test instruments required for the specification test, and connect the test instruments, the device under test, the switch matrix, and the control computer.

[0090] Commonly used instruments in RF device testing include signal generators, spectrum analyzers, and network analyzers. These instruments typically have N input / output ports, each connected to a port on the switch matrix instrument side. The RF signal input port of the device under test (DUT) is connected to a row of ports on the DUT side of the switch matrix, ensuring all DUT input ports are within the same switch group. The DUT output ports are connected to another row of ports on the switch matrix, ensuring that output ports are not simultaneously in the same switch group as input ports, and that all output ports are within the same switch group. Control cables connect the DUT to the control computer, and the test instruments, switch matrix, and control computer are connected to a switch via network cables.

[0091] Step 4: Connect the instruments and switch matrix used in the test task to the switch via network cable. Depending on the type of indicator test, the control computer uses automatic test software based on TCP / IP protocol to select different ports on the switch matrix instrument end and the device under test end to ensure that the input and output ports of the test instrument correspond one-to-one with the input and output ports of the device under test. According to the test method of different indicators, the control computer controls the signal output and shutdown of the test instrument according to the timing relationship. At the same time, the control computer sends data reading instructions to the test instrument and saves the test data locally.

[0092] Specifically, step 4 includes: the control computer using TCP / IP-based automatic testing software to send control commands to the switch matrix, the testing instrument, and the device under test (DUT), so that the output signal of the testing instrument can accurately flow to the input port of the DUT via the switch matrix, and the output signal of the DUT's output port can accurately flow to the signal input terminal of the testing instrument via the switch matrix, forming a closed loop of the test signal. The specific implementation is as follows:

[0093] Step 4.1: The control computer sends control commands to the switch according to the current test parameters, so that the port of the switch matrix instrument end used for test signal input and the port of the device under test used for signal output are in a conducting state, and the port of the switch matrix device under test end used for receiving the output signal of the device under test and the port of the instrument end used for output signal are in a conducting state.

[0094] Step 4.2: The control computer sends a control command to the device under test (DUT) so that the output port of the DUT to be tested is in the conducting state, and the test signal can be returned to the switch matrix via the DUT;

[0095] Step 4.3: The control computer sends a control command to the instrument that generates the test signal, causing the instrument to output the test signal. The test signal passes through the switch matrix and the device under test (DUT) before entering the test instrument used for signal analysis. The control computer sends a data read command to the test instrument to save the test data of the network analyzer and spectrum analyzer locally. Repeat steps 4.2 to 4.3 until all ports of the DUT are tested.

[0096] Step 5: Calculate the performance parameters of the device under test by combining the local test data from the control computer with the network parameter matrix of the switch matrix, thus completing this measurement task.

[0097] Specifically, step 5 includes: using test data and network parameter matrix to derive the calculation methods for the gain G and insertion loss L of the device under test (DUT), the insertion loss in the test data of the local network analyzer on the control computer is the sum of the insertion loss of the DUT and the switching matrix. The insertion loss L or gain G of each channel of the DUT is obtained by subtracting the insertion loss of the test data from the insertion loss of the corresponding port network parameters of the switching matrix. For a DUT with multiple channels, the amplitude consistency index between the channels of the DUT is obtained by subtracting the insertion loss L or gain G of the other channels of the DUT from that channel, using one channel of the DUT as a reference. Similarly, the non-folded phase of each channel of the DUT is obtained by subtracting the non-folded phase of the network analyzer test data from the corresponding port network parameters of the switching matrix. For a DUT with multiple channels, the phase consistency index between the channels of the DUT is obtained by subtracting the non-folded phase of the other channels of the DUT from that channel, using one channel of the DUT as a reference.

[0098] The power value measured by the local spectrum analyzer on the control computer is used to obtain the output power value of the device under test (DUT) by subtracting it from the insertion loss value of the corresponding port network parameters of the switch matrix. When a multi-channel device has a fixed channel in the conducting state, the power of each channel is measured. The difference between the power of the unselected channel and the power of the selected channel gives the isolation of the other channels relative to that channel. The channel of the DUT is then changed, and the power values ​​of each channel are measured again until all channels of the DUT are conducting. The difference between these values ​​and the switch matrix network parameters gives the isolation index between the channels of the DUT.

