Electronic device

Abstract

The invention discloses an electronic device. The electronic device comprises a substrate, a first scanning driving element, a first scanning line and a first switching element, the substrate has an active region and a peripheral region adjacent to the active region. The first scanning driving element is arranged in a first area of the peripheral area. The first scanning line is electrically connected to the first scanning driving element. The first switch element is arranged in the peripheral area and electrically connected to the first scanning line. In a first condition, the first scanning driving element provides a first scanning signal to the first scanning line. Under the second condition, the first switching element is turned on to transmit the second scanning signal to the first scanning line.

Description

Technical Field

[0001] This invention relates to an electronic device, and more particularly to a multi-screen electronic device. Background Technology

[0002] In a multi-screen panel, the electronic units (such as pixels) in the active areas of different zones are controlled by driving circuits located on different sides. When a driving circuit on one side of the multi-screen panel malfunctions, it cannot properly drive the electronic units (such as pixels) in the active areas on the malfunctioning side (e.g., discharging the electronic units to insert a black screen), causing interference for the user's viewing experience. Summary of the Invention

[0003] According to some embodiments, the present invention discloses an electronic device including a substrate, a first scan driving element, a first scan line, and a first switching element. The substrate has an active region and a peripheral region adjacent to the active region. The first scan driving element is disposed in a first region of the peripheral region. The first scan line is electrically connected to the first scan driving element. The first switching element is disposed in the peripheral region and electrically connected to the first scan line. In a first state, the first scan driving element provides a first scan signal to the first scan line. In a second state, the first switching element is turned on to transmit a second scan signal to the first scan line. Attached Figure Description

[0004] Figures 1A to 1C This is a schematic diagram of an electronic device according to an embodiment of the present invention.

[0005] Figures 2 to 6 These are schematic diagrams of electronic devices according to different embodiments of the present invention.

[0006] Explanation of reference numerals in the attached figures: 20 - substrate; 30 - active area; 31, 41 - first area; 32, 42 - second area; 40 - peripheral area; 51, 52 - scan driving element; 61, 62 - data driving element; 100, 200, 300, 400, 500, 600 - electronic device; D1, D2 - data lines; D1S, D2S - data signals; B, G, R - sub-pixels; GSW_N_L, GSW_P_L, GE_L, GO_L, GSB_N_L, GSB_P_L, GSW_N_R, GSW_P_R, GE_R, GO_R, GSB_N_R, GSB_P_R, GSB_L, GSB_R, GON_L, GON_R, SL, SR, XGON_L, XGON_R - Signals; G1, G2, G11 to G1n, G21 to G2n - Scan lines; G1L to GnL, G1R to GnR, GL, GLL, GLR, GR, GRR, GRL - Scan signals; P1, P2, P111 to P1nm, P211 to P2nm - Pixels; PE - Pixel electrodes; Q1, Q2, Qa, Qb - N-type transistors; Q3, Q4 - P-type transistors; SW1 to SW1n, SW2 to SW2n, SW3 to SW3n, SW4 to SW4n, SW5 to SW8 - Switching elements. Detailed Implementation

[0007] The present invention can be understood by referring to the following detailed description in conjunction with the accompanying drawings. It should be noted that, for ease of understanding and for the sake of brevity, many of the drawings depict only a portion of the electronic device, and specific elements in the drawings are not drawn to scale. Furthermore, the number and size of the elements in the drawings are for illustrative purposes only and are not intended to limit the scope of the present invention.

[0008] Throughout this specification and the appended claims, certain terms are used to refer to specific elements. Those skilled in the art will understand that electronic device manufacturers may use different names to refer to the same elements. This document is not intended to distinguish between elements that have the same function but different names.

[0009] In the following description and claims, the terms "comprising," "containing," and "having" are open-ended terms and should therefore be interpreted as "containing but not limited to...". Thus, when the terms "comprising," "containing," and / or "having" are used in the description of this invention, they specify the presence of the corresponding features, areas, steps, operations, and / or components, but do not exclude the presence of one or more of the corresponding features, areas, steps, operations, and / or components.

[0010] The directional terms used herein, such as "up," "down," "front," "back," "left," and "right," are for reference only when referring to the accompanying drawings. Therefore, the directional terms used are illustrative and not intended to limit the invention. In the accompanying drawings, each figure illustrates general features of the methods, structures, and / or materials used in specific embodiments. However, these figures should not be construed as defining or limiting the scope or nature covered by these embodiments. For example, for clarity, the relative dimensions, thicknesses, and positions of various films, regions, and / or structures may be reduced or enlarged.

[0011] When a component (e.g., a membrane or region) is referred to as "on another component," it can be directly on that component, or there can be other components between them. Conversely, when a component is referred to as "directly on another component," there are no components between them. Furthermore, when a component is referred to as "on another component," the two components are vertically related, and this component can be above or below the other component, depending on the orientation of the device.

[0012] It should be understood that when a component or membrane is referred to as being "connected to" another component or membrane, it can be directly connected to this other component or membrane, or there can be an intercalated component or membrane between them. When a component is referred to as being "directly connected to" another component or membrane, there is no intercalated component or membrane between them. Additionally, when a component is referred to as being "electrically connected to another component (or a variant thereof)," it can be directly connected to this other component, or indirectly connected (e.g., electrically connected) to this other component through one or more components.

[0013] In this invention, when one component is "electrically connected" to another component, an electrical signal can flow between the two components at least for a certain period of time under normal operation; when one component is "electrically connected" to another component, an electrical signal can flow between the two components for a specified period of time. In this invention, when one component is "disconnected" from another component, an electrical signal cannot flow between the two components for a specified period of time.

[0014] The terms "approximately" or "identical" are generally interpreted as being within ±20% of a given value, or within ±10%, ±5%, ±3%, ±2%, ±1%, or ±0.5% of a given value.

[0015] The ordinal numbers used in the specification and claims, such as "first," "second," etc., to modify elements, do not in themselves imply or represent any prior ordinal number for that element (or those elements), nor do they represent the order of one element with another, or the order of manufacturing processes. The use of these ordinal numbers is solely to clearly distinguish one named element from another element with the same name. The claims and specification may not use the same terminology; therefore, a first element in the specification may be a second element in the claims.

