Device reliability test method, system and electronic device

Abstract

The application discloses a device reliability test method and system and electronic equipment, and relates to the nuclear fusion technical field. The method comprises the following steps: obtaining a first magnetic field strength of a first steady magnetic field and a second magnetic field strength of a first transient magnetic field according to the installation position of a to-be-tested device, wherein the first steady magnetic field and the first transient magnetic field are both magnetic fields generated by a nuclear fusion device at the installation position; obtaining a magnetic field strength threshold value according to the first magnetic field strength or the second magnetic field strength; and performing reliability test on the to-be-tested device according to the magnetic field strength threshold value, and obtaining a reliability test result. Thus, the reliability of the device in the nuclear fusion environment can be tested.

Description

Technical Field

[0001] This invention relates to the field of nuclear fusion technology, and in particular to a method, system and electronic equipment for testing equipment reliability. Background Technology

[0002] Physical protective equipment in a nuclear fusion environment includes access control systems, intrusion detection systems, and video detection systems. Examples include iris recognition devices, electronic locks, access controllers, vibration fiber optic detectors, dual-technology detectors, laser scanning detectors, and alarm controllers. In a nuclear fusion environment, physical protective equipment is used to safeguard nuclear materials, preventing unauthorized contact and damage, and plays a crucial role in nuclear safety.

[0003] However, due to the extreme nature of the nuclear fusion environment, equipment used in such environments is prone to failure. Therefore, reliability testing is required to ensure that the equipment can function properly in a nuclear fusion environment. Summary of the Invention

[0004] This invention aims to at least partially address one of the technical problems in related technologies. Therefore, the first objective of this invention is to provide a method for testing the reliability of equipment in a nuclear fusion environment.

[0005] The second objective of this invention is to provide an electronic device.

[0006] The third objective of this invention is to provide a device reliability testing system.

[0007] To achieve the above objectives, a first aspect of the present invention provides a device reliability testing method, the method comprising: obtaining a first magnetic field strength of a first steady-state magnetic field and a second magnetic field strength of a first transient magnetic field based on the installation location of the device under test, wherein the steady-state magnetic field and the transient magnetic field are both magnetic fields generated by a nuclear fusion device at the installation location; obtaining a magnetic field strength threshold based on the first magnetic field strength or the second magnetic field strength; and performing a reliability test on the device under test based on the magnetic field strength threshold to obtain a reliability test result.

[0008] In addition, the equipment reliability testing method according to embodiments of the present invention may also have the following additional technical features:

[0009] According to one embodiment of the present invention, the magnetic field strength threshold is obtained based on the first magnetic field strength. The step of performing a reliability test on the device under test (DUT) based on the magnetic field strength threshold to obtain a reliability test result includes: applying a second steady-state magnetic field to the DUT based on a first preset magnetic field strength, and obtaining a first operating state of the DUT; when the first operating state is a normal state, and the first preset magnetic field strength is less than or equal to the magnetic field strength threshold, increasing the first preset magnetic field strength by a first preset value to obtain a new first preset magnetic field strength, and returning to the step of applying the second steady-state magnetic field to the DUT based on the first preset magnetic field strength; when the first operating state is a normal state, and the first preset magnetic field strength is greater than the magnetic field strength threshold, determining that the reliability test result is a pass; when the first operating state is a fault state, determining that the reliability test result is a fail.

[0010] According to one embodiment of the present invention, the magnetic field strength threshold is obtained based on the second magnetic field strength. The step of performing a reliability test on the device under test (DUT) based on the magnetic field strength threshold to obtain a reliability test result includes: applying a second transient magnetic field to the DUT based on a second preset magnetic field strength, and acquiring a second operating state of the DUT; when the second operating state is a normal state and the second preset magnetic field strength is less than or equal to the magnetic field strength threshold, increasing the second preset magnetic field strength by a second preset value to obtain a new second preset magnetic field strength, and returning to the step of applying the second transient magnetic field to the DUT based on the second preset magnetic field strength; when the second operating state is a normal state and the second magnetic field strength is greater than the magnetic field strength threshold, determining that the reliability test result is a pass; when the second operating state is a fault state, determining that the reliability test result is a fail.