[0099] Insertion loss L refers to the reduction in signal power caused when an RF device is inserted into the signal transmission path, and is measured in dB.

[0100] Gain G refers to the degree to which an amplifier or other electronic component amplifies the power of an input signal. It describes the increase in energy of the output signal compared to the input signal, and is measured in dB.

[0101] Phase consistency refers to the phase difference between multiple channels of the same signal after passing through a certain radio frequency device;

[0102] Amplitude consistency refers to the power difference between multiple channels of the same signal after passing through a certain radio frequency device;

[0103] Isolation refers to the difference between the power of a signal leaking into other channels and the power of that channel when a signal passes through a certain channel of an RF device.

[0104] The present invention also provides a test system for RF device network parameters based on a switch matrix. The test system for RF device network parameters based on a switch matrix can be implemented by executing the process steps of the test method for RF device network parameters based on a switch matrix. That is, those skilled in the art can understand the test method for RF device network parameters based on a switch matrix as a preferred embodiment of the test system for RF device network parameters based on a switch matrix.

[0105] Example 2

[0106] According to the present invention, a test system for radio frequency device network parameters based on a switch matrix is ​​provided, such as... Figure 3 As shown, it includes:

[0107] Module M1: Control computer. Based on the different devices or indicators being tested in the batch testing task, it sends control commands to the switch matrix, testing instruments, and the device under test (DUT) according to the testing procedure. It also stores the test data returned by the instruments locally and calculates the various performance indicators of the DUT. The control computer mainly consists of a computer, network card, serial port control card, TTL control card, etc., including but not limited to the aforementioned control cards or communication cards. It can convert control commands into control signals based on serial communication standards such as TCP / IP protocol, RS232, RS485, and RS422. The switch matrix, DUT, and testing instruments respond to the control signals and execute corresponding actions.

[0108] Module M2: Switch, which is responsible for transmitting control command signals from the control computer to the test instruments and the switch matrix computer in the system, and transmitting test data read from the test instruments to the control computer, playing the role of relaying control commands and test data;

[0109] Module M3: Switch Matrix. It receives control commands from the control computer and adjusts the connection between the instrument port and the device under test (DUT) port accordingly to adapt to different DUTs or test parameters. The switch matrix mainly consists of electronic switches, a TTL control card, and a power supply. The TTL control card receives control commands via a network port, converts the TCP / IP-based control commands into TTL control signals, and transmits them to the individual electronic switches within the switch matrix via control cables. This enables the switch matrix to establish the connection between the corresponding instrument port and the DUT port according to the test requirements.

[0110] Module M4: Test instruments are mainly used to generate test signals and detect the output signal parameters of the device under test (DUT). These mainly include RF signal generators, spectrum analyzers, and network analyzers. The number and combination of instruments vary depending on the test task or test specifications, but include, but are not limited to, the instruments mentioned above. Specifically, the RF signal generator generates and outputs test signals with settable frequency and power; the spectrum analyzer detects the frequency domain information of the DUT's output signal; and the network analyzer is used for both generating test signals and analyzing the DUT's output signal to derive network parameters.

[0111] Module M5: Device Under Test (DUT), serving as the device under test in batch testing tasks. It receives control commands from the control computer to change the conduction state of each channel of the DUT, allowing the test signal to traverse all channels of the DUT. It monitors the power and phase of the DUT's output signal to complete the DUT test. In the test system, the DUT is connected to a switch matrix via an RF connector. The switch matrix responds to the control computer's control commands according to the signal flow of the measured DUT parameters, connecting the corresponding instrument and DUT ports. The DUT is suitable for RF devices with obtainable network parameters, including but not limited to amplifier gain, electronic switch insertion loss, and attenuation of attenuators.

