Probe holder and ultrasonic testing apparatus

Abstract

The embodiment of the application discloses a probe seat and an ultrasonic detection device, the probe seat is used for bearing and adjusting the relative position between a detection probe of the ultrasonic detection device and a detected piece, and the probe seat comprises a frame, a flexible base body, a probe bearing assembly movably arranged on the frame and used for mounting the detection probe, and an integrated adjusting device connected to the frame and the probe bearing assembly, wherein the integrated adjusting device comprises a pose adjusting assembly used for driving the probe bearing assembly to perform multi-degree-of-freedom attitude adjustment, a pressure adjusting assembly used for driving the probe bearing assembly to perform linear motion along a direction perpendicular to a matching surface, a sensor group comprising a pose sensor combination and a pressure sensor, and a controller arranged on the frame and in communication connection with the integrated adjusting device, wherein the controller can control the pose adjusting assembly to preposition the probe bearing assembly based on a signal of the pose sensor combination, and control the pressure adjusting assembly to control the feeding amount along the direction perpendicular to the matching surface based on a signal of the pressure sensor.

Description

Technical Field

[0001] This application relates to the field of nondestructive testing technology, and in particular to a probe holder and ultrasonic testing equipment. Background Technology

[0002] In the industrial sector, non-destructive testing (NDT) technology plays a crucial role in quality and safety assessment. Among common testing techniques, radiographic testing is limited by its defect detection capabilities, has bulky equipment, high costs, and potential health risks to operators. Crucially, it has low sensitivity for detecting planar (parallel) defects, which are often critical hidden dangers. Magnetic particle testing is completely ineffective for non-ferromagnetic materials and can only detect surface and near-surface defects, thus limiting its applicability. Penetrant testing can only detect surface opening defects, and the process is cumbersome, easily affected by workpiece surface roughness, and can introduce irrelevant defects that affect direct judgment. In contrast, ultrasonic testing technology has significant advantages. Ultrasonic testing not only overcomes the shortcomings of other testing methods, but its digital display and high precision also indicate significant future potential. Therefore, ultrasonic testing is increasingly becoming the mainstream technology for industrial defect detection.

[0003] However, the detection effect of ultrasonic testing is directly related to the fit between the ultrasonic probe and the workpiece being tested. In related technologies, if the gap between the probe and the workpiece is too large during ultrasonic testing, the ultrasonic signal will be intermittent, leading to a decrease in the accuracy of ultrasonic testing. On the other hand, pressing the probe too hard will cause the detection sensitivity to be too high or fail to display, and may also cause unnecessary damage to the probe, shortening its service life. Summary of the Invention

[0004] This application discloses a probe holder and an ultrasonic testing device. The output signals of the pose sensor combination and the pressure sensor reflect the contact state between the test probe and the test object. The pose of the test probe and the distance between the test probe and the test object can be adjusted by the controller and the integrated adjustment device.

[0005] To achieve the above objectives, in a first aspect, embodiments of this application disclose a probe holder, which is used to support and adjust the relative position between the detection probe of an ultrasonic testing device and the object being tested. The probe holder includes:

[0006] frame;

[0007] A flexible substrate is detachably disposed on the frame, and the edge of the flexible substrate can make sealed contact with the mating surface of the test piece;

[0008] A probe support assembly is used to mount the detection probe, and the probe support assembly is movably disposed on the frame;

[0009] An integrated adjustment device is connected to the frame and the probe carrier assembly, the integrated adjustment device comprising:

[0010] The pose adjustment component is used to drive the probe carrier component to perform multi-degree-of-freedom pose adjustment;

[0011] A pressure regulating component is used to drive the probe carrier component to move linearly in a direction perpendicular to the mating surface;

[0012] The sensor group includes a pose sensor assembly for detecting the spatial pose of the probe carrier assembly, and a pressure sensor for detecting the contact pressure between the detection probe and the object being detected.

[0013] A controller, disposed on the frame and communicatively connected to the integrated adjustment device, is configured to:

[0014] Based on the output signal of the pose sensor combination, the pose adjustment component is controlled to pre-position the probe carrying component.

[0015] Based on the output signal of the pressure sensor, the feed amount of the pressure regulating component is controlled along the direction perpendicular to the mating surface.

[0016] In one possible implementation, the pose adjustment component includes:

[0017] A rotating mechanism is located at one end of the probe-supporting assembly near the frame;

[0018] The first driving component is communicatively connected to the controller, and its output is connected to the rotating mechanism to drive the rotating mechanism to rotate the detection probe.

[0019] In one possible implementation, the pressure regulating component includes:

[0020] An axial adjustment mechanism is movably connected to the frame and the probe support assembly;

[0021] The second driving component is communicatively connected to the controller, and its output is connected to the adjustment mechanism to drive the axial adjustment mechanism to move along the axial direction of the probe bearing assembly.

[0022] In one possible implementation, the axial adjustment mechanism includes:

[0023] A first link, one end of which is connected to the probe carrier assembly, and the other end of the second link is connected to the output end of the second drive unit;

[0024] The first universal joint is disposed between the first connecting rod and the second driving member;

[0025] An elastic element, one end of which is connected to the frame;

[0026] The second link is connected at one end to the end of the elastic element that is away from the frame, and at the other end to the probe bearing assembly;

[0027] The second universal joint is disposed between the second connecting rod and the elastic element.

