Radio frequency chip high-frequency signal test probe station

Abstract

The invention relates to the technical field of chip testing, and particularly discloses a radio frequency chip high-frequency signal testing probe station which comprises a tester body and a detection frame, a piston rod is slidably connected to an inner cavity of the tester body, an air cylinder is arranged at the top end of the tester body and slidably connected with the piston rod, and a first connecting plate is fixedly installed at the bottom end of the piston rod; the clamping assembly has a buffering effect while limiting the chip, a stable supporting effect can be provided during normal testing, when the probe is pressed down excessively, stable supporting is changed into flexible supporting, an alarm is given, the radio frequency chip is prevented from being subjected to large pressure in the process of being in contact with the probe, and the reliability of the radio frequency chip is improved. Through the positioning assembly, the accuracy of the position of the probe can be ensured during testing, and when the position of the probe and the position of the chip deviate relatively, the relative deviation can be found in time and an alarm is given, so that subsequent maintenance is facilitated.

Description

TECHNICAL FIELD

[0001] The application relates to the chip testing technical field, in particular to a radio frequency chip high-frequency signal test probe station. BACKGROUND

[0002] The radio frequency chip is an integrated circuit specially processing radio frequency signals, and is called the "core hub" of wireless communication equipment. The radio frequency chip integrates discrete components such as inductors and capacitors on a single chip through a semiconductor process, and realizes functions such as signal transmission, reception, amplification, filtering and frequency conversion. With the rapid development of 5G communication, Internet of Things and other technologies, the radio frequency chip as the core component of the wireless communication system is very important to test the high-frequency signal of the radio frequency chip. The test can verify the signal integrity of the chip at high frequency, ensure that the chip can accurately transmit and process signals, and through high-frequency testing, potential problems of the chip in the high-frequency environment can be found in advance. Therefore, it has important practical significance to develop a radio frequency chip high-frequency signal test probe station.

[0003] The prior art still has the following problems: 1. The existing high-frequency signal test probe station does not have a buffering effect when testing, and the probe will contact the radio frequency chip. When testing the contact, the probe may be excessively lowered, the supporting mechanism cannot effectively buffer the impact force of the probe pressing down, and the surface microstructure or solder joint of the chip is easily damaged, causing physical damage. In addition, the mechanical stability of the flexible supporting mechanism is poor, the radio frequency chip is easy to deviate on the supporting mechanism, and even causes contact failure. In addition, the radio frequency chip is limited by the clamp, and the clamp cannot automatically release the material when taking out, which prolongs the detection cycle and reduces the overall detection efficiency. When forcibly taking out, the chip may be physically damaged due to uneven force or operation error, affecting the quality and performance of the chip.

[0004] 2. The existing high-frequency signal test probe station is easy to deviate during long-term use, which causes the probe position to fall inaccurately, so that the contact between the test point and the probe is unreliable, and the test data deviates or is wrong. If the deviation of the test frame is not found in time, the performance of the chip cannot be accurately evaluated, causing misjudgment, and the qualified products are misjudged as defective products, or the defective products flow into the subsequent links. SUMMARY

[0005] In order to overcome the test probe station does not have a buffer effect when testing, the probe will be in contact with the radio frequency chip, the probe may appear excessive downward when testing, the support mechanism cannot effectively buffer the impact force of the probe downward, easy to damage the chip surface microstructure or solder point, cause physical damage, and the mechanical stability of the flexible support mechanism is poor, the radio frequency chip is easy to produce deviation on the support mechanism, even cause contact failure, in addition, the clamp is used to limit the radio frequency chip, and the clamp cannot automatically release the material when taking out, which will prolong the detection cycle and reduce the overall detection efficiency, and the forced taking out may cause physical damage to the chip due to uneven force or operation error, which affects the chip quality and performance, the high-frequency signal test probe station is easy to deviate during long-term use, which causes the probe position to fall inaccurately, so that the contact between the test point and the probe is unreliable, and the test data deviates or is wrong, and if the deviation of the test frame is not found in time, the chip performance cannot be accurately evaluated, which causes misjudgment, and the qualified products are misjudged as defective products, or the defective products flow into the subsequent links, and the like.

[0006] The radio frequency chip high-frequency signal test probe station provided by the present application comprises a tester main body and a detection frame, a piston rod is slidably connected in the inner cavity of the tester main body, a gas cylinder is arranged at the top end of the tester main body, the gas cylinder and the piston rod are slidably connected, a first connecting plate is fixedly installed at the bottom end of the piston rod, a limiting rod is arranged on the upper surface of the first connecting plate, the limiting rod and the top arm of the tester main body are slidably connected, the detection frame is arranged at the bottom end of the first connecting plate, a probe is arranged at the bottom end of the detection frame, a test table is rotatably connected in the inner cavity of the tester main body, a clamping assembly is arranged in the inner cavity of the test table, the clamping assembly comprises two clamping assemblies, and the clamping assemblies are separated by 180 degrees, a positioning assembly is arranged on the outer surface of the tester main body, a protruding block is fixedly installed on the upper surface of the tester main body, the top of the protruding block is protruding, and the top of the protruding block is inclined, the clamping assembly comprises a support plate, the support plate is slidably connected in the inner cavity of the test table, limiting blocks are arranged at the two ends of the support plate, the limiting blocks are fixedly connected to the upper surface of the test table, clamping mechanisms are slidably connected to the two sides of the support plate, a jacking mechanism is arranged in the inner cavity of the support plate, and a buffer mechanism is arranged on the lower surface of the support plate.

[0007] Further, the clamping mechanism comprises a clamping arm, clamping blocks are slidably connected to the two ends of the clamping arm, a first threaded rod is rotatably connected in the inner cavity of the clamping arm, the first threaded rod is connected to the clamping blocks through threads, the thread directions of the two ends of the first threaded rod are opposite, and the clamping arm is slidably connected to the support plate.

