Shaking scanning method and device of industrial detection equipment, scanning equipment and medium
By controlling the movement of the detector on a translation stage in industrial inspection equipment to acquire and correct projection data, the problem of ring artifacts was solved, resulting in more accurate projection data and higher quality 3D reconstructed images.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- LIMA OPTOELECTRONICS TECH (BEIJING) CO LTD
- Filing Date
- 2025-12-15
- Publication Date
- 2026-07-21
AI Technical Summary
Existing industrial CT scanning technology suffers from ring artifacts when reconstructing high-density or complex-structured workpieces, resulting in poor image reconstruction quality. Existing correction methods are limited in effectiveness and unstable in systems with few detector channels.
By controlling the detector in the industrial testing equipment to move on the translation stage, multiple projection data are acquired and a reference projection data is determined. The data is then translated to the reference detection position using the detector's feedback position value, eliminating ring artifacts and improving the accuracy of the projection data.
It effectively suppresses ring artifacts, improves the accuracy of projection data and the reliability of 3D reconstructed images, and ensures the accuracy and quality of reconstructed images.
Smart Images
Figure CN121297742B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of industrial scanning technology, and more specifically, to a jitter scanning method, apparatus, scanning equipment, and medium for industrial testing equipment. Background Technology
[0002] When industrial computed tomography (ICT) is used to inspect high-density or complex workpieces, the requirements for industrial CT technology are becoming increasingly stringent due to the complex materials of the products being inspected, the diverse processing techniques, and the high error requirements of the imaging models. However, the reconstruction of projection data from industrial CT scans can produce ring artifacts, which degrade the reconstruction quality and lead to deviations in the results when analyzing sample images.
[0003] Currently, ring artifact correction is mainly achieved by correcting the inconsistency response of the detector. This involves suppressing the generation of ring artifacts by calibrating each channel of the detector one by one, or by modulating the integration time of each detector channel to reduce the formation of ring artifacts.
[0004] However, the method of suppressing ring artifacts by calibrating each detector channel one by one can only achieve good correction results in CT systems with few detector channels. However, due to the instability of actual imaging conditions, some ring artifacts still remain in the image after the consistency correction is completed. Summary of the Invention
[0005] The purpose of this application is to address the shortcomings of the prior art by providing a jitter scanning method, apparatus, scanning equipment, and medium for industrial inspection equipment, thereby improving the accuracy of the obtained projection data and the reliability of the three-dimensional reconstruction of the object to be scanned.
[0006] To achieve the above objectives, the technical solutions adopted in the embodiments of this application are as follows:
[0007] In a first aspect, one embodiment of this application provides a vibration scanning method for an industrial testing equipment, the method comprising:
[0008] The detector in the industrial testing equipment is controlled to move on a translation stage, and multiple projection data obtained by the detector during the movement of the object to be scanned, as well as the detector feedback position value corresponding to each projection, are acquired.
[0009] From the multiple projection data, determine the reference projection data, and determine the reference detection position corresponding to the reference projection data;
[0010] Based on the detector feedback position values corresponding to the multiple projection data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data, wherein the multiple target projection data are used to reconstruct the three-dimensional projection image of the object to be scanned.
[0011] Optionally, controlling the movement of the detector in the industrial testing equipment on the translation stage includes:
[0012] The moving speed of the detector is determined based on the preset exposure time of the detector;
[0013] The detector is controlled to move on the translation stage according to the moving speed.
[0014] Optionally, before controlling the detector to move on the translation stage according to the moving speed, the method further includes:
[0015] Based on the preset distance between adjacent jitter points and the preset number of jitter points of the detector, the movement range of the detector on the translation stage is determined; wherein, the preset number of jitter points is the number of scans required for the detector to move once within the movement range;
[0016] The step of controlling the detector to move on the translation stage according to the moving speed includes:
[0017] Based on the moving speed, the detector is controlled to move back and forth within the moving range until the target number of projection data frames are collected.
[0018] Optionally, the method further includes:
[0019] The detector feedback position values corresponding to each projection data are balanced to obtain the true position values of the detectors corresponding to each projection data.
[0020] Determining the reference detection position corresponding to the reference projection data includes:
[0021] The actual position value of the detector corresponding to the reference projection data is determined as the reference detection position;
[0022] The step of translating the multiple projection data to the reference detection position based on the detector feedback position values corresponding to the multiple projection data to obtain multiple target projection data includes:
[0023] Based on the actual detector position values corresponding to the multiple projection data, the multiple projection data are translated to the reference detection position to obtain the multiple target projection data.
[0024] Optionally, the step of balancing the detector feedback position values corresponding to each projection data to obtain the true detector position value corresponding to each projection data includes:
[0025] Based on the detector feedback position value corresponding to each projection data and the detector feedback position value corresponding to the previous projection data, the actual position value of the detector corresponding to each projection data is determined.
