Impact test method, device and equipment for solid state disk and storage medium

Abstract

The invention discloses an impact test method and device for a solid state disk, equipment and a storage medium. The method comprises the following steps: constructing a corresponding digital twin model for a to-be-tested solid state disk sample of each test group, pre-simulating an impact process of the to-be-tested solid state disk sample of each test group based on the constructed digital twin model, and adjusting an impact working condition parameter of the to-be-tested solid state disk sample of each test group based on a pre-simulation result; based on the adjusted impact working condition parameters, applying an impact load to the to-be-tested solid state disk sample of each test group by adopting step increasing type impact energy, and monitoring electric signal parameters and functional state parameters of the to-be-tested solid state disk sample of each test group in real time; and carrying out transient fault diagnosis and data integrity pressure test on the to-be-tested solid state disk sample of each test group based on a monitoring result, and identifying an impact fault sample of the to-be-tested solid state disk of each test group. According to the invention, the efficiency of the solid state disk impact test is effectively improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of solid state disks, in particular to a shock test method, device and equipment of a solid state disk and a storage medium. BACKGROUND

[0002] With the rapid development of information technology, as a new type of storage medium, solid state disks have gradually replaced traditional mechanical hard disks in various electronic devices. Due to its high read / write speed, low power consumption and shock resistance, solid state disks are widely used in personal computers, servers, data centers, mobile storage devices and other fields, and have become a key component in modern data storage systems. However, although solid state disks have a long service life, their performance may gradually decline during long-term operation, and even fail, affecting the stability and security of data storage. At present, the fault prediction and test of solid state disks mainly rely on real-time monitoring and data analysis of the health status of the hard disk. Common methods include empirical analysis based on hard disk health indicators, and identifying potential problems through regular stress tests. However, these methods are difficult to meet the efficiency and accuracy requirements of fault detection for modern storage devices.

[0003] Therefore, how to improve the efficiency of the shock test of the solid state disk is a technical problem to be solved. SUMMARY

[0004] The present application provides a solid state disk shock test method, device, equipment and storage medium to solve the technical problem of low efficiency of the existing solid state disk shock test.

[0005] In a first aspect, the present application provides a solid state disk shock test method, comprising: Obtaining a solid state disk sample to be tested, and dividing the solid state disk sample to be tested into several test groups according to different test environments; Constructing a corresponding digital twin model for the solid state disk sample to be tested of each test group, pre-simulating the shock process of the solid state disk sample to be tested of each test group based on the constructed digital twin model, and adjusting the shock condition parameters of the solid state disk sample to be tested of each test group based on the results of the pre-simulation; Based on the adjusted shock condition parameters, a stepwise increasing shock energy is used to apply shock load to the solid state disk sample to be tested of each test group, and the electrical signal parameters and functional state parameters of the solid state disk sample to be tested of each test group are monitored in real time; Based on the real-time monitored electrical signal parameters and functional state parameters of the solid state disk sample to be tested of each test group, the solid state disk sample to be tested of each test group is subjected to instantaneous fault diagnosis and data integrity stress test, and the shock fault samples of the solid state disk of each test group are identified.

[0006] Optionally, the method further comprises: constructing a corresponding digital twin model for each test group of the to-be-tested solid state disk samples, pre-simulating the impact process of each test group of the to-be-tested solid state disk samples based on the constructed digital twin model, and adjusting the impact working condition parameters of each test group of the to-be-tested solid state disk samples based on the pre-simulation result, including: extracting the geometric structure and material properties of each test group of the to-be-tested solid state disk samples, and constructing a three-dimensional digital model corresponding to each test group of the to-be-tested solid state disk samples; constructing a digital twin model of each test group of the to-be-tested solid state disk samples based on the constructed three-dimensional digital model, the simulated impact table model and the multi-channel data acquisition model; performing pre-simulation impact testing in the digital twin model of each test group of the to-be-tested solid state disk samples, and adjusting the impact load waveform parameters of each test group of the to-be-tested solid state disk samples based on the pre-simulation result.

[0007] Optionally, the method further comprises: constructing a digital twin model of each test group of the to-be-tested solid state disk samples based on the constructed three-dimensional digital model, the simulated impact table model and the multi-channel data acquisition model, including: importing the constructed three-dimensional digital model into a simulation environment of a corresponding test group impact scene, establishing a finite element analysis grid containing a printed circuit board, a storage chip and a controller chip, and constructing a simulated impact table model and a multi-channel data acquisition model corresponding to the finite element analysis grid; configuring dynamic parameters of the constructed simulated impact table model, the dynamic parameters including a pre-set impact waveform type, a pulse duration and a peak acceleration; configuring virtual sensors at pre-set key positions of each test group of the to-be-tested solid state disk samples, monitoring stress parameters in the impact process of the to-be-tested solid state disk samples through the virtual sensors, and inputting the collected stress parameters into the multi-channel data acquisition model; establishing a real-time data interaction interface between the finite element analysis grid, the simulated impact table model and the multi-channel data acquisition model, and integrating the digital twin model of each test group of the to-be-tested solid state disk samples.