[0008] Further, the jacking mechanism comprises a connecting frame, a pressure ball movably connected to the bottom end of the connecting frame, a first sliding rod fixedly installed on the upper surface of the connecting frame, a first spring sleeved on the outer surface of the first sliding rod, a jacking disc fixedly installed on the top end of the first sliding rod, a fixed block fixedly installed on the middle part of the lower surface of the supporting plate, a second threaded rod rotatably connected to the inner cavity of the fixed block, an adjusting block threadedly connected to the two ends of the second threaded rod, a top rod slidably connected to the inner cavity of the adjusting block, a fixed ring fixedly installed on the outer surface of the top rod, an elastic rod fixedly installed on the outer surface of the adjusting block, a second spring sleeved on the outer surface of the elastic rod, and an inclined block slidably connected to the outer surface of the elastic rod.

[0009] Further, the inner cavity of the tester main body is provided with a stepping motor, the output end of the stepping motor is sleeved with the bottom of the test table, the pressure ball passes through the inclined surface of the protrusion when the test table rotates, and the pressure ball is extruded, the first sliding rod and the supporting plate are slidably connected, the first spring is located between the supporting plate and the connecting frame, the jacking disc and the supporting plate are slidably connected, the top end of the jacking disc and the supporting plate are integrated, the adjusting block and the lower surface of the supporting plate are slidably connected, the screw directions of the two ends of the second threaded rod are opposite, the bottom end of the top rod is attached to the upper surface of the connecting frame, the bottom end of the fixed ring is attached to the upper surface of the adjusting block, the second spring is located between the adjusting block and the inclined block, the top end of the inclined block is fixedly connected with the clamping arm, the inclined block and the supporting plate are slidably connected, the bottom end of the inclined block is an inclined surface, the inclined surface is in close contact with the top end of the top rod, the second threaded rod passes through the inclined block, and there is a gap between the second threaded rod and the inner cavity of the inclined block.

[0010] Further, the buffer mechanism comprises a fixed plate, a fixed rod fixedly installed on the outer surface of the fixed plate, a third spring sleeved on the middle part of the fixed rod, or a sliding block slidably connected to the outer surface of the fixed rod, or located at the two ends of the third spring, a connecting strip rotatably connected to the inner cavity of the sliding block, a buffer plate rotatably connected to the end of the connecting strip away from the sliding block, a second connecting plate fixedly installed on one side of the buffer plate, a limiting groove opened on the outer surface of the second connecting plate, the upper surface of the buffer plate in close contact with the lower surface of the supporting plate, a limiting mechanism arranged on the lower surface of the test table, and the fixed plate fixedly connected with the inner wall of the test table.

[0011] Further, the limiting mechanism comprises a limiting frame fixedly connected with the lower surface of the test table, a first limiting rod slidably connected to the inner cavity of the limiting frame, a rolling ball movably connected to the inner cavity of the first limiting rod, a fourth spring sleeved on one end of the first limiting rod, a sliding block fixedly connected to the outer surface of the first limiting rod, the sliding block slidably connected with the limiting frame, the fourth spring located between the sliding block and the inner wall of the limiting frame, a first alarm fixedly installed on the outer surface of the limiting frame, a first button arranged on the outer surface of the limiting frame, the first alarm electrically connected with the first button, the pressing of the first button controls the first alarm to issue an alarm, the rolling ball engaged with the limiting groove, and the sliding block and the first button have a gap.

[0012] Further, the positioning assembly comprises a first connecting block fixedly connected to the outer surface of the first connecting plate, a positioning rod fixedly installed at the bottom end of the first connecting block, a rotating rod rotatably connected to the inner cavity of the first connecting block, a supporting block installed in the inner cavity of the test bench, a first positioning mechanism fixedly installed on the upper surface of the supporting block, a second positioning mechanism fixedly installed on the outer surface of the test instrument main body, and the middle parts of the positioning rod and the first positioning mechanism are aligned.

[0013] Further, the first positioning mechanism comprises a positioning frame, the middle part of the positioning frame is hollowed out, the positioning frame is fixedly connected to the supporting block, the outer surface of the positioning frame is provided with a second button, the outer surface of the positioning frame is fixedly installed with a second alarm, the second button and the second alarm are electrically connected, the pressing of the second button controls the second alarm to issue an alarm, the outer surface of the positioning frame is provided with a sliding groove, the inner cavity of the positioning frame is provided with a floating block, the outer surface of the floating block is provided with an inclined groove, the outer surface of the floating block is fixedly installed with a second sliding rod, the outer surface of the second sliding rod is sleeved with a fifth spring, the outer surface of the second sliding rod is slidably connected with a gasket ring, the fifth spring is located between the floating block and the gasket ring, the second sliding rod and the sliding groove are slidably connected, the gasket ring and the inner wall of the positioning frame are slidably connected, the lower surface of the floating block is not in contact with the positioning frame, and the middle parts of the positioning rod and the floating block are aligned.

[0014] Further, the second positioning mechanism comprises a fixed frame, the inner wall of the fixed frame is provided with a third button, the inner wall of the fixed frame is fixedly installed with a third alarm, the inner cavity of the fixed frame is slidably connected with a sliding plate, the two ends of the sliding plate are fixedly installed with a second connecting block, the inner cavity of the second connecting block is slidably connected with a second limiting rod, the outer surface of the second limiting rod is sleeved with a sixth spring, and the middle part of the sliding plate is fixedly installed with a pressing rod.

[0015] Further, the second limiting rod is fixedly connected to the fixed frame, the sixth spring is located between the second connecting block and the fixed frame, the third button and the third alarm are electrically connected, the pressing of the third button controls the third alarm to issue an alarm, the sliding plate has two, the rotating rod is located at the middle part of the two sliding plates, and the pressing rod and the third button have a gap.