[0026] Optionally, the step of translating the multiple projection data to the reference detection position based on the detector's actual position value corresponding to the multiple projection data to obtain the multiple target projection data includes:
[0027] The translation data of the multiple projection data is determined based on the detector's actual position value corresponding to the multiple projection data, the reference detection position, and the preset unit pixel size;
[0028] Based on the translation data of the multiple projection data, the multiple projection data are translated to the reference detection position to obtain the multiple target projection data.
[0029] Optionally, the step of translating the multiple projection data to the reference detection position based on the translation data of the multiple projection data to obtain the multiple target projection data includes:
[0030] Based on the translation data of the multiple projection data, the multiple pre-registration data values of the multiple projection data in the first direction are translated and registered to obtain multiple post-registration data values in the first direction, wherein the first direction is the preset movement direction of the detector;
[0031] The multiple target projection data are obtained based on multiple registered data values in the first direction and multiple pre-registration data values in the second direction of the multiple projection data, wherein the second direction is perpendicular to the first direction.
[0032] Secondly, another embodiment of this application provides a vibration scanning device for industrial testing equipment, the device comprising:
[0033] The control module is used to control the detector in the industrial inspection equipment to move on the translation stage, and to acquire multiple projection data obtained by the detector during the movement of the object to be scanned, as well as the detector feedback position value corresponding to each projection.
[0034] The determining module is used to determine reference projection data from the multiple projection data and to determine the reference detection position corresponding to the reference projection data;
[0035] The translation module is used to translate the multiple projection data to the reference detection position according to the detector feedback position value corresponding to the multiple projection data, so as to obtain multiple target projection data, wherein the multiple target projection data are used to reconstruct the three-dimensional projection image of the object to be scanned.
[0036] Thirdly, another embodiment of this application provides an industrial scanning device, which includes at least: a control unit, an X-ray source, a turntable, a translation stage, and a detector disposed on the translation stage; wherein the turntable and the detector are within the X-ray range of the X-ray source;
[0037] The control unit is connected to the radiation source to control the radiation source to emit radiation. The control unit is also connected to the turntable to control the turntable to rotate. The control unit is also connected to the detector to control the detector to move on the translation stage and acquire the projection data collected by the detector.
[0038] The control unit is also used to perform the jitter scanning method of the industrial testing equipment described in the first aspect above.
[0039] Fourthly, another embodiment of this application provides a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the steps of the jitter scanning method of any of the industrial testing equipment described in the first aspect above.
[0040] The beneficial effects of this application are:
[0041] This application provides a jitter scanning method, apparatus, scanning equipment, and medium for industrial inspection equipment. It controls the movement of a detector on a translation stage within the industrial inspection equipment, acquiring multiple projection data images of the object to be scanned during the movement, along with the detector feedback position values corresponding to each projection image. By moving the detector on the translation stage to scan the object, the object is recorded by different pixels on the detector during the scanning process. Ring artifacts in the projection data can be eliminated by confounding pixel errors, resulting in more accurate projection data. Reference projection data is determined from the multiple projection data images, and a reference detection position corresponding to the reference projection data is also determined. Based on the detector feedback position values corresponding to the multiple projection data images, the multiple projection data images are translated to the reference detection position to obtain multiple target projection data images, making the target projection data more accurate. Using the multiple target projection data images at the reference detection position, a three-dimensional projection image of the object to be scanned is obtained, ensuring the reliability of the object reconstruction process and the quality of the reconstructed image. Attached Figure Description
[0042] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.
[0043] Figure 1 This is a schematic diagram of the structure of an industrial scanning device provided in an embodiment of this application;
[0044] Figure 2 A schematic flowchart illustrating a jitter scanning method for an industrial testing equipment provided in this application embodiment;
[0045] Figure 3 A schematic diagram illustrating the process of a detector moving on a translation stage in a jitter scanning method for an industrial testing equipment provided in this application embodiment;
[0046] Figure 4 A schematic diagram illustrating the process of the detector moving on the translation stage in another jitter scanning method for an industrial inspection device provided in this application embodiment;
[0047] Figure 5 A schematic diagram illustrating the process of obtaining multiple target projection data in a jitter scanning method of an industrial testing equipment provided in an embodiment of this application;
[0048] Figure 6 A schematic diagram illustrating the process of obtaining multiple target projection data in another method of jitter scanning of an industrial inspection device provided in an embodiment of this application;
[0049] Figure 7 A schematic diagram illustrating the process of obtaining multiple target projection data in a jitter scanning method of an industrial testing equipment provided in an embodiment of this application;
[0050] Figure 8 This is a schematic diagram of the structure of a shaking scanning device for an industrial testing equipment provided in an embodiment of this application. Detailed Implementation
[0051] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. It should be understood that the accompanying drawings in this application are for illustrative and descriptive purposes only and are not intended to limit the scope of protection of this application. Furthermore, it should be understood that the schematic drawings are not drawn to scale. The flowcharts used in this application illustrate operations implemented according to some embodiments of this application. It should be understood that the operations in the flowcharts may not be implemented in sequence, and steps without logical contextual relationships may be reversed or implemented simultaneously. In addition, those skilled in the art, guided by the content of this application, may add one or more other operations to the flowcharts, or remove one or more operations from the flowcharts.