[0011] According to one embodiment of the present invention, the magnetic field strength threshold is obtained based on the first magnetic field strength. The step of performing a reliability test on the device under test (DUT) based on the magnetic field strength threshold to obtain a reliability test result includes: applying a third steady-state magnetic field to the DUT based on a third preset magnetic field strength, and obtaining a third operating state of the DUT; when the third operating state is a normal state, increasing the third preset magnetic field strength by a third preset value to obtain a new third preset magnetic field strength, and returning to the step of applying the third steady-state magnetic field to the DUT based on the third preset magnetic field strength; when the third operating state is a fault state, if the third preset magnetic field strength is greater than the magnetic field strength threshold, then the reliability test result is determined to be a pass test; when the third operating state is a fault state, if the third preset magnetic field strength is less than the magnetic field strength threshold, then the reliability test result is determined to be a fail test.

[0012] According to one embodiment of the present invention, when the reliability test result is a failure, the method further includes: installing a magnetic field shielding device on the device under test.

[0013] According to one embodiment of the present invention, the second magnetic field strength is the peak value of the magnetic field strength of the first transient magnetic field.

[0014] According to one embodiment of the present invention, the method further includes: applying a fourth steady-state magnetic field to the device under test (DUT) on which the magnetic field shielding device is installed based on the magnetic saturation intensity, and obtaining a fourth operating state of the DUT, wherein the magnetic saturation intensity is the third preset magnetic field intensity when the third operating state is a fault state; when the fourth operating state is a fault state, determining that the reliability test result is a failed test; when the fourth operating state is a normal state, determining that the reliability test result is a passed test.

[0015] According to one embodiment of the present invention, obtaining the first magnetic field strength of the first steady-state magnetic field and the second magnetic field strength of the first transient magnetic field based on the installation position of the device under test includes: obtaining a position-magnetic field strength correspondence based on the installation position of the nuclear fusion device; and substituting the installation position of the device under test into the position-magnetic field strength correspondence to obtain the first magnetic field strength and the second magnetic field strength.

[0016] To achieve the above objectives, a second aspect of the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the computer program is executed by the processor, it implements the above-described device reliability testing method.

[0017] To achieve the above objectives, a third aspect of the present invention provides a device reliability testing system, including the aforementioned electronic equipment.

[0018] According to the device reliability testing method, system, and electronic equipment of the present invention, a first magnetic field strength of a first steady-state magnetic field and a second magnetic field strength of a first transient magnetic field are obtained based on the installation location of the device under test. Both the steady-state magnetic field and the transient magnetic field are magnetic fields generated by the nuclear fusion device at the installation location. Reliability testing is performed on the device under test based on a magnetic field strength threshold to obtain the reliability test results. Therefore, the reliability of the device under a nuclear fusion environment can be tested.

[0019] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0020] Figure 1This is a flowchart of a device reliability testing method according to an embodiment of the present invention;

[0021] Figure 2 This is a schematic diagram of a test device under test, as an example of the present invention;

[0022] Figure 3 This is a schematic diagram of a test device under test, which is another example of the present invention;

[0023] Figure 4 This is a structural block diagram of an electronic device according to an embodiment of the present invention;

[0024] Figure 5 This is a structural block diagram of the equipment reliability testing system according to an embodiment of the present invention. Detailed Implementation

[0025] The following description of a device reliability testing method, system, and electronic device according to embodiments of the present invention is based on the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described with reference to the accompanying drawings are exemplary and should not be construed as limiting the present invention.

[0026] Figure 1 This is a flowchart of a device reliability testing method according to an embodiment of the present invention.

[0027] like Figure 1 As shown, the equipment reliability testing method includes:

[0028] S11, the first magnetic field strength of the first steady-state magnetic field and the second magnetic field strength of the first transient magnetic field are obtained according to the installation position of the device under test. The first steady-state magnetic field and the first transient magnetic field are both magnetic fields generated by the nuclear fusion device at the installation position.

