Current anomaly test method and device, equipment, storage medium and program product

Abstract

The embodiment of the invention discloses a current abnormity test method and device, equipment, a storage medium and a program product. In the method, on one hand, a charging interface of to-be-tested equipment is used as a test access point to provide a stable input source for measurement in a complete machine test stage; according to the method, the limitation of the difference of discharge curves of individual batteries on the measurement precision can be avoided, so that the lower limit of detectable quiescent current anomaly is reduced, current anomaly such as weak short circuit and electric leakage which may be missed in a board-level test is effectively captured, and indirect power consumption test on an assembled printed circuit board assembly is realized; and on the other hand, the first power consumption current and the second power consumption current which are obtained before and after assembly are compared and analyzed, so that the individual power consumption current difference can be eliminated, the current abnormity test can be more accurately carried out, and the outflow risk of the current abnormity product can be obviously reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of intelligent wearable devices, in particular to a current abnormality testing method and device, equipment, storage medium and program product. BACKGROUND

[0002] At present, in the manufacturing and testing process of a portable electronic device (for example, an intelligent wearable device), power consumption is a crucial performance index, which is directly related to the endurance of the product, and therefore, the power consumption of the product needs to be tested before it is shipped.

[0003] In the related art, a current meter is usually connected in series in a battery power supply circuit to accurately measure the static consumption current of a printed circuit board assembly (PCBA) at the board level testing stage of the PCBA.

[0004] However, after the PCBA is assembled into a semi-finished product or a finished product, due to various structural reasons, it may not be possible to use the series connection of the current meter between the battery and the PCBA to test the power consumption of the PCBA assembled into a semi-finished product or a finished product, and only by observing the battery power consumption for a period of time can the power consumption current of the PCBA be estimated. However, due to the differences in the discharge curves of individual batteries, only current abnormality conditions of 40uA or more can be observed, and current abnormality conditions of less than 40uA may be missed, which may easily lead to the flow of products with current abnormality, thereby reducing the accuracy of current abnormality testing and failing to accurately intercept the PCBA with current abnormality. SUMMARY

[0005] To solve the above technical problems, the embodiments of the present application provide a current abnormality testing method and device, equipment, storage medium and program product to solve the problem of poor accuracy of current abnormality testing.

[0006] According to an aspect of an embodiment of the present application, a current abnormality testing method is provided, a device to be tested includes a printed circuit board assembly, and the method includes: obtaining a first power consumption current of the printed circuit board assembly at a board level testing stage; collecting a second power consumption current of the printed circuit board assembly at a whole machine testing stage, the second power consumption current being used to represent the consumption current of the printed circuit board assembly when a pre-set input current is detected at the charging interface of the device to be tested, but the device to be tested is in an uncharged state; and comparing the first power consumption current and the second power consumption current to determine whether the printed circuit board assembly has current abnormality.

[0007] In another exemplary embodiment, the step of collecting the second power consumption current of the printed circuit board assembly during the whole machine testing phase includes: configuring the device under test (DUT) to a preset mode so that the DUT is in an uncharged state; or, sending a preset command to the DUT so that the DUT is in an uncharged state; when the DUT is in the uncharged state, directly performing current detection on the charging interface of the DUT to obtain the second power consumption current.

[0008] In another exemplary embodiment, the step of collecting the second power consumption current of the printed circuit board assembly during the whole machine testing phase includes: acquiring the current waveform of the charging interface of the device under test within a preset time period; determining a target current with the same magnitude as a preset charging current threshold from the current waveform, and taking the time corresponding to the target current as the target charging time; determining a target time range in which the device under test is in an uncharged state based on the target charging time; and determining the second power consumption current based on the current data within the target time range.

[0009] In another exemplary embodiment, determining the second power consumption current based on the current data within the target time range includes: identifying the target current that appears most frequently from the current data within the target time range; filtering out abnormal data in the current data within the target time range based on the target current and a preset difference range; averaging the current data after filtering out abnormal data to obtain an average power consumption current; and determining the second power consumption current based on the average power consumption current.

[0010] In another exemplary embodiment, determining the second power consumption current based on the average power consumption current includes: obtaining the average power consumption current for a preset number of times; if the difference between the maximum and minimum values ​​in the average power consumption current for the preset number of times is lower than a preset current threshold, then averaging the average power consumption current for the preset number of times to obtain the second power consumption current.

[0011] In another exemplary embodiment, comparing the first power consumption current and the second power consumption current to determine whether the printed circuit board assembly has an abnormal current includes: if the difference between the first power consumption current and the second power consumption current collected a preset number of times is within a preset threshold range, then it is determined that the printed circuit board assembly does not have an abnormal current; if among the differences between the first power consumption current and the second power consumption current collected a preset number of times, there is a difference outside the preset threshold range, then it is determined that the printed circuit board assembly has an abnormal current.

[0012] In another exemplary embodiment, after comparing the first power consumption current and the second power consumption current to determine whether there is a current abnormality in the printed circuit board assembly, the method further includes: if it is determined that there is a current abnormality in the printed circuit board assembly, adjusting the average power consumption current according to a preset offset value, and using the adjusted current as the minimum ripple amplitude in the current waveform diagram; traversing the current waveform diagram, and when there is a peak in the current waveform diagram that is greater than the minimum ripple amplitude, determining that a ripple has occurred, and counting the number of ripples in the current waveform diagram; and determining the current abnormality region of the printed circuit board assembly based on the number of ripples.

[0013] In another exemplary embodiment, the printed circuit board assembly includes a voltage converter, and determining the current abnormal region of the printed circuit board assembly based on the ripple quantity includes: if the ripple quantity exceeds a preset threshold, determining the current abnormal region of the printed circuit board assembly as a downstream circuit region of the output terminal of the voltage converter; if the ripple quantity is lower than the preset threshold, determining the current abnormal region of the printed circuit board assembly as an upstream circuit region of the input terminal of the voltage converter.

[0014] According to one aspect of the embodiments of this application, a current anomaly testing device is provided, comprising:

[0015] According to one aspect of the embodiments of this application, an electronic device is provided, including: one or more processors; and a storage device for storing one or more programs, which, when executed by the one or more processors, cause the electronic device to implement the current anomaly testing method as described above.

[0016] According to one aspect of the embodiments of this application, a computer-readable storage medium is provided, on which computer-readable instructions are stored, which, when executed by a computer's processor, cause the computer to perform the current anomaly testing method as described above.