[0052] Furthermore, the described embodiments are merely some, not all, of the embodiments of this application. The components of the embodiments of this application described and illustrated herein can typically be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.
[0053] It should be noted that the term "comprising" will be used in the embodiments of this application to indicate the presence of the features declared thereafter, but does not exclude the addition of other features.
[0054] Currently, industrial computed tomography (CT) primarily involves fixing the object to be scanned at the center of rotation of a scanning platform. The X-ray source and detector are different. Multiple projection images of the object are acquired through its rotation, and a 3D projection image of the object is reconstructed from these images. However, existing methods often result in ring artifacts in the projected images, leading to inaccuracies and the appearance of features not present in the object. To address this, this application provides a jitter scanning method for industrial inspection equipment. This method controls the movement of a detector on a translation stage and acquires multiple projection data images of the object being scanned during this movement, along with the detector's feedback position values corresponding to each projection. Reference projection data is determined from these multiple projection data images, along with the corresponding reference detector position. Based on the detector feedback position values, the multiple projection data images are translated to the reference detector position to obtain multiple target projection data images. Finally, a 3D projection image of the object being scanned is reconstructed from these target projection data images. The method in this application can effectively suppress annular artifacts, thereby improving the accuracy of obtaining multiple target projection data and making the reconstructed three-dimensional projection image of the object to be scanned more accurate.
[0055] The following description, in conjunction with several accompanying drawings, illustrates a jitter scanning method for industrial testing equipment provided in this application. This jitter scanning method for industrial testing equipment is applied to industrial scanning equipment. Figure 1 This is a schematic diagram of the structure of an industrial scanning device provided in an embodiment of this application, as shown below. Figure 1 As shown, the industrial scanning equipment 1000 includes at least: a control unit 100, a radiation source 200, a turntable 300, a translation stage 400, and a detector 500 disposed on the translation stage 400; wherein, the turntable 300 and the detector 500 are within the radiation range of the radiation source 200.
[0056] The control unit 100 is connected to the X-ray source 200 to control the X-ray source 200 to emit X-rays. The control unit 100 is also connected to the turntable 300 to control the turntable 300 to rotate. The control unit 100 is also connected to the detector 500 to control the detector 500 to move on the translation stage 400 and acquire the projection data collected by the detector 500. The control unit 100 is also used to execute the jitter scanning method of any industrial inspection equipment.
[0057] The control unit 100 sends control commands to the X-ray source 200, the turntable 300, and the detector 500, and acquires the projection data collected by the detector 500. The X-ray source 200 can be an X-ray source, used to emit a cone-shaped or fan-shaped X-ray beam that penetrates the object to be scanned. The object to be scanned is placed on the turntable 300, and the rotation of the turntable 300 causes the object to rotate, allowing the detector 500 to collect projection data of the object at different angles. The detector 500 is movably connected to the translation stage 400 and moves back and forth on the translation stage 400.
[0058] Optionally, the workpiece to be scanned is fixed on the turntable 300. The control unit 100 calculates the moving speed of the detector 500 based on preset exposure time and other parameters. Simultaneously, the control unit 100 triggers the X-ray source 200 to emit X-rays and commands the turntable 300 to stop, ensuring that the detector 500 acquires the corresponding projection data on the translation stage 400. After exposure ends, the control unit 100 immediately controls the translation stage 400 to move the detector 500. Once the detector 500 reaches the new position and remains stationary, the control unit 100 triggers the X-ray source 200 and the detector 500 again to acquire the next image of projection data.
[0059] Figure 2 A schematic flowchart of a jitter scanning method for an industrial testing equipment provided in this application embodiment is shown below. Figure 2 As shown, the method includes:
[0060] Step 201: Control the detector in the industrial testing equipment to move on the translation stage, and acquire multiple projection data obtained by the detector during the movement of the object to be scanned, as well as the detector feedback position value corresponding to each projection.
