Display panel and display device

Abstract

The application discloses a display panel and a display device. The display panel comprises a substrate, a driving circuit layer arranged on one side of the substrate, a plurality of sub-pixels arranged on one side of the driving circuit layer, a pixel definition layer for defining positions of the plurality of sub-pixels, the driving circuit layer comprising a plurality of first thermoelectric elements and a plurality of second thermoelectric elements with different Seebeck coefficients and arranged corresponding to the pixel definition layer, a plurality of first detection lines and a plurality of second detection lines, at least one of the first thermoelectric element and the second thermoelectric element being arranged around each sub-pixel, in adjacent sub-pixels, the first thermoelectric element is arranged around one sub-pixel, the second thermoelectric element is arranged around the other sub-pixel, and the first thermoelectric element and the second thermoelectric element around at least two adjacent sub-pixels are in contact and electrically connected, the first detection lines extend along a first direction, the second detection lines extend along a second direction, and the first detection lines and the second detection lines are electrically connected to the contact points of the first thermoelectric element and the second thermoelectric element. Through the above arrangement, the problem of low detection efficiency and insufficient accuracy of the display panel is solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of display, in particular to a display panel and a display device. BACKGROUND

[0002] During the manufacturing process of the display panel, some sub-pixels may abnormally emit light or not emit light, resulting in bad points. In order to ensure the display effect of the display panel, the bad points of the display panel need to be detected for repairing the bad points.

[0003] In the related art, the detection of the bad points mainly relies on machine vision detection technology, which not only takes a lot of time, has low detection efficiency, and has high cost, but also has insufficient detection accuracy. It is difficult to identify the sub-pixels with heating abnormalities caused by leakage and signal disorder, which easily leads to abnormal diffusion and further affects the service life of the display panel. SUMMARY

[0004] The present application mainly provides a display panel and a display device to solve the problem of low detection efficiency and insufficient detection accuracy of the bad points of the display panel in the related art.

[0005] To solve the above technical problems, one technical solution adopted by the present application is to provide a display panel, comprising:

[0006] a substrate;

[0007] a driving circuit layer arranged on one side of the substrate;

[0008] a plurality of sub-pixels arranged on the side of the driving circuit layer away from the substrate; each of the sub-pixels comprises an anode, a light-emitting layer and a cathode arranged in sequence;

[0009] a pixel definition layer arranged on the side of the driving circuit layer away from the substrate, and defining the positions of the plurality of sub-pixels;

[0010] The driving circuit layer comprises a plurality of first thermoelectric elements, a plurality of second thermoelectric elements, a plurality of first detection lines and a plurality of second detection lines. The first thermoelectric elements and the second thermoelectric elements are arranged corresponding to the positions of the pixel definition layer, and the Seebeck coefficients of the first thermoelectric elements and the second thermoelectric elements are different.

[0011] At least one of the first thermoelectric elements and the second thermoelectric elements is arranged around each of the sub-pixels. In the adjacent two sub-pixels, one of the sub-pixels is arranged with the first thermoelectric element, and the other of the sub-pixels is arranged with the second thermoelectric element. The first thermoelectric elements and the second thermoelectric elements around the at least partially adjacent two sub-pixels are in contact and electrically connected with each other.

[0012] The first detection line extends along a first direction, a plurality of the first detection lines are spaced apart from each other along a second direction, and in the second direction, at least one sub-pixel is arranged between any two adjacent first detection lines, and the first detection line is electrically connected to the contact points of the first thermoelectric element and the second thermoelectric element; the second detection line extends along the second direction, a plurality of the second detection lines are spaced apart from each other along the first direction, and in the first direction, at least one sub-pixel is arranged between any two adjacent second detection lines; the second detection line is electrically connected to the contact points of the first thermoelectric element and the second thermoelectric element; the first direction intersects the second direction.

[0013] In some embodiments, the plurality of sub-pixels are arranged in an array, the first direction is perpendicular to the second direction; the first direction is parallel to the column direction, and the second direction is parallel to the row direction.

[0014] Along the second direction, one first detection line is arranged between any two adjacent columns of sub-pixels, and two columns of sub-pixels are arranged between any two adjacent first detection lines.

[0015] In any two adjacent rows of sub-pixels, only one of the first thermoelectric element and the second thermoelectric element is arranged around each sub-pixel in one of the rows, defining a single-thermoelectric-material row.

[0016] The plurality of sub-pixels of the single-thermoelectric-material row constitute a plurality of pixel groups, each pixel group includes two adjacent sub-pixels, the sub-pixels in any two adjacent pixel groups do not overlap with each other, and the first thermoelectric element and the second thermoelectric element around the two sub-pixels in the same pixel group are in contact with each other.

[0017] Each first detection line corresponds to a column of pixel groups and is located between two columns of sub-pixels of the column of pixel groups, and the first detection line is electrically connected to a plurality of contact points of the first thermoelectric element and the second thermoelectric element of the column of pixel groups in sequence.

[0018] In some embodiments, the plurality of sub-pixels are arranged in an array, the first direction is perpendicular to the second direction; the first direction is parallel to the column direction, and the second direction is parallel to the row direction.

[0019] Along the first direction, one second detection line is arranged between any two adjacent rows of sub-pixels, and two rows of sub-pixels are arranged between any two adjacent second detection lines.

[0020] In any two adjacent rows of sub-pixels, the first thermoelectric element and the second thermoelectric element are arranged around each sub-pixel in one of the rows, defining a double-thermoelectric-material row.

[0021] The first thermoelectric element and the second thermoelectric element around each of the sub-pixels are in contact with each other.

[0022] The second detection line is located between two adjacent rows of the sub-pixels, and a plurality of the second detection lines are arranged one-to-one corresponding to a plurality of the double thermoelectric material rows; the second detection line sequentially connects the contact points of the first thermoelectric element and the second thermoelectric element around a plurality of the sub-pixels in the double thermoelectric material row.

[0023] In some embodiments, the materials of the first thermoelectric element and the second thermoelectric element are both semiconductor thermoelectric materials.

[0024] One of the first thermoelectric element and the second thermoelectric element is a P-type semiconductor material, and the other is an N-type semiconductor material.

[0025] In some embodiments, the P-type semiconductor material includes a P-type Bi2Te3-based semiconductor material; and / or,

[0026] The N-type semiconductor material includes an N-type Bi2Te3-based semiconductor material or an N-type SnS-based semiconductor material.

[0027] In some embodiments, the driving circuit layer further includes a plurality of scanning lines, a plurality of data lines, and a plurality of thin film transistors; the thin film transistor includes a gate electrode, a gate insulating layer, an active layer, a passivation layer, and a source-drain electrode layer arranged in layers.

[0028] The first detection line, the data line, and the source-drain electrode layer are arranged in the same layer; the second detection line, the scanning line, the first thermoelectric element, the second thermoelectric element, and the gate electrode are arranged in the same layer.

[0029] The contact points of the first detection line and the first thermoelectric element and the second thermoelectric element are electrically connected through a first via hole.

[0030] In some embodiments, the cathode is a transparent conductive material, and the anode is an opaque metal material.

[0031] Alternatively, the thin film transistor is arranged corresponding to the position of the pixel definition layer; the cathode is an opaque metal material, and the anode is a transparent conductive material.

[0032] In some embodiments, the cathode is a transparent conductive material, and the anode is an opaque metal material; the cathodes of a plurality of the sub-pixels are connected to each other, and the cathode covers the pixel definition layer and the light-emitting layer of a plurality of the sub-pixels.

[0033] The first detection line corresponds to the position of the pixel definition layer, and the first detection line is electrically connected to the cathode through a second via.

[0034] To solve the above technical problems, another technical solution adopted by the present application is to provide a display device, comprising:

[0035] The display panel of any one of the above;

[0036] The control circuit comprises a signal processing unit, which is electrically connected to the plurality of first detection lines and the plurality of second detection lines; the signal processing unit is used to acquire the electrical signals of the plurality of first detection lines and the plurality of second detection lines, and to determine whether there is a bad point in the plurality of sub-pixels and determine the position of the bad point according to the acquired electrical signals.

[0037] In some embodiments, the control circuit further comprises a signal amplifier;

[0038] The signal amplifier is electrically connected between the plurality of first detection lines and the signal processing unit, and the electrical signals of the plurality of first detection lines are transmitted to the signal processing unit after being amplified by the signal amplifier; and / or,

[0039] The signal amplifier is electrically connected between the plurality of second detection lines and the signal processing unit, and the electrical signals of the plurality of second detection lines are transmitted to the signal processing unit after being amplified by the signal amplifier.