[0008] Optionally, the method further comprises: applying impact loads to each test group of the to-be-tested solid state disk samples by using a step-incremental impact energy based on the adjusted impact working condition parameters, and monitoring the electrical signal parameters and the functional state parameters of each test group of the to-be-tested solid state disk samples in real time, including: configuring an initial impact energy, an energy increment step and a test termination condition of the step-incremental impact energy based on the pre-simulation adjusted impact working condition parameters of the digital twin model; Based on the configured step-incremental impact energy, initial impact energy, energy increment step size, and test termination conditions, impact loads are applied to the solid-state drive samples under test in each test group, and the electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group are monitored simultaneously.

[0009] Optionally, based on the configured stepped-incremental impact energy, energy increment step size, and test termination conditions, impact loads are applied to the solid-state drive samples under test in each test group, and the electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group are monitored simultaneously, including: Based on the preset initial impact energy, energy increment step size and test termination conditions, configure the energy increment sequence of the solid-state drive samples under test for each test group; According to the energy increment sequence of the solid-state drive samples under test in each test group, an impact load is applied to the solid-state drive samples under test in each test group, and the electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group are monitored simultaneously. Establish the correlation mapping relationship between the electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group to obtain a time-series feature database for fault analysis.

[0010] Optionally, based on the real-time monitored electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group, instantaneous fault diagnosis and data integrity stress testing are performed on the solid-state drive samples under test in each test group to identify impact failure samples of the solid-state drives under test in each test group, including: Based on real-time monitored electrical signal parameters and functional status parameters, the transient fault modes of the solid-state drive samples under test in each test group are identified by a threshold comparison algorithm. The transient fault modes include abnormal drop in power supply voltage, interface signal interruption, and read / write command timeout. Perform read and write verification operations on the solid-state drive samples under test in each test group to obtain the data integrity test results of the solid-state drive samples under test in each test group. Establish a fault feature library for the solid-state drive samples under test in each test group, perform correlation analysis between the identified instantaneous fault modes and data integrity test results, and determine the failure level of the solid-state drive under test in each test group. The failure level includes failure samples, performance degradation samples, and critical state samples. Based on the determined failure levels of the solid-state drives (SSDs) in each test group, the SSDs in each test group are classified.

[0011] Optionally, after performing instantaneous fault diagnosis and data integrity stress testing on the solid-state drive samples of each test group to identify impact failure samples of the solid-state drives under test in each test group, the method further includes: Based on the random forest algorithm, the correlation between the monitored electrical signal parameters and functional status parameters and the impact failure samples of the solid-state drives under test in each test group is analyzed, and the electrical signal features that indicate failure are extracted. The extracted electrical signal features that indicate the fault are fed back into the constructed digital twin model, and the pre-simulation parameters of the digital twin model are iterated to obtain the calibrated digital twin model.

[0012] Secondly, the present invention provides an impact testing device for a solid-state drive, comprising: The acquisition module is used to acquire solid-state drive samples to be tested and divide the solid-state drive samples to be tested into several test groups according to different test environments; The module is used to build corresponding digital twin models for the solid-state drive samples under test in each test group, perform pre-simulation of the impact process of the solid-state drive samples under test in each test group based on the constructed digital twin models, and adjust the impact condition parameters of the solid-state drive samples under test in each test group based on the pre-simulation results. The monitoring module, based on the adjusted impact condition parameters, applies impact loads to the solid-state drive samples under test in each test group using a stepped increasing impact energy, and monitors the electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group in real time. The testing module, based on the real-time monitoring of the electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group, performs instantaneous fault diagnosis and data integrity stress testing on the solid-state drive samples under test in each test group, and identifies the impact failure samples of the solid-state drives under test in each test group.

[0013] Thirdly, the present invention provides a computer device, the device including a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus; Memory, used to store computer programs; When the processor executes a program stored in the memory, it implements the steps of the impact test method for the solid-state drive described in any one of the first aspects above.

[0014] Fourthly, the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the impact testing method for a solid-state drive as described in any one of the first aspects above.