[0016] It should be understood that the features described below can be replaced, recombined, or mixed in several different embodiments to complete other embodiments without departing from the spirit of the invention. Features between embodiments can be arbitrarily mixed and combined as long as they do not violate the spirit of the invention or conflict with it.

[0017] In this invention, the electronic device may include a display device, a light-emitting device, a backlight device, a virtual reality device, an augmented reality (AR) device, an antenna device, a sensing device, a splicing device, or any combination thereof, but is not limited thereto. The display device may be a non-self-emissive display or a self-emissive display, and may be a color display or a monochrome display, depending on the requirements. The antenna device may be a liquid crystal type antenna device or a non-liquid crystal type antenna device; the sensing device may be a sensing device that senses capacitance, light, heat, or ultrasound; and the splicing device may be a display splicing device or an antenna splicing device, but is not limited thereto. The electronic units in the electronic device may include passive and active components, such as capacitors, resistors, inductors, diodes, transistors, etc. The diode may include a light-emitting diode (LED) or a photodiode. The light-emitting diode may include, for example, an organic light-emitting diode (OLED), a mini LED, a micro LED, or a quantum dot LED, but is not limited thereto. Transistors may include, for example, top-gate thin-film transistors, bottom-gate thin-film transistors, or dual-gate thin-film transistors, but are not limited thereto. Electronic devices may also include, as needed, fluorescent materials, phosphorescent materials, quantum dot (QD) materials, or other suitable materials, but are not limited thereto. Electronic devices may have peripheral systems such as drive systems, control systems, light source systems, etc., to support display devices, antenna devices, wearable devices (e.g., augmented reality or virtual reality devices), automotive devices (e.g., automotive windshields), or splicing devices.

[0018] In some embodiments, the electronic panel may be a type of electronic device, and the electronic panel may be at least a combination of a display device and a touch sensing device, so that the electronic panel has at least display functionality and touch sensing functionality. The present invention is described below using an electronic device as an example, but the design of the present invention can be applied to any suitable electronic device.

[0019] Furthermore, the switching element described in this invention can be any electronic component with switching effect. For example, the switching element can be a thin-film transistor. For example, the thin-film transistor can be a top-gate transistor, a bottom-gate transistor, a dual-gate transistor, or other suitable types of transistors.

[0020] Please refer to Figures 1A to 1C , Figures 1A to 1C This is a schematic diagram of an electronic device 100 according to an embodiment of the present invention. Wherein, in order to... Figures 1A to 1C It can clearly illustrate the important components and signals of each part of the electronic device 100. Figure 1A The main focus of the drawing is on the active area 30 of the electronic device 100 and the two data driving elements 61 and 62. Figure 1B The main focus is on the portions within the first zone 41 and the second zone 42 of the peripheral area 40 of the electronic device 100, while Figure 1C The illustration primarily depicts the circuitry of four electronic units of the electronic device 100, such as four pixels P11m, P12m, P211, and P221. The electronic device 100 may be a display device and may include a substrate 20, a scan driving element 51, scan lines G11 to G1n, switching elements SW1 to SW4 and SW1n to SW4n, a scan driving element 52, and scan lines G21 to G2n. The substrate 20 has an active area 30 and a peripheral area 40 adjacent to the active area 30. In this embodiment, the peripheral area 40 is, for example, an area on the substrate 20 other than the active area 30. Figures 1A to 1C As shown, the electronic device 100 may further include a plurality of pixels P111 to P1nm and pixels P211 to P2nm disposed in the active area 30, and data driving elements 61 and 62 disposed in the peripheral area 40. Pixels P111 to P1nm are disposed in the first area 31 of the active area 30 and electrically connected to the data driving element 61 via data line D1, while pixels P211 to P2nm are disposed in the second area 32 of the active area 30 and electrically connected to the data driving element 62 via data line D2. Pixels P111 to P1nm may be arranged in m columns and n rows, for example, and pixels P211 to P2nm may also be arranged in m columns and n rows, where m and n are integers greater than 1, but are not limited thereto. Each data line D1 extends from the peripheral area 40 to the first area 31 of the active area 30 and is electrically connected to the data driver element 61, while each data line D2 extends from the peripheral area 40 to the second area 32 of the active area 30 and is electrically connected to the data driver element 62.

[0021] Each pixel may include, for example, three sub-pixels R, G, and B, representing the red, green, and blue sub-pixels respectively, but is not limited to these and may include sub-pixels of other colors depending on the design. Figure 1CAs shown, each sub-pixel R, G, or B may be, for example, a sub-pixel with a dual-gate structure and includes N-type transistors Qa and Qb and a pixel electrode PE, but is not limited thereto. The gates of the two N-type transistors Qa and Qb of each sub-pixel R, G, or B are electrically connected to a corresponding scan line. For example, in pixel P11m, the gates of the two N-type transistors Qa and Qb of each sub-pixel R, G, and B are electrically connected to scan line G11; in pixel P211, the gates of the two N-type transistors Qa and Qb of each sub-pixel R, G, and B are electrically connected to scan line G21; in pixel P12m, the gates of the two N-type transistors Qa and Qb of each sub-pixel R, G, and B are electrically connected to scan line G12; and in pixel P221, the gates of the two N-type transistors Qa and Qb of each sub-pixel R, G, and B are electrically connected to scan line G22, but is not limited thereto. Furthermore, each pixel P111 to P1nm (e.g., within the first region 31 of the active region 30) is disposed within the active region 30. Figure 1C In the active region 30, one end of the N-type transistor Qa in each sub-pixel R, G, and B of pixels P11m to P12m is electrically connected to a corresponding data line D1, and each pixel P211 to P2nm (e.g., in the second region 32 of the active region 30) is disposed in the second region 32 of the active region 30. Figure 1C In the pixel P211 to P221, one end of the N-type transistor Qa in each sub-pixel R, G, and B is electrically connected to a corresponding data line D2. The two ends of the N-type transistor Qb are electrically connected to the other end of the N-type transistor Qa and the pixel electrode PE, respectively.