[0028] In one possible implementation, the pose sensor assembly includes:

[0029] An angle sensor is disposed on the rotating mechanism and is communicatively connected to the controller;

[0030] A displacement sensor is disposed at one end of the probe support assembly near the frame and is communicatively connected to the controller.

[0031] In one possible implementation, the probe holder further includes a magnetic adjustment assembly, the magnetic adjustment assembly comprising:

[0032] An electromagnet, embedded in the frame, is used to provide an attractive force to the probe holder so that the probe holder fits against the object being tested.

[0033] A current regulating element is disposed on the frame, the current regulating element is electrically connected to the electromagnet, and the current regulating element is communicatively connected to the controller;

[0034] Multiple magnetic field strength sensors are disposed on the flexible substrate, and the multiple magnetic field strength sensors are communicatively connected to the controller.

[0035] In one possible implementation, the magnetic force adjustment component further includes:

[0036] Multiple permanent magnets are embedded in the frame;

[0037] Multiple permeability adjustment plates are attached to the side of the permanent magnet facing the test piece, corresponding one-to-one with the multiple permanent magnets.

[0038] The actuating mechanism is mechanically connected to the plurality of magnetic permeability adjustment plates;

[0039] A third driving element is disposed on the frame, and the third driving element is communicatively connected to the controller. The third driving element can provide driving force to the actuating mechanism.

[0040] In one possible implementation, the pressure sensor is disposed on the side of the probe carrier assembly near the frame, and the pressure sensor is communicatively connected to the controller.

[0041] In one possible implementation, the controller can control the operating states of the first drive unit, the second drive unit, and the third drive unit based on the signals from the pose sensor assembly, the pressure sensor, and the magnetic field strength sensor.

[0042] Secondly, embodiments of this application provide an ultrasonic testing device, comprising:

[0043] The probe holder as described in any one of the first aspects above;

[0044] A detection probe, which can be inserted into the probe holder.

[0045] The combination of a flexible substrate and a frame in the probe holder provided in this application not only improves the sealing performance during the testing process and prevents coupling agent leakage, but also facilitates replacement and adaptation to different curved surfaces of the tested parts, thus enhancing testing adaptability. The integrated adjustment device expresses the relationship between the pose adjustment component, the pressure adjustment component, and the tested part through signals detected by the sensor group and sends them to the controller. This allows the controller to perform pre-positioning and contact pressure control of the testing probe based on real-time feedback, thereby improving testing accuracy and consistency and reducing manual intervention. The probe holder provided in this application, through its integrated design, achieves multi-degree-of-freedom adjustment of the relative position between the ultrasonic testing device's probe and the tested part, improving the testing efficiency and accuracy of the ultrasonic testing equipment. It also avoids excessive pressure between the probe and the tested part, which could damage the probe and indirectly extend its service life.

[0046] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0047] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0048] Figure 1 This is one of the structural schematic diagrams of a probe holder provided in an embodiment of this application;

[0049] Figure 2 This is a second schematic diagram of a probe holder provided in an embodiment of this application;

[0050] Figure 3This is the third schematic diagram of a probe holder provided in an embodiment of this application.

[0051] Explanation of reference numerals in the attached figures:

[0052] 101-Frame, 102-Flexible substrate, 103-Probe support assembly, 104-Integrated adjustment device, 1041-Position adjustment assembly, 1042-Rotation mechanism, 1043-First driving component, 1051-Pressure adjustment assembly, 1052-Axial adjustment mechanism, 1053-First connecting rod, 1054-First universal joint, 1055-Second driving component, 1056-Elastic component, 1057-Second connecting rod, 1058-Second universal joint, 1061-Pressure sensor, 107-Controller, 108-Magnetic force adjustment assembly, 1081-Electromagnet, 1082-Current adjustment element, 1083-Magnetic field strength sensor, 1084-Permanent magnet, 1085-Permeability adjustment plate, 1086-Third driving component. Detailed Implementation

[0053] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0054] In this application, the terms "upper," "lower," "left," "right," "front," "rear," "top," "bottom," "inner," "outer," "vertical," "horizontal," "lateral," and "longitudinal" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are primarily for the purpose of better describing this application and its embodiments, and are not intended to limit the indicated device, element, or component to having a specific orientation, or to be constructed and operated in a specific orientation.

[0055] Furthermore, in addition to indicating location or positional relationship, some of the aforementioned terms may also have other meanings. For example, the term "above" may also be used in some cases to indicate a certain dependency or connection relationship. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0056] Furthermore, the terms "installation," "setup," "equipped with," "connection," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0057] Furthermore, the terms "first," "second," etc., are primarily used to distinguish different devices, components, or parts (which may be the same or different in specific type and construction), and are not intended to indicate or imply the relative importance or quantity of the indicated devices, components, or parts. Unless otherwise stated, "a plurality of" means two or more.

[0058] Please refer to Figures 1 to 2 This application provides a probe holder for supporting and adjusting the relative position between the probe of an ultrasonic testing device and the object being tested. The probe holder includes a frame 101, a flexible substrate 102, a probe support assembly 103, an integrated adjustment device 104, and a controller 107.