[0040] The beneficial effects of the present application are: different from the prior art, the display panel and the display device are disclosed, the display panel comprises: a substrate; a driving circuit layer arranged on one side of the substrate; a plurality of sub-pixels arranged on the side of the driving circuit layer away from the substrate; each sub-pixel comprises an anode, a light-emitting layer and a cathode arranged in sequence; a pixel definition layer arranged on the side of the driving circuit layer away from the substrate, defining the positions of the plurality of sub-pixels; wherein the driving circuit layer comprises a plurality of first thermoelectric elements and a plurality of second thermoelectric elements, and a plurality of first detection lines and a plurality of second detection lines; the first thermoelectric element and the second thermoelectric element are arranged corresponding to the position of the pixel definition layer, and the Seebeck coefficients of the first thermoelectric element and the second thermoelectric element are different; at least one of the first thermoelectric element and the second thermoelectric element is arranged around each sub-pixel; in the two adjacent sub-pixels, one of the sub-pixels is arranged around the first thermoelectric element, and the other sub-pixel is arranged around the second thermoelectric element, and at least part of the first thermoelectric element and the second thermoelectric element around the two adjacent sub-pixels are in contact and electrically connected with each other; the first detection line extends along the first direction, the plurality of first detection lines are spaced apart from each other in the second direction, and in the second direction, at least one sub-pixel is arranged between the two adjacent first detection lines, and the contact point of the first detection line and the first thermoelectric element and the second thermoelectric element is electrically connected; the second detection line extends along the second direction, the plurality of second detection lines are spaced apart from each other in the first direction, and in the first direction, at least one sub-pixel is arranged between the two adjacent second detection lines, and the contact point of the second detection line and the first thermoelectric element and the second thermoelectric element is electrically connected; the first direction intersects the second direction. By arranging the first thermoelectric element and / or the second thermoelectric element around the sub-pixel, the Seebeck coefficients of the first thermoelectric element and the second thermoelectric element are different, and in the two adjacent sub-pixels, one of the sub-pixels is arranged around the first thermoelectric element, and the other sub-pixel is arranged around the second thermoelectric element, and the contact points of the first detection line and the second detection line are respectively electrically connected with the first thermoelectric element and the second thermoelectric element along the first direction and the second direction, when there is a bad point in the sub-pixel of the display panel, the temperature of the bad point and the temperature of the sub-pixel adjacent to it are different, and the contact points of the first thermoelectric element and the second thermoelectric element will generate a thermoelectric electromotive force due to the temperature difference, and the first detection line and the second detection line will detect the thermoelectric electromotive force signal of the contact point position of the first thermoelectric element and the second thermoelectric element, thereby determining the position of the bad point in the first direction and the second direction respectively, thereby accurately determining the specific position of the bad point, so as to facilitate the repair of the bad point. Through the above arrangement, the problem of low bad point detection efficiency and insufficient detection accuracy of the display panel in the related art is solved, the bad point detection can be quickly and accurately realized, the detection cost and time are reduced, the detection efficiency and accuracy are improved, and targeted repair according to the damage condition of the sub-pixel is facilitated, thereby improving the production efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings needed to be used in the embodiments or prior art description will be briefly introduced as follows. Obviously, the accompanying drawings in the following description only only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained based on these drawings without creative labor.

[0042] Figure 1 is a structural schematic diagram of an embodiment of the display panel provided by the first embodiment of the present application;

[0043] Figure 2 is a structural schematic diagram of an embodiment of the display panel provided by the first embodiment of the present application; Figure 1

[0044] Figure 3 is a structural schematic diagram of an embodiment of the display panel provided by the first embodiment of the present application; Figure 1

[0045] Figure 4 is a structural schematic diagram of an embodiment of the display panel provided by the first embodiment of the present application; Figure 1

[0046] Figure 5 is a structural schematic diagram of another embodiment of the display panel provided by the first embodiment of the present application;

[0047] Figure 6 is a structural schematic diagram of another embodiment of the display panel provided by the first embodiment of the present application; Figure 5

[0048] Figure 7 is a structural schematic diagram of another embodiment of the display panel provided by the first embodiment of the present application; Figure 6

[0049] Figure 8 is a structural schematic diagram of an embodiment of the display device provided by the second embodiment of the present application;

[0050] Figure 9 is a structural schematic diagram of another embodiment of the display device provided by the second embodiment of the present application.

[0051] Reference signs:

[0052] ​​​​​300, display device; 200, control circuit; 201, signal processing unit; 202, signal amplifier; 100, display panel; 1, substrate; 2, drive circuit layer; 21, first thermoelectric element; 22, second thermoelectric element; 23, first detection line; 24, second detection line; 25, scan line; 26, data line; 27, thin film transistor; 271, gate; 272, gate insulating layer; 273, active layer; 274, passivation layer; 275, first passivation layer; 276, second passivation layer; 277, source-drain layer; 278, source; 279, drain; 270, ohmic contact layer; 3, sub-pixel; 31, anode; 32, light-emitting layer; 33, cathode; 4, pixel definition layer; 5, first via hole; 6, second via hole; 7, third via hole; 8, protective layer; L1, first direction; L2, second direction; D, first contact point; E, second contact point; F, third contact point; G, fourth contact point. DETAILED DESCRIPTION

[0053] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0054] The terms "first", "second", "third" in the embodiments of the present application are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first", "second", "third" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "multiple" is at least two, for example, two, three, etc., unless otherwise explicitly and specifically limited. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but can optionally include steps or units not listed, or can optionally include other steps or units inherent to the process, method, product or device.

[0055] In this document, the reference to "embodiments" means that the specific features, structures or properties described in connection with the embodiments can be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily all refer to the same embodiment, nor is it mutually exclusive or alternative to other embodiments. Those skilled in the art explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0056] Reference is madeFigures 1 to 4 , Figure 1 is a structural schematic diagram of an embodiment of a display panel provided by the first embodiment of the present application, Figure 2 is Figure 1 is a schematic diagram of A1-A2 cross section of the display panel provided by the first embodiment of the present application, Figure 3 is Figure 1 is a schematic diagram of B1-B2 cross section of the display panel provided by the first embodiment of the present application, Figure 4 is Figure 1 is a schematic diagram of C1-C2 cross section of the display panel provided by the first embodiment of the present application.

[0057] Referring to Figures 1 to 4 , the first embodiment of the present application provides a display panel 100, which comprises a substrate 1, a driving circuit layer 2, a plurality of sub-pixels 3 and a pixel definition layer 4. In some embodiments, the display panel 100 is an OLED (Organic Light-Emitting Diode) display panel.

[0058] Among them, the driving circuit layer 2 is arranged on one side of the substrate 1, and the plurality of sub-pixels 3 are arranged on the side of the driving circuit layer 2 away from the substrate 1. Each sub-pixel 3 comprises an anode 31, a light-emitting layer 32 and a cathode 33 arranged in sequence. The pixel definition layer 4 is arranged on the side of the driving circuit layer 2 away from the substrate 1, and defines the positions of the plurality of sub-pixels 3.

[0059] Among them, the driving circuit layer 2 comprises a plurality of first thermoelectric elements 21 and a plurality of second thermoelectric elements 22, and a plurality of first detection lines 23 and a plurality of second detection lines 24. It should be noted that the first thermoelectric element 21 and the second thermoelectric element 22 herein refer to thermoelectric material elements, which are material elements with thermoelectric properties, and are not directly used as thermoelectric devices. The first thermoelectric element 21 and the second thermoelectric element 22 are arranged corresponding to the positions of the pixel definition layer 4, and the Seebeck coefficients of the first thermoelectric element 21 and the second thermoelectric element 22 are different. The Seebeck coefficient is one of the core parameters for measuring the thermoelectric properties of a material, and its physical meaning is "the thermoelectric potential generated at both ends of the material per unit temperature difference".

[0060] At least one of the first thermoelectric element 21 and the second thermoelectric element 22 is arranged around each sub-pixel 3, that is, there can be a part of the sub-pixels 3 around which only the first thermoelectric element 21 is arranged, or there can be a part of the sub-pixels 3 around which only the second thermoelectric element 22 is arranged, or there can be a part of the sub-pixels 3 around which both the first thermoelectric element 21 and the second thermoelectric element 22 are arranged. In two adjacent sub-pixels 3, one of the sub-pixels 3 is arranged around the first thermoelectric element 21, and the other sub-pixel 3 is arranged around the second thermoelectric element 22, and the first thermoelectric element 21 and the second thermoelectric element 22 around at least part of the two adjacent sub-pixels 3 are in contact with each other. Specifically, the two different thermoelectric elements around at least part of the two adjacent sub-pixels 3 are in electrical connection with each other. When there is a bad pixel, the temperature of the bad pixel is different from the temperature of the sub-pixel 3 adjacent to the bad pixel, and since the Seebeck coefficients of the first thermoelectric element 21 and the second thermoelectric element 22 are different, a thermoelectric electromotive force will be generated at the contact point between the first thermoelectric element 21 and the second thermoelectric element 22 around the two adjacent sub-pixels 3.

[0061] Specifically, the first detection line 23 extends along the first direction L1, and a plurality of first detection lines 23 are spaced apart from each other in the second direction L2, and in the second direction L2, at least one sub-pixel 3 is arranged between two adjacent first detection lines 23, and the first detection line 23 is in electrical connection with the contact point of the first thermoelectric element 21 and the second thermoelectric element 22. The second detection line 24 extends along the second direction L2, and a plurality of second detection lines 24 are spaced apart from each other in the first direction L1, and in the first direction L1, at least one sub-pixel 3 is arranged between two adjacent second detection lines 24, and the second detection line 24 is in electrical connection with the contact point of the first thermoelectric element 21 and the second thermoelectric element 22; the first direction L1 and the second direction L2 intersect.