[0112] Example 3

[0113] According to the present invention, a method for testing the network parameters of radio frequency devices based on a switch matrix is ​​provided. By sending control commands through a control computer, the connection relationship between the test instrument and the device under test is changed through the switch matrix during the test process, thereby completing the automatic testing of batch devices without manual intervention.

[0114] The method for testing the network parameters of radio frequency devices based on a switch matrix is ​​implemented by the following steps:

[0115] Step 1: Select the test instruments required for this batch testing task, connect the test instruments to the instrument end of the switch matrix using RF connectors, and connect the batch of devices under test to the device under test end of the switch matrix.

[0116] Step 2: Based on the test index type and the type of the device under test, preset the connection relationship between the test instrument port and the device under test port in the test software, and use the control computer to send control commands to the switch matrix to turn on the corresponding ports of the switch matrix according to the preset connection relationship;

[0117] Step 3: The control computer sends control commands to the testing instrument, the testing instrument responds to the test commands and transmits the test data back, and the control computer saves the data locally.

[0118] Step 4: The computer calculates the local test data to obtain various indicators of the tested component and saves the data.

[0119] Those skilled in the art will understand that, in addition to implementing the system, apparatus, and their modules provided by this invention in purely computer-readable program code, the same program can be implemented in the form of logic gates, switches, application-specific integrated circuits, programmable logic controllers, and embedded microcontrollers by logically programming the method steps. Therefore, the system, apparatus, and their modules provided by this invention can be considered a hardware component, and the modules included therein for implementing various programs can also be considered structures within the hardware component; alternatively, modules for implementing various functions can be considered both software programs implementing the method and structures within the hardware component.

[0120] Specific embodiments of the present invention have been described above. It should be understood that the present invention is not limited to the specific embodiments described above, and those skilled in the art can make various changes or modifications within the scope of the claims, which do not affect the essence of the present invention. Unless otherwise specified, the embodiments and features described in this application can be arbitrarily combined with each other.

Claims

1. A method of network parameter testing of a radio frequency device based on a switching matrix, characterized in that, The method comprises the following steps: Step S1: setting a switch matrix according to the number of test instruments and the number of ports of the measured device required by the batch test task; Step S2: sending a control command to the switch matrix through a control computer to select a certain port of the instrument end and a certain port of the measured device end of the switch matrix, connecting the output and input ports of the network analyzer to the selected instrument port and measured device port respectively, testing and recording the network parameters of the current port combination, repeating step S2 until the network parameters of all port combinations are tested and recorded to form a network parameter matrix of the switch matrix, and completing the network parameter self-calibration of the switch matrix; wherein the network parameters include insertion loss and non-folded phase; Step S3: selecting the test instruments required for index testing according to the test index of the measured device of the current batch test task, and connecting the input and output ports of the test instruments to the instrument end of the switch matrix, and connecting the input and output ports of the measured device to the measured device end of the switch matrix; Step S4: connecting the test instruments and the switch matrix used in the test task to the control computer respectively, selecting different ports of the instrument end and the measured device end of the switch matrix through the control computer according to different index test types, ensuring that the input and output ports of the test instruments correspond one-to-one with the input and output ports of the measured device, and controlling the signal output and shutdown of the test instruments according to the test method of different indexes and the time sequence relationship, and simultaneously sending a data reading instruction to the test instruments through the control computer to save the test data locally; Step S5: calculating the performance index parameters of the measured device based on the local test data of the control computer and the network parameter matrix of the switch matrix to complete the current measurement task.

