Fish-eye test needle set for testing circuit board
By designing a fisheye test probe group, the problems of two pairs of contacts and short circuits in chip testing were solved, achieving multi-point integration and electric heating testing effects.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHENZHEN RUIXINHUI TECH CO LTD
- Filing Date
- 2025-12-05
- Publication Date
- 2026-04-21
AI Technical Summary
During chip testing, the test connection point of a single pin needs to have two pairs of contacts simultaneously, and short circuits must be avoided. Existing technology cannot meet this requirement.
A fisheye test probe assembly for circuit board testing was designed, including a test stage, a heating block, an insulating component, and a base. By combining the fisheye probe with a double-ended probe and a spring, the assembly achieves the separation of two pairs of contacts and the function of electric heating, avoiding short circuits and meeting the current and voltage requirements of Kelvin testing.
This technology integrates multiple test points within a single structure, avoids short circuits, meets the current and voltage requirements of Kelvin testing, and improves test performance through electric heating.
Smart Images

Figure CN121254048B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of chip testing technology, specifically to a fisheye test probe set for circuit board testing. Background Technology
[0002] In Kelvin testing, two pairs of contacts are required, each playing a completely different role in order to satisfy the separate testing of current and voltage.
[0003] During chip testing, numerous pins on the chip lead to many test connection points. Since each test requires simultaneous Kelvin testing, the test connection point of a single pin needs to have two pairs of contacts during testing. At the same time, the two pairs of contacts need to avoid short circuits. To address this, a fisheye test pin group for circuit board testing is proposed. Summary of the Invention
[0004] To address the shortcomings of existing technologies, this invention provides a fisheye test probe assembly for circuit board testing, which has advantages and solves the problems.
[0005] To achieve the above objectives, the present invention provides the following technical solution: a fisheye test probe assembly for circuit board testing, comprising a test stage, the test stage including a heating block, an insulating component, and a base, wherein a test sample is placed between the heating block and the insulating component, the test sample including a sample body and fisheye needles extending from each pin on the sample body, and a plurality of sets of double-ended probes and spring contacts installed in the base, which engage with the fisheye needles; the fisheye needles, double-ended probes, and spring contacts constitute the test probe assembly; when the test sample sinks, the fisheye needles engage with the double-ended probes, and the spring contacts engage with the fisheye needles, forming two pairs of contacts. When the test sample sinks and the first pair of contacts appear, the wedge-shaped guide spring in the sinking direction tilts and a second pair of contacts appears, so as to meet the current and voltage requirements of the Kelvin test. Multiple test points are integrated into a single structure. While there is vertical downward pressure, there is also lateral force, which meets the usage requirements. The double-headed probe and the spring used for testing have separate slots to separate the various guide circuits and avoid short circuits. The downward pressure structure also has an electric heating effect to better fit the actual use scenario of the test sample and achieve better test results.
[0006] Preferably, the main body of the dual-headed probe is a positioning rod, which is fixedly installed on the base. The two ends of the positioning rod are respectively provided with a contact pin a and a contact pin b, and the contact pin a and contact pin b at both ends are elastically connected to the main positioning rod by a spring.
[0007] Preferably, the main body of the spring is a fixed base, and a slot is provided on the fixed base. A limit block is held in the slot for fixed installation in the base. An extension piece extends upward from the fixed base. The extension piece is thin and its top is a contact point a. A wedge-shaped seat is provided in the middle of the extension piece on the side opposite to the double-headed probe.
[0008] Preferably, the middle sections of the double-headed probe and the spring sheet both pass through the insulating member and connect with the fisheye needle above. Several ceramic rods are installed inside the insulating member, which respectively connect with the wedge seats on a set of spring sheets. When the insulating member sinks, the ceramic rods guide the extension sheet to tilt towards the fisheye needle through the wedge seats until the contact point a contacts the fisheye needle.
[0009] Preferably, both the stylus b and the contact point b pop out from the bottom of the base and are connected to an external test circuit board.
[0010] Preferably, the insulating component and the base are provided with a number of slots for double-headed probes and spring pieces, and each slot can accommodate only one double-headed probe or one spring piece.
[0011] Preferably, the slot on the insulating member for accommodating the spring sheet provides space for the spring sheet to move due to its tilt.
[0012] Preferably, the sample body and several fisheye needles constitute a test sample, and each fisheye needle on the test sample is pre-welded so that one end is fixedly connected to each needle on the sample body.
[0013] Preferably, the heating block, while serving as an auxiliary pressure block, has a heating wire installed on its bottom contact surface with the test sample.
[0014] Preferably, a number of guide rods and guide springs are provided between the insulating component and the base to limit the sinking of the insulating component and make it sink vertically and stably, so as to meet the synchronous testing effect of multiple sets of double-headed probes and springs.
[0015] Compared with the prior art, the present invention provides a fisheye test probe set for circuit board testing, which has the following beneficial effects:
[0016] 1. When the test sample shows the first pair of contacts during the sinking guide, the wedge-shaped guide spring in the sinking direction tilts to show the second pair of contacts, so as to meet the current and voltage requirements of the Kelvin test. Multiple test points are integrated into a single structure. While there is vertical downward pressure, there is also lateral force, which meets the usage requirements.