[0015] Compared with existing technologies, the present invention provides a method, apparatus, device, and storage medium for impact testing of solid-state drives (SSDs). By constructing corresponding digital twin models for the SSD samples under test in each test group, and pre-simulating the impact process of the SSD samples under test in each test group based on the constructed digital twin models, the model parameters are accurately matched with the environmental conditions and sample characteristics of the corresponding group, avoiding simulation deviations caused by adapting a single model to multiple groups. In addition, by applying impact loads to the SSD samples under test in each test group with progressively increasing impact energy, the impact resistance limit of the SSD can be gradually approached, avoiding a single high-energy impact from skipping critical failure points. This enables full-process tracking from normal operation to failure, effectively improving the impact testing efficiency of SSDs. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention, and not all embodiments. For those skilled in the art, other drawings obtained from these drawings without creative effort are all within the scope of protection of this application.

[0017] Figure 1 This is a flowchart of an impact testing method for a solid-state drive provided in an embodiment of the present invention.

[0018] Figure 2 This is a flowchart of constructing a digital twin model provided by an embodiment of the present invention.

[0019] Figure 3 This is a flowchart of applying an impact load to a solid-state drive sample according to an embodiment of the present invention.

[0020] Figure 4 This is a flowchart of impact monitoring for solid-state drives provided in an embodiment of the present invention.

[0021] Figure 5 This is an impact testing device for solid-state drives provided in an embodiment of the present invention.

[0022] Figure 6 This is a schematic diagram of the structure of a computer device provided in an embodiment of the present invention.

[0023] Figure 7 This is a schematic diagram of the structure of a computer-readable storage medium provided in an embodiment of the present invention. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0025] To make the description of this disclosure more detailed and complete, illustrative descriptions of embodiments and specific examples of the present invention are provided below; however, these are not the only forms of implementing or utilizing the specific embodiments of the present invention. The embodiments cover features of multiple specific embodiments and the methods, steps, and their order for constructing and operating these specific embodiments. However, other specific embodiments may also be used to achieve the same or equivalent functions and step sequences. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without inventive effort are within the scope of protection of this application.

[0026] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in sequences other than those illustrated or described herein.

[0027] In the description of the embodiments of the present invention, unless otherwise stated, " / " means "or". For example, A / B can mean A or B. The word "and / or" in the text is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist simultaneously, and B exists alone. In addition, in the description of the embodiments of this application, "multiple" means two or more. Other quantifiers should be understood similarly. The preferred embodiments described herein are only used to illustrate and explain the present invention and are not intended to limit the present invention. Furthermore, the embodiments and features in the embodiments of this application can be combined with each other without conflict.

[0028] To address the low efficiency of existing solid-state drive (SSD) shock testing, this invention provides a shock testing method for SSDs, such as... Figure 1 The flowchart described above illustrates a method for impact testing of a solid-state drive provided in an embodiment of the present invention, which includes the following steps.

[0029] S10: Obtain a solid-state drive (SSD) sample to be tested, and divide the SSD sample into several test groups according to different test environments. Specifically, in this embodiment of the invention, the SSD sample can be divided into at least four test groups. The first test group is used for power-off shock testing at room temperature; the second test group is used for shock testing under high temperature conditions and continuous full-disk read / write operations; the third test group is used for shock testing under low temperature conditions; and the fourth test group is used for testing under multi-axis synchronous shock conditions. Grouping according to different test environments allows for simultaneous verification of the SSD's shock resistance performance under diverse environments such as temperature and humidity, avoiding the limitations of single-environment test results.

[0030] S20: Construct corresponding digital twin models for the solid-state drive (SSD) samples under test in each test group. Based on the constructed digital twin models, perform pre-simulation of the impact process of the SSD samples under test in each test group, and adjust the impact condition parameters of the SSD samples under test in each test group based on the pre-simulation results. Specifically, in this embodiment of the invention, the parameters are adjusted based on the pre-simulation results to make the actual impact load more closely match the test target, avoid test deviations caused by blindly setting parameters, and effectively improve the accuracy of the impact test.

[0031] S30: Based on the adjusted impact condition parameters, an incrementally increasing impact energy is applied to the solid-state drive (SSD) samples in each test group, and the electrical signal parameters and functional status parameters of each SSD sample are monitored in real time. Specifically, in this embodiment of the invention, the incrementally increasing impact energy refers to: starting from an initial value, the impact energy is increased step by step at a fixed step size until the sample fails or reaches a preset threshold; applying incrementally increasing impact energy to the SSD can gradually approach the SSD's impact resistance limit, avoiding a single high-energy impact from skipping critical failure points, and enabling full-process tracking from normal operation to failure. At the moment of impact, a high-speed data acquisition system can be used to monitor and collect the SSD's power supply current, voltage fluctuations of each power rail, and data interface bit error rate in real time; after each impact, instantaneous functional diagnostics are required to read the SSD controller status and check the error flags of the SSD's functional status.