2. The network parameter test method of a switch matrix based radio frequency device according to claim 1, characterized in that, The step S1 comprises: The switch matrix is ​​N×M, comprising instrument-side ports and device-under-test (DUT)-side ports. N represents the total number of instrument-side ports, indicating the total number of all input / output ports of the instruments that need to be connected simultaneously during the test task. M represents the number of ports per row on the DUT side, indicating the number of ports in each row of the switch matrix on the DUT side, and its value is not less than the number of DUT input ports, m. 输入 Or the number of output ports m 输出 The maximum value, i.e., M≥max{m 输入 ,m 输出 }; The inside of the instrument end port enters the switch matrix and is connected with N 1-to-N switches, the N 1-to-N switches are connected with N N-to-1 switches, then, the N N-to-1 switches are connected with N switch groups; wherein, the inside of the switch group integrates i-layer single-rod j-pole switches, so as to realize arbitrary conduction of the single-end port of the switch group and M=j i The inside of the switch matrix integrates N switch groups, so the instrument end port of the switch matrix has N*M ports.

3. The network parameter test method for a switch-matrix-based radio frequency device of claim 1, wherein, The step S2 comprises: Step S2.1: connecting the output and input ports of the network analyzer to a certain instrument end port and a certain measured device end port of the switch matrix through radio frequency connectors respectively; Step S2.2: Set the start frequency and stop frequency of the network analyzer according to the working frequency band of the switch matrix, and the measurement type is set to S 21 , the data format is logarithmic amplitude and non-folded phase; Step S2.2: sending a control signal to the switch matrix through the control computer to turn on the two ports connected to the network analyzer, and sending a data reading command to the network analyzer through the control computer to store the read data in the local control computer; Step S2.4: changing the interface connection relationship between the network analyzer and the switch matrix, and correspondingly changing the control command sent by the control computer to the switch matrix to ensure that the two interfaces connected to the network analyzer are in the on state, and repeating step S2.3 until all port combinations of the instrument end and the measured device end of the switch matrix are tested; Step S2.5: reconstructing all network port combination test data stored in the local control computer into a transmission network matrix, and the specific form of the matrix is as follows: The network parameter matrix is N 2 rows and M columns, and the elements in the matrix represent the insertion loss and non-folded phase of the Nth port on the instrument side and the Mth port in the Nth row on the DUT side in the on condition.

4. The network parameter test method for a switch-matrix-based radio frequency device according to claim 1, wherein, The step S3 comprises: the test instrument has N input and output ports, which are connected with the instrument end ports of the switch matrix one by one; the radio frequency signal input ports of the device to be tested are connected with a certain row of the switch matrix measured device end ports, so as to ensure that the input ports of the device to be tested are in the same switch group; the output ports of the device to be tested are connected with another row of the switch matrix measured device end ports, so as to ensure that the output ports and the input ports of the device to be tested are not in the same switch group, and the output ports are in the same switch group.

5. The network parameter test method for a switch matrix based radio frequency device of claim 1, wherein, The step S4 comprises: Step S4.1: sending a control instruction to the switch matrix through the control computer according to the current test index, so that the ports of the switch matrix instrument end for testing signal input and the ports of the measured device end for signal output are in the conductive state, and the ports of the switch matrix measured device end for receiving the output signal of the device to be tested and the ports of the instrument end for outputting the signal are in the conductive state; Step S4.2: sending a control instruction to the device to be tested through the control computer, so that the output port of the device to be tested is in the conductive state; Step S4.3: sending a control instruction to the test instrument for generating a test signal through the control computer, so that the test instrument outputs a test signal, the test signal enters the test instrument through the switch matrix and the device to be tested, and the control computer sends a data reading instruction to the test instrument, so that the test data of the network analyzer and the spectrum analyzer are saved locally; steps S4.2 to S4.3 are repeated to trigger until the test of all ports of the device to be tested is completed.