[0022] In other embodiments of the invention, the N-type transistor Qb of each sub-pixel R, G and B may be omitted, while the two ends of the N-type transistor Qa are electrically connected to the data line (D1 or D2) and the pixel electrode PE, respectively.

[0023] like Figures 1A to 1BAs shown, scan driving element 51 is disposed in the first region 41 of the peripheral region 40, and scan driving element 52 is disposed in the second region 42 of the peripheral region 40. Scan driving element 51 is configured, for example, to generate scan signals G1L to GnL, and transmits scan signals G1L to GnL to each sub-pixel R, G, and B in the first region 31 of the active region 30 via scan lines G11 to G1n. Scan driving element 52 is configured to generate scan signals G1R to GnR, and transmits scan signals G1R to GnR to each sub-pixel R, G, and B in the second region 32 of the active region 30 via scan lines G21 to G2n. Specifically, scan signal G1L is transmitted via scan line G11, scan signal GnL via scan line G1n, scan signal G1R via scan line G21, scan signal GnR via scan line G2n, and so on. Scan lines G11 to G1n are electrically connected to scan drive element 51, and scan lines G21 to G2n are electrically connected to scan drive element 52. Furthermore, scan lines G11 to G1n can extend from the first region 31 of the active region 30 to the second region 32 of the active region 30, while scan lines G21 to G2n can extend from the second region 32 of the active region 30 to the first region 31 of the active region 30.

[0024] Switching elements SW1 to SW1n and SW2 to SW2n of the electronic device 100 are disposed in the first region 41 of the peripheral region 40 and electrically connected to scan lines G11 to G1n. Switching elements SW3 to SW3n and SW4 to SW4n of the electronic device 100 are disposed in the second region 42 of the peripheral region 40 and electrically connected to scan lines G21 to G2n. Switching elements SW2 to SW2n are disposed in the first region 41 of the peripheral region 40 and electrically connected between the scan driving element 51 and scan lines G11 to G1n. Switching elements SW4 to SW4n are disposed in the second region 42 of the peripheral region 40 and electrically connected between the scan driving element 52 and scan lines G21 to G2n. Each switching element SW1 to SW1n, SW2 to SW2n, SW3 to SW3n, and SW4 to SW4n respectively has, for example, N-type transistors Q1 and Q2 and P-type transistors Q3 and Q4 electrically connected in a dual-gate structure (e.g., Figure 1B (as shown), but not limited to this.

[0025] Each of the switching elements SW1 to SW1n has two control terminals that receive signals GSB_N_L and GSB_P_L respectively; each of the switching elements SW2 to SW2n has two control terminals that receive signals GSW_N_L and GSW_P_L respectively; each of the switching elements SW3 to SW3n has two control terminals that receive signals GSB_N_R and GSB_P_R respectively; and each of the switching elements SW4 to SW4n has two control terminals that receive signals GSW_N_R and GSW_P_R respectively. Furthermore, the two control terminals of each switching element SW1 to SW1n are the gates of N-type transistors Q1 and Q2 for receiving the signal GSB_N_L, and the gates of P-type transistors Q3 and Q4 for receiving the signal GSB_P_L; the two control terminals of each switching element SW2 to SW2n are the gates of N-type transistors Q1 and Q2 for receiving the signal GSW_N_L, and the gates of P-type transistors Q3 and Q4 for receiving the signal GSW_P_L. The gate of transistor Q4; the two control terminals of each switching element SW3 to SW3n are the gates of two N-type transistors Q1 and Q2 used to receive the signal GSB_N_R, and the gates of P-type transistors Q3 and Q4 used to receive the signal GSB_P_R; and the two control terminals of switching elements SW4 to SW4n are the gates of N-type transistors Q1 and Q2 used to receive the signal GSW_N_R, and the gates of P-type transistors Q3 and Q4 used to receive the signal GSW_P_R.

[0026] Data driver element 61 and data driver element 62 respectively provide signals GSW_N_L, GSW_P_L, GE_L, GO_L, GSB_N_L, GSB_P_L, GSW_N_R, GSW_P_R, GE_R, GO_R, GSB_N_R and / or GSB_P_R, but are not limited thereto. Therefore, even if one of data driver element 61 and data driver element 62 fails, the other data driver element can still transmit signals GSW_N_L, GSW_P_L, GE_L, GO_L, GSB_N_L, GSB_P_L, GSW_N_R, GSW_P_R, GE_R, GO_R, GSB_N_R and / or GSB_P_R to the switching element on the failed side. For example, when data driver 61 fails, the signals GSW_N_L, GSW_P_L, GE_L, GO_L, GSB_N_L and / or GSB_P_L generated by data driver 62 will be transmitted to the left-side switching elements SW1 to SW1n and SW2 to SW2n. The control terminals of switching elements SW1 to SW1n and SW2 to SW2n are provided, for example, by one of data driver 61 and data driver 62 (e.g., the data driver 62 that has not failed). Similarly, when data driver 62 fails, the signals GSW_N_R, GSW_P_R, GE_R, GO_R, GSB_N_R and / or GSB_P_R generated by data driver 61 will be transmitted to the right-side switching elements SW3 to SW3n and SW4 to SW4n. The control terminals of switching elements SW3 to SW3n and SW4 to SW4n are provided, for example, by one of data driver 61 and data driver 62 (e.g., the data driver 61 that has not failed).