[0032] S40: Based on the real-time monitoring of the electrical signal parameters and functional status parameters of the SSD samples under test in each test group, instantaneous fault diagnosis and data integrity stress testing are performed on the SSD samples under test in each test group to identify impact failure samples of the SSDs under test in each test group. Specifically, in this embodiment of the invention, instantaneous fault diagnosis focuses on hardware functional failure, and data integrity stress testing focuses on data security. Performing instantaneous fault diagnosis and data integrity stress testing on the SSD samples under test in each test group can cover the core reliability indicators of SSDs and avoid the one-sidedness of single-function testing.

[0033] As an optional implementation method, Figure 2 The above, Figure 2 This is a flowchart of constructing a digital twin model provided by an embodiment of the present invention. In step S20, a corresponding digital twin model is constructed for the solid-state drive samples under test in each test group. Based on the constructed digital twin model, the impact process of the solid-state drive samples under test in each test group is pre-simulated, and the impact condition parameters of the solid-state drive samples under test in each test group are adjusted based on the pre-simulation results, including: S21: Extract the geometric structure and material properties of the solid-state drive samples under test in each test group, and construct a three-dimensional digital model corresponding to each solid-state drive sample under test. Specifically, in this embodiment of the invention, by extracting geometric features such as the casing size, printed circuit board layout, and component positions of the solid-state drive, as well as material properties such as casing hardness, it can be ensured that the three-dimensional digital model is highly consistent with the physical sample in terms of physical characteristics, avoiding deviations from reality in subsequent simulation results due to model distortion, and providing a foundation for the reliability of digital twins.

[0034] S22: Based on the constructed 3D digital model, simulated impact table model, and multi-channel data acquisition model, digital twin models of the solid-state drive samples to be tested in each test group are constructed. Specifically, in this embodiment of the invention, the 3D solid-state drive model, simulated impact table model, and multi-channel data acquisition model are integrated to construct a complete digital twin, so that the virtual simulation not only includes the test object, but also covers the test equipment and data acquisition process, ensuring that the pre-simulation scenario highly matches the actual test scenario, thus improving the realism and reference value of the simulation.

[0035] S23: Perform pre-simulation impact tests in the digital twin models of the solid-state drive (SSD) samples under test in each test group, and adjust the impact load waveform parameters of the SSD samples under test in each test group based on the pre-simulation results. Specifically, in this embodiment of the invention, through digital twin pre-simulation, the stress distribution and deformation trend of the SSD under different impact load waveforms can be observed intuitively. Adjusting the peak value, pulse width, and other parameters of the waveform based on the simulation results can avoid excessive or insufficient impact caused by unreasonable waveform settings, making the actual impact load more closely match the test target. Pre-simulation can quickly iterate waveform parameters in a virtual environment, screen out a reasonable parameter range, and significantly reduce the wear and tear of the SSD samples.

[0036] As an optional implementation, in step S22, the construction of digital twin models of the solid-state drive samples to be tested in each test group, based on the constructed three-dimensional digital model, the simulated impact table model, and the multi-channel data acquisition model, includes: S221: Import the constructed 3D digital model into the simulation environment of the corresponding test group's impact scenario, establish a finite element analysis mesh including the printed circuit board, memory chip, and controller chip, and construct a simulated impact table model and a multi-channel data acquisition model corresponding to the finite element analysis mesh. Specifically, in this embodiment of the invention, a finite element mesh is established for core components such as the printed circuit board, memory chip, and controller chip, refining the 3D digital model into computable units. This makes the stress distribution and deformation trend calculation during the impact process more closely resemble the actual structure, effectively avoiding local stress distortion caused by overall modeling, and providing a foundation for subsequent stress parameter monitoring.

[0037] S222: Configure the dynamic parameters of the constructed simulated impact platform model. These dynamic parameters include preset impact waveform type, pulse duration, and peak acceleration. Specifically, in this embodiment of the invention, core parameters such as impact waveform type, pulse duration, and peak acceleration are explicitly configured to specifically simulate different impact scenarios actually faced by solid-state drives, ensuring a high degree of match between the simulation scenario and testing requirements.

[0038] S223: Virtual sensors are configured at preset key locations on the solid-state drive samples under test in each test group. These virtual sensors monitor stress parameters during the impact process of the solid-state drive samples and input the collected stress parameters into a multi-channel data acquisition model. Specifically, in this embodiment of the invention, the virtual sensors can be deployed in locations where it is difficult to install physical sensors in physical testing, and will not interfere with the impact process. They can capture stress parameters in core areas that cannot be obtained through physical testing, filling the gaps in the actual measured data.