[0061] In this industrial inspection equipment, the object to be scanned is positioned at the rotation center of a turntable. The turntable is positioned at the detector's 0 position, and the line connecting the center of the X-ray source, the center of the turntable, and the center of the detector is perpendicular to the translation stage. The detector receives the X-rays emitted by the X-ray source passing through the object to be scanned and converts the X-rays into electrical signals. The X-ray source can be an X-ray source, and the object to be scanned can be any object requiring 3D reconstruction, such as castings and forgings, electronic assemblies, crops, archaeological artifacts, and works of art; this embodiment does not impose any limitations on this. The length of the translation stage can be determined based on the X-ray source and the turntable, ensuring that the detector receives all the X-rays emitted by the X-ray source passing through the object to be scanned during translation on the stage. The detector's feedback position value is the position value returned by the detector when scanning each projection data frame, and this position value can be determined by setting a position sensor on the translation stage.
[0062] Optionally, the detector in the industrial inspection equipment is controlled to move on a translation stage, and the object to be scanned is scanned during the movement of the detector, resulting in multiple projection data and the detector feedback position value corresponding to each projection. While the detector is scanning the object, the object rotates around the rotation center of the turntable.
[0063] Step 202: Determine the reference projection data from multiple projection data sets, and determine the reference detection position corresponding to the reference projection data.
[0064] The reference projection data refers to the projection data of the object to be scanned, which is obtained by the detector scanning the object at a constant speed while the translation stage moves. For example, if 10 projection data images of the object to be scanned are obtained after one movement of the translation stage, the reference projection data can be either the fifth or the sixth projection data image, depending on the detector's moving speed. The reference detection position is the position value fed back by the detector when scanning the reference projection data.
[0065] Optionally, reference projection data can be determined from multiple projection data based on the detector's moving speed, and the reference detection position corresponding to the reference projection data can be determined.
[0066] Step 203: Based on the detector feedback position values corresponding to the multiple projection data, translate the multiple projection data to the reference detection position to obtain multiple target projection data.
[0067] Multiple target projection data are used to reconstruct a 3D projection image of the object to be scanned.
[0068] Optionally, based on the difference between the detector feedback position value corresponding to multiple projection data and the reference detection position, the multiple projection data are translated to the reference detection position. Specifically, each pixel in the multiple projection data is translated to the reference detection position to obtain multiple target projection data at the reference detection position. The three-dimensional projection image of the object to be scanned is then reconstructed based on the multiple target projection data.
[0069] In this embodiment, the detector in the industrial inspection equipment is controlled to move on a translation stage, and multiple projection data images obtained by the detector during the movement of the detector scanning the object to be scanned, as well as the detector feedback position values corresponding to each projection image, are acquired. By moving the detector on the translation stage to scan the object to be scanned, the object to be scanned is recorded by different pixels on the detector during the scanning process. Ring artifacts in the projection data can be eliminated by confounding pixel errors, making the obtained projection data more accurate. Reference projection data is determined from the multiple projection data images, and the reference detection position corresponding to the reference projection data is determined. Based on the detector feedback position values corresponding to the multiple projection data images, the multiple projection data images are translated to the reference detection position to obtain multiple target projection data images, making the obtained target projection data more accurate. Through the multiple target projection data images at the reference detection position, a three-dimensional projection image of the object to be scanned is obtained, ensuring the reliability of the reconstruction process of the object to be scanned and the quality of the reconstructed image.
[0070] Based on the above embodiments, this application also provides a process for the movement of the detector on the translation stage in the jitter scanning method of industrial inspection equipment. Figure 3 This is a schematic diagram illustrating the process of a detector moving on a translation stage in a jitter scanning method for an industrial inspection equipment provided in this application embodiment. Figure 3 As shown, in step 201 above, controlling the movement of the detector in the industrial testing equipment on the translation stage includes:
[0071] Step 301: Determine the moving speed of the detector based on the preset exposure time of the detector.
[0072] The preset exposure time of the detector refers to the duration during which the detector's sensitive unit (pixel) receives and accumulates the X-ray photon signal for each projected image acquired.
[0073] Optionally, the detector's movement speed can be determined by dividing the detector's movement step size by the preset exposure time. The movement step size is the distance the detector needs to move after scanning one projected image. Alternatively, when the detector needs to upload a projected image, the detector's movement speed can be determined by dividing the detector's movement step size by the preset exposure time and the projected image upload time.
[0074] Step 302: Control the detector to move on the translation stage according to the moving speed.
[0075] Optionally, the detector can be controlled to move on the translation stage according to the moving speed.
[0076] In this embodiment, the detector's moving speed is determined based on its preset exposure time; and the detector is controlled to move on the translation stage based on the moving speed. By binding the moving speed to the exposure time, this application ensures that the detector remains absolutely stationary throughout the exposure process, guaranteeing the clarity and accuracy of each bald eagle image, significantly shortening the overall scanning time, and improving data acquisition efficiency.