[0016] The technical scheme provided by the application has at least the following technical effects or advantages: 1. By employing a clamping assembly, this solution effectively addresses the shortcomings of existing high-frequency signal test probe stations. These stations lack buffering during testing, leading to probe contact with the RF chip. During this contact, the probe may excessively descend, and the support mechanism cannot effectively cushion the impact of the probe's downward pressure, potentially damaging the chip's surface microstructure or solder joints, causing physical damage. Flexible support mechanisms, on the other hand, suffer from poor mechanical stability, allowing the RF chip to easily shift within the support structure, even leading to contact failure. Furthermore, the clamping mechanism's inability to automatically eject the RF chip upon removal prolongs the testing cycle and reduces overall testing efficiency. Forcibly removing the chip may cause physical damage due to uneven force or operational errors, affecting chip quality and performance. This invention uses a clamping component to limit the chip while providing a buffering effect, offering stable support during normal testing. When the probe is pressed down excessively, the stable support changes to a flexible support and an alarm is triggered, preventing the RF chip from being subjected to excessive pressure during contact with the probe. In addition, it can automatically remove the chip to improve testing efficiency. At the same time, the clamp is removed from the RF chip during removal to avoid physical damage to the chip caused by forced demolding, thus ensuring chip quality and performance.

[0017] 2. By employing a positioning component, this invention effectively solves the problem of existing high-frequency signal test probe stations easily shifting during prolonged use. This shift leads to inaccurate probe placement and unreliable contact between the test point and the probe, resulting in biased or erroneous test data. Furthermore, if the shift is not detected promptly, chip performance cannot be accurately assessed, leading to misjudgments, misclassifying qualified products as defective, or allowing defective products to enter subsequent stages. This invention, through its positioning component, ensures the accuracy of the probe position during testing. It can promptly detect and issue an alarm when the relative positions of the probe and the chip shift, facilitating subsequent maintenance, ensuring reliable contact between the test point and the probe during testing, avoiding biased or erroneous test data, and improving the accuracy of chip testing. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure in Embodiment 1 of this application; Figure 2 This is a schematic diagram of the clamping component structure in Embodiment 1 of this application; Figure 3 This is a schematic diagram of the test bench structure in Embodiment 1 of this application; Figure 4 This is a schematic diagram of the protrusion structure in Embodiment 1 of this application; Figure 5 This is a schematic diagram of the support plate structure in Embodiment 1 of this application; Figure 6 This is a schematic diagram of the pressure ball structure in Embodiment 1 of this application; Figure 7Structure diagram of the clamping mechanism in Embodiment One of the present application; Figure 8 Structure diagram of the buffer mechanism in Embodiment One of the present application; Figure 9 Structure diagram of the limiting frame cross-section in Embodiment One of the present application; Figure 10 Structure diagram of the positioning assembly in Embodiment Two of the present application; Figure 11 Structure diagram of the first positioning mechanism in Embodiment Two of the present application; Figure 12 Structure diagram of the second positioning mechanism in Embodiment Two of the present application; Figure 13 Structure diagram of the second connecting block cross-section in Embodiment Two of the present application.

[0019] In the figure: 1, tester main body; 2, piston rod; 3, first connecting plate; 4, detection frame; 5, test table; 6, clamping assembly; 61, support plate; 62, limiting block; 63, clamping mechanism; 631, clamping arm; 632, clamping block; 633, first threaded rod; 64, jacking mechanism; 641, connecting frame; 642, pressure ball; 643, first sliding rod; 644, first spring; 645, jacking disc; 646, fixed block; 647, second threaded rod; 648, adjusting block; 649, jacking rod; 6410, fixed ring; 6411, elastic rod; 6412, second spring; 6413, inclined block; 65, buffer mechanism; 651, fixed plate; 652, fixed rod; 653, third spring; 654, or; 655, connecting strip; 656, buffer plate; 657, second connecting plate; 658, limiting groove; 659, limiting mechanism; 6591, limiting frame; 6592, first limiting rod; 6593, rolling ball; 6594, fourth spring; 6595, sliding block; 6596, first alarm; 6597, first button; 7, positioning assembly; 71, first connecting block; 72, positioning rod; 73, rotating rod; 74, support block; 75, first positioning mechanism; 751, positioning frame; 752, second button; 753, second alarm; 754, sliding groove; 755, floating block; 756, inclined groove; 757, second sliding rod; 758, fifth spring; 759, pad ring; 76, second positioning mechanism; 761, fixed frame; 762, third button; 763, third alarm; 764, sliding plate; 765, second connecting block; 766, second limiting rod; 767, sixth spring; 768, pressing rod; 8, protruding block. DETAILED DESCRIPTION

[0020] The probe station does not have a buffering effect when testing, the application has a buffering effect when the chip is limited by the clamping assembly, can provide a stable support effect during normal testing, and when the probe is pressed too much, the stable support becomes flexible support and an alarm is issued to prevent the radio frequency chip from being subjected to a large pressure during contact with the probe; for the inaccuracy of the probe position falling, the application can ensure the accuracy of the probe position during testing, and can timely discover and issue an alarm when the positions of the probe and the chip are relatively offset.

[0021] In order to better understand the above technical solutions, the above technical solutions will be described in detail below in combination with the drawings of the specification and specific embodiments.