[0029] Specifically, the biggest difference between a nuclear fusion environment and other environments such as nuclear fission environments is that when a nuclear fusion device is running, its internal components, such as the magnet system and the high-voltage power supply system, generate a huge magnetic field, which can easily interfere with electronic equipment around the nuclear fusion device.

[0030] Therefore, in order to ensure that the electronic equipment around the nuclear fusion device can operate normally, it is necessary to conduct reliability tests on the equipment around the nuclear fusion device.

[0031] To conduct reliability testing on the device under test (DUT), it is necessary to place the DUT in a nuclear fusion environment. However, due to the high cost of nuclear fusion devices, it is necessary to simulate the magnetic field surrounding the device under test in order to better test it.

[0032] Since the magnetic field environment around a nuclear fusion device varies at different locations when the device generates a magnetic field, it is necessary to obtain the installation location of the device under test in order to better simulate the magnetic field applied by the device to the test. This installation location is the location where the device is actually operating.

[0033] Once the installation location of the device under test is obtained, the magnetic field generated by the nuclear fusion device at the installation location of the device under test can be obtained.

[0034] As an example, the installation location of the device under test (DUT) and the installation location of the nuclear fusion device can be obtained. Based on the installation locations of the DUT and the nuclear fusion device, the magnetic field strength of the magnetic field generated by the nuclear fusion device at the DUT's installation location can be obtained. The installation location of the nuclear fusion device refers to the location where the nuclear fusion device is actually operating.

[0035] As another example, the magnetic field strength at different locations around the nuclear fusion device can be measured. Then, after obtaining the installation location of the device under test, the magnetic field strength generated by the nuclear fusion device at the installation location of the device under test can be obtained.

[0036] As another example, the installation location of the nuclear fusion device can be obtained, and a position-magnetic field strength correspondence can be derived based on this location. Substituting the installation location of the device under test into this correspondence yields the first and second magnetic field strengths. This position-magnetic field strength correspondence, derived from the installation location of the nuclear fusion device, can be obtained by considering the installation location, magnetic field attenuation, and the magnetic field generated by the device to determine the magnetic field strength at different locations around the device, thus achieving the aforementioned position-magnetic field strength correspondence.

[0037] The first steady-state magnetic field is the magnetic field generated during the steady-state operation of the nuclear fusion device. The nuclear fusion device generates a magnetic field with a stable magnetic field strength during steady-state operation. Therefore, the magnetic field strength of the first steady-state magnetic field is stable and will only adjust the magnitude of the magnetic field strength according to the state of the plasma.

[0038] The aforementioned first transient magnetic field is the magnetic field generated when an accident or abnormal operating condition occurs during the operation of a nuclear fusion device. This is due to the need to release the magnet current instantaneously, causing a huge change in the magnetic field strength. The magnetic field change time is only on the order of milliseconds.

[0039] The aforementioned second magnetic field strength is the peak value of the first transient magnetic field. The aforementioned nuclear fusion device is a device capable of generating a magnetic field at the installation location of the device under test.

[0040] S12, obtain the magnetic field strength threshold based on the first magnetic field strength or the second magnetic field strength.

[0041] Specifically, after obtaining the first magnetic field strength of the first steady-state magnetic field and the second magnetic field strength of the first transient magnetic field generated by the nuclear fusion device at the installation location of the device under test, a magnetic field strength threshold can be obtained based on the first magnetic field strength or the second magnetic field strength, so as to test the device under test according to the magnetic field strength threshold.

[0042] Specifically, when testing the impact of the first steady-state magnetic field generated by the nuclear fusion device on the device under test, the first magnetic field strength can be amplified by a certain value (e.g., amplified by 20%) to obtain a magnetic field strength threshold. Similarly, when testing the impact of the first transient magnetic field generated by the nuclear fusion device on the device under test, the second magnetic field strength can be amplified by a certain value (e.g., amplified by 20%) to obtain a magnetic field strength threshold. By amplifying the first and second magnetic field strengths to obtain the magnetic field strength threshold, the testing environment can be made more extreme than the actual operating environment of the device under test, thus leaving a safety margin and better enabling reliability testing of the device under test.

