System and method for testing noise coefficient under reversible damage of transceiving component

Abstract

The invention discloses a system and a method for testing a noise coefficient under reversible damage of a transmitting-receiving assembly. A high-power microwave injection branch generates and injects high-power microwave pulses which enable the transmitting-receiving assembly to be tested to generate reversible damage; the noise test branch generates a test noise signal covering the working frequency band of the to-be-tested transmit-receive assembly. The signal combining and protecting unit combines the high-power microwave pulse and the test noise signal, then injects the combined signal into the to-be-tested transceiving assembly, and performs isolation protection on each branch; the data acquisition and processing unit acquires and processes a noise power signal output by the to-be-tested transmit-receive assembly; and the system synchronization and control unit controls the high-power microwave injection branch and the noise test branch to alternately work in a time-sharing manner, and controls the data acquisition and processing unit to complete the measurement of the output noise power of the to-be-tested transmit-receive assembly in an intermittent period when the high-power microwave injection branch is closed. According to the invention, continuous, real-time and dynamic monitoring of the noise coefficient of the transceiver assembly in a reversible damage state can be realized.

Description

TECHNICAL FIELD

[0001] The present application relates to electromagnetic compatibility and protection technology, in particular to a kind of noise figure testing system and method of transceiver subassembly reversible damage. BACKGROUND

[0002] With the increasingly complex electromagnetic environment faced by modern electronic systems, the widespread application of high-power radar and high-power electronic countermeasures equipment, sensitive devices in radio frequency transceiver subassembly may suffer from strong electromagnetic energy attack beyond its normal dynamic range in a short time. Such attacks may cause reversible damage or irreversible damage to the device. The reversible damage of sensitive device is usually temporary deterioration of electrical characteristics, which causes gain compression, sharp increase of noise figure, decrease of linearity in receiving channel, etc., but its performance can recover automatically within a period of time after the interference is removed.

[0003] Radio frequency transceiver subassembly is the core component of radar, communication and other systems, and the noise figure of its receiving channel is a key performance indicator to measure internal noise level and assess sensitivity. Currently, the traditional noise figure measurement method aims to measure the steady-state noise performance of the subassembly under normal working condition. However, when the subassembly is subjected to high-power microwave attack and produces reversible damage, its noise figure will be transiently deteriorated during the interference period and quickly recovered after the interference is removed. The transience and recoverability of this damage state make it difficult for the traditional steady-state measurement method to effectively capture and quantify the noise figure changes during the damage process, thus making it difficult to accurately evaluate the reversible damage effect. Therefore, a new type of testing system and method is needed to realize continuous, real-time and dynamic monitoring of the noise figure of transceiver subassembly under reversible damage state, and to evaluate the impact of high-power microwave on the noise performance of transceiver subassembly receiving channel. SUMMARY

[0004] The purpose of the present application is to provide a noise figure testing system and method of transceiver subassembly under reversible damage, to achieve the purpose of real-time and dynamic testing of noise figure of transceiver subassembly under reversible damage state.

[0005] The technical solution to achieve the purpose of the present application is a noise figure testing system of transceiver subassembly under reversible damage, which includes high-power microwave injection branch, noise testing branch, signal combining and protection unit, data acquisition and processing unit, and system synchronization and control unit, wherein:

[0006] The high-power microwave injection branch is used to generate and inject high-power microwave pulses that cause reversible damage to the transceiver subassembly to be tested;

[0007] The noise testing branch generates test noise signals covering the working frequency band of the transceiver subassembly to be tested;

[0008] The signal combining and protection unit is used to combine high-power microwave pulses and test noise signals and inject them into the transceiver under test, and to isolate and protect each branch.

[0009] The data acquisition and processing unit is used to acquire and process the noise power signal output by the transceiver component under test;

[0010] The system synchronization and control unit is used to control the high-power microwave injection branch and the noise test branch to work alternately in a time-sharing manner, and during the interval when the high-power microwave injection branch is turned off, it controls the data acquisition and processing unit to complete the measurement of the output noise power of the transceiver component under test.