[0077] Based on the above embodiments, this application also provides another process for the movement of the detector on a translation stage in a jitter scanning method for industrial inspection equipment. Figure 4 A schematic diagram illustrating the movement of the detector on a translation stage in another jitter scanning method for industrial inspection equipment provided in this application embodiment is shown below. Figure 4 As shown, before controlling the detector to move on the translation stage according to the moving speed in step 302 above, the method further includes:
[0078] Step 401: Determine the movement range of the detector on the translation stage based on the preset distance between adjacent jitter points and the preset number of jitter points of the detector.
[0079] The preset number of jitter points refers to the number of scans required for the detector to move within its range once. The preset number of jitter points depends on the object being scanned; a higher preset number of jitter points results in more accurate projection data. The preset distance between adjacent jitter points can be determined based on the detector's preset exposure time. Specifically, the product of the preset exposure time and the moving speed is used as the preset distance between adjacent jitter points.
[0080] Optionally, if the preset number of jitter points is b, the distance between the jitter points is c, and the initial position of the detector on the translation stage is a, then the range of movement of the detector on the translation stage is... When the detector's preset exposure time is At that time, the detector is at the initial position a, after passing through Time, movement It reaches the end position of the detector.
[0081] In step 302 above, controlling the detector to move on the translation stage according to the moving speed includes:
[0082] Step 402: Based on the moving speed, control the detector to move back and forth within the moving range until the target number of projection data sheets are collected.
[0083] The target number is determined according to specific needs, and the target number can be an integer multiple of the preset number of jitter points.
[0084] Optionally, based on the moving speed, the detector is controlled to move back and forth within the moving range. Each time the detector moves from the starting position to the ending position of the moving range, a projected image corresponding to the preset number of jitter points is obtained. The detector is controlled to move back and forth until the target number of projected images are collected.
[0085] For example, if the target number is 100 images and the preset number of jitter points is 10, then the detector is controlled to move back and forth 5 times from the starting position to the ending position of the moving range, and then move from the starting position to the ending position and then from the ending position to the starting position once, so as to obtain 100 images of projection data scanned at the preset jitter points.
[0086] In this embodiment, the movement range of the detector on the translation stage is determined based on the preset distance between adjacent jitter points and the preset number of jitter points of the detector. The detector is then controlled to move back and forth within this movement range according to the movement speed until the target number of projection data frames are acquired. This application improves scanning speed and system lifespan by optimizing the detector's motion path, while also ensuring the integrity and consistency of the dataset.
[0087] Based on the above embodiments, this application also provides a process for obtaining multiple target projection data in a jitter scanning method for industrial testing equipment. Figure 5 This is a schematic diagram illustrating the process of obtaining multiple target projection data in a jitter scanning method for an industrial inspection device provided in an embodiment of this application, as shown below. Figure 5 As shown, based on steps 201-203 above, the method further includes:
[0088] Step 501: Balance the deviation of the detector feedback position values corresponding to each projection data to obtain the true position value of the detector corresponding to each projection data.
[0089] Among them, deviation balancing refers to balancing the deviation between the detector's feedback position and the detector's actual physical position.
[0090] Optionally, each projection data is numbered to obtain the number of each projection data and the detector feedback position value. Based on the multiple projection data obtained by scanning at the same jitter point and the detector feedback position values corresponding to the multiple projection data, the detector feedback position values are balanced to obtain the detector's true position value corresponding to each projection data.
[0091] Optionally, each projection data is numbered to obtain the number of each projection data and the detector feedback position value. The deviation is balanced based on the detector feedback position value corresponding to the projection data and the detector feedback position value corresponding to the previous or next numbered projection data to obtain the true position value of the detector corresponding to each projection data.
[0092] Determining the reference detection position corresponding to the reference projection data in step 202 above includes:
[0093] Step 502: Determine the actual position value of the detector corresponding to the reference projection data as the reference detection position.
[0094] Optionally, the detector feedback position value corresponding to the reference projection data is offset and balanced, and the actual position value of the detector when the reference projection data is obtained is used as the reference detection position.
[0095] In step 203 above, based on the detector feedback position values corresponding to the multiple projection data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data, including:
[0096] Step 503: Based on the actual detector position values corresponding to the multiple projection data, translate the multiple projection data to the reference detection position to obtain multiple target projection data.
[0097] Optionally, based on the detector's true position value corresponding to multiple projection data and the reference detection position, the position difference between the detector's true position value corresponding to multiple projection data and the reference position is determined. Then, based on the position difference between the detector's true position value corresponding to multiple projection data and the reference position, the multiple projection data are translated to the reference detection position to obtain multiple target projection data.
[0098] In this embodiment, the detector feedback position values corresponding to each projection data are bias-balanced to obtain the true detector position value corresponding to each projection data. The true detector position value corresponding to the reference projection data is determined as the reference detection position. Based on the true detector position values corresponding to multiple projection data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data. This application ensures the accuracy of subsequent translation operations through bias balancing, thereby enabling the ring artifact suppression mechanism to achieve the expected optimal effect.