[0043] S13, perform reliability testing on the device under test based on the magnetic field strength threshold, and obtain the reliability test results.

[0044] Specifically, after determining the magnetic field strength threshold, the device under test (DUT) can be powered on to put it into normal working condition. The DUT is then placed in the magnetic field generating device, which generates a magnetic field based on the magnetic field strength threshold. The device under test is then monitored to see if it can work normally in the magnetic field generated by the magnetic field generating device, thereby obtaining the reliability test results of the DUT.

[0045] See Figure 2 The specific embodiments shown are in Figure 2 In this process, the device under test (DUT) is the physical protection device (i.e., the physical protection device). The magnetic field generating device consists of a magnetic field generator and a device housing. The DUT is placed in the magnetic field generator, which generates a magnetic field to make the DUT a test device (EUT), thus obtaining the reliability test results of the physical protection device.

[0046] This allows for the testing of the equipment's reliability in a nuclear fusion environment.

[0047] In some embodiments of the present invention, the magnetic field strength threshold is obtained based on a first magnetic field strength. The reliability test of the device under test is performed based on the magnetic field strength threshold to obtain a reliability test result, including: applying a second steady-state magnetic field to the device under test based on a first preset magnetic field strength, and obtaining a first operating state of the device under test; when the first operating state is a normal state and the first preset magnetic field strength is less than or equal to the magnetic field strength threshold, increasing the first preset magnetic field strength by a first preset value to obtain a new first preset magnetic field strength, and returning to the step of applying the second steady-state magnetic field to the device under test based on the first preset magnetic field strength; when the first operating state is a normal state and the first preset magnetic field strength is greater than the magnetic field strength threshold, determining the reliability test result as a pass; when the first operating state is a fault state, determining the reliability test result as a fail.

[0048] Specifically, when applying a stable magnetic field to the device under test (DUT) according to the first preset magnetic field strength, the DUT needs to operate stably for a period of time before observing and recording its first operating state. This first operating state can indicate whether the DUT's functions are complete.

[0049] The above-mentioned application of a second steady-state magnetic field to the device under test based on the first preset magnetic field strength can be achieved by setting the magnetic field strength of the second steady-state magnetic field to the first preset magnetic field strength.

[0050] The above method for determining whether the device under test (DUT) is in a normal or faulty state can be as follows: if no abnormality is found in the function of the DUT and no signal lag is found, the DUT can be considered to be in a normal state; if the function of the DUT is abnormal or a signal lag is found, the DUT can be considered to be in a faulty state.

[0051] This allows for rapid and accurate reliability testing of the equipment under test.

[0052] However, the method for reliability testing of the device under test based on the magnetic field strength threshold in the above embodiments can quickly and accurately test the reliability of the device under test, but it can only test the reliability of the device under test itself. In practical applications, there may be situations where the devices around the nuclear fusion device are equipped with magnetic field shielding devices. For example, the devices around the nuclear fusion device may be installed in a shielding armor, which may be a shielding box made of a high magnetic permeability material.

[0053] Since using magnetic field shielding equipment increases costs, and magnetic field shielding equipment does not necessarily guarantee the safety of the device under test (DUT), in some embodiments of this invention, the magnetic field strength threshold is obtained based on a first magnetic field strength. The DUT is then subjected to a reliability test based on this magnetic field strength threshold to obtain a reliability test result. This includes: applying a third steady-state magnetic field to the DUT based on a third preset magnetic field strength and obtaining the third operating state of the DUT; when the third operating state is normal, increasing the third preset magnetic field strength by a third preset value to obtain a new third preset magnetic field strength, and returning to the step of applying the third steady-state magnetic field to the DUT based on the third preset magnetic field strength; when the third operating state is faulty, if the third preset magnetic field strength is greater than the magnetic field strength threshold, the reliability test result is determined to be a pass; when the third operating state is faulty, if the third preset magnetic field strength is less than the magnetic field strength threshold, the reliability test result is determined to be a fail.