[0011] Furthermore, the signal combining and protection unit includes a combiner, a first circulator, an isolator, a first absorption load, a second circulator, and a second absorption load;

[0012] The first input terminal of the combiner is connected to the output terminal of the high-power microwave injection branch through the first circulator, and its second input terminal is connected to the output terminal of the noise test branch through the isolator. Its output terminal is connected to the input terminal of the transceiver under test.

[0013] The isolation port of the first circulator is connected to the first absorption load;

[0014] The output of the transceiver under test is connected to the data acquisition and processing unit through a second circulator, and the isolation port of the second circulator is connected to the second absorption load.

[0015] Furthermore, the system synchronization and control unit includes a pulse modulator and a display and control terminal;

[0016] The pulse modulator is used to generate synchronous timing signals, which are then sent to the high-power microwave injection branch, the noise test branch, and the data acquisition and processing unit, respectively.

[0017] The display and control terminal is used to configure test parameters, control the test process, and calculate the noise figure based on the data collected by the data acquisition and processing unit.

[0018] A method for testing the noise figure of transceiver components under reversible damage based on a test system includes the following steps:

[0019] Timing configuration steps: Configure the high-power microwave pulse parameters and synchronization timing through the system synchronization and control unit, so that the noise test branch is turned on during the interval of the high-power microwave pulse, and data acquisition is performed after the noise signal stabilizes during the interval;

[0020] Dynamic testing procedure: According to the synchronous timing, high-power microwave pulses and test noise signals are alternately injected into the powered transceiver under test, and its output noise power is measured during the interval. Based on this, the real-time noise figure of the transceiver under test under reversible damage state is calculated.

[0021] Furthermore, prior to the timing configuration step, the following steps are also included:

[0022] System calibration steps: Disconnect the transceiver component under test, connect the output of the signal combiner and protection unit directly to the data acquisition and processing unit, and measure and calculate the initial Y factor Y1 of the test system under synchronous timing control.

[0023] Furthermore, the system calibration steps specifically include:

[0024] During the interval and when the noise test branch is open, the first noise power N1 is measured;

[0025] The second noise power N2 was measured during the interval and when the noise test branch was closed.

[0026] Calculate the initial Y-factor of the system: .

[0027] Furthermore, the dynamic testing steps specifically include:

[0028] During the interval and when the noise test branch is open, the hot noise power N3 is collected;

[0029] During the interval and when the noise test branch is closed, the cold noise power N4 is collected;

[0030] Calculate the Y-factor, which includes the test system and the component under test: ;

[0031] By correcting the initial Y factor Y1 of the test system, the corrected Y factor is obtained: ;

[0032] Calculate the real-time noise figure NF based on the noise source excess-noise ratio (ENR) and the corrected Y factor (Y3): .

[0033] Furthermore, before the first execution of the dynamic testing steps, the following also applies:

[0034] Benchmark test procedure: Perform dynamic test procedure without injecting high-power microwave pulses to obtain the reference noise figure NF0 of the transceiver under test under normal conditions.

[0035] Furthermore, it also includes a damage assessment step:

[0036] Calculate the noise figure NF1 of the transceiver component under test after injecting the high-power microwave signal at the end of the calculation. Compare it with the initial noise figure. If the difference does not exceed the preset threshold, it is determined as a reversible damage. Gradually increase the injection power of the high-power microwave and repeat the dynamic test steps. Otherwise, it is determined that the damage has become irreversible, the test process terminates, and the real-time noise figure NF is output.

[0037] Further, the synchronous timing satisfies the following relationship:

[0038] Set the high-power microwave pulse period as t1 and the pulse width as t2;

[0039] Set the duration of the opening time window of the noise test branch as t3 and open it at a delay of t4 after the pulse ends;

[0040] Set the data acquisition and processing unit to collect the hot-state noise power at time t5 after the noise is turned on and collect the cold-state noise power at time t6 after the noise is turned off;

[0041] Among them, t4 < t5 < t3, and t5 - t4 is greater than the stable establishment time when the noise source is turned on;

[0042] t3 + t4 < t6 < t1, and t6 - t4 - t3 is greater than the stable establishment time when the noise source is turned off.