[0027]

[0028]

[0029] (Table 1)

[0030] The following explanation uses the failure of data drive element 61 as an example, and the normal operation of both data drive elements 61 and 62 as an example. Please refer to Table 1. When both data drive elements 61 and 62 are normal, the electronic device 100 is in a normal state (first state). Signals GSW_N_L, GSW_N_R, GSB_P_L, and GSB_P_R are, for example, all at a high potential VH, and signals GSW_P_L, GSW_P_R, GSB_N_L, and GSB_N_R are, for example, all at a low potential VL. This causes switching elements SW2 to SW2n and SW4 to SW4n to be turned on, and switching elements SW1 to SW1n and / or SW3 to SW3n to be turned off. This allows the scan signals G1L to GnL generated or provided by the scan drive element 51 to be transmitted to the corresponding scan lines G11 to G1n, for example, through switching elements SW2 to SW2n. In the normal state (first state), the scan drive element 51 provides scan signals G1L to GnL on scan lines G11 to G1n. In the normal state (first state), scan signals G1R to GnR generated by the scan drive element 52 can, for example, be transmitted to the corresponding scan lines G21 to G2n via switching elements SW4 to SW4n. In the normal state (first state), the scan drive element 52 provides scan signals G1R to GnR on scan lines G21 to G2n. At this time, signals GE_L, GE_R, GO_L, and GO_R can be, for example, ground voltage (GND), and the common electrode of pixels P11m, P12m, P211, and P221 can be, for example, a common voltage VCOM. Data driving elements 61 and 62 transmit data voltages ranging from VdataH to VdataL to pixels P11m, P12m, P211, and P221 via data lines D1 and D2, respectively. In the first state (normal state), pixels P11m and P12m are driven by scan driving element 51, while pixels P211 and P221 are driven by scan driving element 52.

[0031] When data driver element 61 fails while data driver element 62 is functioning normally, electronic device 100 is in a failure state (second state). Signals GSW_N_L and GSB_P_L are, for example, both at ground voltage GND. At this time, the voltages of signals GSW_P_L, GE_L, and GO_L can be between a high potential VH and a low potential VL. Signals GSW_N_R and GSB_P_R are, for example, at a high potential VH, and signals GSW_P_R and GSB_N_R are, for example, at a low potential VL. As a result, switching elements SW1 to SW1n and SW4 to SW4n are turned on, while switching elements SW2 to SW2n and SW3 to SW3n are turned off. When data driver element 61 fails while data driver element 62 is functioning normally, electronic device 100 is in a failure state (second state). Signals GE_L and GO_L generated or provided by data driver element 62 can, for example, be transmitted as scan signals through the activated switching elements SW1 to SW1n to scan lines G11 to G1n. In other words, switching elements SW1 to SW1n are activated, for example, to transmit the corresponding scan signals (signals GE_L and GO_L) to the first scan lines G11 to G1n respectively, while the corresponding scan signals (e.g., signals GE_L and GO_L) are not provided by scan driver element 51. When data driver element 61 fails while data driver element 62 is functioning normally, electronic device 100 is in a failure state (second state). Scan signals G1R to GnR generated by scan driver element 52 can, for example, still be transmitted to scan lines G21 to G2n through switching elements SW4 to SW4n. At this time, the common electrode of the pixels can be ground voltage GND, and the data driving element 61 transmits the ground voltage GND to pixels P111 to P1nm through data line D1. In this way, pixels P111 to P1nm display black, for example, so that the pixels in the first area 30 (left side) of the electronic device 100 display a black screen. Meanwhile, the data driving element 62 transmits a data voltage ranging from VdataH to VdataL to pixels P211 to P2nm through data line D2, so pixels P211 to P2nm can still display the image normally. When data driving element 61 fails while data driving element 62 is normal, electronic device 100 is in a failure state (second state). Switching elements SW1 to SW1n are turned on to transmit scan signals to scan lines G11 to G1n respectively to turn on transistors (transistor Qa and / or transistor Qb) in multiple pixels P11m and P12m. Pixels P11m and P12m are not driven by scan driving element 51, for example, while pixels P211 and P221 are driven by scan driving element 52.

[0032] Since data driving elements 61 and 62 generate signals GSW_N_L, GSW_P_L, GE_L, GO_L, GSB_N_L, GSB_P_L, GSW_N_R, GSW_P_R, GE_R, GO_R, GSB_N_R, and GSB_P_R respectively, but are not limited to these, even if one of the data driving elements 61 and 62 fails, the other data driving element can still generate or provide signals and transmit signals GSW_N_L, GSW_P_L, GE_L, GO_L, GSB_N_L, GSB_P_L, GSW_N_R, GSW_P_R, GE_R, GO_R, GSB_N_R, and GSB_P_R to the switching element on the failed side. In this way, when one of the data driving elements 61 and 62 fails, the pixel on the failed side displays a black screen, while the pixel on the non-failed side displays a normal screen.

[0033] The above embodiment illustrates the situation with data drive element 62 functioning normally while data drive element 61 fails. Based on this description, those skilled in the art can deduce the operation mode when data drive element 62 fails while data drive element 61 functions normally. Furthermore, each switching element SW1 to SW1n, SW2 to SW2n, SW3 to SW3n, and SW4 to SW4n in the above embodiment, for example, has N-type transistors Q1 and Q2 and P-type transistors Q3 and Q4 electrically connected in a dual-gate structure; however, the present invention is not limited thereto. Please refer to... Figure 2 , Figure 2 This is a schematic diagram of an electronic device 200 according to another embodiment of the present invention. The difference between electronic device 200 and electronic device 100 is that each switching element SW1 to SW1n, SW2 to SW2n, SW3 to SW3n, and SW4 to SW4n of electronic device 200 has an N-type transistor Q1 and a P-type transistor Q3 electrically connected in a single-gate configuration. Apart from the above differences, the circuit structure and operation of electronic device 200 are the same as those of electronic device 100, and therefore will not be described further.

[0034] Please refer to Figure 3 , Figure 3This is a schematic diagram of an electronic device 300 according to another embodiment of the present invention. The electronic device 300 may be a display device and may include a substrate 20, a scan driving element 51, a scan line G1, switching elements SW1 to SW8, a scan driving element 52, and a scan line G2. The substrate 20 has an active region 30 and a peripheral region 40 adjacent to the active region. In this embodiment, the peripheral region 40 is the area on the substrate 20 other than the active region 30. The electronic device 300 may further include a plurality of pixels (such as P1 and P2) disposed in the active region 30, and data driving elements 61 and 62 disposed in the peripheral region 40. Pixel P1 is disposed in the first region 31 of the active region 30 and electrically connected to the data driving element 61 via a data line D1, and pixel P2 is disposed in the second region 32 of the active region 30 and electrically connected to the data driving element 62 via a data line D2. The first region 31 is, for example, adjacent to the second region 32. The structure of the plurality of pixels disposed in the active region 300 of the electronic device 300 may be the same as the structure of the plurality of pixels of the electronic device 100 (e.g., Figure 1C As shown in the figure, it will not be elaborated further here.