[0059] The flexible substrate 102 is detachably disposed on the frame 101, and the edge of the flexible substrate 102 can make sealed contact with the mating surface of the test piece.

[0060] The flexible substrate 102 can be made of silicone material, and the frame 101 can be made of a rectangular substrate. The flexible substrate 102 can be arranged circumferentially along the frame 101, and the flexible substrate 102 and the frame 101 are connected by a detachable snap-fit ​​to facilitate replacement of the flexible substrate 102. The contact area of ​​the flexible substrate 102 with the mating surface of the workpiece can be cut into an arc shape to better fit the workpiece.

[0061] The probe mount includes a probe carrier assembly 103. The probe carrier assembly 103 is used to mount the detection probe and is movably mounted on the frame 101.

[0062] A through hole can be provided at the center of the frame 101, through which the probe support assembly 103 can pass through the frame 101 and move axially relative to the frame 101 along the probe support assembly 103. A fixing mechanism can be provided at the end of the probe support assembly 103 away from the object being tested, so that when the detection probe passes through the probe support assembly 103, it can move axially with the probe support assembly 103. When the ultrasonic testing equipment is working, the detection probe can rotate relative to the probe support assembly 103.

[0063] The probe mount includes an integrated adjustment device 104, which is connected to the frame 101 and the probe support assembly 103. The integrated adjustment device 104 includes a pose adjustment assembly 1041. The pose adjustment assembly 1041 is used to drive the probe support assembly 103 to perform multi-degree-of-freedom pose adjustments.

[0064] The integrated adjustment device 104 includes a pressure adjustment component 1051. The pressure adjustment component 1051 is used to drive the probe carrier component 103 to move linearly in a direction perpendicular to the mating surface.

[0065] The integrated adjustment device 104 includes a sensor group. The sensor group includes an arrangement of pose sensors for detecting the spatial pose of the probe carrier assembly 103, and a pressure sensor 1061 for detecting the contact pressure between the probe of the ultrasonic testing equipment and the workpiece under test.

[0066] The probe holder includes a controller 107. The controller 107 is disposed on the frame 101 and communicatively connected to the integrated adjustment device 104. The controller 107 is configured to:

[0067] Based on the output signal of the pose sensor combination, the pose adjustment component 1041 is controlled to preposition the probe carrier component 103 in pose.

[0068] Based on the output signal of the pressure sensor 1061, the feed amount of the pressure regulating component 1051 along the direction perpendicular to the mating surface is controlled.

[0069] The integrated adjustment device 104 can connect the frame 101 to the probe carrier assembly 103, and through the sensor group, it can reflect the pressure and relative angle between the detection probe and the object being tested. The controller 107 can adjust the axial displacement of the probe carrier assembly 103 and the pose of the detection probe carried by the probe carrier assembly 103 based on the received signals from the sensor group.

[0070] Thus, the combination of the flexible substrate 102 and the frame 101 in the probe holder provided in this application embodiment not only improves the sealing performance during the detection process and prevents coupling agent leakage, but also facilitates the replacement and adaptation of different curved surfaces of the tested parts, thereby improving the detection adaptability; while the integrated adjustment device 104 expresses the relationship between the pose adjustment component 1041, the pressure adjustment component 1051 and the tested parts through the signals detected by the sensor group and sends them to the controller 107, so that the controller 107 can perform pre-positioning and contact pressure control of the detection probe based on real-time feedback, thereby improving detection accuracy and consistency and reducing manual intervention.

[0071] The probe holder provided in this application embodiment achieves multi-degree-of-freedom adjustment of the relative position between the ultrasonic testing probe and the tested object through integrated design, which improves the testing efficiency and accuracy of the ultrasonic testing equipment. At the same time, it avoids excessive pressure between the testing probe and the tested object, which could lead to damage to the testing probe, and indirectly extends the service life of the testing probe.

[0072] In some embodiments, the pose adjustment assembly 1041 includes a rotation mechanism 1042 disposed at one end of the probe support assembly 103 near the frame 101.

[0073] Specifically, after the detection probe is inserted into the probe support assembly 103, the rotating mechanism 1042 can hold the detection probe and allow the detection probe to rotate with the rotating mechanism 1042, so as to adjust the detection part of the detection probe and the detection part of the test piece to a more suitable angle, thereby improving the detection accuracy of the ultrasonic testing equipment.

[0074] The pose adjustment component 1041 includes a first drive member 1043, which is communicatively connected to the controller 107. The output end of the first drive member 1043 is connected to the rotating mechanism 1042 to drive the rotating mechanism 1042 to rotate the detection probe.

[0075] The first drive element 1043 can be mounted on the frame 101. The controller 107 controls the first drive element 1043 based on the received pose signal sent by the pose sensor group, so that the first drive element 1043 can adjust the angle of the rotation mechanism 1042, thereby realizing the adjustment of the angle of the detection probe.

[0076] In the above embodiment, the rotating mechanism 1042 mounted on the probe carrier assembly 103 directly clamps and drives the detection probe to rotate, allowing the ultrasonic emitting part of the detection probe to be adjusted to the optimal alignment angle with the detected part of the workpiece. Furthermore, under the coordination of the controller 107, real-time closed-loop control based on feedback from the posture sensor improves the accuracy of the incident angle and signal quality of the ultrasonic detection, thereby enhancing the accuracy and reliability of the detection.