[0039] S224: Establish a real-time data interaction interface between the finite element analysis mesh, the simulated impact table model, and the multi-channel data acquisition model, and integrate the digital twin models of the solid-state drive samples under test in each test group. Specifically, in this embodiment of the invention, the data flow between the finite element analysis mesh, the simulated impact table model, and the multi-channel data acquisition model is connected through the real-time data interaction interface, so that changes in impact table parameters can be fed back to stress calculation in real time, and stress data can be transmitted synchronously to the acquisition model, effectively improving the simulation realism of the digital twin model.

[0040] As an optional implementation method, Figure 3 The above, Figure 3 This is a flowchart of applying an impact load to a solid-state drive (SSD) sample according to an embodiment of the present invention. In step S30, based on the adjusted impact condition parameters, an impact load is applied to the SSD samples of each test group using a stepped increasing impact energy, and the electrical signal parameters and functional status parameters of the SSD samples of each test group are monitored in real time, including: S31: Based on the impact condition parameters adjusted through pre-simulation using a digital twin model, configure the initial impact energy, energy increment step size, and test termination condition in a stepped-incremental manner. Specifically, in this embodiment of the invention, parameters are configured based on the results of digital twin pre-simulation, avoiding blindly setting the initial impact energy and increment step size based on experience, and ensuring that the configured parameters match the impact resistance characteristics of the solid-state drive. The determined energy increment step size can smoothly approach the failure threshold, avoiding skipping critical failure nodes with an excessively large step size and wasting time and costs with an excessively small step size.

[0041] S32: Based on the configured stepped-incremental impact energy, energy increment step size, and test termination conditions, impact loads are applied to the solid-state drive samples under test in each test group, while simultaneously monitoring the electrical signal parameters and functional status parameters of each test group's solid-state drive samples. Specifically, in this embodiment of the invention, impacts are applied in a stepped-incremental manner, gradually increasing from low energy. This allows for a complete record of the entire response process of the solid-state drive, from normal operation to minor anomalies, critical failure, and complete failure. Compared to a single high-energy impact, this method can more accurately pinpoint the impact resistance limit threshold under different environments, providing a complete data chain for failure mechanism analysis.

[0042] As an optional implementation, in step S32, based on the configured stepped incremental impact energy, energy increment step size, and test termination condition, an impact load is applied to the solid-state drive samples under test in each test group, and the electrical signal parameters and functional status parameters of the solid-state drive samples under test in each test group are monitored simultaneously, including: S321: Configure the energy increment sequence for each test group's solid-state drive (SSD) samples based on preset initial impact energy, energy increment step size, and test termination conditions. Specifically, in this embodiment of the invention, configuring the energy increment sequence for each test group's SSD samples based on preset initial energy, increment step size, and termination conditions ensures logical consistency in applying impact energy to each test group of SSDs, providing a consistent benchmark for comparing impact resistance performance differences under different environments.

[0043] S322: According to the configured energy increment sequence of the solid-state drive (SSD) samples under test in each test group, an impact load is applied to the SSD samples under test in each test group, and the electrical signal parameters and functional status parameters of the SSD samples under test in each test group are monitored simultaneously. Specifically, in this embodiment of the invention, the load is applied step by step according to the increment sequence, and the electrical signal parameters and functional status parameters of the SSD samples under test in each test group are monitored simultaneously. This can clearly record the changing trends of parameters under different energy levels and avoid the ambiguity of causal relationships caused by single energy loading or asynchronous monitoring.

[0044] S323: Establish the correlation mapping relationship between the electrical signal parameters and functional state parameters of the solid-state drive samples under test in each test group to obtain a timing feature database for fault analysis. Specifically, in this embodiment of the invention, the correlation mapping between electrical signals and functional states is established, transforming scattered parameter data into logical fault timing features. The database can accumulate test features from multiple sets and multiple environments, and subsequent tests of similar solid-state drives can directly reuse fault feature templates in the database, reducing the cost of repeated testing.

[0045] As an optional implementation, in step S40, such as Figure 4 The above, Figure 4 This is a flowchart of a shock monitoring process for solid-state drives (SSDs) provided in an embodiment of the present invention. Based on the real-time monitoring of the electrical signal parameters and functional status parameters of the SSD samples under test in each test group, instantaneous fault diagnosis and data integrity stress testing are performed on the SSD samples under test in each test group to identify shock fault samples of the SSDs under test in each test group, including: S41: Based on real-time monitored electrical signal parameters and functional status parameters, a threshold comparison algorithm is used to identify the transient fault modes of the solid-state drive samples under test in each test group. These transient fault modes include abnormal power supply voltage drops, interface signal interruptions, and read / write command timeouts. Specifically, in this embodiment, if the power supply voltage drops from 3.3V to below 3.0V for 20 microseconds, it is determined to be an abnormal power supply voltage drop; if the interface signal is lost for more than 2 milliseconds, it is determined to be an interface signal interruption; if the response time of a read / write command exceeds 200 microseconds, it is determined to be a read / write command timeout. In this embodiment, by employing a threshold comparison algorithm, sudden changes in electrical signals and functional status during the impact process can be captured in real time, avoiding missed or delayed fault detection due to algorithm complexity, and ensuring that transient faults are captured promptly.