[0017] According to one aspect of the embodiments of this application, a computer program product is also provided, the computer program product including computer instructions, which, when executed by a processor, are used to implement the current anomaly testing method as described above.

[0018] In the technical solutions provided by the embodiments of this application, on the one hand, by using the charging interface of the device under test as a test access point to provide a stable input source for measurement during the whole-machine testing stage, the limitation on measurement accuracy due to the differences in individual battery discharge curves can be avoided, thereby reducing the lower limit of detectable static current anomalies and effectively capturing weak short circuits, leakage currents, and other current anomalies that may be missed in board-level testing; and, by detecting the power consumption current under the specific working condition of "having a preset input current, but the device under test is in an uncharged state", indirect power consumption testing of printed circuit board assemblies that have been packaged into a shell after assembly and cannot contact the internal battery circuit can be realized; on the other hand, by comparing and analyzing the first power consumption current and the second power consumption current obtained before and after assembly, the differences in individual power consumption current can be eliminated, thereby conducting current anomaly testing more accurately and significantly reducing the risk of products with current anomalies leaving the market.

[0019] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and do not limit this application. Attached Figure Description

[0020] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application. It is obvious that the drawings described below are merely some embodiments of this application, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings: Figure 1 This is a schematic diagram of an implementation environment related to the current anomaly testing method illustrated in an exemplary embodiment of this application; Figure 2 This is a flowchart illustrating an exemplary embodiment of the current anomaly testing method of this application; Figure 3 yes Figure 2 Step S230 in the illustrated embodiment is a flowchart of a method for determining whether a current anomaly exists in a printed circuit board assembly in an exemplary embodiment; Figure 4 yes Figure 2 Step S220 in the illustrated embodiment is a flowchart of a method for acquiring a second power consumption current in an exemplary embodiment; Figure 5 yes Figure 2 Step S220 in the illustrated embodiment is a flowchart of a method for acquiring a second power consumption current in another exemplary embodiment; Figure 6 This is a schematic diagram of the complete current waveform of the charging interface of the device under test, as shown in an exemplary embodiment of this application. Figure 7This is a schematic diagram of the current waveform of the charging interface during a preset time period, as shown in an exemplary embodiment of this application; Figure 8 yes Figure 5 Step S540 in the illustrated embodiment is a flowchart of a method for determining a second power consumption current based on current data within a target time range in an exemplary embodiment; Figure 9 This is a comparative schematic diagram illustrating the average power consumption current in an exemplary embodiment of this application; Figure 10 This is a flowchart illustrating a current anomaly testing method in another exemplary embodiment of this application; Figure 11 This is an exemplary embodiment of the present application illustrating the application of determining the number of ripples in a current waveform diagram; Figure 12 This is a schematic diagram illustrating a comparison between normal ripple and ripple when there is an abnormal current, as shown in an exemplary embodiment of this application. Figure 13 This is a schematic diagram of the structure of a test fixture shown in an exemplary embodiment of this application; Figure 14 This is a schematic diagram of the structure of a test fixture shown in another exemplary embodiment of this application; Figure 15 This is a schematic diagram of the structure of a current anomaly testing device shown in an exemplary embodiment of this application; Figure 16 A schematic diagram of the structure of a computer system suitable for implementing the electronic device of the present application is shown. Detailed Implementation

[0021] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments identical to those described in this application. Rather, they are merely examples of apparatuses and methods identical to some aspects of this application as detailed in the appended claims.

[0022] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented as application programs, in one or more hardware modules or integrated circuits, or in different models and / or processor devices and / or microcontroller devices.

[0023] The flowcharts shown in the accompanying drawings are merely illustrative and do not necessarily include all content and operations / steps, nor do they necessarily have to be performed in the described order. For example, some operations / steps can be broken down, while others can be combined or partially combined; therefore, the actual execution order may change depending on the specific circumstances.

[0024] It should be noted that "multiple" as mentioned in this application refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0025] Currently, the technical process for product power consumption testing typically includes two main stages: board-level testing and system-wide testing. In the board-level testing stage, the PCBA is not yet assembled, and its static operating current is generally measured directly by connecting a high-precision ammeter in series in the battery power supply circuit to evaluate power consumption performance. However, in the system-wide testing stage, the PCBA has been assembled as a semi-finished or finished product, completely enclosed in a casing, making real-time current monitoring via physical ammeter connection difficult. This limits the ability to continuously detect power consumption anomalies at this stage.

[0026] While accurate measurement of static current can be achieved during board-level testing, existing methods are prone to missing weak current anomalies below 40μA due to individual differences in the discharge characteristics of actual batteries, making it difficult to fully cover all potential power consumption defects.

[0027] After products are assembled into complete units, due to physical structural limitations, the direct current detection method used in the board-level testing stage cannot be used. This can lead to some products with abnormal current flowing into subsequent stages, creating testing blind spots and affecting the overall interception accuracy and product reliability. Therefore, developing a high-precision power consumption testing solution that can cover the entire process and is applicable to different product forms has significant engineering application value.

[0028] Based on this, this application proposes a current anomaly testing method, apparatus, equipment, storage medium, and program product.

[0029] To facilitate understanding of the current anomaly testing method provided in the embodiments of this application, the following is combined with... Figure 1 The implementation environment shown describes a current anomaly testing scenario; specifically, this implementation environment is a current anomaly testing system, such as... Figure 1As shown, the current anomaly testing system includes a device under test (DUT) 110, a test fixture 120, and a terminal 130. The DUT 110, the test fixture 120, and the terminal 130 can be directly or indirectly connected via wired or wireless communication, which is not limited herein.

[0030] Among them, the device under test 110 can be a portable electronic device, such as a smart wearable device. The smart wearable device can include, but is not limited to, smart rings, smartwatches, smartphones (such as Android phones, iOS phones, etc.), tablets, head-mounted devices, etc.

[0031] The test fixture 120 includes a finished test fixture for performing power consumption current testing on the assembled device under test. In this application, the test fixture 120 is used to detect the current at the charging interface of the assembled device under test, thereby obtaining a second power consumption current.