[0054] The above-mentioned application of a third steady-state magnetic field to the device under test based on a third preset magnetic field strength can be achieved by setting the magnetic field strength of the third steady-state magnetic field to the third preset magnetic field strength.

[0055] The above method for determining whether the device under test (DUT) is in a normal or faulty state can be as follows: if no abnormality is found in the function of the DUT and no signal lag is found, the DUT can be considered to be in a normal state; if the function of the DUT is abnormal or a signal lag is found, the DUT can be considered to be in a faulty state.

[0056] The following description uses a specific example.

[0057] In this specific embodiment, the initial value of the third preset magnetic field strength is 10 Gs.

[0058] Specifically, the connected protective device is placed in the magnetic field generating device to generate a third steady-state magnetic field with a magnetic field strength of 10 Gs for the protective device. At the same time, a Hall effect meter is used to test the magnetic field strength at the location of the device, and the device is kept in steady state for 1 hour. The integrity of the protective device's function is observed and recorded to obtain the third working state.

[0059] Adjust the orientation of the device under test so that it can be tested in the X, Y, and Z directions to ensure the completeness of the test. Here, X, Y, and Z refer to the X, Y, and Z directions, which are coordinate axes in a pre-defined coordinate system.

[0060] The magnetic field strength is continuously increased by 10 Gs each time. At the same time, a Hall effect meter is used to test the magnetic field strength at the location of the equipment. The equipment is kept in steady state for 1 hour. The integrity of the protective equipment function is observed and recorded until the protective equipment function is found to be abnormal or the equipment signal is found to be lagging. At this time, it is indicated that the third working state is a fault state, that is, the protective equipment is in a magnetic saturation state. The current third preset magnetic field strength is recorded to obtain the magnetic saturation strength.

[0061] If the magnetic saturation intensity is greater than the magnetic field strength threshold, the reliability test result is determined to be a pass; if the magnetic saturation intensity is less than the magnetic field strength threshold, the reliability test result is determined to be a fail.

[0062] When the reliability test result is a failure, the equipment reliability test method also includes: installing a magnetic field shielding device on the device under test.

[0063] This allows for reliability testing of the equipment under test, and determines whether magnetic field shielding is necessary based on the test results, thus balancing equipment reliability and cost.

[0064] Furthermore, after installing a magnetic field shielding device on the device under test, the device reliability test method also includes: applying a fourth steady-state magnetic field to the device under test with the installed magnetic field shielding device according to the magnetic saturation intensity, and obtaining the fourth operating state of the device under test, wherein the magnetic saturation intensity is the third preset magnetic field intensity when the third operating state is a fault state; when the fourth operating state is a fault state, the reliability test result is determined to be a failed test; when the fourth operating state is a normal state, the reliability test result is determined to be a passed test.

[0065] The above-mentioned application of a fourth steady-state magnetic field to the device under test with a magnetic field shielding device based on the magnetic saturation intensity can be achieved by setting the magnetic field intensity of the fourth steady-state magnetic field to the magnetic saturation intensity.

[0066] The above method for determining whether the device under test (DUT) is in a normal or faulty state can be as follows: if no abnormality is found in the function of the DUT and no signal lag is found, the DUT can be considered to be in a normal state; if the function of the DUT is abnormal or a signal lag is found, the DUT can be considered to be in a faulty state.

[0067] The following description uses a specific example.

[0068] Specifically, the connected protective device is placed in the magnetic field generating device, and the magnetic field is increased to the point of failure. At the same time, a Hall effect meter is used to test the magnetic field strength at the location of the device, and the device is kept in steady state for 1 hour. The integrity of the protective device's function is observed and recorded.

[0069] Adjust the orientation of the device under test so that it can be tested in the X, Y, and Z directions to ensure the completeness of the test.

[0070] Since, theoretically, when the magnetic field strength is at the aforementioned magnetic saturation strength after adding the magnetic field shielding device, the fourth operating state of the device under test must be in a normal state, that is, the device under test will not malfunction or the device signal will lag. Therefore, after applying a magnetic field to the device under test with the magnetic field shielding device based on the magnetic saturation strength, if the fourth operating state is a fault state, the reliability test result is determined to be a failure test, and if the fourth operating state is a normal state, the reliability test result is determined to be a pass test.