[0035] Scan driving element 51 is disposed in the first region 41 of the peripheral region 40, and scan driving element 52 is disposed in the second region 42 of the peripheral region 40. The first region 41 and the second region 42 are disposed, for example, on opposite sides. Scan driving element 51 is configured to generate a scan signal GL and transmit the scan signal GL to the sub-pixels R, G, and B of pixel P1 in the first region 31 of the active region 30 via scan line G1, but is not limited thereto. Scan line G1 is electrically connected to scan driving element 51, and scan line G2 is electrically connected to scan driving element 52. Scan driving element 52 is configured to generate or provide a scan signal GR and transmit the scan signal GR to the sub-pixels R, G, and B of pixel P2 in the second region 32 of the active region 30 via scan line G2, but is not limited thereto. Scan line G1 may extend from the first region 41 of the peripheral region 40 to the active region 30 (e.g., the first region 31 and the second region 32), and one end of scan line G1 is electrically connected to scan driving element 51. The scan line G2 can extend from the second region 42 of the peripheral region 40 to the active region 30 (e.g., the second region 32 and the first region 31), and one end of the scan line G2 is electrically connected to the scan drive element 52. Furthermore, Figure 3 Although only two scan lines G1 and G2 and the corresponding row of pixels (including pixels P1 and P2) are shown, those skilled in the art should understand from the description of this invention. Figure 3 The embodiments can be extended to cases where the electronic device 300 includes more scan lines and more rows of pixels.

[0036] Switching elements SW1 and SW2 of the electronic device 300 are disposed in the peripheral region 40 (e.g., the first region 41) and electrically connected to the scan line G1, while switching elements SW3 and SW4 of the electronic device 300 are disposed in the second region 42 of the peripheral region 40 and electrically connected to the scan line G2. Switching element SW2, disposed in the first region 41 of the peripheral region 40, is electrically connected between the scan driving element 51 and the scan line G1. The control signal (e.g., signal GON_L or signal XGN_L) of switching element SW2 is provided by the scan driving element 52. Switching element SW4 is electrically connected between the scan driving element 52 and the scan line G2. The control signal (e.g., signal GON_R or signal XGN_R) of switching element SW4 is provided by the scan driving element 51, but is not limited thereto. Switching element SW5 is electrically connected between the data driving element 61 and the data line D1, while switching element SW7 is electrically connected between the data driving element 62 and the data line D2. One end of switching element SW6 is electrically connected to data line D1, while the other end of switching element SW6 receives signal SL. One end of switching element SW8 is electrically connected to data line D2, while the other end of switching element SW8 receives signal SR.

[0037] Switching elements SW1 to SW8 are exemplified by having, for example, two N-type transistors Q1 and Q2 and two P-type transistors Q3 and Q4 electrically connected in a dual-gate structure, but are not limited thereto. Switching elements SW1, SW4, SW7 and SW8 each have two control terminals for receiving signals GON_R and XGON_R, respectively, while switching elements SW2, SW3, SW5 and SW6 each have two control terminals for receiving signals GON_L and XGON_L, respectively. Furthermore, the two control terminals of switching elements SW1 and SW8 are the gates of N-type transistors Q1 and Q2, which are used to receive the signal XGON_R, and the gates of P-type transistors Q3 and Q4, which are used to receive the signal GON_R, respectively; the two control terminals of switching elements SW2 and SW5 are the gates of N-type transistors Q1 and Q2, which are used to receive the signal GON_L, and the gates of P-type transistors Q3 and Q4, which are used to receive the signal XGON_L, respectively; the two control terminals of switching elements SW3 and SW6 are the gates of N-type transistors Q1 and Q2, which are used to receive the signal XGON_L, and the gates of P-type transistors Q3 and Q4, which are used to receive the signal GON_L, respectively; and the two control terminals of switching elements SW4 and SW7 are the gates of N-type transistors Q1 and Q2, which are used to receive the signal GON_R, and the gates of P-type transistors Q3 and Q4, which are used to receive the signal XGON_R, respectively, but are not limited to these.

[0038] Scan drive elements 51 and 52 generate or provide signals GON_L, XGON_L, GON_R, and XGON_R, respectively. Therefore, even if one of the scan drive elements 51 and 52 fails, the other scan drive element (the one that has not failed) can still generate or provide signals to the control terminal and transmit signals GON_L, XGON_L, GON_R, and XGON_R to the switching element on the failed side. For example, when scan drive element 51 fails while scan drive element 52 is functioning normally, the signals GON_L, XGON_L, GON_R, and XGON_R generated by scan drive element 52 will be transmitted to the switching elements SW1, SW2, SW5, and SW6 on the left side (i.e., the first zone 41), controlling the opening or closing of these switching elements SW1, SW2, SW5, and SW6. That is, the signals (GON_L, XGON_L, GON_R, and XGON_R) at the control terminals of switching elements SW1, SW2, SW5, and SW6 are provided by scan drive element 52, but are not limited to... Therefore, when the scan drive element 52 fails while the scan drive element 51 is normal, the signals GON_L, XGON_L, GON_R and XGON_R generated by the scan drive element 51 will be transmitted to the switching elements SW3, SW4, SW7 and SW8 on the right side (i.e., the second zone 42) for example, and control the opening or closing of these switching elements SW3, SW4, SW7 and SW8. That is, the signals (signals GON_L, XGON_L, GON_R and XGON_R) at the control terminals of the switching elements SW3, SW4, SW7 and SW8 are provided by the scan drive element 51 for example, but not limited to this.