[0062] Specifically, the first direction L1 and the second direction L2 can be perpendicular or not perpendicular. When the first direction L1 and the second direction L2 are perpendicular to each other, the first direction L1 can be a row direction, and the second direction L2 can be a column direction; or the first direction L1 can be a column direction, and the second direction L2 can be a row direction. In some embodiments, in the second direction L2, only one sub-pixel 3 can be arranged between two adjacent first detection lines 23, or two sub-pixels 3 can also be arranged; in some embodiments, in the first direction L1, only one sub-pixel 3 can be arranged between two adjacent second detection lines 24, or two sub-pixels 3 can also be arranged.

[0063] The first detection line 23 and the second detection line 24 are both used to detect the thermoelectric electromotive force at the contact point position of the first thermoelectric element 21 and the second thermoelectric element 22. When a sub-pixel 3 of the display panel 100 has a bad pixel, the temperature of the bad pixel is different from the temperature of the sub-pixels 3 adjacent to the bad pixel in the first direction L1 and the second direction L2. The first detection line 23 and the second detection line 24 corresponding to the contact point position of the first thermoelectric element 21 and the second thermoelectric element 22 around the bad pixel output the thermoelectric electromotive force signal, so that the coordinate position of the bad pixel in the first direction L1 and the second direction L2 can be determined, and the bad pixel can be repaired.

[0064] It can be understood that, by arranging the first thermoelectric element 21 and / or the second thermoelectric element 22 around the sub-pixel 3, the Seebeck coefficients of the first thermoelectric element 21 and the second thermoelectric element 22 are different, and in the adjacent two sub-pixels 3, one of the sub-pixels 3 is arranged with the first thermoelectric element 21, and the other sub-pixel 3 is arranged with the second thermoelectric element 22. The first detection line 23 and the second detection line 24 are respectively electrically connected to the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 along the first direction L1 and the second direction L2. When a sub-pixel 3 of the display panel 100 has a bad pixel, the temperature of the bad pixel is different from the temperature of the sub-pixels 3 adjacent to the bad pixel, and the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 will generate an electromotive force due to the temperature difference. Since the Seebeck coefficients of the first thermoelectric element 21 and the second thermoelectric element 22 are different, the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 will more easily generate an electromotive force based on the Seebeck effect. The first detection line 23 and the second detection line 24 will detect the thermoelectric electromotive force signal at the contact point position of the first thermoelectric element 21 and the second thermoelectric element 22, so as to respectively determine the position of the bad pixel in the second direction L2 and the first direction L1, and accurately determine the specific position of the bad pixel, so as to facilitate the repair of the bad pixel. Through the above arrangement, the problem of low bad pixel detection efficiency and insufficient detection accuracy of the display panel in the related art is solved, and the bad pixel detection can be quickly and accurately realized, the detection cost and time are reduced, the detection efficiency and accuracy are improved, and the targeted repair according to the damage of the sub-pixel 3 is facilitated, and the production efficiency is improved.

[0065] In some embodiments, the plurality of sub-pixels 3 are arranged in an array, and the first direction L1 and the second direction L2 are perpendicular to each other. In a specific embodiment, the first direction L1 is parallel to the column direction, and the second direction L2 is parallel to the row direction. In a specific embodiment, as shown in FIG. 1, the first direction L1 is parallel to the column direction, and the second direction L2 is parallel to the row direction. Figure 1As shown, along the second direction L2, one first detection line 23 is arranged between two adjacent columns of sub-pixels 3, and two columns of sub-pixels 3 are arranged between two adjacent first detection lines 23. That is, the two columns of sub-pixels 3 corresponding to each first detection line 23 and the two columns of sub-pixels 3 corresponding to the first detection line 23 adjacent to it do not overlap. In other embodiments, the first direction L1 can also be parallel to the row direction, the second direction L2 can be parallel to the column direction, or the plurality of sub-pixels 3 can also not be arranged in an array, and the arrangement position of the first detection line 23 can also be adaptively adjusted according to the distribution mode of the sub-pixels 3.

[0066] As shown, for example, Figure 1 As shown, for example, Figure 1 Only four columns of sub-pixels 3 are shown, so two first detection lines 23 are arranged in the four columns of sub-pixels 3. Specifically, along the row direction, the two first detection lines 23 are Test Xn and Test Xn+1 in sequence. Among them, along the row direction, the first first detection line 23, i.e., Test Xn, is located between the first column of sub-pixels 3, i.e., Xn-1, and the second column of sub-pixels 3, i.e., Xn, and the second first detection line 23, i.e., Test Xn+1, is located between the third column of sub-pixels 3, i.e., Xn+1, and the fourth column of sub-pixels 3, i.e., Xn+2.

[0067] Specifically, in an embodiment, in two adjacent rows of sub-pixels 3, only one of the first thermoelectric element 21 and the second thermoelectric element 22 is arranged around each sub-pixel 3 in one of the rows, which is defined as a single-thermoelectric-material row. The plurality of sub-pixels 3 in the single-thermoelectric-material row constitutes a plurality of pixel groups, each pixel group includes two adjacent sub-pixels 3, the sub-pixels 3 in adjacent two pixel groups do not overlap, and the first thermoelectric element 21 and the second thermoelectric element 22 around the two sub-pixels 3 in the same pixel group are in contact and electrically connected. In an embodiment, each first detection line 23 corresponds to a column of pixel groups, and is located between two columns of sub-pixels 3 in a column of pixel groups, and the first detection line 23 is in sequence Electrically connected to a plurality of contact points of the first thermoelectric element 21 and the second thermoelectric element 22 in the same column of pixel groups.

[0068] As shown, for example, Figure 1As shown, the plurality of sub-pixels 3 of the display panel 100 are arranged in five rows and four columns, and each of the sub-pixels 3 in the first, third and fifth rows is provided with only one of the first and second thermoelectric elements 21 and 22, defining the first, third and fifth rows as single-thermoelectric-material rows. Specifically, the thermoelectric elements around the adjacent two sub-pixels 3 in the single-thermoelectric-material row are different, one of the two sub-pixels 3 is provided with the first thermoelectric element 21, and the other sub-pixel 3 is provided with the second thermoelectric element 22. For example, the first and third columns of sub-pixels 3 in the first, third and fifth rows are provided with the first thermoelectric element 21, and the second and fourth columns of sub-pixels 3 are provided with the second thermoelectric element 22. The plurality of sub-pixels 3 in the single-thermoelectric-material row form a plurality of pixel groups, each pixel group includes two adjacent sub-pixels 3, and the sub-pixels 3 in adjacent pixel groups do not overlap. For example, the two sub-pixels 3 in the first and second columns of the single-thermoelectric-material row form a pixel group, and the two sub-pixels 3 in the third and fourth columns form a pixel group, and the four sub-pixels 3 in each row form two pixel groups. The first and second thermoelectric elements 21 and 22 around the two sub-pixels 3 in the same pixel group are in contact and electrically connected with each other, that is, the first thermoelectric element 21 around the first column of sub-pixels 3 in the first, third and fifth rows is in contact and electrically connected with the second thermoelectric element 22 around the second column of sub-pixels 3. Specifically, the contact points of the first and second thermoelectric elements 21 and 22 around the adjacent two sub-pixels 3 in the single-thermoelectric-material row are located between the two sub-pixels 3, that is, the contact points are located at positions corresponding to the pixel definition layer 4.

[0069] Each first detection line 23 corresponds to a column of pixel groups, as shown in FIG. 2. Figure 1 As shown, the four columns of sub-pixels 3 in each single-thermoelectric-material row form two columns of pixel groups, and the two columns of pixel groups correspond to two first detection lines 23. The first detection line 23 in each column of pixel groups corresponds to the two columns of sub-pixels 3 in the column of pixel groups, and the first detection line 23 is in contact and electrically connected with a plurality of contact points of the first and second thermoelectric elements 21 and 22 in the same column of pixel groups in sequence. For example, the first first detection line 23, that is, Test Xn, is in contact and electrically connected with the contact points of the first thermoelectric element 21 around the first column of sub-pixels 3 and the second thermoelectric element 22 around the second column of sub-pixels 3 in the first row, the contact points of the first thermoelectric element 21 around the first column of sub-pixels 3 and the second thermoelectric element 22 around the second column of sub-pixels 3 in the third row, and the contact points of the first thermoelectric element 21 around the first column of sub-pixels 3 and the second thermoelectric element 22 around the second column of sub-pixels 3 in the fifth row in sequence.

[0070] It is understood that in this embodiment, since the first detection line 23 in the same column of pixels connects the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around two adjacent columns of sub-pixels 3 in multiple single thermoelectric material rows, when there is a bad pixel in any one or more single thermoelectric material rows in the same column of pixels, the first detection line 23 located in the pixel group can output a thermoelectric electromotive force signal. Based on the thermoelectric electromotive force signal output by the first detection line 23, the coordinates of the bad pixel in the second direction L2, i.e., the row direction, can be determined.