[0077] In some embodiments, the pressure regulating assembly 1051 includes an axial adjusting mechanism 1052, which is movably connected to the frame 101 and the probe carrier assembly 103.

[0078] The axial adjustment mechanism 1052 can be housed within a silicone protective cover. The axial adjustment structure connects the frame 101 and the probe carrier assembly 103, and allows the probe carrier assembly 103 to move axially relative to the frame 101, thereby adjusting the pressure between the detection probe and the object being tested.

[0079] The pressure regulating assembly 1051 includes a second drive member 1055. The second drive member 1055 is communicatively connected to the controller 107, and the output end of the second drive member 1055 is connected to the regulating mechanism to drive the axial regulating mechanism 1052 to move along the axial direction of the probe carrying assembly 103.

[0080] The second drive unit 1055 can be mounted on the frame 101 and communicate with the controller 107, thereby enabling the controller 107 to control the second drive unit 1055 based on the pressure signal received from the pressure sensor 1061, so that the second drive unit 1055 can adjust the axial adjustment mechanism 1052, thereby adjusting the position of the probe support assembly 103 in the axial direction.

[0081] The above embodiment uses an axial adjustment mechanism 1052 driven by a second drive component 1055 to movably connect the frame 101 and the probe support assembly 103, enabling controllable axial movement of the detection probe. The axial adjustment mechanism 1052, together with the pressure sensor 1061 and the controller 107, forms a closed-loop control system. Based on real-time feedback of the contact pressure signal, it automatically adjusts the feed amount of the detection probe relative to the workpiece, thereby maintaining a constant and suitable contact pressure between the detection probe and the workpiece. This design not only effectively avoids poor coupling or signal distortion caused by insufficient pressure, but also prevents damage to the detection probe or workpiece caused by excessive pressure, improving the stability, repeatability, and adaptability to different working conditions of the detection process.

[0082] In some embodiments, the axial adjustment mechanism 1052 includes an elastic element 1056. One end of the elastic element 1056 is connected to the frame 101.

[0083] The axial adjustment mechanism 1052 includes a first connecting rod 1053. One end of the first connecting rod 1053 is connected to the probe support assembly 103, and the other end of the first connecting rod 1053 is connected to the output end of the second drive member 1055.

[0084] The axial adjustment mechanism 1052 includes a first universal joint 1054. The first universal joint 1054 is disposed between the first connecting rod 1053 and the second driving member 1055.

[0085] The first universal joint 1054 connects the output ends of the first link 1053 and the second drive member 1055, and the other end of the first link 1053 is fixedly connected to the probe carrier assembly 103. The controller 107 can drive the second drive member 1055 based on the received signal detected by the pressure sensor 1061, so that the second drive member 1055 adjusts the axial displacement of the probe carrier assembly 103 through the first link 1053.

[0086] The axial adjustment mechanism 1052 includes a second link 1057. One end of the second link 1057 is connected to one end of the elastic member 1056 away from the frame 101, and the other end is connected to the probe support assembly 103.

[0087] The axial adjustment mechanism 1052 includes a second universal joint 1058. The second universal joint 1058 is disposed between the second connecting rod 1057 and the elastic member 1056.

[0088] The second universal joint 1058 connects the second link 1057 and the elastic element 1056. The other end of the elastic element 1056 is fixedly connected to the frame 101, and the other end of the second link 1057 is fixedly connected to the probe carrier assembly 103. The elastic element 1056 can compensate for the adjustment angle of the second universal joint 1058, so that the axial displacement of the probe carrier assembly 103 can be coarsely adjusted through the second universal joint 1058 and then finely adjusted through the elastic element 1056.

[0089] The above embodiment achieves controllable adjustment of the axial displacement of the probe-bearing assembly 103 through a mechanism composed of the second driving member 1055, the first connecting rod 1053, and the first universal joint 1054. Simultaneously, the structure composed of the second connecting rod 1057, the second universal joint 1058, and the elastic member 1056 provides auxiliary support for the probe-bearing assembly 103, making its axial movement more stable and smooth. Furthermore, the elastic member 1056 provides buffering and fine-tuning capabilities, automatically compensating for pressure fluctuations caused by minor unevenness on the surface of the tested object or posture adjustments. The axial adjustment mechanism 1052, together with the controller 107 and the sensor, constitutes a closed-loop control, ensuring stable contact pressure between the detection probe and the tested object, thus improving the reliability and consistency of the detection signal.

[0090] In some embodiments, the pose sensor assembly includes an angle sensor. The angle sensor is disposed on the rotation mechanism 1042 and is communicatively connected to the controller 107.

[0091] The pose sensor assembly includes a displacement sensor. The displacement sensor is located at one end of the probe carrier assembly 103 near the frame 101 and is communicatively connected to the controller 107.

[0092] An angle sensor installed in the controller 107 can detect the rotation angle of the rotating mechanism 1042 and send the detected angle signal to the controller 107. A displacement sensor can detect the axial displacement signal of the probe support assembly 103 and send the displacement signal to the controller 107. Then, the controller 107 controls the first drive member 1043 and the second drive member 1055 based on the received signal, thereby adjusting the position and orientation of the probe support assembly 103.