[0043] Furthermore, t1 is 1000 microseconds, t2 is 10 microseconds, t3 is 500 microseconds, t4 is 200 microseconds, t5 is 400 microseconds, and t6 is 700 microseconds.

[0044] Compared with the prior art, the significant advantage of the present invention is that it can test the change of the noise of the receiving channel of the transceiver component with the power of the injected high-power microwave signal and measure the noise parameters that are difficult to measure by traditional test methods in the reversible damage state. Brief Description of the Drawings

[0045] Figure 1 is the architecture diagram of the test system for the noise figure of the transceiver component under reversible damage of the present invention.

[0046] Figure 2 is the test flow chart of the noise figure of the transceiver component under reversible damage of the present invention.

[0047] Figure 3 is Figure 2 the schematic diagram of the timing setting of the pulse modulator in Detailed Embodiments

[0048] In order to make the purpose, technical solutions and advantages of the present application clearer, the following further details the present application with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0049] like Figure 1 As shown in the figure, the present invention provides a test system for the noise figure of a transceiver component under reversible damage, comprising five core parts: a high-power microwave injection branch, a noise test branch, a signal combining and protection unit, a data acquisition and processing unit, and a system synchronization and control unit.

[0050] High-power microwave injection branch: This includes a signal generator and a high-power microwave source connected in sequence. The signal generator is used to set and output the modulation signal of the high-power microwave pulse, including parameters such as center frequency, pulse period, and pulse width. The high-power microwave source is used to amplify the modulation signal to generate a high-power microwave pulse sufficient to cause reversible damage to the transceiver under test.

[0051] Noise test branch: Includes a noise source. The noise source generates a broadband Gaussian noise signal covering the operating frequency band of the transceiver under test, serving as the excitation source for noise figure measurement.

[0052] Signal combining and protection unit: includes a combiner, a first circulator, an isolator, a first absorbing load, a second circulator, and a second absorbing load. The first input terminal of the combiner is connected to the output terminal of a high-power microwave source via the first circulator. The second input terminal of the combiner is connected to the output terminal of a noise source via the isolator. The output terminal of the combiner is connected to the input terminal of the transceiver under test (DUT). The isolation port of the first circulator is connected to the first absorbing load to absorb high-power microwave signals reflected from the DUT, protecting the high-power microwave source. The output terminal of the DUT is connected to the data acquisition and processing unit via the second circulator. The isolation port of the second circulator is connected to the second absorbing load to absorb reflected signals from measuring instruments.

[0053] Data acquisition and processing unit: Includes a spectrum analyzer and a high-speed data acquisition card (with a time resolution in the microsecond range). The input of the spectrum analyzer is connected to the output of the second circulator to measure the noise power output of the transceiver under test. The input of the high-speed data acquisition card is connected to the output of the spectrum analyzer to acquire the noise power data measured by the spectrum analyzer in real time.

[0054] System synchronization and control unit: includes a pulse modulator and a display and control terminal. The pulse modulator is connected to the control terminals of the signal generator, noise source, and high-speed data acquisition card, respectively, and is used to send precise synchronization timing signals to the three. The display and control terminal is connected to the signal generator, pulse modulator, and high-speed data acquisition card, respectively, and is used to configure all test parameters, send control commands, extract acquired data, and calculate the noise figure based on the Y-factor method.

[0055] like Figure 2 As shown, this embodiment of the invention also provides a testing method, which specifically includes the following steps:

[0056] Step S1: Disconnect the connection between the transceiver component under test and the combiner, disconnect the connection between the transceiver component under test and the second circulator, connect the output end of the combiner to the input end of the second circulator, and the pulse modulator controls the noise test branch to work according to a preset initial timing sequence. When the noise source is turned on, use a spectrum analyzer to measure the noise power N1; when the noise source is turned off, use a spectrum analyzer to measure the noise power N2. N1 and N2 are read from the spectrum analyzer by a high-speed data acquisition card, and the display and control terminal calculates the initial Y-factor Y1 of the test system according to the following formula:

[0057]

[0058] Step S2: Set the center frequency, period, and width of the high-power microwave pulse on the display and control terminal, set the working timing parameters of the pulse modulator, so that the noise source is turned on during the time between two pulses, and the high-speed data acquisition card reads the noise power measured by the spectrum analyzer during the stable working time after the noise source is turned on;

