Method for classifying linear polarization defects in transparent materials using stress birefringence
By acquiring and preprocessing polarization images, using optical phase conjugation technology to cancel noise, calculating the delay distribution map and performing topological data analysis, a dynamic knowledge medium-guided classification model is constructed. This solves the problems of noise interference and insufficient feature representation in the online polarization detection of transparent materials, and achieves high-precision defect classification.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NAT INST OF MEASUREMENT & TESTING TECH
- Filing Date
- 2025-11-14
- Publication Date
- 2026-06-09
AI Technical Summary
In online polarization detection of transparent materials, measurement noise introduced by mechanical vibration and environmental disturbance affects the quality of polarization images. Existing methods fail to fully exploit the spatial topological information of stress distribution, resulting in low defect classification accuracy.
The original polarization images are acquired and preprocessed. Optical phase conjugation technology is used to cancel vibration noise, the delay distribution map is calculated and topological data analysis is performed. Macroscopic topological feature vectors are extracted, and a dynamic knowledge medium is constructed to guide the classification model decision-making, outputting the defect classification results.
It effectively cancels out vibration noise, improves the accuracy of defect classification, solves the problems of noise interference and insufficient feature representation in online detection, and achieves high-precision defect classification.
Smart Images

Figure CN121499397B_ABST