[0032] In some embodiments, the test fixture 120 further includes a modified PCBA charging fixture, which is used to collect the first power consumption current. The original PCBA charging fixture is a dedicated test fixture specifically designed for testing electronic devices with bidirectional charging capabilities (such as Type-C interface devices supporting the USB Power Delivery protocol). Its core function is to simulate the device as a power source (power supply terminal) to test the current and function of the charging and discharging circuit. In this embodiment, the input constant voltage source in the original PCBA charging fixture is replaced with a micropower meter. The micropower meter collects the PCBA current and its instantaneous changes to obtain the first power consumption current. In some embodiments, the micropower meter has a sampling rate exceeding 100 sps.

[0033] Terminal 130 refers to an electronic device used to perform a current anomaly test method. Terminal 130 may include, but is not limited to, devices such as smartphones (e.g., Android phones, iOS phones), tablets, portable personal computers, mobile internet devices (MIDs), smart TVs, in-vehicle devices, and head-mounted devices. Terminal 130 includes a screen, which may be a touchscreen. The screen may include, but is not limited to, display devices such as monitors. In this embodiment of the invention, the screen can display the test results indicating whether there is a current anomaly in the printed circuit board assembly.

[0034] The current anomaly testing method provided in the embodiments of this application will be described in detail below.

[0035] Please continue reading. Figure 2 , Figure 2 This is a flowchart illustrating an exemplary embodiment of a current anomaly testing method according to this application. This method can be applied to...Figure 1 The implementation environment shown is specifically executed by terminal 130 in that implementation environment. It should be understood that this method can also be applied to other exemplary implementation environments and specifically executed by terminal 130 in other implementation environments. This embodiment does not limit the implementation environment to which this method is applicable.

[0036] like Figure 2 As shown, in an exemplary embodiment, the current anomaly testing method includes at least steps S210 to S230, which are described in detail below: Step S210: Obtain the first power consumption current of the printed circuit board assembly during the board-level testing phase.

[0037] It is important to understand that the board-level testing phase refers to a series of electrical and functional tests performed after the printed circuit board (PCB) has been assembled but before it has been installed into the final product housing. The board-level testing phase includes current testing, which checks for short circuits or open circuits in the PCBA. Therefore, in the board-level testing phase, the test object is the PCB assembly before assembly. The first power consumption current in the embodiments of this application can characterize the power consumption current of the PCB assembly when performing single-board testing only on the PCBA before it is installed into a housing and assembled into a semi-finished or finished product.

[0038] In some embodiments, the first power consumption current of the PCBA can be collected by the modified PCBA charging fixture as described above, and then the first power consumption current is recorded and stored in the terminal 130 for comparison with the second power consumption current to determine whether there is an abnormal current in the printed circuit board assembly.

[0039] Step S220: Collect the second power consumption current of the printed circuit board assembly during the whole machine test phase. The second power consumption current is used to represent the current consumed by the printed circuit board assembly when a preset input current is detected at the charging interface of the device under test, but the device under test is not charging.

[0040] It's important to understand that the overall device testing phase refers to the comprehensive testing phase conducted after the PCBA, which has passed board-level testing, is installed into the final casing of the product and all necessary internal components (such as screens, batteries, sensors, antennas, etc.) are connected, assembling it into a semi-finished or finished product. Therefore, in the overall device testing phase, the test object is the assembled device under test (DUT). In the board-level testing phase, the power consumption current of the PCBA can be easily and accurately measured directly using probes or series ammeters. However, in the overall device testing phase, the PCBA is sealed inside the casing, and its power supply circuit can no longer be directly accessed. The DUT can be simply viewed as consisting of a printed circuit board assembly and a battery. The printed circuit board assembly contains a charging chip for controlling battery charging. Therefore, when the DUT is charging, the current input through the charging interface can be divided into two parts: one part is the charging current flowing to the battery, and the other part is the current consumed by the printed circuit board assembly. Therefore, when there is input current at the charging interface of the device under test, as long as the device under test is controlled to be in an uncharged state, that is, the device under test is controlled not to be charged, so that the charging current flowing to the battery is 0, the current measured at this time can be regarded as the second power consumption current.

[0041] Under normal circumstances, when a device under test (DUT) is charging, the process essentially involves "detecting input current → completing internal logic processing → finally sending a start command to the charging chip to begin charging." This process is the response window during which the DUT officially begins charging when an input current is detected at its charging port. This response window lasts approximately 100ms. After 100ms, a command is sent to the charging chip to control the battery to begin charging. Therefore, in this embodiment, the second power consumption current can be obtained using the following two methods: First, the terminal connects to the Bluetooth module of the device under test and configures the device under test to a preset mode (e.g., no charging mode). Alternatively, the terminal sends a preset command to the charging interface, and the charging interface responds to the received preset command to turn off the charging function of the device under test, thereby putting the device under test in a non-charging state. Then, the current of the charging interface at this time can be detected to obtain the second power consumption current.

[0042] Second, by collecting the current during this response window, the current consumed by the printed circuit board assembly, i.e., the non-charging current, can be obtained.

[0043] Step S230: Compare the first power consumption current and the second power consumption current to determine whether there is an abnormal current in the printed circuit board assembly.

[0044] It is understood that the first power consumption current in this embodiment is the power consumption current directly measured by a micro-ammeter before the printed circuit board assembly is assembled into a semi-finished or finished product, while the second power consumption current is the power consumption current indirectly obtained by detecting the current of the charging interface of the device under test after the printed circuit board assembly is assembled into a semi-finished or finished product. Therefore, this embodiment solves the test blind zone and realizes non-destructive testing of semi-finished or finished products. Furthermore, this solution does not rely on an absolute, fixed current threshold to judge abnormalities (e.g., "error if greater than 40uA"). Instead, it adopts a comparative analysis method, comparing the "board-level test data" (first power consumption current) and "whole machine test data" (second power consumption current) of the same PCBA. This method is more sensitive to small current changes, can improve the accuracy of current anomaly testing, and greatly reduce the missed detection rate.

[0045] In some embodiments, combined with Figure 3 As shown, Figure 3 yes Figure 2 The illustrated embodiment shows step S230, a flowchart of a method for determining whether a printed circuit board assembly has a current anomaly in an exemplary embodiment; it includes at least steps S310 to S320, which are described in detail below: Step S310: If the difference between the first power consumption current and the second power consumption current collected for a preset number of times is within the preset threshold range, then it is determined that there is no abnormal current in the printed circuit board assembly.