[0071] For example, such as Figure 1 As shown, let's take the sub-pixel 3 located in the third row and second column as an example of a defective pixel. Specifically, the sub-pixel 3 located in the third row and second column is Pixel unit (Xn, Yn), where (Xn, Yn) are the coordinates of sub-pixel 3, Xn is the coordinate of sub-pixel 3 in the second direction L2 (row direction), and Yn is the coordinate of sub-pixel 3 in the first direction L1 (column direction). In the second direction L2 (row direction), the sub-pixels 3 adjacent to this defective pixel are the sub-pixel 3 located in the third row and first column and the sub-pixel 3 located in the third row and third column, respectively. Specifically, the sub-pixel 3 located in the third row and first column is Pixel unit (Xn-1, Yn), and the sub-pixel 3 located in the third row and third column is Pixel unit (Xn+1, Yn). The contact point between the first thermoelectric element 21 around the sub-pixel 3 in the third row and first column and the second thermoelectric element 22 around the sub-pixel 3 in the third row and second column is defined as the first contact point D, and the contact point between the first thermoelectric element 21 around the sub-pixel 3 in the third row and third column and the second thermoelectric element 22 around the sub-pixel 3 in the third row and fourth column is defined as the second contact point E.

[0072] When the sub-pixel 3 in the second column of the third row is a bad pixel, the temperature of the sub-pixel 3 in the second column of the third row, i.e., the Pixel unit (Xn, Yn), is different from that of the sub-pixels 3 adjacent to it. The temperature of the second thermoelectric element 22 around the Pixel unit (Xn, Yn) is greater than that of the first thermoelectric element 21 around the sub-pixel 3 in the first column of the third row, i.e., the Pixel unit (Xn-1, Yn). A temperature difference electromotive force is generated at the first contact point D, i.e., the contact point between the first thermoelectric element 21 around the sub-pixel 3 in the first column of the third row, i.e., the Pixel unit (Xn-1, Yn), and the second thermoelectric element 22 around the sub-pixel 3 in the second column of the third row, i.e., the Pixel unit (Xn, Yn). The first first detection line 23, i.e., Test Xn, transmits the temperature difference electromotive force signal generated at the first contact point D. At the same time, since the sub-pixel 3 in the second column of the third row is a bad pixel, the temperature of the sub-pixel 3 in the second column of the third row, i.e., the Pixel unit (Xn, Yn), is high. The temperature of the sub-pixel 3 in the third column of the third row, i.e., the Pixel unit (Xn+1, Yn), is also high due to the influence of the temperature of the bad pixel. In the second pixel group in the third row, the temperature of the sub-pixel 3 in the fourth column of the third row, i.e., the Pixel unit (Xn+2, Yn), is lower than that of the sub-pixel 3 in the third column of the third row, i.e., the Pixel unit (Xn+1, Yn), because the sub-pixel 3 in the fourth column of the third row is farther away from the bad pixel than the sub-pixel 3 in the third column of the third row. The temperature of the first thermoelectric element 21 around the sub-pixel 3 in the third column of the third row, i.e., the Pixel unit (Xn+1, Yn), is different from that of the second thermoelectric element 22 around the sub-pixel 3 in the fourth column of the third row, i.e., the Pixel unit (Xn+2, Yn). A temperature difference electromotive force is generated at the second contact point E. The second first detection line 23, i.e., Test Xn+1, transmits the temperature difference electromotive force signal generated at the second contact point E.

[0073] That is, the first first detection line 23, i.e., Test Xn, and the second first detection line 23, i.e., Test Xn+1, both output a thermoelectric power signal, but since the third row and second column pixel unit (Xn, Yn) is the hottest bad pixel, the temperature of the second thermoelectric element 22 around the bad pixel is higher than the temperature of the first thermoelectric element 21 around the third row and third column sub-pixel 3, i.e., the pixel unit (Xn+1, Yn). Therefore, the thermoelectric power signal output by the first first detection line 23, i.e., Test Xn, is greater than the thermoelectric power signal output by the second first detection line 23, i.e., Test Xn+1. Therefore, based on the size of the thermoelectric power signals output by the first first detection line 23, i.e., Test Xn, and the second first detection line 23, i.e., Test Xn+1, it can be determined that the bad pixel is located in the second column in the second direction L2, i.e., the row direction, and the coordinate of the bad pixel in the row direction is Xn. Through the above arrangement, the coordinate position of the bad pixel in the row direction can be effectively determined, thereby facilitating the repair of the bad pixel.

[0074] In some embodiments, the plurality of sub-pixels 3 are arranged in an array, the first direction L1 is perpendicular to the second direction L2, the first direction L1 is parallel to the column direction, and the second direction L2 is parallel to the row direction. Along the first direction L1, i.e., the column direction, one second detection line 24 is arranged between every two adjacent rows of sub-pixels 3, and two rows of sub-pixels 3 are arranged between every two adjacent second detection lines 24. In the adjacent two rows of sub-pixels 3, each sub-pixel 3 in one of the rows is surrounded by a first thermoelectric element 21 and a second thermoelectric element 22, defining a double-thermoelectric-material row. Specifically, in the plurality of sub-pixels 3 in the double-thermoelectric-material row, the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 are in contact with each other, and the first thermoelectric element 21 and the second thermoelectric element 22 around adjacent two sub-pixels 3 do not contact each other.

[0075] Specifically, in an embodiment, the second detection line 24 is located between the adjacent two rows of sub-pixels 3, and the plurality of second detection lines 24 are arranged one-to-one corresponding to the plurality of double-thermoelectric-material rows. Each second detection line 24 is electrically connected to the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around the plurality of sub-pixels 3 in the corresponding double-thermoelectric-material row in sequence, i.e., the same second detection line 24 connects a plurality of contact points in the same double-thermoelectric-material row in series.

[0076] For example, Figure 1As shown, the illustration uses a display panel 100 with multiple sub-pixels 3 arranged in a five-row, four-column configuration as an example. Along the first direction L1 (column direction), a second detection line 24 is positioned between two adjacent rows of sub-pixels 3. Two rows of sub-pixels 3 are positioned between two adjacent second detection lines 24. One of the adjacent rows of sub-pixels 3 is a row of dual thermoelectric materials, and the multiple second detection lines 24 correspond one-to-one with the multiple rows of dual thermoelectric materials. Figure 1 Only five rows of sub-pixels 3 are shown. The first, third, and fifth rows are single thermoelectric material rows. Therefore, there are two rows of double thermoelectric material rows in the five rows of sub-pixels 3. Specifically, the second and fourth rows are double thermoelectric material rows. Two second detection lines 24 are set in the five rows of sub-pixels 3.

[0077] Specifically, such as Figure 1 As shown, a first thermoelectric element 21 and a second thermoelectric element 22 are simultaneously disposed around each sub-pixel 3 in the second and fourth rows, and the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 in the second and fourth rows are electrically connected to each other. For example, as shown... Figure 1 As shown, the shape of sub-pixel 3 is rectangular. The first thermoelectric element 21 around each sub-pixel 3 in the second and fourth rows is arranged corresponding to one side of the sub-pixel 3, and the second thermoelectric element 22 around each sub-pixel 3 is arranged corresponding to three sides of the sub-pixel 3. The contact point of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 in the second row is located between the sub-pixel 3 in the second row and the sub-pixel 3 in the third row. The contact point of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 in the fourth row is located between the sub-pixel 3 in the fourth row and the sub-pixel 3 in the fifth row.

[0078] In the column direction, the two second detection lines 24 are Test Yn and Test Yn+1 in sequence. In an embodiment, in the column direction, the first second detection line 24, i.e., Test Yn, is located between the second row of sub-pixels 3, i.e., Yn-1, and the third row of sub-pixels 3, i.e., Yn, and is arranged corresponding to the second row of sub-pixels 3, and the second first detection line 23, i.e., Test Yn+1, is located between the fourth row of sub-pixels 3, i.e., Yn+1, and the fifth row of sub-pixels 3, i.e., Yn+2, and is arranged corresponding to the fourth row of sub-pixels 3. The first second detection line 24, i.e., Test Yn, is electrically connected to the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around the plurality of sub-pixels 3 in the second row in sequence, and the second second detection line 24, i.e., Test Yn+1, is electrically connected to the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around the plurality of sub-pixels 3 in the fourth row in sequence. The contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 in the second row are located between the second row of sub-pixels 3 and the third row of sub-pixels 3 in correspondence, and the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 in the fourth row are located between the fourth row of sub-pixels 3 and the fifth row of sub-pixels 3 in correspondence, so that when there is a defective pixel in the double thermoelectric material row, the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around the defective pixel generate a thermoelectric electromotive force, and the thermoelectric electromotive force signal is output by the second detection line 24 corresponding to the row where the defective pixel is located, so as to determine the coordinate of the defective pixel in the first direction L1, i.e., the column direction, and further determine the specific coordinate position of the defective pixel, and facilitate the repair of the defective pixel.

[0079] In other embodiments, the first thermoelectric element 21 around each sub-pixel 3 in the second row and the fourth row can also be arranged corresponding to two side edges of the sub-pixel 3, or can be arranged corresponding to any three or half side edges of the sub-pixel 3, the second thermoelectric element 22 around each sub-pixel 3 can be arranged corresponding to two side edges of the sub-pixel 3, or can be arranged corresponding to any one or half side edge of the sub-pixel 3, and the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 can also not be located between the adjacent two rows of sub-pixels 3, for example, the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 can be arranged corresponding to the middle position of the sub-pixel 3 in the column direction. The arrangement position and manner of the first thermoelectric element 21 and the second thermoelectric element 22 can be designed as needed, and the arrangement position of the second detection line 24 can be adaptively adjusted according to the arrangement position of the contact points of the first thermoelectric element 21 and the second thermoelectric element 22 around each row of sub-pixels 3, which is not limited in the embodiments of the present application, as long as the coordinate of the defective pixel in the first direction L1, i.e., the column direction, can be detected by the second detection line 24.