[0022] Embodiment one: Please refer to Figure 1 As shown in the figure, a radio frequency chip high-frequency signal test probe station, including a tester main body 1 and a detection frame 4, the inner cavity of the tester main body 1 is slidably connected with a piston rod 2, the top end of the tester main body 1 is provided with an air cylinder, the air cylinder and the piston rod 2 are slidably connected, the bottom end of the piston rod 2 is fixedly installed with a first connecting plate 3, the upper surface of the first connecting plate 3 is provided with a limiting rod for improving the stability of the first connecting plate 3, the limiting rod and the top arm of the tester main body 1 are slidably connected, the bottom end of the first connecting plate 3 is provided with the detection frame 4, the bottom end of the detection frame 4 is provided with a probe, the inner cavity of the test table 5 is rotatably connected with the test table 5, the inner cavity of the test table 5 is provided with a clamping assembly 6, the clamping assembly 6 has two, and the clamping assembly 6 is spaced by one hundred and eighty degrees, the outer surface of the tester main body 1 is provided with a positioning assembly 7, the upper surface of the tester main body 1 is fixedly installed with a protrusion 8, the top of the protrusion 8 is protruding, and the top of the two ends is inclined, which is convenient for lifting the chip when the clamping assembly 6 passes through the protrusion 8, and the radio frequency chip is placed in the clamping assembly 6 during detection, the radio frequency chip is limited and supported by the clamping assembly 6, the piston rod 2 is driven to slide down by the work of the air cylinder to drive the first connecting plate 3 to move down, the first connecting plate 3 drives the radio frequency chip on the detection frame 4 and the clamping assembly 6 to contact and detect the radio frequency chip through the probe on the detection frame 4, the work of the stepping motor drives the test table 5 to rotate, so that the clamping assembly 6 passes through the protrusion 8 for demolding treatment, two work for two clamping assemblies 6 are provided on the test table 5, one is for testing, and the other can be for demolding treatment, so as to realize double-station alternating work, which can significantly reduce the waiting time, when one station is working, the other station can prepare for the next work cycle, so as to reduce the overall test cycle.

[0023] Please refer to Figure 2 and Figure 3As shown, the clamping assembly 6 comprises a support plate 61, which is slidingly connected with the inner cavity of the test table 5. The two ends of the support plate 61 are provided with limiting blocks 62, which are used for limiting the top end of the support plate 61 and stably supporting the support plate 61 in the inner cavity of the test table 5 under the pressure of the buffer mechanism 65, so as to stably support the radio frequency chip. The limiting blocks 62 are fixedly connected with the upper surface of the test table 5. The two sides of the support plate 61 are slidingly connected with clamping mechanisms 63. The inner cavity of the support plate 61 is provided with a jacking mechanism 64. The lower surface of the support plate 61 is provided with the buffer mechanism 65. The clamping mechanism 63 comprises a clamping arm 631. The two ends of the clamping arm 631 are slidingly connected with clamping blocks 632. The inner cavity of the clamping arm 631 is rotatably connected with a first threaded rod 633. The first threaded rod 633 is threadedly connected with the clamping blocks 632. The screw directions of the two ends of the first threaded rod 633 are opposite. The clamping arm 631 is slidingly connected with the support plate 61. When detecting, the test table 5 is driven to rotate by a stepping motor, so that the clamping assembly 6 and the protrusion 8 are slightly offset. The radio frequency chip is placed on the upper surface of the support plate 61. The clamping blocks 632 are slidingly arranged on the outer surface of the clamping arm 631 by rotating the first threaded rod 633. The radio frequency chip is fixed on the upper surface of the support plate 61 by the clamping blocks 632. The jacking mechanism 64 is used for demolding of the radio frequency chip. That is, when the clamping assembly 6 moves to the top of the protrusion 8, the clamping assembly 6 is lifted by the protrusion 8, so that the radio frequency chip is separated from the clamping mechanism 63. During the separation process, the two clamping arms 631 are separated from each other, so as to be taken out. The buffer mechanism 65 is used for buffering the support plate 61. When the pressure of the probe on the radio frequency chip is too large during detection, the support plate 61 is changed from stable support to flexible support, so as to play a buffering effect, and prevent the probe from damaging the radio frequency chip during testing.