[0046] S42: Perform read / write verification operations on the SSD samples under test in each test group to obtain the data integrity test results for each SSD sample under test. Specifically, transient failure modes may only manifest as abnormal electrical parameters and do not directly cause functional failure. Read / write verification can verify the integrity of data storage, such as whether there is data loss or bit errors, filling the evaluation gap of electrically normal but data damaged, and realizing dual-dimensional verification of electrical response and data security.

[0047] S43: Establish a fault feature library for the solid-state drive samples under test in each test group, and perform correlation analysis between the identified transient fault modes and data integrity test results to determine the failure level of the solid-state drives under test in each test group. The failure level includes failed samples, performance degradation samples, and critical state samples. Specifically, in this embodiment of the invention, the transient fault modes are correlated with the data integrity results to avoid the limitations of single-dimensional judgment and comprehensively reflect the overall impact of shocks on solid-state drives.

[0048] S44: Based on the determined failure levels of the solid-state drives (SSDs) in each test group, the SSDs in each test group are classified. Specifically, in this embodiment of the invention, the classified samples can be directly applied to different scenarios. For example, failed samples are used for structural defect improvement, and critical samples are used for shock resistance threshold calibration. This upgrades the test results from data recording to direct requirements for product optimization, enhancing the practical value of SSD shock testing.

[0049] As an optional implementation, after performing instantaneous fault diagnosis and data integrity stress testing on the solid-state drive samples of each test group to identify the impact failure samples of the solid-state drives under test in each test group, the method further includes: S51: Based on the random forest algorithm, the correlation between the monitored electrical signal parameters and functional status parameters and the impact failure samples of the solid-state drives under test in each test group is analyzed to extract the electrical signal features that indicate failure. Specifically, in this embodiment of the invention, the random forest algorithm is good at processing multi-dimensional and nonlinear data, and can effectively mine the implicit correlation between electrical signal parameters, functional status parameters and impact failure samples. Compared with traditional linear analysis or manual experience screening, it is better able to capture the characteristics of impact failures.

[0050] S52: The extracted electrical signal features indicating the fault are fed back into the constructed digital twin model. The pre-simulation parameters of the digital twin model are iterated to obtain the calibrated digital twin model. Specifically, in this embodiment of the invention, the calibrated digital twin model incorporates the features of the actual fault. In subsequent pre-simulation, it can not only simulate the stress distribution of the impact process, but also accurately predict which electrical signal anomalies will indicate the fault. This provides a more reliable virtual basis for adjusting the operating parameters of new sample tests and reduces the trial-and-error cost of physical testing.

[0051] Based on the aforementioned impact testing method for solid-state drives (SSDs), this invention provides an impact testing device for SSDs, such as... Figure 5As shown in Figure 5, the structural schematic diagram of this solid-state drive (SSD) impact testing device includes: an acquisition module 51, used to acquire SSD samples to be tested and divide the SSD samples to be tested into several test groups according to different test environments; a construction module 52, used to construct corresponding digital twin models for the SSD samples to be tested in each test group, perform pre-simulation of the impact process of the SSD samples to be tested in each test group based on the constructed digital twin models, and adjust the impact condition parameters of the SSD samples to be tested in each test group based on the pre-simulation results; a monitoring module 53, based on the adjusted impact condition parameters, applies impact loads to the SSD samples to be tested in each test group using a stepped increasing impact energy, and monitors the electrical signal parameters and functional status parameters of the SSD samples to be tested in each test group in real time; and a testing module 54, based on the real-time monitored electrical signal parameters and functional status parameters of the SSD samples to be tested in each test group, performs instantaneous fault diagnosis and data integrity stress testing on the SSD samples to be tested in each test group, and identifies the impact fault samples of the SSD samples to be tested in each test group.

[0052] For further details regarding the implementation of the above technical solution by each module in the impact testing device for solid-state drives, please refer to the description of the impact testing method for solid-state drives provided in the above embodiments of the invention, which will not be repeated here.