6. The network parameter test method of a switch matrix based radio frequency device according to claim 1, characterized in that, The step S5 comprises: Using the test data and the network parameter matrix to obtain the gain G and the insertion loss L of the device to be tested; The insertion loss in the local network analyzer test data of the control computer is the sum of the insertion loss of the device to be tested and the switch matrix; the insertion loss L or the gain G of each channel of the device to be tested is obtained by subtracting the insertion loss of the corresponding port network parameter of the switch matrix from the test data; for the device to be tested with multiple channels, the insertion loss L or the gain G of the remaining channels of the device to be tested is subtracted from the channel serving as the reference, so as to obtain the amplitude consistency index between the channels of the device to be tested; The non-folded phase of each channel of the device to be tested is obtained by subtracting the non-folded phase of the corresponding port network parameter of the switch matrix from the test data; for the device to be tested with multiple channels, the non-folded phase of the remaining channels is subtracted from the channel serving as the reference, so as to obtain the phase consistency index between the channels of the device to be tested; The power value in the local spectrum analyzer test data of the control computer is subtracted from the insertion loss value of the corresponding port network parameter of the switch matrix, so as to obtain the output power value of the device to be tested; in the case that a certain channel of the multi-channel device is in the conductive state, the power of each channel of the device is measured, and the power of the unselected channel is subtracted from the power of the selected channel, so as to obtain the isolation degree of the remaining channels of the device to be tested relative to the channel; the channel of the device to be tested is changed, and the power values of the channels are measured again until all the channels of the device to be tested are in the conductive state, and the isolation degree index between the channels of the device to be tested is obtained by subtracting the network parameter matrix of the switch matrix.

7. A network parameter test system for a radio frequency device based on a switching matrix, characterized in that It comprises: Module M1: according to the number of test instruments required by the batch test task and the number of DUT ports, the switch matrix is set; Module M2: through the control computer, control commands are sent to the switch matrix, which is used to select a certain port of the instrument end and a certain port of the DUT end of the switch matrix, and the output and input ports of the network analyzer are connected to the selected instrument port and DUT port respectively, the network parameters of the current port combination are tested and recorded, and the module M2 is repeatedly triggered until the network parameters of all port combinations are tested and recorded, forming a network parameter matrix of the switch matrix itself, and the network parameter self-calibration of the switch matrix is completed; wherein, the network parameters include: insertion loss and non-folded phase; Module M3: according to the test index of the DUT in the current batch test task, the test instrument required for index testing is selected, and the input and output ports of the test instrument are connected to the instrument end of the switch matrix, and the input and output ports of the DUT are connected to the DUT end of the switch matrix; Module M4: the test instruments used in the test task and the switch matrix are connected to the control computer respectively, different ports of the instrument end and the DUT end of the switch matrix are selected through the control computer according to different index test types, the input and output relationship between the input and output ports of the test instrument and the DUT port is ensured to be one-to-one corresponding, and the signal output and shutdown of the test instrument are controlled according to the time sequence relationship according to the test method of different indexes, and at the same time, the control computer sends data reading instructions to the test instrument, and the test data is saved locally; Module M5: based on the local test data of the control computer and the network parameter matrix of the switch matrix, the performance index parameters of the DUT are calculated, and the measurement task is completed.

8. A network parameter test system for a switched matrix based radio frequency device according to claim 7, characterized in that, The module M1 comprises: The switch matrix is ​​N×M, comprising instrument-side ports and device-under-test (DUT)-side ports. N represents the total number of instrument-side ports, indicating the total number of all input / output ports of the instruments that need to be connected simultaneously during the test task. M represents the number of ports per row on the DUT side, indicating the number of ports in each row of the switch matrix on the DUT side, and its value is not less than the number of DUT input ports, m. 输入 Or the number of output ports m 输出 The maximum value, i.e., M≥max{m 输入 ,m 输出 }; The inside of the instrument end port enters the switch matrix and is connected with N 1-to-N switches, the N 1-to-N switches are connected with N N-to-1 switches, then, the N N-to-1 switches are connected with N switch groups; wherein, the inside of the switch group integrates i-layer single-rod j-pole switches, so as to realize arbitrary conduction of the single-end port of the switch group and M=j i The inside of the switch matrix integrates N switch groups, so the instrument end port of the switch matrix has N*M ports. The module M2 comprises: Module M2.1: the output and input ports of the network analyzer are connected to a certain instrument end port and a certain DUT end port of the switch matrix through the RF connector respectively; Module M2.2: Set the start frequency and the stop frequency of the network analyzer according to the operating frequency band of the switch matrix, the measurement type is set to S 21 , the data format is log magnitude and non-folded phase; Module M2.2: through the control computer, control signals are sent to the switch matrix to turn on the two ports connected to the network analyzer, and data reading commands are sent to the network analyzer by the control computer to store the read data in the local control computer; Module M2.4: the interface connection relationship between the network analyzer and the switch matrix is changed, and the control commands sent by the control computer to the switch matrix are changed accordingly, so that the two interfaces connected to the network analyzer are in the on state, and the module M2.3 is repeatedly triggered until all port combinations of the instrument end and the DUT end of the switch matrix are tested; Module M2.5: all network port combination test data stored in the local control computer are reconstructed into a transmission network matrix, and the specific form of the matrix is as follows: The network parameter matrix is N 2 rows and M columns, and the elements in the matrix represent the insertion loss and non-folded phase of the Nth port on the instrument side and the Mth port in the Nth row on the DUT side in the on condition.