[0059] The timing relationship is as Figure 3 shown. Let the period of the high-power microwave pulse be t1, the pulse width be t2; the duration of the noise source on-time window is t3, and the noise source is turned on at the t4 moment after the pulse ends; the high-speed data acquisition card performs hot-state noise power data acquisition at the t5 moment after the noise source is turned on, then t5 satisfies t4 < t5 < t3, and t5 - t4 is greater than the stable establishment time of the noise source on state; the high-speed data acquisition card performs cold-state noise power data acquisition at the t6 moment after the noise source is turned off, then t6 satisfies t3 + t4 < t6 < t1, and t6 - t4 - t3 is greater than the stable establishment time of the noise source off state.

[0060] In some embodiments, a set of specific values of the system working timing parameters are: t1 is 1000 microseconds, t2 is 10 microseconds, t3 is 500 microseconds, t4 is 200 microseconds, t5 is 400 microseconds, and t6 is 700 microseconds.

[0061] Step S3: Restore the connections disconnected in step S1, disconnect the connection between the output end of the combiner and the input end of the second circulator in step S1, connect the output end of the transceiver component under test to the input end of the second circulator, connect the input end of the transceiver component under test to the output end of the combiner, and turn on the power to supply power to the transceiver component under test;

[0062] Step S4: Turn on the signal generator, turn on the high-power microwave source, generate a high-power microwave injection condition, so that the high-power microwave pulse and the noise signal are injected into the transceiver component under test according to the set timing sequence, execute the in-operation test process, and the display and control terminal extracts the hot-state noise power N3 and cold-state noise power N4 collected by the high-speed data acquisition card in real time, and calculates the Y-factor Y2 in this state;

[0063]

[0064] Further adjust the effect of Y1:

[0065]

[0066] Finally, the noise source excess-to-noise ratio ENR (dB) is added to the calculation to calculate the real-time noise figure NF;

[0067]

[0068] Step S5: Turn off the high-power microwave source, disconnect the connection between the output of the first circulator and the combiner, inject only the test noise signal to execute the test process, calculate the noise figure NF1 of the transceiver under test after the high-power microwave signal injection ends, and compare it with the initial noise figure (the initial noise figure is a basic parameter of the transceiver, usually marked in the product specification, or can be measured by professionals using industry-standard methods). If the difference does not exceed the preset threshold, it is determined to be reversible damage and proceed to step S6; otherwise, it is determined that the damage has become irreversible, the test process terminates, and the real-time noise figure NF is output.

[0069] Step S6: Increase the gain of the high-power microwave source, increase the power injected into the device under test, and repeat steps S4 and S5 to perform dynamic testing and damage assessment at the new higher power level until irreversible damage assessment is triggered.

[0070] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0071] The above embodiments are merely illustrative of several implementation methods of this application, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of this application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A testing system for the noise figure under reversible damage to transceiver components, characterized in that, It includes a high-power microwave injection branch, a noise testing branch, a signal combining and protection unit, a data acquisition and processing unit, and a system synchronization and control unit, wherein: The high-power microwave injection branch is used to generate and inject high-power microwave pulses that cause reversible damage to the transceiver under test. The noise test branch is used to generate test noise signals covering the operating frequency band of the transceiver under test; The signal combining and protection unit is used to combine high-power microwave pulses and test noise signals and inject them into the transceiver under test, and to isolate and protect each branch. The data acquisition and processing unit is used to acquire and process the noise power signal output by the transceiver component under test; The system synchronization and control unit is used to control the high-power microwave injection branch and the noise test branch to work alternately in a time-sharing manner, and during the interval when the high-power microwave injection branch is turned off, it controls the data acquisition and processing unit to complete the measurement of the output noise power of the transceiver component under test.