[0071] Alternatively, after installing a magnetic field shielding device on the device under test (DUT), the reliability testing method further includes: applying a fifth steady-state magnetic field to the DUT with the installed magnetic field shielding device according to a fourth preset magnetic field strength, and obtaining the fifth operating state of the DUT; when the fifth operating state is a normal state, and the fourth preset magnetic field strength is less than or equal to the magnetic saturation strength, increasing the fourth preset magnetic field strength by a fourth preset value to obtain a new fourth preset magnetic field strength, and then applying the fifth steady-state magnetic field to the DUT with the installed magnetic field shielding device according to the fourth preset magnetic field strength, wherein the magnetic saturation strength is the third preset magnetic field strength when the third operating state is a fault state; when the fifth operating state is a normal state, and the fourth preset magnetic field strength is greater than or equal to the magnetic saturation strength, determining the reliability test result as a pass; when the fifth operating state is a fault state, determining the reliability test result as a fail.

[0072] Therefore, by obtaining the magnetic saturation intensity and testing the magnetic field of the magnetic field shielding device based on the magnetic saturation intensity, the reliability of the device under test with the magnetic field shielding device can be guaranteed.

[0073] In some embodiments of the present invention, the magnetic field strength threshold is obtained based on a second magnetic field strength. A reliability test is performed on the device under test based on the magnetic field strength threshold to obtain a reliability test result. This includes: applying a second transient magnetic field to the device under test based on a second preset magnetic field strength, and acquiring a second operating state of the device under test; when the second operating state is a normal state and the second preset magnetic field strength is less than or equal to the magnetic field strength threshold, increasing the second preset magnetic field strength by a second preset value to obtain a new second preset magnetic field strength, and returning to the step of applying the second transient magnetic field to the device under test based on the second preset magnetic field strength; when the second operating state is a normal state and the second magnetic field strength is greater than the magnetic field strength threshold, determining the reliability test result as a pass; and when the second operating state is a fault state, determining the reliability test result as a fail.

[0074] The above method for determining whether the device under test (DUT) is in a normal or faulty state can be as follows: if no abnormality is found in the function of the DUT and no signal lag is found, the DUT can be considered to be in a normal state; if the function of the DUT is abnormal or a signal lag is found, the DUT can be considered to be in a faulty state.

[0075] The following description uses a specific example.

[0076] In this specific embodiment, the peak value of the second transient magnetic field is a second preset magnetic field strength. That is, applying the second transient magnetic field to the device under test based on the second preset magnetic field strength can be achieved by setting the peak value of the second transient magnetic field to the second preset magnetic field strength. The initial value of the second preset magnetic field strength is 50 Gs, the second preset value is 20 Gs, and the device under test is a protective device.

[0077] Specifically, the connected protective device is placed inside the magnetic field generating device. See also Figure 3 A standard 50Hz power frequency magnetic field generator was used to generate a magnetic field with a strength of 50 Gs. This means the peak strength of the second transient magnetic field generated by the power frequency magnetic field generator was 50 Gs. The power frequency magnetic field generator needed to increase the magnetic field strength to 50 Gs within milliseconds to simulate the second transient magnetic field. Simultaneously, a Hall effect meter was used to test the magnetic field strength at the location of the device under test and maintained stable operation for 5 minutes. The integrity of the device's functions was observed and recorded to obtain the second operating state of the device.

[0078] Adjust the orientation of the device under test so that it can be tested in the X, Y, and Z directions to ensure the completeness of the test.

[0079] While keeping the frequency constant, the magnetic field strength is continuously increased by 20 Gs each time. At the same time, a Hall effect meter is used to test the magnetic field strength at the location of the equipment. The equipment is kept in steady state for 5 minutes. The integrity of the protective equipment function is observed and recorded to obtain the second working state of the protective equipment. This continues until the protective equipment function is found to be abnormal or the equipment signal is found to be lagging. At this time, it is indicated that the electronic components inside the protective equipment are broken down by induced current and fail. The second working state is determined to be a fault state, and the current magnetic field change rate is recorded.