[0093] In this embodiment, an angle sensor mounted on the rotating mechanism 1042 collects the deflection angle of the detection probe in real time, and a displacement sensor mounted on the probe support assembly 103 measures the axial displacement of the probe support assembly 103, thus forming a comprehensive monitoring system for the spatial pose of the detection probe. These two sensors synchronously transmit the collected angle and displacement signals to the controller 107, enabling the controller 107 to precisely coordinate the first drive component 1043 and the second drive component 1055 based on this multi-dimensional data. This achieves real-time, automatic, and coordinated adjustment of the detection probe's pose, ensuring that the detection probe always maintains stable contact with the object being tested at the optimal angle and position, ultimately improving the accuracy of ultrasonic testing.

[0094] like Figure 3 As shown, in some embodiments, the probe holder further includes a magnetic adjustment assembly 108. The magnetic adjustment assembly 108 includes an electromagnet 1081. The electromagnet 1081 is embedded in the frame 101 and is capable of providing an attractive force to the probe holder so that the probe holder adheres to the object being tested.

[0095] The magnetic force adjustment assembly 108 includes a current adjustment element 1082. The current adjustment element 1082 is disposed on the frame 101 and is electrically connected to the electromagnet 1081. The current adjustment element 1082 is communicatively connected to the controller 107.

[0096] The magnetic force adjustment assembly 108 includes multiple magnetic field strength sensors 1083. The multiple magnetic field strength sensors 1083 are disposed on the flexible substrate 102 and are communicatively connected to the controller 107.

[0097] An electromagnet 1081 is embedded inside the frame 101 near the object being tested. The electromagnet 1081 is electrically connected to a current regulating element 1082, which can be a surface-mount type attached to the surface of the frame 101. The current regulating element 1082 and multiple magnetic field strength sensors 1083 are all communicatively connected to a controller 107. The controller 107 can control the current flowing through the electromagnet 1081 via the current regulating element 1082 based on the magnetic field strength signals detected by the multiple magnetic field strength sensors 1083, thereby adjusting the magnetic field strength between the probe holder and the object being tested.

[0098] This embodiment provides an adjustable adsorption force through an electromagnet 1081 embedded in the frame 101, and combines this with real-time monitoring by multiple magnetic field strength sensors 1083 distributed on the flexible substrate 102. This allows the controller 107 to precisely control the excitation current of the electromagnet 1081 through the current regulating element 1082 based on the detected magnetic field signal, thereby achieving closed-loop regulation of the adsorption force. This not only ensures that the probe holder can obtain stable and reliable adsorption fixation on the surface to be tested with different materials, curvatures, or spatial orientations, effectively preventing slippage or overturning during the testing process, but also avoids potential damage to certain precision workpieces due to excessive magnetic force or coupling agent leakage due to insufficient magnetic force causing poor sealing of the sealing lip by optimizing the adsorption force. This improves the adaptability of the probe holder under complex working conditions and the overall stability of the testing process.

[0099] In some embodiments, the magnetic force adjustment assembly 108 further includes a plurality of permanent magnets 1084. The plurality of permanent magnets 1084 are embedded in the frame 101.

[0100] The magnetic force adjustment assembly 108 also includes multiple permeability adjustment plates 1085. Each of the multiple permeability adjustment plates 1085 corresponds to a multiple permanent magnet 1084 and is attracted to the side of the permanent magnet 1084 facing the object being tested.

[0101] The magnetic force adjustment assembly 108 also includes an actuation mechanism. The actuation mechanism is mechanically connected to multiple magnetic permeability adjustment plates 1085.

[0102] The magnetic force adjustment assembly 108 also includes a third drive element 1086. The third drive element 1086 is disposed on the frame 101 and is communicatively connected to the controller 107. The third drive element 1086 is capable of providing driving force to the actuating mechanism.

[0103] Specifically, multiple permanent magnets 1084 are independently embedded inside the frame 101 near the side of the object being tested. A permeability adjustment piece 1085 is adsorbed onto the surface of each permanent magnet 1084 facing the object being tested, and each permeability adjustment piece 1085 is movable relative to the permanent magnet 1084. Each permanent magnet 1084 is mechanically connected to a third drive member 1086 via an actuation mechanism. The third drive member 1086 is communicatively connected to a controller 107, enabling the controller 107 to control the third drive member 1086 based on the magnetic field strength signals detected by multiple magnetic field strength sensors 1083. This allows the third drive member 1086 to drive the multiple permeability adjustment pieces 1085 to move relative to their corresponding permanent magnets 1084 via the actuation mechanism.

[0104] In the above embodiments, the permanent magnet 1084 provides a basic adsorption force for the probe holder. Combined with the magnetic permeability adjustment plate 1085, which can be precisely controlled by the third drive component 1086 through the action mechanism, the magnitude of the adsorption force of the probe holder is mechanically adjusted. This allows the controller 107 to control the relative position between the adjustment plate and the permanent magnet 1084 based on the feedback from the magnetic field strength sensor 1083, thereby continuously and stably adjusting the adsorption force ultimately acting on the surface of the test piece. This not only enhances the adaptability of the probe holder to test pieces of different materials and avoids the heat generation and power consumption problems that may occur when the electromagnet 1081 works for a long time and under high intensity, but also further optimizes the bonding pressure distribution of the probe holder on complex curved surfaces through multi-point independent control. Ultimately, while ensuring an appropriate adsorption force, the overall stability of the probe holder is improved.