[0024] Please refer to Figure 5 , Figure 6 and Figure 7As shown, the jacking mechanism 64 includes a connecting frame 641, the bottom end of the connecting frame 641 is movably connected with a pressure ball 642, the upper surface of the connecting frame 641 is fixedly installed with a first sliding rod 643, the outer surface of the first sliding rod 643 is sleeved with a first spring 644, the top end of the first sliding rod 643 is fixedly installed with a jacking disc 645, the lower surface of the supporting plate 61 is fixedly installed with a fixed block 646, the inner cavity of the fixed block 646 is rotatably connected with a second threaded rod 647, the two ends of the second threaded rod 647 are threadedly connected with an adjusting block 648, the inner cavity of the adjusting block 648 is slidably connected with a jack rod 649, the outer surface of the jack rod 649 is fixedly installed with a fixed ring 6410, the outer surface of the adjusting block 648 is fixedly installed with an elastic rod 6411, the outer surface of the elastic rod 6411 is sleeved with a second spring 6412, the outer surface of the elastic rod 6411 is slidably connected with an inclined block 6413, the inner cavity of the tester main body 1 is provided with a stepping motor, the output end of the stepping motor is sleeved with the bottom of the test table 5, when the test table 5 rotates, the pressure ball 642 passes through the inclined surface of the protrusion 8 and is extruded, the first sliding rod 643 is slidably connected with the supporting plate 61, the first spring 644 is located between the supporting plate 61 and the connecting frame 641, the jacking disc 645 is slidably connected with the supporting plate 61, and the top end of the jacking disc 645 and the supporting plate 61 is integrated, the adjusting block 648 is slidably connected with the lower surface of the supporting plate 61, the thread directions of the two ends of the second threaded rod 647 are opposite, the bottom end of the jack rod 649 is attached to the upper surface of the connecting frame 641, the fixed ring 6410 is attached to the bottom end upper surface of the adjusting block 648, the second spring 6412 is located between the adjusting block 648 and the inclined block 6413, the top end of the inclined block 6413 is fixedly connected with the clamping arm 631, the inclined block 6413 is slidably connected with the supporting plate 61, the bottom end of the inclined block 6413 is an inclined surface, and the inclined surface is in close contact with the top end of the jack rod 649, the second threaded rod 647 passes through the inclined block 6413 and there is a gap between the second threaded rod 647 and the inner cavity of the inclined block 6413, when the radio frequency chip is tested, the test table 5 rotates to drive the pressure ball 642 to pass through the inclined surface of the protrusion 8, at this time the pressure ball 642 is extruded to drive the connecting frame 641 to move upwards, the upward movement of the connecting frame 641 drives the first sliding rod 643 to slide in the inner cavity of the supporting plate 61 and extrude the first spring 644, the upward movement of the first sliding rod 643 drives the jacking disc 645 to lift the radio frequency chip, the upward movement of the connecting frame 641 extrudes the jack rod 649 and drives the jack rod 649 to move upwards, the upward movement of the jack rod 649 extrudes the inclined surface of the inclined block 6413 with the top end of the jack rod 649, at this time the inclined block 6413 slides on the elastic rod 6411 and extrudes the second spring 6412, the movement of the inclined block 6413 drives the clamping arm 631 to slide in the inner cavity of the supporting plate 61, that is, while the jacking disc 645 lifts the radio frequency chip, the two ends of the clamping arm 631 are separated from the radio frequency chip, thereby preventing the radio frequency chip from being damaged by the interaction force when the radio frequency chip is directly lifted out of the inner cavity of the clamping arm 631,The radio frequency chip is better demoulded and protected. The second threaded rod 647 is rotated in the inner cavity of the fixed block 646 to drive the adjusting block 648 to slide on the lower surface of the support plate 61, so that the spacing of the adjusting block 648 changes. When the adjusting block 648 slides on the lower surface of the support plate 61, the elastic force of the second spring 6412 makes the inclined block 6413 always contact the top end of the fixed ring 6410. The fixed ring 6410 is used for limiting the top rod 649, so that the fixed ring 6410 and the adjusting block 648 keep the relative position stable, so as to adjust the spacing of the adjusting block 648 when the connecting frame 641 is lifted. The fixed ring 6410 can always extrude the inclined surface of the inclined block 6413, so as to separate the two clamping arms 631 from the limiting of the radio frequency chip. The rotation of the second threaded rod 647 adjusts the spacing of the clamping arm 631, and the rotation of the first threaded rod 633 adjusts the spacing of the clamping block 632, so as to limit the radio frequency chip of various specifications and improve the fault tolerance of clamping. When the pressure ball 642 is separated from the protrusion 8, the elastic force of the first spring 644 makes the connecting frame 641 return to the original position, so that the jacking disc 645 and the upper surface of the support plate 61 form an integral whole, facilitating the discharge, and the elastic force of the second spring 6412 makes the inclined block 6413 return to the original position. At this time, the lower surface of the fixed ring 6410 contacts the bottom wall of the adjusting block 648 under the extrusion of the inclined block 6413 and the gravity of the fixed ring 6410. In addition, when one of the clamping assemblies 6 is located directly above the protrusion 8, the other clamping assembly 6 is located directly below the detection frame 4, facilitating discharge treatment while testing, improving testing efficiency, and avoiding forcibly taking out the radio frequency chip to cause friction and scratching between the radio frequency chip and the clamp, thereby protecting the radio frequency chip. In order to improve the stability of the radio frequency chip on the support plate 61, the clamping assembly 6 and the protrusion 8 are offset at a certain angle when the radio frequency chip is placed, so as to facilitate the stability of the radio frequency chip on the upper surface of the support plate 61.

[0025] Please refer to Figure 3 , Figure 5 , Figure 8 and Figure 9As shown, the buffer mechanism 65 comprises a fixed plate 651, the outer surface of the fixed plate 651 is fixedly connected with a fixed rod 652, the middle part of the fixed rod 652 is sleeved with a third spring 653, the outer surface of the fixed rod 652 is slidably connected with an or 654, or 654 is located at both ends of the third spring 653, the inner cavity of or 654 is rotatably connected with a connecting strip 655, one end of the connecting strip 655 away from or 654 is rotatably connected with a buffer plate 656, one side of the buffer plate 656 is fixedly connected with a second connecting plate 657, the outer surface of the second connecting plate 657 is provided with a limiting groove 658, the upper surface of the buffer plate 656 is in close contact with the lower surface of the support plate 61, the lower surface of the test table 5 is provided with a limiting mechanism 659, the fixed plate 651 and the inner wall of the test table 5 are fixedly connected, the limiting mechanism 659 comprises a limiting frame 6591, the limiting frame 6591 and the lower surface of the test table 5 are fixedly connected, the inner cavity of the limiting frame 6591 is slidably connected with a first limiting rod 6592, the inner cavity of the first limiting rod 6592 is movably connected with a rolling ball 6593, one end of the first limiting rod 6592 is sleeved with a fourth spring 6594, the outer surface of the first limiting rod 6592 is fixedly connected with a sliding block 6595, the sliding block 6595 and the limiting frame 6591 are slidably connected, the fourth spring 6594 is located between the limiting frame 6591 and the inner wall of the sliding block 6595, the outer surface of the limiting frame 6591 is fixedly connected with a first alarm 6596, the outer surface of the limiting frame 6591 is provided with a first button 6597, the first alarm 6596 and the first button 6597 are electrically connected, and the pressing of the first button 6597 controls the first alarm 6596 to issue an alarm, the rolling ball 6593 and the limiting groove 658 are engaged, the sliding block 6595 and the first button 6597 have a gap, the buffer mechanism 65 is used for supporting the support plate 61, so that the support plate 61 is stably arranged on the inner wall of the test table 5, so that the radio frequency chip on the support plate 61 remains stable, when the detection frame 4 moves downward excessively when testing the radio frequency chip on the upper surface of the support plate 61, the probe on the lower surface of the detection frame 4 has too much pressure on the radio frequency chip, the radio frequency chip is squeezed to drive the support plate 61 to slide downward in the inner cavity of the test table 5, at this time the rolling ball 6593 and the limiting groove 658 are disengaged, the downward movement of the buffer plate 656 drives the connecting strip 655 to rotate in the inner cavity of or 654, so that or 654 slides on the fixed rod 652 and squeezes the third spring 653, at this time the support of the buffer plate 656 to the support plate 61 is flexible support, so that when the probe has too much pressure on the radio frequency chip, the support plate 61 has poor stable support and flexible support, which has a buffering effect and prevents the probe from causing too much damage to the radio frequency chip, when the limiting groove 658 and the rolling ball 6593 are disengaged, at this time the rolling ball 6593 contacts the second connecting plate 657 and squeezes the rolling ball 6593, drives the first limiting rod 6592 to slide in the inner cavity of the limiting frame 6591,At this time, the sliding of the first limiting rod 6592 drives the sliding block 6595 to slide in the inner cavity of the limiting frame 6591 and extrude the fourth spring 6594. Meanwhile, the sliding block 6595 presses the first button 6597 to make the first alarm 6596 give an alarm, so as to remind the staff that the probe has a large pressure on the radio frequency chip and needs to be maintained in time. When the rolling ball 6593 and the limiting groove 658 are engaged, the fixing plate 651 and the buffer plate 656 remain relatively fixed, which can prevent the buffer plate 656 from shaking during normal detection, so that the radio frequency chip on the support plate 61 remains stable, that is, the support plate 61 has a stable supporting effect, and can buffer under a large pressure, thereby converting from "fixed support" to "flexible support", so as to maintain the stability of the radio frequency chip during testing, and also have a buffering effect under a large pressure to prevent damage to the outer surface of the chip.