[0080] exist Figure 3 The magnetic field generating equipment includes a power frequency magnetic field generator, a magnetic field coil, and a GRP (Glass Reinforced Plastic) substrate. The power frequency magnetic field generator is powered by AC 220V / 50Hz. The EUT is mounted on a 0.1-meter-thick insulating support.

[0081] In some embodiments of the present invention, after the second working state is a fault state, the device under test is disassembled, the faulty electronic components (such as burnt-out electronic components) in the device under test are identified, and the faulty electronic components are tested to analyze the cause of the damage, thereby improving the service life of the device under test.

[0082] In summary, the device reliability testing method of this invention obtains a first magnetic field strength of a first steady-state magnetic field and a second magnetic field strength of a first transient magnetic field based on the installation location of the device under test, wherein both the first steady-state magnetic field and the first transient magnetic field are magnetic fields generated by the nuclear fusion device at the installation location; a magnetic field strength threshold is obtained based on the first magnetic field strength or the second magnetic field strength; and a reliability test is performed on the device under test based on the magnetic field strength threshold to obtain the reliability test result. Therefore, it is possible to test the reliability of the device in a nuclear fusion environment.

[0083] Furthermore, the present invention proposes an electronic device.

[0084] Figure 4 This is a structural block diagram of an electronic device according to an embodiment of the present invention.

[0085] like Figure 4 As shown, the electronic device 500 includes a processor 501 and a memory 503. The processor 501 and the memory 503 are connected, for example, via a bus 502. Optionally, the electronic device 500 may also include a transceiver 504. It should be noted that in practical applications, the transceiver 504 is not limited to one type, and the structure of this electronic device 500 does not constitute a limitation on the embodiments of the present invention.

[0086] Processor 501 may be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It can implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this invention. Processor 501 may also be a combination that implements computational functions, such as including one or more microprocessor combinations, a combination of a DSP and a microprocessor, etc.

[0087] Bus 502 may include a pathway for transmitting information between the aforementioned components. Bus 502 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, etc. Bus 502 can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 4 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0088] The memory 503 stores a computer program corresponding to the device reliability testing method of the above embodiments of the present invention. This computer program is controlled and executed by the processor 501. The processor 501 executes the computer program stored in the memory 503 to implement the content shown in the foregoing method embodiments.

[0089] in, Figure 4 The electronic device 500 shown is merely an example and should not be construed as limiting the functionality and scope of use of the embodiments of the present invention.

[0090] The electronic device of this invention, by implementing the device reliability testing method of the above embodiments, can test the reliability of the device in a nuclear fusion environment.

[0091] Furthermore, this invention proposes a device reliability testing system.

[0092] Figure 5 This is a structural block diagram of the equipment reliability testing system according to an embodiment of the present invention.

[0093] like Figure 5 As shown, the equipment reliability testing system 10 includes the aforementioned electronic equipment 500.

[0094] The device reliability testing system of this invention, through the electronic equipment described in the above embodiments, can test the reliability of devices in a nuclear fusion environment.

[0095] It should be noted that the logic and / or steps represented in the flowchart or otherwise described herein can be considered as a ordered list of executable instructions for implementing logical functions, which can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Alternatively, the computer-readable medium may be paper or other suitable media on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in a computer memory.

[0096] It should be understood that various parts of the present invention can be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0097] In the description of this specification, references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0098] In the description of this specification, the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and should not be construed as limiting the present invention.