[0105] In some embodiments, pressure sensor 1061 is disposed on the side of probe carrier assembly 103 near frame 101, and pressure sensor 1061 is communicatively connected to controller 107.

[0106] Specifically, after the detection probe is installed on the probe holder, the detection probe and the probe support assembly 103 are kept flush. A pressure sensor 1061 is provided at the end of the probe support assembly 103 near the object being tested. The pressure signal collected by the pressure sensor 1061 can reflect the pressure between the detection probe and the object being tested. The pressure sensor 1061 can send the pressure signal to the controller 107. The controller 107 adjusts the axial displacement of the probe support assembly 103 based on the received pressure signal.

[0107] In the above embodiment, by directly placing the pressure sensor 1061 at the end of the probe carrier assembly 103 close to the workpiece being tested and keeping it flush with the end face of the detection probe, the sensor can directly detect the actual contact pressure between the detection probe and the workpiece being tested, avoiding mechanical transmission errors that may be caused by indirect measurement. This design provides the controller 107 with a real and timely pressure signal, enabling the controller 107 to accurately control the pressure regulating assembly 1051 based on this signal, realizing closed-loop adjustment of the axial displacement of the detection probe, thereby ensuring that the detection probe and the workpiece being tested always maintain a better contact pressure, effectively ensuring the stability of ultrasonic coupling and the quality of the detection signal, while preventing wear of the detection probe or detection distortion caused by improper pressure.

[0108] In some embodiments, the controller 107 can control the operating state of the first actuator 1043, the second actuator 1055, and the third actuator 1086 based on the signals from the pose sensor combination and the pressure sensor 1061.

[0109] The controller 107 drives the first drive unit 1043, the second drive unit 1055, and the third drive unit 1086 to work based on the pose signal collected by the pose sensor group, the pressure signal collected by the pressure sensor 1061, and the magnetic field strength signal collected by the magnetic field strength sensor 1083, thereby adjusting the pose of the detection probe, the contact pressure between the detection probe and the detected object, and the magnitude of the adsorption force between the probe seat and the detected object.

[0110] Specifically, the controller 107 can receive basic parameters of the workpiece input by the operator and determine the critical value of the magnetic attraction force based on these parameters using a first formula. The basic parameters of the workpiece may include data such as magnetic permeability, thickness, and hardness. The first formula is:

[0111]

[0112] Where F0 is the critical value of magnetic attraction force. I0 is the structural coefficient of electromagnet 1081 (determined by the number of pole pairs and the core material), and I0 is the current flowing through electromagnet 1081. h0 is the permeability of the part being tested and h0 is the thickness of the part being tested.

[0113] The controller 107 determines the actual magnetic attraction force of the probe holder based on the current flowing through the electromagnet 1081, the fixed magnetic field parameters of the permanent magnet 1084, and the gap distance length using a second formula. The second formula is:

[0114]

[0115] Among them, F s The actual magnetic attraction force is μ0, where μ is the free permeability. r Given the relative permeability of the tested object, the area of ​​the frame 101 of the S1 probe holder closest to the tested object, B f N is the magnetic flux density generated by the permanent magnet 1084, N is the number of turns of the electromagnet 1081 coil, I is the operating current of the electromagnet 1081, and L is the magnetic flux density generated by the permanent magnet 1084. G L is the gap distance length (which can be 0 during adsorption). f This is the length of the magnetic circuit of the core of electromagnet 1081.

[0116] Then the controller 107 compares the actual magnetic attraction force with the magnetic attraction force threshold value. If F s If F < F0, the controller 107 determines that the magnetic attraction force is insufficient. At this time, the controller 107 can control the current regulating element 1082 to increase the current passing through the electromagnet 1081; if F s If the magnetic attraction force is greater than F0, the controller 107 determines that the magnetic attraction force is too strong. The controller 107 can control the current regulating element 1082 to reduce the current passing through the electromagnet 1081, ultimately ensuring that F...s Matches F0.

[0117] The controller 107 can also determine the critical contact pressure value between the tested component and the detection probe based on the basic parameters of the tested component, the actual condition of the detection probe, and the third formula, thereby determining the appropriate contact pressure range between the tested component and the detection probe. The third formula is:

[0118]

[0119] Where, p ymax p is the critical maximum contact pressure. ymin The minimum critical contact pressure is K, which is the safety factor and can be taken as 0.005~0.008. HB is the Brinell hardness of the tested part, and S2 is the contact area between the test probe and the tested part.

[0120] The contact area between the detection probe and the workpiece can be calculated using the fourth formula. The fourth formula is:

[0121]

[0122] Where S2 is the contact area between the detection probe and the object being tested, and r is the radius of the detection probe.

[0123] The controller 107 automatically calls preset adaptation parameters based on the material of the workpiece pre-defined before testing. For example, the sampling period Ts can be set to 10ms in the controller 107, and the pressure tolerance can be set. Then, the feed rate of the second drive unit 1055 is calculated using an incremental PID formula. The incremental PID formula is:

[0124]

[0125] in, The pressure signal acquired during the nth sampling period. The pressure signal is the one acquired in the previous sampling period of the nth sampling period. For the first The pressure signals acquired in the first two sampling cycles of a sampling period, where Ts is the set sampling period, Kp is the proportional coefficient, Ki is the integral coefficient, and Kd is the derivative coefficient.