[0039]

[0040] (Table 2)

[0041] The following descriptions will be based on the example of the failure of the scanning drive element 51 of the electronic device 300 (i.e., the second state) and the example of the normal operation of both scanning drive elements 51 and 52 (i.e., the first state). Please refer to Table 2. When both scan drive elements 51 and 52 are normal (i.e., the first state), the electronic device 300 is in a normal state. Signals GON_L and GON_R are, for example, at a high potential VH, and signals XGON_L and XGON_R are, for example, at a low potential VL. This causes switching elements SW2, SW4, SW5, and SW7 to be turned on, and switching elements SW1, SW3, SW6, and SW8 to be turned off. This allows the scan signal GL generated or provided by scan drive element 51 to be transmitted to scan line G1 through switching element SW2, the scan signal GR generated or provided by scan drive element 52 to be transmitted to scan line G2 through switching element SW4, the data signal D1S generated or provided by data drive element 61 to be transmitted to data line D1 through switching element SW5, and the data signal D2S generated or provided by data drive element 62 to be transmitted to data line D2 through switching element SW7.

[0042] The left-side voltage GLL and the right-side voltage GLR are, for example, equivalent to the voltage of the scan signal GL, while the right-side voltage GRR and the left-side voltage GRL are, for example, equivalent to the voltage of the scan signal GR. The signal SL and / or the signal SR may be, for example, the common voltage VCOM or the ground voltage GND, but are not limited thereto.

[0043] When the scan drive element 51 of the electronic device 300 fails while the scan drive element 52 is normal, the electronic device 300 is in a failure state (i.e., the second state). Signals GON_L and XGON_R are, for example, at a low potential (VL), and signals XGON_L and GON_R are, for example, at a high potential (VH). This causes switching elements SW3, SW4, SW6, and SW7 to open, and switching elements SW1, SW2, SW5, and SW8 to close. This allows the scan signal GR generated or provided by the scan drive element 52 to be transmitted to scan lines G1 and G2 via switching elements SW4 and SW3. In other words, when the scan drive element 51 of the electronic device 300 fails while the scan drive element 52 is normal, the electronic device 300 is in a failure state (the second state). Switching element SW3 is open to transmit the scan signal GR to scan line G1. The scan signal GR is not generated or provided by the scan drive element 51; it is generated or provided by the scan drive element 52. When the scan drive element 51 of the electronic device 300 fails while the scan drive element 52 is normal, the electronic device 300 is in a failure state (second state). Since the switch element SW5 is closed and the switch element SW6 is open, the data signal D1S generated or provided by the data drive element 61 will not be transmitted to the pixel (e.g., pixel P1) disposed in the first area 41, but the signal SL can be transmitted to the data line D1 through the switch element SW6. Since the signal SL is, for example, the VCOM potential or ground voltage GND, the pixel (e.g., pixel P1) disposed in the first area 41 displays a black screen.

[0044] In addition, since the switching element SW7 is turned on and the switching element SW8 is turned off, the data signal D2S generated by the data driving element 62 can be transmitted to the data line D2 through the switching element SW7. Since the voltage range of the data signal D2S is from VdataH to VdataL, the pixel P2 located in the second area 42 can display the screen normally.

[0045] The above embodiment illustrates the situation where the scanning drive element 51 of the electronic device 300 fails while the scanning drive element 52 functions normally. Based on this description, those skilled in the art can deduce the operation mode of the electronic device 300 when the scanning drive element 52 fails while the scanning drive element 51 functions normally. Furthermore, each switching element SW1 to SW8 in the above embodiment has two N-type transistors Q1 and Q2 and two P-type transistors Q3 and Q4 electrically connected in a dual-gate structure, but the present invention is not limited thereto. Please refer to... Figure 4 , Figure 4This is a schematic diagram of an electronic device 400 according to another embodiment of the present invention. The difference between electronic device 400 and electronic device 300 is that each switching element SW1 to SW8 of electronic device 400 has an N-type transistor Q1 and a P-type transistor Q3 electrically connected in a single-gate structure. Apart from the above differences, the circuit structure and operation of electronic device 400 are the same as those of electronic device 300, and therefore will not be described further.

[0046] Please refer to Figure 5 , Figure 5 This is a schematic diagram of an electronic device 500 according to another embodiment of the present invention. The electronic device 500 may be a display device and may include a substrate 20, a scan driving element 51, a scan line G1, switching elements SW1 to SW4, a scan driving element 52, and a scan line G2, but is not limited thereto. The substrate 20 has an active region 30 and a peripheral region 40 adjacent to the active region 30. In this embodiment, the peripheral region 40 is the area on the substrate 20 other than the active region 30. The electronic device 500 may further include a plurality of pixels (e.g., pixels P1 and P2) disposed within the active region 30, and data driving elements 61 and 62 disposed within the peripheral region 40. Pixel P1, for example, is disposed in the first region 31 of the active region 30 and electrically connected to the data driving element 61 via a data line D1, and pixel P2, for example, is disposed in the second region 32 of the active region 30 and electrically connected to the data driving element 62 via a data line D2. The structure of the plurality of pixels disposed within the active region 30 of the electronic device 500 may be the same as the structure of the plurality of pixels of the electronic device 100 (e.g., Figure 1C As shown in the figure, it will not be elaborated further here.

[0047] Scan driving element 51 is disposed in the first region 41 of the peripheral region 40, and scan driving element 52 is disposed in the second region 42 of the peripheral region 40. Scan driving element 51 is configured to generate a scan signal GL and transmit the scan signal GL to the sub-pixels R, G, and B of pixel P1 within the first region 31 of the active region 30 via scan line G1, but is not limited thereto. Scan line G1 is electrically connected to scan driving element 51, and scan line G2 is electrically connected to scan driving element 52. Scan driving element 52 is configured to generate a scan signal GR and transmit the scan signal GR to the sub-pixels R, G, and B of pixel P2 within the second region 32 of the active region 30 via scan line G2, but is not limited thereto. Scan line G1 may extend from the first region 41 of the peripheral region 40 to the first region 31 and the second region 32 of the active region 30, while scan line G2 may extend from the second region 42 of the peripheral region 40 to the second region 32 and the first region 31 of the active region 30. Furthermore, Figure 5 Although only two scan lines G1 and G2 and the corresponding row of pixels (including pixels P1 and P2) are shown, those skilled in the art should understand from the description of this invention. Figure 5The embodiments can be extended to cases where the electronic device 500 includes more scan lines and more rows of pixels.