[0053] Please refer to Figure 6This is a schematic diagram of the structure of a computer device provided in an embodiment of the present invention. The device includes a processor 601, which can be implemented using a general-purpose central processing unit (CPU), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, for executing relevant programs to implement the technical solutions provided in the embodiments of this application; and a memory 602, which can be implemented using a read-only memory (ROM), static storage device, dynamic storage device, or random access memory (RAM), etc. The memory 602 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 602 and is called and executed by the processor 601. The input / output interface 603 is used to realize information input and output. The communication interface 604 is used to realize communication interaction between this device and other devices. Communication can be realized by wired means (e.g., USB, network cable, etc.) or by wireless means (e.g., mobile network, WIFI, Bluetooth, etc.). The bus 605 transmits information between the various components of the device (e.g., processor 601, memory 602, input / output interface 603 and communication interface 604). The processor 601, memory 602, input / output interface 603 and communication interface 604 realize communication connection between each other within the device through the bus 605.

[0054] Please refer to Figure 7 This is a schematic diagram of a computer-readable storage medium structure according to an embodiment of the present invention. The storage medium 70 of this embodiment stores program instructions 71 capable of implementing the aforementioned impact testing method for a solid-state drive. These program instructions 71 can be stored in the storage medium in the form of a software product, including several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the method described in various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks, or terminal devices such as computers, servers, mobile phones, and tablets.

[0055] In the several embodiments provided by this invention, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0056] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated units described above can be implemented in hardware or as software functional units. The above are merely embodiments of the present invention and do not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the description and drawings of the present invention, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

[0057] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention in any way. Although the present invention has been disclosed above with reference to preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make some modifications or alterations to the above-disclosed technical content to create equivalent embodiments without departing from the scope of the present invention. Any simple modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present invention without departing from the scope of the present invention shall still fall within the scope of the present invention.

Claims

1. A method of shock testing a solid state drive, the method comprising: The method comprises the following steps: obtaining a to-be-tested solid state disk sample, and dividing the to-be-tested solid state disk sample into a plurality of test groups according to different test environments; constructing a corresponding digital twin model for the to-be-tested solid state disk sample of each test group, pre-simulating the impact process of the to-be-tested solid state disk sample of each test group based on the constructed digital twin model, and adjusting the impact working condition parameters of the to-be-tested solid state disk sample of each test group based on the pre-simulation result; based on the adjusted impact working condition parameters, applying impact load to the to-be-tested solid state disk sample of each test group by using a step-by-step increasing impact energy, and monitoring the electrical signal parameters and functional state parameters of the to-be-tested solid state disk sample of each test group in real time; based on the real-time monitored electrical signal parameters and functional state parameters of the to-be-tested solid state disk sample of each test group, performing instantaneous fault diagnosis and data integrity pressure test on the to-be-tested solid state disk sample of each test group, and identifying the impact failure sample of the to-be-tested solid state disk of each test group.

2. The shock test method of a solid state drive according to claim 1, wherein, The method of constructing a corresponding digital twin model for the to-be-tested solid state disk sample of each test group, pre-simulating the impact process of the to-be-tested solid state disk sample of each test group based on the constructed digital twin model, and adjusting the impact working condition parameters of the to-be-tested solid state disk sample of each test group based on the pre-simulation result comprises: extracting the geometric structure and material properties of the to-be-tested solid state disk sample of each test group, and constructing a three-dimensional digital model corresponding to the to-be-tested solid state disk sample of each test group; based on the constructed three-dimensional digital model, a simulated impact table model and a multi-channel data acquisition model, constructing a digital twin model for the to-be-tested solid state disk sample of each test group; performing pre-simulation impact test in the digital twin model of the to-be-tested solid state disk sample of each test group, and adjusting the impact load waveform parameters of the to-be-tested solid state disk sample of each test group based on the pre-simulation result.