[0099] Based on the above embodiments, this application also provides a process for determining the true position value of a detector in a jitter scanning method for industrial inspection equipment. In step 501 above, the detector feedback position values corresponding to each projection data are balancing to obtain the true position value of the detector corresponding to each projection data, including:
[0100] Based on the detector feedback position value corresponding to each projection data and the detector feedback position value corresponding to the previous projection data, the actual detector position value corresponding to each projection data is determined.
[0101] Optionally, the detector feedback position value corresponding to each projection data is used. and the detector feedback position value corresponding to the previous projection data. The true position value of the detector corresponding to each projection data is determined by the deviation balance formula.
[0102]
[0103] in, Let be the detector feedback position value corresponding to the i-th projection data. Let be the detector feedback position value corresponding to the previous projection data of the i-th projection data. Let be the actual position value of the detector corresponding to the i-th projection data.
[0104] In this embodiment, the actual detector position value corresponding to each projection data is determined based on the detector feedback position value corresponding to each projection data and the detector feedback position value corresponding to the previous projection data. This application recommends the actual position value of the detector by using the relationship between the detector feedback position value corresponding to the previous projection data and the current feedback position value. This eliminates the backlash caused during reverse movement, ensuring that the detector's position data remains synchronized and consistent with the detector's physical movement.
[0105] Based on the above embodiments, this application also provides a process for obtaining multiple target projection data in a jitter scanning method of industrial inspection equipment. Figure 6 A schematic diagram illustrating the process of obtaining multiple target projection data in another method for jitter scanning of industrial inspection equipment provided in this application embodiment, as shown below. Figure 6 As shown, in step 503 above, based on the actual detector position values corresponding to multiple projection data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data, including:
[0106] Step 601: Determine the translation data of the multiple projection data based on the detector's actual position value, the reference detection position, and the preset unit pixel size.
[0107] The preset unit pixel size is the same as the pixel size of the detector.
[0108] Optionally, the translation data of the multiple projection data is determined by using a preset translation calculation formula based on the actual position value of the detector corresponding to the multiple projection data, the reference detection position, and the preset unit pixel size.
[0109]
[0110] in, Let be the actual detector position value corresponding to the i-th projection data. As the baseline detection position, This is the preset unit pixel size for the detector.
[0111] Step 602: Based on the translation data of multiple projection data, translate the multiple projection data to the reference detection position to obtain multiple target projection data.
[0112] Optionally, based on the translation data of multiple projection data, each pixel in the multiple projection data is translated separately, thereby translating the multiple projection data to the reference detection position and obtaining multiple target projection data.
[0113] In this embodiment, translation data for multiple projection data is determined based on the actual detector position values corresponding to multiple projection data, the reference detection position, and a preset unit pixel size. Based on this translation data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data. This application improves the accuracy of the translation data by converting the translation data to specific image pixel coordinates using a preset unit pixel size, thereby enhancing the stability and reliability of the reconstruction process.
[0114] Based on the above embodiments, this application also provides a process for obtaining multiple target projection data in a jitter scanning method of industrial testing equipment. Figure 7 A schematic diagram illustrating the process of obtaining multiple target projection data in a jitter scanning method for an industrial inspection device provided in this application embodiment is shown below. Figure 7 As shown, in step 602 above, based on the translation data of multiple projection data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data, including:
[0115] Step 701: Based on the translation data of multiple projection data, perform translation and registration on the multiple pre-registration data values of the multiple projection data in the first direction to obtain multiple post-registration data values in the first direction.
[0116] The first direction is the preset movement direction of the detector.
[0117] Optionally, based on the translation data of each projection data, the pre-registration data value of each pixel in each projection data in the first direction is translated and registered using a preset registration formula to obtain the registered data value of each projection data in the first direction.
[0118]
[0119] in, Let be the data value of the nth pixel in the i-th projection data before registration in the first direction. For the translation data of the i-th projection data, This is the data value of the nth pixel in the i-th projection data after registration in the first direction.
[0120] Step 702: Based on the multiple registered data values in the first direction and the multiple pre-registration data values in the second direction from the multiple projection data, obtain multiple target projection data.
[0121] The second direction is perpendicular to the first direction.
[0122] Optionally, since the detector only moves in the first direction, registration is only required for the data in the first direction. Therefore, multiple registered data values in the first direction and multiple unregistered data values in the second direction from the multiple projection data are used as multiple target projection data. Specifically, taking the nth pixel in the i-th projection data as an example, the data value of the nth pixel in the i-th projection data after registration in the first direction is... The data before registration of the nth pixel in the second direction of the i-th projection data is: The target projection data of the nth pixel in the i-th projection data is ( ).