[0126] The total feed rate of the second drive unit 1055 is:

[0127]

[0128] in, This represents the theoretical total feed rate achieved by the second drive unit 1055 after the current sampling period. This represents the actual total feed rate achieved by the second drive unit 1055 after the previous sampling cycle. This is the feed amount of the second drive unit 1055 in the current sampling period.

[0129] Preferably, an interference estimate can also be introduced into the controller 107. The interference estimate can be calculated using the fifth formula. The fifth formula is:

[0130]

[0131] in, For interference estimates, The pressure change rate can be obtained using the sixth formula; Ts is the set sampling period. This represents the change in rotational speed of the second driving component 1055. The sixth formula is:

[0132]

[0133] The actual total feed rate of the second drive unit 1055 after the current sampling period is calculated based on the theoretical total feed rate, the disturbance estimate, and the seventh formula. The seventh formula is:

[0134]

[0135] in, The actual total feed rate achieved by the second drive unit 1055 after the current sampling period. This represents the theoretical total feed rate achieved by the second drive unit 1055 after the current sampling period. This is an estimate of the interference.

[0136] The controller 107 drives the second drive unit 1055 to operate based on the actual total feed amount achieved by the second drive unit 1055 after the current sampling period. Preferably, a first indicator light and a second indicator light can also be provided on the frame 101. The controller 107 sets the maximum forward speed and the maximum reverse speed of the second drive unit 1055 and converts the set speed parameters into a pulse width modulation signal (i.e., a PWM drive signal). The first indicator light is used to indicate the contact pressure between the detection probe and the detected object, and the second indicator light is used to indicate the operating status of the second drive unit 1055.

[0137] Specifically, when When the first indicator light turns red, it indicates that the contact pressure between the detection probe and the workpiece is too low, and the controller 107 confirms this. When the value is positive, the controller 107 drives the second drive unit 1055 to rotate forward, thereby driving the detection probe to feed towards the object being detected, increasing the contact pressure between the detection probe and the object being detected; when When the first indicator light turns yellow, it means that the contact pressure between the detection probe and the workpiece is too high, and the controller 107 confirms this. When the value is negative, the controller 107 drives the second drive unit 1055 to reverse, thereby driving the detection probe to feed in a direction away from the detected object; when When the first indicator is green, it means that the contact pressure between the detection probe and the object being tested is within a suitable range. At this time, the controller 107 controls the second drive unit 1055 to stop working in order to maintain a stable contact pressure.

[0138] The controller 107 adjusts the current through the electromagnet 1081 based on the critical value of magnetic attraction force and the current flowing through the electromagnet 1081 through the characteristic curve of the electromagnet 1081 pre-configured in the controller 107, so as to ensure that the attraction force of the probe holder remains in a relatively stable state.

[0139] Furthermore, a memory can be provided outside the probe holder, and the memory is communicatively connected to the controller 107. When the contact pressure and adsorption force between the detection probe and the object being detected are in a stable state, the controller 107 can package and store the detection data obtained based on the detection probe, the pressure signal obtained based on the pressure sensor 1061, the pose signal obtained based on the pose sensor combination, the magnetic field strength signal obtained based on the magnetic field strength sensor 1083, and the current value through the electromagnet 1081 into the memory.

[0140] After the detection probe completes the detection of the workpiece, the second drive unit 1055 can reverse to release the contact pressure applied to the surface of the workpiece by the probe carrier assembly 103 and the detection probe. Then, the controller 107 controls the current adjustment module to reduce the current through the electromagnet 1081 to 0, so as to reduce the attraction force between the probe holder and the workpiece. The controller 1086 controls the third drive unit 1086 to drive the permeability adjustment plate 1085 to completely cover the permanent magnet 1084, so that the probe holder separates from the surface of the workpiece.

[0141] This application also provides an ultrasonic testing device, which includes the probe holder provided in any of the above embodiments. Since the ultrasonic testing device provided in this application has the probe holder as described in any of the above embodiments, it has the beneficial effects of any of the above embodiments regarding the probe holder, which will not be described in detail here.

[0142] Ultrasonic testing equipment includes a testing probe, which can be inserted into a probe holder.

[0143] The ultrasonic testing device's probe is mounted on the probe holder and can rotate or move axially with the probe support assembly 103 in the probe holder.

[0144] The ultrasonic testing equipment provided in the above embodiments can adjust the adsorption force between the probe holder and the test piece, the pressure between the test probe and the test piece, and the position of the test probe through the controller 107 set on the probe holder, thereby achieving high testing accuracy. Since the pressure between the test probe and the test piece will not be too high, the service life of the ultrasonic testing equipment is indirectly extended.