[0017] 2. The dual-headed probe and spring used for testing have separate slots to separate the various guiding circuits and avoid short circuits.
[0018] 3. The downward pressure structure also has an electric heating effect, which better matches the actual use scenario of the test sample and achieves better test results. Attached Figure Description
[0019] Figure 1 This is a schematic diagram of the overall appearance structure of a fisheye test probe assembly for circuit board testing according to the present invention;
[0020] Figure 2 This is a schematic diagram of the main structure of a fisheye test probe assembly for circuit board testing according to the present invention;
[0021] Figure 3 This is a schematic diagram of the connection structure between the insulating component and the base of a fisheye test probe assembly for circuit board testing according to the present invention;
[0022] Figure 4 This is a schematic diagram of the mounting structure of the fisheye test probe group and spring sheet for circuit board testing according to the present invention;
[0023] Figure 5 This is a schematic diagram of the docking structure between the fisheye needle and the test connection needle in a fisheye test probe group for circuit board testing according to the present invention.
[0024] Figure 6 This is a schematic diagram of the connection structure of the fisheye test probe group for circuit board testing, including the fisheye needle, the double-headed probe, and the spring sheet, according to the present invention.
[0025] Figure 7 This is a schematic diagram of the external structure of a double-headed probe and spring sheet for a fisheye test probe assembly for circuit board testing according to the present invention.
[0026] Figure 8 This is a schematic diagram of the structure of a double-headed probe in a fisheye test probe group for circuit board testing according to the present invention.
[0027] In the diagram: 1. Test platform; 2. Heating block; 3. Test sample; 4. Insulating component; 5. Base; 6. Double-ended probe; 7. Spring; 8. Ceramic rod; 31. Sample body; 32. Fisheye needle; 61. Positioning rod; 62. Contact pin a; 63. Contact pin b; 71. Fixing seat; 72. Extension piece; 73. Wedge seat; 74. Contact point a; 75. Limiting block; 76. Contact point b. Detailed Implementation
[0028] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0029] As described in the background section, there are shortcomings in the existing technology. In order to solve the above-mentioned technical problems, this application proposes a fisheye test probe group for circuit board testing.
[0030] In a typical embodiment of a fisheye test probe assembly for circuit board testing according to this application, such as Figure 1-8 As shown, a fisheye test probe assembly for circuit board testing is installed in test bench 1, as follows: Figure 1 and Figure 2 As shown. The test bench 1 includes a heating block 2, an insulating component 4, and a base 5. The space between the heating block 2 and the insulating component 4 is used to place the test sample 3, as shown. Figures 3 to 6 As shown, the test sample 3 includes a sample body 31 and fisheye needles 32 extending from each pin on the sample body 31. Several sets of double-headed probes 6 and springs 7 are installed in the base 5 and are connected to the fisheye needles 32. The fisheye needles 32, the double-headed probes 6 and the springs 7 constitute the test needle group.
[0031] like Figure 6 As shown, the sample body 31 and several fisheye needles 32 constitute the test sample 3. Each fisheye needle 32 on the test sample 3 is pre-welded so that one end is fixedly connected to each pin on the sample body 31. Only in the figure is the connection between the fisheye needle 32 and the sample body 31 vertical. However, in actual use, the other end of the fisheye needle 32 will be connected to the corresponding double-headed probe 6 and spring 7 respectively. Due to the different sample bodies 31, the connection pin positions of the fisheye needle 32 and different sample bodies 31 are different. The connection between the fisheye needle 32 and the sample body 31 can be bent or tilted, as long as the contact section with the double-headed probe 6 and spring 7 is kept in communication.
[0032] Furthermore, such as Figures 3 to 7 As shown, the double-headed probe 6 and the spring piece 7 are both fixedly installed in the base 5. The base 5 has several corresponding slots for accommodating the double-headed probe 6 and the spring piece 7. The slots fix the main body of the double-headed probe 6 and the spring piece 7, and both have a portion of their structure extending upward to contact the test sample 3.
[0033] The extension passes through the insulating member 4 and docks with the fisheye needle 32. The insulating member 4 has several through slots inside to accommodate the double-headed probes 6 and the spring piece 7. The through slots are slightly larger than the spring piece 7, so that the spring piece 7 can move inside the insulating member 4 and make contact with the fisheye needle 32. This ensures that during the sinking of the test sample 3, the fisheye needle 32 makes contact with the double-headed probes 6 and the spring piece 7 respectively, resulting in two pairs of contacts, which meets the requirements of Kelvin testing.