[0123] In this embodiment, based on the translation data of multiple projection data, multiple pre-registration data values of the multiple projection data in a first direction are translated and registered to obtain multiple post-registration data values in the first direction. Based on the post-registration data values in the first direction and the multiple pre-registration data values in the second direction of the multiple projection data, multiple target projection data are obtained. The correction in the first direction achieves precise geometric correction and optimizes artifact suppression. The absence of correction in the second direction maintains data integrity and dimensionality, avoiding information loss.
[0124] Based on the same inventive concept, this application also provides a shaking scanning device for industrial testing equipment corresponding to the shaking scanning method of industrial testing equipment. Since the principle of the device in this application is similar to the shaking scanning method of industrial testing equipment described above, the implementation of the device can refer to the implementation of the method, and the repeated parts will not be described again.
[0125] Figure 8 This is a schematic diagram of the structure of a jitter scanning device for an industrial inspection equipment provided in an embodiment of this application. The device includes: a control module 801, a determination module 802, and a translation module 803. The control module 801 is used to control the detector in the industrial inspection equipment to move on the translation stage and to acquire multiple projection data obtained by the detector during the movement of the detector scanning the object to be scanned, as well as the detector feedback position value corresponding to each projection.
[0126] The determination module 802 is used to determine the reference projection data from multiple projection data and determine the reference detection position corresponding to the reference projection data;
[0127] The translation module 803 is used to translate multiple projection data to a reference detection position based on the detector feedback position values corresponding to the multiple projection data, thereby obtaining multiple target projection data. The multiple target projection data are used to reconstruct a three-dimensional projection image of the object to be scanned.
[0128] In one possible implementation, the control module 801 is specifically used to: determine the moving speed of the detector based on the preset exposure time of the detector;
[0129] The detector is controlled to move on the translation stage according to its movement speed.
[0130] In one possible implementation, the control module 801 is further configured to: determine the movement range of the detector on the translation stage based on the preset distance between adjacent jitter points and the preset number of jitter points of the detector; wherein, the preset number of jitter points is the number of scans required for the detector to move once within the movement range.
[0131] In one possible implementation, the control module 801 is specifically used to: control the detector to move back and forth within the movement range according to the moving speed until the target number of projection data sheets are collected.
[0132] In one possible implementation, the device further includes a balancing module, which is specifically used to balance the deviation of the detector feedback position values corresponding to each projection data to obtain the true position values of the detectors corresponding to each projection data.
[0133] In one possible implementation, the determining module 802 is specifically used to: determine the detector's true position value corresponding to the reference projection data as the reference detection position;
[0134] In one possible implementation, the translation module 803 is specifically used to: translate multiple projection data to a reference detection position based on the detector's true position value corresponding to the multiple projection data, thereby obtaining multiple target projection data.
[0135] In one possible implementation, the translation module 803 is specifically used to: determine the actual position value of the detector corresponding to each projection data based on the detector feedback position value corresponding to each projection data and the detector feedback position value corresponding to the previous projection data.
[0136] In one possible implementation, the translation module 803 is specifically used to: determine the translation data of the multiple projection data based on the detector's true position value, the reference detection position, and the preset unit pixel size.
[0137] Based on the translation data of multiple projection data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data.
[0138] In one possible implementation, the translation module 803 is specifically used to: perform translation registration on multiple pre-registration data values of multiple projection data in a first direction based on the translation data of multiple projection data, to obtain multiple post-registration data values in the first direction, wherein the first direction is the preset movement direction of the detector;
[0139] Based on multiple registered data values in the first direction and multiple pre-registration data values in the second direction from multiple projection data, multiple target projection data are obtained, wherein the second direction is perpendicular to the first direction.
[0140] The processing flow of each module in the device and the interaction flow between each module can be referred to the relevant descriptions in the above method embodiments, and will not be detailed here.
[0141] This application also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the steps of the jitter scanning method of the industrial testing equipment described above.
[0142] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems and devices described above can be referred to the corresponding processes in the method embodiments, and will not be repeated here. In the several embodiments provided in this application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of modules is only a logical functional division, and in actual implementation, there may be other division methods. Furthermore, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed mutual coupling or direct coupling or communication connection can be through some communication interfaces; the indirect coupling or communication connection of devices or modules can be electrical, mechanical, or other forms.
[0143] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. If the functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes: USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, optical disks, and other media capable of storing program code.
[0144] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application.