[0048] Switching elements SW1 and SW2 of the electronic device 500 are disposed in the first region 41 of the peripheral region 40 and electrically connected to scan line G1, while switching elements SW3 and SW4 of the electronic device 500 are disposed in the second region 42 of the peripheral region 40 and electrically connected to scan line G2. One end of switching element SW1 is electrically connected to an external signal source to receive signal SL, the other end of switching element SW1 is electrically connected to scan line G1, and the control terminal of switching element SW1 is electrically connected to scan line G2. One end of switching element SW2 is electrically connected to an external signal source to receive signal SL, the other end of switching element SW2 is electrically connected to scan line G2, and the control terminal of switching element SW2 is electrically connected to scan line G1. One end of switching element SW3 is electrically connected to an external signal source to receive signal SR, the other end of switching element SW3 is electrically connected to scan line G1, and the control terminal of switching element SW3 is electrically connected to scan line G2. One end of the switching element SW4 is electrically connected to an external signal source to receive the signal SR, and the other end of the switching element SW4 is electrically connected to the scan line G2. The control terminal of the switching element SW4 is electrically connected to the scan line G1. In some situations (e.g., failure of the moving element in the opposite scanning area), the signal SL or the signal SR serves as the scanning signal, and the signals SL and SR can be provided by an external signal source.

[0049] Each switching element SW1 to SW4 has a P-type transistor Q3 and a P-type transistor Q4 electrically connected in a dual-gate structure, and the control terminal of each switching element SW1 to SW4 is formed by the gates of its P-type transistors Q3 and Q4. In other embodiments of the present invention, the switching elements SW1 to SW4 of the electronic device 500 may include only a single P-type transistor, replacing the single-gate structure. Figure 5 The dual-gate structure in it.

[0050]

[0051] (Table 3)

[0052] The following explanation uses the failure of the scan drive element 51 of the electronic device 500 as an example, and the normal operation of both scan drive elements 51 and 52 of the electronic device 500 as an example. Referring to Table 3, when both scan drive elements 51 and 52 of the electronic device 500 are normal, the electronic device 500 is in a normal state (first state). Signals SL and SR are, for example, at a low potential VL, while scan signals GL and GR are normally output by scan drive elements 51 and 52 respectively, and their voltages are between VH and VL. At this time, when the voltage provided by scan signal GL is at a high potential VH, switching elements SW2 and SW4 are, for example, off. When the voltage provided by scan signal GR is at a high potential VH, switching elements SW1 and SW3 are, for example, off. At this time, pixels (e.g., P1) located in the first region 31 of the active region 30 are driven by scan drive element 51, and pixels (e.g., P2) located in the second region 32 of the active region 30 are driven by scan drive element 52.

[0053] When the scan drive element 51 of the electronic device 500 fails while the scan drive element 52 is functioning normally, the electronic device 500 is in a failure state (second state). Signals SL and SR are both, for example, at a high potential (VH), while the scan signal GR can be output normally by the scan drive element 52 with its voltage between VH and VL. When the voltage provided by the scan signal GR is at a low potential (VL), switching elements SW1 and SW3 are turned on. Signal SL is transmitted to scan line G1 via switching element SW1, and signal SR is transmitted to scan line G1 via switching element SW3. When the voltage provided by the scan signal GR is at a low potential (VL), and signals SL and SR are both, for example, at a high potential (VH), switching elements SW2 and SW4 are, for example, turned off. Since the scan drive element 52 is not failed, the transmitted scan signal GR can be normally provided to scan line G2, with the voltage of the scan signal GR between VH and VL. When the scan drive element 51 of the electronic device 500 fails while the scan drive element 52 is normal, the electronic device 500 is in a failure state (second state). Since the data line D1 is, for example, ground voltage GND, the pixel P1 located in the first area 41 displays black, for example. Since the data line D2 can normally transmit data voltages ranging from VdataH to VdataL, the pixel P2 located in the second area 42 can normally display the screen. When the scan drive element 51 of the electronic device 500 fails while the scan drive element 52 is normal, the electronic device 500 is in a failure state (second state). The pixels (e.g., P1) located in the first area 41 of the active area 30 and the pixels (e.g., P2) located in the second area 31 of the active area 30 are driven by the scan drive element 52.

[0054] Please refer to Figure 6 , Figure 6This is a schematic diagram of an electronic device 600 according to another embodiment of the present invention. The electronic device 600 may be a display device and may include a substrate 20, a scan driving element 51, a scan line G1, switching elements SW1 to SW2, a scan driving element 52, and a scan line G2. The substrate 20 has an active region 30 and a peripheral region 40 adjacent to the active region 30. In this embodiment, the peripheral region 40 is the area on the substrate 20 other than the active region 30. The electronic device 600 may further include a plurality of pixels (e.g., pixels P1 and P2) disposed within the active region 30, and data driving elements 61 and 62 disposed within the peripheral region 40. The configuration of the data driving elements 61 and 62, the scan driving elements 51 and 52, and the pixels (e.g., pixels P1 and P2) in the electronic device 600 can be the same as that in the electronic device 500, and will not be described again here.

[0055] The electronic device 600 has a switching element SW1 located in the first region 41 of the peripheral region 40 and electrically connected to the scan line G1, and a switching element SW2 located in the second region 42 of the peripheral region 40 and electrically connected to the scan line G2. One end of the switching element SW1 is electrically connected to an external signal source to receive signal SL, and the other end is electrically connected to the scan line G1. The control terminal of the switching element SW1 is used to receive signal GSB_L. Similarly, one end of the switching element SW2 is electrically connected to an external signal source to receive signal SR, and the other end is electrically connected to the scan line G2. The control terminal of the switching element SW2 is used to receive signal GSB_R. Signals SL, SR, GSB_L, and GSB_R can be provided, for example, by an external signal source.