[0026] Embodiment two: Please refer to Figure 1 、 Figure 2 and Figure 10 , the positioning assembly 7 includes a first connecting block 71, the first connecting block 71 and the outer surface of the first connecting plate 3 are fixedly connected, the bottom end of the first connecting block 71 is fixedly installed with a positioning rod 72, the inner cavity of the first connecting block 71 is rotatably connected with a rotating rod 73, the inner cavity of the test bench 5 is installed with a supporting block 74, the upper surface of the supporting block 74 is fixedly installed with a first positioning mechanism 75, the outer surface of the test instrument main body 1 is fixedly installed with a second positioning mechanism 76, the middle parts of the positioning rod 72 and the first positioning mechanism 75 are aligned, the first connecting plate 3 is lowered to drive the first connecting block 71 to be lowered, the first connecting block 71 is lowered to drive the positioning rod 72 and the rotating rod 73 to be lowered, whether the detection frame 4 is deviated from the test bench 5 is judged by the position difference between the positioning rod 72 and the first positioning mechanism 75, whether the detection frame 4 and the test instrument main body 1 are deviated is judged by whether the rotating rod 73 and the second positioning mechanism 76 are deviated, so as to ensure that the detection frame 4 is relatively stable in position during testing.

[0027] Please refer to Figures 10-13As shown, the first positioning mechanism 75 comprises a positioning frame 751, the middle part of the positioning frame 751 is hollowed out, the positioning frame 751 is fixedly connected with the supporting block 74, the outer surface of the positioning frame 751 is provided with a second button 752, the outer surface of the positioning frame 751 is fixedly installed with a second alarm 753, the second button 752 and the second alarm 753 are electrically connected, and the pressing of the second button 752 controls the second alarm 753 to issue an alarm, the outer surface of the positioning frame 751 is provided with a sliding groove 754, the inner cavity of the positioning frame 751 is provided with a floating block 755, the outer surface of the floating block 755 is provided with an inclined groove 756, the outer surface of the floating block 755 is fixedly installed with a second sliding rod 757, the outer surface of the second sliding rod 757 is sleeved with a fifth spring 758, the outer surface of the second sliding rod 757 is slidably connected with a grommet 759, the fifth spring 758 is located between the floating block 755 and the grommet 759, the second sliding rod 757 and the sliding groove 754 are slidably connected, the grommet 759 and the inner wall of the positioning frame 751 are slidably connected, the lower surface of the floating block 755 is not in contact with the positioning frame 751, the middle part of the positioning rod 72 is aligned with the floating block 755, and the second positioning mechanism 76 comprises a fixed frame 761, the inner wall of the fixed frame 761 is provided with a third button 762, the inner wall of the fixed frame 761 is fixedly installed with a third alarm 763, the inner cavity of the fixed frame 761 is slidably connected with a sliding plate 764, both ends of the sliding plate 764 are fixedly installed with a second connecting block 765, the inner cavity of the second connecting block 765 is slidably connected with a second limiting rod 766, the outer surface of the second limiting rod 766 is sleeved with a sixth spring 767, the middle part of the sliding plate 764 is fixedly installed with a pressing rod 768, the second limiting rod 766 and the fixed frame 761 are fixedly connected, the sixth spring 767 is located between the second connecting block 765 and the fixed frame 761, the third button 762 and the third alarm 763 are electrically connected, and the pressing of the third button 762 controls the third alarm 763 to issue an alarm, the sliding plate 764 has two, and the rotating rod 73 is located at the middle part of the two sliding plates 764, the pressing rod 768 and the third button 762 have a gap, when the test table 5 and the detection frame 4 are deviated, at this time the positioning rod 72 is lowered to press the inclined groove 756 to drive the floating block 755 to slide in the inner cavity of the positioning frame 751, the movement of the floating block 755 drives the second sliding rod 757 to slide in the inner cavity of the sliding groove 754 and press the fifth spring 758, the movement of the second sliding rod 757 drives the second sliding rod 757 to press the second button 752, at this time the second alarm 753 issues an alarm, reminding the staff that the positioning rod 72 and the floating block 755 are displaced, that is, the clamping assembly 6 on the detection frame 4 and the test table 5 is deviated and needs to be maintained in time, when the detection frame 4 and the test instrument main body 1 are deviated in the front and back directions, the rotating rod 73 is pressed to slide on the second limiting rod 766 and press the sixth spring 767, at the same time, the movement of the sliding plate 764 drives the pressing rod 768 to press the third button 762,The third alarm 763 sends an alarm to remind the staff to rotate the rod 73 and the slide plate 764 to generate displacement, to ensure that the contact between the test point and the probe is reliable during the test. In addition, the timbre and loudness of the first alarm 659, the second alarm 753 and the third alarm 763 are set to be different, so as to be distinguished and to quickly troubleshoot problems for subsequent maintenance.