3. The shock test method of a solid state drive according to claim 2, wherein, The method of constructing a digital twin model for the to-be-tested solid state disk sample of each test group based on the constructed three-dimensional digital model, a simulated impact table model and a multi-channel data acquisition model comprises: importing the constructed three-dimensional digital model into the simulation environment of the corresponding test group impact scene, establishing a finite element analysis grid containing a printed circuit board, a storage chip and a controller chip, and constructing a simulated impact table model and a multi-channel data acquisition model corresponding to the finite element analysis grid; configuring the dynamic parameters of the constructed simulated impact table model, the dynamic parameters of the simulated impact table model including a pre-set impact waveform type, a pulse duration and a peak acceleration; configuring virtual sensors at the pre-set key positions of the to-be-tested solid state disk sample of each test group, monitoring the stress parameters in the impact process of the to-be-tested solid state disk sample through the virtual sensors, and inputting the collected stress parameters into the multi-channel data acquisition model; establishing a real-time data interaction interface between the finite element analysis grid, the simulated impact table model and the multi-channel data acquisition model, and integrating the digital twin model of the to-be-tested solid state disk sample of each test group. 4.The method of claim 1, wherein, The method of applying impact load to the to-be-tested solid state disk sample of each test group by using a step-by-step increasing impact energy based on the adjusted impact working condition parameters, and monitoring the electrical signal parameters and functional state parameters of the to-be-tested solid state disk sample of each test group in real time comprises: Based on the digital twin model, the adjusted shock working condition parameters are pre-simulated, and the initial shock energy, energy increment step and test termination condition of the stepwise increasing shock energy are configured; Based on the configured initial shock energy, energy increment step and test termination condition of the stepwise increasing shock energy, the shock load is applied to the solid state disk samples of each test group, and the electrical signal parameters and functional state parameters of the solid state disk samples of each test group are monitored synchronously. 5.The method of claim 4, wherein, Based on the configured initial shock energy, energy increment step and test termination condition of the stepwise increasing shock energy, the shock load is applied to the solid state disk samples of each test group, and the electrical signal parameters and functional state parameters of the solid state disk samples of each test group are monitored synchronously, including: According to the preset initial shock energy, energy increment step and test termination condition, the energy increment sequence of the solid state disk samples of each test group is configured; According to the configured energy increment sequence of the solid state disk samples of each test group, the shock load is applied to the solid state disk samples of each test group, and the electrical signal parameters and functional state parameters of the solid state disk samples of each test group are monitored synchronously; The correlation mapping relationship between the electrical signal parameters and the functional state parameters of the solid state disk samples of each test group is established, and a time sequence feature database for fault analysis is obtained. 6.The method of claim 1, wherein, Based on the real-time monitored electrical signal parameters and functional state parameters of the solid state disk samples of each test group, the solid state disk samples of each test group are subjected to instantaneous fault diagnosis and data integrity pressure test, and the shock failure samples of the solid state disk of each test group are identified, including: Based on the real-time monitored electrical signal parameters and functional state parameters, the instantaneous fault mode of the solid state disk samples of each test group is identified through a threshold comparison algorithm, and the instantaneous fault mode includes power voltage abnormal drop, interface signal interruption and read-write instruction timeout; The read-write verification operation is performed on the solid state disk samples of each test group, and the data integrity test result of the solid state disk samples of each test group is obtained; A fault feature library of the solid state disk samples of each test group is established, the identified instantaneous fault mode and the data integrity test result are analyzed, the failure level of the solid state disk of each test group is determined, and the failure level includes failure sample, performance degradation sample and critical state sample; Based on the determined failure level of the solid state disk of each test group, the solid state disk of each test group is classified. 7.The method of claim 1, wherein, After the solid state disk samples of each test group are subjected to instantaneous fault diagnosis and data integrity pressure test, and the shock failure samples of the solid state disk of each test group are identified, the method further includes: Based on the random forest algorithm, the correlation between the monitored electrical signal parameters and functional state parameters and the shock failure samples of the solid state disk of each test group is analyzed, and the fault-indicating electrical signal features are extracted; The extracted fault-indicating electrical signal features are fed back to the constructed digital twin model, the pre-simulation parameters of the digital twin model are iterated, and the calibrated digital twin model is obtained.

8. An impact testing device for a solid-state drive, characterized in that, including: An acquisition module is configured to acquire a to-be-tested solid state disk sample and divide the to-be-tested solid state disk sample into a plurality of test groups according to different test environments; A construction module is configured to construct a corresponding digital twin model for the to-be-tested solid state disk sample of each test group, pre-simulate the impact process of the to-be-tested solid state disk sample of each test group based on the constructed digital twin model, and adjust the impact working condition parameters of the to-be-tested solid state disk sample of each test group based on the result of the pre-simulation; A monitoring module is configured to apply an impact load to the to-be-tested solid state disk sample of each test group by using a step-incremental impact energy based on the adjusted impact working condition parameters, and monitor the electrical signal parameters and functional state parameters of the to-be-tested solid state disk sample of each test group in real time; A test module is configured to perform instantaneous fault diagnosis and data integrity stress testing on the to-be-tested solid state disk sample of each test group based on the electrical signal parameters and functional state parameters of the to-be-tested solid state disk sample of each test group monitored in real time, and identify the impact fault sample of the to-be-tested solid state disk of each test group.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, The processor executes the computer program to implement the steps of the impact test method of the solid state disk according to any one of claims 1 to 7.

10. A computer-readable storage medium storing a computer program, the computer program comprising instructions that, when executed by a computer, cause the computer to perform the method of any one of claims 1 to 9. The computer program is executed by the processor to implement the steps of the impact test method of the solid state disk according to any one of claims 1 to 7.

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