[0034] For details, please refer to Figure 5 and Figure 7As shown, the double-headed probe 6 and the spring piece 7 are arranged adjacent to each other. The main body of the double-headed probe 6 is a positioning rod 61, with a contact pin a62 and a contact pin b63 respectively at its two ends. The contact pins a62 and b63 at both ends are elastically connected to the main positioning rod 61 by springs. The contact pin a62 at the top is used to dock with the fisheye needle 32, and the contact pin b63 at the bottom is used to dock with the external test circuit board. The main body of the spring piece 7 is a fixing base 71. A bayonet is opened on the fixing base 71, and a limit block 75 is held in the bayonet for fixing it in the base 5. A thin extension piece 72 extends upward from the fixing base 71. The top of the extension piece 72 is a contact point a74. A wedge-shaped seat 73 is provided in the middle of the extension piece 72 on the side opposite to the double-headed probe 6. The section where the wedge-shaped seat 73 is located passes through the insulating member 4. Several ceramic rods 8 are installed in the insulating member 4. During the process of the insulating member 4 sinking, the ceramic rods 8 and the wedge-shaped seat 73... Contact is generated, causing the wedge seat 73 to shift, which in turn guides the extension piece 72 to tilt toward the fisheye needle 32 until the contact point a74 contacts the fisheye needle 32, creating a pair of contacts. The other end of the limiting block 75 is similar to the contact needle b63, and is provided with a contact point b76 for docking with an external test circuit board.
[0035] It is important to note that during chip testing using the Kelvin method, the two pairs of contacts led out by a single pin must be absolutely protected from short circuits. The slots on the base 5 are one slot per pin to prevent short circuits between the corresponding double-headed probes 6 and springs 7 in the same group, while also preventing short circuits between different groups. The upward extension section, within the insulating member 4, is also separated to prevent contact between contacts. The ceramic rod 8 is also used to prevent short circuits.
[0036] Furthermore, it should be added that while the heating block 2 assists in pressing down, it is equipped with a heating wire at its bottom to heat the test sample 3, so as to better fit the actual use scenario of the test sample 3.
[0037] In addition, several guide rods and guide springs are provided between the insulating component 4 and the base 5 to limit the sinking of the insulating component 4, so that it sinks vertically and stably, in order to meet the synchronous testing effect of multiple sets of double-headed probes 6 and springs 7.
[0038] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A fisheye test probe assembly for circuit board testing, comprising a test stage (1), characterized in that: The test stand (1) includes a heating block (2), an insulating component (4) and a base (5). A test sample (3) is placed between the heating block (2) and the insulating component (4). The test sample (3) includes a sample body (31) and fisheye needles (32) extending from each pin on the sample body (31). Several sets of double-headed probes (6) and spring sheets (7) are installed in the base (5) and are connected to the fisheye needles (32). The fisheye needles (32), double-headed probes (6) and spring sheets (7) constitute a test needle group. When the test sample (3) sinks, the fisheye needles (32) are connected to the double-headed probes (6) and the spring sheets (7) are connected to the fisheye needles (32), forming two pairs of contacts. The main body of the double-headed probe (6) is a positioning rod (61), which is fixedly installed on the base (5). The two ends of the positioning rod (61) are respectively provided with a stylus a (62) and a stylus b (63). The stylus a (62) and stylus b (63) at both ends are elastically connected to the main positioning rod (61) by springs. The main body of the spring (7) is a fixed base (71). A slot is provided on the fixed base (71), and a limit block (75) is held in the slot for fixed installation in the base (5). An extension piece (72) extends upward from the fixed base (71). The extension piece (72) is thin and its top is a contact point a (74). A wedge-shaped seat (73) is provided in the middle of the extension piece (72) on the side opposite to the double-headed probe (6). The middle sections of the double-headed probe (6) and the spring (7) pass through the insulating member (4) and dock with the fisheye needle (32) above. Several ceramic rods (8) are installed inside the insulating member (4), which dock with the wedge seat (73) on a set of springs (7). When the insulating member (4) sinks, the ceramic rods (8) guide the extension piece (72) to tilt towards the fisheye needle (32) through the wedge seat (73) until the contact point a (74) contacts the fisheye needle (32). The stylus b (63) and contact b (76) both pop out from the bottom of the base (5) and are connected to the external test circuit board; The insulating component (4) and the base (5) are provided with a number of slots for double-headed probes (6) and spring pieces (7), and each slot can only accommodate one double-headed probe (6) or one spring piece (7). The slot on the insulating member (4) for accommodating the spring piece (7) provides space for the spring piece (7) to move when it is tilted.
2. The fisheye test probe assembly for circuit board testing according to claim 1, characterized in that: The sample body (31) and several fisheye needles (32) constitute the test sample (3). Each fisheye needle (32) on the test sample (3) is pre-welded so that one end is fixedly connected to each pin on the sample body (31).
3. The fisheye test probe assembly for circuit board testing according to claim 1, characterized in that: The heating block (2) plays an auxiliary role in pressing down, and its bottom is fitted with a heating wire on the contact surface with the test sample (3).
4. The fisheye test probe assembly for circuit board testing according to claim 1, characterized in that: Several guide rods and guide springs are provided between the insulating component (4) and the base (5) to limit the sinking of the insulating component (4) so that it sinks vertically and stably, so as to meet the synchronous testing effect of multiple sets of double-headed probes (6) and springs (7).
Citation Information
Patent Citations
IC socket for kelvin inspection
JP2019211355A