[0028] In summary, when detecting, the radio frequency chip is placed in the clamping assembly 6, the radio frequency chip is limited and supported by the clamping assembly 6, the first connecting plate 3 is driven to move down by the working of the cylinder, the first connecting plate 3 drives the detection frame 4 and the radio frequency chip on the clamping assembly 6 to contact and detect the radio frequency chip by the probe on the detection frame 4, the test table 5 is rotated by the working of the stepping motor, so that the clamping assembly 6 is demolded at the convex block 8, when detecting, the test table 5 is rotated by the stepping motor, so that the clamping assembly 6 and the convex block 8 are offset by a point, the radio frequency chip is placed on the upper surface of the supporting plate 61, the clamping mechanism 63 is used for limiting the radio frequency chip, the jacking mechanism 64 is used for demolding the radio frequency chip, that is, when the clamping assembly 6 moves to the upper of the convex block 8, the clamping assembly 6 is lifted by the convex block 8, so that the radio frequency chip is separated from the clamping mechanism 63, and the two clamping arms 631 are separated from each other during the separation process, so as to be convenient to take out, the buffer mechanism 65 is used for buffering the supporting plate 61, when the pressure of the probe on the radio frequency chip is too large during detection, the supporting plate 61 changes from stable support to flexible support, so as to play a buffering effect, to prevent the probe from damaging the radio frequency chip during testing, the first connecting block 71 is driven to move down when the first connecting plate 3 moves down, the first connecting block 71 drives the positioning rod 72 and the rotating rod 73 to move down, whether the detection frame 4 is offset relative to the test table 5 is judged by the position difference between the positioning rod 72 and the first positioning mechanism 75, whether the detection frame 4 and the test instrument main body 1 are offset is judged by whether the rotating rod 73 and the second positioning mechanism 76 are offset, so as to ensure that the position of the detection frame 4 is relatively stable during testing.

[0029] Obviously, those skilled in the art can make various modifications and variations to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application belong to the scope of the claims of the present application and their equivalent technologies, the present application also intends to include these modifications and variations.

[0030] The above is only a preferred specific implementation of the embodiment of the present application, but the protection scope of the present application is not limited to this. Any person skilled in the art can make equivalent substitutions or changes to the technical scheme and concept of the present application within the technical range disclosed by the present application, which should be covered within the protection scope of the present application.

Claims

1. A high-frequency signal test probe station for radio frequency chips, comprising a tester body (1) and a probe holder (4), characterized in that, The inner cavity of the tester body (1) is slidably connected to a piston rod (2). A cylinder is provided at the top of the tester body (1). The cylinder and the piston rod (2) are slidably connected. A first connecting plate (3) is fixedly installed at the bottom of the piston rod (2). A limit rod is provided on the upper surface of the first connecting plate (3). The limit rod is slidably connected to the top arm of the tester body (1). A probe frame (4) is provided at the bottom of the first connecting plate (3). A probe is provided at the bottom of the probe frame (4). A test platform (5) is rotatably connected to the inner cavity of the tester body (1). A clamping assembly (6) is provided in the inner cavity of the test platform (5). There are two clamping assemblies (6), and the clamping assemblies (6) are spaced 180 degrees apart. A positioning assembly (7) is provided on the outer surface of the tester body (1). A protrusion (8) is fixedly installed on the upper surface of the tester body (1). The top of the protrusion (8) is raised, and the two ends of the top are inclined surfaces. The clamping assembly (6) includes a support plate (61), which is slidably connected to the inner cavity of the test table (5). Limiting blocks (62) are provided at both ends of the support plate (61), and the limiting blocks (62) are fixedly connected to the upper surface of the test table (5). Clamping mechanisms (63) are slidably connected to both sides of the support plate (61). A lifting mechanism (64) is provided in the inner cavity of the support plate (61), and a buffer mechanism (65) is provided on the lower surface of the support plate (61).

2. The RF chip high-frequency signal test probe station as described in claim 1, characterized in that, The clamping mechanism (63) includes a clamping arm (631), with clamping blocks (632) slidably connected to both ends of the clamping arm (631). A first threaded rod (633) is rotatably connected to the inner cavity of the clamping arm (631). The first threaded rod (633) and the clamping blocks (632) are connected by threads, and the threads at both ends of the first threaded rod (633) are in opposite directions. The clamping arm (631) and the support plate (61) are slidably connected.

3. The radio frequency chip high-frequency signal test probe station as described in claim 2, characterized in that, The lifting mechanism (64) includes a connecting frame (641), a pressure ball (642) is movably connected to the bottom end of the connecting frame (641), a first slide rod (643) is fixedly installed on the upper surface of the connecting frame (641), a first spring (644) is sleeved on the outer surface of the first slide rod (643), a lifting plate (645) is fixedly installed at the top end of the first slide rod (643), a fixing block (646) is fixedly installed in the middle part of the lower surface of the support plate (61), and a first spring (644) is rotatably connected to the inner cavity of the fixing block (646). The second threaded rod (647) has two ends connected to adjusting blocks (648) by threads. The inner cavity of the adjusting block (648) is slidably connected to a top rod (649). A fixing ring (6410) is fixedly installed on the outer surface of the top rod (649). A spring rod (6411) is fixedly installed on the outer surface of the adjusting block (648). A second spring (6412) is sleeved on the outer surface of the spring rod (6411). An inclined block (6413) is slidably connected to the outer surface of the spring rod (6411).