[0046] Step S320: If there is a difference between the first power consumption current and the second power consumption current collected for a preset number of times that is outside the preset threshold range, then it is determined that there is an abnormal current in the printed circuit board assembly.

[0047] In this embodiment, due to unavoidable factors such as ambient temperature and test fixture contact resistance, there will be extremely small differences between two measurements. By setting a reasonable threshold range, such as a preset threshold range of ±10uA, fluctuations caused by these uncontrollable factors can be included within the threshold range, thereby avoiding false alarms and improving the stability and reliability of the test. When the difference between the two measurements exceeds this threshold range, it can be highly certain that there is a defect in the assembly process (such as component damage, short circuit, poor insulation, etc.), thus accurately triggering a current anomaly alarm, reducing the false alarm rate and improving the accuracy of current anomaly testing. Furthermore, this embodiment can detect short-circuit currents of 10-18uA, which is more sensitive than power consumption testing in traditional methods.

[0048] In some embodiments, if the difference between the maximum and minimum values ​​of the first and second power consumption currents collected over a preset number of tests exceeds 20uA, a retest is required. The retest should be performed after a 10-second delay to avoid misjudgments (such as noise or transient load changes). Failure to wait 10 seconds before retesting may trigger the printed circuit board's reset function, causing it to reset after six power-on / off cycles.

[0049] In some embodiments, combined with Figure 4 As shown, Figure 4 yes Figure 2 The flowchart of step S220 in the illustrated embodiment, which describes a method for acquiring a second power consumption current in an exemplary embodiment, includes at least steps S410 to S420, as detailed below: Step S410: Configure the device under test to a preset mode so that the device under test is in an uncharged state; or, send a preset command to the device under test so that the device under test is in an uncharged state.

[0050] In some embodiments of this application, the device under test (DUT) can be made to be in a non-charging state in the following two ways, that is, to control the DUT to not charge or to turn off the charging function: S1. Connect the Bluetooth module of the device under test to the terminal and configure the device under test to enter a preset mode (e.g., non-charging mode) so that the device under test is in a non-charging state.

[0051] S2. Send a preset command to the charging interface of the device under test through the terminal. The charging interface responds to the received preset command and turns off the charging function of the device under test, so that the device under test is in an uncharged state.

[0052] Step S420: When the device under test is not charging, the current of the charging interface of the device under test is directly detected to obtain the second power consumption current.

[0053] In this embodiment, by placing the device under test in an uncharged state, the charging current of the battery is 0, which eliminates the interference of the charging current on the test. The current measured at the charging interface is entirely used for the operating loss of the printed circuit board assembly itself, so it can be used as the second power consumption current, ensuring the accuracy of the second power consumption current and laying the foundation for accurate comparison with the board-level test data (first power consumption current) in the future. This facilitates the interception of printed circuit board assemblies with minute current anomalies.

[0054] In other embodiments, combined with Figure 5 As shown, Figure 5 yes Figure 2The flowchart of step S220 in the illustrated embodiment is a method for acquiring the second power consumption current in another exemplary embodiment, which includes at least steps S510 to S540, and is described in detail below: Step S510: Obtain the current waveform of the charging interface of the device under test within a preset time period.

[0055] In this embodiment of the application, the preset time period refers to the response window period between the detection of a preset input current at the charging interface and the formal start of charging of the device under test. For example, such as Figure 6 and Figure 7 As shown, Figure 6 This is a schematic diagram of the complete current waveform of the charging interface of the device under test, as illustrated in an exemplary embodiment of this application. Figure 7 This is a schematic diagram of the current waveform of the charging interface during a preset time period, as shown in an exemplary embodiment of this application.

[0056] like Figure 6 and Figure 7 As shown, when the device under test (DUT) is charging, there is essentially a process of "detecting input current → completing internal logic processing → finally sending a start command to the charging chip to begin charging." This process is the response window period from when a preset input current is detected at the charging interface of the DUT until the DUT officially starts charging. In some embodiments, this response window period is approximately 100ms. After 100ms, the charging current will start to rise, reach the preset charging current threshold, and then charging will begin.

[0057] Step S520: Determine the target current, which is the same as the preset charging current threshold, from the current waveform diagram, and take the time corresponding to the target current as the target charging time. In some embodiments, the target charging time refers to the time when the device under test officially starts charging.

[0058] Step S530: Determine the target time range in which the device under test is in an uncharged state based on the target charging time.

[0059] It is understandable that, based on the above Figure 5 and Figure 6 It is known that the process of the current jumping from "not charged" to "start charging" is not vertical, but has a gradual upward process. Therefore, after finding the target charging time, it is necessary to trace back based on the target charging time to ensure that the target time range when the device under test is in the uncharged state is on the flat and stable "uncharged current platform" before the rising edge begins.

[0060] In some embodiments, determining the target time range in which the device under test is in an uncharged state based on the target charging time includes: starting from the target charging time, tracing back a first preset duration to obtain the first boundary time of the target time range; then starting from the first boundary time, tracing back a second preset duration to obtain the second boundary time of the target time range; and taking the time range between the first boundary time and the second boundary time as the target time range in which the device under test is in an uncharged state.

[0061] Understandably, the first preset duration is used to avoid the current rise period. By tracing back the first preset duration from the target charging moment, the first boundary moment of the target time range can be made to fall on the flat and stable "uncharged current plateau" before the current rise edge begins. The second preset duration refers to the duration of the target time range. In some embodiments, the first preset duration is 6ms and the second preset duration is 90ms.

[0062] For example, a target current with the same magnitude as the preset charging current threshold is determined from the current waveform diagram, and the time corresponding to the target current (e.g., 98ms) is taken as the target charging time. Starting from the target charging time of 98ms, a first preset duration of 6ms is traced back to obtain the first boundary time of the target time range as 92ms. Then, starting from the first boundary time of 92ms, a second preset duration of 90ms is traced back to obtain the second boundary time of the target time range as 2ms. At this time, the time range of 2ms between the first boundary time of 92ms and the second boundary time is taken as the target time range in which the device under test is in an uncharged state, that is, [2ms, 92ms].

[0063] Step S540: Determine the second power consumption current based on the current data within the target time range.