[0080] For example, the contact point of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 in the second row can be set at the middle position of each sub-pixel 3 in the column direction, or it can be set at the position between the sub-pixels 3 in the first row and the second row; similarly, the contact point of the first thermoelectric element 21 and the second thermoelectric element 22 around each sub-pixel 3 in the fourth row can be set at the middle position of each sub-pixel 3 in the column direction, or it can be set at the position between the sub-pixels 3 in the third row and the fourth row; one or three rows of sub-pixels 3 can be set between two adjacent second detection lines 24.

[0081] like Figure 1 As shown, in some embodiments, single thermoelectric material rows and double thermoelectric material rows are alternately arranged along the first direction L1, i.e., the column direction, which makes it easier to determine the coordinate position of the defect.

[0082] For example, such as Figures 1 to 4 As shown, taking the sub-pixel 3 located in the third row and second column, i.e., pixel unit (Xn, Yn), as a defective pixel as an example, the sub-pixel 3 adjacent to this defective pixel in the first direction L1, i.e., the column direction, are the sub-pixel 3 located in the second row and second column and the sub-pixel 3 located in the fourth row and second column, respectively. Specifically, the sub-pixel 3 located in the second row and second column is pixel unit (Xn, Yn-1), and the sub-pixel 3 located in the fourth row and second column is pixel unit (Xn, Yn+1). The contact point between the first thermoelectric element 21 and the second thermoelectric element 22 around the sub-pixel 3 in the second row and second column, i.e., pixel unit (Xn, Yn-1), is defined as the third contact point F, and the contact point between the first thermoelectric element 21 and the second thermoelectric element 22 around the sub-pixel 3 in the fourth row and second column, i.e., pixel unit (Xn, Yn+1), is defined as the fourth contact point G.

[0083] When the sub-pixel 3 in the second column of the third row is a bad pixel, the temperature of the sub-pixel 3 in the second column of the third row, i.e., the Pixel unit (Xn, Yn), is higher. The first thermoelectric element 21 around the sub-pixel 3 in the second column of the second row, i.e., the Pixel unit (Xn, Yn-1), is closer to the bad pixel than the second thermoelectric element 22, and the temperature of the first thermoelectric element 21 is higher than that of the second thermoelectric element 22. A thermoelectric power is generated at a contact point, i.e., the third contact point F, between the first thermoelectric element 21 and the second thermoelectric element 22 around the sub-pixel 3 in the second column of the second row. A first second detection line 24, i.e., Test Yn, arranged corresponding to the sub-pixel 3 in the second row outputs the thermoelectric power signal. Meanwhile, the second thermoelectric element 22 around the sub-pixel 3 in the second column of the fourth row, i.e., the Pixel unit (Xn, Yn+1), is closer to the bad pixel than the first thermoelectric element 21, and the temperature of the second thermoelectric element 22 is higher than that of the first thermoelectric element 21. A thermoelectric power is generated at a contact point, i.e., the fourth contact point G, between the first thermoelectric element 21 and the second thermoelectric element 22 around the sub-pixel 3 in the second column of the fourth row. A second second detection line 24, i.e., Test Yn+1, arranged corresponding to the sub-pixel 3 in the fourth row also outputs the thermoelectric power signal. Based on the fact that the first second detection line 24, i.e., Test Yn, and the second second detection line 24, i.e., Test Yn+1, both output the thermoelectric power signal, it can be determined that the bad pixel is located in the third row in the first direction L1, i.e., the column direction, and the coordinate of the bad pixel in the column direction is Yn. Through the above arrangement, the coordinate position of the bad pixel in the column direction can be effectively determined, thereby facilitating the repair of the bad pixel.

[0084] In other embodiments, when the bad pixel is located in the double thermoelectric material row, for example, the sub-pixel 3 in the second row and the second column, Pixel unit (Xn, Yn-1), when the sub-pixel 3 in the second row and the second column, Pixel unit (Xn, Yn-1), is a bad pixel, the contact point of the first thermoelectric element 21 and the second thermoelectric element 22 around the sub-pixel 3 in the second row and the second column, Pixel unit (Xn, Yn-1), i.e. the third contact point F, will generate a thermoelectric power, and the first second detection line 24, Test Yn, corresponding to the second row of sub-pixels 3 will output the thermoelectric power signal; and since the sub-pixel 3 in the fourth row and the second column, Pixel unit (Xn, Yn+1), is far away from the sub-pixel 3 in the second row and the second column, Pixel unit (Xn, Yn-1), therefore, the temperature of the first thermoelectric element 21 and the second thermoelectric element 22 around the sub-pixel 3 in the fourth row and the second column, Pixel unit (Xn, Yn+1), will not change greatly, and the contact point of the first thermoelectric element 21 and the second thermoelectric element 22 around the sub-pixel 3 in the fourth row and the second column, Pixel unit (Xn, Yn+1), i.e. the fourth contact point G, will not generate a thermoelectric power, and the second second detection line 24, Test Yn+1, corresponding to the fourth row of sub-pixels 3 will not output the thermoelectric power signal, therefore, it can be directly determined that the bad pixel is located in the second row in the first direction L1, i.e. the column direction.

[0085] Meanwhile, the temperatures of the other sub-pixels 3 around the sub-pixel 3 at the defective point, i.e., the sub-pixel 3 at the second row and the second column, Pixel unit (Xn, Yn-1), are affected by the defective point. Therefore, the temperature of the second thermoelectric element 22 around the sub-pixel 3 at the first row and the second column, Pixel unit (Xn, Yn-2), and the temperature of the second thermoelectric element 22 around the sub-pixel 3 at the third row and the second column, Pixel unit (Xn, Yn), are both increased. As a result, a thermoelectric electromotive force signal is generated at the contact point of the second thermoelectric element 22 around the sub-pixel 3 at the first row and the second column, Pixel unit (Xn, Yn-2), and the first thermoelectric element 21 around the sub-pixel 3 at the first row and the first column, Pixel unit (Xn-1, Yn-2), and at the contact point of the second thermoelectric element 22 around the sub-pixel 3 at the third row and the second column, Pixel unit (Xn, Yn), and the first thermoelectric element 21 around the sub-pixel 3 at the third row and the first column, Pixel unit (Xn-1, Yn), i.e., the first contact point D. The first first detection line 23, Test Xn, outputs the thermoelectric electromotive force signal. Meanwhile, the temperature of the first thermoelectric element 21 around the sub-pixel 3 at the first row and the third column, Pixel unit (Xn+1, Yn-2), and the temperature of the first thermoelectric element 21 around the sub-pixel 3 at the third row and the third column, Pixel unit (Xn+1, Yn), are also increased due to the defective point. As a result, a thermoelectric electromotive force signal is generated at the contact point of the first thermoelectric element 21 around the sub-pixel 3 at the first row and the third column, Pixel unit (Xn+1, Yn-2), and the second thermoelectric element 22 around the sub-pixel 3 at the first row and the fourth column, Pixel unit (Xn+2, Yn-2), and at the contact point of the first thermoelectric element 21 around the sub-pixel 3 at the third row and the third column, Pixel unit (Xn+1, Yn), and the second thermoelectric element 22 around the sub-pixel 3 at the third row and the fourth column, Pixel unit (Xn+2, Yn), i.e., the second contact point E. The second first detection line 23, Test Xn+1, outputs the thermoelectric electromotive force signal.

[0086] However, since the distance between the sub-pixel 3, i.e. the Pixel unit (Xn, Yn-1) in the second row and the second column, and the sub-pixel 3, i.e. the Pixel unit (Xn, Yn-2) in the first row and the second column, and the sub-pixel 3, i.e. the Pixel unit (Xn, Yn) in the third row and the second column, is smaller than the distance between the sub-pixel 3, i.e. the Pixel unit (Xn, Yn-1) in the second row and the second column, and the sub-pixel 3, i.e. the Pixel unit (Xn+1, Yn-2) in the first row and the third column, and the sub-pixel 3, i.e. the Pixel unit (Xn+1, Yn) in the third row and the third column, the temperature of the second thermoelectric element 22 around the sub-pixel 3, i.e. the Pixel unit (Xn, Yn-2) in the first row and the second column, and the sub-pixel 3, i.e. the Pixel unit (Xn, Yn) in the third row and the second column, is greater than the temperature of the first thermoelectric element 21 around the sub-pixel 3, i.e. the Pixel unit (Xn+1, Yn-2) in the first row and the third column, and the sub-pixel 3, i.e. the Pixel unit (Xn+1, Yn) in the third row and the third column, and the thermoelectric electromotive force signal output by the first first detection line 23, i.e. Test Xn, is greater than the thermoelectric electromotive force signal output by the second first detection line 23, i.e. Test Xn+1, so that, based on the size of the thermoelectric electromotive force signals output by the first first detection line 23, i.e. Test Xn, and the second first detection line 23, i.e. Test Xn+1, the position of the bad pixel in the second direction L2, i.e. the row direction, can be determined to be in the second column. According to the position of the bad pixel in the first direction L1, i.e. the column direction, and in the second direction L2, i.e. the row direction, the coordinates of the bad pixel can be finally determined as (Xn, Yn-1).