4. The radio frequency chip high-frequency signal test probe station as described in claim 3, characterized in that, The inner cavity of the main body (1) of the tester is equipped with a stepper motor. The output end of the stepper motor is sleeved with the bottom of the test platform (5). When the test platform (5) rotates, the pressure ball (642) passes through the inclined surface of the protrusion (8) and is squeezed. The first slide rod (643) and the support plate (61) are slidably connected. The first spring (644) is located between the support plate (61) and the connecting frame (641). The lifting plate (645) and the support plate (61) are slidably connected, and the top of the lifting plate (645) and the support plate (61) are integrated. The adjusting block (648) and the lower surface of the support plate (61) are slidably connected. The threads at both ends of the second threaded rod (647) are... In opposite directions, the bottom end of the top rod (649) is in contact with the upper surface of the connecting frame (641), the bottom end of the fixing ring (6410) is in contact with the upper surface of the adjusting block (648), the second spring (6412) is located between the adjusting block (648) and the inclined block (6413), the top end of the inclined block (6413) is fixedly connected to the clamping arm (631), the inclined block (6413) and the support plate (61) are slidably connected, the bottom end of the inclined block (6413) is an inclined surface, and the inclined surface is in close contact with the top end of the top rod (649), the second threaded rod (647) passes through the inclined block (6413) and there is a gap between the second threaded rod (647) and the inner cavity of the inclined block (6413).

5. The RF chip high-frequency signal test probe station as described in claim 1, characterized in that, The buffer mechanism (65) includes a fixed plate (651), a fixed rod (652) is fixedly installed on the outer surface of the fixed plate (651), a third spring (653) is sleeved in the middle part of the fixed rod (652), an or (654) is slidably connected to the outer surface of the fixed rod (652), the or (654) is located at both ends of the third spring (653), a connecting strip (655) is rotatably connected to the inner cavity of the or (654), a buffer plate (656) is rotatably connected to the end of the connecting strip (655) away from the or (654), a second connecting plate (657) is fixedly installed on one side of the buffer plate (656), a limit groove (658) is opened on the outer surface of the second connecting plate (657), the upper surface of the buffer plate (656) and the lower surface of the support plate (61) are in close contact, a limit mechanism (659) is provided on the lower surface of the test platform (5), and the fixed plate (651) and the inner wall of the test platform (5) are fixedly connected.

6. The radio frequency chip high-frequency signal test probe station as described in claim 5, characterized in that, The limiting mechanism (659) includes a limiting frame (6591), which is fixedly connected to the lower surface of the test platform (5). A first limiting rod (6592) is slidably connected to the inner cavity of the limiting frame (6591). A ball (6593) is movably connected to the inner cavity of the first limiting rod (6592). A fourth spring (6594) is sleeved on one end of the first limiting rod (6592). A slider (6595) is fixedly connected to the outer surface of the first limiting rod (6592). The slider (6595) is slidably connected to the limiting frame (6591). The fourth... A spring (6594) is located between the slider (6595) and the inner wall of the limiting frame (6591). A first alarm (6596) is fixedly installed on the outer surface of the limiting frame (6591). A first button (6597) is provided on the outer surface of the limiting frame (6591). The first alarm (6596) and the first button (6597) are electrically connected. Pressing the first button (6597) controls the first alarm (6596) to sound an alarm. The ball (6593) engages with the limiting groove (658). There is a gap between the slider (6595) and the first button (6597).

7. The radio frequency chip high-frequency signal test probe station as described in claim 1, characterized in that, The positioning component (7) includes a first connecting block (71), the outer surfaces of the first connecting block (71) and the first connecting plate (3) are fixedly connected, a positioning rod (72) is fixedly installed at the bottom end of the first connecting block (71), a rotating rod (73) is rotatably connected to the inner cavity of the first connecting block (71), a support block (74) is installed at one end of the inner cavity of the test platform (5), a first positioning mechanism (75) is fixedly installed on the upper surface of the support block (74), a second positioning mechanism (76) is fixedly installed on the outer surface of the tester body (1), and the middle parts of the positioning rod (72) and the first positioning mechanism (75) are aligned.

8. The radio frequency chip high-frequency signal test probe station as described in claim 7, characterized in that, The first positioning mechanism (75) includes a positioning frame (751), the middle part of which is hollowed out. The positioning frame (751) and the support block (74) are fixedly connected. A second button (752) is provided on the outer surface of the positioning frame (751). A second alarm (753) is fixedly installed on the outer surface of the positioning frame (751). The second button (752) and the second alarm (753) are electrically connected, and pressing the second button (752) controls the second alarm (753) to sound an alarm. A sliding groove (754) is provided on the outer surface of the positioning frame (751). A floating block (755) is provided in the inner cavity of the positioning frame (751). 5) An inclined groove (756) is provided on the outer surface of the floating block (755). A second slide rod (757) is fixedly installed on the outer surface of the floating block (755). A fifth spring (758) is sleeved on the outer surface of the second slide rod (757). A washer (759) is slidably connected to the outer surface of the second slide rod (757). The fifth spring (758) is located between the floating block (755) and the washer (759). The second slide rod (757) is slidably connected to the slide groove (754). The washer (759) is slidably connected to the inner wall of the positioning frame (751). The lower surface of the floating block (755) does not contact the positioning frame (751). The positioning rod (72) is aligned with the middle part of the floating block (755).

9. The radio frequency chip high-frequency signal test probe station as described in claim 7, characterized in that, The second positioning mechanism (76) includes a fixed frame (761), a third button (762) is provided on the inner wall of the fixed frame (761), a third alarm (763) is fixedly installed on the inner wall of the fixed frame (761), a slide plate (764) is slidably connected to the inner cavity of the fixed frame (761), a second connecting block (765) is fixedly installed at both ends of the slide plate (764), a second limiting rod (766) is slidably connected to the inner cavity of the second connecting block (765), a sixth spring (767) is sleeved on the outer surface of the second limiting rod (766), and a pressing rod (768) is fixedly installed in the middle part of the slide plate (764).

10. The radio frequency chip high-frequency signal test probe station as described in claim 9, characterized in that, The second limiting rod (766) and the fixing frame (761) are fixedly connected. The sixth spring (767) is located between the second connecting block (765) and the fixing frame (761). The third button (762) and the third alarm (763) are electrically connected. Pressing the third button (762) controls the third alarm (763) to sound an alarm. There are two slides (764). The rotating rod (73) is located in the middle of the two slides (764). There is a gap between the pressing rod (768) and the third button (762).

Images