[0056] Switching elements SW1 and SW2 each have N-type transistors Q1 and Q2 electrically connected in a dual-gate structure, and the control terminals of switching elements SW1 and SW2 are formed by the gates of their respective N-type transistors Q1 and Q2. In other embodiments of the present invention, the switching elements SW1 and SW2 of the electronic device 600 may include only a single N-type transistor, replacing the single-gate structure. Figure 6 The dual-gate structure in it.

[0057]

[0058] (Table 4)

[0059] The following explanations will be provided using the following scenarios as examples: the scan drive element 51 of the electronic device 600 fails; the scan drive element 52 of the electronic device 600 fails; and both scan drive elements 51 and 52 of the electronic device 600 are functioning normally. Please refer to Table 4. When both scan drive elements 51 and 52 of the electronic device 600 are functioning normally, the electronic device 600 is in a normal state (first state). Signals SL and SR are, for example, at a low potential of VL, while scan signals GL and GR are normally output by scan drive elements 51 and 52 respectively, and their voltages are between VH and VL. In the normal state (first state), switching elements SW1 and SW2 are, for example, both closed. Pixels located in the first region 31 of the active region 30 (e.g., pixel P1) are driven by scan drive element 51, and pixels located in the second region 32 of the active region 30 (e.g., pixel P2) are driven by scan drive element 52.

[0060] When the scan drive element 51 of the electronic device 600 fails while the scan drive element 52 is normal, the electronic device 600 is in a failure state (second state). Signals SL and GSB_L are, for example, at a high potential (VH), and signals SR and GSB_R are, for example, at a low potential (VL). In this state, switching element SW1 is turned on, while switching element SW2 is turned off. The potential of the scan signal GL can be equal to the potential of the signal SL (i.e., a high potential (VH)). At this time, data line D1 is, for example, at ground voltage (GND), so pixel P1 will display black. However, since data line D2 can normally transmit data voltages ranging from VdataH to VdataL, pixel P2 still displays the image normally.

[0061] Furthermore, when the scan drive element 52 of the electronic device 600 fails while the scan drive element 51 is functioning normally, the electronic device 600 is in a failed state (another second state). Signals SR and GSB_R are, for example, at a high potential (VH), and signals SL and GSB_L are, for example, at a low potential (VL). In this state, switching element SW2 is turned on, while switching element SW1 is turned off. The potential of the scan signal GR can be equal to the potential of the signal SR (i.e., a high potential (VH)). At this time, data line D2 is, for example, at ground voltage (GND), so pixel P2 will display black. However, since data line D1 can normally transmit data voltages ranging from VdataH to VdataL, pixel P1 still displays the image normally.

[0062] The electronic device of the present invention can be a display device, wherein the two regions of its active area can be driven by different driving elements. When one of the two driving elements fails, the scanning signal originally generated by the failed driving element can be generated by the other elements of the electronic device. Therefore, when the driving element used to drive one region of the active area fails, the electronic device of the present invention can display a black screen, thereby improving the user's viewing experience.

[0063] The above description is merely an embodiment of the present invention and is not intended to limit the invention. Those skilled in the art will recognize that the present invention can have various modifications and variations. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An electronic device, characterized in that, The electronic device includes: The substrate has an active region and a peripheral region adjacent to the active region; A first scanning drive element is disposed in the first region of the peripheral area; The first scan line is electrically connected to the first scan driving element; and A first switching element is disposed in the peripheral area and electrically connected to the first scan line; In the first condition, the first scan driving element provides a first scan signal to the first scan line; and In the second state, the first switching element is turned on to transmit the second scan signal to the first scan line.

2. The electronic device as claimed in claim 1, characterized in that, The electronic device further includes: A first data driving element is disposed in the surrounding area; A second data driving element is disposed in the surrounding area; A first data line extends from the peripheral area to the first area of ​​the active area and is electrically connected to the first data driving element; and The second data line extends from the peripheral area to the second area of ​​the active area and is electrically connected to the second data driving element; The second scan signal is provided by one of the first data driving element and the second data driving element.

3. The electronic device as claimed in claim 2, characterized in that, The electronic device further includes: A second switching element is disposed in the first area of ​​the peripheral area and is electrically connected between the first scan driving element and the first scan line; The signal at the control terminal of the second switching element is provided by either the first data driving element or the second data driving element.

4. The electronic device as claimed in claim 1, characterized in that, The electronic device further includes: A second scanning driving element is disposed in the second region of the peripheral area; and The second scan line extends from the second region of the peripheral region to the active region, and one end of the second scan line is electrically connected to the second scan driving element; The second scan signal is provided by the second scan driving element.

5. The electronic device as claimed in claim 4, characterized in that, The electronic device further includes: A second switching element is disposed in the first area of ​​the peripheral area and electrically connected between the first scan line and the first scan driving element, wherein the signal of the control terminal of the second switching element is provided by the second scan driving element.

6. The electronic device as claimed in claim 1, characterized in that, The second scan signal is provided to the first scan line by an external signal source.

7. The electronic device as claimed in claim 6, characterized in that, The electronic device further includes: A second scanning driving element is disposed in the second region of the peripheral area; and The second scan line is electrically connected to the second scan drive element; The control terminal of the first switching element is electrically connected to the second scan line.

8. The electronic device as claimed in claim 7, characterized in that, The electronic device further includes: A second switching element is disposed in the first area of ​​the peripheral area. The first end of the second switching element is electrically connected to the second scan line, the control end of the second switching element is electrically connected to the first scan line, and the second end of the second switching element is electrically connected to the external signal source.

9. The electronic device as claimed in claim 1, characterized in that, The electronic device further includes: The second scanning drive element is disposed in the second region of the peripheral area; Multiple first pixels are set in the first region of this active region; Multiple second pixels are located in the second region of the active region; In the first state, the plurality of first pixels are driven by the first scan driving element, and the plurality of second pixels are driven by the second scan driving element; and In the second state, the plurality of second pixels are driven by the second scan driving element, and the first switching element is turned on to transmit the second scan signal to the first scan line to turn on the transistors in the plurality of first pixels.

10. The electronic device as claimed in claim 9, characterized in that, In this second situation, the plurality of first pixels are driven by the second scan driving element.

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