[0064] Understandably, once the target time range is determined, it can be guaranteed that the current data within the target range are all on the flat and stable "uncharged current plateau" before the current rising edge begins. Therefore, the current data within the target time range is completely unaffected by the voltage converter startup and high-current charging process. It only reflects the basic power consumption of the printed circuit board assembly in standby mode (i.e., static power consumption or standby power consumption), which ensures the accuracy of the second power consumption current.

[0065] In some embodiments, combined with Figure 8 As shown, Figure 8 yes Figure 5 The flowchart of step S540 in the illustrated embodiment, which is a method for determining a second power consumption current based on current data within a target time range, includes at least steps S810 to S840, as detailed below: Step S810: Calculate the target current that appears most frequently from the current data within the target time range.

[0066] It is understood that, in this embodiment of the application, after determining the target time range in which the device under test is in an uncharged state, the target time range will include current data at multiple moments. However, within the target time range, there may be instances where the printed circuit board components are not idle, such as in Bluetooth communication mode, which can cause a sudden increase in current, resulting in abnormal current values. Since abnormal values ​​are usually rare, the target current that appears most frequently in the current data within the target time range can be used to facilitate outlier filtering based on the target current.

[0067] Step S820: Based on the target current and the preset difference range, filter out abnormal data in the current data within the target time range.

[0068] In this embodiment, the preset difference range includes [X-0.05mA, X] and [X, X+0.15mA], where X represents the target current. Therefore, a filtering range can be determined by the target current and the preset difference range, for example, [X-0.05mA, X+0.15mA]. Current data outside this filtering range are filtered out as abnormal data, which helps to improve the accuracy of power consumption current.

[0069] Step S830: Average the current data after filtering out abnormal data to obtain the average power consumption current.

[0070] In this embodiment of the application, by first filtering out abnormal data and then calculating the average value, the current surge caused by the printed circuit board assembly being in a non-idle state can be avoided, thus ensuring the accuracy of the final determined power consumption current.

[0071] For example, combining Figure 9 As shown, Figure 9 This is a comparative schematic diagram illustrating the average power consumption current in an exemplary embodiment of this application. Figure 9 Within the target time range, if outlier filtering is not performed, the average power consumption current obtained by directly averaging is relatively large, such as... Figure 9 As shown by the lines at the top and middle. Within the target time range, after filtering out outliers, the average power consumption current obtained by averaging is relatively small, such as... Figure 9 As shown by the lines at the bottom center, a clear comparison reveals that the average power consumption current obtained without outlier filtering is significantly higher. Therefore, in this embodiment, by first filtering out outlier data and then calculating the average value, the sudden current surge caused by the printed circuit board components being in a non-idle state can be avoided, thus ensuring the accuracy of the final determined power consumption current.

[0072] Step S840: Determine the second power consumption current based on the average power consumption current.

[0073] In this embodiment, the average power consumption current can be directly used as the second power consumption current, or multiple average power consumption currents can be obtained using the method described above, and then the second power consumption current can be determined based on these multiple average power consumption currents. This avoids the problem of inaccurate power consumption current caused by other abnormal situations.

[0074] In some embodiments, determining the second power consumption current based on the average power consumption current includes: obtaining the average power consumption current for a preset number of times; if the difference between the maximum and minimum values ​​in the average power consumption current for the preset number of times is lower than a preset current threshold, then averaging the average power consumption current for the preset number of times to obtain the second power consumption current.

[0075] For example, the preset number of measurements is 3, and the preset current threshold is 20uA. By collecting the average power consumption current three times, if the difference between the maximum and minimum values ​​does not exceed 20uA, the data is considered valid, and the average of these three average power consumption currents is calculated to obtain the second power consumption current. However, if the difference between the maximum and minimum values ​​exceeds 20uA, the data is considered invalid, possibly due to other abnormal conditions causing inaccurate current measurement. In this case, the average power consumption current can be collected again for the preset number of times, and the second power consumption current can be calculated again.

[0076] It should be noted that the steps in this embodiment are consistent with the corresponding steps in the foregoing embodiments. Therefore, for a detailed description of these steps, please refer to the description in the foregoing embodiments. This embodiment will not repeat them here.

[0077] In other embodiments, combined with Figure 10 As shown, Figure 10 This is a flowchart illustrating a current anomaly testing method in another exemplary embodiment of this application. After comparing the first power consumption current and the second power consumption current to determine whether there is a current anomaly in the printed circuit board assembly, the current anomaly testing method further includes at least steps S1010 to S1030, which are described in detail below: Step S1010: If it is determined that there is an abnormal current in the printed circuit board assembly, the average power consumption current is adjusted according to the preset offset value, and the adjusted current is used as the minimum ripple amplitude in the current waveform diagram.

[0078] It is understood that, in this embodiment of the application, the minimum text amplitude can be obtained by adding a preset offset value to the average power consumption current. In some embodiments, the preset offset value is 0.05mA.

[0079] Step S1020: Traverse the current waveform diagram. When there is a peak in the current waveform diagram that is greater than the minimum amplitude of the ripple, it is determined that a ripple has occurred, and the number of ripples in the current waveform diagram is counted.

[0080] For example, combining Figure 11 As shown, Figure 11 This is an exemplary embodiment of the present application illustrating the application of determining the number of ripples in a current waveform diagram. Figure 11 In the diagram, the lower line represents the average power consumption current, while the upper line represents the minimum ripple amplitude obtained by adjusting the average power consumption current using a preset offset value. Figure 11 It can be seen that within the target time range, the number of peaks exceeding the minimum ripple amplitude in the current waveform is 8.

[0081] In some embodiments, anomalies need to be excluded when counting ripples to improve the accuracy of locating abnormal current regions. For example, the time interval between two ripples should be less than 0.05s and greater than 0.005s. If the occurrence time of the second ripple is greater than 0.05s or less than 0.005s compared to the occurrence time of the first ripple, the second ripple is considered invalid and is not counted.

[0082] Step S1030: Determine the abnormal current region of the printed circuit board assembly based on the ripple quantity.

[0083] In this embodiment, dividing the printed circuit board assembly by the voltage converter yields the upstream circuit region of the voltage converter's input and the downstream circuit region of the voltage converter's output. When a fault occurs in the downstream circuit region, high-power tasks will frequently start or execute at abnormal, irregular intervals. This instantaneous high current demand will severely disrupt the output voltage. The voltage converter's feedback loop detects this voltage drop and attempts to compensate by increasing switching operations. However, this compensation is for random, irregular load changes, not the chip's inherent, regular switching frequency. Therefore, in the current waveform, in addition to normal switching ripple, numerous additional, aperiodic peaks will appear. These peaks correspond to each abnormal load pulse.