[0087] It can be understood that when the bad pixel is located at other coordinate positions, the specific coordinate position of the bad pixel can also be determined based on the same judgment logic as the above-mentioned manner, so as to facilitate the repair of the bad pixel, which will not be listed here.

[0088] In other embodiments, the first thermoelectric element 21 and the second thermoelectric element 22 and the first detection line 23 and the second detection line 24 around each of the sub-pixels 3 can also adopt other layouts and arrangements as long as the coordinate position of the bad pixel can be detected. For example, the first thermoelectric element 21 and the second thermoelectric element 22 can be arranged around each of the sub-pixels 3 in each row of the sub-pixels 3 of the display panel 100, i.e., each row of the sub-pixels 3 can be a double thermoelectric material row, one second detection line 24 is arranged corresponding to each row of the sub-pixels 3, and one first detection line 23 is arranged corresponding to each column of the sub-pixels 3; or only one of the first thermoelectric element 21 and the second thermoelectric element 22 is arranged around each of the sub-pixels 3 in each row of the sub-pixels 3 of the display panel 100, and one of the first thermoelectric element 21 is arranged around one of the adjacent two sub-pixels 3, and the second thermoelectric element 22 is arranged around the other sub-pixel 3, i.e., each row of the sub-pixels 3 can be a single thermoelectric material row, one second detection line 24 is arranged corresponding to each row of the sub-pixels 3, and one first detection line 23 is arranged corresponding to each column of the sub-pixels 3, and two columns of the sub-pixels 3 are arranged between the adjacent two first detection lines 23. The specific arrangement of the first thermoelectric element 21 and the second thermoelectric element 22 and the first detection line 23 and the second detection line 24 around the sub-pixels 3 can be designed as needed, and the embodiments of the present application do not limit the same.

[0089] In some embodiments, the materials of the first thermoelectric element 21 and the second thermoelectric element 22 are both semiconductor thermoelectric materials, one of the first thermoelectric element 21 and the second thermoelectric element 22 is a P-type semiconductor material, and the other is an N-type semiconductor material. It can be understood that the Seebeck coefficient of the P-type semiconductor material is usually positive, and the Seebeck coefficient of the N-type semiconductor is usually negative. Through the above arrangement, when there is a bad pixel, there is a temperature difference between the first thermoelectric element 21 and the second thermoelectric element 22, a thermoelectric electromotive force signal is generated at the contact position of the first thermoelectric element 21 and the second thermoelectric element 22, the thermoelectric potential of the P-type semiconductor material and the N-type semiconductor material is superimposed, the output voltage is improved, the thermoelectric electromotive force signal is more obvious, and the coordinate position of the bad pixel is more convenient to determine. In other embodiments, the first thermoelectric element 21 and the second thermoelectric element 22 can also be other metals, conductors or other materials with thermoelectric effect.

[0090] In some embodiments, the P-type semiconductor material comprises a P-type Bi2Te3-based semiconductor material; and / or, in some embodiments, the N-type semiconductor material comprises an N-type Bi2Te3-based semiconductor material, or an N-type SnS-based semiconductor material. It can be appreciated that the P-type Bi2Te3-based semiconductor material, the N-type Bi2Te3-based semiconductor material and the N-type SnS-based semiconductor material are all semiconductor thermoelectric materials with excellent room-temperature thermoelectric properties, and are more conducive to generating a strong thermoelectric voltage signal. Specifically, the Seebeck coefficient is denoted by S, and at room temperature, for example, at a temperature of 300 K, the Seebeck coefficient of the P-type Bi2Te3-based semiconductor material is S = 228 μV / K, the Seebeck coefficient of the N-type Bi2Te3-based semiconductor material is generally in the range of -200 μV / K to -250 μV / K, and the Seebeck coefficient of the N-type SnS-based semiconductor material is S = -522 μV / K.

[0091] When there are bad pixels in the plurality of sub-pixels 3, the local temperature at the position of the bad pixel can reach 500 K, while the normal sub-pixels 3 are at room temperature, for example, 300 K, and the temperature difference between the bad pixel and the normal sub-pixel 3 is T, specifically, T can reach 200 K. In an embodiment, the P-type semiconductor material is a P-type Bi2Te3-based semiconductor material, the N-type semiconductor material can be an N-type SnS-based semiconductor material, and the difference between the Seebeck coefficients of the first thermoelectric element 21 and the second thermoelectric element 22 is S, specifically, S is equal to the Seebeck coefficient of the P-type Bi2Te3-based semiconductor material minus the Seebeck coefficient of the N-type SnS-based semiconductor material, and specifically is about 750 μV / K. According to the formula for calculating the thermoelectric voltage: V = S * T, S* T, the calculated thermoelectric voltage at the contact position of the first thermoelectric element 21 and the second thermoelectric element 22 is 0.15 V, which can be detected by a conventional detection tool.

[0092] Specifically, in some embodiments, the specific type of the abnormality can be further confirmed according to the electrical signals output by the first detection line 23 and the second detection line 24, by comparing the electrical signal waveform of the normal sub-pixel 3 with the abnormal waveform library, and then targeted repair can be performed according to the damage of the sub-pixel 3 to avoid affecting the surrounding sub-pixels 3.

[0093] Through the above setting mode, the electrical signal generated by capturing the temperature difference between the normally displayed sub-pixel 3 and the abnormally displayed sub-pixel 3 (bad point) can be accurately positioned to the coordinates of the bad point through positioning twice in the first direction L1 and the second direction L2, and different types of abnormal signals can be collected to reasonably speculate the abnormal type of the bad point, which can improve the repair efficiency.

[0094] Specifically, the conventional bad point detection usually adopts visual detection technology, and the detection of the visual detection technology follows the row-by-row scanning and gray scale contrast principle, and the working time is relatively long. Specifically, the working time is expected to reach two minutes. The above structure and the corresponding detection method provided by the embodiment of the application make up for the shortcomings of the long detection time and the insufficient accuracy of the traditional machine vision detection technology, can quickly and accurately find out the bad points of other types of abnormal sub-pixels 3 and the bad points that cannot be detected by the visual detection technology, and the searching time is relatively short, which is expected to be within 5 seconds, and the further iteration of the bad point detection function of the sub-pixel 3 can be realized. The detection method of the sub-pixel 3 bad point has a positive influence on the product quality, brand influence improvement and production benefit.

[0095] In some embodiments, referring to Figure 1 The driving circuit layer 2 of the display panel 100 further includes a plurality of scan lines 25, a plurality of data lines 26 and a plurality of thin film transistors 27. The scan line 25 is used to control the opening and closing of the thin film transistor 27 in the row, the data line 26 is a signal transmission line, and is used to provide a signal for the sub-pixel 3. The thin film transistor 27 includes a gate 271, a gate insulating layer 272, an active layer 273, a passivation layer 274 and a source-drain layer 277 which are arranged in layers. The source-drain layer 277 includes a source 278 and a drain 279 which are spaced apart from each other. Specifically, the thin film transistor 27 can be a top gate structure, or can also be a bottom gate structure.

[0096] Specifically, the substrate 1 of the display panel 100 is mainly used to support a plurality of functional layers located on one side thereof. The gate insulating layer 272 (GI, Gate Insulator) is used for insulating and protecting the gate 271. The active layer 273 forms a conductive channel of the thin film transistor 27. The passivation layer 274 is used to prevent metal electrode short circuit. The source-drain layer 277 controls the active layer 273 to deliver a signal to the anode 31 of the sub-pixel 3 through the thin film transistor 27. In a specific embodiment, the source 278 is connected to the anode 31 through the third via hole 7. In some embodiments, the thin film transistor 27 further includes an ohmic contact layer 270. The ohmic contact layer 270 is a transition zone of the thin film transistor 27 device and external signals, and is used to reduce the contact resistance.

[0097] The anode 31 of the sub-pixel 3 eliminates electrons and increases holes when current flows through the device, and the holes are then transmitted to the light-emitting layer 32, thereby starting the light-emitting process; the light-emitting layer 32 is used for light emission, and specifically, the light-emitting layer 32 can include a hole transport layer, an organic light-emitting layer, and an electron transport layer; and the cathode 33 is used to provide a current source and inject electrons into the photoelectrically activated layer, thereby causing the light-emitting layer 32 to emit light.

[0098] For example, as shown in FIG. 1, the display panel 100 includes a plurality of sub-pixels 3 arranged in five rows and four columns, and the driving circuit layer 2 includes five scan lines 25 and four data lines 26. Figures 1 to 4 For example, as shown in FIG. 1, the display panel 100 includes a plurality of sub-pixels 3 arranged in five rows and four columns, and the driving circuit layer 2 includes five scan lines 25 and four data lines 26.