[0145] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A probe holder, characterized in that, The probe holder is used to support and adjust the relative position between the ultrasonic testing probe and the object being tested. The probe holder includes: frame; A flexible substrate is detachably disposed on the frame, and the edge of the flexible substrate can make sealed contact with the mating surface of the test piece; A probe support assembly for mounting the detection probe, the probe support assembly being movably disposed on the frame; An integrated adjustment device is connected to the frame and the probe carrier assembly, the integrated adjustment device comprising: The pose adjustment component is used to drive the probe carrier component to perform multi-degree-of-freedom pose adjustment; A pressure regulating component is used to drive the probe carrier component to move linearly in a direction perpendicular to the mating surface; The sensor group includes a pose sensor assembly for detecting the spatial pose of the probe carrier assembly, and a pressure sensor for detecting the contact pressure between the detection probe and the object being detected. A controller, disposed on the frame and communicatively connected to the integrated adjustment device, is configured to: Based on the output signal of the pose sensor combination, the pose adjustment component is controlled to pre-position the probe carrying component. Based on the output signal of the pressure sensor, the feed amount of the pressure regulating component along the direction perpendicular to the mating surface is controlled; The probe holder further includes a magnetic adjustment assembly, which comprises: An electromagnet, embedded in the frame, is used to provide an attractive force to the probe holder so that the probe holder fits against the object being tested. A current regulating element is disposed on the frame, the current regulating element is electrically connected to the electromagnet, and the current regulating element is communicatively connected to the controller; Multiple magnetic field strength sensors are disposed on the flexible substrate, and the multiple magnetic field strength sensors are communicatively connected to the controller; Multiple permanent magnets are embedded in the frame; The controller can receive the basic parameters of the tested object and determine the critical value of magnetic attraction force based on the basic parameters using a first formula; the basic parameters of the tested object include magnetic permeability, thickness, and hardness data; the first formula is: Where F0 is the critical value of the magnetic attraction force, k is the structural coefficient of the electromagnet, and I0 is the current passing through the electromagnet. h0 is the magnetic permeability of the tested component and h0 is the thickness of the tested component. The controller determines the actual magnetic attraction force of the probe holder based on the current flowing through the electromagnet, the fixed magnetic field parameters of the permanent magnet, and the gap distance length of the permanent magnet using a second formula; the second formula is: Among them, F s The actual magnetic attraction force is μ0, where μ is the free permeability. r S1 is the relative permeability of the object being tested, S1 is the area of ​​the probe holder frame on the side closest to the object being tested, and B is the relative permeability of the object being tested. f Where N is the magnetic flux density generated by the permanent magnet, I is the number of turns in the electromagnet's coil, and L is the operating current of the electromagnet. G L is the length of the gap distance. f The length of the magnetic circuit of the electromagnet's core; The controller compares the actual magnetic attraction force with the magnetic attraction force threshold value. If F s If F < F0, the controller determines that the magnetic attraction force is insufficient. In this case, the controller can control the current regulating element to increase the current passing through the electromagnet; if F s If the magnetic attraction force is greater than F0, the controller determines that the magnetic attraction force is too strong. The controller can then control the current regulating element to reduce the current passing through the electromagnet, ultimately ensuring that F... s Matches F0.

2. The probe holder according to claim 1, characterized in that, The pose adjustment component includes: A rotating mechanism is located at one end of the probe-supporting assembly near the frame; The first driving component is communicatively connected to the controller, and its output is connected to the rotating mechanism to drive the rotating mechanism to rotate the detection probe.

3. The probe holder according to claim 2, characterized in that, The pressure regulating component includes: An axial adjustment mechanism is movably connected to the frame and the probe support assembly; The second driving component is communicatively connected to the controller, and its output is connected to the adjustment mechanism to drive the axial adjustment mechanism to move along the axial direction of the probe bearing assembly.

4. The probe holder according to claim 3, characterized in that, The axial adjustment mechanism includes: A first link, one end of which is connected to the probe carrier assembly, and the other end of which is connected to the output end of the second drive unit; The first universal joint is disposed between the first connecting rod and the second driving member; An elastic element, one end of which is connected to the frame; The second link is connected at one end to the end of the elastic element that is away from the frame, and at the other end to the probe bearing assembly; The second universal joint is disposed between the second connecting rod and the elastic element.

5. The probe holder according to claim 4, characterized in that, The magnetic force adjustment component further includes: Multiple permeability adjustment plates are attached to the side of the permanent magnet facing the test piece, corresponding one-to-one with the multiple permanent magnets. The actuating mechanism is mechanically connected to the plurality of magnetic permeability adjustment plates; A third driving element is disposed on the frame, and the third driving element is communicatively connected to the controller. The third driving element can provide driving force to the actuating mechanism.

6. The probe holder according to claim 5, characterized in that, The controller can control the working state of the first drive unit, the second drive unit, and the third drive unit based on the signals from the pose sensor combination, the pressure sensor, and the magnetic field strength sensor.

7. The probe holder according to claim 2, characterized in that, The pose sensor assembly includes: An angle sensor is disposed on the rotating mechanism and is communicatively connected to the controller; A displacement sensor is disposed at one end of the probe support assembly near the frame and is communicatively connected to the controller.

8. The probe holder according to claim 1, characterized in that, The pressure sensor is disposed on the side of the probe support assembly near the frame, and the pressure sensor is communicatively connected to the controller.

9. An ultrasonic testing device, characterized in that, include: The probe holder as described in any one of claims 1 to 8 above; A detection probe, which can be inserted into the probe holder.

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