[0084] Conversely, when a fault occurs in the upstream circuit area, insufficient or unstable input current will directly cause the voltage converter to fail to perform normal switching operations. The chip may enter a protection state due to input undervoltage, work intermittently, or the switching waveform may be distorted, thereby reducing or even eliminating the original amount of ripple on the current waveform.

[0085] Therefore, in this embodiment of the application, the abnormal current area can be determined by statistically analyzing the "number of ripples" within the target time range, which facilitates the user in locating the fault for repair.

[0086] In some embodiments, the printed circuit board assembly includes a voltage converter. Determining a current abnormality region of the printed circuit board assembly based on the ripple quantity includes: if the ripple quantity exceeds a preset threshold, determining the current abnormality region of the printed circuit board assembly as a downstream circuit region of the output terminal of the voltage converter; if the ripple quantity is lower than the preset threshold, determining the current abnormality region of the printed circuit board assembly as an upstream circuit region of the input terminal of the voltage converter.

[0087] In this embodiment, the fault area is located by the number of ripple waves, realizing an automated and non-invasive preliminary fault location method. There is no need to immediately use an oscilloscope to measure each node individually; simply analyzing the current waveform characteristics can quickly narrow down the fault area to the circuit region "before the voltage converter" or "after the voltage converter."

[0088] In some embodiments, the preset threshold for the number of ripples is 20. For example, when a current anomaly is determined in a printed circuit board assembly, if the number of ripples in the current waveform within the target time range exceeds 20, the current anomaly region of the printed circuit board assembly is determined to be the downstream circuit region of the voltage converter's output; if the number of ripples in the current waveform within the target time range is less than 20, the current anomaly region of the printed circuit board assembly is determined to be the upstream circuit region of the voltage converter's input.

[0089] In some embodiments, the presence of a current anomaly can also be determined by the number of ripples, including: acquiring the number of ripples; if the number of ripples exceeds a preset threshold, then determining that there is a current anomaly in the printed circuit board assembly; if the number of ripples is lower than the preset threshold, then determining that there is no current anomaly in the printed circuit board assembly.

[0090] In this embodiment, the voltage converter is a DC / DC converter used to convert one DC voltage into another. For example, the DC / DC converter can be a 1.9V DC / DC converter, which will turn on at different cycles when the current is large and the current is small. Different ripple cycles (or the number of ripples per unit time) can be detected at the interface. By extracting the number of ripples, it is possible to sensitively detect whether there is a short circuit current of more than 10uA at the 1.9V input terminal, thereby determining whether there is an abnormal current in the printed circuit board assembly.

[0091] For example, combining Figure 12 As shown, Figure 12 This is a schematic diagram illustrating a comparison between normal ripple and ripple when an abnormal current exists, as shown in an exemplary embodiment of this application.Figure 12 As can be seen, under normal circumstances, the number of ripples in the current waveform is lower than the preset threshold (e.g., 20). However, when there is an abnormal current in the printed circuit board assembly, the number of ripples in its current waveform will increase significantly. Therefore, by detecting the number of ripples, it is possible to sensitively detect whether there is an abnormal current in the printed circuit board assembly.

[0092] It should be noted that the steps in this embodiment are consistent with the corresponding steps in the foregoing embodiments. Therefore, for a detailed description of these steps, please refer to the description in the foregoing embodiments. This embodiment will not repeat them here.

[0093] In some embodiments, combined with Figure 13 As shown, Figure 13 This is a schematic diagram of the structure of a test fixture shown in an exemplary embodiment of this application. Figure 13 The system includes a test fixture 1201 and a printed circuit board assembly 1101. In some embodiments, the test fixture 1201 in this application embodiment is specifically used for directly connecting and testing the current of the printed circuit board assembly 1101. The test fixture 1201 can be a test fixture obtained by modifying a PCBA charging fixture. The test fixture 1201 is directly connected to the printed circuit board assembly 1101 and includes a battery simulator, a serial-to-USB module, a positive / negative switching circuit, and a micro-power meter. The battery simulator is connected to the positive terminal VBAT and the ground terminal GND of the printed circuit board assembly 1101, respectively, and is used to supply power to the printed circuit board assembly 1101. The test fixture 1201 is connected to interfaces VIN1 and VIN2 of the printed circuit board assembly 1101 to detect the power consumption current of the printed circuit board assembly 1101, directly acquiring the current of interfaces VIN1 and VIN2 of the printed circuit board assembly 1101 to obtain the first power consumption current.

[0094] In some embodiments, combined with Figure 14 As shown, Figure 14 This is a schematic diagram of the structure of a test fixture shown in another exemplary embodiment of this application. Figure 14 The system includes a test fixture 1202 and an assembled device under test (DUT) 110. The test fixture 1202 includes a serial-to-USB module, a positive / negative switching circuit, and a micro-power meter. The test fixture 1202 is connected to interfaces VIN1 and VIN2 of the assembled DUT 110 to detect the power consumption current of the printed circuit board assembly 1101, directly acquiring the current at interfaces VIN1 and VIN2 of the DUT 110 to obtain a second power consumption current.

[0095] Combination Figure 15 As shown, Figure 15This is a structural diagram illustrating a current anomaly testing device according to an exemplary embodiment of this application. This current anomaly testing device can be applied to... Figure 1 The implementation environment shown, for example, the current anomaly testing device can be specifically configured as follows: Figure 1 Terminal 130 in the illustrated implementation environment. Of course, this current anomaly testing device can also be applied to other exemplary implementation environments and specifically configured in the backend. This embodiment does not limit the implementation environment to which the device is applicable.

[0096] like Figure 15 As shown, the exemplary current anomaly testing device includes: an acquisition module 1510, a data acquisition module 1520, and a determination module 1530. The acquisition module 1510 is configured to acquire a first power consumption current of the printed circuit board assembly during board-level testing; the data acquisition module 1520 is configured to acquire a second power consumption current of the printed circuit board assembly during whole-machine testing, the second power consumption current representing the current consumed by the printed circuit board assembly when a preset input current is detected at the charging interface of the device under test, but the device under test is not charging; the determination module 1530 is configured to compare the first power consumption current and the second power consumption current to determine whether there is a current anomaly in the printed circuit board assembly.