[0099] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0100] In this specification, unless otherwise stated, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly defined. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0101] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0102] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A method for testing equipment reliability, characterized in that, The method includes: The first magnetic field strength of the first steady-state magnetic field and the second magnetic field strength of the first transient magnetic field are obtained based on the installation location of the device under test. The first steady-state magnetic field and the first transient magnetic field are both magnetic fields generated by the nuclear fusion device at the installation location. The magnetic field strength threshold is obtained based on the first magnetic field strength or the second magnetic field strength; The reliability test results are obtained by performing a reliability test on the device under test based on the magnetic field strength threshold. The step of obtaining the magnetic field strength threshold based on the first magnetic field strength or the second magnetic field strength includes: The magnetic field strength threshold is obtained by amplifying either the first magnetic field strength or the second magnetic field strength. The magnetic field strength threshold is obtained based on the first magnetic field strength. The process of performing a reliability test on the device under test based on the magnetic field strength threshold to obtain a reliability test result includes: A third steady-state magnetic field is applied to the device under test according to a third preset magnetic field strength, and the third working state of the device under test is obtained; When the third working state is the normal state, the third preset magnetic field strength is increased by a third preset value to obtain a new third preset magnetic field strength, and the process returns to the step of applying a third steady-state magnetic field to the device under test according to the third preset magnetic field strength. When the third working state is a fault state, if the third preset magnetic field strength is greater than the magnetic field strength threshold, then the reliability test result is determined to be a pass test. When the third working state is a fault state, if the third preset magnetic field strength is less than the magnetic field strength threshold, then the reliability test result is determined to be a failure test. When the reliability test result is a failure, the method further includes: Install a magnetic field shielding device on the device under test; The method further includes: A fourth steady-state magnetic field is applied to the device under test (DUT) with the magnetic field shielding device installed based on the magnetic saturation intensity, and the fourth operating state of the DUT is obtained, wherein the magnetic saturation intensity is the third preset magnetic field intensity when the third operating state is a fault state; When the fourth operating state is a fault state, the reliability test result is determined to be a failed test; When the fourth working state is the normal state, the reliability test result is determined to be a pass.

2. The equipment reliability testing method according to claim 1, characterized in that, The magnetic field strength threshold is obtained based on the first magnetic field strength. The process of performing a reliability test on the device under test based on the magnetic field strength threshold to obtain a reliability test result includes: A second steady-state magnetic field is applied to the device under test according to a first preset magnetic field strength, and the first working state of the device under test is obtained; When the first working state is normal, and the first preset magnetic field strength is less than or equal to the magnetic field strength threshold, the first preset magnetic field strength is increased by a first preset value to obtain a new first preset magnetic field strength, and the process returns to the step of applying a second steady-state magnetic field to the device under test according to the first preset magnetic field strength. When the first working state is normal and the first preset magnetic field strength is greater than the magnetic field strength threshold, the reliability test result is determined to be a pass test. When the first operating state is a fault state, the reliability test result is determined to be a failed test.

3. The equipment reliability testing method according to claim 1, characterized in that, The magnetic field strength threshold is obtained based on the second magnetic field strength. The process of performing a reliability test on the device under test based on the magnetic field strength threshold to obtain a reliability test result includes: A second transient magnetic field is applied to the device under test according to a second preset magnetic field strength, and the second operating state of the device under test is obtained; When the second working state is normal, and the second preset magnetic field strength is less than or equal to the magnetic field strength threshold, the second preset magnetic field strength is increased by a second preset value to obtain a new second preset magnetic field strength, and the process returns to the step of applying a second transient magnetic field to the device under test according to the second preset magnetic field strength. When the second working state is normal and the second magnetic field strength is greater than the magnetic field strength threshold, the reliability test result is determined to be a pass. When the second operating state is a fault state, the reliability test result is determined to be a failed test.

4. The equipment reliability testing method according to claim 1, characterized in that, The second magnetic field strength is the peak magnetic field strength of the first transient magnetic field.

5. The equipment reliability testing method according to claim 1, characterized in that, The process of obtaining the first magnetic field strength of the first steady-state magnetic field and the second magnetic field strength of the first transient magnetic field based on the installation location of the device under test includes: The position-magnetic field strength correspondence is obtained based on the installation location of the nuclear fusion device; By substituting the installation location of the device under test into the position-magnetic field strength correspondence, the first magnetic field strength and the second magnetic field strength are obtained.

6. An electronic device, characterized in that, It includes a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the computer program is executed by the processor, it implements the device reliability testing method according to any one of claims 1-5.

7. A device reliability testing system, characterized in that, Includes the electronic device according to claim 6.

Images