[0099] Specifically, in some embodiments, referring to FIG. 2, the first detection line 23 and the data line 26 are arranged in the same layer as the source-drain layer 277 of the thin film transistor 27, the second detection line 24, the scan line 25, the first thermoelectric element 21, and the second thermoelectric element 22 are arranged in the same layer as the gate 271 of the thin film transistor 27, the contact points of the first detection line 23 and the first thermoelectric element 21 and the second thermoelectric element 22 are electrically connected through the first via 5, and the contact points of the second detection line 24 and the first thermoelectric element 21 and the second thermoelectric element 22 can be directly connected. Figures 2 to 4

[0100] In a specific embodiment, the second detection line 24 is arranged in the same layer as the gate 271 of the thin film transistor 27, and the second detection line 24 has the same extension direction as the scan line 25, and the second detection line 24 and the scan line 25 can be prepared by using the same photomask; the first thermoelectric element 21 and the second thermoelectric element 22 are arranged in the same layer as the gate 271 of the thin film transistor 27, and any one of the first thermoelectric element 21 and the second thermoelectric element 22 can be prepared by using the same photomask as the gate 271, which is beneficial to saving cost. In other embodiments, the specific arrangement positions of the first detection line 23, the second detection line 24, the first thermoelectric element 21, and the second thermoelectric element 22 can also use other arrangement manners as long as the coordinates of the defective pixels can be detected.

[0101] In some embodiments, as shown in FIG. 3, the display panel 100 includes a plurality of sub-pixels 3 arranged in five rows and four columns, and the driving circuit layer 2 includes five scan lines 25 and four data lines 26. Figures 5 to 7 ​As shown, the passivation layer 274 includes a first passivation layer 275 and a second passivation layer 276 arranged in a stack, the second detection line 24, the scan line 25, the first thermoelectric element 21, the second thermoelectric element 22, and the gate 271 of the thin film transistor 27 are arranged in the same layer, and the first passivation layer 275 covers the second detection line 24, the scan line 25, the first thermoelectric element 21, the second thermoelectric element 22, and the gate 271 of the thin film transistor 27; the first detection line 23, the data line 26, and the source 278 and the drain 279 of the thin film transistor 27 are arranged in the same layer and are located on the surface of the first passivation layer 275 away from the substrate 1, and the second passivation layer 276 covers the first detection line 23, the data line 26, and the source 278 and the drain 279 of the thin film transistor 27. The second passivation layer 276 is provided with a third via hole 7, and the source 278 is connected to the anode 31 through the third via hole 7 of the second passivation layer 276.

[0102] In some embodiments, the anode 31 of the sub-pixel 3 is an opaque metal material, the cathode 33 is a transparent conductive material, the display panel 100 is a top emission display panel, and the light emitted by the light-emitting layer 32 is emitted from the side of the cathode 33. Specifically, in the present embodiment, the thin film transistor 27 can be arranged corresponding to the position of the pixel definition layer 4, or can be arranged corresponding to the position of the sub-pixel 3.

[0103] In some embodiments, the anode 31 of the sub-pixel 3 is an opaque metal material, the cathode 33 is a transparent conductive material, the display panel 100 is a top emission display panel, and the light emitted by the light-emitting layer 32 is emitted from the side of the cathode 33. Specifically, in the present embodiment, the thin film transistor 27 can be arranged corresponding to the position of the pixel definition layer 4, or can be arranged corresponding to the position of the sub-pixel 3.

[0104] In some embodiments, the display panel 100 further includes a protective layer 8 arranged on the side of the cathode 33 away from the substrate 1. The protective layer 8 can be used to resist external scratches, collisions and impacts, and avoid damage to the internal structure of the display panel 100. At the same time, the protective layer 8 can block pollutants such as dust, water vapor and oil stains from entering the inside of the display panel 100, avoid circuit short circuit, aging or failure of the display panel 100, and at the same time, can guarantee the stability of the optical performance of the display panel 100.

[0105] The specific type of the display panel 100 can be designed as needed, and the present application does not make specific limitations thereto.

[0106] Referring to Figure 5 , Figure 6 is a structure schematic diagram of another embodiment of the display panel provided by the present application, Figure 5 is Figure 7 a partial enlarged schematic diagram of the region O of the display panel provided by the present application, Figure 6 is Figures 5 to 7 a H1-H2 cross-sectional schematic diagram of the display panel provided by the present application.

[0107] Specifically, in an embodiment, the cathode 33 of the sub-pixel 3 is a transparent conductive material, the anode 31 is an opaque metal material, and the display panel 100 is a top emission display panel. Specifically, in the present embodiment, referring to Figure 7 , the cathodes 33 of the plurality of sub-pixels 3 are connected to each other, and the cathode 33 covers the pixel definition layer 4 and the light-emitting layer 32 of the plurality of sub-pixels 3 entirely. As shown in Figure 7 , the first detection line 23 is arranged corresponding to the position of the pixel definition layer 4, and the first detection line 23 is electrically connected to the cathode 33 through the second via hole 6.

[0108] In a specific embodiment, as shown in Figure 5 , the passivation layer 274 includes a first passivation layer 275 and a second passivation layer 276 arranged in layers, the first detection line 23 is arranged on the surface of the first passivation layer 275 away from the substrate 1, the second passivation layer 276 covers the first detection line 23, and the second via hole 6 penetrates the pixel definition layer 4 and the second passivation layer 276, so that the first detection line 23 is electrically connected to the cathode 33 through the second via hole 6.

[0109] It can be understood that, in the present embodiment, by connecting the cathodes 33 of the plurality of sub-pixels 3 to each other, arranging the first detection line 23 corresponding to the position of the pixel definition layer 4, and electrically connecting the first detection line 23 to the cathode 33 through the second via hole 6, the display panel 100 can realize the touch function without adding additional film layers and processes.

[0110] Specifically, in self-induction type capacitance detection, the main detection is the change of the capacitance value between a single electrode and the ground. This type of detection method is commonly used in simple touch button or touch screen applications, and its characteristics are simple structure and low cost. The display panel 100 structure provided by the present embodiment has already arranged the first detection line 23 for detecting the bad points of the sub-pixel 3, and in the present embodiment, by connecting the first detection line 23 to the transparent cathode 33 through the second via hole 6, the first detection line 23 can serve as the touch signal transmission line of the touch panel, saving the cost of additionally adding a touch panel outside the display panel 100, and realizing the integration of the touch function in the display panel 100.

[0111] Specifically, referring to Figure 6 and Figure 6 , the display panel 100 includes a plurality of touch sub-areas, each touch sub-area can include a plurality of sub-pixels 3, and exemplarily, as shown in Figures 8 to 9 , the plurality of sub-pixels 3 in each touch sub-area are arranged in an array, for example, the plurality of sub-pixels 3 in each touch sub-area are arranged in five rows and four columns, and each touch sub-area has twenty sub-pixels 3. In other embodiments, the number and arrangement of the sub-pixels 3 in each touch sub-area can be designed as needed, and the present embodiment does not limit this.

[0112] In this embodiment, the display panel 100 can not only accurately locate the coordinates of the bad pixel, reasonably infer the abnormal type of the bad pixel, and improve the repair efficiency, but also can integrate the self-induction type capacitive touch function, reduce the cost, and improve the product competitiveness.

[0113] In the embodiment of the application, the first thermoelectric element 21 and the second thermoelectric element 22 are provided, although the cost of additional one or two mask plates, mold and process time is required, the number of newly added mask plates can be selected according to the actual detection speed and cost of the product, for example, in the case of ensuring that the detection sensitivity is sufficient to cope with the product use scene, in order to shorten the process time and reduce the mask plate material cost, one of the film layers of the first thermoelectric element 21 and the second thermoelectric element 22 can share the mask plate and material of other film layers (such as the gate 271 of the thin film transistor 27) of the display panel 100, but the selling price of the display panel 100 can be higher than that of the conventional product, the detection accuracy is improved, the product yield is improved, the product quality is improved, the high-quality product is produced, and the production efficiency and brand competitiveness are improved.

[0114] Referring to Figure 8 , Figure 9 is a structural schematic diagram of an embodiment of a display device provided by the second embodiment of the application, Figure 8 is a structural schematic diagram of another embodiment of a display device provided by the second embodiment of the application.

[0115] Referring to Figure 9 and Figure 9 , the second embodiment of the application provides a display device 300, which comprises a display panel 100 and a control circuit 200. Specifically, the display panel 100 can be any one of the display panels 100 described above.

[0116] The control circuit 200 comprises a signal processing unit 201, which is electrically connected with the plurality of first detection lines 23 and the plurality of second detection lines 24 of the display panel 100. The signal processing unit 201 is used to acquire the electrical signals of the plurality of first detection lines 23 and the plurality of second detection lines 24, and to determine whether there is a bad pixel in the plurality of sub-pixels 3 according to the acquired electrical signals, and to determine the position of the bad pixel.

[0117] It can be understood that the electrical signals output by the plurality of first detection lines 23 and the plurality of second detection lines 24 acquired by the signal processing unit 201 of the control circuit 200 can determine whether there is a bad pixel in the sub-pixel 3 corresponding to the first detection line 23 and the second detection line 24, and the specific coordinate position of the bad pixel is determined by the different electrical signals, so as to facilitate the quick, accurate and targeted repair of the bad pixel, and improve the production efficiency and product competitiveness of the display device 300.