[0097] In this embodiment, by employing this exemplary current anomaly testing device, on the one hand, by using the charging interface of the device under test as a test access point to provide a stable input source for measurement during the whole-machine testing stage, the limitations on measurement accuracy due to individual battery discharge curve differences can be avoided, thus lowering the lower limit of detectable static current anomalies and effectively capturing weak short circuits, leakage currents, and other current anomalies that may be missed during board-level testing; and, by detecting the power consumption current under the specific condition of "having a preset input current, but the device under test is in an uncharged state," indirect power consumption testing of printed circuit board assemblies that have been packaged into a housing after assembly and cannot access the internal battery circuit is achieved; on the other hand, by comparing and analyzing the first power consumption current and the second power consumption current obtained before and after assembly, current anomaly testing can be performed more accurately, thereby significantly reducing the risk of products with current anomalies leaving the market.

[0098] In another exemplary embodiment, the acquisition module 1520 is configured to acquire the second power consumption current of the printed circuit board assembly during the whole machine testing phase by: configuring the device under test (DUT) to a preset mode so that the DUT is in an uncharged state; or sending a preset command to the DUT so that the DUT is in an uncharged state; and when the DUT is in an uncharged state, directly performing current detection on the charging interface of the DUT to obtain the second power consumption current.

[0099] In another exemplary embodiment, the acquisition module 1520 is configured to acquire the second power consumption current of the printed circuit board assembly during the whole-machine testing phase by: acquiring the current waveform of the charging interface of the device under test within a preset time period; determining a target current with the same magnitude as a preset charging current threshold from the current waveform, and taking the time corresponding to the target current as the target charging time; determining a target time range in which the device under test is in an uncharged state based on the target charging time; and determining the second power consumption current based on the current data within the target time range.

[0100] In another exemplary embodiment, the acquisition module 1520 is further configured to determine a second power consumption current based on current data within a target time range by: statistically identifying the target current that appears most frequently from the current data within the target time range; filtering out abnormal data in the current data within the target time range based on the target current and a preset difference range; averaging the current data after filtering out abnormal data to obtain an average power consumption current; and determining the second power consumption current based on the average power consumption current.

[0101] In another exemplary embodiment, the acquisition module 1520 is further configured to determine the second power consumption current based on the average power consumption current in the following manner: acquiring the average power consumption current for a preset number of times; if the difference between the maximum and minimum values ​​in the average power consumption current for the preset number of times is lower than a preset current threshold, then averaging the average power consumption current for the preset number of times to obtain the second power consumption current.

[0102] In another exemplary embodiment, the determining module 1530 is configured to compare the first power consumption current and the second power consumption current to determine whether there is a current abnormality in the printed circuit board assembly, including: if the difference between the first power consumption current and the second power consumption current collected a preset number of times is within a preset threshold range, then it is determined that there is no abnormal current in the printed circuit board assembly; if there is a difference between the first power consumption current and the second power consumption current collected a preset number of times that is outside the preset threshold range, then it is determined that there is a current abnormality in the printed circuit board assembly.

[0103] In another exemplary embodiment, the determining module 1530 is further configured to, after comparing the first power consumption current and the second power consumption current to determine whether there is a current abnormality in the printed circuit board assembly, if it is determined that there is a current abnormality in the printed circuit board assembly, adjust the average power consumption current according to a preset offset value, and use the adjusted current as the minimum ripple amplitude in the current waveform diagram; traverse the current waveform diagram, and when there is a peak in the current waveform diagram that is greater than the minimum ripple amplitude, determine that a ripple has occurred, and count the number of ripples in the current waveform diagram; determine the current abnormality area of ​​the printed circuit board assembly based on the number of ripples.

[0104] In another exemplary embodiment, the printed circuit board assembly includes a voltage converter, and the determining module 1530 is further configured to determine a current abnormality region of the printed circuit board assembly based on the ripple quantity in the following manner: if the ripple quantity exceeds a preset threshold, then determine that the current abnormality region of the printed circuit board assembly is a downstream circuit region of the output terminal of the voltage converter; if the ripple quantity is lower than the preset threshold, then determine that the current abnormality region of the printed circuit board assembly is an upstream circuit region of the input terminal of the voltage converter.

[0105] It should be noted that the current anomaly testing device and the current anomaly testing method provided in the above embodiments belong to the same concept. The specific operation methods of each module and unit have been described in detail in the method embodiments and will not be repeated here. In practical applications, the current anomaly testing device provided in the above embodiments can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. This is not a limitation here.

[0106] Embodiments of this application also provide an electronic device, including: one or more processors; and a storage device for storing one or more programs, which, when executed by the one or more processors, cause the electronic device to implement the current anomaly testing method provided in the above embodiments.

[0107] Figure 16 A schematic diagram of a computer system suitable for implementing the embodiments of this application is shown. It should be noted that... Figure 16 The computer system 1600 of the electronic device shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of this application.

[0108] like Figure 16 As shown, the computer system 1600 includes a Central Processing Unit (CPU) 1601, which can perform various appropriate actions and processes based on programs stored in Read-Only Memory (ROM) 1602 or programs loaded from storage portion 1608 into Random Access Memory (RAM) 1603, such as performing the methods described in the above embodiments. Various programs and data required for system operation are also stored in RAM 1603. The CPU 1601, ROM 1602, and RAM 1603 are interconnected via bus 1604. An Input / Output (I / O) interface 1605 is also connected to bus 1604.

[0109] The following components are connected to I / O interface 1605: an input section 1606 including a keyboard, mouse, etc.; an output section 1607 including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and speakers, etc.; a storage section 1608 including a hard disk, etc.; and a communication section 1609 including a model interface card such as a LAN (Local Area Network) card, modem, etc. The communication section 1609 performs communication processing via a model such as the Internet. A drive 1610 is also connected to I / O interface 1605 as needed. Removable media 1611, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., are installed on drive 1610 as needed so that computer programs read from them can be installed into storage section 1608 as needed.

[0110] Specifically, according to embodiments of this application, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of this application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program including a computer program for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from the model via communication section 1609, and / or installed from removable medium 1611. When the computer program is executed by central processing unit (CPU) 1601, it performs various functions defined in the system of this application.