Claims
1. A vibration scanning method for industrial testing equipment, characterized in that, The method includes: The detector in the industrial inspection equipment is controlled to move on the translation stage, and multiple projection data obtained by the detector during the movement of the detector to scan the object to be scanned, as well as the detector feedback position value corresponding to each projection data, are acquired. The detector feedback position values corresponding to each projection data are balanced to obtain the true position values of the detectors corresponding to each projection data. Reference projection data is determined from the multiple projection data, and the actual position value of the detector corresponding to the reference projection data is determined as the reference detection position; wherein, the reference projection data is the projection data of the object to be scanned scanned by the detector when the translation stage moves at a constant speed, and the reference detection position is the position value fed back by the detector when the detector scans the reference projection data. The translation data of the multiple projection data is determined based on the detector's actual position value corresponding to the multiple projection data, the reference detection position, and the preset unit pixel size; Based on the translation data of the multiple projection data, the multiple projection data are translated to the reference detection position to obtain multiple target projection data, wherein the multiple target projection data are used to reconstruct the three-dimensional projection image of the object to be scanned; The step of balancing the deviation of the detector feedback position values corresponding to each projection data to obtain the true position value of the detector corresponding to each projection data includes: determining the true position value of the detector corresponding to each projection data based on the detector feedback position value corresponding to each projection data and the detector feedback position value corresponding to the previous projection data.
2. The method according to claim 1, characterized in that, The control of the detector in the industrial testing equipment to move on the translation stage includes: The moving speed of the detector is determined based on the preset exposure time of the detector; The detector is controlled to move on the translation stage according to the moving speed.
3. The method according to claim 2, characterized in that, Before controlling the detector to move on the translation stage according to the moving speed, the method further includes: Based on the preset distance between adjacent jitter points and the preset number of jitter points of the detector, the movement range of the detector on the translation stage is determined; wherein, the preset number of jitter points is the number of scans required for the detector to move once within the movement range; The step of controlling the detector to move on the translation stage according to the moving speed includes: Based on the moving speed, the detector is controlled to move back and forth within the moving range until the target number of projection data frames are collected.
4. The method according to claim 1, characterized in that, The step of translating the multiple projection data to the reference detection position based on the translation data of the multiple projection data to obtain the multiple target projection data includes: Based on the translation data of the multiple projection data, the multiple pre-registration data values of the multiple projection data in the first direction are translated and registered to obtain multiple post-registration data values in the first direction, wherein the first direction is the preset movement direction of the detector; The multiple target projection data are obtained based on multiple registered data values in the first direction and multiple pre-registration data values in the second direction of the multiple projection data, wherein the second direction is perpendicular to the first direction.
5. A vibration scanning device for industrial testing equipment, characterized in that, The device includes: The control module is used to control the detector in the industrial inspection equipment to move on the translation stage, and to acquire multiple projection data obtained by the detector during the movement of the object to be scanned, as well as the detector feedback position value corresponding to each projection data. The determination module is used to determine reference projection data from the multiple projection data and determine the reference detection position corresponding to the reference projection data; wherein, the reference projection data is the projection data of the object to be scanned scanned by the detector when the translation stage moves at a constant speed, and the reference detection position is the position value fed back by the detector when the detector scans the reference projection data; The translation module is used to translate the multiple projection data to the reference detection position according to the detector feedback position value corresponding to the multiple projection data, so as to obtain multiple target projection data, wherein the multiple target projection data is used to reconstruct the three-dimensional projection image of the object to be scanned; The device further includes a balancing module, which is specifically used to balance the deviation of the detector feedback position value corresponding to each projection data to obtain the true position value of the detector corresponding to each projection data. The determining module is specifically used to determine the actual position value of the detector corresponding to the reference projection data as the reference detection position; The translation module is specifically used to translate the multiple projection data to the reference detection position according to the detector's actual position value corresponding to the multiple projection data, so as to obtain the multiple target projection data; The translation module is specifically used to determine the translation data of the multiple projection data based on the detector's true position value corresponding to the multiple projection data, the reference detection position, and the preset unit pixel size; Based on the translation data of the multiple projection data, the multiple projection data are respectively translated to the reference detection position to obtain the multiple target projection data; The balancing module is specifically used to determine the actual position value of the detector corresponding to each projection data based on the detector feedback position value corresponding to each projection data and the detector feedback position value corresponding to the previous projection data.
6. An industrial scanning device, characterized in that, The industrial scanning equipment includes at least: a control unit, an X-ray source, a turntable, a translation stage, and a detector mounted on the translation stage; wherein the turntable and the detector are within the X-ray range of the X-ray source; The control unit is connected to the radiation source to control the radiation source to emit radiation. The control unit is also connected to the turntable to control the turntable to rotate. The control unit is also connected to the detector to control the detector to move on the translation stage and acquire the projection data collected by the detector. The control unit is also used to perform the jitter scanning method of the industrial testing equipment according to any one of claims 1 to 4.
7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, performs the steps of the jitter scanning method for an industrial inspection device as described in any one of claims 1 to 4.