9. The switch matrix based network parameter test system for radio frequency devices of claim 7, wherein, The module M3 comprises: N input and output ports of the test instrument are connected with the instrument end ports of the switch matrix one by one; the radio frequency signal input ports of the device under test are connected with a certain row of the switch matrix device under test ports, so as to ensure that the input ports of the device under test are in the same switch group; the output ports of the device under test are connected with another row of the switch matrix device under test, so as to ensure that the output ports and the input ports of the device under test are not in the same switch group, and the output ports are in the same switch group; The module M4 comprises: Module M4.1: the control computer sends a control instruction to the switch matrix according to the current test index, so that the ports of the switch matrix instrument end for testing signal input and the ports of the device under test for signal output are in a conductive state, and the ports of the switch matrix device under test for receiving the output signal of the device under test and the ports of the instrument end for outputting the signal are in a conductive state; Module M4.2: the control computer sends a control instruction to the device under test, so that the output port of the device under test is in a conductive state; Module M4.3: the control computer sends a control instruction to the test instrument for generating a test signal, so that the test instrument outputs a test signal, the test signal enters the test instrument through the switch matrix and the device under test, and the control computer sends a data reading instruction to the test instrument, so that the test data of the network analyzer and the spectrum analyzer are saved locally; the modules M4.2 to M4.3 are repeatedly triggered until the test of all ports of the device under test is completed.

10. The switch matrix based network parameter test system for radio frequency devices of claim 7, wherein, The module M5 comprises: The test data and the network parameter matrix are used to obtain the gain G and the insertion loss L of the device under test; The insertion loss in the local network analyzer test data of the control computer is the sum of the insertion loss of the device under test and the switch matrix; the insertion loss L or the gain G of each channel of the device under test is obtained by subtracting the insertion loss of the corresponding port network parameters of the test data and the switch matrix; for the device under test with multiple channels, the insertion loss L or the gain G of the remaining channels of the device under test is subtracted from a certain channel of the device under test, so as to obtain the amplitude consistency index between each channel of the device under test; The non-folded phase of the corresponding port network parameters of the test data and the switch matrix is subtracted to obtain the non-folded phase of each channel of the device under test; for the device under test with multiple channels, the non-folded phase of the remaining channels is subtracted from a certain channel of the device under test, so as to obtain the phase consistency index between each channel of the device under test; The test data of the local spectrum analyzer of the control computer is a power value, and the insertion loss value of the corresponding port network parameters of the switch matrix is subtracted to obtain the output power value of the device under test; in the case that a certain channel of the multi-channel device is in a conductive state, the power of each channel of the device is measured, and the power of the unselected channel is subtracted from the power of the selected channel, so as to obtain the isolation degree of the remaining channels of the device under test relative to the channel; the conductive channel of the device under test is changed, and the power values of each channel are measured again until all channels of the device under test are in a conductive state, and the isolation degree index between each channel of the device under test is obtained by subtracting the network parameter matrix of the switch matrix.

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