[0111] It should be noted that the computer-readable medium shown in the embodiments of this application can be a computer-readable signal medium or a computer-readable storage medium, or any combination of the two. A computer-readable storage medium can be, for example, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of a computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), flash memory, optical fiber, portable compact disc read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this application, a computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, carrying a computer-readable computer program. Such propagated data signals can take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media can also be any computer-readable medium other than computer-readable storage media, which can send, propagate, or transmit a program for use by or in connection with an instruction execution system, apparatus, or device. The computer program contained on the computer-readable medium can be transmitted using any suitable medium, including but not limited to wireless, wired, etc., or any suitable combination thereof.

[0112] Another aspect of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the current anomaly testing method as described above. This computer-readable storage medium may be included in the electronic device described in the above embodiments, or it may exist independently and not assembled into the electronic device.

[0113] Another aspect of this application provides a computer program product or computer program including computer instructions stored in a computer-readable storage medium. A processor of a computer device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the computer device to perform the current anomaly testing method provided in the various embodiments described above.

[0114] The above description is merely a preferred exemplary embodiment of this application and is not intended to limit the implementation of this application. Those skilled in the art can easily make corresponding modifications or alterations based on the main concept and spirit of this application. Therefore, the scope of protection of this application should be determined by the scope of protection claimed in the claims.

[0115] It is understood that in the specific implementation of this application, data related to power consumption and current are involved. When the above embodiments of this application are applied to specific products or technologies, user permission or consent is required, and the collection, use and processing of related data must comply with the relevant laws, regulations and standards of the relevant countries and regions.

Claims

1. A method for testing abnormal current, characterized in that, The device under test includes a printed circuit board assembly, and the method includes: Obtain the first power consumption current of the printed circuit board assembly during the board-level testing phase; The second power consumption current of the printed circuit board assembly is collected during the whole machine test phase. The second power consumption current is used to represent the current consumed by the printed circuit board assembly when a preset input current is detected at the charging interface of the device under test, but the device under test is in an uncharged state. The first power consumption current and the second power consumption current are compared to determine whether there is an abnormal current in the printed circuit board assembly.

2. The method according to claim 1, characterized in that, The acquisition of the second power consumption current of the printed circuit board assembly during the overall testing phase includes: Configure the device under test to a preset mode so that the device under test is in an uncharged state; or, send a preset command to the device under test so that the device under test is in an uncharged state. When the device under test is in the non-charging state, the current of the charging interface of the device under test is directly detected to obtain the second power consumption current.

3. The method according to claim 1, characterized in that, The acquisition of the second power consumption current of the printed circuit board assembly during the overall testing phase includes: Obtain the current waveform of the charging interface of the device under test within a preset time period; The target current, which is the same as the preset charging current threshold, is determined from the current waveform diagram, and the time corresponding to the target current is taken as the target charging time. Determine the target time range within which the device under test is in an uncharged state based on the target charging time. The second power consumption current is determined based on the current data within the target time range.

4. The method according to claim 3, characterized in that, Determining the second power consumption current based on the current data within the target time range includes: The target current that appears most frequently is identified from the current data within the target time range; Based on the target current and the preset difference range, abnormal data in the current data within the target time range are filtered out; The average power consumption current is obtained by averaging the current data after filtering out abnormal data. The second power consumption current is determined based on the average power consumption current.

5. The method according to claim 4, characterized in that, Determining the second power consumption current based on the average power consumption current includes: Obtain the average power consumption current after a preset number of cycles; If the difference between the maximum and minimum values ​​of the average power consumption current for the preset number of times is lower than the preset current threshold, then the average power consumption current for the preset number of times is averaged to obtain the second power consumption current.

6. The method according to claim 1, characterized in that, The step of comparing the first power consumption current and the second power consumption current to determine whether there is a current abnormality in the printed circuit board assembly includes: If the difference between the first power consumption current and the second power consumption current collected for a preset number of times is within a preset threshold range, then it is determined that there is no abnormal current in the printed circuit board assembly. If any difference between the first power consumption current and the second power consumption current collected over a preset number of times falls outside the preset threshold range, then it is determined that the printed circuit board assembly has an abnormal current.

7. The method according to claim 4, characterized in that, After comparing the first power consumption current and the second power consumption current to determine whether there is a current abnormality in the printed circuit board assembly, the method further includes: If it is determined that there is an abnormal current in the printed circuit board assembly, the average power consumption current is adjusted according to a preset offset value, and the adjusted current is used as the minimum ripple amplitude in the current waveform diagram. Traverse the current waveform diagram. When there is a peak in the current waveform diagram that is greater than the minimum amplitude of the ripple, it is determined that a ripple has occurred, and the number of ripples in the current waveform diagram is counted. The abnormal current region of the printed circuit board assembly is determined based on the ripple count.

8. The method according to claim 7, characterized in that, The printed circuit board assembly includes a voltage converter, and determining the abnormal current region of the printed circuit board assembly based on the ripple quantity includes: If the number of ripples exceeds a preset threshold, the abnormal current region of the printed circuit board assembly is determined to be the downstream circuit region of the output terminal of the voltage converter. If the ripple count is lower than the preset threshold, then the abnormal current region of the printed circuit board assembly is determined to be the upstream circuit region of the input terminal of the voltage converter.

9. A current anomaly testing device, characterized in that, The device under test includes a printed circuit board assembly, and the apparatus includes: The acquisition module is configured to acquire the first power consumption current of the printed circuit board assembly during the board-level testing phase; The acquisition module is configured to acquire the second power consumption current of the printed circuit board assembly during the whole machine testing phase. The second power consumption current is used to represent the current consumed by the printed circuit board assembly when a preset input current is detected at the charging interface of the device under test, but the device under test is in an uncharged state. The determination module is configured to compare the first power consumption current and the second power consumption current to determine whether there is a current abnormality in the printed circuit board assembly.

10. An electronic device, characterized in that, include: One or more processors; A storage device for storing one or more programs, which, when executed by the one or more processors, cause the electronic device to implement the current anomaly testing method as described in any one of claims 1 to 8.

11. A computer-readable storage medium, characterized in that, It stores computer-readable instructions that, when executed by the computer's processor, cause the computer to perform the current anomaly testing method according to any one of claims 1 to 8.

12. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the current anomaly testing method according to any one of claims 1 to 8.

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