[0118] In some implementations, such as ​ As shown, the control circuit 200 further includes a signal amplifier 202. In some embodiments, the signal amplifier 202 is electrically connected between the plurality of first detection lines 23 and the signal processing unit 201, and the electrical signals of the plurality of first detection lines 23 are amplified by the signal amplifier 202 and then transmitted to the signal processing unit 201. And / or, in some embodiments, the signal amplifier 202 is electrically connected between the plurality of second detection lines 24 and the signal processing unit 201, and the electrical signals of the plurality of second detection lines 24 are amplified by the signal amplifier 202 and then transmitted to the signal processing unit 201.

[0119] It is understood that in this embodiment, by providing a signal amplifier 202 between the first detection line 23 and / or the second detection line 24 and the signal processing unit 201, the signal amplifier 202 can adjust the magnitude of the electrical signal transmitted from the first detection line 23 and / or the second detection line 24 to the signal processing unit 201, thereby making signal reading more convenient.

[0120] Specifically, in some implementations, the thermoelectric potential is calculated using the formula: V = S* The calculated thermoelectric potential at the contact point of the first thermoelectric element 21 and the second thermoelectric element 22 is 0.15V, indicating that the thermoelectric potential can be detected by conventional testing tools. The signal processing unit 201 is configured with a corresponding signal amplifier 202 to adjust the signal magnitude for easier signal reading. For example, during normal display, the generated microcurrent will be absorbed by the corresponding ESD unit (electrostatic discharge protection unit) inside the display panel 100. Detection can be performed on a specific screen. The heat difference generated by the first thermoelectric element 21 and the second thermoelectric element 22 is known. The electrical signal generated during normal inspection is treated as noise, and the abnormal signal is picked up during noise reduction processing. The defect detection method of this application embodiment is not limited to pure white screen detection, but can be advanced to R (red), G (green), B (blue) screen and mosaic screen detection. This method provides a more comprehensive and systematic defect detection.

[0121] In other embodiments, the control circuit 200 of the display device 300 may not include the signal amplifier 202, and the signal processing unit 201 may be directly electrically connected to the plurality of first detection lines 23 and the plurality of second detection lines 24. It can be designed as needed, as long as the electrical signals of the plurality of first detection lines 23 and the plurality of second detection lines 24 can be transmitted to the signal processing unit 201. This application embodiment does not limit this.

[0122] The above merely describes the embodiments of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation, or direct or indirect application in other related technical fields, which is made by using the content of the present application specification and drawings, is also included in the patent protection scope of the present application.

Claims

1. A display panel, characterized by, The display panel comprises: a substrate; a driving circuit layer arranged on one side of the substrate; a plurality of sub-pixels arranged on the side of the driving circuit layer away from the substrate, each of the sub-pixels comprising an anode, a light-emitting layer and a cathode arranged in sequence; a pixel definition layer arranged on the side of the driving circuit layer away from the substrate, and defining the positions of the plurality of sub-pixels; wherein the driving circuit layer comprises a plurality of first thermoelectric elements and a plurality of second thermoelectric elements, and a plurality of first detection lines and a plurality of second detection lines; the first thermoelectric elements and the second thermoelectric elements are arranged corresponding to the positions of the pixel definition layer, and the Seebeck coefficients of the first thermoelectric elements and the second thermoelectric elements are different; at least one of the first thermoelectric elements and the second thermoelectric elements is arranged around each of the sub-pixels; in two adjacent sub-pixels, one of the sub-pixels is arranged around the first thermoelectric element, and the other of the sub-pixels is arranged around the second thermoelectric element, and the first thermoelectric elements and the second thermoelectric elements around at least part of the two adjacent sub-pixels are in contact and electrically connected with each other; the first detection lines extend along a first direction, the plurality of first detection lines are spaced apart from each other in a second direction, and in the second direction, at least one of the sub-pixels is arranged between two adjacent first detection lines, and the first detection lines are electrically connected with the contact points of the first thermoelectric elements and the second thermoelectric elements; the second detection lines extend along the second direction, the plurality of second detection lines are spaced apart from each other in the first direction, and in the first direction, at least one of the sub-pixels is arranged between two adjacent second detection lines; the second detection lines are electrically connected with the contact points of the first thermoelectric elements and the second thermoelectric elements; the first direction intersects the second direction.

2. The display panel of claim 1, wherein: the plurality of sub-pixels are arranged in an array, the first direction is perpendicular to the second direction; the first direction is parallel to a column direction, and the second direction is parallel to a row direction; along the second direction, one first detection line is arranged between two adjacent columns of the sub-pixels, and two columns of the sub-pixels are arranged between two adjacent first detection lines; in two adjacent rows of the sub-pixels, each of the sub-pixels in one of the rows is arranged around only one of the first thermoelectric elements and the second thermoelectric elements, and the row is defined as a single thermoelectric material row; the plurality of sub-pixels in the single thermoelectric material row form a plurality of pixel groups, each of the pixel groups comprises two adjacent sub-pixels, the sub-pixels in adjacent pixel groups do not overlap with each other, and the first thermoelectric elements and the second thermoelectric elements around the two sub-pixels in the same pixel group are in contact and electrically connected with each other; each of the first detection lines corresponds to a column of the pixel groups, and is located between two columns of the sub-pixels of the column of the pixel groups, and the first detection line is electrically connected with a plurality of contact points of the first thermoelectric elements and the second thermoelectric elements of the column of the pixel groups in sequence.

3. The display panel of claim 1, wherein: The plurality of sub-pixels are arranged in an array, the first direction and the second direction are perpendicular to each other, the first direction is parallel to a column direction, and the second direction is parallel to a row direction; Along the first direction, one second detection line is arranged between two adjacent rows of the sub-pixels, and two rows of the sub-pixels are arranged between two adjacent second detection lines; In the two adjacent rows of the sub-pixels, the first thermoelectric element and the second thermoelectric element are arranged around each of the sub-pixels in one of the rows, and the row is defined as a double-thermoelectric-material row; The first thermoelectric element and the second thermoelectric element around each of the sub-pixels in the double-thermoelectric-material row are in contact with each other and are electrically connected to each other; The second detection line is arranged between two adjacent rows of the sub-pixels, and a plurality of the second detection lines are arranged in one-to-one correspondence with a plurality of the double-thermoelectric-material rows; and the second detection line is electrically connected to the contact points of the first thermoelectric element and the second thermoelectric element around a plurality of the sub-pixels in the double-thermoelectric-material row in sequence.

4. The display panel of claim 1, wherein: The first thermoelectric element and the second thermoelectric element are both semiconductor thermoelectric materials; One of the first thermoelectric element and the second thermoelectric element is a P-type semiconductor material, and the other is an N-type semiconductor material.

5. The display panel of claim 4, wherein: The P-type semiconductor material includes a P-type Bi2Te3-based semiconductor material; and / or The N-type semiconductor material includes an N-type Bi2Te3-based semiconductor material or an N-type SnS-based semiconductor material.

6. The display panel of any one of claims 1-5, wherein: The driving circuit layer further includes a plurality of scan lines, a plurality of data lines, and a plurality of thin film transistors; the thin film transistors include a gate electrode, a gate insulating layer, an active layer, a passivation layer, and a source-drain electrode layer arranged in layers; The first detection line, the data line, and the source-drain electrode layer are arranged in the same layer; the second detection line, the scan line, the first thermoelectric element, the second thermoelectric element, and the gate electrode are arranged in the same layer; The contact points of the first detection line and the first thermoelectric element and the second thermoelectric element are electrically connected through a first via.

7. The display panel of claim 6, wherein: The cathode is a transparent conductive material, and the anode is a non-transparent metal material; Or, the thin film transistors are arranged at positions corresponding to the pixel definition layer; the cathode is a non-transparent metal material, and the anode is a transparent conductive material.

8. The display panel of claim 7, wherein: The cathode is a transparent conductive material, and the anode is a non-transparent metal material; the cathodes of a plurality of the sub-pixels are electrically connected to each other, and the cathodes cover the pixel definition layer and the light-emitting layer of a plurality of the sub-pixels; The first detection line is arranged at a position corresponding to the pixel definition layer, and the first detection line and the cathode are electrically connected through a second via.

9. A display device, characterized by comprising: The display panel of any one of claims 1-8; and The display panel of any one of claims 1-8; and A control circuit includes a signal processing unit electrically connected to the plurality of first detection lines and the plurality of second detection lines; the signal processing unit is configured to acquire electrical signals of the plurality of first detection lines and the plurality of second detection lines, and determine whether there is a bad pixel in the plurality of sub-pixels according to the acquired electrical signals, and determine a position of the bad pixel.

10. The display device of claim 9, wherein, The control circuit further includes a signal amplifier; The signal amplifier is electrically connected between the plurality of first detection lines and the signal processing unit, and the electrical signals of the plurality of first detection lines are transmitted to the signal processing unit after being amplified by the signal amplifier; and / or The signal amplifier is electrically connected between the plurality of second detection lines and the signal processing unit, and the electrical signals of the plurality of second detection lines are transmitted to the signal processing unit after being amplified by the signal amplifier.

Images