2. The test system for noise figure under reversible damage to transceiver components according to claim 1, characterized in that, The signal combining and protection unit includes a combiner, a first circulator, an isolator, a first absorption load, a second circulator, and a second absorption load; The first input terminal of the combiner is connected to the output terminal of the high-power microwave injection branch through the first circulator, and its second input terminal is connected to the output terminal of the noise test branch through the isolator. Its output terminal is connected to the input terminal of the transceiver under test. The isolation port of the first circulator is connected to the first absorption load; The output of the transceiver under test is connected to the data acquisition and processing unit through a second circulator, and the isolation port of the second circulator is connected to the second absorption load.

3. The test system for the noise figure under reversible damage to the transceiver component according to claim 1, characterized in that, The system synchronization and control unit includes a pulse modulator and a display and control terminal; The pulse modulator is used to generate synchronous timing signals, which are then sent to the high-power microwave injection branch, the noise test branch, and the data acquisition and processing unit, respectively. The display and control terminal is used to configure test parameters, control the test process, and calculate the noise figure based on the data collected by the data acquisition and processing unit.

4. A method for testing the noise figure of a transceiver component under reversible damage based on the test system of any one of claims 1 to 3, characterized in that, Includes the following steps: Timing configuration steps: Configure the high-power microwave pulse parameters and synchronization timing through the system synchronization and control unit, so that the noise test branch is turned on during the interval of the high-power microwave pulse, and data acquisition is performed after the noise signal stabilizes during the interval; Dynamic testing procedure: According to the synchronous timing, high-power microwave pulses and test noise signals are alternately injected into the powered transceiver under test, and its output noise power is measured during the interval. Based on this, the real-time noise figure of the transceiver under test under reversible damage state is calculated.

5. The method for testing the noise figure of a transceiver component under reversible damage according to claim 4, characterized in that, Before the timing configuration step, the following is also included: System calibration steps: Disconnect the transceiver component under test, connect the output of the signal combiner and protection unit directly to the data acquisition and processing unit, and measure and calculate the initial Y factor Y1 of the test system under synchronous timing control.

6. The method for testing the noise figure of a transceiver component under reversible damage according to claim 5, characterized in that, The system calibration steps specifically include: During the interval and when the noise test branch is open, the first noise power N1 is measured; The second noise power N2 was measured during the interval and when the noise test branch was closed. Calculate the initial Y factor: .

7. The method for testing the noise figure of a transceiver component under reversible damage according to claim 6, characterized in that, The dynamic testing steps specifically include: During the interval and when the noise test branch is open, the hot noise power N3 is collected; During the interval and when the noise test branch is closed, the cold noise power N4 is collected; Calculate the Y-factor, which includes the test system and the component under test: ; By correcting the initial Y factor Y1, we obtain the corrected Y factor: ; Calculate the real-time noise figure NF based on the noise source excess-noise ratio (ENR) and the corrected Y factor (Y3): .

8. The method for testing the noise figure of a transceiver component under reversible damage according to claim 4, characterized in that, It also includes a damage determination step: Calculate the noise figure NF1 of the transceiver component under test after injecting the high-power microwave signal at the end of the calculation, and compare it with the initial noise figure. If the difference does not exceed the preset threshold, it is determined as reversible damage, and the injection power of the high-power microwave is gradually increased, and the dynamic test step is repeatedly executed. Otherwise, it is determined that the damage has become irreversible, the test process is terminated, and the real-time noise figure NF is output.

9. The method for testing the noise figure of a transceiver component under reversible damage according to claim 4, characterized in that, The synchronous timing satisfies the following relationship: Set the high-power microwave pulse period as t1 and the pulse width as t2; Set the duration of the opening time window of the noise test branch as t3 and it is opened at a delay of t4 after the pulse ends; Set the data acquisition and processing unit to collect the hot noise power at t5 after the noise is turned on and the cold noise power at t6 after the noise is turned off; Among them, t4 < t5 < t3, and t5 - t4 is greater than the stable establishment time when the noise source is turned on; t3 + t4 < t6 < t1, and t6 - t4 - t3 is greater than the stable establishment time when the noise source is turned off.

10. The method for testing the noise figure of a transceiver component under reversible damage according to claim 9, characterized in that, t1 is 1000 microseconds, t2 is 10 microseconds, t3 is 500 microseconds, t4 is 200 microseconds, t5 is 400 microseconds, and t6 is 700 microseconds.

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